Function testing device and function testing method
By providing functional testing devices, simulating the working environment of the energy storage valve submodule and outputting test commands, the shortcomings in testing the energy storage valve submodule control device are solved, comprehensive testing of control devices such as SMC is achieved, and the stability and reliability of the energy storage system are improved.
Patent Information
- Application Number
- CN202410010911.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-01-04
- Publication Date
- 2025-07-04
AI Technical Summary
There is a lack of devices that can perform functional testing of control devices such as power module controllers in energy storage valve submodules, which affects the operating stability of the energy storage system.
It provides a functional testing device, including a valve-based controller simulation module, an insulated gate bipolar transistor simulation module, a computer communication interface, etc., to simulate the working environment required for SMC testing, and output test commands through the corresponding test interface to realize the testing of SMC in the energy storage valve submodule.
A comprehensive functional test of control devices such as SMC in the energy storage valve submodule has been realized, and the operation stability and reliability of the energy storage system have been improved.
Smart Images
Figure CN120254422A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of electronic technologies, and particularly to a functional test device and a functional test method. Background Art
[0002] Functional test (FCT) refers to a test method that provides a simulated operating environment for the test object, enables it to work in various design states, and thus obtains the parameters of each design state to verify the functionality of the test object.
[0003] To improve the operating stability of the energy storage system, it is very necessary to ensure the reliable operation of controller components such as the power module controller and the switch drive board. Therefore, it is necessary to perform functional tests on controller components such as the power module controller in the energy storage valve sub-module. However, there is currently a lack of a device that can perform functional tests on controller components such as the power module controller in the energy storage valve sub-module. Summary of the Invention
[0004] The embodiments of this application provide a functional test device and a functional test method that can perform functional tests on controller components such as the power module controller in the energy storage valve sub-module.
[0005] In a first aspect, a functional test device is provided, including:
[0006] A valve base controller simulation module, including a valve base controller test interface; the valve base controller simulation module is used to simulate the working environment of the valve base controller according to the test case, and output a first test command through the valve base controller test interface; the first test command is a test command related to the power module controller under test, which is determined according to the test case and output by the valve base controller simulation module;
[0007] An insulated gate bipolar transistor simulation module, including an insulated gate bipolar transistor test interface; the insulated gate bipolar transistor simulation module is used to simulate the working environment of the insulated gate bipolar transistor according to the test case, receive the insulated gate bipolar transistor control command through the insulated gate bipolar transistor test interface, and feedback the state of the insulated gate bipolar transistor through the insulated gate bipolar transistor test interface, where the insulated gate bipolar transistor control command is issued by the power module controller under test;
[0008] And, a host computer communication interface.
[0009] In the functional test device provided by the embodiments of this application, it can simulate the working environment required for SMC testing, and can also output relevant test commands to the SMC under test through the corresponding test interface, so as to realize the testing of the SMC in the energy storage valve sub-module.
[0010] In some embodiments, the functional test device further includes:
[0011] A switch trigger module, including a bypass switch driver board test interface;
[0012] A monitoring module, including an input status detection interface and an output signal output interface. Among them, the input status detection interface obtains the input status feedback from the bypass switch; the output signal output interface outputs an output signal.
[0013] The functional test device provided by the embodiments of the present application can also provide corresponding test interfaces for the test of the bypass switch driver board, and can receive the action feedback of the bypass switch, so as to realize the test function of the bypass switch driver board.
[0014] In some embodiments, the functional test device further includes:
[0015] A battery management controller simulation module, including a battery management controller test interface; the battery management controller simulation module is used to simulate the working environment of the battery management controller according to the test case, and output a second test command through the battery management controller test interface; the second test command is determined according to the test case and is related to the test of the power module controller under test and is output by the battery management controller simulation module.
[0016] The functional test device provided by the embodiments of the present application can also simulate the working environment of the BMC and output test commands related to the BMC and the SMC under test, so as to realize a more comprehensive test function for the SMC.
[0017] In some embodiments, the switch trigger module further includes a bus switch driver board connection interface;
[0018] The input status detection interface also obtains the input status feedback from the bus switch.
[0019] The functional test device provided by the embodiments of the present application can also provide corresponding test interfaces for the bus switch driver board, and can receive the action feedback of the bus switch, so as to realize the test function of the bus switch driver board.
[0020] In some embodiments, the functional test device includes a test tooling host and a test tooling slave;
[0021] The test tooling host assembles the valve base controller simulation module, the switch trigger module, and the monitoring module;
[0022] The test tooling slave assembles the insulated gate bipolar transistor simulation module;
[0023] The test tooling host includes a slave communication interface, and the test tooling slave includes a host communication interface. The slave communication interface is communicatively connected to the host communication interface.
[0024] In the embodiments of the present application, the test tooling host provides a test interface for the main functions, and the test tooling slave provides an IGBT test interface that the test tooling host does not have. The test tooling host issues an instruction to the test tooling slave. The test tooling slave receives the relevant IGBT test commands output by the SMC to be tested through the insulated gate bipolar transistor test interface of its IGBT simulation module, collects the IGBT feedback information, and then uploads the IGBT feedback information to the test tooling host, and the test tooling host uploads it to the upper computer, so as to realize the test requirements for the IGBT control function of the SMC.
[0025] In some embodiments, the above-mentioned test tooling host includes a power supply board, an interface board, a communication board, a processing board, an input board, and an output board.
[0026] In some embodiments of the present application, the functional test device is provided with a number of redundant test interfaces.
[0027] In order to completely test all the interfaces of the SMC, redundant test interfaces are provided in the functional test device in this embodiment to meet the test requirements of multiple groups of interfaces.
[0028] In some embodiments, the above-mentioned upper computer communication interface is a network cable interface.
[0029] The valve base controller test interface and / or the insulated gate bipolar transistor test interface is a fiber optic interface.
[0030] In a second aspect, the embodiments of the present application provide a functional test method, which is applied to the functional test device according to any one of the first aspects. The above-mentioned functional test method includes:
[0031] Obtain test cases;
[0032] Determine the test object and test commands according to the test cases;
[0033] Simulate the target working environment according to the test cases; wherein, the target working environment includes the working environment of the valve base controller, the working environment of the battery management controller, and / or the working environment of the insulated gate bipolar transistor;
[0034] Send a test command to the target interface of the test object in the target working environment, and receive a test feedback signal from the feedback interface of the test object.
[0035] In the embodiments of the present application, based on various interfaces required for functional testing of each control device in the energy storage valve sub-module provided by the above functional testing device, and capable of providing the target working environment required for testing each control device, it can automatically simulate the target working environment corresponding to the test case according to the test case, automatically send test commands to the target interfaces related to the test case, and receive feedback signals through the feedback interface, so as to realize the functional testing requirements of the control devices in the energy storage valve sub-module.
[0036] In an implementation manner of the second aspect, before obtaining the test case, the test method further includes: after the functional testing device is powered on, perform an initialization operation.
[0037] In an implementation manner, the above-mentioned execution of the initialization operation specifically includes:
[0038] Obtain a configuration file;
[0039] Verify the configuration file;
[0040] When the configuration file verification is successful, determine the initialization data output by each interface according to the configuration file, and the initialization data is the default value corresponding to the test object connected to the interface;
[0041] Control each interface to output the corresponding initialization data.
[0042] Through the above initialization operation, the test object and the functional testing device can be restored to the initial state, improving the test accuracy. Description of the Drawings
[0043] Figure 1 Shows a schematic diagram of the system architecture of an energy storage system provided by an embodiment of the present application.
[0044] Figure 2 Shows a schematic diagram of the structure of a functional testing device provided by an embodiment of the present application.
[0045] Figure 3 Shows a schematic diagram of the structure of another functional testing device provided by an embodiment of the present application.
[0046] Figure 4 Shows a schematic diagram of the structure of another functional testing device provided by an embodiment of the present application.
[0047] Figure 5 Shows a schematic diagram of the structure of another functional testing device provided by an embodiment of the present application.
[0048] Figure 6 Shows a schematic diagram of the interfaces of the interface board of the test tooling host of a functional testing device provided by an embodiment of the present application.
[0049] Figure 7 The figure shows a schematic flowchart of an implementation of a function testing method provided by an embodiment of the present application.
[0050] Figure 8 The figure shows a schematic flowchart of executing an initialization process in the function testing method provided by an embodiment of the present application. Detailed implementation manners
[0051] Next, the technical solutions in the present application will be described in conjunction with the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments.
[0052] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. However, those skilled in the art should clearly understand that the present application can also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to avoid unnecessary details from interfering with the description of the present application.
[0053] As used herein, the term "including" indicates the presence of the described features, wholes, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components, and / or their combinations. The terms "including", "comprising", "having", and their variants all mean "including but not limited to", unless otherwise specifically emphasized in other ways. Hereinafter, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the embodiments of the present application, unless otherwise stated, the meaning of "a plurality of" is two or more.
[0054] As used herein, the term "and / or" is merely a description of the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B may represent: the existence of A alone, the existence of both A and B, and the existence of B alone. In addition, the character " / " herein generally represents an "or" relationship between the associated objects before and after.
[0055] Energy storage refers to the process of storing energy through a medium or device and releasing it when needed. Refer to Figure 1 , which is a schematic structural diagram of an energy storage system. As Figure 1 shown, the energy storage system may include multiple energy storage valve sub-modules ( Figure 1Only two energy storage valve sub - modules are shown). Each energy storage valve sub - module includes a power module and a battery module. The power module is used to charge the battery module to provide electrical energy to the battery module, thereby converting part of the grid electrical energy into electrical energy in the battery module; while during peak electricity consumption or when the external power grid interrupts power supply, the power module can receive the electrical energy released by the battery module and convert it into the AC power grid to compensate for the grid electrical energy. The power module includes a bypass switch, a bypass switch drive board, and a power module controller (Sub - module management controller, SMC) for controlling the bypass switch. The battery module includes a bus - bar switch, a bus - bar switch drive board, and a battery management controller (Battery management controller, BMC) for controlling the bus - bar switch. The energy storage system also includes at least one valve base controller (Valve base controller, VBC)( Figure 1 Only one VBC is shown). Among them, the SMC of the energy storage valve sub - module and high - voltage controller components such as each switch drive board are one of the core components for the optoelectronic triggering of high - voltage power devices. In the energy storage system, the SMC and each switch drive board are located on the high - voltage side, which is the bridge connecting the VBC and the BMC, and is also the information input end for realizing the device protection function of the energy storage valve sub - module.
[0056] To improve the operating stability of the energy storage system, it is very necessary to ensure the reliable operation of the SMC and the switch drive board. Therefore, it is necessary to conduct functional tests on controller components such as the SMC in the energy storage valve sub - module. However, there is currently a lack of a device that can conduct functional tests on controller components such as the SMC in the energy storage valve sub - module.
[0057] In some embodiments of the present application, the above - mentioned controller components include the above - mentioned SMC, the bus - bar switch drive board, and the bypass switch drive board, etc.
[0058] Based on this, the embodiments of the present application provide a functional test device. By providing various interfaces required for the functional test of the SMC in the energy storage valve sub - module and providing the working environment required for the SMC during the test, it can meet the test requirements for the SMC in the energy storage valve sub - module and can conduct functional tests on the SMC in the energy storage valve sub - module.
[0059] The following will describe the functional test device provided by the embodiments of the present application in conjunction with the drawings:
[0060] Please refer to Figure 2 , Figure 2 which shows a schematic structural diagram of a functional test device 10 provided by the embodiments of the present application. As Figure 2As shown in the figure, the above-mentioned function test device 10 includes a valve base controller simulation module (hereinafter referred to as the VBC simulation module) 11, an insulated gate bipolar transistor (IGBT) simulation module (hereinafter referred to as the IGBT simulation module) 12, and a host computer communication interface 13.
[0061] Among them, the VBC simulation module 11 includes a valve base controller test interface 111. The VBC simulation module 11 is used to simulate the working environment of the valve base controller (VBC) according to the test case, and output a first test command through the valve base controller test interface 111.
[0062] The first test command is a test command determined according to the test case, output by the VBC simulation module 11, and related to the test of the power module controller 20 to be measured.
[0063] Among them, the valve base controller test interface 111 can be connected to the power module controller to be measured (hereinafter referred to as SMC)
[0064] 20. When the valve base controller test interface 111 is connected to the SMC 20 to be measured, the first test command related to SMC is output and the information uploaded by the SMC 20 is obtained.
[0065] The IGBT simulation module 12 includes an insulated gate bipolar transistor test interface 121. The insulated gate bipolar transistor test interface 121 is used to connect to the SMC 20 to be measured. The IGBT simulation module 12 is used to simulate the working environment of the IGBT according to the test case. When the insulated gate bipolar transistor test interface 121 is connected to the SMC 20 to be measured, the IGBT control command of the SMC to be measured is received, and the state of the IGBT is fed back through the insulated gate bipolar transistor test interface.
[0066] The above-mentioned host computer communication interface 13 is used for communication connection with the communication interface 51 of the host computer 30.
[0067] In specific applications, the above-mentioned host computer communication interface 13 and the communication interface 51 can be connected by a network cable.
[0068] It should be noted that the above-mentioned host computer communication interface 13 and the above-mentioned communication interface 51 can also be wireless interfaces, that is, the above-mentioned host computer communication interface 13 and the above-mentioned communication interface 51 can also be connected through a wireless network. The above-mentioned wireless network includes but is not limited to a Bluetooth wireless network, a WiFi wireless network, etc. The embodiments of the present application do not specifically limit the wireless network.
[0069] In the above-mentioned host computer 30, application programs (software) related to the functional testing of each control device of the energy storage valve sub-module can be installed. Testers can send test cases and test commands to the functional testing device provided in this embodiment through the host computer 30, and can also perform device self-check and communication function testing on the functional testing device. The specific testing process will be illustrated in the method embodiment and will not be elaborated here.
[0070] As can be seen from the above, the functional testing device provided in the embodiment of the present application can simulate the working environment required for SMC testing, and can also output relevant test commands to the SMC under test through the corresponding test interface, so as to realize the testing of the SMC in the energy storage valve sub-module.
[0071] Please refer to Figure 3 , Figure 3 , which shows the structural schematic diagram of the functional testing device 10 provided in another embodiment of the present application. As Figure 2 shown, in the embodiment of the present application, the above-mentioned functional testing device 10 includes a VBC simulation module 11, an IGBT simulation module 12, a host computer communication interface 13, a switch trigger module 14, and a monitoring module 15.
[0072] Among them, the relevant descriptions of the VBC simulation module 11, the IGBT simulation module 12, and the host computer communication interface 13 can refer to the description of the previous embodiment and will not be elaborated here.
[0073] The above-mentioned switch trigger module 14 includes a bypass switch drive board test interface 141.
[0074] Among them, the bypass switch drive board test interface 141 can be connected to the bypass switch drive board 40 under test. When the functional testing device 10 is connected to the bypass switch drive board 40 under test through the above-mentioned bypass switch drive board test interface 141, relevant test commands related to the bypass switch drive board 40 under test can be output through this bypass switch drive board test interface 141 to trigger the bypass switch drive board 40 under test to drive the bypass switch to perform opening or closing actions.
[0075] The above-mentioned monitoring module 15 includes an input status detection interface 151 and an output signal output interface 152. Among them, the input status detection interface 151 can obtain the input status feedback by the bypass switch. The output signal output interface 152 can output output signals
[0076] Specifically, the input status detection interface 151 can be connected to the trigger circuit of the bypass switch drive board 40, so as to obtain the input status feedback by the bypass switch. The output signal output interface 152 can be connected to the switch feedback interface of the bypass switch drive board 40.
[0077] As can be seen above, the functional test device provided by the embodiments of the present application can also provide corresponding test interfaces for the test of the bypass switch drive board, and can receive the action feedback of the bypass switch, so as to realize the test function of the bypass switch drive board.
[0078] Please refer to Figure 4 , Figure 4 which shows a schematic structural diagram of a functional test device 10 provided by another embodiment of the present application. As Figure 3 shown, the functional test device 10 provided by the embodiments of the present application may include a VBC simulation module 11, an IGBT simulation module 12, a host computer communication interface 13, a switch trigger module 14, a monitoring module 15, and a battery management controller simulation module 16 (hereinafter simply referred to as the BMC simulation module 16).
[0079] The BMC simulation module 16 may include a battery management controller test interface 161; the BMC simulation module is used to simulate the working environment of the BMC according to the test case, and output a second test command through the battery management controller test interface.
[0080] The second test command is a test command determined according to the test case, output by the BMC simulation module, and related to the test of the SMC20 under test.
[0081] In a specific application, the above-mentioned battery management controller test interface 161 may be connected to the SMC20 under test. When the battery management controller test interface 161 is connected to the SMC20 under test, a second test command related to the SMC is output and information uploaded by the SMC20 is obtained.
[0082] As can be seen above, the functional test device provided by the embodiments of the present application can also simulate the working environment of the BMC and output test commands related to the BMC and the SMC under test, so as to realize a more comprehensive test function for the SMC.
[0083] In some embodiments, in order to more completely and comprehensively test each interface and function of the SMC, the above-mentioned switch trigger module 14 may further include a bus switch drive board connection interface 142.
[0084] The bus switch drive board connection interface 142 can be connected to the bus switch drive board 50 under test. When the functional test device 10 is connected to the bus switch drive board 40 under test through the above-mentioned bus switch drive board test interface 142, test commands related to the bus switch drive board 50 under test can be output through the bus switch drive board test interface 142 to trigger the bus switch drive board 50 under test to drive the bypass switch to perform an on or off action.
[0085] The above-mentioned input status detection interface 151 is also used to obtain the input status feedback by the bus switch.
[0086] Specifically, the above input status detection interface 151 can also be connected to the trigger circuit of the bus switch drive board 50 to be measured. The output signal output interface 152 can also be connected to the switch feedback interface of the bus switch drive board 50.
[0087] As can be seen from the above, the function test device provided by the embodiment of the present application can also provide corresponding test interfaces for the bus switch drive board, and can receive the action feedback of the bus switch, so as to realize the test function of the bus switch drive board.
[0088] Please refer to Figure 5 , as Figure 5 shown, in some embodiments, the above function test device 10 may include a test tooling host 101 and a test tooling slave 102.
[0089] Among them, the test tooling host 101 is equipped with the above valve base controller simulation module 11, the host computer communication interface 13, the switch trigger module 14, the monitoring module 15, and the battery management controller simulation module 16. The above test tooling slave 102 is equipped with the IGBT simulation module 12.
[0090] The above test tooling host 101 further includes a slave communication interface 17, and the above test tooling slave further includes a host communication interface 18. The slave communication interface 17 is used to connect to the host communication interface 18.
[0091] In a specific application, the above slave communication interface 17 and the above host communication interface 18 can be connected by an optical fiber.
[0092] In the embodiment of the present application, the test tooling host provides the test interfaces for the main functions. Since there is also IGBT feedback in the SMC, the test tooling slave provides the IGBT test interfaces that the test tooling host does not have. The test tooling host 101 issues instructions to the test tooling slave 102. The test tooling slave 102 receives the relevant IGBT test commands output by the SMC 20 to be measured through the insulated gate bipolar transistor test interface 121 of its IGBT simulation module 12, collects the IGBT feedback information, and then uploads the IGBT feedback information to the test tooling host 101, which is uploaded by the test tooling host 101 to the host computer 30, so as to realize the test requirements for the IGBT control function of the SMC.
[0093] In some embodiments, several redundant test interfaces are also provided in the above function test device 10.
[0094] Exemplarily, as Figure 5 shown, the above valve base controller test interface 111 includes a first test sub-interface 111a and a second test sub-interface 111b.
[0095] Among them, the first test sub-interface 111a is used to connect to the first transceiver interface (hereinafter simply referred to as VBC-A) in the SMC20 under test, and the second test sub-interface 111b is connected to the second transceiver interface (hereinafter simply referred to as VBC-B) in the SMC20 under test.
[0096] In practical applications, SMC usually sets two sets of transceiver interfaces for communicating with VBC. In order to fully test all the interfaces of SMC, redundant test interfaces are set in the valve base controller test interface 111 in this embodiment, that is, it includes two test sub-interfaces, the first test sub-interface 111a and the second test sub-interface 111b, so as to achieve a complete test of the transceiver interfaces between SMC and VBC.
[0097] In a specific application, the above-mentioned first test sub-interface 111a may include a data sending interface and a data receiving interface, and the above-mentioned second test sub-interface 111b may also include a data sending interface and a data receiving interface. Among them, the data sending interface of the first test sub-interface 111a is used to connect to the receiving port of VBC-A, the data receiving interface of the first test sub-interface 111a is used to connect to the sending port of VBC-A, the data sending interface of the second test sub-interface 111b is used to connect to the receiving port of VBC-B, and the data receiving interface of the second test sub-interface 111b is used to connect to the sending port of VBC-B.
[0098] Also exemplarily, please continue to refer to Figure 5 The above battery management controller test interface 161 includes a third test sub-interface 161a and a fourth test sub-interface 161b.
[0099] Among them, the third test sub-interface 161a is connected to the third transceiver interface (hereinafter simply referred to as BMC-A) in the SMC20 under test, and the fourth test sub-interface 161b is connected to the fourth transceiver interface (hereinafter simply referred to as BMC-B) in the SMC20 under test.
[0100] In practical applications, SMC usually sets two sets of transceiver interfaces for communicating with BMC. In order to fully test all the interfaces of SMC, redundant test interfaces are set in the battery management controller test interface 161 in this embodiment, that is, it includes two test sub-interfaces, namely the third test sub-interface 161a and the fourth test sub-interface 161b, so as to achieve a complete test of the transceiver interfaces between SMC and BMC.
[0101] In a specific application, the above-mentioned third test sub-interface 161a may include a data sending interface and a data receiving interface, and the above-mentioned fourth test sub-interface 161b may also include a data sending interface and a data receiving interface. Among them, the data sending interface of the third test sub-interface 161a is used to connect to the receiving port of BMC-A, the data receiving interface of the third test sub-interface 161a is used to connect to the sending port of BMC-A, the data sending interface of the fourth test sub-interface 161b is used to connect to the receiving port of BMC-B, and the data receiving interface of the fourth test sub-interface 161b is used to connect to the sending port of BMC-B.
[0102] In some embodiments, the above-mentioned bypass switch drive board test interface 141 also includes a data sending interface and a data receiving interface. The data sending interface of the bypass switch drive board test interface 141 is used to connect to the receiving port of the bypass switch drive board 40, and the data receiving interface of the bypass switch drive board test interface 141 is used to connect to the sending port of the bypass switch drive board 40.
[0103] In some embodiments, the above-mentioned bus switch drive board connection interface 142 also includes a data sending interface and a data receiving interface. The data sending interface of the bus switch drive board connection interface 142 is used to connect to the receiving port of the bus switch drive board 50, and the data receiving interface of the bus switch drive board connection interface 142 is used to connect to the sending port of the bus switch drive board 50.
[0104] Exemplarily, in some embodiments, the above-mentioned input status detection interface 151 may include a first input status detection interface 151a, a second input status detection interface 151b, a third input status detection interface 151c, and a fourth input status detection interface 151d.
[0105] Among them, the first input status detection interface 151a is used to obtain the trigger status of the main trigger circuit in the bypass switch drive board 40, the second input status detection interface 151b is used to obtain the trigger status of the standby trigger circuit in the bypass switch drive board 40, the third input status detection interface 151c is used to obtain the trigger status of the main trigger circuit in the bus switch drive board, and the fourth input status detection interface 151d is used to obtain the trigger status of the standby trigger circuit in the bus switch drive board.
[0106] In practical applications, in order to improve the reliability of bypass switch control, two trigger circuits are provided in the above-mentioned bypass switch drive board. In order to test the working status of both trigger circuits, the function test device in this embodiment can obtain the trigger status of the main trigger circuit in the bypass switch drive board 40 through the first input status detection interface 151a, and obtain the trigger status of the standby trigger circuit in the bypass switch drive board 40 through the second input status detection interface 151b.
[0107] In practical applications, in order to improve the reliability of the busbar switch control, two trigger circuits are provided in the above-mentioned busbar switch drive. In order to test the working states of both of these trigger circuits, the function test device in this embodiment can obtain the trigger state of the main trigger circuit of the busbar switch drive board 50 through the third input state detection interface 151c, and obtain the trigger state of the standby trigger circuit of the busbar switch drive board 50 through the fourth input state detection interface 151d.
[0108] In some embodiments, the above-mentioned output interface 152 for outputting signals can include a first output interface 152a for outputting signals, a second output interface 152b for outputting signals, a third output interface 152c for outputting signals, and a fourth output interface 152d for outputting signals.
[0109] Among them, the first output interface 152a for outputting signals is used to connect to the first switch feedback interface of the bypass switch drive board 40, and the second output interface 152b for outputting signals is used to connect to the second switch feedback interface of the bypass switch drive board 40; the third output interface 152c for outputting signals is used to connect to the first switch feedback interface of the busbar switch drive board 50, and the fourth output interface 152d for outputting signals is used to connect to the second switch feedback interface of the busbar switch drive board 50.
[0110] In practical applications, also in order to improve the reliability of the bypass switch and the busbar switch, the function test device provided in this embodiment respectively sets output interfaces for outputting signals for the main trigger circuit and the standby trigger circuit of the bypass switch drive board, and respectively sets output interfaces for outputting signals for the main trigger circuit and the standby trigger circuit of the busbar switch drive board.
[0111] In some embodiments, the above-mentioned test tooling host can include a power supply board card, an interface board card, a communication board card, a processing board card, an input board, and an output board card.
[0112] Among them, the above-mentioned processing board card can parse the test cases sent by the upper computer to control the function test device to simulate a working environment related to the test cases. For example, it controls the power supply board card to output the working voltage required for the test object to work and generate test commands corresponding to the test cases, and outputs them from the relevant interfaces. The specific test process will be described in the embodiment of the function test method and will not be elaborated here.
[0113] In a specific application, the interface board of the above test tooling host is used to provide the data sending interface of the first test sub-interface 111a, the data receiving interface of the first test sub-interface 111a, the data sending interface of the second test sub-interface 111b, the data receiving interface of the second test sub-interface 111b, the data sending interface of the third test sub-interface 161a, the data receiving interface of the third test sub-interface 161a, the data sending interface of the fourth test sub-interface 161b, the data receiving interface of the fourth test sub-interface 161b, the slave communication interface 17 with the test tooling slave (specifically including a data sending interface and a data receiving interface), the data sending interface of the bypass switch drive board test interface 141, the data receiving interface of the bypass switch drive board test interface 141, the data sending interface of the bus switch drive board connection interface 142, and the data receiving interface of the bus switch drive board connection interface 142.
[0114] It should be noted that the above test tooling host 101 may include multiple interface boards, and the interfaces in the multiple interface boards can be configured according to actual requirements. Exemplarily, as Figure 6 shown, the above test tooling host may include interface board 1, interface board 2, interface board 3, and interface board 4.
[0115] Among them, the 1# interface of interface board 1 is configured as the data sending interface of the first test sub-interface 111a, and is used to connect the receiving port of VBC-A; the 2# interface is configured as the data receiving interface of the first test sub-interface 111a, and is used to connect the sending port of VBC-A; the 3# interface is configured as the data sending interface of the second test sub-interface 111b, and is used to connect the receiving port of VBC-B; the 4# interface is configured as the data receiving interface of the second test sub-interface 111b, and is used to connect the sending port of VBC-B.
[0116] The 1# interface of interface board 2 is configured as the data sending interface of the third test sub-interface 161a, and is used to connect the receiving port of BMC-A; the 2# interface is configured as the data receiving interface of the third test sub-interface 161a, and is used to connect the sending port of BMC-A; the 3# interface is configured as the data sending interface of the fourth test sub-interface 161b, and is used to connect the receiving port of BMC-B; the 4# interface is configured as the data receiving interface of the fourth test sub-interface 161b, and is used to connect the sending port of BMC-B.
[0117] The 1# interface of interface board 3 is configured as the data sending interface of the slave communication interface 17, and is used to connect the IGBT trigger interface of SMC; the 2# interface is configured as the data receiving interface of the slave communication interface 17, and is used to connect the IGBT feedback interface of SMC.
[0118] The 1# interface of interface board 4 is configured as the data sending interface of bypass switch driver board test interface 141, for connecting to the receiving port of the bypass switch driver board; the 2# interface is configured as the data receiving interface of bypass switch driver board test interface 141, for connecting to the sending port of the bypass switch driver board; the 3# interface is configured as the data sending interface of bus switch driver board connection interface 142, for connecting to the receiving port of the bus switch driver board; the 4# interface is configured as the data receiving interface of bus switch driver board connection interface 142, for connecting to the sending port of bus switch driver board 50.
[0119] It can be understood that the configurations of the above-mentioned various interfaces can be set according to actual requirements. Figure 6 The shown interface schematic diagram is only an example rather than a limitation.
[0120] In some embodiments, the above-mentioned first test sub-interface, second test sub-interface, third test sub-interface, fourth test sub-interface, insulated gate bipolar transistor test interface, bypass switch driver board test interface, and battery management controller test interface can be fiber optic interfaces, and the above-mentioned host computer communication interface is a network cable interface.
[0121] In some embodiments of the present invention, the above-mentioned processing board can be a central processing unit (CPU), and this processor can also be other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), field programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or this processor can also be any conventional processor, etc.
[0122] The above-mentioned input board is used to implement the function of the above-mentioned input status detection interface 151, and the above-mentioned output board is used to implement the function of the above-mentioned output signal output interface 152.
[0123] To more clearly illustrate the test process of the above-mentioned function test device, the test process of relevant test cases is exemplified as follows:
[0124] First, if a functional test is to be performed on the test object, a test environment needs to be provided for the functional test device 10 provided in the embodiments of the present application. The test object is placed in a high and low temperature test chamber, and the functional test device 10 is placed on the experimental table outside the test chamber. Then, after connecting the interfaces of the test object (including the above-mentioned SMC20 under test, the above-mentioned bypass switch drive board 40 under test, and the above-mentioned bus switch drive board 50 under test) to the functional test device, the functional test device is started. After that, during the automatic execution of the test case process, the status data and alarm data of the test object can be sent to the above-mentioned functional test device (specifically, the above-mentioned test tooling host) through the corresponding interfaces. The functional test device can upload the status data and alarm data to the upper computer for sequential recording, automatically record the status changes of the test object during the test process, such as disconnection / loss of packets / check failure alarms of each interface, mis-triggering signals of the bypass switch, mis-triggering signals of the bus switch, failure of IGBT trigger signals, etc., and automatically judge the test results.
[0125] Here, the above-mentioned functional test device 10 can be connected to the upper computer 30 through the upper computer communication interface, and the status data of the above-mentioned test object can be uploaded to the above-mentioned upper computer 30 through the above-mentioned functional test device 10 for the tester to view. At the same time, the SMC20 under test is also connected to the bypass switch drive board 40 under test and the bus switch drive board 50 under test through optical fibers respectively.
[0126] After the tester determines that the test object starts normally, the high and low temperature test chamber program can be started, heated to the aging delay temperature, and then the accelerated life test can be started. During the life test, relevant test cases are called to test the test object, and the upper computer can automatically record the test data according to the preset frequency.
[0127] An exemplary description of the test process of the test case is as follows:
[0128] Test Case 1: Functional Test of the Bus Switch Drive Board (the First Method):
[0129] The tester selects the test function 1 of the bus switch drive board through the host computer. After the FPGA in the test tooling host receives this test command at the interface, it can send the bus switch test command to the SMC20 under test through the battery management controller test interface (the BMC-related test interface) via protocol messages. After receiving the bus switch test command, the SMC20 under test generates a bus switch drive command according to the bus switch test command (after parsing the bus switch test command by the SMC20 under test, the encoded command is obtained, which can specifically be an optical fiber control command (such as a control command for constant light)), and sends the bus switch drive command to the bus switch drive board 50 under test. After receiving the bus switch drive command, the bus switch drive board 50 under test drives the main trigger circuit and the standby trigger circuit to output opening signals. At this time, the input status detection interface of the test tooling host can receive the input signals, and the FPGA of the test tooling host transmits the change information of the input signals back to the host computer for display.
[0130] Exemplarily, assume that before the test, the bus switch is in the off state. After receiving the input signal, the bus switch changes from the off state to the on state, that is, the above change information is that the bus switch changes from the off state to the on state.
[0131] Meanwhile, the test tooling host sends corresponding output signals to the switch feedback interface (input contact) of the bus switch drive board 50 under test. After receiving the input signal, the switch feedback interface of the bus switch drive board 50 under test will feedback the on state or off state of the bus switch through communication messages for display on the host computer. Here, the corresponding output signals refer to the signals corresponding to this bus switch test command.
[0132] Through the feedback information, it can be determined whether the bus switch drive board 50 under test can receive control commands and feedback signals, and whether it can control the bus switch to perform actions corresponding to the control commands according to the received control commands.
[0133] Test case 2: Function test of the bus switch drive board (the second method): The tester selects the test function 2 of the bus switch drive board card through the host computer. The test tooling host sends the bus switch test command to the bus switch drive board 50 under test through the fifth test interface. After receiving the control bus switch test command, the bus switch drive board 50 under test drives the main trigger circuit and the standby trigger circuit to output opening signals. Then, the input status detection interface of the test tooling host can receive the input signals, and the FPGA of the test tooling host transmits the change information of the input signals back to the host computer for display.
[0134] Meanwhile, the mainframe of the test tooling sends out corresponding output signals to the switch feedback interface (connected to the output signal interface) of the busbar switch drive board 50 under test. After receiving the output signal, the busbar switch drive board 50 under test will feedback the on-state or off-state of the busbar switch through a communication message and display it on the upper computer.
[0135] Test case 3: Function test of the bypass switch drive board (the first method):
[0136] The tester selects function 1 of the bypass switch drive board test through the upper computer. After the FPGA in the mainframe of the test tooling receives this test command at the interface, it can send a bypass switch test command to the SMC20 under test through the valve base controller test interface (VBC-related test interface) via a protocol message. After receiving the bypass switch test command, the SMC20 under test generates a bypass switch drive command according to the bypass switch test command (after parsing the bypass switch test command by the SMC20 under test, the encoded command is obtained, which can specifically be an optical fiber control command (such as a control command with constant light)). The bypass switch drive command is sent to the bypass switch drive board 40 under test. After receiving the bypass switch drive command, the bypass switch drive board 40 under test drives the output signals of the main trigger circuit and the standby trigger circuit. At this time, the input state detection interface of the mainframe of the test tooling can receive the input signal, and the FPGA of the mainframe of the test tooling transmits the change information of the input signal back to the upper computer for display.
[0137] Exemplarily, assume that before the test, the bypass switch is in the on-state. After receiving the input signal, the bypass switch changes from the on-state to the off-state, that is, the above change information is that the bypass switch changes from the on-state to the off-state.
[0138] Meanwhile, the mainframe of the test tooling sends out corresponding output signals to the switch feedback interface (input contact) of the bypass switch drive board 40 under test. After receiving the input signal, the switch feedback interface of the bypass switch drive board 40 under test will feedback the on-state or off-state of the bypass switch through a communication message and display it through the upper computer. Here, the corresponding output signal refers to the signal corresponding to this bypass switch test command.
[0139] Through the feedback information, it can be determined whether the bypass switch drive board 40 under test can receive control commands and feedback signals, and whether it can control the bypass switch to perform actions corresponding to the control commands according to the received control commands.
[0140] Test Case 4: Functional Test of Bypass Switch Driver Board (the Second Method): The tester selects the test function 2 of the bypass switch driver board card through the host computer. The test tooling mainframe sends a bypass switch test command to the bypass switch driver board 40 under test through the bypass switch driver board test interface. After receiving the control bypass switch test command, the bypass switch driver board 40 under test drives the main trigger circuit and the standby trigger circuit to output a trip signal, and then the input status detection interface of the test tooling mainframe can receive the input signal. The FPGA of the test tooling mainframe transmits the change information of the input signal back to the host computer for display.
[0141] Meanwhile, the test tooling mainframe sends a corresponding trip signal to the switch feedback interface (connected to the trip signal output interface) of the bypass switch driver board 40 under test. After receiving the trip signal, the bypass switch driver board 40 under test will feedback the on state or off state of the bypass switch through the communication message and display it through the host computer.
[0142] Test Case 5: Capacitance Voltage Acquisition Accuracy Test of SMC20
[0143] Among them, the SMC20 under test may include a capacitance voltage monitoring function module, and this test case is used to test the capacitance voltage acquisition accuracy of SMC20.
[0144] The host computer selects the capacitance voltage acquisition test task and controls the adjustable high-voltage power supply to output the voltage values of each test point. The voltage measurement values collected by the voltage acquisition module in the SMC20 under test are sent to the valve base controller test interface through the communication message. After the FPGA performs interface data parsing and processing, the accuracy calculation is performed on the read voltage measurement value and the voltage value output by the adjustable high-voltage power supply, and the capacitance voltage acquisition accuracy of the SMC can be determined. For example, if the test point voltage is 1000V and the voltage measurement value collected by the voltage acquisition module of the SMC20 under test is 999V, the capacitance voltage acquisition accuracy of the SMC20 under test can be calculated. The test tooling mainframe can also feedback the calculation result of the capacitance voltage acquisition accuracy to the host computer for display. Those skilled in the art can clearly understand that for the convenience and simplicity of description, the specific working processes of the systems, devices, and units described above can refer to the corresponding processes in the foregoing embodiments and will not be elaborated here.
[0145] Based on the above functional test device, an embodiment of the present application further provides a functional test method, which is applied to the functional test device described in any of the above embodiments, and mainly performs functional tests on the controller components of the energy storage valve sub-module. Please refer to Figure 7 , Figure 7The figure is a schematic implementation flowchart of a function testing method provided by an embodiment of the present application. It should be noted that the execution subject of the function testing method provided by the embodiment of the present application can specifically be the processor in the above-mentioned function testing device, for example, the FPGA in the test tooling host. Of course, the above-mentioned processor can also be other devices, and the present application does not make specific limitations here. As Figure 7 shown, the above-mentioned function testing method may include the following steps:
[0146] S701. Obtain test cases.
[0147] In some implementation manners, the above-mentioned function testing device may be communicatively connected to a host computer, and the above-mentioned test cases may be sent by a tester through the host computer. Exemplarily, software related to the function testing of each control device of the energy storage valve sub-module may be installed in the above-mentioned host computer. When the software is running on the above-mentioned host computer, the tester can input the test cases to be selected through the operation interface provided by the software, and the host computer can send the test cases to the function testing device so that the above-mentioned function testing device can obtain the above-mentioned test cases.
[0148] In other implementation manners, the above-mentioned host computer may also sequentially call relevant test cases according to a preset test process and send the called test cases to the above-mentioned function testing device so that the function testing device can obtain the above-mentioned test cases. Exemplarily, assuming that when the host computer is running software related to function testing, various test cases related to the test object may be stored in the software. When the software runs, it can call test cases from the preset various test cases and perform tests according to the preset test process.
[0149] In other implementation manners, the above-mentioned function testing device may also store test cases related to the test object. After the test environment of the function testing device is set up and the function testing device is powered on, it can obtain the test cases stored therein. Of course, it can also obtain the test cases stored therein after the test device is initialized.
[0150] S702. Determine a test object and a test command according to the test case.
[0151] In the embodiment, the above-mentioned test object includes each control device of the above-mentioned energy storage valve sub-module, such as the measured SMC, the measured busbar switch drive board, the measured bypass switch drive board, etc.
[0152] In a specific application, after the function testing device obtains a test case, it parses the test case and can determine the test object corresponding to the test case and the items to be tested, so as to determine the test commands related to the test items.
[0153] Exemplarily, taking the test case for the functional test of the busbar switch drive board (the above test case 1) as an example, it can be determined that the test objects are the SMC under test and the busbar switch drive board under test. The test commands may include controlling the battery management controller test interface to send a busbar switch test command to the SMC under test, controlling the input status detection interface to receive an input signal, and controlling the output signal output interface to output an output signal, etc.
[0154] Another exemplarily, taking the test case for testing the capacitance voltage acquisition accuracy of the SMC (the above test case 5) as an example, it can be determined that the test object is the SMC under test. The test commands may include controlling the adjustable high-voltage power supply to output the voltage values of each test point, and the valve base controller test interface to receive the communication message fed back by the SMC.
[0155] S703. Simulate the target working environment according to the test case.
[0156] Among them, the target working environment includes the working environment of the valve base controller, the working environment of the battery management controller, and / or the working environment of the insulated gate bipolar transistor.
[0157] In a specific application, after determining the test case, the working environment of the VBC can be simulated through the VBC simulation module, including the working voltage, working current, etc. of the VBC; the working environment of the BMC can be simulated through the BMC simulation module, including the working environment temperature, working voltage, working current, etc. of the BMC, and the working environment of the IGBT can be simulated through the IGBT simulation module, including the working environment temperature, working voltage, working current, etc. of the IGBT.
[0158] S704. Send a test command to the target interface of the test object in the target working environment, and receive a test feedback signal from the feedback interface of the test object.
[0159] From the test command, it can be determined which interface to send which test command to. Therefore, after simulating the target working environment corresponding to the current test case, the test command can be sent to the target interface according to the test command, so that the test object performs an action corresponding to the test command. Then, receive the test feedback signal of this test through the feedback interface of the test object, so as to determine whether the test object performs an action corresponding to the test command, which is convenient for determining the test result.
[0160] Exemplarily, taking the test case for the functional test of the busbar switch drive board (the above test case 1) as an example, the target interfaces include the battery management controller test interface and the output signal output interface, and the feedback interface is the input status detection interface. Among them, the test command output by the battery management controller test interface is the busbar switch test command, and the test command output by the output signal output interface is the output signal.
[0161] Exemplarily, taking the test case for the function test of the bypass switch drive board (the above test case 4) as an example, the target interfaces include the bypass switch drive board test interface and the trip signal output interface, and the feedback interface is the input status interface. Among them, the test command output by the bypass switch drive board test interface is the bypass switch test command, and the test command output by the trip signal output interface is the trip signal.
[0162] Exemplarily, taking the test case for the capacitance voltage acquisition accuracy of the SMC (the above test case 5) as an example, the above target test interface is the valve base controller test interface, and the feedback interface is also the above valve base controller test interface.
[0163] As can be seen from the above, the function test method provided in the embodiments of the present application is based on various interfaces required for the function tests of each control device of the energy storage valve sub-module provided by the above function test device, and can provide the target working environment required for the tests of each control device, can automatically simulate the target working environment corresponding to the test case according to the test case, and automatically send test commands to the target interfaces related to the test case, and receive feedback signals through the feedback interface, so as to realize the function test requirements of the control devices in the energy storage valve sub-module.
[0164] In some embodiments, in order to improve the test accuracy, after the function test device is powered on, the function test device will also perform an initialization operation.
[0165] In specific applications, please refer to Figure 8 , Figure 8 which is a schematic diagram of the implementation process of the initialization operation in the function test method provided in the embodiments of the present application. As shown in Figure 8 , the above initialization operation may include the following steps:
[0166] S801. Obtain the configuration file.
[0167] The above configuration file may include the configuration information of each interface and the master station communication point table information, and the file format of the above configuration file may be the XML format.
[0168] The above configuration file may be sent by the above master station. Of course, the above configuration file may also be set in the function test device.
[0169] S802. Check the configuration file and determine whether the check is successful. If so, execute S603; otherwise, pop up an error message.
[0170] Checking the configuration file may include operations such as verifying whether the configuration file is complete and whether the configuration file can be parsed.
[0171] S803. Determine the initialization data output by each interface according to the configuration file.
[0172] The initialization data is the default value corresponding to the test object connected to the interface.
[0173] S804. Control each interface to output the corresponding initialization data.
[0174] After controlling each interface to output the corresponding initialization data, the initialization of each interface and each test object can be achieved.
[0175] As can be seen from the above, through the above initialization operations, the test object and the functional test device can be restored to the initial state, improving the test accuracy.
[0176] In several embodiments provided by the present application, it should be understood that the disclosed systems, devices, and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point, the displayed or discussed mutual coupling or direct coupling or communication connection can be through some interfaces, and the indirect coupling or communication connection of the devices or units can be in electrical, mechanical, or other forms.
[0177] The units described as separate components may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they can be located in one place, or they can be distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.
[0178] In addition, in each embodiment of the present application, the functional units can be integrated in one processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit.
[0179] The above is only the specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present application can easily think of changes or substitutions, which should all be covered by the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.
Claims
1. A functional test device, characterized in that, Comprising: A valve base controller simulation module, including a valve base controller test interface; the valve base controller simulation module is used to simulate the working environment of the valve base controller according to a test case, and output a first test command through the valve base controller test interface; the first test command is a test command determined according to the test case, output by the valve base controller simulation module, and related to the test of the power module controller under test. An insulated gate bipolar transistor simulation module, including an insulated gate bipolar transistor test interface; the insulated gate bipolar transistor simulation module is used to simulate the working environment of the insulated gate bipolar transistor according to a test case, receive an insulated gate bipolar transistor control command through the insulated gate bipolar transistor test interface, and feedback the state of the insulated gate bipolar transistor through the insulated gate bipolar transistor test interface, wherein the insulated gate bipolar transistor control command is issued by the power module controller under test. And, a host computer communication interface.
2. The functional test device according to claim 1, wherein The functional test device further includes: A switch trigger module, including a bypass switch drive board test interface; A monitoring module, including an input state detection interface and an output signal output interface, wherein the input state detection interface obtains the input state feedback by the bypass switch; the output signal output interface outputs an output signal.
3. The functional test device according to claim 1, characterized in that, The functional test device further includes: A battery management controller simulation module, including a battery management controller test interface; the battery management controller simulation module is used to simulate the working environment of the battery management controller according to a test case, and output a second test command through the battery management controller test interface; the second test command is a test command determined according to the test case, output by the battery management controller simulation module, and related to the test of the power module controller under test.
4. The functional test device according to claim 2, wherein The switch trigger module further includes a busbar switch drive board connection interface; The input state detection interface also obtains the input state feedback by the busbar switch.
5. The functional test device according to claim 2, characterized in that, The functional test device includes a test tooling host and a test tooling slave; The test tooling host assembles the valve base controller simulation module, the switch trigger module, and the monitoring module; The test tooling slave assembles the insulated gate bipolar transistor simulation module; The test tooling host includes a slave communication interface, the test tooling slave includes a host communication interface, and the slave communication interface is communicatively connected to the host communication interface.
6. The functional test device according to claim 5, wherein, The test tooling host includes a power supply board, an interface board, a communication board, a processing board, an input board, and an output board.
7. The functional test device according to any one of claims 1 to 6, characterized in that The functional test device is provided with a plurality of redundant test interfaces.
8. The functional test device according to claim 1, characterized in that, The host computer communication interface is a network cable interface.
9. The functional test device according to claim 1, wherein, The valve base controller test interface and / or the insulated gate bipolar transistor test interface is a fiber optic interface.
10. A functional test method, characterized in that, Applied to the functional test device according to any one of claims 1 to 9, the functional test method includes: Obtaining a test case; Determining a test object and a test command according to the test case; Simulating a target working environment according to the test case; wherein the target working environment includes the working environment of the valve base controller, the working environment of the battery management controller, and / or the working environment of the insulated gate bipolar transistor. Send the test command to the target interface of the test object in the target working environment, and receive a test feedback signal from the feedback interface of the test object.
11. The functional test method according to claim 10, wherein Before obtaining the test case, the test method further includes: After the functional test device is powered on, perform an initialization operation.
12. The functional test method according to claim 11, wherein The performing an initialization operation after the functional test device is powered on includes: Obtain a configuration file; Verify the configuration file; When the configuration file verification is successful, determine the initialization data output by each interface according to the configuration file, where the initialization data is the default value corresponding to the test object connected to the interface; Control each interface to output the corresponding initialization data.