Microseismic waveform arrival time picking method, system, device and medium

Abstract

The present invention provides a method, system, device and medium for picking up microseismic waveform arrival times, which relates to the field of signal processing technology. The method comprises: acquiring full waveform data including N original data points; determining an original data point that meets a preset maximum value condition as a local maximum value point; determining a local maximum value point that meets a preset screening condition as a target local maximum value point; determining the AIC value of each target local maximum value point; determining a first target maximum value point from each target local maximum value point according to each AIC value, and determining the longitudinal wave arrival time according to the first target maximum value point; determining an absolute maximum value point according to the absolute value of the signal corresponding to each original data point; determining a target calculation interval according to the first target maximum value point and the absolute maximum value point; determining a second target maximum value point according to the AIC value of each target local maximum value point within the target calculation interval, and determining the shear wave arrival time according to the second target maximum value point. The present application improves the efficiency and accuracy of picking up the longitudinal wave arrival time and the shear wave arrival time.

Description

Technical Field

[0001] The present invention relates to the field of signal processing technology, and in particular to a method, system, device and medium for picking up microseismic waveform arrival time. Background Art

[0002] Microseismic waveform arrival time picking includes picking longitudinal waves and shear waves. Existing methods for picking microseismic waveform arrival time use the Akaike Information Criterion (AIC) to calculate each data point in the full waveform, obtaining the AIC value corresponding to each data point. The time point corresponding to the data point with the smallest AIC value is then determined as the longitudinal wave arrival time. The shear wave arrival time is then determined based on the longitudinal wave arrival time. Existing methods for picking microseismic waveform arrival time have low picking accuracy, slow calculation speed, and high resource consumption. Summary of the Invention

[0003] In view of this, the purpose of the present invention is to overcome the deficiencies in the prior art and provide a method, system, device and medium for picking up microseismic waveform arrival times. The present invention provides the following technical solutions:

[0004] In a first aspect, the present invention provides a method for picking microseismic waveform arrival times, the method comprising:

[0005] Acquire full waveform data, the full waveform data including: N original data points, each of the original data points representing a wave signal value at a different moment;

[0006] Determining at least one of the original data points that meets a preset maximum condition as a local maximum point;

[0007] Determine at least one local maximum point that meets a preset screening condition as a target local maximum point;

[0008] Determine the AIC value of each target local maximum point based on the Akaike Information Criterion;

[0009] Determining a first target maximum point from each target local maximum point according to each AIC value, and determining a time corresponding to the first target maximum point as a longitudinal wave arrival time;

[0010] Determine an absolute maximum point according to the absolute value of the signal corresponding to each of the original data points, wherein the absolute value of the signal is the absolute value of the wave signal value corresponding to the original data point;

[0011] Determining a target calculation interval according to the first target maximum point and the absolute maximum point;

[0012] According to the AIC values ​​of the target local maximum points within the target calculation interval, the second target maximum point is determined, and the time corresponding to the second target maximum point is determined as the shear wave arrival time.

[0013] In an optional embodiment, determining at least one original data point that meets a preset maximum condition as a local maximum point includes:

[0014] If the wave signal value of the i-th original data point is greater than the wave signal value of the i-1-th original data point and greater than the wave signal value of the i+1-th original data point, then the i-th original data point is determined as the local maximum point;

[0015] Alternatively, if the wave signal value of the i-th original data point is less than the wave signal value of the i-1th original data point and less than the wave signal value of the i+1th original data point, then the i-th original data point is determined as the local maximum point, where 1<i<N.

[0016] In an optional embodiment, the number of the local maximum points is M and M<N, and determining at least one local maximum point that meets a preset screening condition as a target local maximum point includes:

[0017] If the time interval between the jth local maximum point and the j-1th local maximum point is greater than the minimum waveform period, it is determined that the j-1th local maximum point and the jth local maximum point meet the preset screening condition;

[0018] The j-1th local maximum point and the jth local maximum point are respectively determined as the target local maximum points, wherein 1<j≤M.

[0019] In an optional embodiment, obtaining the minimum waveform period includes:

[0020] Acquire the maximum frequency of the full waveform data;

[0021] The minimum waveform period of the full waveform data is determined according to the maximum frequency.

[0022] In an optional embodiment, determining the first target maximum point from each target local maximum point according to each AIC value includes:

[0023] The AIC values ​​are compared, and the target local maximum point with the smallest AIC value is determined as the first target maximum point.

[0024] In an optional embodiment, determining the absolute maximum point according to the absolute value of the signal corresponding to each of the original data points includes:

[0025] The original data point with the largest absolute signal value is determined as the absolute maximum point.

[0026] In an optional embodiment, determining the second target maximum point according to the AIC value of each target local maximum point within the target calculation interval includes:

[0027] Comparing the AIC values ​​of the target local maximum points within the target calculation interval;

[0028] The target local maximum point with the minimum AIC value within the target calculation interval is determined as the second target maximum point.

[0029] In a second aspect, the present invention provides a microseismic waveform arrival time picking system, the system comprising:

[0030] A waveform acquisition module is used to acquire full waveform data, wherein the full waveform data includes: N original data points, each of which represents a wave signal value at a different time;

[0031] A first screening module, configured to determine at least one of the original data points that meets a preset maximum condition as a local maximum point;

[0032] A second screening module is configured to determine at least one local maximum point that meets a preset screening condition as a target local maximum point;

[0033] A calculation module, used for determining the AIC value of each target local maximum point based on the Akaike Information Criterion;

[0034] a longitudinal wave arrival time determination module, configured to determine a first target maximum point from each target local maximum point according to each AIC value, and determine a time corresponding to the first target maximum point as the longitudinal wave arrival time;

[0035] A first determining module is configured to determine an absolute maximum point based on the absolute value of a signal corresponding to each of the original data points, wherein the absolute value of the signal is the absolute value of the wave signal value corresponding to the original data point;

[0036] A second determining module, configured to determine a target calculation interval according to the first target maximum point and the absolute maximum point;

[0037] The shear wave arrival time determination module is used to determine the second target maximum point according to the AIC value of each target local maximum point in the target calculation interval, and determine the time corresponding to the second target maximum point as the shear wave arrival time.

[0038] In a third aspect, the present invention provides an electronic device comprising a memory and a processor, wherein the memory stores a computer program, and when the computer program runs on the processor, the method for picking up microseismic waveform arrival times as described in the first aspect is executed.

[0039] In a fourth aspect, the present invention provides a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the microseismic waveform arrival time picking method described in the first aspect.

[0040] The microseismic waveform arrival time picking method, system, device and medium provided by the present application obtain full waveform data, wherein the full waveform data includes: N original data points, each of which represents a wave signal value at a different time; at least one of the original data points that meets a preset maximum value condition is determined as a local maximum value point; at least one of the local maximum value points that meets a preset screening condition is determined as a target local maximum value point; the AIC value of each of the target local maximum value points is determined based on the Akaike Information Criterion; according to each AIC value, a first target maximum value point is determined from each of the target local maximum value points, and the first target maximum value point is determined. The moment corresponding to a target maximum point is determined as the arrival time of the longitudinal wave; the absolute maximum point is determined according to the absolute value of the signal corresponding to each of the original data points, and the absolute value of the signal is the absolute value of the wave signal value corresponding to the original data point; the target calculation interval is determined according to the first target maximum point and the absolute maximum point; the second target maximum point is determined according to the AIC value of each target local maximum point in the target calculation interval, and the moment corresponding to the second target maximum point is determined as the arrival time of the transverse wave, which optimizes the picking process of the longitudinal wave arrival time and the transverse wave arrival time, and improves the picking efficiency and picking accuracy of the longitudinal wave arrival time and the transverse wave arrival time.

[0041] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, preferred embodiments are given below and described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments. It should be understood that the following drawings only illustrate certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without making any creative efforts.

[0043] Figure 1 A schematic diagram of a process of picking microseismic waveform arrival time provided by an embodiment of the present application is shown;

[0044] Figure 2 An example diagram of full waveform data provided by an embodiment of the present application is shown;

[0045] Figure 3 Another schematic diagram of the process of picking microseismic waveform arrival time provided by an embodiment of the present application is shown;

[0046] Figure 4Another schematic flow chart of the method for picking up microseismic waveform arrival times provided in an embodiment of the present application is shown;

[0047] Figure 5 An example diagram of a waveform picking result provided by an embodiment of the present application is shown;

[0048] Figure 6 A schematic diagram showing a comparison of the time required for three different waveform picking methods provided in an embodiment of the present application is shown;

[0049] Figure 7 A schematic structural diagram of a microseismic waveform arrival time picking system provided by an embodiment of the present application is shown;

[0050] Figure 8 A structural schematic diagram of an electronic device provided in an embodiment of the present application is shown.

[0051] Description of main component symbols:

[0052] 700-microseismic waveform arrival time picking system; 710-waveform acquisition module; 720-first screening module; 730-second screening module; 740-calculation module; 750-longitudinal wave arrival time determination module; 760-first determination module; 770-second determination module; 780-transverse wave arrival time determination module; 800-electronic device; 801-transceiver; 802-processor; 803-memory. DETAILED DESCRIPTION

[0053] The following describes embodiments of the present invention in detail. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended only to explain the present invention and are not to be construed as limiting the present invention.

[0054] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature identified as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0055] Unless otherwise defined, all technical and scientific terms used herein have the same meanings as commonly understood by one skilled in the art to which this application belongs. The terms used in the template description herein are for the purpose of describing specific embodiments only and are not intended to limit the present invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0056] Example 1

[0057] The existing method for picking up the arrival time of microseismic waveforms is mainly as follows: based on the Akaike Information Criterion (AIC), each data point in the full waveform is calculated to obtain the AIC value corresponding to each data point in the full waveform, and the time point corresponding to the data point with the smallest AIC value is determined as the arrival time of the longitudinal wave. After the arrival time of the longitudinal wave is determined, the arrival time of the shear wave is determined by any of the following methods: (1) the point with the smallest wave signal value or the signal inflection point after the arrival time of the longitudinal wave is determined as the arrival time of the shear wave; (2) for the waveform after the arrival time of the longitudinal wave, the arrival time of the shear wave is calculated again using the AIC algorithm; (3) the short-term average / long-term average (STA / LTA) method is used to determine the shear wave interval according to the preset threshold, and then the point with the smallest AIC value in the shear wave interval is determined as the arrival time of the shear wave. The existing method for picking up the arrival time of microseismic waveforms has low picking accuracy, slow calculation speed, and large resource consumption. For this, please refer to Figure 1 The embodiment of the present application provides a method for picking up microseismic waveform arrival time, including steps S110 to S180.

[0058] Step S110 , obtaining full waveform data, wherein the full waveform data includes: N original data points, each of which represents a wave signal value at a different moment.

[0059] The full waveform data is the waveform of the identified rock fracture signal, see Figure 2 , Figure 2 An example of a full waveform data graph is shown, in which the horizontal axis represents the sampling time and the vertical axis represents the signal amplitude, that is, the wave signal value described below.

[0060] Step S120: determining at least one of the original data points that meets a preset maximum condition as a local maximum point.

[0061] Due to the noise and discreteness of full waveform data, the fitted curve itself contains errors. Therefore, using the derivative method to determine the local maximum point based on the fitted curve is not accurate. The local maximum point is the data point where the peak or trough of the full waveform data is located. It can be understood that the peak is the data point with the maximum waveform signal value in the local area, and the trough is the data point with the minimum waveform signal value in the local area.

[0062] In this embodiment, the local maximum point is determined by comparing the signal values ​​between each original data point and its adjacent data points, thereby avoiding the problem of low accuracy of the derivative method due to data errors and improving the accuracy of determining the local maximum point.

[0063] In one embodiment, determining at least one original data point that meets a preset maximum condition as a local maximum point includes:

[0064] If the wave signal value of the i-th original data point is greater than the wave signal value of the i-1-th original data point and greater than the wave signal value of the i+1-th original data point, then the i-th original data point is determined as the local maximum point;

[0065] Alternatively, if the wave signal value of the i-th original data point is less than the wave signal value of the i-1th original data point and less than the wave signal value of the i+1th original data point, then the i-th original data point is determined as the local maximum point, where 1<i<N.

[0066] In this embodiment, the local maximum point includes: a local maximum point, and its determination condition is:

[0067]

[0068] That is, the i-th original data point x[i] is greater than its left and right adjacent points x[i−1] and x[i+1]. Specifically, the derivative diff(x)=x[i+1]−x[i] is calculated by first-order difference, and the peak is detected by the sign change:

[0069]

[0070]

[0071] Local maximum points also include: local minimum points, and their judgment conditions are:

[0072]

[0073] That is, the i-th original data point x[i] is smaller than its left and right adjacent points x[i−1] and x[i+1]. Similarly, the derivative diff(x)=x[i+1]−x[i] is calculated by first-order difference, and the peak is detected by the sign change:

[0074]

[0075] .

[0076] Step S130 , determining at least one local maximum point that meets a preset screening condition as a target local maximum point.

[0077] It can be understood that the local maximum point is the data point where the peak or trough is located. Please refer to Figure 2 , Figure 2 A number of local minimum points are also shown.

[0078] In this embodiment, in order to further reduce the amount of calculation and improve the calculation efficiency, multiple local maximum points are further screened to eliminate pseudo peaks and troughs generated by high-frequency noise or redundant fluctuations.

[0079] In one embodiment, the number of the local maximum points is M and M<N, see Figure 3 , step S130 includes: steps S131~S132.

[0080] Step S131: If the time interval between the jth local maximum point and the j-1th local maximum point is greater than the minimum waveform period, it is determined that the j-1th local maximum point and the jth local maximum point meet the preset screening condition.

[0081] In this embodiment, the M local minimum points, selected from N raw data points, are screened based on the physical properties of microseismic signals: the time interval between true peaks or troughs is typically greater than the minimum period, while fluctuations less than the minimum period may be high-frequency noise or invalid vibrations. Specifically, adjacent local minimum points whose time interval is less than the minimum waveform period are removed.

[0082] Step S132: Determine the j-1th local maximum point and the jth local maximum point as the target local maximum point, respectively, where 1<j≤M.

[0083] In this embodiment, if the time interval between the jth local minimum point and the j-1th local minimum point is greater than the minimum waveform period, these two points are identified as target local minimum points. This method effectively eliminates high-frequency noise interference and retains characteristic points that reflect the true rock fracture signal, such as key peaks and troughs. This provides more reliable input for the subsequent calculation of P- and S-wave arrival times using the AIC method, while also reducing redundant computation and improving waveform picking efficiency.

[0084] In one embodiment, obtaining the minimum waveform period includes: obtaining the maximum frequency of the full waveform data; and determining the minimum waveform period of the full waveform data according to the maximum frequency.

[0085] In this embodiment, the maximum frequency of the full waveform data is obtained. , minimum waveform period .

[0086] Step S140 , determining the AIC value of each target local maximum point based on the Akaike Information Criterion.

[0087] In this embodiment, the AIC value of each target local maximum point is calculated to evaluate the possibility of each target local maximum point being a longitudinal wave. Specifically, the calculation formula of the AIC of the kth target local maximum point is as follows:

[0088]

[0089]

[0090]

[0091]

[0092]

[0093] in, Indicates the AIC value of the kth target local minimum point, Indicates the variance value of the 1st to k-1th local maximum points of the target, represents the variance value of the k+1~nth target local maximum point, n represents the total number of target local maximum points, represents the average value of the 1st to k-1th target local maximum points, Represents the wave signal value of the rth target local maximum point; Represents the average value of the k+1~nth target local maximum points.

[0094] Step S150 , determining a first target maximum point from each target local maximum point according to each AIC value, and determining the time corresponding to the first target maximum point as the longitudinal wave arrival time.

[0095] In this embodiment, the AIC value is used to measure the significance of the waveform change. The smaller the AIC value, the more significant the waveform. The target local maximum point where the waveform changes most significantly is determined as the first target maximum point, and the sampling time corresponding to the first target maximum point is determined as the arrival time of the longitudinal wave.

[0096] In one embodiment, determining the first target maximum point from each target local maximum point based on each AIC value includes: comparing the sizes of each AIC value and determining the target local maximum point with the smallest AIC value as the first target maximum point.

[0097] It can be understood that, based on the physical propagation laws of microseismic waveforms, the arrival time of P-waves is significantly earlier than that of S-waves, and the AIC value of the data point corresponding to the P-wave arrival time is smaller than the AIC value of the data point corresponding to the S-wave arrival time. Therefore, by comparing the AIC values ​​of the local maximum points of each target, the arrival time of the P-wave can be determined first.

[0098] Step S160, determining an absolute maximum point according to the absolute value of the signal corresponding to each of the original data points, wherein the absolute value of the signal is the absolute value of the wave signal value corresponding to the original data point.

[0099] In this embodiment, the absolute values ​​of the signals at all raw data points are compared to determine the point with the largest absolute value as the absolute maximum point. This absolute maximum point reflects the location of the maximum vibration intensity in the waveform. Combined with the propagation patterns of longitudinal and shear waves, this can be used to subsequently determine the arrival time of the shear wave within the interval between the first target maximum point and the absolute maximum point.

[0100] In one embodiment, determining the absolute maximum point according to the absolute values ​​of the signals corresponding to the original data points includes: determining the original data point with the largest absolute value of the signal as the absolute maximum point.

[0101] In this embodiment, the absolute value of the wave signal value corresponding to each original data point is calculated, and the original data point with the largest absolute value of the wave signal is determined as the absolute maximum point. According to the superposition characteristics of longitudinal waves and transverse waves, the transverse wave will be located in the interval between the absolute maximum point and the first target maximum point.

[0102] Step S170: determining a target calculation interval according to the first target maximum point and the absolute maximum point.

[0103] Since the propagation speed of longitudinal waves is faster than that of transverse waves, and the superposition of longitudinal waves and transverse waves will form the maximum value of the waveform, the arrival time of the longitudinal wave must be between the arrival time of the transverse wave and the absolute maximum point. Therefore, the interval between the first target maximum point (longitudinal wave arrival time) and the absolute maximum point is determined as the target calculation interval, which is used for the subsequent determination of the transverse wave arrival time.

[0104] Step S180: determining a second target maximum point according to the AIC value of each target local maximum point within the target calculation interval, and determining the time corresponding to the second target maximum point as the shear wave arrival time.

[0105] In this embodiment, the AIC values ​​of the target local maximum points within the target calculation interval are weighted respectively. By comparing the sizes of these AIC values, the target local maximum point with the smallest AIC value is determined as the second target maximum point, and the moment corresponding to this point is the arrival time of the shear wave.

[0106] It can be understood that by determining the target calculation interval based on the physical fluctuation law of the microseismic waveform and determining the shear wave arrival time within the target calculation interval, the search range of the shear wave arrival time is greatly narrowed, the amount of calculation is reduced, and the accuracy of the picking results is further improved.

[0107] In one embodiment, see Figure 4, determining the second target maximum point according to the AIC value of each target local maximum point within the target calculation interval includes: steps S181~S182.

[0108] S181 , comparing the AIC values ​​of the target local maximum points within the target calculation interval.

[0109] In this embodiment, the shear wave arrives after the first target maximum point and before the absolute maximum point. After the shear wave arrives, it will also cause significant fluctuations in the waveform. Therefore, by comparing the AIC values ​​of each target maximum point in the target calculation interval, the target local maximum point with the most significant fluctuation in the target calculation interval can be determined.

[0110] S182: Determine the target local maximum point with the minimum AIC value within the target calculation interval as the second target maximum point.

[0111] Based on the characteristics of the waveform energy or frequency change when the shear wave arrives, the AIC value of the data point corresponding to the shear wave arrival time is minimized within the target local interval, and this is used as the basis for judging the shear wave arrival time. Figure 5 , Figure 5 An example diagram of the waveform picking result provided by an embodiment of the present application is shown.

[0112] To further illustrate the improvement in waveform picking efficiency, see Figure 6 , Figure 6 The figure shows a comparison of the time required for three different waveform picking methods. The first picking method directly uses the AIC value to calculate the time required for the arrival of the longitudinal wave. The second picking method screens the peaks and troughs to calculate the time required for the arrival of the longitudinal wave. The third is the time required for the longitudinal wave picking method proposed in this application. In terms of time, the calculation efficiency of this application scheme is improved by more than 8 times, and only 4000 sampling points are calculated. Usually, the acquisition instrument samples 6000 points per second, and the trigger signal is at least 1s. Therefore, this scheme only picks longitudinal waves, and the calculation efficiency is improved by nearly 9 times. In the subsequent shear wave calculation, a small calculation range is obtained by screening, and the peaks and troughs do not need to be recalculated. This will reduce further calculation time while improving the picking accuracy.

[0113] The microseismic waveform arrival time extraction method provided by the embodiment of the present application obtains full waveform data, wherein the full waveform data includes: N original data points, each of which represents a wave signal value at a different time; at least one of the original data points that meets a preset maximum value condition is determined as a local maximum value point; at least one of the local maximum value points that meets a preset screening condition is determined as a target local maximum value point; based on the Akaike Information Criterion, the AIC value of each of the target local maximum value points is determined; according to each AIC value, a first target maximum value point is determined from each of the target local maximum value points, and the first target maximum value point is determined. The moment corresponding to the maximum point is determined as the arrival time of the longitudinal wave; the absolute maximum point is determined according to the absolute value of the signal corresponding to each of the original data points, and the absolute value of the signal is the absolute value of the wave signal value corresponding to the original data point; the target calculation interval is determined according to the first target maximum point and the absolute maximum point; the second target maximum point is determined according to the AIC value of each target local maximum point in the target calculation interval, and the moment corresponding to the second target maximum point is determined as the arrival time of the transverse wave, which optimizes the picking process of the longitudinal wave arrival time and the transverse wave arrival time, and improves the picking efficiency and picking accuracy of the longitudinal wave arrival time and the transverse wave arrival time.

[0114] Example 2

[0115] Also, see Figure 7 The present application also provides a microseismic waveform arrival time picking system 700, comprising:

[0116] The waveform acquisition module 710 is used to acquire full waveform data, wherein the full waveform data includes: N original data points, each of which represents a waveform signal value at a different time;

[0117] A first screening module 720 is configured to determine at least one of the original data points that meets a preset maximum condition as a local maximum point;

[0118] The second screening module 730 is configured to determine at least one local maximum point that meets a preset screening condition as a target local maximum point;

[0119] A calculation module 740 is used to determine the AIC value of each target local maximum point based on the Akaike Information Criterion;

[0120] A longitudinal wave arrival time determination module 750 is configured to determine a first target maximum point from each target local maximum point according to each AIC value, and determine the time corresponding to the first target maximum point as the longitudinal wave arrival time;

[0121] A first determining module 760 is configured to determine an absolute maximum point based on the absolute value of the signal corresponding to each of the original data points, wherein the absolute value of the signal is the absolute value of the wave signal value corresponding to the original data point;

[0122] A second determining module 770 is configured to determine a target calculation interval according to the first target maximum point and the absolute maximum point;

[0123] The shear wave arrival time determination module 780 is used to determine the second target maximum point according to the AIC value of each target local maximum point in the target calculation interval, and determine the time corresponding to the second target maximum point as the shear wave arrival time.

[0124] The microseismic waveform arrival time picking system 700 provided in the embodiment of the present invention can execute the microseismic waveform arrival time picking method provided in the above-mentioned method embodiment 1, which will not be described again here to avoid repetition.

[0125] The microseismic waveform arrival time extraction system provided in the embodiment of the present application obtains full waveform data through a waveform acquisition module, and the full waveform data includes: N original data points, each of which represents a wave signal value at a different time; a first screening module determines at least one of the original data points that meets the preset maximum value condition as a local maximum value point; a second screening module determines at least one of the local maximum value points that meets the preset screening condition as a target local maximum value point; a calculation module determines the AIC value of each of the target local maximum value points based on the Akaike Information Criterion; a longitudinal wave arrival time determination module determines the first target maximum value point from each of the target local maximum value points according to each AIC value, and determines the target local maximum value point. The moment corresponding to the first target maximum point is determined as the longitudinal wave arrival time; the first determination module determines the absolute maximum point according to the absolute value of the signal corresponding to each of the original data points, and the absolute value of the signal is the absolute value of the wave signal value corresponding to the original data point; the second determination module determines the target calculation interval according to the first target maximum point and the absolute maximum point; the shear wave arrival time determination module determines the second target maximum point according to the AIC value of each target local maximum point in the target calculation interval, and determines the moment corresponding to the second target maximum point as the shear wave arrival time, which optimizes the picking process of the longitudinal wave arrival time and the shear wave arrival time, and improves the picking efficiency and picking accuracy of the longitudinal wave arrival time and the shear wave arrival time.

[0126] Example 3

[0127] In addition, an embodiment of the present invention provides an electronic device including a memory and a processor, wherein the memory stores a computer program, and when the computer program runs on the processor, the method for picking microseismic waveform arrival time provided in Example 1 is executed.

[0128] For details, see Figure 8The electronic device 800 includes: a transceiver 801, a bus interface and a processor 802, wherein the processor 802 is used to obtain full waveform data, wherein the full waveform data includes: N original data points, each of the original data points represents a wave signal value at a different time; determining at least one of the original data points that meets a preset maximum value condition as a local maximum value point; determining at least one of the local maximum value points that meets a preset screening condition as a target local maximum value point; determining an AIC value of each of the target local maximum value points based on the Akaike Information Criterion; determining a first target maximum value point from each of the target local maximum value points according to each AIC value, and determining the time corresponding to the first target maximum value point as the arrival time of the longitudinal wave; determining an absolute maximum value point according to the absolute value of the signal corresponding to each of the original data points, wherein the absolute value of the signal is the absolute value of the wave signal value corresponding to the original data point; determining a target calculation interval according to the first target maximum value point and the absolute maximum value point; determining a second target maximum value point according to the AIC value of each of the target local maximum value points within the target calculation interval, and determining the time corresponding to the second target maximum point as the arrival time of the transverse wave.

[0129] In the embodiment of the present invention, the electronic device 800 further includes a memory 803. Figure 8 In the embodiment, the bus architecture can include any number of interconnected buses and bridges, specifically linking together various circuits of one or more processors represented by processor 802 and memory represented by memory 803. The bus architecture can also link together various other circuits such as peripheral devices, voltage regulators, and power management circuits, which are all well known in the art and therefore will not be further described herein. The bus interface provides an interface. The transceiver 801 can be multiple components, that is, including a transmitter and a receiver, providing a unit for communicating with various other devices on a transmission medium. The processor 802 is responsible for managing the bus architecture and general processing, and the memory 803 can store data used by the processor 802 when performing operations.

[0130] The electronic device 800 provided in the embodiment of the present invention can execute the microseismic waveform arrival time picking method provided in the above method embodiment 1, which will not be described again here to avoid repetition.

[0131] Example 4

[0132] In addition, an embodiment of the present invention provides a computer-readable storage medium storing a computer program. When the computer program is executed by a processor, the method for picking the arrival time of a microseismic waveform provided in Example 1 is implemented.

[0133] In this embodiment, the computer-readable storage medium may be a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0134] The computer-readable storage medium provided in this embodiment can implement the microseismic waveform arrival time picking method provided in Example 1, and will not be described again here to avoid repetition.

[0135] In all examples shown and described herein, any specific values ​​should be interpreted as merely exemplary and not limiting, and thus other examples of the exemplary embodiments may have different values.

[0136] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, it does not need to be further defined or explained in subsequent drawings.

[0137] The above-described embodiments merely illustrate several implementations of the present invention, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that variations and modifications are possible without departing from the scope of the present invention, and such variations and modifications are fully within the scope of protection of the present invention.

Claims

1. A method for picking up microseismic waveform arrival time, characterized in that: The method comprises: Acquire full waveform data, the full waveform data including: N original data points, each of the original data points representing a wave signal value at a different moment; Determining at least one of the original data points that meets a preset maximum condition as a local maximum point; Determine at least one local maximum point that meets a preset screening condition as a target local maximum point; Determine the AIC value of each target local maximum point based on the Akaike Information Criterion; Determining a first target maximum point from each target local maximum point according to each AIC value, and determining a time corresponding to the first target maximum point as a longitudinal wave arrival time; Determine an absolute maximum point according to the absolute value of the signal corresponding to each of the original data points, wherein the absolute value of the signal is the absolute value of the wave signal value corresponding to the original data point; Determining a target calculation interval according to the first target maximum point and the absolute maximum point; According to the AIC values ​​of the target local maximum points within the target calculation interval, the second target maximum point is determined, and the time corresponding to the second target maximum point is determined as the shear wave arrival time.

2. The microseismic waveform arrival time picking method according to claim 1, characterized in that: The step of determining at least one original data point that meets a preset maximum condition as a local maximum point includes: If the wave signal value of the i-th original data point is greater than the wave signal value of the i-1-th original data point and greater than the wave signal value of the i+1-th original data point, then the i-th original data point is determined as the local maximum point; Alternatively, if the wave signal value of the i-th original data point is less than the wave signal value of the i-1th original data point and less than the wave signal value of the i+1th original data point, then the i-th original data point is determined as the local maximum point, where 1<i<N.

3. The method for picking up microseismic waveform arrival time according to claim 2, characterized in that: The number of the local maximum points is M and M<N, and determining at least one local maximum point that meets a preset screening condition as a target local maximum point includes: If the time interval between the jth local maximum point and the j-1th local maximum point is greater than the minimum waveform period, it is determined that the j-1th local maximum point and the jth local maximum point meet the preset screening condition; The j-1th local maximum point and the jth local maximum point are respectively determined as the target local maximum points, wherein 1<j≤M.

4. The method for picking up microseismic waveform arrival time according to claim 3, characterized in that: Obtaining the minimum waveform period includes: Acquire the maximum frequency of the full waveform data; The minimum waveform period of the full waveform data is determined according to the maximum frequency.

5. The method for picking up microseismic waveform arrival time according to claim 1, characterized in that: Determining the first target maximum point from each target local maximum point according to each AIC value includes: The AIC values ​​are compared, and the target local maximum point with the smallest AIC value is determined as the first target maximum point.

6. The method for picking up microseismic waveform arrival time according to claim 1, characterized in that: Determining the absolute maximum point according to the absolute value of the signal corresponding to each of the original data points includes: The original data point with the largest absolute signal value is determined as the absolute maximum point.

7. The method for picking up microseismic waveform arrival time according to claim 1, characterized in that: Determining the second target maximum point according to the AIC values ​​of the target local maximum points within the target calculation interval includes: Comparing the AIC values ​​of the target local maximum points within the target calculation interval; The target local maximum point with the minimum AIC value within the target calculation interval is determined as the second target maximum point.

8. A microseismic waveform arrival time picking system, characterized in that: The system comprises: A waveform acquisition module is used to acquire full waveform data, wherein the full waveform data includes: N original data points, each of which represents a wave signal value at a different time; A first screening module, configured to determine at least one of the original data points that meets a preset maximum condition as a local maximum point; A second screening module is configured to determine at least one local maximum point that meets a preset screening condition as a target local maximum point; A calculation module, used for determining the AIC value of each target local maximum point based on the Akaike Information Criterion; a longitudinal wave arrival time determination module, configured to determine a first target maximum point from each target local maximum point according to each AIC value, and determine a time corresponding to the first target maximum point as the longitudinal wave arrival time; A first determining module is configured to determine an absolute maximum point based on the absolute value of a signal corresponding to each of the original data points, wherein the absolute value of the signal is the absolute value of the wave signal value corresponding to the original data point; A second determining module, configured to determine a target calculation interval according to the first target maximum point and the absolute maximum point; The shear wave arrival time determination module is used to determine the second target maximum point according to the AIC value of each target local maximum point in the target calculation interval, and determine the time corresponding to the second target maximum point as the shear wave arrival time.

9. An electronic device, characterized in that: The method comprises a memory and a processor, wherein the memory stores a computer program, and when the computer program is run on the processor, the method for picking the arrival time of microseismic waveforms according to any one of claims 1 to 7 is executed.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method for picking the arrival time of microseismic waveforms according to any one of claims 1 to 7 is implemented.

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