Aging rack for aging electronic components and detection line using same

Abstract

The invention provides an aging rack for aging electronic components, which can conveniently install a loading unit equipped with the electronic components in the aging rack, and also provides a detection line using the aging rack, the aging rack comprises a rack body and an electric connection seat arranged on the rack body, the rack body is provided with a plurality of layers of placing spaces along the vertical direction, and the placing spaces are arranged on the rack body. The aging rack further comprises a needle plate located at the top of each layer of placing space and a first displacement mechanism used for driving the needle plate to press downwards, the needle plate is connected with a probe, the probe is connected with the electric connection base, each layer of placing space is used for placing a loading unit with an electronic element, the probe is located over an electric connection point of the loading unit placed in the placing space, and the first displacement mechanism is used for driving the probe plate to press downwards. The electrical connection point is connected with an electronic component in the loading unit.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic component aging tests, and specifically to an aging rack for electronic component aging and an inspection line using the aging rack. Background Art

[0002] To improve the reliability of electronic components and reduce production costs, a screening process and a testing and packaging process that can achieve long-term power-on and temperature-raising aging are usually provided during their production process. It is required to form an integrated automatic production line for aging, testing, and packaging. For some electronic components, due to the need for screening, it is also necessary to perform on-line testing on each component for specific parameters during the aging process. At the same time, it is required that the aging operation, including the operation of loading and unloading the aging tooling for the components, be automated to improve production efficiency and reduce operating costs.

[0003] In the existing aging technology, some adopt the aging chamber technology, which adds an on-line monitoring function for specific parameters of each electronic component inside it, and can meet the automation of the aging process, but cannot realize the automatic loading and unloading operations of the components.

[0004] To improve the automation degree of the inspection line, the patent with the publication number CN218890862U discloses an inspection line for capacitor aging and testing, which includes a loading machine for loading electronic components into a loading box, a board loading machine for connecting multiple loading boxes to an aging board to form an aging fixture as described in the patent with the publication number CN208224312U, and a rack loading machine for loading the aging fixture into an aging rack. In this way, a large number of electronic components can be aged at one time by placing the aging rack into the aging device. However, in order to use the aging rack, it is necessary to individually align the aging fixture with the guide groove and insert it into the aging rack, and then lead out the electrical connection end (circuit transfer board) of the aging fixture from the aging rack. Since more aging fixtures can be stored in the aging rack, the above method is relatively inconvenient. Summary of the Invention

[0005] Aiming at the problem of inconvenient loading of the aging rack in the existing technology, the present invention provides an aging rack for electronic component aging, which can facilitate the installation of the loading unit equipped with electronic components in the aging rack, and also provides an inspection line using the aging rack.

[0006] Its technical solution is as follows: An aging rack for electronic components aging, which includes a rack body and an electrical connection base provided on the rack body. The rack body is provided with multiple layers of placement spaces in the vertical direction. It is characterized in that: The aging rack further includes a needle plate located at the top of each layer of the placement space, and a displacement mechanism one for driving the needle plate to press down. Probes are connected to the needle plate, and the probes are connected to the electrical connection base. Each layer of the placement space is respectively used to place a loading unit with electronic components. The probes are located directly above the electrical connection points of the loading unit placed in the placement space, and the electrical connection points are connected to the electronic components in the loading unit.

[0007] Further, the loading unit is a loading box. The loading box is provided with multiple placement slots for placing the electronic components. The electrical connection points are the electrodes of the electronic components or the contacts located on the loading box and connected to the electrodes of the electronic components; when the probes contact the electrodes, the electrodes are not connected to the electrical connection base through parallel connection. When aging, the power supply and testing device of the aging equipment are connected to the electrical connection base, and each electronic component is independently connected to the power supply and testing device through the probes, so that each electronic component can be tested and its performance monitored during the aging process.

[0008] Further, when aging, the power supply and testing device of the aging equipment are connected to the electronic components in the loading unit through the electrical connection base. The power supply and testing device includes a power supply, a voltage wire connected to the power supply, and a measurement wire connected to a testing instrument. One ends of multiple electronic components forming a column in the loading unit are connected to one measurement wire, forming a column in the loading unit; the other ends of multiple electronic components forming a row are connected to the voltage wire, forming a row in the loading unit. A switch is provided between the voltage wire and the power supply; During aging, the switches on all voltage wires are closed, and the total leakage current of all electronic components connected to the measurement wire is measured on each measurement wire; the switch on the voltage wire where the electronic component whose leakage current needs to be tested is located is disconnected, and the total current on the measurement wire connected to this electronic component is measured again. The total current measured this time is less than the current measured before the voltage wire is disconnected from the power supply, and the reduced current value is the leakage current value of the measured electronic component.

[0009] Further, the displacement mechanism one includes a guide rod, a lead screw, and a driving wheel. The end of the guide rod is rotatably connected to the rack body. The middle of the guide rod passes through the needle plate and is slidably connected to it. The end of the lead screw is fixedly connected to the driving wheel. The middle of the lead screw passes through the needle plate and is threadedly connected to it. The driving wheel is used to drive the lead screw to rotate.

[0010] Furthermore, the lead screw and the guide rod are respectively connected to multiple needle plates simultaneously in the vertical direction.

[0011] Furthermore, the guide rod and the lead screw are respectively located on both sides of the frame body. Each lead screw is correspondingly connected to a driving wheel located at the top of the frame body. The displacement mechanism I further includes a driving wheel, and the driving wheel is connected to the driving wheel through a transmission member.

[0012] An inspection line includes an aging rack installation station, an aging test station, and an aging rack disassembly station. Conveyor tracks are respectively installed at each station. The aging test station includes a tunnel-type aging furnace and an aging conveyor track. The aging rack disassembly station is used to remove the loading unit from the aging rack. It is characterized in that: the aging rack installation station is used to install the loading unit onto the above-mentioned aging rack, the aging conveyor track is used to convey the aging rack with the loading unit installed therein in the tunnel-type aging furnace, and the inspection line for electronic components further includes an aging rack conveyor track. The starting end and the ending end of the aging rack conveyor track are respectively arranged corresponding to the aging rack disassembly station and the aging rack installation station.

[0013] Further, a contact array is installed on the tunnel-type aging furnace. The contact array is connected to the displacement mechanism II. When the aging rack with the loading unit installed therein moves in the tunnel-type aging furnace, the contact array is located on the moving path of the electrical connection base, and the displacement mechanism II is used to drive the contact array to be connected to the electrical connection base.

[0014] Further, when the electrodes of the electronic components in the aging rack are not connected to the electrical connection base in parallel, a charging station and a leakage current test station are provided in the tunnel-type aging furnace.

[0015] Further, the inspection line further includes a loading unit conveyor track. The starting end of the loading unit conveyor track is located at the aging rack disassembly station, and the ending end of the loading unit conveyor track is located at the aging rack installation station. A loading unit storage position I, an electronic component screening position, an electronic component blanking position, an electronic component feeding position, and a loading unit storage position II are sequentially arranged at the loading unit conveyor track from the starting end to the ending end.

[0016] Beneficial effects: When loading the aging rack, it only needs to place the loading unit into the placement space, and then control the needle plate to press down through the displacement mechanism I to connect the probe to the electrode of the electronic component, so that the loading unit can be installed in the aging rack, and the installation is convenient.

[0017] For the detection line, since the tunnel-type aging furnace is directly used to conduct aging tests on the aging racks equipped with loading units, the aging racks are transported by the aging conveyor track inside the tunnel-type aging furnace to complete the aging process. Compared with the existing detection lines that require moving the aging racks one by one into the aging chamber for aging and then taking them out, it can reduce labor consumption more effectively. At the same time, when the aging test is completed and the disassembly is finished, the empty aging racks can be transported to the aging rack installation station through the aging rack conveyor track for recycling, thus eliminating the need for manual operation of transportation tools to move the aging racks and further reducing labor costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a three-dimensional structure schematic diagram of the aging rack; Figure 2 It is a front view schematic diagram of the aging rack; Figure 3 It is for Figure 2 side view schematic diagram; Figure 4 It is a structure schematic diagram of the loading box; Figure 5 It is a layout schematic diagram of each station of the detection line; Figure 6 It is an electronic component aging circuit diagram. DETAILED DESCRIPTION OF THE INVENTION

[0019] As Figures 1-3 shown, an aging rack for aging electronic components includes a rack body 1 and an electrical connection base 2 provided on the rack body 1. The rack body 1 is provided with multiple layers of placement spaces along the vertical direction. The aging rack further includes a needle board 3 (preferably an elastic probe card with elasticity) located at the top of each layer of placement space, and a displacement mechanism 1 for driving the needle board 3 to press down. The needle board 3 is connected with a probe 4, and the probe 4 is electrically connected to the electrical connection base 2 through a conductor such as a wire. Each layer of placement space is respectively used to place a loading unit 5 with electronic components. The probe 4 is located directly above the electrical connection point of the loading unit 5 placed in the placement space, and the electrical connection point is connected to the electronic components in the loading unit. Specifically, one form of the loading unit 5 is a loading box 6 as Figure 4 shown. The loading box 6 is provided with multiple placement slots for placing electronic components, and the electrical connection point is the electrode 7 of the electronic component or a contact point on the loading box 6 connected to the electrode of the electronic component. Another form of the loading unit 5 is the aging fixture mentioned in the background technology. After connecting the loading box to the aging board, the electrodes of the electronic components are led out to the circuit transfer board of the aging fixture. At this time, the electrical connection point is the circuit transfer board.

[0020] When assembling and aging fixtures in the prior art, the aging needle board is brought into contact with the electrodes of each electronic component to be aged, so that multiple electronic components are connected in parallel and then led out to the end of the aging board through wires. Since only a small number of ends are required for the parallel connection of electronic components to correspond to the electrodes of each electronic component, voltage can be applied to each electronic component through the ends during aging for power-on aging. However, the above method can only power on the electronic components during aging.

[0021] In order to be able to measure the parameters of electronic components (such as leakage current values) during aging, when the probe 4 contacts the electrode, the electrode is not connected to the electrical connection base 2 through parallel connection. When aging, the power-on and testing device of the aging equipment is connected to the electrical connection base 2, and each electronic component is independently connected to the power-on and testing device through the probe 4, so that each electronic component can be tested and its performance monitored during the aging process.

[0022] However, the above method is costly because each electronic component needs to be led out. It can be combined with Figure 6 As shown, when aging, the power-on and testing device of the aging equipment is connected to the electronic components in the loading unit 5 through the electrical connection base 2. The power-on and testing device includes a power supply 700, a voltage line 701 connected to the power supply 700, and a measurement connection line 703 connected to the testing instrument 702. One end of multiple electronic components forming a column in the loading unit 5 is connected to one measurement connection line 703, forming a column in the loading unit; the other ends of multiple electronic components forming a row are connected to the voltage line 701, forming a row in the loading unit. A switch 704 is provided between the voltage line 701 and the power supply 700; during aging, the switches 704 on all voltage lines 701 are closed, and the total leakage current of all electronic components connected to the measurement connection line 703 is measured on each measurement connection line 703; the switch 704 on the voltage line 701 where the electronic component whose leakage current needs to be tested is located is disconnected, and the total current on the measurement connection line 703 to which this electronic component is connected is measured again. The total current measured this time is less than the current measured before the voltage line 701 is disconnected from the power supply 700, and the reduced current value is the leakage current value of the electronic component to be measured. Such a setting can detect the relevant parameters of parallel-connected electronic components (such as capacitors).

[0023] Meanwhile, when the electronic component is a capacitor, in order to reduce the influence of the voltage on other voltage lines on the total current of the measurement connection wires connected to the capacitor under test through other capacitors, two diodes 705 are added between all capacitors and their respective voltage lines 701 to isolate the adverse effects of the bypass current caused by other units around the capacitor under test and improve the test accuracy of the leakage current of the capacitor under test. Specifically, the capacitor is connected to two voltage lines through two diodes 705 with opposite installation directions. One of the two voltage lines is used to power the capacitor, and the other is used to discharge the capacitor. The two voltage lines are respectively connected to an external power supply or a discharge terminal through their respective switches. The switch determines whether to power or discharge the capacitor. The voltage line used to power the capacitor is connected to a DC power supply through a switch or connected to a series of DC power supply and AC power supply through a switch.

[0024] The electronic components mentioned in this solution are preferably electronic components with cylindrical single-end side double electrodes, double-end side electrodes, or surface-mounted single-sided side electrodes, double-sided side electrodes, or pin-type electrodes for plug-in packaging. If used for some capacitor products, such as supercapacitors, the capacitors that have been initially tested after aging can be charged in the loading unit, and then the loading unit can be placed in the loading unit storage rack. After a certain period of time, the charge storage state of the capacitor can be tested. Finally, a step of testing the main parameters of the capacitors in the loading unit can be added.

[0025] The specific structure of other aging racks is as follows: The first displacement mechanism includes a guide rod 8, a lead screw 9, and a driving wheel 10. The end of the guide rod 8 is rotatably connected to the frame body 1. The middle of the guide rod 8 passes through the needle plate 3 and is slidably connected to it. The end of the lead screw 9 is fixedly connected to the driving wheel 10. The middle of the lead screw 9 passes through the needle plate 3 and is threadedly connected to it. The driving wheel 10 is used to drive the lead screw 9 to rotate. In this way, by rotating the lead screw 9, the rotation is converted into a linear motion by the lead screw pair to control the up and down movement of the needle plate 3. Although devices such as air cylinders and oil cylinders can also be used to directly control the up and down movement of the needle plate 3, considering factors such as the use environment and stability, it is more appropriate to use components such as lead screws. In addition, preferably, the lead screw 9 and the guide rod 8 are respectively connected to multiple needle plates 3 in the vertical direction at the same time, as shown in the figure, all the needle plates 3 in the same vertical direction are connected; the guide rod 8 and the lead screw 9 are respectively located on both sides of the frame body 1. Each lead screw 9 is respectively connected to a driving wheel 10 located at the top of the frame body. The first displacement mechanism also includes a driving wheel 11, and the driving wheel 11 is connected to the driving wheel 10 through a transmission member (such as a chain or a synchronous belt).

[0026] Such as Figure 5A detection line as shown includes an aging rack installation station 100, an aging test station, and an aging rack disassembly station 200. Conveyor tracks are installed at each station. The aging rack installation station 100 is used to install the loading unit onto the above-mentioned aging rack. The aging test station includes a tunnel-type aging furnace 300 (preferably U-shaped) and an aging conveyor track 400. The aging rack disassembly station 200 is used to remove the loading unit from the aging rack. The aging conveyor track 400 is used to convey the aging rack with the loading unit installed therein in the tunnel-type aging furnace 300. Multiple aging racks are aged and tested at the power-on and test stations in a sequential queueing manner at a certain rhythm. The electronic component detection line further includes an aging rack conveyor track 500. The starting end and the terminating end of the aging rack conveyor track 500 are respectively arranged corresponding to the aging rack disassembly station 200 and the aging rack installation station 100. A manipulator can place the loading unit into the aging rack or take it out from the aging rack. The aging rack conveyor track 500 can facilitate the transfer of the empty aging rack in the detection line. The taken-out loading unit can be directly used for the test device outside the aging device. The probe card of the test device contacts the electrodes of each electronic component on the electronic component carrier board to complete the performance test. Although the above-mentioned aging rack can be directly placed into the aging chamber for static aging, and there is a power-on and test device in the aging chamber, which is in contact connection with the electrical connection seat on the aging rack through a multi-channel contact array, in order to facilitate handling, aging the aging rack in a tunnel-type aging furnace can facilitate the operation of the aging rack loaded with electronic components during the aging process in the detection line.

[0027] Specifically, a contact array 301 is installed on the tunnel-type aging furnace 300. The contact array 301 is connected to the displacement mechanism II. When the aging rack with the loading unit moves in the tunnel-type aging furnace, the contact array 301 is located on the moving path of the electrical connection seat. The displacement mechanism II is used to drive the contact array 301 to connect with the electrical connection seat, thereby connecting the power-on and test device with the aging rack, and further connecting with the electrodes of the electronic components.

[0028] Similar to the above-mentioned function, when the electrodes of the electronic components in the aging rack are not connected to the electrical connection seat in parallel, there are a charging station 302 and a leakage current test station 303 in the tunnel-type aging furnace for power-on and testing respectively.

[0029] The detection line further includes a loading unit conveying track 600. The starting end of the loading unit conveying track 600 is located at the aging rack disassembly station 200, and the terminating end of the loading unit conveying track 600 is located at the aging rack installation station 100. Along the loading unit conveying track 600 from the starting end to the terminating end, there are successively provided a first loading unit storage position 601, an electronic component screening position 602 (a screening device is provided at this station, and defective products formed during the aging process can be removed from the loading unit by the screening device outside the aging device), an electronic component unloading position 603, a spare loading unit position 604, an electronic component loading position 605, and a second loading unit storage position 606.

[0030] The above are only the preferred specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that can be easily thought of by those familiar with the technology within the technical scope disclosed by the present invention should be covered by the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.

Claims

1. An aging rack for electronic components aging, which comprises a rack body and an electrical connection base arranged on the rack body. The rack body is provided with multiple layers of placement spaces along the vertical direction, and is characterized in that: The aging rack further includes a needle board located at the top of each placement space and a displacement mechanism I for driving the needle board to press down. A probe is connected to the needle board, and the probe is connected to the electrical connection base. Each placement space is respectively used to place a loading unit with electronic components. The probe is located directly above the electrical connection point of the loading unit placed in the placement space, and the electrical connection point is connected to the electronic components in the loading unit.

2. The aging rack for aging electronic components according to claim 1, wherein: The loading unit is a loading box, and the loading box is provided with a plurality of placement slots for placing the electronic components. The electrical connection point is the electrode of the electronic component or a contact point located on the loading box and connected to the electrode of the electronic component; when the probe contacts the electrode, the electrode is not connected to the electrical connection base in parallel. When aging, the power supply and testing device of the aging equipment is connected to the electrical connection base, and each electronic component is independently connected to the power supply and testing device through the probe, so that each electronic component can be tested and its performance monitored during the aging process.

3. An aging rack for aging electronic components according to claim 1, characterized in that: When aging, the power supply and testing device of the aging equipment is connected to the electronic components in the loading unit through the electrical connection base. The power supply and testing device includes a power supply, a voltage line connected to the power supply, and a measurement connection line connected to a testing instrument. One end of a plurality of electronic components forming a column in the loading unit is connected to one measurement connection line to form a column in the loading unit; the other ends of a plurality of electronic components forming a row are connected to the voltage line to form a row in the loading unit. A switch is provided between the voltage line and the power supply. During aging, the switches on all voltage lines are closed, and the total leakage current of all electronic components connected to the measurement connection line is measured on each measurement connection line; the switch on the voltage line where the electronic component whose leakage current needs to be tested is located is disconnected, and the total current on the measurement connection line connected to this electronic component is measured again. The total current measured this time is less than the current measured before the voltage line was disconnected from the power supply, and the reduced current value is the leakage current value of the measured electronic component.

4. An aging rack for aging electronic components according to claim 1, characterized in that: The displacement mechanism I includes a guide rod, a lead screw, and a driving wheel. The end of the guide rod is rotatably connected to the frame body, the middle of the guide rod passes through the needle board and is slidably connected thereto, the end of the lead screw is fixedly connected to the driving wheel, the middle of the lead screw passes through the needle board and is threadedly connected thereto, and the driving wheel is used to drive the lead screw to rotate.

5. The aging rack for aging electronic components according to claim 4, wherein: The lead screw and the guide rod are respectively connected to a plurality of needle boards in the vertical direction at the same time.

6. The aging rack for aging electronic components according to claim 4, wherein: The guide rod and the lead screw are respectively located on both sides of the frame body. Each lead screw is respectively connected to a driving wheel located at the top of the frame body. The displacement mechanism I further includes a driving wheel, and the driving wheel is connected to the driving wheel through a transmission member.

7. A detection line, which includes an aging rack installation station, an aging test station, and an aging rack disassembly station. Conveyor tracks are respectively installed at each station. The aging test station includes a tunnel-type aging furnace and an aging conveyor track. The aging rack disassembly station is used to remove the loading unit from the aging rack, and is characterized in that: The aging rack installation station is used to install the loading unit onto the aging rack according to any one of claims 1-6. The aging conveying track is used to convey the aging rack with the loading unit installed therein in the tunnel-type aging furnace. The electronic component detection line further includes an aging rack conveying track, and the starting end and the terminating end of the aging rack conveying track are respectively arranged corresponding to the aging rack disassembly station and the aging rack installation station.

8. A detection line according to claim 7, characterized in that: A contact array is installed on the tunnel-type aging furnace, and the contact array is connected to the displacement mechanism II. When the aging rack with the loading unit installed therein moves in the tunnel-type aging furnace, the contact array is located on the moving path of the electrical connection base, and the displacement mechanism II is used to drive the contact array to be connected to the electrical connection base.

9. A detection line according to claim 7 or 8, characterized in that: When the electrodes of the electronic components in the aging rack are not connected to the electrical connection base in parallel, a charging station and a leakage current test station are provided in the tunnel-type aging furnace.

10. A detection line according to claim 7, characterized in that: The detection line further includes a loading unit conveying track. The starting end of the loading unit conveying track is located at the aging rack disassembly station, and the terminating end of the loading unit conveying track is located at the aging rack installation station. The loading unit storage position I, the electronic component screening position, the electronic component blanking position, the electronic component loading position, and the loading unit storage position II are successively arranged at the loading unit conveying track from the starting end to the terminating end.

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