UVM-based verification device, system and method for TST circuit switching module
By integrating data proxy components and configuration information control components through a UVM-based TST circuit switching module verification device, the reusability and scalability issues of traditional verification methods in TST circuit switching modules are solved, achieving efficient and flexible verification results.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-16
- Publication Date
- 2026-03-10
AI Technical Summary
Existing verification technologies are difficult to apply effectively to TST circuit switching modules, resulting in poor reusability, insufficient scalability, and low verification efficiency. In particular, they are difficult to handle complex scenarios such as timing synchronization and resource contention in multi-channel, high-concurrency time-division-space-division-time-division switching structures.
The verification device for the TST circuit switching module based on UVM includes a TST data proxy component, a configuration information control proxy component, and a switching data scoring board component. It integrates data sending, processing, and checking functions, supports multiple test cases and configuration types, and realizes dynamic collaborative verification of multi-level configurations.
This improved the accuracy and completeness of verification for TST circuit switching modules, reduced configuration costs, increased verification efficiency and coverage, and ensured the flexibility and completeness of verification.
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Figure CN120342924B_ABST
Abstract
Description
Technical Field
[0001] This invention belongs to the field of chip verification technology, specifically relating to a UVM-based TST circuit switching module verification device, system, and method. Background Technology
[0002] With the continuous development of aerospace, integrated circuits, and communication technologies, circuit switching systems, as a type of on-board switching technology, can handle satellite communication scenarios with requirements for high capacity, high reliability, and high performance. As the core of the switching system, the switching chip is crucial for thorough verification. Traditional circuit switching module verification methods mainly rely on register-transfer-level simulation and the construction of specific test platforms. However, these methods have significant drawbacks: 1. Poor reusability: The verification environment is strongly coupled with the design, making it difficult to adapt to design changes and reuse across multiple projects; 2. Insufficient scalability: For multi-channel, high-concurrency Time-Space-Time (TST) switching structures, traditional methods struggle to efficiently handle complex scenarios such as timing synchronization and resource contention; 3. Low verification efficiency: The lack of systematic approach to stimulus generation, coverage analysis, and result feedback leads to long verification cycles and high vulnerability risks.
[0003] Due to its large scale, the TST circuit switching module places higher demands on verification. Traditional methods struggle to handle challenges such as concurrent data transmission across multiple channels, the distribution of multiple switching configurations, and the constant switching of switching relationships, which can easily lead to insufficient verification or the omission of critical defects.
[0004] Among existing verification technologies, verification schemes based on the Universal Verification Methodology (UVM) have been widely used in digital circuit verification, but their systematic application in TST circuit switching modules remains a gap. However, existing technologies have not yet formed a UVM verification system specifically for TST structures, particularly lacking effective solutions in areas such as multi-channel stimulus generation, configuration information distribution and switching verification, real-time data comparison, and functional coverage analysis. Summary of the Invention
[0005] This invention provides a UVM-based verification device, system, and method for TST circuit switching modules, which can solve the problems of poor reusability, insufficient scalability, and low verification efficiency caused by the inability of existing devices to verify TST modules based on the UVM method.
[0006] In a first aspect, embodiments of the present invention provide a UVM-based TST circuit switching module verification device, comprising:
[0007] The TST data proxy component generates exchange data and inputs the exchange data to the TST switching circuit module under test, enabling multiple switching units in the TST switching circuit module under test to exchange data. The TST data proxy component also monitors the transmission process of the exchange data to obtain the exchange result of the data under test.
[0008] Multiple configuration information control agent components, each corresponding to one of the switching units, are used to generate configuration information for their respective switching units and monitor the transmission results of the configuration information.
[0009] A data switching scoring board component is used to simulate the logic implementation of the switching unit based on the switching data and the configuration information to obtain the expected switching result, and to determine whether the data switching result under test meets the switching requirements based on the expected switching result, thereby obtaining the verification result of the TST switching circuit module under test.
[0010] The input and output terminals of the TST data proxy component are connected to the first input and output terminals of the TST switching circuit module under test through the TST switching data interface, and the second output terminal is connected to the first input terminal of the switching data scoring board component. The input and output terminals of the configuration information control proxy component are connected to the second input and output terminals of the TST switching circuit module under test through their respective configuration information interfaces, and the second output terminal is connected to the second input terminal of the switching data scoring board component.
[0011] Secondly, embodiments of the present invention provide a UVM-based TST circuit switching module verification system, including the apparatus as described in the first aspect and the TST switching circuit module under test.
[0012] Thirdly, embodiments of the present invention provide a UVM-based TST circuit switching module verification method, which is applied to the system described in the second aspect, and includes:
[0013] Invoke the TST data broker component to generate exchange data based on test cases;
[0014] The configuration information control agent component is invoked to generate configuration information based on the test cases;
[0015] The TST data proxy component and the configuration information control proxy component are invoked to monitor the data transmission status of each interface of the TST switching circuit module under test, and the configuration information transmission result and the data exchange result under test are obtained.
[0016] The switching data scoring board component is invoked to simulate the logic implementation of the switching unit to obtain the expected switching result. Based on the expected switching result, it is determined whether the transmission result of the configuration information and the switching result of the data under test meet the switching requirements, and the verification result of the TST switching circuit module under test is obtained.
[0017] The beneficial effects of this invention compared to existing technologies are as follows: The device provided by this invention can integrate an advanced UVM verification platform that combines data transmission, processing, and inspection. The integrated TST switching data proxy component and the TST switching configuration information control proxy component at each level have good portability. Furthermore, through the integrated TST switching configuration information control proxy component at each level, various test cases can be used to achieve different types of randomization, such as complete configuration or incremental configuration of configuration information. Verifying the TST circuit switching module using this device ensures the accuracy and completeness of the verification. Compared to traditional technologies, this invention not only enables the verification of the TST circuit switching module, but also improves the flexibility of verification, reduces configuration costs, and increases code and functional coverage by adopting the UVM verification environment, while ensuring improved verification efficiency and completeness. Attached Figure Description
[0018] Figure 1 This is a schematic diagram of the structure of a TST circuit switching module provided in an embodiment of the present invention;
[0019] Figure 2 A schematic diagram of the structure of a UVM-based TST circuit switching module verification device provided in an embodiment of the present invention;
[0020] Figure 3 This is a schematic diagram of the structure of a TST data proxy component provided in an embodiment of the present invention;
[0021] Figure 4 This is a schematic diagram of the structure of a configuration information control agent component provided in an embodiment of the present invention;
[0022] Figure 5 A schematic diagram of the structure of a UVM-based TST circuit switching module verification system provided in an embodiment of the present invention;
[0023] Figure 6 The flowchart illustrates the implementation of a UVM-based TST circuit switching module verification method according to an embodiment of the present invention. Detailed Implementation
[0024] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of the invention. However, those skilled in the art will understand that the invention can be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods are omitted so as not to obscure the description of the invention with unnecessary detail.
[0025] It should be understood that, when used in this specification and the appended claims, the term "comprising" indicates the presence of the described features, integrals, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or collections thereof.
[0026] It should also be understood that the term "and / or" as used in this specification and the appended claims refers to any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.
[0027] As used in this specification and the appended claims, the term "if" may be interpreted, depending on the context, as "when," "once," "in response to determination," or "in response to detection." Similarly, the phrase "if determined" or "if [described condition or event] is detected" may be interpreted, depending on the context, as meaning "once determined," "in response to determination," "once [described condition or event] is detected," or "in response to detection of [described condition or event]."
[0028] Furthermore, in the description of this invention and the appended claims, the terms "first," "second," "third," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.
[0029] References to "one embodiment" or "some embodiments" as described in this specification mean that one or more embodiments of the invention include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless otherwise specifically emphasized.
[0030] The present invention will be further described in detail below with reference to specific embodiments, but the implementation of the present invention is not limited thereto.
[0031] Example 1
[0032] Figure 1 The diagram shown is a structural schematic of a TST circuit switching module provided in an embodiment of the present invention.
[0033] In one example, see Figure 1 The TST circuit switching module mainly consists of the following switching units: Class A time-division switching unit, Class S space-division switching unit, and Class B time-division switching unit.
[0034] For example, each switching unit in the TST circuit switching module may include a data switching module and a configuration information control module.
[0035] Specifically, the TST circuit switching module can receive exchanged data and configuration information and transmit them to the corresponding switching unit. Each switching unit can control the data exchange module in the switching unit to perform data exchange according to the configuration information.
[0036] Example 2
[0037] Figure 2 The diagram shown is a structural schematic of a UVM-based TST circuit switching module verification device provided in an embodiment of the present invention. As an example and not a limitation, the device 200 may include at least a TST data proxy component 210, multiple configuration information control proxy components 220, and a data switching scoring board component 230.
[0038] For example, see Figure 2 Various components in device 200, such as TST data proxy component 210, multiple configuration information control proxy components 220, and exchange data scoring board component 230, can constitute the verification environment (tst_sw_env) of device 200. Above the verification environment level, device 200 can also include a test case base class (base_test), which can include multiple test cases in addition to the verification environment.
[0039] For example, the configuration information control agent component 220 can correspond one-to-one with the switching unit in the TST circuit switching module under test. For example, the configuration information control agent component 220 can include a Class A time-division switching configuration information control agent component, a Class S space-division switching configuration information control agent component, and a Class B time-division switching configuration information control agent component.
[0040] In some embodiments, the test case base class can derive various test cases. The TST data proxy component 210 can generate exchange data according to the test cases and input this exchange data to the TST switching circuit module under test, enabling it to perform data exchange. The configuration information control proxy component 220 can generate configuration information for the corresponding switching unit according to the test cases, then transmit this configuration information to the corresponding switching unit and monitor the transmission result of the configuration information. The TST data proxy component 210 can also monitor the transmission process of the exchange data to obtain the exchange result of the data under test. The exchange data scoring board component 230 can simulate the logical implementation of the switching unit according to the exchange data and configuration information, generate the expected exchange result, and determine whether the exchange result of the data under test meets the exchange requirements based on the expected exchange result, thereby obtaining the verification result of the TST circuit switching module under test.
[0041] For example, see Figure 2 The input and output ports of the TST data proxy component 210 can be connected via the TST data exchange interface (see...). Figure 2 The first input / output terminal of the TST switching circuit module under test (tst_data_if) is connected to the second output terminal of the switching data scoring board component 230, and the second output terminal is connected to the first input terminal of the switching data scoring board component 230. The input / output terminals of the configuration information control agent component 220 can be connected through their respective configuration information interfaces (see [link to configuration information]). Figure 2 The configuration information interfaces at_cfg_if (Class A time-division switching unit), s_cfg_if (Class S space-division switching unit), and bt_cfg_if (Class B time-division switching unit) are connected to the second input / output terminals of the TST switching circuit module under test. The second output terminal is connected to the first input terminal of the switching data scoring board assembly 230.
[0042] Specifically, see Figure 2 The TST circuit switching module under test and the various components inside the device 200 can transmit data through the connected interfaces. For example, the device 200 can transmit data with the TST circuit switching module (i.e., the design under test DUT) through the TST data exchange interface, transmit configuration information to each switching unit through the configuration information interface, and then each switching unit controls the switching unit to realize the data exchange process according to the configuration information.
[0043] In one possible implementation, see Figure 3 The TST data agent component 210 may include a TST data sequence generator 211, a TST data driver 212, and a TST data interface monitor 213.
[0044] For example, the TST data sequence generator 211 can generate different exchange data sequences according to different test cases, and then transmit them to the TST data driver 212. The TST data driver 212 can drive the obtained exchange data to the TST exchange data interface (tst_data_if), and then send it to the DUT to simulate real data transmission. The TST data interface monitor 213 can monitor the input and output of exchange data in the DUT to obtain the exchange result of the data under test, and transmit the result to the exchange data scoring board component.
[0045] In one possible implementation, the configuration information control agent components at each level have the same structure and similar working logic, only differing in the objects they execute. For example, the A-level time-division switching configuration information control agent component is used to generate the configuration information for the A-level time-division switching unit, and the S-level space-division switching configuration information control agent component is used to generate the configuration information for the S-level space-division switching unit.
[0046] Specifically, see Figure 4 The configuration information control agent component 220 may include a T-switch configuration sequence generator 221, a T-switch configuration driver 222, and a T-switch configuration interface monitor 223.
[0047] For example, the T-switching configuration sequence generator 221 can generate a set of configuration information based on the randomized configuration of the test cases. The T-switching configuration driver 222 can drive the configuration information to the corresponding configuration information interface according to the storage location of the configuration information of each level of switching unit in the switching reference model component of the switching data scoreboard component 230. The T-switching configuration interface monitor 223 can continuously monitor the input and output of the DUT to these configuration information on the configuration information interface and send the monitoring results (i.e., the transmission results of the configuration information) to the switching data scoreboard component 230.
[0048] In one example, configuration information may include a set of configuration data frames and exchange relationship switching signals.
[0049] For example, a configuration data frame can be a set of complete data frames and / or a set of incremental configuration signals.
[0050] For example, if the TST circuit switching module under test supports uninterrupted switching and incremental configuration functions, the configuration information can include a complete configuration data frame, incremental configuration information transmission transactions (i.e., incremental configuration signals), and switching signals.
[0051] In one possible implementation, see Figure 2 The exchange data scoreboard component 230 can embed an exchange reference model component (tst_sw_refmod) 231 and an exchange data comparison component 232.
[0052] For example, the switching reference model component 231 can receive switching data from the TST data proxy component and configuration information from each configuration information control proxy component. Based on the configuration information, it performs TST switching on the input switching data to obtain the desired switching result. Then, it inputs the desired switching result to the switching data comparison component 232. The switching data comparison component 232 can compare the desired switching result with the test data switching result, perform statistical analysis and printing on the results, determine whether the test data switching result meets the switching requirements, and obtain the verification result of the TST switching circuit module under test.
[0053] Specifically, the data exchange scoring board component 230 can write configuration information into the data exchange reference model component 231 to control the exchange of data and simulate the logic in real hardware.
[0054] In one example, see Figure 2 All agent components monitoring the top-level input and output data of the DUT can transmit the results to the exchange data scoreboard component 230, such as the TST data agent component and all configuration information control agent components, through Transaction Level Modeling (TLM). Data exchange within the verification environment can also be achieved through TLM.
[0055] In some embodiments, see Figure 2 The device 200 may also include a function coverage group definition component 240. This component can be used to determine whether the data on each interface covers the function points defined in the coverage group, that is, to determine whether the data on each interface is written correctly.
[0056] For example, the input / output terminals of the functional coverage group definition component 240 can be connected to the third input / output terminal of the TST switching circuit module under test via the coverage group monitoring interface (cover_if).
[0057] Specifically, the function coverage group definition component 240 defines some function points that need to be verified according to different system requirements, and then judges whether the defined function points are covered by monitoring the data on the monitoring interface (cover_if) of the coverage group and the data changes.
[0058] For example, the components within device 200 can be built using the SystemVerilog language.
[0059] In some embodiments, users can also write a makefile, select the compilation tools, link the DUT file list filelist and the verification environment file list filelist, add compilation macros, etc. Through this makefile script, the test cases can also be run automatically a specified number of times. Specifically, the number of runs can be set through the makefile script, and the system can be started to automatically execute the simulation verification for the corresponding number of runs.
[0060] The device provided by this invention is an advanced UVM verification platform that integrates data transmission, processing, and inspection. The integrated TST switching data proxy component and TST switching configuration information control proxy components at all levels have good portability. Furthermore, through the integrated TST switching configuration information control proxy components at all levels, various test cases can be used to achieve different types of randomization, such as complete configuration or incremental configuration of configuration information. Verifying the TST circuit-switched module using this device ensures the accuracy and completeness of the verification. Compared to traditional technologies, this invention not only enables the verification of the TST circuit-switched module, but also improves verification flexibility, reduces configuration costs, and increases code and functional coverage by employing a UVM verification environment, while simultaneously ensuring improved verification efficiency and completeness.
[0061] Traditional UVM verification devices typically only simulate single-level logic, failing to accurately reproduce the cascading effect of three-level switching, and are unable to simulate the process of configuration information being distributed step-by-step from each level of switching unit in the TST module. Furthermore, they struggle to generate mixed transaction sequences containing complete configuration, incremental configuration, and switching signals. Consequently, traditional UVM verification devices often suffer from insufficient data comparison accuracy and difficulty in capturing cross-level timing errors or configuration conflicts when verifying TST circuit switching modules.
[0062] This invention controls proxy components by setting configuration information corresponding one-to-one with the switching units. Each component independently generates and determines the configuration information of the corresponding switching unit, and supports mixed transaction injection of complete configuration, incremental configuration and switching signals. This ensures dynamic collaborative verification of multi-level configuration of the TST circuit switching module. By setting TST data proxy components, it can support randomized generation and dynamic driving of multi-channel data frames. Through parameterized design to adapt to different channel scales, it can simulate the timing synchronization problem of the TST circuit switching module in high-concurrency scenarios.
[0063] Furthermore, through the reference model component embedded in the scoring board component, it is possible to accurately simulate the cascaded logic of Class A time-division switching, Class S space-division switching and Class B time-division switching, receive input data and configuration information synchronously with the DUT, generate expected results consistent with hardware behavior, and achieve the zero-error requirement for cross-level data comparison.
[0064] It should be understood that each component in the aforementioned device 200 can be implemented entirely or partially through software, hardware, or a combination thereof. These components can be embedded in hardware or independently of a device with data processing capabilities, or stored in software within the memory of the aforementioned device, so that the processor can invoke and execute the operations corresponding to each of the above modules. The aforementioned device can be, but is not limited to, various types of chip verification computers already existing in the art.
[0065] Example 3
[0066] Figure 5 The diagram shown illustrates the structure of a UVM-based TST circuit switching module verification system according to an embodiment of the present invention. As an example and not a limitation, system 500 may include the TST switching circuit module shown in Embodiment 1 as the TST switching circuit module under test, and may also include the UVM-based TST circuit switching module verification device 200 shown in Embodiment 2.
[0067] For example, the apparatus 200 can be used to test the TST switching circuit module under test to verify whether its data switching function meets the requirements.
[0068] The specific structure and function of the device 200 and the TST switching circuit module under test can be found in Embodiments 2 and 1 above, respectively, and will not be repeated here.
[0069] Example 4
[0070] Figure 6 The diagram illustrates an implementation flowchart of a UVM-based TST circuit switching module verification method provided by an embodiment of the present invention. This method can be applied to the system shown in Embodiment 3 above, and may include the following steps S601-S605, which are described below.
[0071] S601, power on and initialize the UVM-based TST circuit switching module verification system.
[0072] In one possible implementation, if the system has already been initialized before this test and this is not the first test, then step S602 can be performed directly. If this is the first test, then step S601 must be started to initialize the device 200 and the TST circuit switching module in the system.
[0073] In one example, all random access memories (RAMs) in the system can be manually initialized before starting testing, and then configuration information can be written to them in subsequent processes. For instance, the switching reference model component 231 needs to be reset, and the various RAMs in the TST circuit switching module need to be initialized before configuration information can be written to them.
[0074] S602, invokes the TST data broker component to generate exchange data based on test cases.
[0075] In one example, before invoking the TST data proxy component 210, multiple configuration information control proxy components can be invoked to generate initial configuration information conforming to the driver protocol requirements and sent to the TST circuit switching module through the corresponding interfaces. The TST circuit switching module can then configure all switching control memories based on the initial configuration information. Afterwards, the TST data proxy component 210 can be invoked to generate switching data.
[0076] In one example, the TST data proxy component 210 can be invoked to generate exchange data frames and drive these exchange data onto the TST exchange data interface to complete the input of exchange data.
[0077] S603 invokes the configuration information control agent component to generate configuration information based on test cases.
[0078] In one example, after the input exchange data begins, the proxy component can be controlled to generate subsequent configuration information based on the test case configuration, in order to achieve the most complete verification and coverage collection possible.
[0079] For example, if the TST circuit switching module is a 40-port TST switching circuit, when generating configuration information, it needs to wait until all control memories in the TST circuit switching module have written a complete set of configuration data frames before it can generate the switching data transmission signal and the incremental configuration signal. Only after all control memories have written two complete sets of configuration data frames can it begin generating the switching relationship switching signal.
[0080] S604 calls the TST data proxy component and configuration information control proxy component to monitor the data transmission status of each interface of the TST switching circuit module under test, and obtains the configuration information transmission result and the data exchange result under test.
[0081] In one example, the data exchange result of the data to be tested can be obtained by monitoring the data transmission of the TST exchange data interface through the TST data proxy component, and the transmission result of the configuration information can be obtained by monitoring the data transmission of the configuration information interface through the configuration information control proxy component.
[0082] S605 calls the data switching board component to simulate the logic implementation of the switching unit to obtain the expected switching result, and determines whether the transmission result of the configuration information and the switching result of the data under test meet the switching requirements based on the expected switching result, and obtains the verification result of the TST switching circuit module under test.
[0083] In one example, if the result of the data exchange to be tested does not meet the requirements, the verification can end after printing the simulation log of the failed data comparison.
[0084] In another example, if the data exchange results meet the requirements, the verification can end after printing the simulation log of successful data comparison.
[0085] The method provided by this invention constructs a module-level TST circuit switching module verification system, thereby supporting the use of the design code module of the TST circuit switching module to be verified as the verification object, eliminating the need to integrate the entire chip as the design under test. Therefore, only the TST circuit switching module itself needs to be integrated as the design under test, thus reducing the dependency on the design under test and allowing for earlier execution of verifiable nodes. Since the entire electronic control unit chip or other design components are no longer required, the system can begin verification during the design phase of the TST circuit switching module, significantly advancing the verification intervention time and reducing dependencies. Furthermore, the system incorporates different switching function modes, thereby generating random configuration or switching data to effectively complete the functional modes within the TST circuit switching module, ultimately achieving randomness and completeness of the TST circuit switching module's excitation, significantly improving the verification quality of the TST circuit switching module.
[0086] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.
Claims
1. A UVM-based TST circuit switching module verification apparatus, characterized in that, The application comprises: a TST data agent component for generating exchange data and inputting the exchange data into a TST exchange circuit module under test so that multiple switching units in the TST exchange circuit module under test perform data switching; the TST data agent component is also used for monitoring the transmission process of the exchange data to obtain a data switching result under test; a plurality of configuration information control agent components corresponding to the switching units, which are used for generating configuration information of the switching units corresponding thereto and monitoring the transmission result of the configuration information; an exchange data scoreboard component for simulating the logical implementation of the switching units according to the exchange data and the configuration information to obtain an expected switching result, and determining whether the data switching result under test meets the switching requirement based on the expected switching result to obtain a verification result of the TST exchange circuit module under test; wherein the TST exchange circuit module comprises A-level time division switching units, S-level time division switching units and B-level time division switching units, each level of time division switching unit comprises a data switching module and a configuration information control module, the TST exchange circuit module is used for receiving the exchange data and the configuration information and transmitting them to corresponding time division switching units, the time division switching units are used for controlling the internal data switching modules to perform data switching according to the configuration information; the input and output ends of the TST data agent component are connected with the first input and output ends of the TST exchange circuit module under test through a TST exchange data interface, the second output end is connected with the first input end of the exchange data scoreboard component, the input and output ends of the configuration information control agent components are connected with the second input and output ends of the TST exchange circuit module under test through corresponding configuration information interfaces, and the second output end is connected with the second input end of the exchange data scoreboard component.
2. The apparatus of claim 1, wherein, The TST data agent component comprises: a TST data sequence generator for generating different exchange data according to different test cases; a TST data driver for driving the exchange data onto the TST exchange data interface so that multiple switching units in the TST exchange circuit module under test perform data switching; a TST data interface monitor for monitoring the transmission process of the exchange data to obtain the data switching result under test.
3. The apparatus of claim 1, wherein, The exchange data scoreboard component comprises: an exchange reference model component for simulating the logical implementation of the switching units according to the exchange data and the configuration information to obtain the expected switching result; an exchange data comparison component for determining whether the data switching result under test meets the switching requirement based on the expected switching result to obtain the verification result of the TST exchange circuit module under test.
4. The apparatus of claim 3, wherein, The switching units comprise A-level time division switching units, S-level space division switching units and B-level time division switching units.
5. The apparatus of claim 4, wherein, The configuration information control agent component comprises: A T-switch configuration sequence generator is configured to generate the configuration information according to the randomization configuration of the test case; A T-switch configuration driver is configured to drive the configuration information to the configuration information interface according to the storage location of the configuration information in the switch reference model component; A T-switch configuration interface monitor is configured to monitor the transmission result of the configuration information.
6. The apparatus of claim 5, wherein, The configuration information includes configuration data frames and switch relationship switching signals.
7. The apparatus of claim 1, wherein, The device further includes: A function coverage group definition component is configured to monitor whether the data of each interface in the TST switch circuit module under test is correctly written; The input and output ends of the function coverage group definition component are connected to the third input and output end of the TST switch circuit module under test through a coverage group monitoring interface.
8. A UVM based TST circuit switching module verification system, characterized in that, The system includes the device of any one of claims 1-7 and a TST switch circuit module under test.
9. A UVM-based TST circuit switching module verification method, characterized in that, The method is applied to the system of claim 8, and the method includes: Calling a TST data agent component to generate switch data based on a test case; Calling a configuration information control agent component to generate configuration information based on the test case; Calling the TST data agent component and the configuration information control agent component to monitor the data transmission of each interface of the TST switch circuit module under test, to obtain a configuration information transmission result and a test data switch result; Calling a switch data scoreboard component to simulate the logical implementation of the switch unit to obtain an expected switch result, and to determine whether the configuration information transmission result and the test data switch result meet the switch requirements based on the expected switch result, to obtain a verification result of the TST switch circuit module under test.
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