Performance detection device for electronic component production

Abstract

The invention discloses a performance detection device for electronic component production, and relates to the technical field of electronic component detection, the performance detection device comprises a rack assembly, a driving assembly, a clamping table assembly and a self-lifting assembly, and the clamping table assembly comprises a storage plate. When the STM32 conveying device is used, the STM32 can be accurately conveyed to a designated position only by starting the first electric push rod, the second electric push rod, the third electric push rod and the fourth electric push rod to the maximum stroke in sequence, and an expensive servo transmission mechanism is replaced; the four groups of probes which are simply and independently distributed are matched with the sliding plate and the trapezoidal plate to achieve the purpose of accurately butting STM32 specified test pins, an integrated probe station which is internally composed of a complex servo control system is replaced, power supply, burning, GPIO and communication detection can be automatically completed in the whole process, meanwhile, the comprehensive cost can be remarkably reduced, the structure is simple, and the cost is low. And the purposes of reducing cost and increasing efficiency are achieved, and the device is suitable for large-scale popularization and application.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic component detection, and particularly to a performance detection device for electronic component production. Background Art

[0002] During the production process of STM32 single-chip microcomputers in electronic components, performance detection is a key link to ensure product quality and reliability. By comprehensively verifying the power supply, programming, GPIO, and communication processing functions of STM32, defective products with unqualified parameters or defects can be effectively screened out, preventing unqualified products from entering the market. This kind of detection can not only detect potential problems such as short circuits and poor soldering in advance, prevent terminal product failures, but also significantly reduce after-sales repair and scrapping costs.

[0003] In the prior art, during the performance detection of STM32, comprehensive detection of power supply, programming, GPIO, and communication processing performance is required to effectively eliminate defective products in STM32. Existing automated detection devices need precise servo drive mechanisms to control the movement of STM32 and complete power supply, programming, GPIO, and communication performance detection through an integrated probe station. However, precise servo drive mechanisms and integrated probe stations on the market are expensive and have high maintenance costs, making them not suitable for large-scale popularization and use.

[0004] Therefore, a performance detection device for electronic component production is proposed to solve the problems mentioned in the above background art. Summary of the Invention

[0005] The purpose of the present invention is to provide a performance detection device for electronic component production to solve the problems mentioned in the above background art.

[0006] To achieve the above purpose, the present invention provides the following technical solution: A performance detection device for electronic component production, including: a frame assembly, a drive assembly, a clamping table assembly, and a self-lifting assembly. The clamping table assembly includes a placement plate, a limiting frame is fixedly connected to the top of the placement plate, a trapezoidal plate is fixedly connected to a position near the rear surface of the top of the limiting frame. The number of self-lifting assemblies is four, and each includes a mounting plate. A sliding plate is slidably connected to a position near the upper part of the front surface of the mounting plate. Outer inclined openings and inner inclined openings are symmetrically formed at positions near the outer side and the inner side of the bottom of the sliding plate respectively. An avoidance opening extending upward is formed at a position between the two inner inclined openings at the bottom of the sliding plate. The outer inclined openings, inner inclined openings, and avoidance opening cooperate with the trapezoidal plate.

[0007] Preferably, the frame assembly includes a U-shaped frame. A front plate is fixedly connected to the right surface of the U-shaped frame, and a rear plate is fixedly connected to the left surface of the U-shaped frame. Chutes are provided at positions near the top on the inner walls of the front and rear sides of the U-shaped frame. T-shaped bars are fixedly connected to the outer surfaces of the front and rear sides of the placement plate. Pulleys are rotatably connected to positions near the four corners inside the T-shaped bars. The T-shaped bars are arranged inside the chutes and the outer surfaces of the pulleys are in rolling fit with the inner walls of the chutes.

[0008] Preferably, connection frames are fixedly connected to positions near the upper part of the front surfaces of the four sliding plates. A first probe, a second probe, a third probe, and a fourth probe are respectively fixedly connected to the bottoms of the four connection frames. Springs are fixedly connected between the tops of the sliding plates and the inner tops of the mounting plates. A test mainframe is installed on the left surface of the rear plate. The test mainframe is electrically connected to the first probe, the second probe, the third probe, and the fourth probe through wires.

[0009] Preferably, the drive assembly includes a first electric push rod. The first electric push rod is fixedly connected to the left surface of the front plate and its telescopic end extends leftward. The telescopic end of the first electric push rod is fixedly connected to a first connecting plate extending forward. A second electric push rod with a telescopic end extending leftward is installed at a position near the right side of the outer surface of the first connecting plate. The telescopic end of the second electric push rod is fixedly connected to a second connecting plate extending downward. A third electric push rod with a telescopic end extending leftward is installed at a position near the right side of the outer surface of the second connecting plate.

[0010] Preferably, the telescopic end of the third electric push rod is fixedly connected to a third connecting plate extending backward. A fourth electric push rod with a telescopic end extending leftward is installed at a position near the right side of the outer surface of the third connecting plate. The telescopic end of the fourth electric push rod is fixedly connected to a fourth connecting plate. The placement plate is fixedly connected to a position near the top on the left surface of the fourth connecting plate. The outer surface of the fourth connecting plate is in sliding fit with the inner wall of the U-shaped frame.

[0011] Preferably, a through hole is provided at the top of the mounting plate. A rubber sleeve is adhesively connected to the inner wall of the through hole. A guide rod extending upward is fixedly connected to the top of the sliding plate. The outer surface of the guide rod is in sliding fit with the inner wall of the rubber sleeve. The spring is sleeved outside the guide rod.

[0012] Preferably, travel switches are installed at positions on the tops of the four mounting plates behind the through hole. The trigger levers of the travel switches cooperate with the guide rods. The four travel switches are all electrically connected to the test mainframe through wires.

[0013] Preferably, inclined openings are provided on the inner walls around the limiting frame. The bottom of the trapezoidal plate is in sliding fit with the position near the rear side of the top of the U-shaped frame and the trapezoidal plate is matched with the sliding plate in position.

[0014] Preferably, rotating seats are symmetrically and fixedly connected to the positions near the front side of the top of the limiting frame. A rotating shaft is rotatably connected between the outer surfaces of the two rotating seats. A soft rubber rod is sleeved on the outer surface of the rotating shaft, and the soft rubber rod is arranged in an X shape.

[0015] Preferably, a round rod is fixedly connected to the position on the outer surface of the soft rubber rod away from the rotating seat. Arc-shaped socket seats are symmetrically and fixedly connected to the positions near the rear side of the top of the limiting frame. The round rod and the top of the arc-shaped socket seat are snap-connected.

[0016] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0017] 1. When the present invention is used, only need to start the first electric push rod, the second electric push rod, the third electric push rod, and the fourth electric push rod in sequence to open to the maximum stroke, and then the STM32 can be accurately sent to the specified position, replacing the expensive servo drive mechanism. The four groups of simple and independently distributed probes cooperate with the sliding plate and the trapezoidal plate to achieve the purpose of accurately docking the specified test pins of the STM32, replacing the integrated probe station composed of a complex servo control system inside. And the whole process can automatically complete power supply, programming, GPIO and communication detection. At the same time, the comprehensive cost can be significantly reduced, and the structure is simple and easy to repair, achieving the purpose of reducing costs and increasing efficiency, and is suitable for large-scale popularization and use.

[0018] 2. When the present invention is used, after the STM32 on the placement table is in place, the sliding plate will move upward and squeeze the spring to contract and drive the guide rod to move upward. The guide rod squeezes and triggers the travel switch in the corresponding area. The travel switch will directly provide a binary signal to the test host to prompt that the STM32 has reached the position. Subsequently, the test host directly starts the corresponding test program according to the electrical signals sent by different travel switches, saving the process of real-time position calibration required by traditional automated detection equipment, having the effects of simplifying the hardware and reducing costs and simplifying the logic and reducing the hardware requirements of the test host, thereby further improving the automation degree of the present device and reducing the equipment cost.

[0019] 3. When the present invention is used, during the process of the sliding plate moving downward after the placement table drives the STM32 to be completely in place, the spring will generate a downward thrust to ensure that the sliding plate and the probe can smoothly descend to the specified height. And during the process, the friction generated when the guide rod slides inside the rubber sleeve provides a good damping effect, which can avoid damage to the probe and the STM32 caused by the too fast falling speed of the probe, improving the reliability of the present device.

[0020] 4. When the present invention is in use, when the STM32 is installed on the top of the storage board and placed inside the limit frame, under the action of the inclined opening, the STM32 will slide down to the designated position without additional adjustment operations. Then, the round rod is flipped towards the arc-shaped socket. At this time, the soft rubber rod will rotate with the rotating seat with the rotating shaft as the center. Then, after the round rod is engaged with the arc-shaped opening at the top of the arc-shaped socket, the X-shaped soft rubber rod will press on the top of the STM32 to fix it. At the same time, the X-shaped soft rubber rod will not block the test pins around the STM32. When removing the STM32 after the detection is completed, just pull the round rod upwards to separate it from the arc-shaped socket. This design has a simple structure and convenient operation, improving the clamping efficiency of the STM32. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 is a three-dimensional view of a performance detection device for electronic component production according to the present invention;

[0022] Figure 2 is an exploded view of a performance detection device for electronic component production according to the present invention;

[0023] Figure 3 is another three-dimensional view of a performance detection device for electronic component production according to the present invention;

[0024] Figure 4 is a three-dimensional view of a driving component of a performance detection device for electronic component production according to the present invention;

[0025] Figure 5 is an exploded view of a driving component of a performance detection device for electronic component production according to the present invention;

[0026] Figure 6 is a cross-sectional view of a performance detection device for electronic component production according to the present invention;

[0027] Figure 7 is a schematic structural diagram of a clamping table component of a performance detection device for electronic component production according to the present invention;

[0028] Figure 8 is a schematic structural diagram of a self-lifting component of a performance detection device for electronic component production according to the present invention;

[0029] Figure 9 is a schematic diagram of the movement of a trapezoidal plate of a performance detection device for electronic component production according to the present invention.

[0030] In the figure: 1. Frame assembly; 101. U-shaped frame; 102. Front plate; 103. Chute; 104. Rear plate; 105. Test host; 2. Driving assembly; 201. First electric push rod; 202. First connecting plate; 203. Second electric push rod; 204. Second connecting plate; 205. Third electric push rod; 206. Third connecting plate; 207. Fourth electric push rod; 208. Fourth connecting plate; 3. Clamping table assembly; 301. Object placing plate; 302. T-shaped bar; 303. Pulley; 304. Limit frame; 305. Tilted opening; 306. Trapezoidal plate; 307. Rotating seat; 308. Rotating shaft; 309. Soft rubber rod; 310. Round rod; 311. Arc-shaped socket; 4. Self-lifting assembly; 401. Mounting plate; 402. Sliding plate; 403. Connecting frame; 404. Guide rod; 405. Through opening; 406. Rubber sleeve; 407. Spring; 408. Travel switch; 409. Outer beveled opening; 410. Inner beveled opening; 411. Avoidance opening; 51. First probe; 52. Second probe; 53. Third probe; 54. Fourth probe. Detailed implementation mode

[0031] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0032] Embodiment 1: Please refer to Figures 1-9 As shown in the figure, the present invention provides a technical solution: a performance detection device for electronic component production, including: a frame assembly 1, a driving assembly 2, a clamping table assembly 3 and a self-lifting assembly 4. The clamping table assembly 3 includes an object placing plate 301. A limit frame 304 is fixedly connected to the top of the object placing plate 301. A trapezoidal plate 306 is fixedly connected to the position near the rear surface of the top of the limit frame 304. There are four self-lifting assemblies 4, each including a mounting plate 401. A sliding plate 402 is slidably connected to the position near the upper part of the front surface of the mounting plate 401. Outer beveled openings 409 and inner beveled openings 410 are symmetrically opened at the positions near the outer side and the inner side of the bottom of the sliding plate 402 respectively. An upward-extending avoidance opening 411 is opened at the position between the two inner beveled openings 410 at the bottom of the sliding plate 402. The outer beveled openings 409, the inner beveled openings 410 and the avoidance opening 411 cooperate with the trapezoidal plate 306.

[0033] The frame assembly 1 includes a U-shaped frame 101. A front plate 102 is fixedly connected to the right surface of the U-shaped frame 101. A rear plate 104 is fixedly connected to the left surface of the U-shaped frame 101. Chutes 103 are provided at positions near the top on the inner surfaces of the front and rear sides of the U-shaped frame 101. T-shaped bars 302 are fixedly connected to the outer surfaces of the front and rear sides of the storage plate 301. Pulleys 303 are rotatably connected to positions near the four corners inside the T-shaped bars 302. The T-shaped bars 302 are arranged inside the chutes 103 and the outer surfaces of the pulleys 303 are in rolling contact with the inner walls of the chutes 103.

[0034] Connecting frames 403 are fixedly connected to positions near the upper part of the front surfaces of the four sliding plates 402. A first probe 51, a second probe 52, a third probe 53, and a fourth probe 54 are respectively fixedly connected to the bottoms of the four connecting frames 403. Springs 407 are fixedly connected between the tops of the sliding plates 402 and the inner top of the mounting plate 401. A test host 105 is installed on the left surface of the rear plate 104. The test host 105 is electrically connected to the first probe 51, the second probe 52, the third probe 53, and the fourth probe 54 through wires.

[0035] The drive assembly 2 includes a first electric push rod 201. The first electric push rod 201 is fixedly connected to the left surface of the front plate 102 and its telescopic end extends to the left. The telescopic end of the first electric push rod 201 is fixedly connected to a first connecting plate 202 extending forward. A second electric push rod 203 with a telescopic end extending to the left is installed at a position near the right side of the outer surface of the first connecting plate 202. The telescopic end of the second electric push rod 203 is fixedly connected to a second connecting plate 204 extending downward. A third electric push rod 205 with a telescopic end extending to the left is installed at a position near the right side of the outer surface of the second connecting plate 204.

[0036] The telescopic end of the third electric push rod 205 is fixedly connected to a third connecting plate 206 extending backward. A fourth electric push rod 207 with a telescopic end extending to the left is installed at a position near the right side of the outer surface of the third connecting plate 206. The telescopic end of the fourth electric push rod 207 is fixedly connected to a fourth connecting plate 208. The storage plate 301 is fixedly connected to a position near the top of the left surface of the fourth connecting plate 208. The outer surface of the fourth connecting plate 208 is in sliding contact with the inner wall of the U-shaped frame 101.

[0037] Steps of using the present invention: When in use, place the STM32 inside the limiting frame 304 at the top of the placing board 301 for fixation. Then, start the first electric push rod 201, the second electric push rod 203, the third electric push rod 205, and the fourth electric push rod 207 in sequence to extend to the maximum stroke. The first electric push rod 201 will drive the second electric push rod 203, the third electric push rod 205, the fourth electric push rod 207, and the fourth connecting plate 208 to move leftward by a specified stroke through the first connecting plate 202. The fourth connecting plate 208 drives the placing board 301 to move leftward, so that the STM32 is accurately moved to directly below the first probe 51 on the far right. During this process, when the trapezoidal plate 306 contacts the outer bevel 409 at the bottom of the sliding plate 402 during movement, it will push the sliding plate 402 upward. The connecting frame 403 will drive the first probe 51 to move upward following the sliding plate 402. When the trapezoidal plate 306 reaches the avoidance opening 411 at the bottom of the sliding plate 402, the sliding plate 402 will move downward to reset. At this time, the trapezoidal plate 306 is located inside the avoidance opening 411. Thus, when the STM32 approaches the first probe 51, the first probe 51 will automatically rise for avoidance. After the STM32 reaches directly below the first probe 51, the first probe 51 will complete a straight downward fall and contact the power supply pin of the STM32. The adjustable power supply is integrated inside the test host 105 to replace the external power supply, the integrated STM32 flashing firmware replaces the ST-Link debugger, and directly driving / detecting signals through the GPIO expansion board replaces the logic analyzer. All its internal modules are commercially available products and have a low cost. The first probe 51, the second probe 52, the third probe 53, and the fourth probe 54 select inexpensive spring pins on the market and are grouped and fixed on the board to replace the integrated probe station, and its cost can be greatly reduced. The test host 105 applies 3. to the STM32 through the first probe 51.After measuring the static current at 3V voltage, the power supply performance is detected and recorded. When the second electric push rod 203 extends to the maximum stroke, it will drive the third electric push rod 205 and the fourth electric push rod 207 to move leftward by a specified stroke again through the second connecting plate 204. During this process, when the inclined surface of the trapezoidal plate 306 abuts against the inner inclined opening 410 at the bottom of the sliding plate 402, the sliding plate 402 and the first probe 51 will be jacked up again. Subsequently, the trapezoidal plate 306 enters the avoidance opening 411 under another sliding plate 402. At this time, the second probe 52 will perform the same action as the first probe 51 and then accurately dock with the debugging pin of the STM32. Subsequently, the test host 105 cooperates with the second probe 52 and injects and burns the test program through the SWD protocol, reads the Flash content to verify the integrity, and then records the data. Subsequently, after the third electric push rod 205 and the fourth electric push rod 207 are started, the placement plate 301 and the STM32 will be accurately sent under the third probe 53 and the fourth probe 54 by means of the third connecting plate 206 and the fourth connecting plate 208, so that the third probe 53 and the fourth probe 54 are accurately docked with the GPIO pins and serial port pins of the STM32. After that, the testing machine 105 cooperates with the third probe 53 to pull up / pull down PA0 - PA3 in sequence, detects the output voltage with a comparator and records the GPIO test data. After inputting signal data to the STM32 through the fourth probe 54, it records whether the signal data returned by the STM32 is complete, thereby completing the communication test. When this device is in use, only need to start the first electric push rod 201, the second electric push rod 203, the third electric push rod 205, and the fourth electric push rod 207 in sequence to the maximum stroke, then the STM32 can be accurately sent to the specified position, replacing the expensive servo drive mechanism. The four groups of simple and independently distributed probes cooperate with the sliding plate 402 and the trapezoidal plate 306 to achieve the purpose of accurately docking with the specified test pins of the STM32, replacing the integrated probe station composed of a complex servo control system inside. And the whole process can automatically complete power supply, burning, GPIO and communication detection. At the same time, the comprehensive cost can be significantly reduced, and the structure is simple and easy to repair, achieving the purpose of cost reduction and efficiency increase, and is suitable for large-scale popularization and use. During the movement of the placement plate 301, the T-shaped strip 302 slides inside the chute 103, playing a role in slidingly connecting the placement plate 301 inside the U-shaped frame 101. The design of the pulley 303 is mainly used to reduce the friction between the T-shaped strip 302 and the inner wall of the chute 103.

[0038] Embodiment 2: As Figures 1-3 and Figure 8 shown, the difference based on the combination of the embodiments lies in that a through hole 405 is opened at the top of the mounting plate 401, a rubber sleeve 406 is adhesively connected to the inner wall of the through hole 405, a guide rod 404 extending upward is fixedly connected to the top of the sliding plate 402, the outer surface of the guide rod 404 slides and fits with the inner wall of the rubber sleeve 406, and a spring 407 is sleeved outside the guide rod 404.

[0039] At the positions where the tops of the four mounting plates 401 are located at the rear side of the through port 405, travel switches 408 are installed. The travel switches 408 trigger the cooperation of the toggle lever and the guide rod 404, and the four travel switches 408 are all electrically connected to the test host 105 through wires.

[0040] The using steps of the present invention are as follows. When in use, when the sliding plate 402 moves upward, it will squeeze the spring 407 to contract and drive the guide rod 404 to move upward. During this process, the guide rod 404 squeezes and triggers the travel switch 408 in the corresponding area. The travel switch 408 will directly provide a binary signal to the test host 105 to indicate that the STM32 has reached the position. Subsequently, the test host 105 directly starts the corresponding test program according to the electrical signals sent by different travel switches 408, eliminating the process of real-time position calibration required by traditional automated detection equipment. It has the effects of simplifying the hardware to reduce costs and simplifying the logic to reduce the hardware requirements of the test host, thereby further improving the automation degree of the device and reducing the equipment cost. When the sliding plate 402 moves downward, the spring 407 will generate a downward thrust to ensure that the sliding plate 402 and the probe can smoothly descend to the specified height. And during the process, the frictional force generated when the guide rod 404 slides inside the rubber sleeve 406 provides a good damping effect, which can avoid damage to the probe and the STM32 caused by the too fast falling speed of the probe, improving the reliability of the device.

[0041] Embodiment 3: As Figures 1-3 and Figure 7 shown, the difference based on the combination of the embodiments is that inclined openings 305 are provided on the inner walls around the limit frame 304. The bottom of the trapezoidal plate 306 is slidably attached to the top of the U-shaped frame 101 near the rear side, and the trapezoidal plate 306 is matched with the position of the sliding plate 402.

[0042] Rotating seats 307 are symmetrically and fixedly connected to the position of the limit frame 304 near the front side at the top. A rotating shaft 308 is rotatably connected between the outer surfaces of the two rotating seats 307. A soft rubber rod 309 is sleeved on the outer surface of the rotating shaft 308, and the soft rubber rod 309 is arranged in an X shape.

[0043] A round rod 310 is fixedly connected to the outer surface of the soft rubber rod 309 at a position far from the rotating seat 307. Arc-shaped socket seats 311 are symmetrically and fixedly connected to the position of the limit frame 304 near the rear side at the top. The round rod 310 and the top of the arc-shaped socket seat 311 are in snap connection.

[0044] The usage steps of the present invention are as follows. When in use, when the STM32 is placed inside the limiting frame 304 with a special size, the STM32 will slide down to the designated position on the top of the placement board 301 under the action of the inclined opening 305 without the need for additional adjustment operations. Subsequently, the round rod 310 is flipped towards the arc-shaped socket 311, and the soft rubber rod 309 will rotate with the rotating seat 307 with the rotation axis 308 as the center. Then, after the round rod 310 is engaged with the arc-shaped opening at the top of the arc-shaped socket 311, the X-shaped soft rubber rod 309 will press on the top of the STM32 to fix it. At the same time, the X-shaped soft rubber rod 309 will not block the test pins around the STM32. When removing the STM32 after the detection is completed, just pull the round rod 310 upwards to separate it from the arc-shaped socket 311. This design has a simple structure and convenient operation, improving the clamping efficiency of the STM32. The soft rubber rod 309 is composed of an internal metal sheet and an external silicone layer, with a certain extensibility, which can effectively press the STM32 on the placement board 301 without causing damage.

[0045] The effect and working principle achieved by the entire mechanism are as follows: when using the device to perform performance testing on STM32, it is placed on the inner side of the limit frame 304 at the top of the storage plate 301 and fixed, and then the first electric push rod 201, the second electric push rod 203, the third electric push rod 205 and the fourth electric push rod 207 are started in sequence to extend to the maximum stroke. When the first electric push rod 201 is extended to the maximum stroke, it will drive the second electric push rod 203, the third electric push rod 205, the fourth electric push rod 207 and the fourth connecting plate 208 to move to the left by a specified stroke through the first connecting plate 202. At this time, the fourth connecting plate 208 will drive the storage plate 301 to move to the left by a specified distance, thereby allowing the STM32 to accurately move to the bottom of the first probe 51 at the bottom of the rightmost connection frame 403, and in the process, follow the limit on the top of the storage plate 301 When the moving trapezoidal plate 306 of the frame 304 contacts the outer oblique opening 409 at the bottom of the sliding plate 402 during the movement, the sliding plate 402 will be lifted up. At this time, the connecting frame 403 will drive the first probe 51 to move upward with the sliding plate 402. When the trapezoidal plate 306 reaches the avoidance opening 411 at the bottom of the sliding plate 402, the sliding plate 402 will move downward to reset. At this time, the trapezoidal plate 306 is located inside the avoidance opening 411 and does not conflict with the sliding plate 402. As a result, when the STM32 approaches the first probe 51, the first probe 51 will automatically rise to avoid it. After the STM32 reaches directly below the first probe 51, the first probe 51 will complete a straight fall and contact the power pin of the STM32. Then, the test host 105 applies 3.After measuring the static current at 3V voltage, the power supply performance is detected and recorded. Subsequently, when the second electric push rod 203 extends to the maximum stroke, it will drive the third electric push rod 205 and the fourth electric push rod 207 to move leftward by a specified stroke again through the second connecting plate 204. During this process, when the inclined surface of the trapezoidal plate 306 abuts against the inner inclined opening 410 at the bottom of the sliding plate 402, the sliding plate 402 and the first probe 51 will be jacked up again. Subsequently, the trapezoidal plate 306 enters the avoidance opening 411 under another sliding plate 402. At this time, the second probe 52 will perform the same action as the first probe 51 and then accurately dock with the debugging pins of the STM32. Subsequently, the test host 105 cooperates with the second probe 52 and injects and burns the test program through the SWD protocol, reads the Flash content to verify the integrity, and then records the data. Subsequently, after the third electric push rod 205 and the fourth electric push rod 207 are started, the placement plate 301 and the STM32 will be accurately sent under the third probe 53 and the fourth probe 54 by means of the third connecting plate 206 and the fourth connecting plate 208, so that the third probe 53 and the fourth probe 54 are accurately docked with the GPIO pins and serial port pins of the STM32. After that, the testing machine 105 cooperates with the third probe 53 to sequentially pull high / pull low PA0 - PA3, detects the output voltage with a comparator, and then records the GPIO test data. After inputting signal data to the STM32 through the fourth probe 54, it records whether the signal data returned by the STM32 is complete, thereby completing the communication test. When this device is in use, only need to start the first electric push rod 201, the second electric push rod 203, the third electric push rod 205, and the fourth electric push rod 207 in sequence to the maximum stroke, and then the STM32 can be accurately sent to the specified position, replacing the expensive servo drive mechanism. The four groups of simple and independently distributed probes cooperate with the sliding plate 402 and the trapezoidal plate 306 to achieve the purpose of accurately docking with the specified test pins of the STM32, replacing the integrated probe station composed of a complex servo control system inside. And the whole process can automatically complete power supply, burning, GPIO and communication detection. At the same time, the comprehensive cost can be significantly reduced, and the structure is simple and easy to repair, achieving the purpose of reducing costs and increasing efficiency, and is suitable for large-scale popularization and use;.

[0046] During use, when the sliding plate 402 moves upward under the resistance of the trapezoidal plate 306, the top of the sliding plate 402 will squeeze the spring 407 to contract and drive the guide rod 404 to move upward. During the process, the guide rods 404 at different positions will squeeze and trigger the travel switch 408 of the corresponding functional detection area. During the process, the travel switch 408 will directly provide a binary signal to the test host 105 to prompt that the STM32 is in place. Then the test host 105 directly starts the corresponding test program according to the electrical signals sent by different travel switches 408, eliminating the process of real-time position calibration required by traditional automated detection equipment, and has the effect of simplifying hardware to reduce costs and simplifying logic to reduce the hardware requirements of the test host, thereby further improving the automation level of the device and reducing the equipment cost. During the downward movement of the sliding plate 402, the spring 407 will generate a downward thrust to ensure that the sliding plate 402 and the probe can be smoothly lowered to the specified height, and the friction generated by the guide rod 404 during the sliding down of the rubber sleeve 406 provides a good damping effect, which can avoid the probe from falling too fast and causing damage to the probe and STM32, thereby improving the reliability of the device;

[0047] When in use, when the STM32 is installed on the top of the storage plate 301 and placed inside the limit frame 304 of a special size, the STM32 will slide down to the specified position on the top of the storage plate 301 under the action of the inclined mouth 305, and no additional adjustment operation is required. Then the round rod 310 is flipped toward the arc-shaped holder 311. At this time, the soft rubber rod 309 will rotate with the rotating seat 307 with the rotating shaft 308 as the center of the circle. Then, after the round rod 310 and the arc-shaped mouth at the top of the arc-shaped holder 311 are engaged, the X-shaped soft rubber rod 309 will press on the top of the STM32 to fix it. At the same time, the X-shaped soft rubber rod 309 will not block the test pins around the STM32. When the STM32 is removed after the detection is completed, the round rod 310 is pulled upward to separate it from the arc-shaped holder 311. This design has a simple structure and is easy to operate, which improves the clamping efficiency of the STM32.

[0048] Although the present invention has been described in detail with reference to the aforementioned embodiments, it is still possible for those skilled in the art to modify the technical solutions described in the aforementioned embodiments, or to make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A performance detection device for electronic component production, characterized in that, Including: a frame assembly (1), a drive assembly (2), a clamping table assembly (3), and a self-lifting assembly (4); The clamping table assembly (3) includes a placement plate (301), a limiting frame (304) is fixedly connected to the top of the placement plate (301), and a trapezoidal plate (306) is fixedly connected to a position near the rear surface of the top of the limiting frame (304); There are four self-lifting assemblies (4), each including a mounting plate (401). A sliding plate (402) is slidably connected to a position near the upper part of the front surface of the mounting plate (401). Outer inclined openings (409) and inner inclined openings (410) are symmetrically formed at positions near the outer side and the inner side of the bottom of the sliding plate (402) respectively. An avoidance opening (411) extending upward is formed at a position between the two inner inclined openings (410) at the bottom of the sliding plate (402). The outer inclined opening (409), the inner inclined opening (410), and the avoidance opening (411) cooperate with the trapezoidal plate (306).

2. The performance detection device for electronic component production according to claim 1, characterized in that: The frame assembly (1) includes a U-shaped frame (101). A front plate (102) is fixedly connected to the right surface of the U-shaped frame (101). A rear plate (104) is fixedly connected to the left surface of the U-shaped frame (101). Chute grooves (103) are formed at positions near the top of the inner walls on the front and rear sides of the U-shaped frame (101). T-shaped bars (302) are fixedly connected to the outer surfaces on the front and rear sides of the placement plate (301). Pulleys (303) are rotatably connected to positions near the four corners inside the T-shaped bars (302). The T-shaped bars (302) are arranged inside the chute grooves (103), and the outer surfaces of the pulleys (303) are in rolling contact with the inner walls of the chute grooves (103).

3. The performance detection device for electronic component production according to claim 2, characterized in that: Connection frames (403) are fixedly connected to positions near the upper part of the front surfaces of the four sliding plates (402). A first probe (51), a second probe (52), a third probe (53), and a fourth probe (54) are respectively fixedly connected to the bottoms of the four connection frames (403). A spring (407) is fixedly connected between the top of the sliding plate (402) and the inner top of the mounting plate (401). A test mainframe (105) is installed on the left surface of the rear plate (104). The test mainframe (105) is electrically connected to the first probe (51), the second probe (52), the third probe (53), and the fourth probe (54) through wires.

4. The performance detection device for electronic component production according to claim 1, wherein: The drive assembly (2) includes a first electric push rod (201). The first electric push rod (201) is fixedly connected to the left surface of the front plate (102) and its telescopic end extends leftward. The telescopic end of the first electric push rod (201) is fixedly connected to a first connecting plate (202) extending forward. A second electric push rod (203) with a telescopic end extending leftward is installed at a position near the right side of the outer surface of the first connecting plate (202). The telescopic end of the second electric push rod (203) is fixedly connected to a second connecting plate (204) extending downward. A third electric push rod (205) with a telescopic end extending leftward is installed at a position near the right side of the outer surface of the second connecting plate (204).

5. The performance detection device for electronic component production according to claim 4, characterized in that: The telescopic end of the third electric push rod (205) is fixedly connected with a third connecting plate (206) extending backward. A fourth electric push rod (207) with a telescopic end extending leftward is installed at a position near the right side of the outer surface of the third connecting plate (206). The telescopic end of the fourth electric push rod (207) is fixedly connected with a fourth connecting plate (208). The storage plate (301) is fixedly connected to a position near the top of the left surface of the fourth connecting plate (208). The outer surface of the fourth connecting plate (208) is in sliding fit with the inner wall of the U-shaped frame (101).

6. The performance detection device for electronic component production according to claim 3, characterized in that: A through hole (405) is formed at the top of the mounting plate (401). A rubber sleeve (406) is adhesively connected to the inner wall of the through hole (405). A guide rod (404) extending upward is fixedly connected to the top of the sliding plate (402). The outer surface of the guide rod (404) is in sliding fit with the inner wall of the rubber sleeve (406). A spring (407) is sleeved outside the guide rod (404).

7. The performance detection device for electronic component production according to claim 1, wherein: Four travel switches (408) are installed at positions behind the through hole (405) at the top of the mounting plates (401). The trigger lever of the travel switch (408) cooperates with the guide rod (404). All four travel switches (408) are electrically connected to the test host (105) through wires.

8. The performance detection device for electronic component production according to claim 1, wherein: Inclined openings (305) are formed in the inner walls around the limiting frame (304). The bottom of the trapezoidal plate (306) is in sliding fit with the top of the U-shaped frame (101) near the rear side, and the trapezoidal plate (306) is in cooperation with the sliding plate (402) in position.

9. The performance detection device for electronic component production according to claim 1, characterized in that: Rotating seats (307) are symmetrically and fixedly connected to the top of the limiting frame (304) near the front side. A rotating shaft (308) is rotatably connected between the outer surfaces of the two rotating seats (307). A soft rubber rod (309) is sleeved on the outer surface of the rotating shaft (308). The soft rubber rod (309) is arranged in an X shape.

10. The performance detection device for electronic component production according to claim 9, characterized in that: A round rod (310) is fixedly connected to the outer surface of the soft rubber rod (309) at a position far from the rotating seat (307). Arc-shaped socket seats (311) are symmetrically and fixedly connected to the top of the limiting frame (304) near the rear side. The round rod (310) is in snap connection with the top of the arc-shaped socket seat (311).

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