An independently monitored storage system and method

Abstract

The application relates to the technical field of memories, in particular to an independently monitored storage system and method, which comprises a plurality of sub memories, a physical parameter acquisition module, a controller, a parameter monitoring module in the controller, a receiving unit, an encoding determination unit, a sending unit, a reference range determination unit, a judging unit, a first marking unit, a curve generation unit, a prediction unit for predicting the final temperature parameter and the final vibration frequency parameter of the corresponding sub memory when the sub memory transmits the to-be-stored data packet according to the data volume of the to-be-stored data packet, the data volume of the test packet and the vibration frequency curve and the temperature change curve of each to-be-used sub memory, a second marking unit, a selection unit for selecting the final sub memory according to a second preset condition, and a handshake unit. The application has the effects of monitoring the real-time working conditions of each sub memory and realizing faster and more lossless access of target data.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of memory, in particular to an independently monitored storage system and method. BACKGROUND

[0002] The storage capacity of memory is advancing rapidly according to Moore's Law. Currently, both consumer-level memory and server-level memory tend to store a large amount of data information. Large-scale storage devices are usually arrayed storage devices. Compared with traditional memory, arrayed memory uses a parallel access mode, which can achieve faster write speed and lower latency. When accessing arrayed storage devices using the parallel access mode, theoretically, the working state of each individual sub-memory needs to be investigated and an algorithm based on the working state of each chip needs to be scheduled. Each individual sub-memory often has a large number of operating parameters to be monitored, including but not limited to storage space, working conditions (temperature, humidity, etc.), clock frequency, fault conditions, etc. It is difficult to comprehensively monitor these parameters (especially physical parameters) in the prior art, and there is no suitable algorithm to reasonably summarize and utilize the data obtained by monitoring. SUMMARY

[0003] In order to realize real-time monitoring of each sub-memory, to realize reasonable access scheduling based on the monitoring data, and to realize faster and lossless access to target data, the present application provides an independently monitored storage system and method.

[0004] The above-mentioned application object of the present application is achieved by the following technical scheme:

[0005] An independently monitored storage system and method, comprising:

[0006] a plurality of sub-memories;

[0007] a physical parameter acquisition module, the physical parameters including decibel information, vibration frequency and temperature information, the physical parameter acquisition module including a noise detection unit for acquiring decibel information, a vibration detection unit for acquiring vibration frequency of each sub-memory, and a temperature detection unit for acquiring temperature information of each sub-memory;

[0008] a controller, the controller storing an encoding sequence list, the sequence list being a mapping table about encoding of the sub-memory and type of the sub-memory;

[0009] the controller including a parameter monitoring module, the parameter monitoring module including a read-write monitoring unit for acquiring write speed parameters, and a response time monitoring unit for acquiring response time parameters;

[0010] the controller further comprising:

[0011] a receiving unit configured to receive a storage request carrying storage information, the storage information including a data amount (data type, etc.) of a data packet to be stored;

[0012] a code determining unit configured to determine a code of a storable sub-memory according to the data amount of the data packet to be stored carried by the storage request and a remaining capacity of each sub-memory;

[0013] a sending unit configured to send the test packet to each storable sub-memory, send a collection start signal to a collection module, and send a monitoring signal to a parameter monitoring module; after receiving the monitoring start signal, the collection module starts to collect decibel information with a preset monitoring time and vibration frequency and temperature information of each storable sub-memory; after receiving the monitoring signal, the parameter monitoring module starts to collect a write speed parameter and a response time parameter of each storable sub-memory; the data amount of the test packet is determined according to the write speed of each sub-memory and the preset monitoring time;

[0014] an analysis module configured to select a final sub-memory according to the type of each storable sub-memory, the data amount of the data packet to be stored, the data amount of the test packet, and physical parameters;

[0015] a handshake unit configured to establish a connection with a sending end to store the data packet to be stored.

[0016] In a preferred example, the application can be further configured such that the analysis module includes:

[0017] a reference range determining unit configured to determine a write speed parameter reference range and a response time parameter reference range of each storable sub-memory according to a collected initial temperature value and the type of each storable sub-memory;

[0018] a judging unit configured to judge whether the average value of the write speed parameter is within the write speed parameter reference range of each sub-memory and whether the response time parameter is within the response time parameter reference range of each sub-memory;

[0019] a first marking unit configured to mark the storable sub-memory as a sub-memory to be used if the average value of the write speed parameter of the storable sub-memory is within the write speed parameter reference range of each sub-memory and the response time parameter is within the response time parameter reference range of each sub-memory;

[0020] a curve generating unit configured to generate a vibration frequency curve of each storable sub-memory and a temperature change curve of each storable sub-memory according to the collected vibration frequency and temperature information of each storable sub-memory, and generate a decibel change curve according to the collected decibel information;

[0021] a prediction unit configured to predict, according to the data volume of the data packet to be stored, the data volume of the test packet, and the vibration frequency curve and the temperature change curve of each sub-memory to be used, a completion temperature parameter and a completion vibration frequency parameter of each sub-memory when the data packet to be stored is completely transmitted;

[0022] a second marking unit configured to mark the sub-memory to be used whose completion temperature parameter and completion vibration frequency parameter satisfy the first preset condition as an available sub-memory;

[0023] a selection unit configured to select the final sub-memory according to a second preset condition.

[0024] In a preferred example, the application can be further configured to further comprise:

[0025] a rejection unit configured to, if the decibel information exceeds the preset value, infer a faulty sub-memory according to the decibel change curve and the vibration frequency curve of each sub-memory, and reject the faulty sub-memory from the sub-memory to be used.

[0026] In a preferred example, the application can be further configured to: the storage request further carries label information, and the label information includes an urgent label and a no requirement label;

[0027] The second preset condition includes:

[0028] If the urgent label is received, the available sub-memory with the maximum average speed of the write speed parameter is selected as the final sub-memory.

[0029] In a preferred example, the application can be further configured to: the second preset condition further includes:

[0030] If the no requirement label is received, the available sub-memory with the minimum remaining capacity is selected as the final sub-memory.

[0031] In a preferred example, the application can be further configured to: the sequence table further stores an abnormal temperature threshold and an abnormal vibration frequency threshold of each sub-memory;

[0032] The first preset condition refers to that the completion temperature parameter of each sub-memory does not exceed the corresponding abnormal temperature threshold, and the completion vibration frequency parameter of each sub-memory does not exceed the corresponding abnormal vibration frequency threshold.

[0033] The above-mentioned second application purpose of the application is achieved by the following technical scheme:

[0034] An independent monitoring storage method of an independent monitoring storage system, comprising:

[0035] receiving a storage request carrying storage information, the storage information including a data volume of a data packet to be stored;

[0036] determining the encoding of the storable sub-memory according to the data volume of the data packet to be stored carried by the storage request and the residual capacity of each sub-memory;

[0037] sending the test packet to each storable sub-memory, sending a collection start signal to the collection module, and sending a monitoring signal to the parameter monitoring module;

[0038] selecting the final sub-memory according to the type of each storable sub-memory, the data volume of the data packet to be stored, the data volume of the test packet, and the physical parameters;

[0039] establishing a connection with the sending end to store the data packet to be stored.

[0040] In a preferred example, the application can be further configured to select the final sub-memory according to the type of each storable sub-memory, the data volume of the data packet to be stored, the data volume of the test packet, and the physical parameters, including:

[0041] determining the write speed parameter reference range and the response time parameter reference range of each storable sub-memory according to the collected initial temperature value and the type of each storable sub-memory;

[0042] determining whether the average value of the write speed parameter is within the write speed parameter reference range of each sub-memory and whether the response time parameter is within the response time parameter reference range of each sub-memory;

[0043] if the average value of the write speed parameter of the storable sub-memory is within the write speed parameter reference range of each sub-memory and the response time parameter is within the response time parameter reference range of each sub-memory, marking the storable sub-memory as a standby sub-memory;

[0044] generating the vibration frequency curve of each storable sub-memory and the temperature change curve of each storable sub-memory according to the collected vibration frequency and temperature information of each storable sub-memory, and generating the decibel change curve according to the collected decibel information;

[0045] predicting the completion temperature parameter and the completion vibration frequency parameter of the corresponding sub-memory when the data packet to be stored is completely transmitted according to the data volume of the data packet to be stored, the data volume of the test packet, and the vibration frequency curve and the temperature change curve of each standby sub-memory;

[0046] marking the standby sub-memory whose completion temperature parameter and completion vibration frequency parameter satisfy the first preset condition as a usable sub-memory;

[0047] The final sub-memory is selected according to a second preset condition.

[0048] The application can be further configured in a preferred example to further include, before marking the standby sub-memory whose end temperature parameter and end vibration frequency parameter satisfy the first preset condition as an available sub-memory:

[0049] If the decibel information exceeds a preset value, a faulty sub-memory is inferred according to the decibel change curve and the vibration frequency curve of each sub-memory, and the faulty sub-memory is removed from the standby sub-memory.

[0050] The application can be further configured in a preferred example to select the final sub-memory according to a second preset condition, including:

[0051] If an urgent label is received, the available sub-memory with the maximum average speed of the write speed parameter is selected as the final sub-memory;

[0052] If a no requirement label is received, the available sub-memory with the minimum remaining capacity is selected as the final sub-memory.

[0053] The application can be further configured in a preferred example to further store an encoding sequence list, which is a mapping table about the encoding of the sub-memory and the type of the sub-memory.

[0054] The first preset condition refers to that the end temperature parameter of each sub-memory does not exceed the corresponding abnormal temperature threshold, and the end vibration frequency parameter of each sub-memory does not exceed the corresponding abnormal vibration frequency threshold.

[0055] In summary, the application includes at least one of the following beneficial technical effects:

[0056] After receiving a storage request, the plurality of sub-memories are gradually screened, and are sequentially evaluated in terms of capacity, write speed, and response time, and then the state physical parameters of each sub-memory during operation are monitored, combined with the evaluation of various factors, to analyze the sub-memories that may have faults or poor running states and exclude them, and select the sub-memories with good running states for storage, to realize independent monitoring function, and abnormal detection and safety warning. BRIEF DESCRIPTION OF DRAWINGS

[0057] Figure 1 is a topological diagram of each module unit of the storage system independently monitored in an embodiment of the application;

[0058] Figure 2 is a flowchart of the implementation of the storage method independently monitored in an embodiment of the application. DETAILED DESCRIPTION

[0059] The exemplary embodiments of this application are described herein with reference to the accompanying drawings, which are meant to be exemplary. Therefore, various changes and modifications can be made to the embodiments described herein without departing from the spirit and scope of this application. For clarity and conciseness, descriptions of well-known functions and constructions are omitted.

[0060] It should be noted that the terms "first", "second", and the like in the description of the application are used to distinguish similar objects, and do not necessarily have to be used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so that the embodiments of the disclosure described herein can be implemented in an order other than those illustrated or described herein. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure.

[0061] In addition, the term "and / or" herein is only a description of the association between the associated objects, which means that there can be three relationships, for example, A and / or B, which means that there are three cases of A alone, A and B together, and B alone. In addition, the character " / " in this paper, unless otherwise specified, generally represents an "or" relationship between the associated objects before and after.

[0062] Figure 1 is a topological diagram of each module unit of the storage system independently monitored in an embodiment of the application, as shown in Figure 1 The independently monitored storage system includes a plurality of sub-storages, a physical parameter acquisition module and a controller, wherein the controller is built-in with a parameter monitoring module, the parameter monitoring module includes a read-write monitoring unit for acquiring a write speed parameter and a response time monitoring unit for acquiring a response time parameter, the physical parameters include decibel information, vibration frequency and temperature information, and the physical parameter acquisition module includes a noise detection unit for acquiring decibel information, a vibration detection unit for acquiring vibration frequency of each sub-storage, and a temperature detection unit for acquiring temperature information of each sub-storage.

[0063] Among the plurality of sub-storages, there are multiple storage types, such as solid state storage, mechanical storage, ROM, RAM, SAM, DAM, optical disc storage, etc.; the read-write monitoring unit uses, for example, CrystalDiskMark test tool, the response time monitoring unit uses, for example, HD Tune test software, etc.; the noise detection unit uses a noise decibel meter, the noise detection unit is configured with only one in the system, the vibration detection unit uses a micro vibration sensor, and the temperature detection unit uses a micro temperature sensor; the micro vibration sensor and the micro temperature sensor are each configured with one for each sub-storage to detect the corresponding physical parameters of the corresponding sub-storage.

[0064] The controller stores a code list, which is a mapping table about the code of the sub-memory and the type of the sub-memory, and the abnormal temperature threshold and the abnormal vibration frequency threshold of each sub-memory, that is, in the mapping table, each sub-memory is mapped with the corresponding abnormal temperature threshold and abnormal vibration frequency threshold about its type of sub-memory;

[0065] The abnormal temperature threshold of the sub-memory refers to the set temperature at which the memory cannot work normally or may be damaged, for example, the abnormal temperature threshold of a sub-memory of a certain type of solid state disk is set to 70℃, the abnormal temperature threshold of a sub-memory of a certain type of mechanical hard disk is set to 55℃, and so on. The same abnormal vibration frequency threshold is also set in advance about the type of the sub-memory.

[0066] The controller further comprises a receiving unit, a code determining unit, a sending unit, a reference range determining unit, a judging unit, a first marking unit, a curve generating unit, a predicting unit, a second marking unit, a selecting unit and a handshake unit.

[0067] The receiving unit is configured to receive a storage request from a sending end, the storage request carrying storage information, the storage information including the data volume and the data type of a data packet to be stored, and in an embodiment, the storage request further carries label information, the label information including an urgent label and a no requirement label.

[0068] The code determining unit is configured to determine the code of the storable sub-memory according to the data volume of the data packet to be stored carried by the storage request and the remaining capacity of each sub-memory; specifically, if the remaining capacity of the sub-memory exceeds the data volume of the data packet to be stored, the memory is a storable sub-memory.

[0069] The sending unit is configured to send a test packet to each storable sub-memory, send a collection start signal to a collection module, and send a monitoring signal to a parameter monitoring module; after receiving the monitoring start signal, the collection module starts to collect the decibel information and the vibration frequency and temperature information of each storable sub-memory for a preset monitoring time; after receiving the monitoring signal, the parameter monitoring module starts to collect the write speed parameter and the response time parameter of each storable sub-memory.

[0070] The preset monitoring time can be set to 3s, and the data volume of the test packet is determined according to the write speed of each sub-memory and the preset monitoring time; specifically, the data volume that each sub-memory can store within the span of the preset monitoring time is calculated according to the write speed of each sub-memory and the preset monitoring time, and the mean value of the data volumes that multiple sub-memories can store is taken as the data volume of the test packet.

[0071] The reference range determining unit is configured to determine the write speed parameter reference range and the response time parameter reference range of each storable sub-memory according to the collected temperature initial value and each storable sub-memory type;

[0072] Specifically, the write speed and the response time of different sub-memory types are affected by the change of temperature, and thus the write speed parameter reference range and the response time parameter reference range are different for different sub-memory types at different temperatures. For example, the write speed parameter reference range of a certain SSD sub-memory is 400 MB / s to 500 MB / s at 20-40℃, and the write speed parameter reference range is 350 MB / s to 400 MB / s at 40-50℃; the response time parameter reference range is the same.

[0073] The determining unit is configured to determine whether the write speed parameter mean value is within the write speed parameter reference range of each sub-memory, and whether the response time parameter is within the response time parameter reference range of each sub-memory;

[0074] The write speed parameter mean value of the sub-memory is the average value of the write speed parameter of the sub-memory within the preset monitoring time span.

[0075] The first marking unit is configured to mark the storable sub-memory as a standby sub-memory if the write speed parameter mean value of the storable sub-memory is within the write speed parameter reference range of each sub-memory, and the response time parameter is within the response time parameter reference range of each sub-memory.

[0076] It can be understood that the memory may exhibit a variety of parameter signs before it is damaged. When reading and writing data, if the speed is significantly slow, it may be a sign of a problem in the internal circuit or storage unit of the chip, and if the response time of the memory is significantly increased, it may be a performance degradation of the chip. Therefore, the write speed parameter and the response time parameter are used for preliminary screening and filtering.

[0077] The curve generating unit is configured to generate a vibration frequency curve of each storable sub-memory and a temperature change curve of each storable sub-memory according to the collected vibration frequency and temperature information of each storable sub-memory, and generate a decibel change curve according to the collected decibel information.

[0078] Specifically, a linear fitting with regularization (ridge regression and Lasso regression) is used for fitting, and the collected decibel information within the preset monitoring time span is fitted to generate the decibel change curve.

[0079] The prediction unit is configured to predict, according to the data amount of the data packet to be stored, the data amount of the test packet, and the vibration frequency curve and the temperature change curve of each sub-memory to be used, a completion temperature parameter and a completion vibration frequency parameter of the corresponding sub-memory when the data packet to be stored is completely transmitted.

[0080] Specifically, according to the data amount of the data packet to be stored and the data amount of the test packet, and in combination with the preset monitoring time, the storage time required for the data amount of the data packet to be stored to be completed can be calculated. That is, the product of the ratio of the data amount of the data packet to be stored to the data amount of the test packet and the preset monitoring time is the storage time required for the data amount of the data packet to be stored to be completed. The vibration frequency curve and the temperature change curve are curves of parameters with respect to time, and therefore, curve fitting is performed to model the time sequence, and only the corresponding parameter values at the node of the storage time when the data amount is completed need to be predicted. Each curve has a corresponding function, and therefore, the completion temperature parameter and the completion vibration frequency parameter of each sub-memory at the corresponding time point can be directly obtained.

[0081] The second marking unit is configured to mark the sub-memory to be used whose completion temperature parameter and completion vibration frequency parameter satisfy a first preset condition as an available sub-memory. The first preset condition means that the completion temperature parameter of each sub-memory does not exceed the abnormal temperature threshold corresponding to each sub-memory, and the completion vibration frequency parameter of each sub-memory does not exceed the abnormal vibration frequency threshold corresponding to each sub-memory.

[0082] The selection unit is configured to select the final sub-memory according to a second preset condition. The second preset condition includes: if an urgent label is received, selecting the available sub-memory with the maximum average speed of the write speed parameter as the final sub-memory. If a no requirement label is received, selecting the available sub-memory with the minimum remaining capacity as the final sub-memory.

[0083] The handshake unit is configured to establish a connection with the sending end to store the data packet to be stored.

[0084] In an embodiment, the independently monitored storage system further includes a rejection unit configured to, if the decibel information exceeds a preset value, infer a faulty sub-memory according to the decibel change curve and the vibration frequency curve of each sub-memory, and reject the faulty sub-memory from the sub-memory to be used. The execution of the rejection unit is located before the second marking unit. It can be understood that the noise in the chip output signal is obviously increased, which is caused by the decrease in the stability of the internal circuit of the chip or the influence of external interference. Therefore, a pre-trained neural network model is input into the decibel change curve and the vibration frequency curve of each sub-memory to infer whether each sub-memory is faulty. That is, the input is the decibel change curve and the vibration frequency curve of each sub-memory. The model is trained in the following manner:

[0085] Each set of curve samples in the curve sample training set is labeled to determine whether each set of curve samples reflects a fault and whether the fault is associated with all or part of the information in the curve sample; and the neural network is trained using the labeled curve sample training set to obtain a model. Each set of curve samples includes a decibel change curve sample and a vibration frequency curve sample.

[0086] Specifically, the decibel change curve of the running memory in a fault state and the vibration frequency curve of the sub-memory are collected as a set of curve samples, and the decibel change curve of the running memory in a normal state and the vibration frequency curve of the sub-memory are collected as a set of curve samples, thereby obtaining a plurality of experimental samples, and the neural network is trained. The obtained model can infer whether the sub-memory is faulty.

[0087] The application also provides an independently monitored storage system and an independently monitored storage method thereof, which are described in detail in Figure 2 , including:

[0088] S1, receiving a storage request, the storage request carrying storage information, the storage information including the data volume of the data packet to be stored;

[0089] S2, determining the code of the storable sub-memory according to the data volume of the data packet to be stored carried by the storage request and the residual capacity of each sub-memory;

[0090] S3, sending a test packet to each storable sub-memory, sending a collection start signal to a collection module, and sending a monitoring signal to a parameter monitoring module;

[0091] S4, selecting the final sub-memory according to the type of each storable sub-memory, the data volume of the data packet to be stored, the data volume of the test packet, and the physical parameters;

[0092] S5, establishing a connection with the sending end to store the data packet to be stored.

[0093] S4 includes:

[0094] S41, determining the write speed parameter reference range and the response time parameter reference range of each storable sub-memory according to the collected initial temperature value and the type of each storable sub-memory;

[0095] S42, determining whether the average value of the write speed parameter is within the write speed parameter reference range of each sub-memory and whether the response time parameter is within the response time parameter reference range of each sub-memory;

[0096] S43, if the average of the write speed parameter of the storable sub-memory is within the reference range of the write speed parameter of each sub-memory, and the response time parameter is within the reference range of the response time parameter of each sub-memory, the storable sub-memory is marked as a standby sub-memory;

[0097] S44, the vibration frequency curve of each storable sub-memory and the temperature change curve of each storable sub-memory are generated according to the collected vibration frequency and temperature information of each storable sub-memory, and the decibel change curve is generated according to the collected decibel information;

[0098] S45, the completion temperature parameter and the completion vibration frequency parameter of the corresponding sub-memory when the storable data packet is completely transmitted are predicted according to the data amount of the storable data packet, the data amount of the test packet, and the vibration frequency curve and the temperature change curve of each standby sub-memory;

[0099] S46, the standby sub-memory whose completion temperature parameter and completion vibration frequency parameter meet the first preset condition is marked as an available sub-memory;

[0100] S47, the final sub-memory is selected according to the second preset condition.

[0101] In an embodiment, before S46, further comprising:

[0102] S451, if there is decibel information exceeding the preset value, the faulty sub-memory is inferred according to the decibel change curve and the vibration frequency curve of each sub-memory, and the faulty sub-memory is excluded from the standby sub-memory.

[0103] In another embodiment, S47 comprises:

[0104] S471, if the urgent label is received, the available sub-memory with the maximum average of the write speed parameter is selected as the final sub-memory;

[0105] S472, if the no requirement label is received, the available sub-memory with the minimum remaining capacity is selected as the final sub-memory.

[0106] The specific limitations of the independent monitoring storage method can refer to the limitations of the independent monitoring storage system in the above, which will not be repeated here. Each step of the above independent monitoring storage method can be realized by software, hardware and their combinations.

[0107] Various implementations of the systems and techniques described here can be realized in digital electronic circuitry, integrated circuitry, specially designed ASICs (application specific integrated circuits), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include implementation in one or more computer programs that are executable and / or interpretable on a programmable system including at least one programmable processor, which can be special or general purpose, coupled to receive data and instructions from, and to transmit data and instructions to, a storage system, at least one input device, and at least one output device.

[0108] These computer programs (also known as programs, software, software applications or code) include machine instructions for the programmable processor, and can be implemented in a high-level procedural and / or object-oriented programming language, and / or in assembly / machine language. As used herein, the terms "machine-readable medium" and "computer-readable medium" refer to any computer program product, apparatus and / or device (e.g., magnetic discs, optical disks, memory, Programmable Logic Devices (PLDs)) used to provide machine instructions and / or data to a programmable processor, including a machine-readable medium that receives machine instructions as a machine-readable signal. The term "machine-readable signal" refers to any signal used to provide machine instructions and / or data to a programmable processor.

[0109] To provide for interaction with a user, the systems and techniques described here can be implemented on a computer having a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user and a keyboard and a pointing device (e.g., a mouse or a trackball) by which the user can provide input to the computer. Other kinds of devices can be used to provide for interaction with a user as well; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form, including acoustic, speech, or tactile input.

[0110] The systems and techniques described here can be implemented in a computing system that includes a back end component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front end component (e.g., a user computer having a graphical user interface or a Web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such back end, middleware, or front end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include a local area network (LAN), a wide area network (WAN), and the Internet.

[0111] It should be understood that the various forms of flow shown above can be re-ordered, added to, or deleted from without departing from the scope of the present disclosure. For example, the steps recited in the application can be executed in parallel, executed in series, or executed in different orders, as long as the desired results of the technology disclosed in the present application can be achieved, and the present application is not limited herein.

[0112] The specific embodiments have been shown and described for purposes of illustrating the embodiments, and not for purposes of limitation. It will be clear to those skilled in the art that various modifications, combinations, sub-combinations and alternatives can be made to the specific embodiments without departing from the spirit and principles of the disclosure. Any further modifications, changes, improvements, combinations, sub-combinations, alternatives, and the like made to the specific embodiments relate, by way of example only, to the spirit and principles of the disclosure.

Claims

1. An independently monitored storage system, comprising: The application relates to a storage device, which comprises: a plurality of sub storages; a physical parameter acquisition module, wherein the physical parameters include decibel information, vibration frequency and temperature information, the physical parameter acquisition module comprises a noise detection unit for acquiring the decibel information, a vibration detection unit for acquiring the vibration frequency of each sub storage, and a temperature detection unit for acquiring the temperature information of each sub storage; a controller, wherein a code sequence table is stored in the controller, and the sequence table is a mapping table about the codes of the sub storages and the types of the sub storages; the controller comprises a parameter monitoring module, wherein the parameter monitoring module comprises a read-write monitoring unit for acquiring a write speed parameter, and a response time monitoring unit for acquiring a response time parameter; the controller further comprises: a receiving unit for receiving a storage request, wherein the storage request carries storage information, and the storage information comprises the data volume of a data packet to be stored; a code determination unit for determining the codes of the sub storages that can be stored according to the data volume of the data packet to be stored and the residual capacities of the sub storages; a sending unit for sending a test packet to each sub storage that can be stored, sending a collection start signal to the collection module, and sending a monitoring signal to the parameter monitoring module; after receiving the monitoring start signal, the collection module starts to collect the decibel information and the vibration frequency and temperature information of each sub storage that can be stored for a preset monitoring time; after receiving the monitoring signal, the parameter monitoring module starts to collect the write speed parameter and the response time parameter of each sub storage that can be stored; the data volume of the test packet is determined according to the write speed of each sub storage and the preset monitoring time; an analysis module for selecting the final sub storage according to the types of each sub storage that can be stored, the data volume of the data packet to be stored, the data volume of the test packet and the physical parameters; a handshake unit for establishing a connection with a sending end to store the data packet to be stored; wherein the analysis module comprises: a reference range determination unit for determining the write speed parameter reference range and the response time parameter reference range of each sub storage that can be stored according to the initial temperature value collected and the types of each sub storage that can be stored; a judgment unit for judging whether the average value of the write speed parameter is located in the write speed parameter reference range of each sub storage, and whether the response time parameter is located in the response time parameter reference range of each sub storage; a first marking unit for marking the sub storage that can be stored as a sub storage to be used if the average value of the write speed parameter of the sub storage that can be stored is located in the write speed parameter reference range of each sub storage, and the response time parameter is located in the response time parameter reference range of each sub storage; a curve generation unit for generating the vibration frequency curve of each sub storage that can be stored and the temperature change curve of each sub storage that can be stored according to the vibration frequency and temperature information of each sub storage that can be stored collected, and generating the decibel change curve according to the decibel information collected; a prediction unit for predicting the completion temperature parameter and the completion vibration frequency parameter of the corresponding sub storage when the data packet to be stored is completely transmitted according to the data volume of the data packet to be stored, the data volume of the test packet and the vibration frequency curve and the temperature change curve of each sub storage to be used. The second marking unit is configured to mark the standby sub-memory, whose end temperature parameter and end vibration frequency parameter satisfy the first preset condition, as an available sub-memory. The selection unit is configured to select the final sub-memory according to a second preset condition.

2. The independently monitored storage system of claim 1, wherein, Further comprising: The rejection unit is configured to infer a faulty sub-memory from the decibel change curve and the vibration frequency curve of each sub-memory if the decibel information exceeds a preset value, and to reject the faulty sub-memory from the standby sub-memory.

3. The independently monitored storage system of claim 1, wherein, The storage request further carries label information, and the label information includes an urgent label and a no requirement label. The second preset condition includes: If the urgent label is received, the available sub-memory with the maximum average write speed parameter is selected as the final sub-memory.

4. The independently monitored storage system of claim 3, wherein, The second preset condition further includes: If the no requirement label is received, the available sub-memory with the minimum remaining capacity is selected as the final sub-memory.

5. The independently monitored storage system of claim 1, wherein, The sequence table further stores an abnormal temperature threshold and an abnormal vibration frequency threshold of each sub-memory. The first preset condition refers to that the end temperature parameter of each sub-memory does not exceed the corresponding abnormal temperature threshold, and the end vibration frequency parameter of each sub-memory does not exceed the corresponding abnormal vibration frequency threshold.

6. A self-monitoring storage method based on the self-monitoring storage system according to any one of claims 1 to 5, characterized by, Including: Receiving a storage request, the storage request carrying storage information, the storage information including the data volume of a data packet to be stored; Determining the encoding of the storable sub-memory according to the data volume of the data packet to be stored carried by the storage request and the remaining capacity of each sub-memory; Sending a test packet to each storable sub-memory, sending a collection start signal to a collection module, and sending a monitoring signal to a parameter monitoring module; Selecting the final sub-memory according to the type of each storable sub-memory, the data volume of the data packet to be stored, the data volume of the test packet, and the physical parameters; Establishing a connection with the sending end to store the data packet to be stored; The selecting the final sub-memory according to the type of each storable sub-memory, the data volume of the data packet to be stored, the data volume of the test packet, and the physical parameters includes: Determining the write speed parameter reference range and the response time parameter reference range of each storable sub-memory according to the collected temperature initial value and the type of each storable sub-memory; Determining whether the average write speed parameter is within the write speed parameter reference range of each sub-memory and whether the response time parameter is within the response time parameter reference range of each sub-memory; If the average write speed parameter of the storable sub-memory is within the write speed parameter reference range of each sub-memory and the response time parameter is within the response time parameter reference range of each sub-memory, the storable sub-memory is marked as a standby sub-memory; Generating the vibration frequency curve of each storable sub-memory and the temperature change curve of each storable sub-memory according to the collected vibration frequency and temperature information of each storable sub-memory, and generating a decibel change curve according to the collected decibel information; According to the data amount of the data packet to be stored, the data amount of the test packet, and the vibration frequency curve and the temperature change curve of each sub-memory to be used, the corresponding completion temperature parameter and completion vibration frequency parameter of the sub-memory when the data packet to be stored is completely transmitted are predicted; The sub-memory to be used, whose completion temperature parameter and completion vibration frequency parameter satisfy the first preset condition, is marked as an available sub-memory; The final sub-memory is selected according to a second preset condition.

7. The independently monitored storage method of claim 6, wherein, Before the sub-memory to be used, whose completion temperature parameter and completion vibration frequency parameter satisfy the first preset condition, is marked as an available sub-memory, the method further comprises: If the decibel information exceeds a preset value, a faulty sub-memory is inferred according to the decibel change curve and the vibration frequency curve of each sub-memory, and the faulty sub-memory is removed from the sub-memories to be used.

8. The independently monitored storage method of claim 6, wherein, The final sub-memory is selected according to a second preset condition, which comprises: If an urgent label is received, the available sub-memory with the maximum average speed of the write speed parameter is selected as the final sub-memory.

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