Server item testing method and electronic equipment

Abstract

The invention discloses a server item test method and electronic equipment, and relates to the technical field of server testing, and the method comprises the steps: determining a plurality of test items of a type server; determining the type of a common test platform to divide each test item into a corresponding test item cluster; intersection is solved according to the type of the common test platform, and a plurality of intersection categories are obtained; screening each test item cluster according to the plurality of intersection categories to obtain each test item intersection; testing any target test item in any test item intersection to obtain a target test result; determining the target test result as the target test result of the remaining target test items; determining each target test result in each test item intersection; testing the remaining test items in the plurality of test items to obtain test results; and all the target test results and all the test results are integrated into the test result of the type server, so that the test efficiency of the server project is improved.

Description

Technical Field

[0001] The present application relates to the technical field of server testing, and in particular to a server project testing method and electronic equipment. Background Art

[0002] Server project testing, a critical phase in building a reliable computing infrastructure, involves systematic project testing to verify that all server indicators meet standards, covering core dimensions such as functionality, performance, and security. Server testing primarily checks basic server functionality, performs stress tests, and verifies disaster recovery capabilities. The results provide a scientific basis for server deployment optimization and operations and maintenance decisions, ensuring reliable, efficient, and secure server operation in real-world business scenarios.

[0003] Current server project testing methods in the related art require obtaining multiple test items on the server platform, testing each test item one by one, obtaining corresponding test results, and then determining the final test result based on each test result. However, this method of testing each test item sequentially to obtain each test result in the face of a large number of test items, resulting in low server project testing efficiency. Summary of the Invention

[0004] The present application provides a server project testing method and electronic equipment to at least solve the problem in the related art of obtaining each test result by testing each test item in sequence, which will cause low efficiency of server project testing when faced with a large number of test items.

[0005] This application provides a server project testing method, including:

[0006] Determine multiple test items for any type of server, wherein each test item includes test information corresponding to multiple servers of the type of server, wherein each test item includes a test platform identifier of the corresponding server;

[0007] Identify the test items that belong to the common test platform among multiple test items;

[0008] Determine the type of common test platform;

[0009] Grouping the test items of the shared test platform, which have the same type as the shared test platform, into test item clusters corresponding to the type of the shared test platform to obtain a plurality of test item clusters;

[0010] Perform intersection processing according to the type of the shared test platform to obtain multiple intersection categories;

[0011] Filter each test item cluster according to multiple intersection categories to obtain the test item intersection corresponding to each intersection category;

[0012] Extract multiple target test items from the intersection of any test items;

[0013] Test any target test item and obtain the corresponding target test result;

[0014] determining the target test result as the target test result for the remaining target test items;

[0015] Determine a target test result for each target test item in the intersection of each test item;

[0016] Testing the remaining test items in the multiple test items to obtain one or more test results;

[0017] The target test results and the test results of each type are integrated into the test results of the server.

[0018] The present application also provides an electronic device, comprising: a memory for storing a computer program; and a processor for implementing the steps of any of the above-mentioned server project testing methods when executing the computer program.

[0019] The present application also provides a computer-readable storage medium, in which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above-mentioned server project testing methods are implemented.

[0020] The present application also provides a computer program product, including a computer program, which implements the steps of any of the above-mentioned server project testing methods when executed by a processor.

[0021] The server project testing method and electronic device provided in the embodiments of the present application determine multiple test items of the type server; determine the test items belonging to a shared test platform in the multiple test items; divide the test items of the same type of the shared test platform into corresponding multiple test item clusters; perform intersection processing according to the type of the shared test platform to obtain multiple intersection categories; screen each test item cluster according to the multiple intersection categories to obtain the intersection of each test item; extract multiple target test items in any intersection of test items; test any target test item to obtain the corresponding target test result; determine the target test result as the target test result of the remaining target test items; determine the target test result of each target test item in the intersection of each test item; test the remaining test items in the multiple test items to obtain each test result; integrate each target test result and each test result into a test result of the type server, without the need to repeatedly test each test item in the intersection of each test item, thereby improving the testing efficiency of the server project. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0023] Figure 1 Schematic diagram of an application scenario of the server project testing method provided in an embodiment of the present application;

[0024] Figure 2 Schematic diagram of the process of the server project testing method provided in the embodiment of the application Figure 1 ;

[0025] Figure 3 Schematic diagram of the process of the server project testing method provided in the embodiment of the application Figure 2 ;

[0026] Figure 4 A schematic diagram of the structure of a server project testing device provided in an embodiment of the present application;

[0027] Figure 5 A schematic diagram of the hardware structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0028] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0029] It should be noted that, in the description of this application, the terms "comprises," "includes," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. The terms "first," "second," etc., in this application are used to distinguish similar objects, and are not used to describe a particular order or sequence.

[0030] Server project testing, as a key stage in building a reliable computing infrastructure, verifies the entire process of whether various server indicators meet the standards through systematic project testing, covering core dimensions such as function, performance, and security. Server testing is mainly used for basic function inspection, stress testing, and disaster recovery capability verification of servers. Its test results provide a scientific basis for server deployment optimization and operation and maintenance decisions, ensuring that the server runs reliably, efficiently, and safely in real business scenarios. In the related art, the current server project testing method needs to obtain multiple test items on the server platform, and test each test item one by one to obtain the corresponding test results, and determine the final test results based on each test result. However, in the related art, the detection method of obtaining each test result by testing each test item in turn will cause the problem of low efficiency of server project testing when faced with a large number of test items.

[0031] In order to solve the above technical problems, the embodiments of the present application propose the following technical concepts: the inventor takes into account multiple test items of the type server, divides the multiple test items according to the type of the shared test platform, obtains multiple test item clusters, and uses the obtained intersection categories to screen the multiple test item clusters to obtain the intersection of each test item; extracts multiple target test items in any test item intersection to obtain corresponding target test results; determines the target test results as the target test results of the remaining target test items; determines the target test results of each target test item in the intersection of each test item; tests the remaining test items to obtain each test result; integrates each target test result and each test result into the test result of the type server, and there is no need to repeatedly test each test item in the intersection of each test item, thereby improving the testing efficiency of the server project.

[0032] In order to enable those skilled in the art to better understand the present application, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0033] In conjunction with the specific application environment architecture or specific hardware architecture that the execution of the server project test method depends on, the specific application environment architecture or specific hardware architecture is described here. Figure 1 , Figure 1 Schematic diagram of the application scenario of the server project testing method provided in the embodiment of the present application.

[0034] like Figure 1 As shown, the application scenarios of the server project testing method include: type server 101 and electronic device 102.

[0035] The type server 101 may be a single server or a cluster of multiple servers.

[0036] The electronic device 102 may be a test center terminal or another device terminal.

[0037] The electronic device 102 determines multiple test items for any type of server 101; determines the test items belonging to a shared test platform among the multiple test items; determines the type of the shared test platform; divides the test items of the shared test platform that have the same type into test item clusters corresponding to the type of the shared test platform to obtain multiple test item clusters; performs intersection processing according to the type of the shared test platform to obtain multiple intersection categories; screens each test item cluster according to the multiple intersection categories to obtain a test item intersection corresponding to each intersection category; extracts multiple target test items from any test item intersection; tests any target test item to obtain a corresponding target test result; determines the target test result as the target test result of the remaining target test items; determines the target test result of each target test item in the intersection of each test item; tests the remaining test items in the multiple test items to obtain one or more test results; integrates each target test result and each test result into a test result of the type server 101.

[0038] Figure 2 Schematic diagram of the process of the server project testing method provided in the embodiment of the application Figure 1 ,like Figure 2 As shown, the embodiment of the present application provides a server project testing method, which is described in detail as follows:

[0039] S201: Determine multiple test items for any type of server, wherein each test item includes test information for multiple servers corresponding to the type of server, wherein each test item includes a test platform identifier of the corresponding server.

[0040] In this embodiment, the type server may be a high-performance server or other server.

[0041] Illustratively, the plurality of test items are P1, P2, P3, P4, P5, P6, P7, P8, P9, and P10.

[0042] The test platform identifier is used to indicate the model and type of the corresponding test platform.

[0043] S202: Determine test items among multiple test items that belong to a common test platform.

[0044] For example, it is determined that P1 and P2 share a server 1U motherboard platform, P3 and P4 share a server 2U motherboard platform, and P5 and P6 share a server single-channel motherboard platform; it is determined that P1, P2, P3 and P4 share a baseboard management controller code platform; and it is determined that P1, P2, P5 and P6 have a basic input and output system code platform.

[0045] S203: Determine the type of the shared test platform.

[0046] In this embodiment, the types of the shared test platform include one or more of the following: a server motherboard platform, a baseboard management controller code platform, and a basic input and output system code platform.

[0047] Exemplarily, the server 1U motherboard platform, server 2U motherboard platform and server single-channel motherboard platform are determined to be server motherboard platforms, and the other shared test platforms are determined to be baseboard management controller code platforms and basic input and output system code platforms.

[0048] S204: Divide the test items of the shared test platform of the same type into test item clusters corresponding to the type of the shared test platform to obtain multiple test item clusters.

[0049] In this embodiment, the types of shared test platforms are server motherboard platforms, baseboard management controller code platforms, and basic input / output system code platforms; accordingly, step S204 specifically includes: dividing the test items of the shared test platforms with the same type into test item clusters corresponding to the types of the shared test platforms, and obtaining multiple test item clusters, which are test item clusters corresponding to the server motherboard platform, test item clusters corresponding to the baseboard management controller code platform, and test item clusters corresponding to the basic input / output system code platform.

[0050] Exemplarily, P1, P2, P3, P4, P5 and P6 are determined to be the test item clusters corresponding to the server motherboard platform; P1, P2, P3 and P4 are determined to be the test item clusters corresponding to the baseboard management controller code platform; and P1, P2, P5 and P6 are determined to be the test item clusters corresponding to the basic input and output system code platform.

[0051] S205: performing intersection processing according to the types of the shared test platform to obtain multiple intersection categories.

[0052] Specifically, step S205 includes:

[0053] S2051: Obtain the code corresponding to the type of the shared test platform.

[0054] In this embodiment, the types of shared test platforms include server motherboard platforms, baseboard management controller code platforms, and basic input / output system code platforms; accordingly, step S2051 specifically includes: obtaining the code corresponding to the server motherboard platform, the code corresponding to the baseboard management controller code platform, and the code corresponding to the basic input / output system code platform.

[0055] Exemplarily, the obtained code corresponding to the server motherboard platform is A, the obtained code corresponding to the baseboard management controller code platform is B, and the obtained code corresponding to the basic input and output system code platform is C.

[0056] S2052: Perform intersection processing according to the codes corresponding to the types of the shared test platform to obtain multiple intersection categories.

[0057] In this embodiment, the multiple intersection categories include the intersection of the server motherboard platform and the baseboard management controller code platform, the intersection of the baseboard management controller code platform and the basic input and output system code platform, the intersection of the server motherboard platform and the basic input and output system code platform, and the intersection of the server motherboard platform, the baseboard management controller code platform, and the basic input and output system code platform; accordingly, step S2052 specifically includes: performing intersection processing according to the code corresponding to the server motherboard platform, the code corresponding to the baseboard management controller code platform, and the code corresponding to the basic input and output system code platform to obtain the intersection of the server motherboard platform and the baseboard management controller code platform, the intersection of the baseboard management controller code platform and the basic input and output system code platform, the intersection of the server motherboard platform and the basic input and output system code platform, and the intersection of the server motherboard platform, the baseboard management controller code platform, and the basic input and output system code platform.

[0058] Exemplarily, according to the code corresponding to the server motherboard platform, the code corresponding to the baseboard management controller code platform, and the code corresponding to the basic input and output system code platform, an intersection processing is performed, and the intersection of the server motherboard platform and the baseboard management controller code platform is A∩B, the intersection of the baseboard management controller code platform and the basic input and output system code platform is B∩C, the intersection of the server motherboard platform and the basic input and output system code platform is A∩C, and the intersection of the server motherboard platform, the baseboard management controller code platform, and the basic input and output system code platform is A∩B∩C.

[0059] Specifically, step S205 further includes: performing intersection processing according to the type and preset level of the shared test platform until no intersection is found, thereby obtaining a plurality of intersection categories.

[0060] In this embodiment, the preset levels are levels arranged from small to large according to the number of combinations.

[0061] For example, according to the server motherboard platform A, the baseboard management controller code platform B, the basic input and output system code platform C and the preset hierarchy, the intersection between each two platforms is calculated first, and then the intersection between the three platforms is calculated until there is no intersection, and multiple intersection categories are obtained: A∩B, B∩C, A∩C and A∩B∩C.

[0062] S206: Filter each test item cluster according to multiple intersection categories to obtain a test item intersection corresponding to each intersection category.

[0063] For example, based on S204, each test item cluster is screened according to A∩B, and the intersections of test items corresponding to each intersection category are P1, P2, P3 and P4; each test item cluster is screened according to B∩C, and the intersections of test items corresponding to each intersection category are P1 and P2; each test item cluster is screened according to A∩C, and the intersections of test items corresponding to each intersection category are P1, P2, P5 and P6.

[0064] S207: Extract multiple target test items from any intersection of test items.

[0065] Exemplarily, the multiple target test items extracted from the intersection of the test items corresponding to A∩B are P1, P2, P3 and P4.

[0066] S208: Test any target test item to obtain a corresponding target test result.

[0067] Exemplarily, any target test item P1 is tested to obtain a corresponding target test result.

[0068] S209: Determine the target test result as the target test result of the remaining target test items.

[0069] Exemplarily, the target test results are determined to be the target test results of P2, P3, and P4.

[0070] S210: Determine a target test result for each target test item in the intersection of each test item.

[0071] Illustratively, according to the examples of steps S207 to S209 , target test results of target test items in the intersection of test items corresponding to A∩B, B∩C, A∩C, and A∩B∩C are determined.

[0072] S211: Testing the remaining test items in the plurality of test items to obtain one or more test results.

[0073] Illustratively, among the multiple test items, excluding the intersection of each test item, the remaining test items P7, P8, P9 and P10 are tested to obtain multiple test results.

[0074] S212: Integrate each target test result and each test result into a test result of the type server.

[0075] In addition, the method for determining the test result of the server type can also be steps a to d:

[0076] Step a: Get the server model of type server.

[0077] Step b: Find the corresponding reference server information based on the server model.

[0078] Exemplarily, according to the server model, corresponding reference server information is searched in a structured database.

[0079] Step c: Obtain the reference test results corresponding to the reference server information.

[0080] Specifically, step c includes:

[0081] Step c1: Determine each test platform in the corresponding reference server according to the reference server information.

[0082] Taking any test platform, ie, a baseboard management controller code platform, as an example, the baseboard management controller code platform corresponding to the reference server is determined according to the reference server information.

[0083] Step c2: Obtain the software test results in each test platform, and determine each software test result as a reference test result.

[0084] Exemplarily, a software test result in a baseboard management controller code platform is obtained, and the corresponding software test result is determined as a reference test result.

[0085] The software test results may be program error data executed and submitted with the same use case, or other test output content.

[0086] Step d: Determine the reference test result as the test result of the type server.

[0087] In summary, the server project testing method provided in this embodiment determines multiple test items of the type server; determines the test items belonging to the shared test platform among the multiple test items; divides the test items of the same type of the shared test platform into corresponding multiple test item clusters; performs intersection processing according to the type of the shared test platform to obtain multiple intersection categories; screens each test item cluster according to the multiple intersection categories to obtain the intersection of each test item; extracts multiple target test items in any test item intersection; tests any target test item to obtain the corresponding target test result; determines the target test result as the target test result of the remaining target test item; determines the target test result of each target test item in the intersection of each test item; tests the remaining test items in the multiple test items to obtain each test result; integrates each target test result and each test result into a test result of the type server, and there is no need to repeatedly test each test item in the intersection of each test item, thereby improving the testing efficiency of the server project and shortening the development cycle of the server.

[0088] In addition, the server project testing method provided in this embodiment improves the testing efficiency of the server project by obtaining the server model of the type server; searching for the corresponding reference server information according to the server model; obtaining the reference test results corresponding to the reference server information; and determining the reference test results as the test results of the type server.

[0089] Figure 3 Schematic diagram of the process of the server project testing method provided in the embodiment of the application Figure 2 In the embodiment of the present application, Figure 2 Based on the embodiment provided, a detailed description is given of the specific implementation method for testing any target test item in step S208 and obtaining the corresponding target test result. Figure 3 As shown, the server project testing method includes:

[0090] S301: Obtain server component information in the test project.

[0091] S302: Determine corresponding server components according to the server component information of each test.

[0092] In this embodiment, each server component may be a central processing unit, a memory, a network card, a hard disk, or other server components.

[0093] S303: Perform test processing on each server component to obtain the test results of each server component.

[0094] Specifically, step S303 includes:

[0095] S3031: Obtain multiple sub-test items corresponding to each server component.

[0096] In this embodiment, the plurality of sub-test items include one or more of the following: a performance test item, a stress test item, a stability test item, a functionality test item, a location information identification item, and a bandwidth identification item.

[0097] S3032: Perform test processing on each server component according to multiple sub-test items to obtain test results of each server component.

[0098] Specifically, each server component is tested according to a plurality of sub-test items, and the test results of each server component obtained include performance test results, stress test results, stability test results, functional test results, location information identification results and bandwidth identification results.

[0099] In addition, if the test item in S301 belongs to the intersection of test items corresponding to A∩B∩C, then other test items in the same test item intersection as the test item can use the performance test results, stress test results, stability test results, functional test results, location information identification results and bandwidth identification results of each server component corresponding to the test item.

[0100] In addition, if the test item in S301 belongs to the intersection of test items corresponding to A∩B or the intersection of test items corresponding to A∩C, then other test items in the same test item intersection as the test item can use the performance test results, stress test results, stability test results and functional test results of each server component corresponding to the test item, but the location information identification items and bandwidth identification items corresponding to each server component need to be executed separately.

[0101] In addition, if the test item in S301 belongs to the intersection of test items corresponding to B∩C, then other test items in the same test item intersection as the test item can use the location information identification results and bandwidth identification results of each server component corresponding to the test item, but the performance test items, stress test items, stability test items and functional test items corresponding to each server component need to be executed separately.

[0102] S304: Determine the target test result of the test item according to the test result of each server component.

[0103] In summary, the server project testing method provided in this embodiment obtains the server component information in the test project; determines the corresponding server components based on the server component information; tests and processes each server component to obtain the test results of each server component; and determines the target test results of the test project based on the test results of each server component. By testing each server component, the comprehensiveness of the server project test is improved.

[0104] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by means of software plus the necessary general hardware platform, and of course it can also be implemented by hardware, but in many cases the former is a better implementation method.

[0105] Figure 4 This is a schematic diagram of the structure of the server project testing device provided in the embodiment of the present application. Figure 4 As shown, an embodiment of the present application also provides a server project testing device, including: a first determination module 401, a second determination module 402, a third determination module 403, a division module 404, a processing module 405, a screening module 406, an extraction module 407, a first test module 408, a fourth determination module 409, a fifth determination module 410, a second test module 411 and an integration module 412.

[0106] A first determining module 401 is configured to determine a plurality of test items for any type of server, wherein each test item includes test information corresponding to a plurality of servers of the type of server, wherein each test item includes a test platform identifier of the corresponding server;

[0107] A second determining module 402 is configured to determine a test item among the plurality of test items that belongs to a common test platform;

[0108] The third determination module 403 is used to determine the type of the shared test platform;

[0109] A division module 404 is configured to divide the test items of the shared test platform into test item clusters corresponding to the type of the shared test platform, thereby obtaining a plurality of test item clusters;

[0110] A processing module 405 is used to perform intersection processing according to the type of the shared test platform to obtain multiple intersection categories;

[0111] A screening module 406 is configured to screen each test item cluster according to a plurality of intersection categories to obtain a test item intersection corresponding to each intersection category;

[0112] Extraction module 407, used to extract multiple target test items from any intersection of test items;

[0113] The first testing module 408 is used to test any target test item and obtain the corresponding target test result;

[0114] A fourth determining module 409 is configured to determine the target test result as the target test result of the remaining target test items;

[0115] A fifth determining module 410 is configured to determine a target test result for each target test item in the intersection of each test item;

[0116] The second testing module 411 is configured to test the remaining test items in the plurality of test items and obtain one or more test results;

[0117] The integration module 412 is used to integrate each target test result and each test result into a test result of a server type.

[0118] In one possible implementation, the types of the shared test platforms are server motherboard platforms, baseboard management controller code platforms, and basic input / output system code platforms; accordingly, the division module 404 is specifically used to: divide the test items of the shared test platforms with the same type into test item clusters corresponding to the types of the shared test platforms, and obtain multiple test item clusters, which are test item clusters corresponding to the server motherboard platform, test item clusters corresponding to the baseboard management controller code platform, and test item clusters corresponding to the basic input / output system code platform.

[0119] In a possible implementation, the processing module 405 specifically includes:

[0120] An acquiring unit, used for acquiring a code corresponding to a type of a common test platform;

[0121] The processing unit is used to perform intersection processing according to the codes corresponding to the types of the shared test platforms to obtain multiple intersection categories.

[0122] In one possible implementation, the types of shared test platforms include server motherboard platforms, baseboard management controller code platforms, and basic input / output system code platforms; accordingly, the acquisition unit is specifically used to: obtain the code corresponding to the server motherboard platform, the code corresponding to the baseboard management controller code platform, and the code corresponding to the basic input / output system code platform.

[0123] In one possible implementation, the multiple intersection categories include the intersection of the server motherboard platform and the baseboard management controller code platform, the intersection of the baseboard management controller code platform and the basic input / output system code platform, the intersection of the server motherboard platform and the basic input / output system code platform, and the intersection of the server motherboard platform, the baseboard management controller code platform and the basic input / output system code platform; accordingly, the processing unit is specifically used to: perform intersection processing according to the code corresponding to the server motherboard platform, the code corresponding to the baseboard management controller code platform, and the code corresponding to the basic input / output system code platform to obtain the intersection of the server motherboard platform and the baseboard management controller code platform, the intersection of the baseboard management controller code platform and the basic input / output system code platform, the intersection of the server motherboard platform and the basic input / output system code platform, and the intersection of the server motherboard platform, the baseboard management controller code platform and the basic input / output system code platform.

[0124] In a possible implementation, the processing module 405 is specifically configured to perform intersection processing according to the type and preset hierarchy of the shared test platform until no intersection is found, thereby obtaining a plurality of intersection categories.

[0125] In a possible implementation, the first testing module 408 specifically includes:

[0126] The acquisition unit is used to obtain the server component information in the test project;

[0127] A first determining unit, configured to determine corresponding server components according to the server component information;

[0128] The testing unit is used to test each server component and obtain the test results of each server component;

[0129] The second determining unit is configured to determine a target test result of the test item according to the test result of each server component.

[0130] In a possible implementation, the test unit specifically includes:

[0131] An acquisition unit, used for acquiring multiple sub-test items corresponding to each server component;

[0132] The test unit is used to test each server component according to multiple sub-test items to obtain the test results of each server component.

[0133] In a possible implementation, the multiple sub-test items include one or more of the following: a performance test item, a stress test item, a stability test item, a functional test item, a location information identification item, and a bandwidth identification item.

[0134] In a possible implementation, the apparatus further includes:

[0135] A first acquisition module is used to acquire a server model of a type server;

[0136] A search module is used to search for corresponding reference server information according to the server model;

[0137] A second acquisition module is used to obtain reference test results corresponding to the reference server information;

[0138] The sixth determining module is configured to determine the reference test result as a test result of a type server.

[0139] In a possible implementation, the second acquisition module specifically includes:

[0140] A first determining unit, configured to determine each test platform in the corresponding reference server according to the reference server information;

[0141] The second determining unit is configured to obtain software test results in each test platform and determine each software test result as a reference test result.

[0142] In a possible implementation, the types of the shared test platform include one or more of the following: a server motherboard platform, a baseboard management controller code platform, and a basic input and output system code platform.

[0143] For the description of the features in the embodiment corresponding to the server project testing device, please refer to the relevant description of the embodiment corresponding to the server project testing method, which will not be repeated here.

[0144] Figure 5 This is a schematic diagram of the structure of the electronic device provided in this application. Figure 5 As shown, the electronic device provided by this embodiment includes: at least one processor 501 and a memory 502. Optionally, the electronic device further includes a communication component 503. The processor 501, the memory 502 and the communication component 503 are connected via a bus.

[0145] During the specific implementation process, at least one processor 501 executes the computer execution instructions stored in the memory 502, so that the at least one processor 501 executes the above-mentioned server project testing method embodiment.

[0146] The specific implementation process of the processor 501 can be found in the above method embodiment. Its implementation principle and technical effects are similar and will not be repeated here in this embodiment.

[0147] In the above embodiments, it should be understood that the processor may be a central processing unit (CPU), other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), etc. A general-purpose processor may be a microprocessor or any conventional processor. The steps of the method disclosed in the application may be directly executed by a hardware processor or by a combination of hardware and software modules within the processor.

[0148] The memory may include random access memory (RAM) and may also include non-volatile memory (NVM), such as at least one disk storage.

[0149] A bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus. Buses can be categorized as address buses, data buses, and control buses. For ease of illustration, the buses in the drawings of this application are not limited to just one bus or just one type of bus.

[0150] An embodiment of the present application further provides a computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to execute the steps of any of the above-mentioned server project testing method embodiments when running.

[0151] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk, or an optical disk.

[0152] An embodiment of the present application further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the steps of any of the above-mentioned server project testing method embodiments are implemented.

[0153] An embodiment of the present application also provides another computer program product, including a non-volatile computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, it implements the steps in any of the above-mentioned server project testing method embodiments.

[0154] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0155] The above is a detailed introduction to a server project testing method and electronic equipment provided by this application. This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand the method and core ideas of this application. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of this application, several improvements and modifications can be made to this application, and these improvements and modifications also fall within the scope of protection of the claims of this application.

Claims

1. A server project testing method, characterized in that: include: Determine multiple test items for any type of server, wherein each test item includes test information corresponding to multiple servers of the type of server, wherein each test item includes a test platform identifier of the corresponding server; Determining test items among the plurality of test items that belong to a common test platform; Determine the type of common test platform; Grouping the test items of the shared test platform, which have the same type as the shared test platform, into test item clusters corresponding to the type of the shared test platform to obtain a plurality of test item clusters; Performing intersection processing according to the type of the shared test platform to obtain multiple intersection categories; Filtering each test item cluster according to the multiple intersection categories to obtain a test item intersection corresponding to each intersection category; Extract multiple target test items from the intersection of any test items; Test any target test item and obtain the corresponding target test result; Determine the target test result as the target test result for the remaining target test items; Determine a target test result for each target test item in the intersection of each test item; Testing the remaining test items in the plurality of test items to obtain one or more test results; The target test results and the test results are integrated into the test results of the server type.

2. The server project testing method according to claim 1, characterized in that: The types of the shared test platforms are server motherboard platforms, baseboard management controller code platforms and basic input and output system code platforms; Accordingly, the test items of the shared test platform having the same type are divided into test item clusters corresponding to the type of the shared test platform, to obtain a plurality of test item clusters, including: The test items of the shared test platforms with the same type are divided into test item clusters corresponding to the type of the shared test platforms, and multiple test item clusters are obtained, namely, the test item cluster corresponding to the server motherboard platform, the test item cluster corresponding to the baseboard management controller code platform, and the test item cluster corresponding to the basic input and output system code platform.

3. The server project testing method according to claim 1, characterized in that: The intersection processing is performed according to the type of the shared test platform to obtain multiple intersection categories, including: Obtaining a code corresponding to the type of the shared test platform; An intersection process is performed according to the codes corresponding to the types of the shared test platforms to obtain a plurality of intersection categories.

4. The server project testing method according to claim 3, characterized in that: The types of the shared test platforms include server motherboard platforms, baseboard management controller code platforms and basic input and output system code platforms; Accordingly, the step of obtaining the code corresponding to the type of the shared test platform includes: Obtain the code corresponding to the server mainboard platform, the code corresponding to the baseboard management controller code platform, and the code corresponding to the basic input and output system code platform.

5. The server project testing method according to claim 3, characterized in that: The multiple intersection categories include the intersection of a server motherboard platform and a baseboard management controller code platform, the intersection of a baseboard management controller code platform and a basic input / output system code platform, the intersection of a server motherboard platform and a basic input / output system code platform, and the intersection of a server motherboard platform, a baseboard management controller code platform, and a basic input / output system code platform; Accordingly, the intersection processing is performed according to the codes corresponding to the types of the shared test platforms to obtain multiple intersection categories, including: An intersection process is performed based on the code corresponding to the server motherboard platform, the code corresponding to the baseboard management controller code platform, and the code corresponding to the basic input and output system code platform to obtain the intersection of the server motherboard platform and the baseboard management controller code platform, the intersection of the baseboard management controller code platform and the basic input and output system code platform, the intersection of the server motherboard platform and the basic input and output system code platform, and the intersection of the server motherboard platform, the baseboard management controller code platform, and the basic input and output system code platform.

6. The server project testing method according to claim 1, characterized in that: The intersection processing is performed according to the type of the shared test platform to obtain multiple intersection categories, including: The intersection processing is performed according to the type and preset level of the shared test platform until no intersection is found, thereby obtaining a plurality of intersection categories.

7. The server project testing method according to claim 1, characterized in that: The step of testing any target test item to obtain a corresponding target test result includes: Obtaining server component information in the test project; Determining corresponding server components according to the server component information; Performing a test process on each of the server components to obtain a test result of each of the server components; The target test result of the test item is determined according to the test results of each server component.

8. The server project testing method according to claim 7, characterized in that: The testing of each server component to obtain a test result of each server component includes: Obtaining multiple sub-test items corresponding to each server component; According to the multiple sub-test items, each server component is tested and processed to obtain a test result of each server component.

9. The server project testing method according to claim 8, characterized in that: The multiple sub-test items include one or more of the following: Performance test items, stress test items, stability test items, functional test items, location information identification items, and bandwidth identification items.

10. The server project testing method according to claim 1, characterized in that: Also includes: Get the server model of the server of the type; Searching for corresponding reference server information according to the server model; Obtaining a reference test result corresponding to the reference server information; The reference test result is determined as the test result of the server of the type.

11. The server project testing method according to claim 10, characterized in that: The obtaining of the reference test result corresponding to the reference server information includes: Determine each test platform in the corresponding reference server according to the reference server information; The software test results in each test platform are obtained, and each software test result is determined as the reference test result.

12. The server project testing method according to claim 1, characterized in that: The types of the shared test platform include one or more of the following: a server motherboard platform, a baseboard management controller code platform, and a basic input and output system code platform.

13. An electronic device, characterized in that: include: memory for storing computer programs; A processor, configured to implement the steps of the server project testing method according to any one of claims 1 to 12 when executing the computer program.

14. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, wherein when the computer program is executed by a processor, the steps of the server project testing method according to any one of claims 1 to 12 are implemented.

15. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the server project testing method according to any one of claims 1 to 12 are implemented.

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