Test system and control method for coarse and fine tracking photoelectric equipment

Abstract

The invention provides a test system and a control method for coarse and fine tracking and aiming photoelectric equipment, which can be applied to the technical field of tracking and aiming. The test system comprises a main shaft, an auxiliary shaft, a pitch shaft, a fine tracking light pipe and a coarse tracking light pipe which are arranged on a base, wherein the fine tracking light pipe is used for emitting a fine tracking light beam, the coarse tracking light pipe is used for emitting a coarse tracking light beam, the main shaft is used for adjusting the position of the fine tracking light beam in a first plane, the pitch shaft is used for adjusting the angle between the fine tracking light beam and the horizontal plane, and the auxiliary shaft is used for adjusting the position of the coarse tracking light beam in the first plane. The fine tracking light beam is parallel to the coarse tracking light beam after being reflected, and the first plane is a plane perpendicular to the emergent direction of the fine tracking light beam. Therefore, the test system can complete the coarse and fine integrated dynamic test of the coarse and fine tracking and pointing photoelectric equipment, and simplifies the test process of the coarse and fine tracking and pointing photoelectric equipment.

Description

Technical Field

[0001] The present invention relates to the technical field of tracking and aiming, and more specifically, to a test system and a control method for a coarse and fine tracking optoelectronic device. Background Art

[0002] In scenarios that require high precision, fast response, and strong anti-interference capabilities, optoelectronic tracking and aiming systems play a crucial role. The core component of an optoelectronic tracking and aiming system is a coarse and fine tracking optoelectronic device. The control technology of a coarse and fine tracking optoelectronic device usually adopts a cooperative control strategy for the coarse and fine composite axes to ensure accurate, stable, and reliable tracking and aiming effects.

[0003] In order to enable a coarse and fine tracking optoelectronic device to achieve accurate, stable, and reliable tracking and aiming effects, it is necessary to test it. However, the inventor has found that there are at least the following problems in the related art: the test process for a coarse and fine tracking optoelectronic device is relatively complex. Summary of the Invention

[0004] In view of this, the present invention provides a test system and a control method for a coarse and fine tracking optoelectronic device.

[0005] One aspect of the present invention provides a test system for a coarse and fine tracking optoelectronic device, including a main shaft, an auxiliary shaft, a pitch axis, a fine tracking light tube, and a coarse tracking light tube disposed on a base;

[0006] Wherein, the above-mentioned fine tracking light tube is used to emit a fine tracking beam, the above-mentioned coarse tracking light tube is used to emit a coarse tracking beam, the above-mentioned main shaft is used to adjust the position of the above-mentioned fine tracking beam in a first plane, the above-mentioned pitch axis is used to adjust the angle between the above-mentioned fine tracking beam and the horizontal plane, the above-mentioned auxiliary shaft is used to adjust the position of the above-mentioned coarse tracking beam in the above-mentioned first plane, the above-mentioned fine tracking beam is parallel to the above-mentioned coarse tracking beam after reflection, and the above-mentioned first plane is a plane perpendicular to the emission direction of the above-mentioned fine tracking beam.

[0007] According to an embodiment of the present invention, the above-mentioned test system further includes:

[0008] A telescopic shaft, the above-mentioned coarse tracking light tube is disposed on the above-mentioned telescopic shaft, and the above-mentioned telescopic shaft is used to adjust the distance between the above-mentioned coarse tracking beam and the above-mentioned fine tracking beam.

[0009] According to an embodiment of the present invention, a reflector is provided on the rotation axis of the above-mentioned auxiliary shaft, and the above-mentioned fine tracking beam is parallel to the above-mentioned coarse tracking beam after being emitted from the above-mentioned fine tracking light tube and reflected by the above-mentioned reflector.

[0010] According to an embodiment of the present invention, the rotation axis of the above-mentioned auxiliary shaft is parallel to the rotation axis of the above-mentioned main shaft.

[0011] According to an embodiment of the present invention, the auxiliary shaft is rigidly connected to the auxiliary rocker arm, the telescopic shaft is arranged at one end of the auxiliary rocker arm, and the auxiliary shaft adjusts the position of the coarse tracking beam in the first plane through the auxiliary rocker arm.

[0012] According to an embodiment of the present invention, the pitch axis is provided with an operating handwheel, a turbine and a worm, and the pitch axis adjusts the angle between the fine tracking beam and the horizontal plane through the operating handwheel, the turbine and the worm.

[0013] According to an embodiment of the present invention, the main shaft is driven by a first permanent magnet DC torque motor, and the auxiliary shaft is driven by a second permanent magnet DC torque motor.

[0014] According to an embodiment of the present invention, a main shaft counterweight is arranged at one end of the fine tracking optical tube.

[0015] According to an embodiment of the present invention, the interior of the base is a hollow structure, and the base is provided with a base counterweight.

[0016] Another aspect of the present invention provides a control method applied to the test system as described above, including:

[0017] Input the main shaft desired trajectory of the main shaft in the test system at the i-th moment into the test system, and output the main shaft actual trajectory of the main shaft, where i is an integer greater than 0;

[0018] Input the auxiliary shaft desired trajectory of the auxiliary shaft in the test system at the i-th moment into the test system, and output the auxiliary shaft actual trajectory of the auxiliary shaft;

[0019] Determine the position error between the main shaft and the auxiliary shaft according to the main shaft desired trajectory, the auxiliary shaft desired trajectory, the main shaft actual trajectory and the auxiliary shaft actual trajectory;

[0020] Generate the auxiliary shaft desired trajectory at the (i + 1)-th moment according to the position error to control the main shaft and the auxiliary shaft to be synchronized.

[0021] According to an embodiment of the present invention, since the coarse and fine tracking optoelectronic device needs to test the fine tracking function and the coarse tracking function, where the fine tracking beam is used to test the fine tracking function of the coarse and fine tracking optoelectronic device, and the coarse tracking beam is used to test the coarse tracking function of the coarse and fine tracking optoelectronic device, and the parallelism of the fine tracking beam and the coarse tracking beam can simultaneously test the coarse tracking function and the fine tracking function of the coarse and fine tracking optoelectronic device. Moreover, the position of the fine tracking beam in the first plane can be adjusted by the main axis, the position of the coarse tracking beam in the first plane can be adjusted by the auxiliary axis, and the angle of the fine tracking beam can also be adjusted by the pitch axis, so as to adapt to different angles of the detected coarse and fine tracking optoelectronic device, and the test of the coarse and fine tracking optoelectronic device can be completed in the laboratory, simplifying the test process of the coarse and fine tracking optoelectronic device and reducing the test cost. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Through the following description of the embodiments of the present invention with reference to the accompanying drawings, the above and other objects, features, and advantages of the present invention will become more apparent. In the drawings:

[0023] Figure 1 The structural schematic diagram of the test system for the coarse and fine tracking optoelectronic device according to an embodiment of the present invention is shown;

[0024] Figure 2 The structural schematic diagram of the auxiliary axis of the test system for the coarse and fine tracking optoelectronic device according to an embodiment of the present invention is shown;

[0025] Figure 3 The structural schematic diagram of the pitch axis of the test system for the coarse and fine tracking optoelectronic device according to an embodiment of the present invention is shown;

[0026] Figure 4 The flowchart of the control method applied to the test system of the present invention according to an embodiment of the present invention is shown;

[0027] Figure 5 The schematic diagram of the control principle of the control method according to an embodiment of the present invention is shown. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0028] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are merely exemplary and are not intended to limit the scope of the present invention. In the following detailed description, for the sake of explanation, many specific details are set forth to provide a comprehensive understanding of the embodiments of the present invention. However, it is obvious that one or more embodiments can be implemented without these specific details. In addition, in the following description, descriptions of well-known structures and technologies are omitted to avoid unnecessarily confusing the concepts of the present invention.

[0029] The terms used herein are merely for describing specific embodiments and are not intended to limit the present invention. The terms "including", "comprising" and the like as used herein indicate the presence of the described features, steps, operations and / or components, but do not preclude the presence or addition of one or more other features, steps, operations or components.

[0030] All terms used herein (including technical and scientific terms) have the meanings commonly understood by those skilled in the art, unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification, and should not be interpreted in an idealized or overly rigid manner.

[0031] In the case of using expressions such as "at least one of A, B, and C, etc.", generally, it should be interpreted according to the meaning commonly understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include, but is not limited to, a system having only A, only B, only C, having A and B, having A and C, having B and C, and / or having A, B, and C, etc.).

[0032] The cooperative control strategy of the coarse and fine compound axis works by combining coarse tracking and fine tracking. First, the coarse tracking mechanism conducts preliminary target positioning within a large field of view; then, the fine tracking mechanism conducts detailed adjustment within a small field of view. This process involves the combined use of infrared and television large field of view detectors and direct drive motors, as well as the cooperative operation of piezoelectric ceramic fast steering mirrors and fine tracking television small fields of view.

[0033] During the coarse tracking process, the system will fuse infrared and television tracking data to stably track the target and ensure a reliable handover of the process to the fine tracking stage. The cooperative motion control of the coarse tracking and fine tracking systems makes full use of the target information obtained by each, and obtains the actual target aiming information through data fusion processing.

[0034] The process of Acquisition, Tracking and Pointing (ATP) is usually verified step by step through field tests or switching of coarse, fine, and optical tubes. These tests are carried out on links at different distances to verify the effectiveness of the optoelectronic tracking and pointing system ATP. However, this test process has problems such as complex process and high cost.

[0035] In view of this, the present invention provides a test system for a coarse and fine tracking optoelectronic device, including: a main shaft, an auxiliary shaft, a pitching shaft, a fine tracking optical tube, and a coarse tracking optical tube disposed on a base; wherein, the fine tracking optical tube is used to emit a fine tracking beam, the coarse tracking optical tube is used to emit a coarse tracking beam, the main shaft is used to adjust the position of the fine tracking beam in a first plane, the pitching shaft is used to adjust the angle between the fine tracking beam and the horizontal plane, the auxiliary shaft is used to adjust the position of the coarse tracking beam in the first plane, and after reflection, the fine tracking beam is parallel to the coarse tracking beam, and the first plane is a plane perpendicular to the emission direction of the fine tracking beam.

[0036] Figure 1 The structural schematic diagram of the test system for the coarse and fine tracking optoelectronic device according to an embodiment of the present invention is shown.

[0037] As Figure 1 shown, the test system 100 for the coarse and fine tracking optoelectronic device includes a main shaft 120, an auxiliary shaft 130, a pitching shaft 140, a fine tracking optical tube 150, and a coarse tracking optical tube 160 disposed on a base 110.

[0038] Among them, the fine tracking optical tube 150 is used to emit a fine tracking beam L1, the coarse tracking optical tube 160 is used to emit a coarse tracking beam L2, the main shaft 120 is used to adjust the position of the fine tracking beam L1 in a first plane, the pitching shaft 140 is used to adjust the angle between the fine tracking beam L1 and the horizontal plane, the auxiliary shaft 130 is used to adjust the position of the coarse tracking beam L2 in the first plane, and after reflection, the fine tracking beam L1 is parallel to the coarse tracking beam L2, and the first plane is a plane perpendicular to the emission direction X1 of the fine tracking beam L1.

[0039] According to an embodiment of the present invention, since the coarse and fine tracking optoelectronic device needs to test the fine tracking function and the coarse tracking function, where the fine tracking beam L1 is used to test the fine tracking function of the coarse and fine tracking optoelectronic device, and the coarse tracking beam L2 is used to test the coarse tracking function of the coarse and fine tracking optoelectronic device, and the parallelism of the fine tracking beam L1 and the coarse tracking beam L2 can simultaneously test the coarse tracking function and the fine tracking function of the coarse and fine tracking optoelectronic device.

[0040] According to an embodiment of the present invention, the position of the fine tracking beam L1 in the first plane can be adjusted by the main shaft 120, the position of the coarse tracking beam L2 in the first plane can be adjusted by the auxiliary shaft 130, and the angle of the fine tracking beam L1 can be adjusted by the pitching shaft 140, so as to adapt to different angles of the to-be-tested coarse and fine tracking optoelectronic device, and the test of the coarse and fine tracking optoelectronic device can be completed in the laboratory, simplifying the test process of the coarse and fine tracking optoelectronic device and reducing the test cost.

[0041] According to an embodiment of the present invention, as Figure 1As shown, the test system 100 may further include a telescopic shaft 170, and the coarse tracking optical tube 160 is disposed on the telescopic shaft 170. The telescopic shaft 170 is used to adjust the distance between the coarse tracking beam L2 and the fine tracking beam L1 to adapt to different detected coarse and fine tracking optoelectronic devices.

[0042] According to an embodiment of the present invention, the interior of the base 110 may be a hollow structure, and the base 110 may be provided with a base counterweight 111.

[0043] According to an embodiment of the present invention, the base 110 may be designed as a C shape, and the internal hollow structure is used for wire routing. The base counterweight 111 is to keep the center of gravity of the table body at the central position for easy hoisting. The base counterweight 111 may be disposed at the edge of the base 110. The base 110 may be provided with reserved mounting holes, which can be fixed to brackets of different heights during installation to ensure the stability of the table body and adapt to various detected coarse and fine tracking optoelectronic devices.

[0044] According to an embodiment of the present invention, the frame and the base 110 may be made of high-strength cast aluminum alloy ZL201A. The mechanical properties such as the tensile strength and hardness of the ZL201A material are significantly better than those of the aluminum-silicon alloy ZL104, and it has good machining performance.

[0045] According to an embodiment of the present invention, the main shaft 120 is driven by a first permanent magnet DC torque motor, and the auxiliary shaft 130 is driven by a second permanent magnet DC torque motor 131.

[0046] According to an embodiment of the present invention, the main shaft 120 may be supported by precision mechanical bearings and directly driven by the first permanent magnet DC torque motor. The main shaft 120 may also be configured with a high-precision absolute optical encoder 132, so that continuous infinite rotation can be achieved. At the same time, the main shaft 120 may also be configured with a conductive slip ring 133 to meet the signal transmission requirements of the test product.

[0047] According to an embodiment of the present invention, the rotation axis of the auxiliary shaft 130 is parallel to the rotation axis of the main shaft 120.

[0048] As Figure 1 shown, in order to balance the unbalanced torque brought by the auxiliary shaft 130, a main shaft counterweight 121 is installed on one end side of the fine tracking optical tube 150 to ensure the smooth operation of the main shaft 120. The main function of the main shaft 120 is to carry the fine tracking optical tube 150, transmit the fine tracking beam L1, and at the same time drive the auxiliary shaft 130 to move together.

[0049] Figure 2 The schematic structural diagram of the auxiliary shaft of the test system for the coarse and fine tracking optoelectronic device according to an embodiment of the present invention is shown.

[0050] As Figure 2As shown, the auxiliary shaft 130 can also be supported by the same precision mechanical bearings as the main shaft 120 and directly driven by the second permanent magnet DC torque motor 131. At the same time, the auxiliary shaft 130 can also be equipped with a high-precision absolute photoelectric encoder 132 to achieve continuous and infinite rotation. To ensure the effective transmission of the test product signal, the auxiliary shaft 130 is also equipped with a conductive slip ring 133.

[0051] According to an embodiment of the present invention, as Figure 2 shown, a reflecting mirror 134 is provided on the rotating shaft of the auxiliary shaft 130, and the fine tracking beam L1 emitted from the fine tracking optical tube 150 is reflected by the reflecting mirror 134 and is parallel to the coarse tracking beam L2.

[0052] According to an embodiment of the present invention, the main function of the auxiliary shaft 130 is to carry the coarse tracking optical tube 160. To ensure that the coarse tracking beam L2 emitted by the coarse tracking optical tube 160 remains parallel to the fine tracking beam L1, the reflecting mirror 134 is installed at the center of rotation of the rotating shaft of the auxiliary shaft 130 and is equipped with an adjustment bracket to adjust the angle of the reflecting mirror 134. This installation method can ensure that the distance between the coarse tracking beam L2 and the fine tracking beam L1 remains unchanged regardless of how the main shaft 120 and the auxiliary shaft 130 rotate.

[0053] According to an embodiment of the present invention, the auxiliary shaft 130 can be rigidly connected to the auxiliary rocker arm 135, and the telescopic shaft 170 is provided at one end of the auxiliary rocker arm 135. The auxiliary shaft 130 adjusts the position of the coarse tracking beam L2 in the first plane through the auxiliary rocker arm 135.

[0054] According to an embodiment of the present invention, the auxiliary rocker arm 135 and the auxiliary shaft 130 can be rigidly connected by screws and adopt an asymmetric structure design. One end of the auxiliary rocker arm 135 is used to install the telescopic shaft 170 and the coarse tracking optical tube 160, and the other side is used to install a counterweight. Since there are usually differences in the distance between the coarse and fine optical paths of different measured coarse and fine tracking optoelectronic devices, the installation position of the coarse tracking optical tube 160 is increased with an adjustable telescopic shaft 170. The telescopic shaft 170 can be fixed to the auxiliary rocker arm 135 through a kidney-shaped hole, and its length can be adjusted within a certain range. Such a design enables the coarse tracking optical tube 160 to move along the auxiliary rocker arm 135 within a certain range, thereby achieving precise adjustment of the distance between the coarse and fine optical paths.

[0055] Figure 3 The structural schematic diagram of the pitch axis of the test system for the coarse and fine tracking optoelectronic device according to an embodiment of the present invention is shown.

[0056] As Figure 3As shown, the pitch axis 140 is provided with an operating handwheel 141, a turbine 142 and a worm 143. The pitch axis 140 adjusts the angle between the fine tracking beam L1 and the horizontal plane through the operating handwheel 141, the turbine 142 and the worm 143.

[0057] According to an embodiment of the present invention, a pair of high-precision angular contact ball bearings can be installed in the pitch axis 140. These bearings are installed back-to-back and preloaded to support the shafting components and ensure the accuracy and load-bearing stiffness of the shaft. As Figure 3 shown, by controlling the rotation of the pitch axis 140 through the handwheel 141, the worm gear 142 and the worm 143, it is possible to adapt to the coarse and fine tracking optoelectronic devices to be measured at different angles and distances, so that the rotation axis of the main shaft 120, the azimuth axis of the coarse and fine tracking optoelectronic device to be measured, and the rotation axis of the pitch axis 140 intersect at one point.

[0058] In some other embodiments, Figure 4 The flowchart of the control method applied to the test system of the present invention according to an embodiment of the present invention is shown.

[0059] As Figure 4 shown, the method includes operation S410 to operation S440.

[0060] In operation S410, the spindle desired trajectory of the spindle in the test system at the i-th moment is input into the test system, and the spindle actual trajectory of the spindle is output, where i is an integer greater than 0.

[0061] In operation S420, the auxiliary axis desired trajectory of the auxiliary axis in the test system at the i-th moment is input into the test system, and the auxiliary axis actual trajectory of the auxiliary axis is output.

[0062] In operation S430, according to the spindle desired trajectory, the auxiliary axis desired trajectory, the spindle actual trajectory and the auxiliary axis actual trajectory, the position error between the spindle and the auxiliary axis is determined.

[0063] In operation S440, according to the position error, the auxiliary axis desired trajectory at the (i + 1)-th moment is generated to control the spindle and the auxiliary axis to remain synchronized.

[0064] According to an embodiment of the present invention, a position-velocity closed-loop control system can be formed based on the spindle and the auxiliary axis respectively. According to the spindle desired trajectory and the auxiliary axis desired trajectory of the spindle in the test system at the i-th moment, the desired distance between the spindle and the auxiliary axis can be determined. According to the spindle actual trajectory and the auxiliary axis actual trajectory of the spindle in the test system at the i-th moment, the actual distance between the spindle and the auxiliary axis can be determined. According to the desired distance and the actual distance between the spindle and the auxiliary axis, the position error between the spindle and the auxiliary axis can be determined.

[0065] According to an embodiment of the present invention, the position error can be compensated into the desired trajectory of the auxiliary axis at the (i + 1)-th moment, so that the motion error of the auxiliary axis is compensated, thereby enabling the main axis and the auxiliary axis to maintain synchronization.

[0066] According to an embodiment of the present invention, the purpose of the control method is to ensure that the main axis and the auxiliary axis are synchronized in position. As Figure 5 shown, the control method is based on a position-velocity closed-loop control system formed by the main axis and the auxiliary axis respectively. By compensating the position error between the two axes into the desired trajectory of the auxiliary axis, it is possible to effectively prevent the accumulation and continuous increase of the position difference between the main axis and the auxiliary axis after multiple revolutions.

[0067] Figure 5 Fig. shows a schematic diagram of the control principle of the control method according to an embodiment of the present invention.

[0068] As Figure 5 shown, the test system may include a Digital Signal Processor Motion Controller (DSP Motion Controller for short). The DSP motion controller includes a main axis position controller, a main axis speed controller, an auxiliary axis position controller, an auxiliary axis speed controller, etc. Taking the main axis as an example, the desired trajectory of the main axis is sequentially input into the main axis position controller and the main axis speed controller, and a signal for controlling the motion trajectory of the main axis is output. The signal is transmitted to the main axis driver through a Digital-to-Analog (DA) converter, and the main axis driver drives the main axis motor to act. Considering the clock transmission mechanism of the absolute encoder, an information fusion technology is also added. After the position information of the main axis obtained from the absolute encoder is fused and processed, one path of the position signal is sent to the main axis driver for the phase search and current closed-loop of the main axis motor; another path of the position signal is sent to the DSP motion controller for position, speed closed-loop and synchronization correction. The control principle of the auxiliary axis is similar to that of the main axis, and the control of the auxiliary axis refers to the main axis, which will not be elaborated here. Through the control method of the embodiment of the present invention, the purpose of synchronous control of the main axis and the auxiliary axis is finally achieved, ensuring that the coarse tracking beam and the fine tracking beam can always remain stable in spatial position.

[0069] The flowcharts and block diagrams in the accompanying drawings illustrate the possible architectures, functions, and operations of systems, methods, and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagram may represent a module, a segment of a program, or a part of code that contains one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions noted in the blocks may occur in a different order than that noted in the accompanying drawings. For example, two consecutive blocks shown may actually be executed substantially in parallel, or they may sometimes be executed in the reverse order, depending on the functions involved. It should also be noted that each block in the block diagram or flowchart, and combinations of blocks in the block diagram or flowchart, can be implemented by a dedicated hardware-based system that performs the specified functions or operations, or can be implemented by a combination of dedicated hardware and computer instructions. Those skilled in the art will understand that the features described in the various embodiments of the present invention can be combined and / or combined in various ways, even if such combinations or combinations are not explicitly described in the present invention. In particular, without departing from the spirit and teachings of the present invention, the features described in the various embodiments of the present invention can be combined and / or combined in various ways. All such combinations and / or combinations fall within the scope of the present invention.

[0070] The embodiments of the present invention have been described above. However, these embodiments are for illustrative purposes only and are not intended to limit the scope of the present invention. Although the embodiments have been described separately above, this does not mean that the measures in the various embodiments cannot be used advantageously in combination. Without departing from the scope of the present invention, those skilled in the art can make various substitutions and modifications, and all such substitutions and modifications should fall within the scope of the present invention.

Claims

1. A test system for a coarse and fine tracking optoelectronic device, characterized in that, It includes a main shaft, an auxiliary shaft, a pitching axis, a fine tracking optical tube and a coarse tracking optical tube arranged on a base; Among them, the fine tracking optical tube is used to emit a fine tracking beam, the coarse tracking optical tube is used to emit a coarse tracking beam, the main shaft is used to adjust the position of the fine tracking beam in a first plane, the pitching axis is used to adjust the angle between the fine tracking beam and the horizontal plane, the auxiliary shaft is used to adjust the position of the coarse tracking beam in the first plane, the fine tracking beam is parallel to the coarse tracking beam after reflection, and the first plane is a plane perpendicular to the emitting direction of the fine tracking beam.

2. The test system according to claim 1, characterized in that, The test system further includes: A telescopic shaft, the coarse tracking optical tube is arranged on the telescopic shaft, and the telescopic shaft is used to adjust the distance between the coarse tracking beam and the fine tracking beam.

3. The test system according to claim 1, wherein A reflecting mirror is arranged on the rotation axis of the auxiliary shaft, and the fine tracking beam emitted from the fine tracking optical tube is parallel to the coarse tracking beam after being reflected by the reflecting mirror.

4. The test system according to claim 1, characterized in that, The rotation axis of the auxiliary shaft is parallel to the rotation axis of the main shaft.

5. The test system according to claim 1, characterized in that, The auxiliary shaft is rigidly connected to an auxiliary rocker arm, the telescopic shaft is arranged at one end of the auxiliary rocker arm, and the auxiliary shaft adjusts the position of the coarse tracking beam in the first plane through the auxiliary rocker arm.

6. The test system according to claim 1, wherein The pitching axis is provided with an operating handwheel, a turbine and a worm, and the pitching axis adjusts the angle between the fine tracking beam and the horizontal plane through the operating handwheel, the turbine and the worm.

7. The test system according to any one of claims 1 to 5, characterized in that, The main shaft is driven by a first permanent magnet DC torque motor, and the auxiliary shaft is driven by a second permanent magnet DC torque motor.

8. The test system according to any one of claims 1 to 5, characterized in that A main shaft counterweight is arranged at one end of the fine tracking optical tube.

9. The test system according to any one of claims 1 to 5, characterized in that, The interior of the base is a hollow structure, and the base is provided with a base counterweight.

10. A control method applied to the test system according to any one of claims 1 to 9, characterized in that, The method includes: Inputting the main shaft desired trajectory of the main shaft in the test system at the i-th moment into the test system, and outputting the main shaft actual trajectory of the main shaft, where i is an integer greater than 0; Inputting the auxiliary shaft desired trajectory of the auxiliary shaft in the test system at the i-th moment into the test system, and outputting the auxiliary shaft actual trajectory of the auxiliary shaft; Determining the position error between the main shaft and the auxiliary shaft according to the main shaft desired trajectory, the auxiliary shaft desired trajectory, the main shaft actual trajectory and the auxiliary shaft actual trajectory; Generating the auxiliary shaft desired trajectory at the (i + 1)-th moment according to the position error to control the main shaft and the auxiliary shaft to be synchronized.

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