Execution method of large model graph retrieval enhancement system oriented to software and hardware monitoring operation and maintenance
By building an operation and maintenance/fault knowledge graph based on the ontology model and combining a graph retrieval enhancement system with a large language model, the problems of low efficiency of knowledge graph retrieval, inaccurate results and low degree of automation in the existing technology are solved, and efficient and accurate fault location and processing are achieved.
Patent Information
- Application Number
- CN202510890611.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-30
- Publication Date
- 2025-07-29
- Estimated Expiration
- 2045-06-30
AI Technical Summary
When facing large-scale knowledge graphs, existing knowledge graph search technology has high computing power requirements, low retrieval efficiency, and lacks a deep understanding of contextual information, resulting in insufficient correlation of search results, lack of dynamic update mechanism, low degree of automation of fault processing processes, and difficult to quickly and accurately locate relevant knowledge and handle faults.
The graph search enhancement system is adopted, including graph construction and update module, graph search enhancement module, prompt word construction module, reasoning generation module and process analysis module. By building an operation and maintenance/fault knowledge graph based on the ontology model, two-stage filtering search and structured natural language question and answer are carried out, and combined with the reasoning generation capabilities of the large language model, fault analysis and process automation are realized.
It significantly improves the adaptability of knowledge reasoning and fault positioning, improves retrieval efficiency and accuracy, ensures the context fit of generated results and the stability of inference, and enhances the degree of automation of fault processing and the practical value of results.