Memory system-level test method and device based on TFTP (trivial file transfer protocol) service

Abstract

The embodiment of the invention provides a memory system-level test method and device based on a TFTP service, and the method comprises the steps: obtaining a plurality of different test work orders, generating a test script and an algorithm program which are named by test work order numbers, and each test work order is associated with one or more SLT device numbers; monitoring a test script and an algorithm program downloading request of the SLT equipment, and identifying a corresponding SLT equipment number when the downloading request is received; querying a corresponding test work order according to the SLT device number, and issuing a test script and an algorithm program corresponding to the test work order number to the requested SLT device; and after the SLT equipment executes the test script and the algorithm program, receiving a memory test report uploaded by the SLT equipment.

Description

Technical Field

[0001] Embodiments of the present disclosure relate to the field of memory automated testing, and more particularly, to a memory system-level testing method and apparatus based on TFTP service. Background Art

[0002] With the continuous development of information technology, the demand for data storage is increasing day by day. Especially in the fields of servers and high-performance computing, as one of the key components, the reliability of memory is crucial to the stability and performance of the entire system. Especially with the increase in memory capacity and complexity, the quality detection and fault screening of memory have become important links to ensure the reliability of devices.

[0003] Due to the increasingly small size of semiconductor chips and the increasingly precise manufacturing processes used in memory, various factors (such as temperature, voltage fluctuations, timing settings, etc.) can affect the stability of memory. System Level Test (SLT) is becoming increasingly important. In the system-level testing of memory, a test work order contains a set of test configuration items, such as test temperature, test algorithm, number of cycles, timing parameters, memory voltage, etc. According to the work order configuration, the corresponding test script is generated and sent to the SLT device for execution. The SLT device modifies the timing, voltage and other parameters of the memory according to the script, and then executes the algorithm program to perform a large number of read and write operations on the memory module, checks whether the memory has errors, and screens out unqualified memory modules according to the test results to ensure that only memory that meets the quality standards is put on the market.

[0004] Since the test work order configuration items of memory in different production batches are generally different, and the test work orders of memory in the same batch may also be different. In the existing memory SLT testing, one host computer controls multiple SLT devices to perform the testing of one test work order, and it is impossible to perform the testing of different test work orders simultaneously. In the face of large-scale production and multi-batch testing, the existing host computer control method limits the testing efficiency. Summary of the Invention

[0005] The embodiments described herein provide a memory system-level testing method, apparatus, and computer-readable storage medium storing a computer program to improve the testing verification efficiency and shipping efficiency during memory mass production testing.

[0006] According to a first aspect of the present disclosure, a memory system-level testing method based on TFTP service is provided, which is suitable for execution on a host computer. The host computer is connected to multiple SLT devices through a switch in a local area network, and the memory is inserted on the SLT devices. The method includes: obtaining a plurality of different test work orders, generating a test script and an algorithm program named after the test work order number, and each test work order is associated with one or more SLT device numbers; listening for download requests of the test script and the algorithm program of the SLT device, and when receiving the download request, identifying the corresponding SLT device number; querying the corresponding test work order according to the SLT device number, and sending the test script and the algorithm program corresponding to the test work order number to the requested SLT device; and after the SLT device finishes executing the test script and the algorithm program, receiving the memory test report uploaded by the SLT device.

[0007] In some embodiments of the present disclosure, obtaining a plurality of different test work orders and generating a test script and an algorithm program named after the test work order number includes: obtaining a plurality of test work order information from a database, and each test work order is associated with one or more SLT device numbers according to the test requirements; generating different test scripts and algorithm programs according to the requirements of each test work order and the associated SLT device numbers, and the test script and the algorithm program are named after the corresponding test work order number; and associating and storing the generated test script and algorithm program with the corresponding test work order number in the database.

[0008] In some embodiments of the present disclosure, listening for download requests of the test script and the algorithm program of the SLT device, and when receiving the download request, identifying the corresponding SLT device number includes: after the SLT device is powered on and started, sending a download request for the test script and the algorithm program to the host computer according to the self-starting script, and the SLT device number is carried in the download request; the host computer starts the TFTP server and listens for download requests of the test script and the algorithm program of the SLT device on the listening port; parsing the file name or path according to the file name in the download request, and extracting the SLT device number from the requested file name through a regular expression.

[0009] In some embodiments of the present disclosure, querying the corresponding test work order according to the SLT device number and sending the test script and the algorithm program corresponding to the test work order number to the requested SLT device includes: querying the database according to the SLT device number to find the corresponding test work order number; obtaining the corresponding test script and algorithm program according to the test work order number; and sending the test script and the algorithm program to the SLT device through the TFTP protocol.

[0010] In some embodiments of the present disclosure, sending the test script and the algorithm program to the SLT device through the TFTP protocol includes: if multiple SLT device numbers are associated with the same test work order number, sending the test script and the algorithm program corresponding to the test work order number to multiple SLT devices simultaneously.

[0011] In some embodiments of the present disclosure, the test script and algorithm program corresponding to the test work order number are used to set the test temperature, number of cycles, timing parameters, and memory voltage of the memory; check the stability of the memory module under the workload through frequent memory read and write operations; check the durability of the memory module by increasing the frequency and complexity of memory access and simulating an extreme environment; introduce an incorrect or damaged memory pattern to test the reaction and recovery ability of the memory module under abnormal conditions; if the memory module fails under certain configuration conditions, record the failure information and mark the memory module as a defective product.

[0012] In some embodiments of the present disclosure, after the SLT device finishes executing the test script and algorithm program, receiving the memory test report uploaded by the SLT device includes: listening for the file upload request of the SLT device, receiving and storing the uploaded test report from the SLT device; verifying whether the format or content of the test report meets the expectations, and storing the verified test report in the database.

[0013] In some embodiments of the present disclosure, listening for the file upload request of the SLT device and receiving and storing the uploaded test report from the SLT device includes: allocating an independent thread for each test work order in the TFTP service to execute the test task of the SLT device; setting priorities for each request in the TFTP service, and processing the TFTP requests in parallel by multiple threads according to the priority queue.

[0014] According to a second aspect of the present disclosure, there is provided a memory system-level test device based on the TFTP service. The device includes at least one processor; and at least one memory storing a computer program. When the computer program is executed by the at least one processor, the device is caused to: obtain a plurality of different test work orders, generate a test script and algorithm program named after the test work order number, and each test work order is associated with one or more SLT device numbers; listen for the download request of the test script and algorithm program of the SLT device, and when the download request is received, identify the corresponding SLT device number; query the corresponding test work order according to the SLT device number, and send the test script and algorithm program corresponding to the test work order number to the requested SLT device; and after the SLT device finishes executing the test script and algorithm program, receive the memory test report uploaded by the SLT device.

[0015] According to a third aspect of the present disclosure, there is provided a computer-readable storage medium storing a computer program, wherein the computer program, when executed by a processor, implements the steps of the memory system-level test method based on the TFTP service according to the first aspect of the present disclosure.

[0016] A memory system-level testing method and apparatus based on TFTP service according to an embodiment of the present disclosure can achieve at least the following technical effects compared with the prior art: 1. The association with multiple SLT devices can be flexibly adjusted through test work orders, enabling the host computer test system to centrally manage the test tasks of multiple devices, reducing the complexity of single-device configuration and maintenance, and being able to adapt to different test requirements and device configurations; 2. By simultaneously starting multiple devices and associating them with corresponding test work orders, parallel execution of multiple test tasks can be achieved. The device numbers are included in the download requests of the SLT devices, and the corresponding test work orders can be quickly queried and test scripts distributed according to the device numbers; 3. Through the TFTP service, one host computer controls multiple SLT devices to simultaneously perform tests for multiple different test work orders. The host computer only needs to generate corresponding test scripts and algorithm programs, and the SLT devices automatically obtain and execute them through the TFTP protocol without manual intervention, simplifying the cooperation between hardware and software and communication complexity. When the production volume is large and there are many different test batches, the test verification efficiency and shipping efficiency during mass production testing can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] To more clearly illustrate the technical solutions of the embodiments of the present disclosure, the accompanying drawings of the embodiments will be briefly described below. It should be understood that the following described drawings only relate to some embodiments of the present disclosure and do not limit the present disclosure, where: Figure 1 is a schematic diagram of a memory system-level test environment based on TFTP service according to an embodiment of the present disclosure; Figure 2 shows an exemplary flowchart of a memory system-level testing method 200 based on TFTP service according to an embodiment of the present disclosure; Figure 3 is a schematic diagram of a system architecture for simultaneously performing memory tests for multiple different test work orders according to an embodiment of the present disclosure; Figure 4 is a schematic block diagram of a memory system-level testing apparatus 400 based on TFTP service according to an embodiment of the present disclosure.

[0018] It should be noted that the elements in the drawings are schematic and not drawn to scale. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0019] To make the objectives, technical solutions, and advantages of the embodiments of the present disclosure clearer, the technical solutions of the embodiments of the present disclosure will be clearly and completely described below with reference to the accompanying drawings. Apparently, the described embodiments are some, but not all, of the embodiments of the present disclosure. All other embodiments obtained by those skilled in the art based on the described embodiments of the present disclosure without creative efforts shall also fall within the scope of protection of the present disclosure.

[0020] Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which the subject matter of the present disclosure pertains. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the specification and the relevant art, and will not be interpreted in an idealized or overly formal manner unless expressly so defined herein.

[0021] System-level testing (SLT) belongs to customized testing, and the software part has relatively high flexibility. The test content usually includes chip function testing, high-speed interface testing, and DDR memory-related testing, etc. To improve the efficiency and flexibility of SLT devices in memory testing, this solution can enable a single host computer to control multiple SLT devices simultaneously through customized development of the host computer software and TFTP service. Different test scripts and algorithm programs can be issued according to different test requirements, realizing automated and customized management of batch testing, improving the test verification efficiency, and reducing hardware and labor costs.

[0022] Figure 1 is a schematic diagram of a memory system-level test environment based on TFTP service according to an embodiment of the present disclosure. As Figure 1 shown, the host computer, switch, and multiple SLT devices are connected to the same local area network through network cables. The switch acts as an intermediary to ensure smooth data flow between devices. The host computer serves as the control center, managing and scheduling the test tasks of each SLT device. The memory is inserted into the SLT device, and the host computer software, test scripts, and algorithm programs are built into the host computer. Each SLT device can run the test script independently, and the test process is monitored and controlled by the host computer.

[0023] Figure 2 shows an exemplary flowchart of a memory system-level test method 200 based on TFTP service according to an embodiment of the present disclosure. Referring to Figure 2 shown, at block S202 of Figure 2 , multiple different test work orders are obtained, and test scripts and algorithm programs named after the test work order numbers are generated. Each test work order is associated with one or more SLT device numbers.

[0024] To ensure that the host computer can correctly identify and assign test tasks when receiving service requests from multiple SLT devices, add the SLT device number or storage location number or other codes that can be used as the unique identifier of the SLT device to the test work order according to the test requirements.

[0025] In some embodiments of the present disclosure, first, obtain multiple test work order information from the database, and each test work order is associated with one or more SLT device numbers according to the test requirements. A database or file system can be created to manage test work orders. A standardized test work order template may include: Test work order number: The unique identifier of each work order to ensure the distinction between different work orders.

[0026] Device number: For users to add the device numbers of each SLT device.

[0027] Test case number: Uniquely identifies a test case.

[0028] Test case description: Details the functional expectations and operation steps of the test case.

[0029] Preconditions: Conditions that need to be met before executing the test case.

[0030] Test parameters: For example, configuration items such as test temperature, test algorithm, number of cycles, timing parameters, memory voltage, etc.

[0031] Execution result: The result after the test execution, including whether it passes and the reason for not passing.

[0032] Defect record: If defects are found during the test, detailed information about the defects needs to be recorded for the development team to repair.

[0033] Test environment: The hardware and software environment in which the test case is executed.

[0034] Test personnel: The name of the test personnel who executes the test case.

[0035] Review personnel: The name of the personnel who reviews the test case. According to the requirements of the test case and the model, characteristics, and configuration requirements of the SLT devices participating in the test, select eligible SLT devices and fill in the corresponding device numbers. Each work order can involve multiple SLT devices, so there will be multiple device numbers associated with the test work order. These device numbers are the unique identifiers of the SLT devices used in this test work order. In this way, the test work order can accurately specify the test tasks required for each device number, providing a clear basis for subsequent automated testing. After all the device numbers and related parameter configurations are completed, save multiple different test work orders to the database.

[0036] After the work order is generated, check the consistency of the device numbers to ensure that the device numbers listed in the work order are consistent with the actual device configuration. Confirm whether the specific parameter settings of each device meet the test requirements to avoid test failures caused by parameter errors. The work order can be updated and maintained regularly according to the actual usage. When the device characteristics or test requirements change, adjust the content of the work order. Each updated work order needs to be under version control, recording the change content for historical tracking and problem backtracking.

[0037] Then, according to the requirements of each test work order and the associated SLT device numbers, different test scripts and algorithm programs are generated. The test scripts and algorithm programs are named after the corresponding test work order numbers. The host computer can enter different test work order information into the database through the operation interface or configuration file. When the host computer program starts the service, it automatically generates the corresponding test scripts and algorithm programs according to the configured test work order information. The generated scripts and programs are named after the test work order numbers. The generated test scripts and algorithm programs are associated with the corresponding test work order numbers and stored in the database. That is, each test work order and its associated SLT device numbers are mapped to specific test scripts and algorithm programs to ensure that each SLT device executes the correct test process, and multiple test tasks can be carried out in parallel without interference.

[0038] Specifically, extract the key test requirements, device configurations, and parameter settings from each test work order, including: SLT device numbers, device parameters required for testing (such as temperature, frequency, period, etc.), expected output results for each test, etc. Generate corresponding test scripts for each test work order according to the extracted information. For example, select appropriate test tools according to the device characteristics and test requirements (such as Python, Shell scripts, LabVIEW, etc.). Configure communication interfaces (such as Ethernet, serial port, etc.) for each required device to control the device in the script. Automatically generate test scripts according to the test requirements and device configurations. The test scripts can include: Initializing the device: Connecting and configuring the device interface, loading the initial settings. Executing the test: Conducting different types of tests according to the work order requirements (such as functional verification, performance testing, etc.). Obtaining the test results: Obtaining the output of the device through automated commands and saving the results to a specified file.

[0039] The file name of each script is named after the work order number, in the format of TC-001_test_script.py or TC-002_test_script.sh, etc., to ensure that each work order corresponds to an independent script.

[0040] Generate the corresponding algorithm program according to the test requirements listed in the work order. For example, the algorithm can include real-time data processing algorithms, signal analysis algorithms, performance (such as latency, bandwidth, bit error rate, etc.) evaluation algorithms to obtain test data through the device interface; perform real-time analysis, processing, and calculation on the data according to the requirements; and generate a result report or output a log file according to the algorithm results.

[0041] Name the algorithm program file as TC-001_algorithm.py or TC-002_algorithm.m according to the test work order number for use in conjunction with the test script.

[0042] Through the above steps, corresponding test scripts and algorithm programs can be generated according to multiple different test work orders and saved as files named after the work order numbers. Each test work order can be associated with multiple SLT device numbers, and the generated script and program files will be saved to the corresponding device directory for subsequent operation and management.

[0043] Subsequently, in block S204, listen for the download requests of the test script and algorithm program of the SLT device, and when a download request is received, identify the corresponding SLT device number.

[0044] TFTP (Trivial File Transfer Protocol) is a lightweight file transfer protocol suitable for device configuration and program transfer in a local area network. In some embodiments of the present disclosure, all SLT devices run a self-start script when starting up and automatically initiate a TFTP download request to the host computer. The device number is included in the self-start script to identify the device. The SLT device communicates with the host computer through the network and sends a TFTP download request with the device number to ensure that the host computer can identify the device and respond with the correct script and program. In the TFTP request, the device number can be embedded in the file name or be part of the file path.

[0045] The host computer starts a TFTP server and listens on the port (usually port 69) to receive the download requests of the test script and algorithm program. Whenever a download request arrives, the TFTP server parses the file name or path according to the file name of the download request and extracts the SLT device number from the requested file name through a regular expression.

[0046] In block S206, query the corresponding test work order according to the SLT device number and send the test script and algorithm program of the corresponding test work order number to the requested SLT device.

[0047] After the host computer receives the TFTP download request from a certain SLT device, it determines which SLT device it is based on the SLT device number, queries its configuration file or database to determine the test work order corresponding to the device number, and finds out the test work order number to which the SLT device belongs. Obtain the corresponding test script and algorithm program according to the test work order number; send the test script and algorithm program to the SLT device through the TFTP protocol.

[0048] In some embodiments of the present disclosure, in the database, each test work order number contains the SLT device number, test script file name, and algorithm program file name associated with it. As shown in the following table:

[0049] Query the database according to the SLT device number, and send the test script and algorithm program corresponding to the test work order number to the corresponding SLT device through the TFTP protocol. According to the embodiments of the present disclosure, the test script and algorithm program corresponding to the test work order number are used to set the test temperature, number of cycles, timing parameters, and memory voltage of the memory; check the stability of the memory module under the workload through frequent memory read and write operations; simulate an extreme environment to check the durability of the memory module by increasing the frequency and complexity of memory access; introduce an incorrect or damaged memory pattern to test the reaction and recovery ability of the memory module in an abnormal situation; if the memory module fails under certain configuration conditions, record the failure information and mark the memory module as a defective product.

[0050] The purpose of the above memory SLT test is to detect the performance and reliability of the memory module by simulating different environments and working conditions. During the test process, by adjusting configuration items such as temperature, voltage, and timing, and executing the corresponding test algorithms and scripts, it ultimately helps to screen out potential defective memory modules.

[0051] If multiple SLT device numbers are associated with the same test work order number, the test script and algorithm program corresponding to the test work order number are sent to multiple SLT devices simultaneously. Figure 3 It is a schematic diagram of the system architecture for simultaneous memory testing of multiple different test work orders according to the embodiments of the present disclosure. Refer to Figure 3 As shown, test work order a: contains the device numbers of SLT device 1 and SLT device 2. Test work order b: contains the device numbers of SLT device 3 and SLT device 4. Test work order c: contains the device numbers of SLT device 5 and SLT device 6.

[0052] If the request comes from Device 1 or Device 2, look up work order a. If the request comes from Device 3 or Device 4, look up work order b. If the request comes from Device 5 or Device 6, look up work order c. SLT Devices 1 and 2 will receive test script a and algorithm program a. SLT Devices 3 and 4 will receive test script b and algorithm program b. SLT Devices 5 and 6 will receive test script c and algorithm program c. This way ensures that each SLT device only receives the test content it should execute, avoiding misconfiguration of scripts and programs.

[0053] Finally, in box S208, after the SLT device finishes executing the test script and algorithm program, receive the memory test report uploaded by the SLT device.

[0054] Once the script and algorithm program are successfully distributed, the memory test on the SLT device can be started through the command line, management interface, or automation platform. After each SLT device receives its respective test script and algorithm program, it executes its respective test script for temperature control and various parameter configurations, and then executes its respective algorithm program to complete the test task. Among them, the specific content of temperature control operations and parameter configurations will be customized according to the work order requirements, which may include sensor reading, temperature adjustment, device configuration, etc. After the configuration is completed, the SLT device runs the corresponding algorithm program to execute tasks (such as data processing, performance verification, etc.).

[0055] Return Figure 3 As shown, SLT Devices 1 and 2 execute test script a and algorithm program a, SLT Devices 3 and 4 execute test script b and algorithm program b, and SLT Devices 5 and 6 execute test script c and algorithm program c. After the SLT device executes the algorithm, it generates test results, including performance data, parameter logs, etc., and uploads the result data to the host computer through the network. The host computer listens for file upload requests from the SLT device and receives and stores the uploaded test report from the SLT device.

[0056] When processing multiple test work orders, using a multi-threaded or multi-process approach can make the execution of each test work order independent and parallel. In the TFTP service, assign an independent thread to each test work order to execute the test task of the SLT device. If the priorities of the test work orders are different, set the priority for each request in the TFTP service, and multiple threads process the TFTP requests in parallel according to the priority queue.

[0057] The host computer verifies whether the format or content of the test report meets the expectations, and stores the verified test report in the database. For example, analyze whether there are abnormal or failed test items in the test results in the report, and update the test status of the corresponding SLT device according to the test report. For example, mark it as "completed" or "failed".

[0058] The entire above-mentioned test process realizes the process of the device automatically downloading scripts, executing tests, and uploading the results to the host computer. Through the customized TFTP service, the host computer can dynamically generate and distribute test scripts and algorithm programs according to the device numbers of the SLT devices, ensuring that each device executes test tasks as required.

[0059] Figure 4 FIG. 4 is a schematic block diagram of a memory system-level test device 400 based on a TFTP service according to an embodiment of the present disclosure. As Figure 4 shown, the device 400 may include a processor 410 and a memory 420 storing a computer program. When the computer program is executed by the processor 410, the device 400 can execute the steps of the memory system-level test method 200 based on the TFTP service as Figure 2 shown. In one example, the device 400 may be a computer device or a cloud computing node. The device 400 can obtain a plurality of different test work orders, generate test scripts and algorithm programs named after the test work order numbers, and each test work order is associated with one or more SLT device numbers. After the test environment is set up, the device 400 can listen for download requests for test scripts and algorithm programs of the SLT device, and when the download request is received, identify the corresponding SLT device number. Subsequently, query the corresponding test work order according to the SLT device number, and send the test script and algorithm program corresponding to the test work order number to the requested SLT device. After each SLT device receives its own test script and algorithm program, it executes its own test script to control the temperature and configure various parameters, and then executes its own algorithm program. Finally, the device 400 can receive the memory test report uploaded by the SLT device after the SLT device has executed the test script and algorithm program.

[0060] In some embodiments of the present disclosure, the device 400 can obtain a plurality of test work order information from a database, and each test work order is associated with one or more SLT device numbers according to test requirements; generate different test scripts and algorithm programs according to the requirements of each test work order and the associated SLT device numbers, and the test scripts and algorithm programs are named after the corresponding test work order numbers; and store the generated test scripts and algorithm programs in association with the corresponding test work order numbers in the database.

[0061] In some embodiments of the present disclosure, the device 400 can start the TFTP server, receive the TFTP request of the SLT device at the listening port; parse the file name or path according to the file name in the TFTP request, and extract the SLT device number from the requested file name through a regular expression.

[0062] In some embodiments of the present disclosure, the apparatus 400 may query a database according to the SLT device number to find the corresponding test work order number; obtain the corresponding test script and algorithm program according to the test work order number; and send the test script and algorithm program to the SLT device through the TFTP protocol.

[0063] In some embodiments of the present disclosure, the apparatus 400 may listen for file upload requests from the SLT device, receive and store the uploaded test reports from the SLT device; verify whether the format or content of the test reports meets the expectations, and store the verified test reports in the database.

[0064] Further, the apparatus 400 may allocate an independent thread for each test work order in the TFTP service to execute the test tasks of the SLT device; set priorities for each request in the TFTP service, and process TFTP requests in parallel by multiple threads according to the priority queue.

[0065] In embodiments of the present disclosure, the processor 410 may be, for example, a central processing unit (CPU), a microprocessor, a digital signal processor (DSP), a processor based on a multi-core processor architecture, etc. The memory 420 may be any type of memory implemented using data storage technology, including but not limited to random access memory, read-only memory, semiconductor-based memory, flash memory, disk memory, etc.

[0066] In addition, in embodiments of the present disclosure, the apparatus 400 may also include an input device 430, such as a keyboard, a mouse, etc., for inputting configuration information of the test work order. Additionally, the apparatus 400 may further include an output device 440, such as a display, etc., for outputting test reports of one or more SLT devices.

[0067] In other embodiments of the present disclosure, there is also provided a computer-readable storage medium storing a computer program, wherein the computer program, when executed by a processor, can implement the steps of the memory system-level test method 200 based on the TFTP service as Figure 2 shown.

[0068] In summary, according to the memory system-level test method and apparatus based on the TFTP service in embodiments of the present disclosure, the association with multiple SLT devices can be flexibly adjusted through test work orders, enabling the host computer test system to centrally manage the test tasks of multiple devices, reducing the complexity of single-device configuration and maintenance, and being able to adapt to different test requirements and device configurations.

[0069] By simultaneously starting multiple devices and associating them with corresponding test work orders, parallel execution of multiple test tasks can be achieved. The device numbers are included in the download requests of the SLT devices, and corresponding test work orders can be quickly queried according to the device numbers and test scripts can be distributed.

[0070] Through the TFTP service, a host computer controls multiple SLT devices to simultaneously perform tests for multiple different test work orders. The host computer only needs to generate corresponding test scripts and algorithm programs, and the SLT devices automatically obtain and execute them through the TFTP protocol without manual intervention, simplifying the cooperation between hardware and software and the communication complexity. When the production volume is large and there are many different test batches, the test verification efficiency and shipping efficiency during mass production testing can be improved.

[0071] The flowcharts and block diagrams in the accompanying drawings illustrate the possible architectures, functions, and operations of the devices and methods according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagram may represent a module, a segment of a program, or a part of an instruction, and the module, the segment of a program, or the part of an instruction contains one or more executable instructions for implementing the specified logical function. In some alternative implementations, the functions marked in the blocks may occur in a different order than that marked in the accompanying drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in the reverse order, depending on the functions involved. It should also be noted that each block in the block diagram and / or flowchart, and combinations of blocks in the block diagram and / or flowchart, can be implemented by a dedicated hardware-based system that performs the specified functions or actions, or can be implemented by a combination of dedicated hardware and computer instructions.

[0072] Unless the context clearly indicates otherwise, the singular forms of the words used in this specification and the appended claims include the plural, and vice versa. Thus, when referring to the singular, the plural of the corresponding term is generally included. Similarly, the terms "comprising" and "including" shall be interpreted as inclusive rather than exclusive. Likewise, the term "including" and "or" shall be interpreted as inclusive, unless such an interpretation is explicitly prohibited herein. Where the term "example" is used in this specification, particularly when it is located after a list of terms, the "example" is merely illustrative and explanatory and should not be considered exclusive or extensive.

[0073] Further aspects and scopes of adaptability become apparent from the description provided herein. It should be understood that the various aspects of the present application may be implemented alone or in combination with one or more other aspects. It should also be understood that the description herein and the specific embodiments are intended for illustrative purposes only and are not intended to limit the scope of the present application.

[0074] The above has described several embodiments of the present disclosure in detail. However, it is obvious that those skilled in the art can make various modifications and variations to the embodiments of the present disclosure without departing from the spirit and scope of the present disclosure. The protection scope of the present disclosure is defined by the appended claims.

Claims

1. A memory system-level testing method based on TFTP service, suitable for execution on a host computer, wherein the host computer is connected to a plurality of SLT devices in a local area network through a switch, and the memory is inserted into the SLT device, characterized in that: The method comprises: Acquire multiple different test work orders, generate test scripts and algorithm programs named after the test work order numbers, each of the test work orders being associated with one or more SLT device numbers; Monitor the test script and algorithm program download request of the SLT device, and identify the corresponding SLT device number when receiving the download request; Querying the corresponding test work order according to the SLT device number, and sending the test script and algorithm program corresponding to the test work order number to the requested SLT device; and After the SLT device executes the test script and algorithm program, receive the memory test report uploaded by the SLT device.

2. The memory system level testing method based on TFTP service according to claim 1, characterized in that: The method of obtaining a plurality of different test work orders and generating a test script and an algorithm program named after the test work order number includes: Acquire multiple test work order information from the database, each test work order is associated with one or more SLT equipment numbers according to the test requirements; Generate different test scripts and algorithm programs according to the requirements of each test work order and the associated SLT device number, wherein the test scripts and algorithm programs are named after the corresponding test work order number; and The generated test script and algorithm program are associated with the corresponding test work order number and stored in the database.

3. The memory system level testing method based on TFTP service according to claim 1, characterized in that: The monitoring of the test script and algorithm program download request of the SLT device and identifying the corresponding SLT device number upon receiving the download request comprises: After the SLT device is powered on, it sends a test script and algorithm program download request to the host computer according to the self-starting script, and the download request carries the respective SLT device number; The host computer starts the TFTP server and receives the test script and algorithm program download request of the SLT device on the listening port; The file name or path is parsed according to the file name in the download request, and the SLT device number is extracted from the requested file name through a regular expression.

4. The memory system level testing method based on TFTP service according to claim 1, characterized in that: The step of searching for a corresponding test work order according to the SLT device number and sending a test script and an algorithm program corresponding to the test work order number to the requested SLT device includes: Query the database according to the SLT device number to find the corresponding test work order number; Obtaining the corresponding test script and algorithm program according to the test work order number; and The test script and algorithm program are sent to the SLT device via the TFTP protocol.

5. The memory system level testing method based on TFTP service according to claim 4 is characterized in that: The sending of the test script and algorithm program to the SLT device through the TFTP protocol includes: If multiple SLT device numbers are associated with the same test work order number, the test script and algorithm program corresponding to the test work order number will be sent to the multiple SLT devices at the same time.

6. The memory system level testing method based on TFTP service according to claim 5 is characterized in that: The test script and algorithm program corresponding to the test work order number are used to set the test temperature, number of cycles, timing parameters and memory voltage of the memory; and check the stability of the memory bar under the workload through frequent memory read and write operations; By increasing the frequency and complexity of memory accesses and simulating extreme environments, the durability of the memory stick is checked. By introducing erroneous or damaged memory modes, the response and recovery capabilities of the memory stick under abnormal conditions are tested. If the memory stick fails under certain configuration conditions, the failure information is recorded and the memory stick is marked as a faulty product.

7. The memory system level testing method based on TFTP service according to claim 1, characterized in that: After the SLT device executes the test script and the algorithm program, receiving the memory test report uploaded by the SLT device includes: Listen to the file upload request of the SLT device, receive and store the uploaded test report from the SLT device; Verify whether the format or content of the test report meets expectations, and store the verified test report in a database.

8. The memory system level testing method based on TFTP service according to claim 7 is characterized in that: The monitoring of the file upload request of the SLT device, receiving and storing the uploaded test report from the SLT device includes: In the TFTP service, a separate thread is allocated for each test work order to execute the test task of the SLT device; In the TFTP service, a priority is set for each request, and TFTP requests are processed in parallel by multiple threads according to the priority queue.

9. A memory system-level test device based on TFTP service, characterized in that: The device comprises: at least one processor; and at least one memory storing a computer program; Wherein, when the computer program is executed by the at least one processor, the device executes the steps of the memory system-level testing method based on the TFTP service according to any one of claims 1 to 8.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the computer program implements the steps of the memory system-level testing method based on the TFTP service according to any one of claims 1 to 8.

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