Automatic testing device and method for simultaneously testing multiple groups of high-voltage output modules

Abstract

The invention provides an automatic testing device and method for simultaneously testing multiple groups of high-voltage output modules. The device comprises a main control module, a first detection module, multiple groups of interface modules, a matrix module and a second detection module, a plurality of test connecting ends are arranged on each group of interface modules; each group of matrix modules comprises at least 16 groups of change-over switches, any two groups of change-over switches serve as a test group, and each group of matrix modules is also connected with the main control module and the first detection module respectively; the second detection module and the first detection module are both connected with the main control module; and the main control module is used for controlling the operation of the change-over switch in each group of matrix modules through PWM signals. According to the device, the function of testing multiple high-voltage output modules at the same time is achieved by expanding test interfaces through multiple groups of interface modules, and the debugging efficiency is greatly improved; the feedback signal of the high-voltage output module is measured through the matrix module integrating multiple groups of change-over switches, so that the tedious procedure of manually replacing a test point position can be greatly reduced, and the test efficiency is improved.

Description

Technical Field

[0001] The present application belongs to the technical field of electrical system testing, and in particular relates to an automatic testing device and method for simultaneously testing multiple groups of high-voltage output modules. Background Art

[0002] When performing functional testing on a single high-voltage output module, it is generally necessary to gradually test each signal and record the measured values before officially increasing the voltage, requiring frequent use of a multimeter and oscilloscope. Only after ensuring that each test step has passed can the high-voltage output module's high-voltage output and discharge functions be tested. During the voltage increase, an oscilloscope is used to monitor the module's peak current. Existing methods for testing high-voltage output modules not only require testers to frequently change test points, but also require the host computer to communicate with the high-voltage output module via a serial port. Therefore, each host computer can only connect to one device for testing, significantly reducing testing efficiency. Furthermore, due to the large number of signal lines in the high-voltage output module, manual testing cannot measure the static impedance between each signal line before officially powering on. This makes it impossible to detect signal line shorts, breaks, or abnormal static resistance values in advance, resulting in unnecessary component burnout after powering on the high-voltage output module, causing financial losses. Therefore, there is an urgent need for a test fixture that can simultaneously test multiple groups of high-voltage output modules to improve testing efficiency and reduce financial losses.

[0003] Currently, test fixtures for testing high-voltage output modules on the market generally use external standard multimeters and oscilloscopes to read data, and judge the test qualification by reading back the data of standard instruments. The multimeter and oscilloscope are not integrated into the test fixture. This leads to the problem of data interaction between the test fixture, the multimeter and the oscilloscope, resulting in a large workload for software development. Summary of the Invention

[0004] An embodiment of the present application provides an automatic testing device and method for simultaneously testing multiple groups of high-voltage output modules to solve the problem that a host computer cannot simultaneously test multiple groups of high-voltage output modules during the existing high-voltage output module testing process.

[0005] In a first aspect, an embodiment of the present application provides an automatic testing device for simultaneously testing multiple groups of high-voltage output modules, comprising: a main control module, a first detection module, multiple groups of interface modules, a matrix module connected to each group of the interface modules, and a second detection module connected to the matrix module;

[0006] Each group of the interface modules is provided with a plurality of test connection terminals connected to the signal connection terminals of the high-voltage output modules to be tested;

[0007] Each group of the matrix modules includes at least 16 groups of switching switches, and any two groups of the switching switches serve as a test group. Each group of the matrix modules is further connected to the main control module and the first detection module, respectively, so that the signal connection end of the high-voltage output module to be tested is connected to the first detection module; the second detection module and the first detection module are both connected to the main control module;

[0008] The main control module is configured to output a PWM signal for controlling the switching switches of each group in the matrix module to be closed or opened; when the PWM signal controls the switching switches of any one of the test groups in the matrix module to be closed, the first detection module and the second detection module are configured to obtain test data of the test connection terminal corresponding to the test group;

[0009] Among them, the main control module is used to control the operation of the switching switch in each group of the matrix modules through the PWM signal to realize simultaneous testing of multiple groups of high-voltage output modules; the main control module is used to determine whether the functional performance of the corresponding test connection end is normal based on the test data.

[0010] Optionally, each group of the switching switches includes a positive channel and a negative channel, and the positive channel and the negative channel both include a normally closed contact and a normally open contact. The normally open contacts of all the positive channels of each group of the matrix modules are connected to the positive connection end of the first detection module, and the normally open contacts of all the negative channels of each group of the matrix modules are connected to the negative connection end of the first detection module; one group of the switching switches in each test group is connected to a DC power supply through a DC / DC module to power the high-voltage output module to be tested; and another group of the switching switches in each test group is connected to the main control module through an optocoupler device.

[0011] Optionally, the first detection module includes a gear selection circuit and a voltage source circuit, a four-speed constant current source circuit, a voltage divider circuit and an AD sampling circuit connected to the gear selection circuit;

[0012] The voltage source circuit and the four-speed constant current source circuit are used for measuring resistance values;

[0013] The voltage divider circuit is used for measuring analog voltage;

[0014] The gear selection circuit is used for gear switching to switch between voltage value testing and resistance value testing;

[0015] The AD acquisition circuit is used to collect test data and transmit the collected test data to the main control module.

[0016] Optionally, the voltage source circuit includes a second operational amplifier, a third operational amplifier, a third resistor, a fourth resistor and a fifth resistor, the non-inverting input terminal of the second operational amplifier is used to connect to the power input terminal, the third resistor has the same resistance as the fifth resistor and together with the second operational amplifier constitutes a voltage conversion loop, so that the output terminal of the second operational amplifier outputs a reference voltage to the third operational amplifier, and the output terminal of the third operational amplifier is connected to the gear selection circuit through the fourth resistor.

[0017] Optionally, the four-speed constant current source circuit includes a sixth operational amplifier, a seventh operational amplifier and multiple groups of switch modules connected in parallel with the seventh operational amplifier, one end of each group of switch modules is connected to the output end of the sixth operational amplifier and the same-direction input end of the seventh operational amplifier through a thirteenth resistor, the other end of each group of switch modules is connected to the output end of the seventh operational amplifier, and the output end of the seventh operational amplifier is connected to the gear selection circuit through a sixteenth resistor; each group of switch modules includes a switch resistor and a mechanical switch connected in series with the switch resistor; the output end and the reverse input end of the sixth operational amplifier are grounded through an eighteenth resistor, so that the current flowing through the eighteenth resistor is a constant value, and the current flowing through the thirteenth resistor is also a constant value.

[0018] Optionally, the multiple groups of switch modules include a first switch module, a second switch module, a third switch module and a fourth switch module, the first switch module is used to constantly output a first current, the second switch module is used to constantly output a second current, the third switch module is used to constantly output a third current, and the fourth switch module is used to constantly output a fourth current.

[0019] Optionally, the gear selection circuit includes a first switch, a ninth switch, a tenth switch, and a fifth zener diode, wherein the first switch is connected to the voltage source circuit, the first switch is also connected to the ninth switch and the tenth switch, respectively, the ninth switch is also connected to the AD sampling circuit and the voltage divider circuit, respectively, and the tenth switch is also grounded via the fifth zener diode;

[0020] The ninth switch is used to switch between voltage measurement and resistance measurement;

[0021] The first switch is used to switch the constant current source position or the voltage source position in resistance measurement.

[0022] Optionally, the AD acquisition circuit includes a fourth operational amplifier and a fifth operational amplifier connected to the fourth operational amplifier, a fourteenth resistor, a fifteenth resistor and a fourth capacitor are arranged between the fourth operational amplifier and the fifth operational amplifier, the same-direction input terminal of the fourth operational amplifier is connected to the gear selection circuit through a first inductor, and the first inductor is also grounded through a fifth capacitor; the measured signal at the test connection terminal is filtered by the first inductor and the fifth capacitor and then connected to the voltage follower of the fourth operational amplifier, and then enters the reverse input terminal of the fifth operational amplifier after RC filtering of the fourteenth resistor, the fifteenth resistor and the fourth capacitor, and the output terminal of the fifth operational amplifier outputs the test data.

[0023] In a second aspect, an embodiment of the present application provides an automatic testing method for simultaneously testing multiple groups of high-voltage output modules, which is applied to the automatic testing device for simultaneously testing multiple groups of high-voltage output modules described above. The automatic testing method includes the following steps:

[0024] Connecting the signal connection end of each group of high-voltage output modules to be tested to each group of interface modules of the automatic testing device for simultaneously testing the multiple groups of high-voltage output modules; and obtaining the channel measured resistance value of each signal connection end and the PWM signal of each group of high-voltage output modules to be tested;

[0025] Determining, according to the measured resistance value of the channel, a test gear at which the first detection module performs a functional performance test on the corresponding signal connection terminal;

[0026] According to the PWM signal and the test gear, the test group corresponding to the signal connection end is automatically controlled to be closed, and the static resistance and power-on tests are performed on the high-voltage output module to be tested in sequence, and the test data of the test connection end corresponding to the test group is obtained through the first detection module and the second detection module.

[0027] Optionally, the automatic testing method for simultaneously testing multiple groups of high-voltage output modules includes: when the feedback signal of the test data is a high-level signal, the functional performance of the corresponding test connection end is normal.

[0028] An embodiment of the present application provides an automatic testing device and method for simultaneously testing multiple groups of high-voltage output modules. The automatic testing device for simultaneously testing multiple groups of high-voltage output modules includes a main control module, a first detection module, multiple groups of interface modules, a matrix module connected to each group of interface modules, and a second detection module connected to the matrix module; each group of interface modules is provided with a plurality of test connection terminals connected to the signal connection terminals of the high-voltage output modules to be tested; each group of matrix modules includes at least 16 groups of switching switches, and any two groups of switching switches serve as a test group. Each group of matrix modules is also connected to the main control module and the first detection module respectively, so that the high-voltage output modules to be tested are connected to the signal connection terminals of the high-voltage output modules to be tested. The signal connection end is connected to the first detection module; the second detection module and the first detection module are both connected to the main control module; the main control module is used to output a PWM signal to control the closing or opening of each group of switching switches in the matrix module; when the PWM signal controls the closing of the switching switches of any group of test groups in the matrix module, the test data of the test connection end corresponding to the test group is obtained through the first detection module and the second detection module; wherein, the main control module is used to control the operation of the switching switches in each group of matrix modules through the PWM signal to realize simultaneous testing of multiple groups of high-voltage output modules; the main control module is used to determine whether the functional performance of the corresponding test connection end is normal based on the test data. The automatic test device for simultaneously testing multiple groups of high-voltage output modules realizes the function of simultaneously testing multiple high-voltage output modules by expanding the test interface through multiple groups of interface modules, thereby greatly improving the debugging efficiency; by testing the static resistance of the signal line at the test connection end before power is applied by the first detection module, short circuit, open circuit or abnormal resistance faults between the signal lines can be discovered early, thereby avoiding the burning of components after power-on due to such faults, thereby causing unnecessary economic losses; by measuring the feedback signal of the high-voltage output module through a matrix module integrating multiple groups of switching switches, the tedious procedure of manually changing the test points can be greatly reduced, the test efficiency is improved, and the problem that a host computer cannot simultaneously test multiple groups of high-voltage output modules during the existing high-voltage output module testing process is solved.

[0029] The automatic testing method for simultaneously testing multiple groups of high-voltage output modules realizes the automated testing of multiple groups of high-voltage output modules to be tested, can realize the synchronous testing of multiple groups of high-voltage output modules to be tested, and solves the tedious procedure of frequently changing test points during manual testing. It further solves the static resistance measurement of the high-voltage output modules to be tested before power-on, and reduces the failure rate of the power-on test of the high-voltage output modules to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] To more clearly illustrate the technical solution in one embodiment of the present application, the following briefly introduces the drawings required for describing the embodiment. Obviously, the drawings described below are only some embodiments of the present application. Those skilled in the art can also derive other drawings based on these drawings without inventive effort.

[0031] In order to more completely understand the present application and its beneficial effects, the following description will be given in conjunction with the accompanying drawings. In the following description, the same reference numerals represent the same parts.

[0032] Figure 1 A schematic diagram of the framework of an automatic testing device for simultaneously testing multiple groups of high-voltage output modules provided in one embodiment of the present application.

[0033] Figure 2 A circuit diagram of a matrix module in an automatic testing device for simultaneously testing multiple groups of high-voltage output modules provided by one embodiment of the present application.

[0034] Figure 3 A circuit schematic diagram of a first detection module in an automatic testing device for simultaneously testing multiple groups of high-voltage output modules provided in one embodiment of the present application.

[0035] Figure 4 A circuit schematic diagram of a main control module in an automatic testing device for simultaneously testing multiple groups of high-voltage output modules provided in one embodiment of the present application.

[0036] Figure 5 A circuit schematic diagram of a second detection module in an automatic testing device for simultaneously testing multiple groups of high-voltage output modules provided in one embodiment of the present application. DETAILED DESCRIPTION

[0037] The following will be combined with the drawings in one embodiment of the present application to clearly and completely describe the technical solution in one embodiment of the present application. Obviously, the described embodiment is only a part of the embodiments of the present application, not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without making any creative efforts shall fall within the scope of protection of this application.

[0038] Patent terms:

[0039] DC / DC module power supply is a switching type modular voltage-regulated power supply. With its remarkable features of small size, excellent performance and easy use, it is increasingly widely used in communications, networks, industrial control, railways, military and other fields.

[0040] An embodiment of the present application provides an automatic testing device and method for simultaneously testing multiple groups of high-voltage output modules to solve the problem that a host computer cannot simultaneously test multiple groups of high-voltage output modules during the existing high-voltage output module testing process.

[0041] Example 1:

[0042] An embodiment of the present application provides an automatic testing device for simultaneously testing multiple groups of high-voltage output modules. For example, see Figure 1 , Figure 1 A schematic diagram of the framework of an automatic testing device for simultaneously testing multiple groups of high-voltage output modules provided in one embodiment of the present application.

[0043] like Figure 1 As shown, the invention of this application provides an automatic testing device for simultaneously testing multiple groups of high-voltage output modules, including a main control module 10, a first detection module 20, multiple groups of interface modules 30, a matrix module 40 connected to each group of interface modules 30, and a second detection module 50 connected to the matrix module 40.

[0044] It is further explained that the automatic test device for testing multiple groups of high-voltage output modules simultaneously is illustrated using five groups of interface modules (respectively, the first interface module, the second interface module, the third interface module, the fourth interface module and the fifth interface module) as a case study, and the corresponding matrix module 40 includes five groups (respectively recorded as the first matrix module, the second matrix module, the third matrix module, the fourth matrix module and the fifth matrix module). The multiple high-voltage output modules are connected to the first interface module, the second interface module, the third interface module, the fourth interface module and the fifth interface module respectively. In sequence, the first interface module is connected to the first matrix module via a cable, the second interface module is connected to the second matrix module via a cable, the third interface module is connected to the third matrix module via a cable, the fourth interface module is connected to the fourth matrix module via a cable, and the fifth interface module is connected to the fifth matrix module via a cable. In the five groups of matrix modules, the first wiring harness of each group of matrix modules 40 is connected to the interface of the high-voltage output module to be tested, the second wiring harness of the matrix module 40 is connected to the first detection module 20, and the third wiring harness of the matrix module 40 is connected to the main control module 10. The first wiring harness of the first detection module 20 is connected to the matrix module 40, and the second wiring harness of the first detection module 20 is connected to the main control module 10. The first wiring harness of the main control module 10 is connected to the matrix module 40, the second wiring harness of the main control module 10 is connected to the first detection module 20, and the third wiring harness of the main control module 10 is connected to the second detection module 50. The second detection module is connected to the signal line under test of the matrix module 40.

[0045] In the embodiment of the invention of the application, each group of interface modules 30 is provided with a plurality of test connection terminals connected to the signal connection terminals of the high-voltage output module to be tested.

[0046] In the embodiment of the invention of the application, each group of matrix modules 40 includes at least 16 groups of switching switches CH, and any two groups of switching switches CH serve as a test group. Each group of matrix modules 40 is also connected to the main control module 10 and the first detection module 20 respectively, so that the signal connection end of the high-voltage output module to be tested is connected to the first detection module 20; the second detection module 50 and the first detection module 20 are both connected to the main control module 10.

[0047] It should be further explained that the matrix module 40 is composed of a switch matrix, the structure of which is mainly composed of relays and connecting cables. The switching switches CH of the switch matrix are grouped in pairs. The normally open contacts of the relays on the left side of the switch matrix are connected to the signal lines of the module under test. For the common terminal COM point on the right side of the switch matrix, the odd-numbered switches are short-circuited together to form the positive common terminal COM+, and the even-numbered switches on the right side are short-circuited together to form the negative common terminal COM-. The positive common terminal COM+ and the negative common terminal COM- are connected to the first detection module 20. By selecting any two groups of switching switches CH, the external measured signal can be introduced into the first detection module 20 to measure the static resistance value.

[0048] In the embodiment of the invention under application, the first detection module 20 is used to detect the static resistance, current, and voltage of the signal under test at the signal connection terminal of the high-voltage output module under test. The second detection module 50 is used to detect the supply peak current and rise time of the signal under test at the signal connection terminal of the high-voltage output module under test.

[0049] It is further explained that the second detection module 50 can be selected as a Hall sensor.

[0050] In the embodiment of the invention of the application, the main control module 10 is used to output a PWM signal to control the closing or opening of each group of switching switches in the matrix module 40; when the PWM signal controls the closing of the switching switches of any group of test groups in the matrix module 40, the test data of the test connection terminal corresponding to the test group is obtained through the first detection module 20 and the second detection module 50; wherein, the main control module 10 is used to control the operation of the switching switches in each group of matrix modules 40 through the PWM signal to realize simultaneous testing of multiple groups of high-voltage output modules; the main control module 10 is used to determine whether the functional performance of the corresponding test connection terminal is normal based on the test data.

[0051] To further explain, the first detection module 20 sends the collected voltage and current data to the main control module 10 and then transmits it to the host computer for comparison with a predetermined static resistance range. The predetermined static resistance value must be set according to actual test requirements. Once the data passes the test, the next test step is performed. After all static resistance values pass the test, the power-on test of the high-voltage output module begins. During the power-on test of the high-voltage output module, the 28V normally closed contact of the matrix module 40 is connected to the first detection module 20, and the 28V power supply within the first detection module 20 supplies power to the high-voltage output module. Because the peak value and duration of the boost current of the high-voltage output module need to be tested, the automatic test device for simultaneously testing multiple groups of high-voltage output modules uses a second detection module 50 instead of an oscilloscope to sample the boost peak value. The second detection module 50 monitors the peak current and boost time of the 28V power supply in real time. The feedback signal line of the switch CH is connected to the first detection module 20 via the positive and negative common terminals, and the first detection module 20 monitors the feedback voltage value. The normally closed contacts of the other signal lines of the switch CH are connected to the main control module 10, and the working state of the high-voltage output module is controlled by the main control module 10. After all the test processes are completed, the host computer records the data of each test step according to the current test process situation and records it, and finally outputs a report for later review and analysis.

[0052] This automatic testing device for simultaneously testing multiple high-voltage output modules uses a first detection module to measure the static resistance of the signal lines at the test terminals before power is applied. This allows for early detection of short circuits, open circuits, or abnormal resistance between signal lines, preventing component burnout after power-up and unnecessary economic losses caused by such failures. By integrating a matrix module 40 with multiple sets of switches to measure the feedback signals from the high-voltage output modules, the tedious process of manually changing test points is significantly reduced. The integration of the first detection module 20 and the second detection module 50 replaces external multimeters and oscilloscopes, enabling automated data testing and reading, improving testing efficiency.

[0053] The automatic test device for simultaneously testing multiple groups of high-voltage output modules can realize the function of simultaneously testing multiple high-voltage output modules by expanding the test interface and internal modules through multiple groups of interface modules 30, thereby greatly improving the debugging efficiency.

[0054] An embodiment of the present application provides an automatic testing device for simultaneously testing multiple groups of high-voltage output modules, including a main control module, a first detection module, multiple groups of interface modules, a matrix module connected to each group of interface modules, and a second detection module connected to the matrix module; each group of interface modules is provided with a plurality of test connection terminals connected to the signal connection terminals of the high-voltage output modules to be tested; each group of matrix modules includes at least 16 groups of switches, with any two groups of switches constituting a test group; each group of matrix modules is further connected to the main control module and the first detection module, respectively, so that the signal connection terminals of the high-voltage output modules to be tested are connected to the first detection module; the second detection module and the first detection module are both connected to the main control module; the main control module is configured to output a PWM signal for controlling the closing or opening of each group of switches in the matrix module; when the PWM signal controls the closing of the switch of any test group in the matrix module, test data corresponding to the test connection terminals connected to the test group is obtained through the first detection module and the second detection module; wherein the main control module is configured to control the operation of the switches in each group of matrix modules through the PWM signal to achieve simultaneous testing of multiple groups of high-voltage output modules; and the main control module is configured to determine whether the functional performance of the corresponding test connection terminals is normal based on the test data. The automatic test device for simultaneously testing multiple groups of high-voltage output modules realizes the function of simultaneously testing multiple high-voltage output modules by expanding the test interface through multiple groups of interface modules, thereby greatly improving the debugging efficiency; by testing the static resistance of the signal line at the test connection end before power is applied by the first detection module, short circuit, open circuit or abnormal resistance faults between the signal lines can be discovered early, thereby avoiding the burning of components after power-on due to such faults, thereby causing unnecessary economic losses; by measuring the feedback signal of the high-voltage output module through a matrix module integrating multiple groups of switching switches, the tedious procedure of manually changing the test points can be greatly reduced, the test efficiency is improved, and the problem that a host computer cannot simultaneously test multiple groups of high-voltage output modules during the existing high-voltage output module testing process is solved.

[0055] Figure 2 A circuit diagram of a matrix module in an automatic testing device for simultaneously testing multiple groups of high-voltage output modules provided by one embodiment of the present application.

[0056] like Figure 2As shown, in the embodiment of the invention of the application, each group of switching switches CH includes a positive channel and a negative channel, and the positive channel and the negative channel both include a normally closed contact NC and a normally open contact NO. The normally open contact NO of all positive channels of each group of matrix modules 40 is connected to the positive connection terminal COM+ of the first detection module 20, and the normally open contact NC of all negative channels of each group of matrix modules 40 is connected to the negative connection terminal COM- of the first detection module 20; one group of switching switches CH of each test group is connected to the DC power supply through the DC / DC module U1 to power the high-voltage output module to be tested; another group of switching switches CH of each test group is connected to the main control module 10 through the optocoupler device N1.

[0057] It is further explained that the DC / DC module U1 and the DC power supply can be replaced by a DC / DC module power supply. Figure 2 As shown, in this automated testing method for simultaneously testing multiple high-voltage output modules, each matrix module 40 has 16 sets of switches. To perform a static resistance measurement before power-on, the matrix module 40 randomly selects two sets of switches CH to close. After the switches CH are closed, the common terminals COM+ and COM- connected to the first detection module 20 are connected for resistance measurement. The static resistance measurement of all channels must fall within a predetermined error range to pass the test. Only after the static test passes can the power-on test proceed. During the power-on test, the positive channel CH2+ and negative channel CH2- of the switching switch are grouped together. The internal DC-DC module U1 of the matrix module 40 connects the 28V output to the normally closed contacts NC between the positive and negative channels CH2+ and CH2- of the switching switch, providing DC power to the high-voltage output module under test. The positive channel CH1+ and negative channel CH1- of the switching switch are grouped together. The main control module 10 isolates the PWM signal through the optocoupler device N1 and connects it to the normally closed contacts between the positive and negative channels CH1+ and CH1-, outputting a PWM signal to control the establishment of the test circuit for the high-voltage output module under test. The feedback and control signals of the matrix module 40 are connected to the switching channels CH3 to CH16 in the same manner as the switching switch CH1, as needed. The main control module 10 collects the data and status of the feedback signal through the first detection module 20 and the second detection module 50 to determine whether the high-voltage output module under test is functioning properly. Among them, the feedback signal includes a charging safety signal and a charging completion signal. When the charging safety signal and the charging completion signal are both at a high level of 3.3V, it means that the function of the high-voltage output module to be tested is normal, and the corresponding test data is recorded.

[0058] Figure 3 A circuit schematic diagram of a first detection module in an automatic testing device for simultaneously testing multiple groups of high-voltage output modules provided in one embodiment of the present application.

[0059] like Figure 3As shown, in the embodiment of the invention of the application, the first detection module 20 includes a gear selection circuit 21 and a voltage source circuit 22, a four-speed constant current source circuit 23, a voltage divider circuit 24 and an AD sampling circuit 25 connected to the gear selection circuit 21;

[0060] The voltage source circuit 22 and the four-speed constant current source circuit 23 are used to measure the resistance value;

[0061] A voltage divider circuit 24 is used for measuring analog voltage;

[0062] The gear selection circuit 21 is used for gear switching to switch between voltage value testing and resistance value testing;

[0063] The AD acquisition circuit 25 is used to collect test data and transmit the collected test data to the main control module.

[0064] It is further explained that if Figure 3 As shown, the first detection module 20 is used to read the resistance value during static resistance measurement and to measure the analog voltage value of the high-voltage output module during power-on testing. The first detection module 20 is composed of a voltage source circuit 22, a four-speed constant current source circuit 23, a gear selection circuit 21, a voltage divider circuit 24, and an AD acquisition circuit 25. The voltage source circuit 22 and the four-speed constant current source circuit 23 are used to measure the resistance value, the voltage divider circuit 24 is used to measure the analog voltage, the gear selection circuit 23 is used to switch between voltage and resistance testing, and the AD acquisition circuit 25 is used to collect test data and send the collected test data to the main control module 10.

[0065] In the embodiment of the invention applied for, when the first detection module 20 performs resistance measurement, in order to improve the accuracy of the test, the resistance value of the channel of the signal connection end of the high-voltage output module to be tested is divided into different grades. When the measured resistance value is large, the voltage source circuit 22 is used for measurement, that is, the voltage value at both ends of the signal connection end of the high-voltage output module to be tested is read by the reference voltage division method to calculate the size of the measured resistance value; wherein the calculation formula of the measured resistance under this working condition can be based on Figure 3 As shown, after the voltage source circuit 22 outputs the 5V reference voltage, the fourth resistor R4 forms a series circuit with the signal connection terminal to share the 5V voltage. The fourth resistor R4 has a fixed resistance of 1MΩ. By sampling the voltage value on the signal connection terminal to be measured, the resistance value of the measured resistor can be inferred according to Ohm's law and the voltage divider formula. When the measured resistance value is moderate or small, a constant current source is used for testing. That is, the resistance value of the channel measured resistance is calculated by obtaining the voltage generated after the constant current source flows through the signal connection terminal to be measured. The calculation formula of the measured resistance under this working condition can be based on Figure 3As shown, by selecting a certain constant current source gear (SW1~SW4), the constant current source circuit 23 can output currents of 4uA, 40uA, 400uA, and 4000uA. Assuming that the 4uA gear is selected, when the 4uA current flows through the measured signal connection terminal, the voltage drop generated on the measured signal connection terminal = 4uA×R. The value of the measured resistance can be reversely calculated by sampling the voltage on the resistor.

[0066] like Figure 3 As shown, in the embodiment of the invention of the application, the voltage source circuit 22 includes a second operational amplifier U2, a third operational amplifier U3, a third resistor R3, a fourth resistor R4 and a fifth resistor R5. The non-inverting input terminal of the second operational amplifier U2 is used to connect to the power input terminal VREF. The resistance values of the third resistor R3 and the fifth resistor R5 are equal and they form a voltage conversion circuit together with the second operational amplifier R2, so that the output terminal of the second operational amplifier U2 outputs a reference voltage to the third operational amplifier U3, and the output terminal of the third operational amplifier U3 is connected to the gear selection circuit 21 through the fourth resistor R4.

[0067] It is further explained that if Figure 3 As shown, a 2.5V reference voltage is applied to the non-inverting input terminal 3 of the second operational amplifier U2. The third resistor R3 and the fifth resistor R5 have equal resistance values. Together with the second operational amplifier U2, the third resistor R3 and the fifth resistor R5 form a reference voltage converter, resulting in a 5V reference voltage output at pin 6 of the second operational amplifier U2. The third operational amplifier U3 can be a voltage follower, and the fourth resistor R4 serves as an output matching resistor. The power supply input terminal VREF is connected to the 2.5V first reference voltage.

[0068] In the embodiment of the invention applied for, the four-speed constant current source circuit 23 includes a sixth operational amplifier U6, a seventh operational amplifier U7 and a plurality of switch modules connected in parallel with the seventh operational amplifier U7. One end of each switch module is connected to the output end of the sixth operational amplifier U6 and the same-direction input end of the seventh operational amplifier U7 through the thirteenth resistor R13, and the other end of each switch module is connected to the output end of the seventh operational amplifier U7. The output end of the seventh operational amplifier U7 is connected to the gear selection circuit 21 through the sixteenth resistor R16; each switch module includes a switch resistor and a mechanical switch connected in series with the switch resistor; the output end and the reverse input end of the sixth operational amplifier U6 are grounded through the eighteenth resistor R18, so that the current flowing through the eighteenth resistor R18 is a constant value, and the current flowing through the thirteenth resistor R13 is also a constant value. The multiple switch modules include a first switch module, a second switch module, a third switch module and a fourth switch module. The first switch module is used to constantly output a first current, the second switch module is used to constantly output a second current, the third switch module is used to constantly output a third current, and the fourth switch module is used to constantly output a fourth current.

[0069] It is further explained that the first switch module includes a first switch resistor R7 and a first mechanical switch SW1 connected in series with the first switch resistor. The second switch module includes a second switch resistor R8 and a first mechanical switch SW2 connected in series with the second switch resistor R8. The third switch module includes a third switch resistor R9 and a third mechanical switch SW3 connected in series with the third switch resistor R9. The fourth switch module includes a fourth switch resistor R10 and a fourth mechanical switch SW4 connected in series with the fourth switch resistor R10. The first current can be selected as 4000uA, the second current can be selected as 400uA, the third current can be selected as 40uA, and the fourth current can be selected as 4uA. The sixth operational amplifier U6 and the eighteenth resistor R18 form a constant current source circuit. The current flowing through the eighteenth resistor R18 is a constant value, so the current flowing through the thirteenth resistor R13 is also a constant value. In this embodiment, the reference voltage of the sixth operational amplifier U6 is 2.5V, the value of the eighteenth resistor R18 is 50KΩ / 0.1%, and the value of the thirteenth resistor R13 is 80KΩ / 0.1%. Therefore, the current flowing through the eighteenth resistor R18 is 0.05mA. In addition, the voltage difference across the thirteenth resistor R13 is constant at 4V. Since the seventh operational amplifier U7 is a voltage follower operational amplifier, the voltage difference between the anode of the diode D1 and the output terminal of pin 6 of the seventh operational amplifier U7 is constant at 4V. The switch resistors R7-R10 in the four-speed constant current source circuit 23 are selected to be 1KΩ / 0.1%, 10KΩ / 0.1%, 100KΩ / 0.1%, and 1000kΩ / 0.1%, respectively. Therefore, when the first mechanical switch SW1 is closed, the seventh operational amplifier U7 constantly outputs 4000uA current; when the second mechanical switch SW2 is closed, the seventh operational amplifier U7 constantly outputs 400uA current; when the third mechanical switch SW3 is closed, the seventh operational amplifier U7 constantly outputs 40uA current; when the fourth mechanical switch SW4 is closed, the seventh operational amplifier U7 constantly outputs 4uA current. By switching the mechanical switches SW1~SW4, four-speed constant current source output can be achieved. For example: when the channel measured resistance of the signal connection end under test is between 800kΩ and 30MΩ, the first detection module 20 controls the voltage source circuit 22 to test the resistance data; when the channel measured resistance of the signal connection end under test is between 80kΩ and 800kΩ, the first detection module 20 controls the 4uA constant current source to test the resistance data; when the channel measured resistance of the signal connection end under test is between 8kΩ and 80kΩ, the first detection module 20 controls the 40uA constant current source to test the resistance data; when the channel measured resistance of the signal connection end under test is between 800Ω and 8kΩ, the first detection module 20 controls the 400uA constant current source to test the resistance data; when the channel measured resistance of the signal connection end under test is between 0Ω and 800Ω, the first detection module 20 controls the 4000uA constant current source to test the resistance data.The signal connection terminal to be tested is connected to the RL+ and AGND ends of the gear selection circuit 21. When the actual test is carried out, it starts from the maximum constant current source 4000uA gear and cycles in sequence. When the 4000uA gear test resistance data exceeds the range, the gear selection circuit 21 automatically switches to the next gear 400uA to continue testing. If the test value is still out of range, it will automatically switch to the next gear until it switches to the voltage source circuit 22 gear test. If the voltage source circuit 22 gear test is still out of range, the first detection module 20 defaults the test value to the open circuit state, and the reported data record is the maximum value of 30MΩ.

[0070] In the embodiment of the present application, when the first detection module 20 performs resistance measurement, in order to improve the accuracy of the test, the channel resistance is divided into different levels according to the size of the channel resistance at the signal connection end being measured. When the channel resistance is large, the voltage source circuit 22 is used for measurement, that is, the voltage value at both ends of the signal connection end being measured is read by the reference voltage division method to obtain the size of the channel resistance. The calculation formula of the resistance under this working condition can be based on Figure 3 As shown, after the voltage source circuit 22 outputs the 5V reference voltage, the fourth resistor R4 and the measured channel resistance form a series loop to share the 5V voltage together, wherein the fourth resistor R4 has a fixed resistance of 1MΩ. By sampling the voltage value on the measured signal connection terminal, the resistance value at both ends of the measured signal connection terminal can be reversely calculated according to Ohm's law and the voltage divider formula. When the measured resistance value of the channel is moderate or small, a constant current source is used for testing, that is, the resistance value of the measured resistor is calculated by obtaining the voltage generated after the constant current source flows through the measured resistor. The calculation formula for the measured resistor under this working condition can be based on Figure 3 As shown, by selecting a certain constant current source gear (SW1~SW4), the constant current source circuit 22 can output currents of 4uA, 40uA, 400uA, and 4000uA. Assuming that the 4uA gear is selected, when the 4uA current flows through the measured signal connection terminal, the voltage drop generated on the measured signal connection terminal = 4uA×R. The value of the measured resistance can be reversely calculated by sampling the voltage on the resistor.

[0071] like Figure 3 As shown, in the embodiment of the invention of the application, the gear selection circuit 21 includes a first switch K1, a ninth switch K9, a tenth switch K10 and a fifth Zener diode D5. The first switch K1 is connected to the voltage source circuit 22, and the first switch K1 is also connected to the ninth switch K9 and the tenth switch K10 respectively. The ninth switch K9 is also connected to the AD sampling circuit 25 and the voltage divider circuit 24 respectively. The tenth switch K10 is also grounded through the fifth Zener diode D5; the ninth switch K9 is used to switch between voltage measurement and resistance measurement; the first switch K1 is used to switch between the constant current source gear and the voltage source gear in resistance measurement.

[0072] It should be further noted that the first switch K1 and the tenth switch K10 operate synchronously. For example, when the constant current source position is selected for resistance measurement, the contact of the tenth switch K10 is connected to the fifth voltage regulator diode D5, ensuring that the voltage at the RL+ terminal is clamped within the maximum sampling voltage range during over-range testing of the constant current source position.

[0073] like Figure 3 As shown, in the embodiment of the invention of the application, the voltage divider circuit 24 includes a 30th resistor R30, a 31st resistor R31 and a sixth voltage stabilizing diode D6 for voltage division.

[0074] It should be further noted that the maximum voltage measurement range of the first detection module 20 is DC36V. When voltage measurement is required, the positive terminal of the voltage to be measured is connected to the first connection terminal VO.AD, and the negative terminal of the voltage to be measured is connected to the second connection terminal AGND. The actual value of the voltage to be measured is calculated by collecting the voltage divider signal. The sixth voltage stabilizing diode D6 ensures that the voltage divider signal does not exceed the maximum sampling voltage range when the voltage measurement exceeds the range.

[0075] like Figure 3 As shown, in the embodiment of the invention of the application, the AD acquisition circuit 25 includes a fourth operational amplifier U4 and a fifth operational amplifier U5 connected to the fourth operational amplifier U4, and a fourteenth resistor R14, a fifteenth resistor R15 and a fourth capacitor C4 are arranged between the fourth operational amplifier U4 and the fifth operational amplifier U5. The same-direction input terminal of the fourth operational amplifier U4 is connected to the gear selection circuit 21 through the first inductor L1, and the first inductor L1 is also grounded through the fifth capacitor C5; the measured signal at the test connection terminal is filtered by the first inductor L1 and the fifth capacitor C5 and then connected to the voltage follower fourth operational amplifier U4, and then enters the reverse input terminal of the fifth operational amplifier U5 after RC filtering by the fourteenth resistor R14, the fifteenth resistor R15 and the fourth capacitor C4, and the output terminal of the fifth operational amplifier U5 outputs the test data.

[0076] Further, the fifth operational amplifier U5, the seventeenth resistor R17, the eleventh resistor R11, and the twelfth resistor R12 form a subtractor. The connection terminal REF_N is a reference voltage of -2.5V, and the eleventh resistor R11 and the twelfth resistor R12 have equal values. When the maximum sampled voltage at the inverting input terminal of the fifth operational amplifier U5 is 5V, the maximum output voltage at the output terminal 6 of the fifth operational amplifier U5 is 2.5V, which does not exceed the 3.3V power supply voltage of the main control module 10, ensuring that the main control module 10 can normally perform A / D data conversion.

[0077] Figure 4 A circuit schematic diagram of a main control module in an automatic testing device for simultaneously testing multiple groups of high-voltage output modules provided in one embodiment of the present application.

[0078] like Figure 4 As shown, in the embodiment of the invention being applied for, the main control module 10 is required to control the switching channels of the matrix module 40, and perform AD acquisition on the data fed back by the first detection module 20. Based on instructions from the host computer, the main control module 10 sends PWM signals, activates the boost operation of the high-voltage output module under test, sends output control signals / mode switching signals, and promptly receives feedback signals from the high-voltage output module under test. The main control module 10 also communicates with the host computer, receiving and executing its instructions.

[0079] Figure 5 A circuit schematic diagram of a second detection module in an automatic testing device for simultaneously testing multiple groups of high-voltage output modules provided in one embodiment of the present application.

[0080] like Figure 5 As shown, in the embodiment of the invention, the second detection module 50 is primarily composed of a Hall current sampling circuit and a current AD acquisition circuit. The Hall current sampling circuit primarily performs current acquisition and amplification and is primarily composed of a ninth operational amplifier U9, a Hall current sensor U8, and its peripheral resistors and capacitors. The IP+ terminal of the Hall current sensor U8 is connected to the positive terminal of the current being measured, and the IP- terminal is connected to the negative terminal of the current being measured. The measured current is sampled by the differential Hall isolation within the Hall current sensor U8 and then output through pin 7 of the Hall current sensor. The output is conditioned by the differential operational amplifier formed by the ninth operational amplifier U9 before being transmitted to the current AD acquisition circuit for analog-to-digital conversion. The current AD acquisition circuit primarily comprises an energy metering chip N2, its peripheral resistors and capacitors, and a passive crystal oscillator XT1. The AD value of the sampled current is connected to pin 9 of the energy metering chip N2 for analog-to-digital conversion and acquisition. Ultimately, it is transmitted to the main control module 10 via the SPI bus on pins 5, 6, 7, 19, and 23 of the energy metering chip N2 for data reading, completing the boost current test of the module under test.

[0081] It is further explained that the Hall current sensor U8 can be a CC6920 Hall current sensor, and the energy metering chip N2 can be a CS5460A chip.

[0082] In an embodiment of the present application, the automatic testing device for simultaneously testing multiple groups of high-voltage output modules realizes automated testing of multiple groups of high-voltage output modules to be tested through a matrix module, a first detection module, a main control module and a second detection module, and can realize synchronous testing of multiple groups of high-voltage output modules to be tested. At the same time, it solves the cumbersome procedure of frequently changing test points during manual testing, and further solves the static resistance measurement of the high-voltage output module to be tested before power-on, reducing the failure rate of the power-on test of the high-voltage output module to be tested. At the same time, the method of internally building a measuring instrument solves the data interaction problem between the tooling and the external standard instrument, greatly reducing the workload of software development.

[0083] Example 2:

[0084] The present invention further provides an automatic testing method for simultaneously testing multiple groups of high-voltage output modules, which is used in the above-mentioned automatic testing device for simultaneously testing multiple groups of high-voltage output modules. The automatic testing method includes the following steps:

[0085] Connecting the signal connection end of each group of high-voltage output modules to be tested to each group of interface modules of an automatic test device for simultaneously testing multiple groups of high-voltage output modules; and obtaining the channel resistance value of each signal connection end and the PWM signal of each group of high-voltage output modules to be tested;

[0086] Determining the test gear for the first detection module to perform functional performance testing on the corresponding signal connection terminal according to the measured resistance value of the channel;

[0087] Automatically control the test group corresponding to the signal connection terminal to be closed according to the PWM signal and the test gear position to perform static resistance and power-on tests on the high-voltage output module to be tested, and obtain test data of the test connection terminal corresponding to the test group through the first detection module and the second detection module;

[0088] When the feedback signal of the test data is a high-level signal, the functional performance of the corresponding test connection terminal is normal.

[0089] It should be further noted that the details of the automatic testing device for simultaneously testing multiple groups of high-voltage output modules have been described in Example 1 and will not be repeated in this example. This automatic testing method for simultaneously testing multiple groups of high-voltage output modules implements automated testing of multiple groups of high-voltage output modules to be tested, enabling simultaneous testing of multiple groups of high-voltage output modules to be tested. It also eliminates the cumbersome process of frequently changing test points during manual testing and further addresses the static resistance measurement of the high-voltage output modules to be tested before power is applied, thereby reducing the failure rate during power-on testing of the high-voltage output modules to be tested.

[0090] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0091] In the description of this application, the terms "first" and "second" are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly specify the number of technical features indicated. Therefore, features specified as "first" or "second" may explicitly or implicitly include one or more features.

[0092] The above is a detailed introduction to the automatic testing device for simultaneously testing multiple groups of high-voltage output modules provided by an embodiment of the present application. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea; at the same time, for technical personnel in this field, based on the ideas of the present application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims

1. An automatic testing device for simultaneously testing multiple groups of high-voltage output modules, characterized in that: include: A main control module, a first detection module, multiple groups of interface modules, a matrix module connected to each group of the interface modules, and a second detection module connected to the matrix module; Each group of the interface modules is provided with a plurality of test connection terminals connected to the signal connection terminals of the high-voltage output modules to be tested; Each group of the matrix modules includes at least 16 groups of switching switches, and any two groups of the switching switches serve as a test group. Each group of the matrix modules is further connected to the main control module and the first detection module, respectively, so that the signal connection end of the high-voltage output module to be tested is connected to the first detection module; the second detection module and the first detection module are both connected to the main control module; The main control module is configured to output a PWM signal for controlling the switching switches of each group in the matrix module to be closed or opened; when the PWM signal controls the switching switches of any one of the test groups in the matrix module to be closed, the first detection module and the second detection module are configured to obtain test data of the test connection terminal corresponding to the test group; Among them, the main control module is used to control the operation of the switching switch in each group of the matrix modules through the PWM signal to realize simultaneous testing of multiple groups of high-voltage output modules; the main control module is used to determine whether the functional performance of the corresponding test connection end is normal based on the test data.

2. The automatic testing device for simultaneously testing multiple groups of high-voltage output modules according to claim 1, characterized in that: Each group of the switching switches includes a positive channel and a negative channel, and the positive channel and the negative channel both include a normally closed contact and a normally open contact. The normally open contacts of all the positive channels of each group of the matrix modules are connected to the positive connection end of the first detection module, and the normally open contacts of all the negative channels of each group of the matrix modules are connected to the negative connection end of the first detection module; one group of the switching switches in each test group is connected to a DC power supply through a DC / DC module to power the high-voltage output module to be tested; another group of the switching switches in each test group is connected to the main control module through an optocoupler device.

3. The automatic testing device for simultaneously testing multiple groups of high-voltage output modules according to claim 1, characterized in that: The first detection module includes a gear selection circuit and a voltage source circuit, a four-speed constant current source circuit, a voltage divider circuit and an AD sampling circuit connected to the gear selection circuit; The voltage source circuit and the four-speed constant current source circuit are used for measuring resistance values; The voltage divider circuit is used for measuring analog voltage; The gear selection circuit is used for gear switching to switch between voltage value testing and resistance value testing; The AD acquisition circuit is used to collect test data and transmit the collected test data to the main control module.

4. The automatic testing device for simultaneously testing multiple groups of high-voltage output modules according to claim 3, characterized in that: The voltage source circuit includes a second operational amplifier, a third operational amplifier, a third resistor, a fourth resistor and a fifth resistor. The non-inverting input terminal of the second operational amplifier is used to be connected to the power input terminal. The third resistor and the fifth resistor have equal resistance values and together with the second operational amplifier form a voltage conversion circuit, so that the output terminal of the second operational amplifier outputs a reference voltage to the third operational amplifier. The output terminal of the third operational amplifier is connected to the gear selection circuit through the fourth resistor.

5. The automatic testing device for simultaneously testing multiple groups of high-voltage output modules according to claim 3, characterized in that: The four-speed constant current source circuit includes a sixth operational amplifier, a seventh operational amplifier, and multiple groups of switch modules connected in parallel with the seventh operational amplifier. One end of each group of switch modules is connected to the output end of the sixth operational amplifier and the same-direction input end of the seventh operational amplifier through a thirteenth resistor, and the other end of each group of switch modules is connected to the output end of the seventh operational amplifier. The output end of the seventh operational amplifier is connected to the gear selection circuit through a sixteenth resistor; each group of switch modules includes a switch resistor and a mechanical switch connected in series with the switch resistor; the output end and the reverse input end of the sixth operational amplifier are grounded through an eighteenth resistor, so that the current flowing through the eighteenth resistor is a constant value, and the current flowing through the thirteenth resistor is also a constant value.

6. The automatic testing device for simultaneously testing multiple groups of high-voltage output modules according to claim 5, characterized in that: The multiple groups of switch modules include a first switch module, a second switch module, a third switch module and a fourth switch module. The first switch module is used to constantly output a first current, the second switch module is used to constantly output a second current, the third switch module is used to constantly output a third current, and the fourth switch module is used to constantly output a fourth current.

7. The automatic testing device for simultaneously testing multiple groups of high-voltage output modules according to claim 3, characterized in that: The gear selection circuit includes a first switch, a ninth switch, a tenth switch, and a fifth zener diode, wherein the first switch is connected to the voltage source circuit, and is also connected to the ninth switch and the tenth switch, respectively. The ninth switch is also connected to the AD sampling circuit and the voltage divider circuit, respectively. The tenth switch is also grounded via the fifth zener diode. The ninth switch is used to switch between voltage measurement and resistance measurement; The first switch is used to switch the constant current source position or the voltage source position in resistance measurement.

8. The automatic testing device for simultaneously testing multiple groups of high-voltage output modules according to claim 3, characterized in that: The AD acquisition circuit includes a fourth operational amplifier and a fifth operational amplifier connected to the fourth operational amplifier. A fourteenth resistor, a fifteenth resistor and a fourth capacitor are arranged between the fourth operational amplifier and the fifth operational amplifier. The non-inverting input terminal of the fourth operational amplifier is connected to the gear selection circuit through a first inductor, and the first inductor is also grounded through a fifth capacitor. The measured signal at the test connection terminal is filtered by the first inductor and the fifth capacitor and then connected to the voltage follower of the fourth operational amplifier. Then, after RC filtering by the fourteenth resistor, the fifteenth resistor and the fourth capacitor, it enters the reverse input terminal of the fifth operational amplifier, and the output terminal of the fifth operational amplifier outputs the test data.

9. An automatic testing method for simultaneously testing multiple groups of high-voltage output modules, applied to the automatic testing device for simultaneously testing multiple groups of high-voltage output modules as claimed in any one of claims 1 to 8, characterized in that: The automatic testing method includes the following steps: Connecting the signal connection end of each group of high-voltage output modules to be tested to each group of interface modules of the automatic testing device for simultaneously testing the multiple groups of high-voltage output modules; and obtaining the channel measured resistance value of each signal connection end and the PWM signal of each group of high-voltage output modules to be tested; Determining, according to the measured resistance value of the channel, a test gear at which the first detection module performs a functional performance test on the corresponding signal connection terminal; According to the PWM signal and the test gear, the test group corresponding to the signal connection end is automatically controlled to be closed, and the static resistance and power-on tests are performed on the high-voltage output module to be tested in sequence, and the test data of the test connection end corresponding to the test group is obtained through the first detection module and the second detection module.

10. The automatic testing method for simultaneously testing multiple groups of high-voltage output modules according to claim 9, characterized in that: include: When the feedback signal of the test data is a high-level signal, the functional performance of the corresponding test connection terminal is normal.

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