Read interference optimization method, electronic equipment and storage medium

Abstract

The invention relates to the field of storage, and provides a read interference optimization method, electronic equipment and a storage medium. The method comprises the following steps: when a page reading operation on any physical block is detected, accumulating physical block reading times of any physical block; if the number of physical block reading times is smaller than or equal to a first preset read interference threshold value and larger than a second preset read interference threshold value, code words in the multiple storage pages are sampled and scanned, and the code word with the worst performance in any physical block is determined to serve as a target code word; and if the original bit error rate of the target code word is greater than a preset bit error rate threshold, recovering any physical block. According to the method, the single-page reading interference performance can be improved.

Description

Technical Field

[0001] This application relates to the field of storage technologies, and in particular, to a read interference optimization method, an electronic device, and a storage medium. Background Art

[0002] As the block capacity in flash memory increases, the read interference performance of physical blocks becomes worse and worse. To improve the read interference performance of physical blocks, the originally shared Bottom Select Gate (BSG) of the entire physical block is divided into several BSGs ( Figure 3 including 3 BSGs in the figure), however, this structure can only improve the block-level read interference performance of physical blocks, but cannot improve the single-page read interference performance, resulting in the inability to fully utilize the improvement in read interference performance brought by dividing into multiple BSGs. Summary of the Invention

[0003] In view of the above, it is necessary to provide a read interference optimization method, an electronic device, and a storage medium, which can solve the technical problem of how to improve the single-page read interference performance.

[0004] On the one hand, this application proposes a read interference optimization method, which is applied to an electronic device. The electronic device includes a storage device, and the storage device includes multiple physical blocks. Each physical block includes multiple storage pages. The read interference optimization method includes: when a read page operation on any physical block is detected, accumulating the physical block read times of the any physical block; if the physical block read times are less than or equal to a first preset read interference threshold and greater than a second preset read interference threshold, sampling and scanning the codewords in the multiple storage pages, and determining the worst-performing codeword in the any physical block as the target codeword; if the original bit error rate of the target codeword is greater than a preset bit error rate threshold, recycling the any physical block.

[0005] According to an embodiment of this application, when a read page operation on any physical block is detected, the method further includes: calculating the equivalent read times of each sub-block in the any physical block; if the equivalent read times of each sub-block are less than or equal to the first preset read interference threshold and there is a target sub-block whose equivalent read times are greater than the second preset read interference threshold, scanning and determining the original bit error rate of the target sub-block; if the original bit error rate of the target sub-block is greater than the preset bit error rate threshold, recycling the target sub-block or the any physical block.

[0006] According to an embodiment of this application, the calculating the equivalent read times of each sub-block in the any physical block includes: determining the sub-block that performs the read page operation in the any physical block as the read sub-block, and accumulating the sub-block read times of the read sub-block; according to the sub-block read times of the read sub-block, calculating the equivalent read times of each sub-block in the any physical block.

[0007] According to an embodiment of the present application, calculating the equivalent read count of each block in any physical block according to the block read count of the read block includes: obtaining the block read count of each block in any physical block; calculating the equivalent read count according to the block read count of each block and the proportionality coefficient.

[0008] According to an embodiment of the present application, calculating the equivalent read count of each block in any physical block further includes: obtaining the initial equivalent read count of each block in any physical block before the page read operation; calculating the equivalent read count according to the multiple initial equivalent read counts and the proportionality coefficient.

[0009] According to an embodiment of the present application, before calculating the equivalent read count of each block in any physical block, the method further includes: obtaining the voltage change amount of any block as the first voltage change amount when performing a page read operation on any block in any physical block, and obtaining the voltage change amount of other blocks except the any block in any physical block as the second voltage change amount; determining the proportionality coefficient according to the ratio of the second voltage change amount to the first voltage change amount.

[0010] According to an embodiment of the present application, sampling and scanning the codewords in the multiple storage pages to determine the worst-performing codeword in any physical block as the target codeword includes: scanning all the codewords of a word line in any physical block, and determining the storage page where the worst-performing codeword in the word line is located as the initial storage page; scanning all the word lines in the initial storage page, and determining the target codeword from all the word lines in the initial storage page.

[0011] According to an embodiment of the present application, recycling the target block or any physical block includes: counting the number of blocks in any physical block whose original bit error rate is greater than the preset bit error rate threshold; if the number is greater than or equal to the preset number, recycling any physical block; or if the number is less than the preset number, recycling the target block.

[0012] On the other hand, the present application also proposes a read interference optimization device, which runs on an electronic device. The electronic device includes a storage device, and the storage device includes a plurality of physical blocks. Each physical block includes a plurality of storage pages. The read interference optimization device includes: a calculation unit, configured to accumulate the physical block read times of any physical block when detecting a read page operation on any physical block; if the physical block read times are less than or equal to a first preset read interference threshold and greater than a second preset read interference threshold, a scanning unit, configured to sample and scan the codewords in the plurality of storage pages, and determine the worst-performing codeword in any physical block as the target codeword; a recycling unit, configured to recycle any physical block if the original bit error rate of the target codeword is greater than a preset bit error rate threshold.

[0013] On the other hand, the present application also proposes an electronic device, which includes: a storage device storing computer-readable instructions; and a processor, configured to execute the computer-readable instructions stored in the storage device to implement a read interference optimization method.

[0014] On the other hand, the present application also proposes a storage medium storing computer-readable instructions, and the computer-readable instructions are executed by a processor in an electronic device to implement a read interference optimization method.

[0015] It can be seen from the above technical solutions that in the embodiments of the present application, since it is not necessary to scan all the codewords in the physical block, the scanning frequency of the page can be reduced, thereby improving the single-page read interference performance and reducing the impact on the service quality of the storage device. Description of the Drawings

[0016] Figure 1 is a schematic structural diagram of an electronic device for implementing a read interference optimization method provided by an embodiment of the present application.

[0017] Figure 2 is a flowchart of a read interference optimization method provided by an embodiment of the present application.

[0018] Figure 3 is an internal structural diagram of a physical block after bottom select gate segmentation provided by an embodiment of the present application.

[0019] Figure 4a is a first read interference curve graph of a storage page in different on-off states provided by an embodiment of the present application.

[0020] Figure 4b is a second read interference curve graph of a storage page in different on-off states provided by an embodiment of the present application.

[0021] Figure 5 is a read interference curve graph of a storage page under a read page operation provided by an embodiment of the present application.

[0022] Figure 6 It is a flowchart of a read interference optimization method provided by another embodiment of the present application.

[0023] Figure 7 It is a flowchart of a read interference optimization method provided by another embodiment of the present application.

[0024] Figure 8 They are the block read times and equivalent read times of sub - blocks in a physical block provided by an embodiment of the present application.

[0025] Figure 9 It is a scaling factor between one sub - block and another sub - block in a physical block provided by an embodiment of the present application.

[0026] Figure 10 It is a flowchart of a read interference optimization method provided by another embodiment of the present application.

[0027] Figure 11 It is a functional module diagram of a read interference optimization device provided by an embodiment of the present application. Detailed implementation manners

[0028] In order to make the objectives, technical solutions and advantages of the present application clearer, the present application will be described in detail below with reference to the accompanying drawings and specific embodiments.

[0029] It should be noted that, in the present application, "at least one" means one or more, and "a plurality" means two or more than two. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B may represent: A exists alone, A and B exist simultaneously, and B exists alone, where A and B may be singular or plural. Terms such as "first", "second", "third", "fourth", etc. (if any) in the description, claims and drawings of the present application are used to distinguish similar objects, rather than to describe a specific order or sequence.

[0030] In the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or explanations. Any embodiment or design solution described as "exemplary" or "for example" in the embodiments of the present application should not be construed as being more preferred or having more advantages than other embodiments or design solutions. Rather, the use of words such as "exemplary" or "for example" is intended to present relevant concepts in a specific manner. Without conflict, the following embodiments and the features in the embodiments may be combined with each other.

[0031] As Figure 1 shown, it is a schematic structural diagram of an electronic device for implementing the read interference optimization method provided by an embodiment of the present application.

[0032] In the embodiments of the present application, the read interference optimization method is applied to one or more electronic devices 1. An electronic device 1 is a device capable of automatically performing numerical calculations and / or information processing according to pre-set or stored computer-readable instructions. Its hardware includes, but is not limited to, a microprocessor, an application specific integrated circuit (ASIC), a field-programmable gate array (FPGA), a digital signal processor (DSP), an embedded device, etc.

[0033] The electronic device 1 can be any kind of electronic product that can interact with users. For example, a personal computer, a tablet computer, a smart phone, a personal digital assistant (PDA), a game console, an Internet Protocol Television (IPTV), a smart wearable device, etc.

[0034] The electronic device 1 may include a network device and / or a user device. Among them, the network device includes, but is not limited to, a single network electronic device, a group of electronic devices composed of multiple network electronic devices, or a cloud composed of a large number of hosts or network electronic devices based on cloud computing (Cloud Computing).

[0035] The network where the electronic device 1 is located includes, but is not limited to: the Internet, a wide area network, a metropolitan area network, a local area network, a virtual private network (VPN), etc.

[0036] In the embodiments of the present application, the electronic device 1 includes, but is not limited to, a storage device 12, a processor 13, and computer-readable instructions stored in the storage device 12 and executable on the processor 13, such as a read interference optimization program.

[0037] Those skilled in the art can understand that the schematic diagram is only an example of the electronic device 1, and does not constitute a limitation on the electronic device 1. It may include more or fewer components than shown in the figure, or combine some components, or different components. For example, the electronic device 1 may also include input / output devices, network access devices, buses, etc.

[0038] The processor 13 may be a Central Processing Unit (CPU), or may also be other general-purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field-Programmable Gate Arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or a processor, or any conventional processor, etc. The processor 13 is the operation core and control center of the electronic device 1, connecting various parts of the entire electronic device 1 through various interfaces and circuits, and executing the operating system of the electronic device 1 and various installed application programs, program codes, etc.

[0039] The storage device 12 may be an external storage device and / or an internal storage device of the electronic device 1. Further, the storage device 12 may be a storage device in physical form, such as a memory stick, a Trans-flash Card (TF card), etc.

[0040] Combined Figure 2 , the storage device 12 in the electronic device 1 stores computer-readable instructions, and the processor 13 can execute the computer-readable instructions stored in the storage device 12 to implement, for example, Figure 2 the read interference optimization method shown.

[0041] As Figure 2 shown, it is a flowchart of the read interference optimization method provided by an embodiment of the present application. The read interference optimization method is applied to an electronic device (such as Figure 1 the electronic device 1 in), and the electronic device runs a storage device. According to different requirements, the order of the steps in this flowchart can be changed, and some steps can be omitted.

[0042] 201, when a read page operation on any physical block is detected, accumulate the physical block read times of any physical block.

[0043] In at least one embodiment of the present application, the storage device may be a NAND flash memory (Solid State Drive, SSD). The NAND flash memory may include multiple physical blocks, and each physical block may include multiple wordlines (Wordline, WL). For example, block1 includes WL0, WL1, WL2,..., WLn. Each physical block may also include multiple storage pages, and each storage page includes multiple wordlines. Combined Figure 3 to illustrate the internal structure diagram of the physical block. As Figure 3As shown, there are 3 Bottom Select Gates (BSGs) in the physical block, namely BSG0, BSG1, and BSG2. This figure is only an example, and actual products may have various different structures, such as 2 BSGs, etc. Each BSG can correspond to two Top Select Gates (TSGs), namely TSG0, TSG1, TSG2, TSG3, TSG4, and TSG5. All codewords controlled by each TSG are called a storage page (String). For example, TSG0 corresponds to String0, TSG1 corresponds to String1, etc. Each storage page includes multiple word lines, such as WLn-2, WLn-1, WLn, WLn+1, WLn+2, etc. The voltages corresponding to the word lines WLn-2 and above are Vpass, the voltage corresponding to the word line WLn-1 is Vpass′, the voltage corresponding to the word line WLn is Vrd, the voltage corresponding to the word line WLn+1 is Vpass′, and the voltages corresponding to the word lines WLn+2 and below are Vpass. When reading the stored data of the codeword in the word line, it is necessary to turn on the BSG and TSG where the codeword is located, and turn off other BSGs and other TSGs. Among them, the codeword can be a logical unit of 1K, 2K, 4K, etc., and the capacity of the codeword can be set according to the actual situation. The codeword can also include multiple storage units. Specifically, when reading the data in the first codeword (i.e., the codeword on String0) in the nth layer word line (i.e., WLn), the storage page has three on-off states, namely: String0 (TSG on, BSG on), String1 (TSG off, BSG on), and String2-5 (TSG off, BSG off). Each on-off state corresponds to a different degree of read interference.

[0044] Combined with Figure 4a and Figure 4b illustrate that different on-off states of the storage page correspond to different degrees of read interference. As Figure 4a shown, Figure 4a in the abscissa represents the voltage Vrd1 of the codeword, and the ordinate represents the read page count cellcount of the codeword. Since String0 and String1 share the same BSG, that is, the BSGs corresponding to String0 and String1 are both in the on state, the read interference degrees of String0 and String1 are close. While the BSGs of String2-5 are all in the off state, the read interference degrees of String2-5 are relatively close. As Figure 4b shown, Figure 4bThe abscissa represents the number of single-page reads, and the ordinate represents the difference between Vrd1 and L0 Tail. The difference between Vrd1 and L0 Tail represents the degree of influence of read interference. The voltage of String0 and String1 is affected by read interference at a speed nearly twice that of String2-5.

[0045] In at least one embodiment of the present application, the read page operation is an operation in which an electronic device reads data from a page in any physical block. The physical block read count is the number of times data is read from any physical block.

[0046] 202, if the physical block read count is less than or equal to the first preset read interference threshold and greater than the second preset read interference threshold, sample and scan the codewords in multiple storage pages, and determine the codeword with the worst performance in any physical block as the target codeword.

[0047] In at least one embodiment of the present application, the first preset read interference threshold and the second preset read interference threshold can be set by the manufacturer during actual production. The first preset read interference threshold is greater than the second preset read interference threshold.

[0048] In at least one embodiment of the present application, when an electronic device samples and scans the codewords in multiple storage pages and determines the codeword with the worst performance in any physical block as the target codeword, it includes: the electronic device scans all the codewords of a word line in any physical block, and determines the storage page where the codeword with the worst performance in the word line is located as the initial storage page. Further, the electronic device scans the word lines in the initial storage page. When the bit error rate of the word line scanned in the initial storage page is greater than the preset bit error rate threshold, the target codeword is determined from the word lines with a bit error rate greater than the preset bit error rate threshold. Combining Figure 3 Describe the process of determining the target codeword. The electronic device scans 6 codewords in the WLn word line. If the first codeword in the WLn word line has the worst performance, then string0 is determined as the initial storage page. Further, the electronic device scans the word lines in string0. When the original bit error rate of WLn-1 scanned is greater than the preset bit error rate threshold, the codeword shared by string0 and WLn-1 is determined as the target codeword. The present application first scans all the codewords of a word line to determine the initial storage page, and then scans all the word lines in the determined initial storage page. Since it is not necessary to scan all the codewords in the physical block, the efficiency of determining the target codeword can be improved. At the same time, by reducing the number of scans of the codewords in the physical block, the effectiveness of the scan is improved, and the impact of read interference on the quality of service of the storage device is reduced.

[0049] Specifically, combining Figure 5 Describe the electronic device scanning all the codewords of a word line in any physical block. Figure 5Among them, for the word lines closer to the BSG side, the difference in read interference among different storage pages is more obvious. Then, the electronic device selects the word lines closer to the BSG side for scanning, determines the voltage change rate when the codewords of the word lines closer to the BSG side are subject to read interference, and determines the codeword with the maximum voltage change rate as the codeword with the worst performance in that word line. Through the difference in read interference among different storage pages of word lines at different positions, the present application can reasonably select appropriate word lines for scanning, thereby improving the determination accuracy of the initial storage page. The determination method of the target codeword is similar to that of the codeword with the worst performance in the word line, and the present application will not elaborate on this.

[0050] In another embodiment, the electronic device obtains the change amount of the carrier frequency when the codewords of the word lines closer to the BSG side are subject to read interference, and determines the codeword with the worst performance in the word line according to the change amount of the carrier frequency.

[0051] In another embodiment, in combination with Figure 5 illustrate the determination of the codeword with the worst performance in the word line. The electronic device determines the voltage value Vrd1 when the codewords of the word lines closer to the BSG side are subject to read interference, determines the difference between the voltage value Vrd1 and L0 Tail, and determines the codeword with the largest difference between Vrd1 and L0 Tail as the codeword with the worst performance in the word line.

[0052] 203, if the original bit error rate of the target codeword is greater than the preset bit error rate threshold, recycle any physical block.

[0053] In at least one embodiment of the present application, the preset bit error rate threshold can be determined according to the performance requirements for the physical block. If the original bit error rate of the target codeword is greater than the preset bit error rate threshold, the electronic device can also refresh any physical block.

[0054] It can be seen from the above technical solutions that since the embodiments of the present application do not need to scan all the codewords in the physical block, the scanning frequency of the page can be reduced, thereby improving the single-page read interference performance and reducing the impact on the service quality of the storage device.

[0055] Such as Figure 6 shown, is the flowchart of the read interference optimization method provided by another embodiment of the present application. The read interference optimization method is applied to an electronic device (such as Figure 1 the electronic device 1 in), and the electronic device runs a storage device. According to different requirements, the order of the steps in this flowchart can be changed, and some steps can be omitted.

[0056] 601, when a read page operation on any physical block is detected, accumulate the physical block read times of any physical block.

[0057] 602, determine whether the physical block read times are greater than the first preset read interference threshold.

[0058] 603. If the read count of the physical block is greater than the first preset read interference threshold, recycle any physical block.

[0059] In at least one embodiment of the present application, if the read count of the physical block is greater than the first preset read interference threshold, refresh the physical block.

[0060] 604. If the read count of the physical block is less than or equal to the first preset read interference threshold, determine whether the read count of the physical block is greater than the second preset read interference threshold.

[0061] 605. If the read count of the physical block is less than or equal to the second preset read interference threshold, wait for the next read page operation command.

[0062] 606. If the read count of the physical block is greater than the second preset read interference threshold, sample and scan the codewords in multiple storage pages, and determine the codeword with the worst performance in any physical block as the target codeword.

[0063] 607. Determine whether the original bit error rate of the target codeword is greater than the preset bit error rate threshold.

[0064] 608. If the original bit error rate of the target codeword is greater than the preset bit error rate threshold, recycle any physical block.

[0065] 609. If the original bit error rate of the target codeword is less than or equal to the preset bit error rate threshold, wait for the next read page operation command.

[0066] For the detailed content of steps 601, 606, and 608, reference may be made to the above Figure 2 detailed description of steps 201 - 203, which will not be repeated here.

[0067] It can be seen from the above technical solutions that in the embodiments of the present application, since it is not necessary to scan all the codewords in the physical block, the scanning frequency of the page can be reduced, thereby improving the single - page read interference performance and reducing the impact on the service quality of the storage device.

[0068] As Figure 7 shown, it is a flowchart of a read interference optimization method provided by another embodiment of the present application. The read interference optimization method is applied to an electronic device (such as Figure 1 the electronic device 1 therein), and the electronic device runs a storage device. According to different requirements, the order of the steps in this flowchart can be changed, and some steps can be omitted.

[0069] 701. When a read page operation on any physical block is detected, calculate the equivalent read count of each sub - block in any physical block.

[0070] In at least one embodiment of the present application, an electronic device may divide any physical block into multiple sub-blocks according to different storage pages. Figure 8 In the figure, Block0 is divided into Subblock0, Subblock1, …, SubblockNs. Figure 8 In the figure, the read count of each sub-block (i.e., the actual Read Count) and the equivalent read count of each sub-block are respectively recorded. When a read page operation is performed on a sub-block, it may interfere with other sub-blocks within the same physical block. The equivalent read count of each sub-block is usually greater than the number of times the sub-block read page operation is performed. The equivalent read count of the sub-block on which the read page operation is being performed is usually greater than the equivalent read count of other sub-blocks within the same physical block. For example, when a read page operation is performed on Figure 3 String0 in the figure, the equivalent read counts of String 0 and String 1 are greater than the equivalent read counts of String 2-5.

[0071] In at least one embodiment of the present application, an electronic device obtains the voltage change amount of any sub-block during a read page operation on any sub-block in any physical block as the first voltage change amount, and obtains the voltage change amount of other sub-blocks in any physical block except the sub-block as the second voltage change amount. The electronic device determines the proportionality coefficient between any sub-block and other sub-blocks according to the ratio of the second voltage change amount to the first voltage change amount.

[0072] In another embodiment, an electronic device obtains the change amount of the original bit error rate of any sub-block during a read page operation on any sub-block in any physical block as the first value, and obtains the change amount of the original bit error rate of other sub-blocks in any physical block except the sub-block as the second value. The electronic device determines the proportionality coefficient between any sub-block and other sub-blocks according to the ratio of the first value to the second value.

[0073] In Figure 4b describing the value of the proportionality factor, when a read page operation is performed on Figure 3 String0 in the figure, the equivalent read counts of String 0 and String 1 are twice the equivalent read counts of String 2-5, that is, as Figure 9 shown, the proportionality coefficient Rii = 2.

[0074] The present application can accurately determine the degree of influence of read interference on all sub-blocks in a physical block when a read page operation is performed on any sub-block through the voltage change amount or the change amount of the original bit error rate.

[0075] In at least one embodiment of the present application, the electronic device calculates the equivalent read count of each sub-block in any physical block, including: the electronic device determines that the sub-blocks in any physical block that perform page read operations are read sub-blocks, accumulates the sub-block read counts of the read sub-blocks, and further calculates the equivalent read count of each sub-block in any physical block according to the sub-block read counts of the read sub-blocks.

[0076] Specifically, the electronic device calculates the equivalent read count of each sub-block in any physical block according to the sub-block read counts of the read sub-blocks, including: the electronic device obtains the sub-block read count of each sub-block in any physical block, and calculates the equivalent read count according to the sub-block read count of each sub-block and the proportionality coefficient. The determination formula for the equivalent read count of each sub-block is: where RDC(i) represents the equivalent read count of the i-th sub-block, Ns represents the maximum serial number of sub-blocks in any physical block, R ij represents the proportionality factor between the i-th sub-block and the j-th sub-block, and RDC(j) represents the sub-block read count of the j-th sub-block.

[0077] In another embodiment, the electronic device calculates the equivalent read count of each sub-block in any physical block further including: the electronic device obtains the initial equivalent read count of each sub-block before the page read operation, and calculates the equivalent read count of each sub-block according to multiple initial equivalent read counts and the proportionality coefficient. Specifically, the determination formula for the equivalent read count is: SRDC(k)+=R ki where SRDC(k) is the equivalent read count of the k-th sub-block, and R ki is the proportionality factor between the k-th sub-block and the i-th sub-block, and i, k ∈ [0, Ns]. In the embodiment of the present application, by combining the initial equivalent read count and the proportionality coefficient before the page read operation to calculate the equivalent read count, since the influence of the sub-block on other sub-blocks before erasure is retained when calculating the equivalent read count.

[0078] 702. If the equivalent read count of each sub-block is less than or equal to the first preset read interference threshold and there is a target sub-block whose equivalent read count is greater than the second preset read interference threshold, scan and determine the original bit error rate of the target sub-block.

[0079] In at least one embodiment of the present application, the first preset read interference threshold is greater than the second preset read interference threshold. The electronic device uses bit error rate testing to scan the target sub-block and determines the original bit error rate of the target sub-block.

[0080] 703. If the original bit error rate of the target sub-block is greater than the preset bit error rate threshold, recycle the target sub-block or any physical block.

[0081] In at least one embodiment of the present application, the preset bit error rate threshold can be set according to actual production.

[0082] In at least one embodiment of the present application, the electronic device recycling target block or any physical block includes: the electronic device counts the number of blocks in any physical block where the original bit error rate is greater than the preset bit error rate threshold. If the number is greater than or equal to the preset number, recycle any physical block. If the number is less than the preset number, recycle the target block. Among them, the preset number can be set according to the performance requirements of the physical block. If the performance requirements for the physical block are higher, the preset number is smaller. When the number of blocks where the original bit error rate is greater than the preset bit error rate threshold is less than the preset number, the present application recycles the target block, avoiding recycling the entire physical block and reducing the waste of recycled resources.

[0083] It can be seen from the above technical solutions that in the embodiment of the present application, by determining the equivalent read count of each block, since the influence of other blocks on the read block during the page read operation is considered in the equivalent read count, the accuracy of the equivalent read count is improved. Furthermore, by comparing the equivalent read count of each block with the first preset read interference threshold and the second preset read interference threshold, the accuracy of determining the target block can be improved. In addition, by analyzing each block in the physical block, the present application can accurately locate the target block, and by comparing the number of target blocks with the preset number, a reasonable choice can be made for recycling the physical block or the target block.

[0084] As Figure 10 shown, it is a flowchart of a read interference optimization method provided by another embodiment of the present application. The read interference optimization method is applied to an electronic device (such as Figure 1 the electronic device 1 therein), and the electronic device runs a storage device. According to different requirements, the order of the steps in this flowchart can be changed, and some steps can be omitted.

[0085] 1001, when a page read operation on any physical block is detected, calculate the equivalent read count of each block in any physical block.

[0086] 1002, determine whether the equivalent read count of each block is greater than the first preset read interference threshold.

[0087] 1003, if there is a target block whose equivalent read count is greater than the first preset read interference threshold, recycle the target block or any physical block.

[0088] In at least one embodiment of the present application, the electronic device determines a block with an equivalent read count greater than a first preset read interference threshold as an abnormal block. If the number of abnormal blocks in any physical block is greater than or equal to a preset number, any physical block is recycled. If the number of abnormal blocks in any physical block is less than the preset number, the abnormal blocks are recycled. By comparing the number of abnormal blocks with the preset number, the present application can reasonably select whether to recycle a physical block or an abnormal block, thereby improving the recycling efficiency while ensuring the performance of the physical block.

[0089] 1004, if the equivalent read count of each block is less than or equal to the first preset read interference threshold, determine whether the equivalent read count of each block is greater than a second preset read interference threshold.

[0090] In this embodiment, the first preset read interference threshold is generally greater than the second preset read interference threshold.

[0091] 1005, if the equivalent read count of each block is less than or equal to the second preset read interference threshold, wait for the next read page operation.

[0092] In this embodiment, if the equivalent read count of each block is less than or equal to the second preset read interference threshold, it means that all blocks in any physical block belong to physical blocks with normal performance.

[0093] 1006, if there is a target block with an equivalent read count greater than the second preset read interference threshold, scan and determine the original bit error rate of the target block.

[0094] 1007, determine whether the original bit error rate of the target block is greater than a preset bit error rate threshold.

[0095] 1008, if the original bit error rate of the target block is less than or equal to the preset bit error rate threshold, wait for the next read page operation.

[0096] 1009, if the original bit error rate of the target block is greater than the preset bit error rate threshold, recycle the target block or any physical block.

[0097] For the detailed content of steps 1001, 1006, and 1009, reference can be made to the above Figure 7 detailed description of steps 701-703, which will not be repeated here.

[0098] As can be seen from the above technical solutions, in the embodiments of the present application, by determining the equivalent read times of each block, since the influence of other blocks on the read block during the page read operation is considered in the equivalent read times, the accuracy of the equivalent read times is improved. Furthermore, by comparing the equivalent read times of each block with the first preset read interference threshold and the second preset read interference threshold, the accuracy of determining the target block can be improved. In addition, by analyzing each block in the physical block in the present application, the target block can be accurately located, and by comparing the number of target blocks with the preset number, a reasonable selection can be made for the recycling of the physical block or the target block.

[0099] As Figure 11 shown, it is a functional module diagram of a read interference optimization device provided by an embodiment of the present application. The read interference optimization device 11 runs on an electronic device, the electronic device runs a storage device, the storage device includes a plurality of physical blocks, each physical block includes a plurality of storage pages, and the read interference optimization device 11 includes a calculation unit 110, a scanning unit 111, a recycling unit 112, an obtaining unit 113 and a determining unit 114. The module / unit referred to in the present application means a series of computer-readable instruction segments that can be acquired by a processor 13 and can complete a fixed function, and is stored in the storage device 12.

[0100] The calculation unit 110 is configured to, when a page read operation on any physical block is detected, accumulate the physical block read times of any physical block. If the physical block read times are less than or equal to the first preset read interference threshold and greater than the second preset read interference threshold, the scanning unit 111 is configured to sample and scan the codewords in a plurality of storage pages, and determine the worst-performing codeword in any physical block as the target codeword. The recycling unit 112 is configured to recycle any physical block if the original bit error rate of the target codeword is greater than the preset bit error rate threshold.

[0101] The calculation unit 110 is further configured to, when a page read operation on any physical block is detected, calculate the equivalent read times of each block in any physical block. The scanning unit 111 is further configured to, if the equivalent read times of each block are less than or equal to the first preset read interference threshold and there is an equivalent read time of the target block greater than the second preset read interference threshold, scan and determine the original bit error rate of the target block. The recycling unit 112 is further configured to recycle the target block or any physical block if the original bit error rate of the target block is greater than the preset bit error rate threshold.

[0102] Before calculating the equivalent read count of each sub-block in any physical block, the acquisition unit 113 is configured to acquire the voltage change amount of any sub-block during a page read operation on any sub-block in any physical block as the first voltage change amount, and acquire the voltage change amount of other sub-blocks in any physical block except any sub-block as the second voltage change amount. The determination unit 114 is configured to determine a proportionality coefficient according to the ratio of the second voltage change amount to the first voltage change amount.

[0103] If the modules / units integrated in the electronic device 1 are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, to implement all or part of the processes in the above method embodiments of the present application, it can also be completed by instructing relevant hardware through computer-readable instructions. The computer-readable instructions can be stored in a computer-readable storage medium. When the computer-readable instructions are executed by a processor, the steps of the above method embodiments can be implemented.

[0104] Among them, the computer-readable instructions include computer-readable instruction codes, and the computer-readable instruction codes can be in the form of source code, object code, executable files or some intermediate forms, etc. The computer-readable medium can include: any entity or device capable of carrying the computer-readable instruction code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory).

[0105] The storage device 12 can be used to store computer-readable instructions and / or modules. The processor 13 realizes various functions of the electronic device 1 by running or executing the computer-readable instructions and / or modules stored in the storage device 12, and calling the data stored in the storage device 12. The storage device 12 mainly includes a program storage area and a data storage area. Among them, the program storage area can store an operating system, application programs required for at least one function (such as a sound playback function, an image playback function, etc.), etc.; the data storage area can store data created according to the use of the electronic device. The storage device 12 can include non-volatile and volatile storage devices, such as: hard disk, memory, plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, at least one magnetic disk storage device, flash device, or other storage devices.

[0106] Exemplarily, the computer-readable instructions may be divided into one or more modules / units. One or more modules / units are stored in the storage device 12 and executed by the processor 13 to complete the present application. One or more modules / units may be a series of computer-readable instruction segments capable of performing specific functions, and the computer-readable instruction segments are used to describe the execution process of the computer-readable instructions in the electronic device 1. For example, the computer-readable instructions may be divided into a calculation unit 110, a scanning unit 111, a recycling unit 112, an acquisition unit 113, and a determination unit 114.

[0107] For the detailed content of the functions of each module / unit, reference may be made to the above Figures 2 - 11 detailed description, and no repeated description will be given here.

[0108] In the embodiments of the present application, since it is not necessary to scan all codewords in the physical block, the scanning frequency of the page can be reduced, thereby improving the single-page read interference performance and reducing the impact on the service quality of the storage device.

[0109] In several embodiments provided in the present application, it should be understood that the disclosed systems, devices, and methods may be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of modules is only a logical function division, and there may be other division methods in actual implementation.

[0110] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical units, that is, they may be located in one place, or may be distributed to multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0111] In addition, the functional modules in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically alone, or two or more units may be integrated into one unit. The above integrated unit may be implemented in the form of hardware, or in the form of a combination of hardware and software functional modules.

[0112] Therefore, from any point of view, the embodiments should be regarded as exemplary and non-limiting. The scope of the present application is defined by the appended claims rather than the above description. Therefore, all changes falling within the meaning and scope of the equivalent elements of the claims are intended to be included in the present application. Any reference signs attached to the claims should not be regarded as limiting the claimed rights.

[0113] In addition, it is obvious that the term "including" does not exclude other units or steps, and the singular does not exclude the plural. A plurality of units or devices may also be implemented by one unit or device through software or hardware. Terms such as first and second are used to denote names and do not denote any particular order.

[0114] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application and not to limit them. Although the present application has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical solutions of the present application may be modified or equivalently replaced without departing from the spirit and scope of the technical solutions of the present application.

Claims

1. A read interference optimization method, applied to an electronic device, characterized in that, The electronic device includes a storage device, the storage device includes a plurality of physical blocks, and each physical block includes a plurality of storage pages. The read interference optimization method includes: When a page read operation on any physical block is detected, accumulate the physical block read count of the any physical block; If the physical block read count is less than or equal to a first preset read interference threshold and greater than a second preset read interference threshold, sample and scan the codewords in the plurality of storage pages, and determine the worst-performing codeword in the any physical block as the target codeword; If the original bit error rate of the target codeword is greater than a preset bit error rate threshold, recycle the any physical block.

2. The read interference optimization method according to claim 1, wherein When a page read operation on any physical block is detected, the method further includes: Calculate the equivalent read count of each sub-block in the any physical block; If the equivalent read count of each sub-block is less than or equal to the first preset read interference threshold and there is a target sub-block whose equivalent read count is greater than the second preset read interference threshold, scan and determine the original bit error rate of the target sub-block; If the original bit error rate of the target sub-block is greater than the preset bit error rate threshold, recycle the target sub-block or the any physical block.

3. The read interference optimization method according to claim 2, wherein The calculating the equivalent read count of each sub-block in the any physical block includes: Determine the sub-block that performs the page read operation in the any physical block as the read sub-block, and accumulate the sub-block read count of the read sub-block; According to the sub-block read count of the read sub-block, calculate the equivalent read count of each sub-block in the any physical block.

4. The read interference optimization method according to claim 3, characterized in that The calculating the equivalent read count of each sub-block in the any physical block according to the sub-block read count of the read sub-block includes: Obtain the sub-block read count of each sub-block in the any physical block; According to the sub-block read count of each sub-block and the proportionality coefficient, calculate the equivalent read count.

5. The read interference optimization method according to claim 2, wherein The calculating the equivalent read count of each sub-block in the any physical block further includes: Obtain the initial equivalent read count of each sub-block in the any physical block before the page read operation; According to a plurality of the initial equivalent read counts and the proportionality coefficient, calculate the equivalent read count.

6. The read interference optimization method according to claim 4 or 5, characterized in that Before calculating the equivalent read count of each sub-block in the any physical block, the method further includes: Obtain the voltage change amount of any sub-block in the any physical block during a page read operation on the any sub-block as a first voltage change amount, and obtain the voltage change amount of other sub-blocks in the any physical block except the any sub-block as a second voltage change amount; According to the ratio of the second voltage change amount to the first voltage change amount, determine the proportionality coefficient.

7. The read interference optimization method according to claim 1, wherein The sampling and scanning the codewords in the plurality of storage pages and determining the worst-performing codeword in the any physical block as the target codeword includes: Scan all the codewords of a word line in the any physical block, and determine the storage page where the worst-performing codeword in the word line is located as the initial storage page; When the bit error rate of the word line in the initial storage page is greater than the preset bit error rate threshold, determine the target codeword from the word lines whose bit error rate is greater than the preset bit error rate threshold.

8. The read interference optimization method according to claim 2, wherein The recycling the target sub-block or the any physical block includes: Count the number of sub-blocks in any one of the physical blocks where the original bit error rate is greater than the preset bit error rate threshold; If the number is greater than or equal to the preset number, recycle any one of the physical blocks; or If the number is less than the preset number, recycle the target sub-block.

9. An electronic device, characterized in that, The electronic device includes: A storage device storing computer-readable instructions; and A processor that executes the computer-readable instructions stored in the storage device to implement the read interference optimization method according to any one of claims 1 to 8.

10. A storage medium, characterized in that: Computer-readable instructions are stored in the storage medium, and the computer-readable instructions are executed by a processor in an electronic device to implement the read interference optimization method according to any one of claims 1 to 8.

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