Insulator creepage distance detection method based on X-ray
Through X-ray-based detection methods, the insulator creepage distance is automatically measured, which solves the problems of low efficiency and low accuracy in the prior art. It is suitable for insulators of various complex shapes, and realizes efficient and accurate creepage distance detection.
Patent Information
- Application Number
- CN202510364293.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-26
- Publication Date
- 2025-07-04
AI Technical Summary
In the prior art, the method for detecting insulator creepage distances is low efficiency and has low accuracy, and has poor adaptability to insulators with complex shapes, which is easily affected by the environment, making it difficult to achieve automated measurements.
Using X-ray-based detection method, the insulator projection images are collected by adjusting voltage, current, resolution and exposure time, and converted into three-dimensional data using a computed tomography reconstruction algorithm, a three-dimensional model is established, internal defects are detected and the profile curve is extracted, and the arc length of the fitted curve is calculated to measure the creepage distance.
It realizes automatic measurement of insulator creepage distance, improves measurement efficiency and accuracy, and is suitable for insulators of various complex shapes, without contacting equipment, and avoids damage.
Smart Images
Figure CN120253906A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of insulators, and more particularly, to a method for detecting the creepage distance of insulators based on X-rays. Background Art
[0002] The detection of the creepage distance of porcelain insulators is an important link in the maintenance and operation of power systems. Its main purpose is to ensure the insulation performance of insulators, prevent electrical faults, and ensure the safe and stable operation of power systems. The creepage distance refers to the shortest path length between two conductive parts on the surface of the insulator, and this path extends along the surface of the insulator. The creepage distance directly affects the insulation performance of the insulator. Sufficient creepage distance can prevent surface flashover and breakdown, ensuring the normal operation of the insulator in a high-voltage environment. During operation, the surface of porcelain insulators may accumulate dirt, and these dirt will form a conductive layer in a humid environment. If the creepage distance is insufficient, surface dirt and a humid environment may cause partial discharge, ultimately leading to flashover and causing short circuits or power outages. Therefore, by detecting the creepage distance, the insulation performance of insulators under different environmental conditions can be evaluated, and flashover accidents can be prevented. The insulation performance requirements of porcelain insulators are different under different environments.
[0003] The creepage distance is an important parameter in the design of insulators. Detecting the creepage distance can verify whether the insulator meets the operating requirements under specific environments. Porcelain insulators in long-term operation may have surface damage due to aging, wear, or mechanical stress, affecting the creepage distance. Insufficient creepage distance is one of the main causes of insulator failures. Detecting the creepage distance can effectively prevent failures and improve the reliability of power systems. Through detection and maintenance, power outages caused by insulator failures can be reduced, and economic losses can be minimized. The detection of the creepage distance of porcelain insulators is an important measure to ensure the safe and stable operation of power systems. By detecting the creepage distance, the insulation performance of insulators can be evaluated, flashover accidents can be prevented, the equipment life can be extended, and the requirements of industry standards and specifications can be met. With the increasing requirements of power systems for reliability and intelligent operation and maintenance, the importance of creepage distance detection will be further highlighted. In the existing technology, the methods for detecting the creepage distance of insulators mainly include manual measurement, template comparison, and detection based on image processing. However, these methods all have more or less disadvantages. For example, the method of manual measurement is inefficient, time-consuming and laborious, difficult to measure insulators with complex shapes, and easily affected by human factors, making it difficult to guarantee the accuracy; the method of template comparison has a high production cost, poor adaptability to insulators with complex shapes, and low accuracy; while the detection method based on image processing is greatly affected by environmental factors such as light and background, and has high requirements for the accuracy of image processing algorithms. Summary of the Invention
[0004] The object of the present invention is to provide an X-ray-based method for detecting the creepage distance of insulators, which can achieve automatic measurement of the creepage distance of insulators and significantly improve the measurement efficiency.
[0005] The technical solution of the present invention is as follows:
[0006] In a first aspect, the present application provides an X-ray-based method for detecting the creepage distance of insulators, which includes the following steps:
[0007] S1. Collect X-ray projection images of the insulator from multiple angles by adjusting the voltage, current, resolution, and exposure time of the X-ray generator to obtain projection data of the insulator;
[0008] S2. Use a computed tomography reconstruction algorithm to convert the projection data of the insulator into three-dimensional volume data;
[0009] S3. Establish a three-dimensional model of the insulator based on the three-dimensional volume data;
[0010] S4. Detect internal defects of the insulator through the three-dimensional model of the insulator, and extract the contour curve;
[0011] S5. Use an image processing tool to extract data points on the contour curve and fit the data points to obtain a fitted curve;
[0012] S6. Output the creepage distance measurement result by calculating the arc length of the fitted curve.
[0013] Further, in step S2, the computed tomography reconstruction algorithm includes a filtered back-projection algorithm and an iterative reconstruction algorithm.
[0014] Further, in step S4, the process of extracting the contour curve includes:
[0015] Extract the cross-sectional slice image of the insulator through the data in the three-dimensional model of the insulator;
[0016] Select the slice image and perform edge detection to extract the contour of the insulator;
[0017] Smooth the contour to remove noise and obtain the contour curve.
[0018] Further, step S4 further includes: before outputting the contour curve, performing equal-proportion scaling on the contour curve according to the actual size of the object to be calibrated.
[0019] Further, the algorithm used for the above-mentioned edge detection is one or more of the Canny algorithm, the Sobel algorithm, and the deep learning algorithm.
[0020] Further, in step S5, the above image processing tool adopts one or more of MATLAB, OpenCV, and Matplotlib.
[0021] Further, in step S5, the methods adopted in the process of fitting the data points include: linear interpolation method, polynomial interpolation method, and spline interpolation method.
[0022] Further, in step S6, the process of calculating the arc length of the fitting curve includes:
[0023] If the fitting curve is represented by the function y = f(x), and x varies in the interval [a, b], the calculation formula for the arc length is:
[0024]
[0025] In the formula, L represents the arc length.
[0026] In a second aspect, the present application provides an electronic device, including:
[0027] A memory for storing one or more programs;
[0028] A processor;
[0029] When the above one or more programs are executed by the above processor, a method for detecting the creepage distance of an insulator based on X-rays as described in any one of the above first aspects is implemented.
[0030] In a third aspect, the present application provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, a method for detecting the creepage distance of an insulator based on X-rays as described in any one of the above first aspects is implemented.
[0031] Compared with the prior art, the present invention has at least the following advantages or beneficial effects:
[0032] (1) The method for detecting the creepage distance of an insulator based on X-rays in the present invention automatically collects X-ray projection images of the insulator from multiple angles by adjusting the voltage, current, resolution, and exposure time of the X-ray generator, significantly improving the measurement efficiency;
[0033] (2) The present invention ensures the accuracy of the measurement results through three-dimensional reconstruction and path optimization algorithms;
[0034] (3) The method for detecting the creepage distance of an insulator in the present invention is applicable to various insulators with complex shapes, including suspension insulators, post insulators, and composite insulators, and does not need to contact the insulator during the measurement process, avoiding damage to the equipment. At the same time, this method can not only measure the contour curve length of the insulator, but also detect the missing item situation inside the insulator. Description of the Drawings
[0035] To more clearly illustrate the technical solutions of the embodiments of the present invention, the following will briefly introduce the accompanying drawings required for the embodiments. It should be understood that the following drawings only show certain embodiments of the present invention and should not be regarded as limiting the scope. For those of ordinary skill in the art, without creative efforts, other related drawings can also be obtained based on these drawings.
[0036] Figure 1 A method for detecting the creepage distance of an insulator based on X-rays according to the present invention;
[0037] Figure 2 A schematic structural block diagram of an electronic device according to an embodiment of the present invention.
[0038] Icons: 101, memory; 102, processor; 103, communication interface. Detailed implementation manners
[0039] To make the objectives, technical solutions, and advantages of the embodiments of the present application clearer, the following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are some, but not all, of the embodiments of the present application. Generally, the components of the embodiments of the present application described and illustrated in the accompanying drawings here can be arranged and designed in various different configurations.
[0040] Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the present application claimed, but merely represents the selected embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present application.
[0041] It should be noted that: similar reference numerals and letters denote similar items in the following drawings. Therefore, once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings.
[0042] It should be noted that in this document, the term "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article, or device including a series of elements not only includes those elements but also includes other elements not explicitly listed, or further includes elements inherent to such a process, method, article, or device. Without further limitations, the elements defined by the statement "including..." do not exclude the existence of additional identical elements in the process, method, article, or device including the said elements.
[0043] The following will describe in detail some embodiments of the present application in conjunction with the accompanying drawings. Without conflict, the following various embodiments and the various features in the embodiments can be combined with each other.
[0044] Embodiment 1
[0045] Please refer to Figure 1 , Figure 1 which shows a step diagram of a method for detecting the creepage distance of an insulator based on X-rays provided by an embodiment of the present application.
[0046] The present application provides a method for detecting the creepage distance of an insulator based on X-rays, which includes the following steps:
[0047] S1. Collect X-ray projection images of the insulator from multiple angles by adjusting the voltage, current, resolution, and exposure time of the X-ray generator to obtain projection data of the insulator;
[0048] S2. Use a computed tomography reconstruction algorithm to convert the projection data of the insulator into three-dimensional volume data;
[0049] S3. Establish a three-dimensional model of the insulator based on the three-dimensional volume data;
[0050] S4. Detect internal defects of the insulator through the three-dimensional model of the insulator and extract contour curves;
[0051] S5. Use an image processing tool to extract data points on the contour curve and fit the data points to obtain a fitted curve;
[0052] S6. Output the creepage distance measurement result by calculating the arc length of the fitted curve.
[0053] It should be noted that the X-ray generator of the present invention uses a high-resolution X-ray detector, such as a flat panel detector or a linear array detector. By fixing the insulator on a rotatable platform, the rotating platform steps at a fixed angle, such as 1° or 0.5°, and X-ray projection images are collected at each angle to obtain projection data from multiple angles, ensuring coverage of the complete 360° range to obtain sufficient projection data, so as to capture clear multi-angle X-ray images.
[0054] As a preferred embodiment, in step S2, the computed tomography reconstruction algorithm includes a filtered back-projection algorithm and an iterative reconstruction algorithm.
[0055] As a preferred embodiment, in step S4, the process of extracting the contour curve includes:
[0056] Extract cross-sectional slice images of the insulator through the data in the three-dimensional model of the insulator;
[0057] Select the sliced image and perform edge detection to extract the contour of the insulator;
[0058] Smooth the contour to remove noise and obtain the contour curve.
[0059] As a preferred embodiment, step S4 further includes: before outputting the contour curve, perform proportional scaling on the contour curve according to the actual size of the object to be calibrated.
[0060] It should be noted that the calibrated contour curve can be exported in a vector format, such as SVG or DXF format, for convenient subsequent use. If further analysis is required, the curve data can be imported into tools such as CAD or MATLAB.
[0061] As a preferred embodiment, the algorithm used for edge detection is one or more of the Canny algorithm, Sobel algorithm, and deep learning algorithm.
[0062] As a preferred embodiment, in step S5, the image processing tool is one or more of MATLAB, OpenCV, and Matplotlib.
[0063] It should be noted that since the curve is given in the form of an image or discrete points, it is necessary to first use an image processing tool to extract the data points on the curve.
[0064] As a preferred embodiment, in step S5, the methods used in the process of fitting the data points include: linear interpolation method, polynomial interpolation method, and spline interpolation method.
[0065] As a preferred embodiment, in step S6, the process of calculating the arc length of the fitted curve includes:
[0066] If the fitted curve is represented by the function y = f(x) and x varies in the interval [a, b], the calculation formula for the arc length is:
[0067]
[0068] In the formula, L represents the arc length.
[0069] Embodiment 2
[0070] Please refer to Figure 2 , Figure 2 which is a schematic structural block diagram of an electronic device provided by an embodiment of the present application.
[0071] An electronic device includes a memory 101, a processor 102, and a communication interface 103. The memory 101, the processor 102, and the communication interface 103 are electrically connected directly or indirectly to each other to achieve data transmission or interaction. For example, these components can be electrically connected to each other through one or more communication buses or signal lines. The memory 101 can be used to store software programs and modules. The processor 102 executes various functional applications and data processing by executing the software programs and modules stored in the memory 101. The communication interface 103 can be used to communicate signaling or data with other node devices.
[0072] Among them, the memory 101 can be, but is not limited to, a random access memory (RAM), a read only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), etc.
[0073] The processor 102 can be an integrated circuit chip with signal processing capabilities. The processor 102 can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.
[0074] It can be understood that the structure shown in the figure is only schematic. An X-ray-based insulator creepage distance detection method may also include more or fewer components than those shown in the figure, or have a different configuration from that shown in the figure. Each component shown in the figure can be implemented using hardware, software, or a combination thereof.
[0075] In the embodiments provided in this application, it should be understood that the disclosed method can also be implemented in other ways. The embodiments described above are merely illustrative. For example, the flowcharts or block diagrams in the accompanying drawings show the possible architectures, functions, and operations of the methods and computer program products according to multiple embodiments of this application. In this regard, each block in the flowchart or block diagram may represent a module, a program segment, or a part of code, and the part of the module, program segment, or code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the blocks may occur in a different order than that marked in the accompanying drawings. For example, two consecutive blocks can actually be executed substantially in parallel, and they can sometimes be executed in the reverse order, depending on the functions involved. It should also be noted that each block in the block diagram and / or flowchart, as well as the combination of blocks in the block diagram and / or flowchart, can be implemented by a dedicated hardware-based system for performing the specified functions or actions, or can be implemented by a combination of dedicated hardware and computer instructions.
[0076] In addition, in each embodiment of this application, the various functional modules can be integrated together to form an independent part, or each module can exist alone, or two or more modules can be integrated to form an independent part.
[0077] If the described function is implemented in the form of a software functional module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in each embodiment of this application. The aforementioned storage medium includes: USB flash drives, mobile hard disks, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical discs, and other various media that can store program codes.
[0078] The foregoing is only the preferred embodiment of this application and is not used to limit this application. For those skilled in the art, this application can have various changes and modifications. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of this application shall be included within the protection scope of this application.
[0079] It is obvious to those skilled in the art that the present application is not limited to the details of the above-described exemplary embodiments, and that the present application can be implemented in other specific forms without departing from the spirit or essential characteristics of the present application. Therefore, from any point of view, the embodiments should be regarded as exemplary and non-limiting. The scope of the present application is defined by the appended claims rather than the above description. Therefore, all changes falling within the meaning and scope of the equivalent elements of the claims are intended to be embraced within the present application. Any reference signs in the claims should not be construed as limiting the claims involved.
Claims
1. An X-ray based method for detecting the creepage distance of insulators, characterized in that, It includes the following steps: S1. Collect X-ray projection images of the insulator from multiple angles by adjusting the voltage, current, resolution, and exposure time of the X-ray generator to obtain projection data of the insulator; S2. Use a computed tomography reconstruction algorithm to convert the projection data of the insulator into three-dimensional volume data; S3. Establish a three-dimensional model of the insulator based on the three-dimensional volume data; S4. Detect internal defects of the insulator through the three-dimensional model of the insulator and extract the contour curve; S5. Use an image processing tool to extract data points on the contour curve and fit the data points to obtain a fitted curve; S6. Output the creepage distance measurement result by calculating the arc length of the fitted curve.
2. The method for detecting the creepage distance of an insulator based on X-ray according to claim 1, wherein, In step S2, the computed tomography reconstruction algorithm includes a filtered back-projection algorithm and an iterative reconstruction algorithm.
3. The method for detecting the creepage distance of an insulator based on X-ray according to claim 1, wherein In step S4, the process of extracting the contour curve includes: Extract the cross-sectional slice image of the insulator through the data in the three-dimensional model of the insulator; Select the slice image and perform edge detection to extract the contour of the insulator; Smooth the contour to remove noise to obtain the contour curve.
4. The method for detecting the creepage distance of an insulator based on X-ray according to claim 3, characterized in that, Step S4 further includes: before outputting the contour curve, perform equal-proportion scaling on the contour curve according to the actual size of the object to be calibrated.
5. The method for detecting the creepage distance of an insulator based on X-ray according to claim 3, characterized in that, The algorithm used for the edge detection is one or more of the Canny algorithm, the Sobel algorithm, and the deep learning algorithm.
6. The method for detecting the creepage distance of an insulator based on X-ray according to claim 1, wherein In step S5, the image processing tool uses one or more of MATLAB, OpenCV, and Matplotlib.
7. The method for detecting the creepage distance of an insulator based on X-ray according to claim 1, wherein In step S5, the methods used for fitting the data points include: linear interpolation method, polynomial interpolation method, and spline interpolation method.
8. The method for detecting the creepage distance of an insulator based on X-ray according to claim 1, wherein, In step S6, the process of calculating the arc length of the fitted curve includes: If the fitted curve is represented by the function y = f(x) and x varies in the interval [a, b], the calculation formula for the arc length is: In the formula, L represents the arc length.
9. An electronic device, characterized in that, It includes: A memory for storing one or more programs; A processor; When the one or more programs are executed by the processor, it implements a method for detecting the creepage distance of an insulator based on X-ray as described in any one of claims 1-8.
10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements a method for detecting the creepage distance of an insulator based on X-ray as described in any one of claims 1-8.