Cell performance degradation processing method and device, electronic equipment and storage medium

Abstract

The invention provides a cell performance degradation processing method and device, electronic equipment and a storage medium, and belongs to the technical field of wireless communication networks, and the method comprises the steps: obtaining a preset cell association table; a plurality of frequent fault cells and adjacent cells associated with each frequent fault cell are recorded in the cell association table; after the performance of the cell is degraded, searching a frequently-occurring fault cell corresponding to the degraded cell in the cell association table; according to the out-of-service fault condition of the target node before the performance degradation of the degraded cell occurs and when the performance degradation occurs, judging whether the performance degradation reason of the degraded cell is the out-of-service fault of the target node; wherein the target node is a fault frequent occurrence cell or a base station corresponding to the fault frequent occurrence cell. According to the invention, after the performance degradation of the cell occurs, the reason of the performance degradation of the cell is further judged according to the out-of-service fault condition of the frequently-occurring fault cell or the base station associated with the degraded cell, the reason of the performance degradation of the cell does not need to be checked manually, and the checking efficiency of the performance degradation of the cell is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of wireless communication networks, and in particular to a method, device, electronic device and storage medium for processing cell performance degradation. Background Art

[0002] A city's wireless communication network typically includes multiple base stations, each of which has multiple cells. Performance degradation often occurs in these cells, and the cause of this degradation needs to be investigated.

[0003] Currently, when performance degradation occurs in a cell, the cause of the performance degradation is usually manually investigated, but the manual investigation method is inefficient. Summary of the Invention

[0004] The present invention provides a method, device, electronic device and storage medium for processing cell performance degradation, which are used to solve the technical problem of low efficiency in manually troubleshooting the causes of cell performance degradation in the prior art.

[0005] The present invention provides a method for processing cell performance degradation, comprising: Obtaining a preset cell association table; the cell association table records a plurality of fault-prone cells and neighboring cells associated with each of the fault-prone cells; After the performance of the cell degrades, searching the cell association table for the fault-prone cell corresponding to the degraded cell; Determining whether the cause of the performance degradation of the degraded cell is the out-of-service failure of the target node according to the out-of-service failure of the target node before and when the performance degradation occurs in the degraded cell; The target node is the cell where failures frequently occur or a base station corresponding to the cell where failures frequently occur.

[0006] According to a method for processing cell performance degradation provided by the present invention, judging whether the cause of the performance degradation of the degraded cell is a deservice failure of the target node before and when the performance degradation occurs in the degraded cell, includes: determining a performance degradation indicator of the degraded cell; Obtaining the number of outage failures of the target node in a first historical time period and the degradation amount of the performance degradation indicator from before the outage failure of the target node to when the outage failure occurs each time; Determining, based on each of the degradation amounts and the number of occurrences of the outage failure, a correlation between the performance degradation indicator and the frequently faulty cell; It is determined according to the correlation degree and the outage failure condition whether the cause of the performance degradation of the degraded cell is an outage failure of the target node.

[0007] According to a method for processing cell performance degradation provided by the present invention, determining the correlation between the performance degradation index and the frequently faulty cell based on the degradation amount and the number of occurrences of the out-of-service fault, includes: Counting the number of degradations of the performance degradation indicator within the first historical time period; the number of degradations is the number of times the degradation amount exceeds a degradation threshold; The ratio of the degradation times to the outage failure times is used as the correlation degree.

[0008] According to a method for processing cell performance degradation provided by the present invention, determining whether the cause of the performance degradation of the degraded cell is a deservice failure of the target node based on the correlation degree and the deservice failure condition includes: If the correlation degree is higher than a preset threshold, and the out-of-service failure condition is that the target node has an out-of-service failure both before and when the performance degradation occurs in the degraded cell, it is determined that the cause of the performance degradation of the degraded cell is the out-of-service failure of the target node.

[0009] According to a method for processing cell performance degradation provided by the present invention, before obtaining a preset cell association table, the method further includes: Obtaining outage failure data of each cell in a second historical time period, and screening a plurality of cells with frequent failures from each cell according to the outage failure data; Obtaining the number of network connection switching requests between the neighboring cells of each of the fault-prone cells and the corresponding fault-prone cells, and screening a plurality of target neighboring cells from the neighboring cells of each of the fault-prone cells according to the number of network connection switching requests; Obtain the correlation between each performance indicator of each target neighboring area and the corresponding fault-frequent cell. If the correlation corresponding to at least one performance indicator of the target neighboring area is higher than a preset threshold, write the target neighboring area into the cell association table and associate it with the corresponding fault-frequent cell.

[0010] According to a method for processing cell performance degradation provided by the present invention, the method of selecting a plurality of target neighboring cells from neighboring cells of each of the frequently faulty cells according to the number of network connection switching requests includes: sorting the number of network connection switching requests corresponding to each neighboring cell of the frequently faulty cell in descending order; The top N neighboring cells ranked by the number of network connection switching requests are used as the target neighboring cells, where N is a positive integer.

[0011] The present invention also provides a cell performance degradation processing device, comprising: An acquisition module is used to obtain a preset cell association table; the cell association table records a plurality of fault-prone cells and adjacent cells associated with each of the fault-prone cells; A search module, configured to search the cell association table for the fault-prone cell corresponding to the degraded cell after performance degradation occurs in the cell; a judgment module, configured to judge whether the cause of the performance degradation of the degraded cell is the out-of-service failure of the target node according to the out-of-service failure of the target node before and when the performance degradation occurs in the degraded cell; The target node is the cell where failures frequently occur or a base station corresponding to the cell where failures frequently occur.

[0012] The present invention also provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the method for processing cell performance degradation as described above is implemented.

[0013] The present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the method for processing cell performance degradation as described above is implemented.

[0014] The present invention also provides a computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the computer program implements any of the above methods for processing cell performance degradation.

[0015] The cell performance degradation processing method, device, electronic device and storage medium provided by the present invention first search for fault-prone cells that may cause performance degradation in the cell in a preset cell association table after performance degradation occurs in the cell, and then further judge whether the cause of the cell's performance degradation is a service failure of the corresponding fault-prone cell or base station based on the out-of-service failure of the fault-prone cell or the base station corresponding to the fault-prone cell before and when the cell performance degradation occurs. It can accurately determine whether the cause of the cell's performance degradation is a service failure of the corresponding fault-prone cell or base station, without the need for manual investigation of the cause of cell performance degradation, thereby improving the efficiency of investigating cell performance degradation. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the present invention or the prior art, a brief introduction is given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0017] Figure 1This is one of the flow charts of the method for processing cell performance degradation provided by the present invention.

[0018] Figure 2 This is the second flow chart of the method for processing cell performance degradation provided by the present invention.

[0019] Figure 3 It is a flow chart of step S3 provided by the present invention.

[0020] Figure 4 It is a structural diagram of the cell performance degradation processing device provided by the present invention.

[0021] Figure 5 It is a structural schematic diagram of the electronic device provided by the present invention. DETAILED DESCRIPTION

[0022] To make the objectives, technical solutions, and advantages of the present invention more clear, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the embodiments described are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0023] It should be noted that, in the description of the present invention, the terms "comprise," "include," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or apparatus comprising a list of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. Without further limitation, the phrase "comprises a..." does not preclude the presence of additional identical elements in the process, method, article, or apparatus comprising the elements. Terms such as "upper" and "lower" indicate positions or relationships based on those shown in the accompanying drawings and are intended solely to facilitate the description of the present invention and simplify the description. They are not intended to indicate or imply that the devices or elements referred to must have a specific orientation, be constructed, or operate in a specific orientation, and are therefore not to be construed as limitations on the present invention. Unless otherwise expressly specified or limited, the terms "mounted," "connected," and "connected" should be broadly construed, for example, to mean fixed, removable, or integral; mechanical or electrical; direct or indirect through an intermediary; or internal communication between two elements. For those skilled in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0024] The terms "first," "second," and so forth, used herein are used to distinguish similar objects, not to describe a specific order or precedence. It should be understood that such terms are interchangeable where appropriate, allowing embodiments of the present invention to be implemented in an order other than that illustrated or described herein. Furthermore, the terms "first," "second," and so forth generally distinguish objects of a single type, and do not limit the number of objects. For example, the first object may be one or more. Furthermore, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates an "or" relationship between the connected objects.

[0025] The following combination Figure 1-Figure 5 The present invention describes a method, device, electronic device, and storage medium for processing cell performance degradation.

[0026] like Figure 1 As shown, the method for processing cell performance degradation of the present invention includes steps S1 to S3.

[0027] Step S1: Obtain a preset cell association table; the cell association table records a plurality of fault-prone cells and the neighboring cells associated with each fault-prone cell.

[0028] It should be noted that each base station includes multiple cells. A cell itself may experience a service failure, or a base station may experience a service failure, causing all cells under the base station to experience a service failure.

[0029] In practice, the present invention has discovered that after some fault-prone cells or the base stations corresponding to these cells experience outages, performance degradation may occur in some neighboring cells of the fault-prone cells. Neighboring cells are cells adjacent to the fault-prone cells. Therefore, a cell association table is pre-established, which records multiple cells with faults due to specific reasons and the neighboring cells that may experience performance degradation after each of the fault-prone cells with specific reasons experience outages. Outages in fault-prone cells or base stations may cause performance degradation in the corresponding neighboring cells in the cell association table.

[0030] Step S2: After the performance of a cell degrades, the fault-prone cell corresponding to the degraded cell is searched in the cell association table.

[0031] A degraded cell is a cell experiencing performance degradation. Specifically, a cell's performance indicators typically include multiple indicators, such as wireless connection rate, wireless drop rate, handover success rate, 4G to 2G handover success rate, uplink voice packet loss rate, downlink voice packet loss rate, user connection reestablishment rate, voice drop rate, average wireless setup delay, uplink network utilization, downlink network utilization, and so on. When a cell experiences performance degradation, the cell's filter work order type alert can indicate the indicator of performance degradation among these indicators, i.e., the performance degradation indicator.

[0032] If a fault-prone cell corresponding to the degraded cell is found in the cell association table, it means that the performance degradation of the degraded cell is likely caused by a service failure of the corresponding fault-prone cell or base station, but further judgment is needed.

[0033] Of course, if the degraded cell is not recorded in the cell association table, it is impossible to further confirm whether the cause of the performance degradation of the degraded cell is related to the fault-frequent cell or base station, and the process ends directly.

[0034] Step S3: Determine whether the cause of the performance degradation of the degraded cell is a target node out-of-service failure based on the target node's out-of-service failure before and when the performance degradation occurs in the degraded cell; wherein the target node is a cell with frequent failures or a base station corresponding to the cell with frequent failures.

[0035] For example, the time period when the performance of the degraded cell degrades may be 8:10-9:30, which means that the cell experiences performance degradation in the time period of 8:10-9:30; the target node's out-of-service failure condition before the performance degradation of the degraded cell occurs may be the target node's out-of-service failure condition one hour before the performance degradation of the degraded cell occurs, for example, the out-of-service failure condition in the time period of 7:10-8:10.

[0036] Exemplarily, the outage failure conditions may include the target node experiencing an outage failure in both the time periods of 7:10-8:10 and 8:10-9:30, the target node experiencing an outage failure in 7:10-8:10 but not in 8:10-9:30, the target node experiencing no outage failure in 7:10-8:10 but experiencing an outage failure in 8:10-9:30, or the target node experiencing no outage failure in both the time periods of 7:10-8:10 and 8:10-9:30.

[0037] For the situation where a cell with frequent faults experiences a service outage, if the base station corresponding to the cell with frequent faults does not experience a service outage, it means that the cell with frequent faults itself experiences a service outage, and the target node is the cell with frequent faults; if the base station corresponding to the cell with frequent faults experiences a service outage, it means that the service outage of the base station causes the service outage of the cell with frequent faults, and the target node is the base station.

[0038] It is understandable that a decommissioning failure of the target node corresponding to a degraded cell may cause performance degradation in the degraded cell. If the cause of the degraded cell's performance degradation is a decommissioning failure of the corresponding target node, the decommissioning failure of the target node should occur before the degraded cell's performance degradation, and the decommissioning failure of the target node must still be ongoing when the degraded cell's performance degradation occurs. Therefore, if the target node experiences a decommissioning failure both before and during the degraded cell's performance degradation, it can be further confirmed that the cause of the degraded cell's performance degradation is a decommissioning failure of the target node.

[0039] Of course, if the outage failure situation is that the target node has an outage failure between 7:10-8:10 but does not have an outage failure between 8:10-9:30, the target node does not have an outage failure between 7:10-8:10 but has an outage failure between 8:10-9:30, or the target node has no outage failure between 7:10-8:10 and 8:10-9:30, it is impossible to further confirm whether the cause of the performance degradation of the degraded cell is related to the target node, and the process ends directly.

[0040] As can be seen from the above, after the performance degradation occurs in the cell, the present invention first searches the preset cell association table for the fault-prone cell that may cause the performance degradation of the cell, and then further judges whether the cause of the performance degradation of the cell is the deservice failure of the corresponding fault-prone cell or base station based on the deservice failure of the fault-prone cell or the base station corresponding to the fault-prone cell before and when the performance degradation occurs in the cell. It can basically accurately determine whether the cause of the performance degradation of the cell is the deservice failure of the corresponding fault-prone cell or base station, without the need for manual investigation of the cause of the cell performance degradation, thereby improving the efficiency of investigating the cell performance degradation.

[0041] In order to pre-establish the cell association table, such as Figure 2 As shown, before step S1, the method for processing cell performance degradation of the present invention may further include steps S4 to S6.

[0042] Step S4: Obtain out-of-service fault data of each cell in the second historical time period, and select a plurality of cells with frequent faults from each cell based on the out-of-service fault data.

[0043] Exemplarily, the second historical time period can be the last 6 months. After obtaining the outage fault data for the last 6 months, it is necessary to eliminate the outage faults whose duration in a single hour is less than 45 minutes. First determine whether the total duration of the outage fault is greater than 45 minutes, and then determine whether the duration of the outage fault in a single hour is greater than 45 minutes. For example, the start time of the outage fault is 9:40, the end time of the outage fault is 10:30, and the total duration of the outage fault is 50 minutes, which meets the condition of being greater than 45 minutes. However, the duration of the outage fault at 9 o'clock is 20 minutes, and the duration of the outage fault at 10 o'clock is 30 minutes, both of which are less than 45 minutes, so this outage fault is eliminated. Furthermore, it is also necessary to eliminate the outage faults whose hourly granularity downlink traffic of the cell is less than 100M 1 hour before the outage.

[0044] After eliminating outage failures, each outage failure time period can be split into a 1-hour + 2-hour format. For example, if the outage failure starts at 13:46:00 and ends at 16:21:00, the time period is split into 13:46:00-14:00:00, 14:00:00-16:00:00, and 16:00:00-16:21:00. The outage failure durations are 14 minutes, 120 minutes, and 21 minutes, respectively. The outage failure time periods are 13:00:00-14:00:00, 14:00:00-16:00:00, and 16:00:00-17:00:00, respectively.

[0045] The final outage failure data can be shown in Tables 1 to 3.

[0046] Table 1

[0047] Table 2

[0048] Table 3

[0049] The reasons for the service withdrawal failure of the present invention include: network element connection interruption, eNodeB service withdrawal alarm, 4G base station service withdrawal alarm, base station service withdrawal or disconnection, connection failure, service unavailable, equipment deactivation, cell unavailable alarm, complaint-cell unavailable alarm, complaint-cell unavailable four categories, complaint-cell unavailable four categories alarm, cell unavailable four categories, cell unavailable alarm three categories, complaint-network element connection interruption, network element connection interruption four categories, complaint-network element connection interruption alarm, complaint-network element connection interruption four categories, complaint-network element connection interruption three categories, network element connection interruption fault alarm, network element connection interruption three categories, network element connection interruption one category, complaint-network element connection interruption two categories, AC power failure, etc.

[0050] In step S4, a plurality of cells with frequent faults are screened out from each cell according to the out-of-service fault data, which may further include: If a cell meets any of the following conditions, it will be considered a fault-prone cell: Number of server shutdown failures in the last 6 months 96. Probability of the most common reasons for service withdrawal failures in the last 6 months 90% and the number of service outages in the last month 10; Number of server shutdown failures in the last three months 30. Probability of the most common reasons for service withdrawal in the last three months 90% and the number of service outages in the last month 10; Number of server shutdown failures in the last 6 months 96. Number of server shutdown failures in the last month 10. The probability of service failure occurring during the most service withdrawal period in the last 6 months 55% and the probability of the most frequent service withdrawal failures occurring during the most service withdrawal periods in the last 6 months 90%; Number of server shutdown failures in the last three months 30. Number of server shutdown failures in the last month 10. The probability of service failure occurring during the most service withdrawal period in the last three months 55% and the probability of the most frequent service withdrawal failures occurring during the most service withdrawal periods in the last three months 90%.

[0051] Step S5: obtaining the number of network connection switching requests between the neighboring cells of each fault-prone cell and the corresponding fault-prone cell, and screening multiple target neighboring cells from the neighboring cells of each fault-prone cell according to the number of network connection switching requests.

[0052] The more network connection handover requests there are between the neighboring cell and the corresponding fault-prone cell, the stronger the correlation between the neighboring cell and the corresponding fault-prone cell. The target neighboring cell is the neighboring cell with a strong correlation with the corresponding fault-prone cell.

[0053] Specifically, the top N neighboring cells of each fault-prone cell in terms of the number of network connection handover requests can be used as target neighboring cells, where N is a positive integer. That is, in step S5, selecting multiple target neighboring cells from the neighboring cells of each fault-prone cell based on the number of network connection handover requests can further include: The number of network connection switching requests corresponding to each neighboring cell of the cell with frequent failures is sorted in descending order; The top N neighboring cells with the highest number of network connection switching requests are selected as target neighboring cells.

[0054] For example, N can be 50, that is, 50 target neighboring cells of each fault-prone cell are screened out. Of course, if there are fewer than 50 neighboring cells with which the fault-prone cell has a network connection handover, all neighboring cells with which the fault-prone cell has a network connection handover can be used as target neighboring cells.

[0055] Step S6: Obtain the correlation between each performance indicator of each target neighboring cell and the corresponding fault-prone cell. If the correlation corresponding to at least one performance indicator of the target neighboring cell is higher than a preset threshold, write the target neighboring cell into the cell association table and associate it with the corresponding fault-prone cell.

[0056] In step S6, obtaining the correlation between each performance indicator of each target neighboring cell and the corresponding fault-prone cell may further include: Obtain the number of outage failures in cells with frequent faults and the degradation of performance indicators from before to when each outage failure occurs in cells with frequent faults; The correlation between the performance degradation indicator and the fault-prone cell is determined based on the degradation amount of each performance indicator and the number of outage failures in the fault-prone cell.

[0057] Illustratively, the degradation amount of the performance indicator can be the degradation amount from one hour before the outage of the fault-prone cell to the time when the outage occurs. For example, the degradation amount of the wireless connection rate = the wireless connection rate of the target neighboring cell one hour before the outage occurs in the fault-prone cell - the wireless connection rate of the target neighboring cell when the outage occurs in the fault-prone cell. The degradation amount of the wireless drop rate = the wireless drop rate of the target neighboring cell when the outage occurs in the fault-prone cell - the wireless drop rate of the target neighboring cell one hour before the outage occurs in the fault-prone cell.

[0058] Determining the correlation between the performance degradation indicator and the fault-prone cell based on the degradation amount of each performance indicator and the number of outage failures in the fault-prone cell may further include: Count the number of degradations of the performance indicator; the number of degradations is the number of times the degradation amount exceeds the degradation threshold; The ratio of the number of degradations of the performance indicator to the number of outage failures in the fault-prone cell is used as the correlation between the performance indicator and the fault-prone cell.

[0059] For example, the degradation thresholds corresponding to the various performance indicators may be as shown in Table 4.

[0060] Table 4

[0061] For example, a fault-prone cell has experienced six outages in the past six months. Before and after the three outages, the degradation of the wireless connection rate of the target neighboring cell of the fault-prone cell is higher than 2%. Then, the number of times the wireless connection rate deteriorates is three times, and the correlation between the wireless connection rate of the target neighboring cell and the fault-prone cell is 50%.

[0062] Exemplarily, the preset threshold can be 70%. For example, if the correlation between the wireless connection rate of the target neighboring area a of the fault-frequent cell A and the fault-frequent cell A is 80%, the target neighboring area a is written into the cell association table and associated with the fault-frequent cell A; if the correlation between the wireless disconnection rate of the target neighboring area b of the fault-frequent cell B and the fault-frequent cell B is 80%, the target neighboring area b is written into the cell association table and associated with the fault-frequent cell B.

[0063] It is understandable that the correlation between the performance index of the target neighboring cell and the fault-prone cell actually represents the probability that the performance index of the target neighboring cell will experience more serious performance degradation due to the out-of-service failure of the fault-prone cell.

[0064] When establishing a cell association table, as long as the correlation between at least one performance indicator of the target cell and the fault-prone cell is higher than a preset threshold, the target cell will be written into the cell association table. For example, if the correlation between the wireless connection rate of the target cell a and the fault-prone cell A is higher than the preset threshold, and the correlation between the wireless drop rate and the fault-prone cell A is lower than the preset threshold, the target cell a will be written into the cell association table and associated with the fault-prone cell A, indicating that the out-of-service failure of the fault-prone cell A is likely to cause the wireless connection rate to deteriorate, but is unlikely to cause the wireless drop rate to deteriorate. In the above example, if the cause of the performance degradation of the degraded cell is determined only based on the out-of-service failure of the target node before and when the performance degradation occurs in the degraded cell, when the performance degradation indicator of the degraded cell is the wireless drop rate, the judgment result may be that the cause of the performance degradation of the degraded cell is the out-of-service failure of the fault-frequent cell A or the corresponding base station. Since the correlation between the wireless drop rate of the target cell a and the fault-frequent cell A is lower than the preset threshold when the cell association table is established, it indicates that the out-of-service failure of the fault-frequent cell A or the corresponding base station is unlikely to cause the degradation of the wireless drop rate. When the wireless drop rate performance is degraded, it is obviously not accurate to judge that the cause of the performance degradation of the degraded cell is the out-of-service failure of the fault-frequent cell A or the corresponding base station.

[0065] In order to improve the accuracy of determining the cause of cell performance degradation, such as Figure 3 As shown, step S3 of the present invention may further include: Step S31, determining the performance degradation index of the degraded cell; Step S32: Obtain the number of outage failures of the target node in the first historical time period and the degradation amount of the performance degradation indicator from before the outage failure of the target node to when the outage failure occurs each time; Step S33: determining the correlation between the performance degradation indicator and the fault-frequent cell based on the degradation amount of each performance degradation indicator and the number of outage failures of the target node; Step S34: Determine whether the cause of the performance degradation of the degraded cell is an out-of-service failure of the target node based on the correlation between the performance degradation index and the fault-frequent cell and the out-of-service failure condition.

[0066] For example, the first historical time period may be the last six months. The calculation methods for the degradation amount of the performance degradation indicator and the degradation amount of the performance indicator are the same, and the calculation methods for the correlation between the performance degradation indicator and the fault-prone cell and the correlation between the performance indicator and the fault-prone cell are the same, and are not further described here.

[0067] In this way, when determining the cause of performance degradation of a degraded cell, the correlation between the performance degradation index and the cell with frequent faults is taken into consideration, which is conducive to improving the accuracy of the determination result.

[0068] Based on the calculation method for the correlation between the performance indicators of the target neighboring cells and the cells with frequent failures described above, the correlation between the performance degradation indicators and the cells with frequent failures is determined based on the degradation amounts of the performance degradation indicators and the number of outage failures of the target node. This may further include: Counting the number of times the performance degradation indicator has degraded in the first historical time period; the number of times the degradation amount is higher than the degradation threshold; The ratio of the number of degradations of the performance degradation indicator to the number of out-of-service failures of the target node is used as the correlation between the performance degradation indicator and the fault-frequent cell.

[0069] In this way, the correlation between the performance degradation index and the fault-prone cells can be calculated based on historical data, that is, the probability that the performance degradation index will show more serious performance degradation due to out-of-service failures in the fault-prone cells.

[0070] Wherein, judging whether the cause of the performance degradation of the degraded cell is an out-of-service failure of the target node based on the correlation between the performance degradation indicator and the fault-frequent cell and the out-of-service failure situation may further include: If the correlation between the performance degradation index and the cell with frequent faults is higher than the preset threshold, and the out-of-service failure situation is that the target node has an out-of-service failure both before and when the performance degradation occurs in the degraded cell, then it is determined that the cause of the performance degradation of the degraded cell is the out-of-service failure of the target node.

[0071] The correlation between the performance degradation index and the cell with frequent faults is higher than the preset threshold, which means that the out-of-service failure of the target node is likely to cause performance degradation of the performance degradation index of the degraded cell. Conversely, the cause of the performance degradation of the degraded cell is likely to be the out-of-service failure of the target node. The out-of-service failure situation is that the target node has an out-of-service failure both before and when the performance degradation occurs in the degraded cell, which means that the performance degradation of the degraded cell occurs synchronously after the out-of-service failure of the target node, further proving that the cause of the performance degradation of the degraded cell is very likely to be the out-of-service failure of the target node. It can be determined that the cause of the performance degradation of the degraded cell is the out-of-service failure of the target node.

[0072] Of course, if the correlation between the performance degradation index and the cell with frequent faults is lower than the preset threshold, or the out-of-service failure situation is not that the target node has an out-of-service failure before and when the performance degradation occurs in the degraded cell, it is impossible to further confirm whether the cause of the performance degradation in the degraded cell is related to the target node, and the process ends directly.

[0073] In this way, the cause of the performance degradation of the degraded cell can be further confirmed based on the correlation between the performance degradation index of the degraded cell and the frequently faulty cell and the outage fault situation.

[0074] like Figure 4 As shown, the cell performance degradation processing device provided by the present invention includes: An acquisition module is used to obtain a preset cell association table; the cell association table records multiple fault-prone cells and the neighboring cells associated with each fault-prone cell; A search module is used to search for a frequently faulty cell corresponding to the degraded cell in the cell association table after the cell performance degrades; A judgment module is used to judge whether the cause of the performance degradation of the degraded cell is the out-of-service failure of the target node based on the out-of-service failure of the target node before and when the performance degradation occurs in the degraded cell; The target node is a cell where failures frequently occur or a base station corresponding to the cell where failures frequently occur.

[0075] It should be noted that the cell performance degradation processing device provided by the present invention can execute the cell performance degradation processing method of any of the above embodiments during specific operation, which will not be described in detail in this embodiment.

[0076] The judgment module can be used specifically for: Determining performance degradation indicators of degraded cells; Obtain the number of outage failures of the target node in the first historical time period and the degradation amount of the performance degradation indicator from before the outage failure of each target node to when the outage failure occurs; Determine the correlation between performance degradation indicators and cells with frequent failures based on the degradation amount and the number of outages. According to the correlation degree and the outage fault situation, it is determined whether the performance degradation of the degraded cell is caused by the outage fault of the target node.

[0077] The judgment module can also be used to: Counting the number of times the performance degradation indicator has degraded in the first historical time period; the number of times the degradation amount is higher than the degradation threshold; The ratio of the number of degradations to the number of outage failures is used as the correlation degree.

[0078] The judgment module can also be used to: If the correlation degree is higher than the preset threshold, and the outage failure situation is that the target node has an outage failure both before and when the performance degradation occurs in the degraded cell, it is determined that the cause of the performance degradation of the degraded cell is the outage failure of the target node.

[0079] The cell performance degradation processing device of the present invention may further include: A screening module is used to obtain outage fault data of each cell in a second historical time period, and screen out a plurality of cells with frequent faults from each cell based on the outage fault data; and for obtaining the number of network connection switching requests between the neighboring cells of each fault-frequent cell and the corresponding fault-frequent cell, and screening multiple target neighboring cells from the neighboring cells of each fault-frequent cell according to the number of network connection switching requests; The association module is used to obtain the correlation between each performance indicator of each target neighboring cell and the corresponding fault-prone cell. If the correlation corresponding to at least one performance indicator of the target neighboring cell is higher than a preset threshold, the target neighboring cell is written into the cell association table and associated with the corresponding fault-prone cell.

[0080] The screening module can be used specifically for: The number of network connection switching requests corresponding to each neighboring cell of the cell with frequent failures is sorted in descending order; The top N neighboring cells with the highest number of network connection switching requests are selected as target neighboring cells, where N is a positive integer.

[0081] Figure 5 Schematic diagram of the structure of the electronic device provided by the present invention, such as Figure 5As shown, the electronic device may include: a processor, a communications interface, a memory, and a communications bus, wherein the processor, the communications interface, and the memory communicate with each other via the communications bus. The processor may invoke logic instructions in the memory to execute a method for processing cell performance degradation, the method comprising: obtaining a preset cell association table; the cell association table records multiple fault-prone cells and neighboring cells associated with each fault-prone cell; after a cell experiences performance degradation, searching the cell association table for a fault-prone cell corresponding to the degraded cell; and determining whether the cause of the degraded cell's performance degradation is a target node out-of-service failure based on the target node's out-of-service failure before and during the degraded cell's performance degradation; wherein the target node is the fault-prone cell or the base station corresponding to the fault-prone cell.

[0082] Furthermore, the logical instructions in the aforementioned memory can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the portion that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present invention. The aforementioned storage media include various media capable of storing program code, such as USB flash drives, mobile hard drives, read-only memories (ROMs), random access memories (RAMs), magnetic disks, or optical disks.

[0083] On the other hand, the present invention also provides a computer program product, which includes a computer program stored on a non-transitory computer-readable storage medium, and the computer program includes program instructions. When the program instructions are executed by a computer, the computer can execute the cell performance degradation processing method provided in the above-mentioned embodiments, the method including: obtaining a preset cell association table; the cell association table records multiple fault-frequent cells and neighboring cells associated with each fault-frequent cell; after the cell performance deteriorates, searching the cell association table for the fault-frequent cell corresponding to the degraded cell; based on the decommissioning failure of the target node before and when the performance degradation occurs in the degraded cell, judging whether the cause of the performance degradation of the degraded cell is the decommissioning failure of the target node; wherein the target node is the fault-frequent cell or the base station corresponding to the fault-frequent cell.

[0084] On the other hand, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, is implemented to execute the cell performance degradation processing method provided in the above-mentioned embodiments, the method comprising: obtaining a preset cell association table; the cell association table records a plurality of fault-frequent cells and neighboring cells associated with each fault-frequent cell; after the cell performance deteriorates, searching the cell association table for the fault-frequent cell corresponding to the degraded cell; judging whether the cause of the performance degradation of the degraded cell is a deservice failure of the target node based on the decommissioning failure of the target node before and when the performance degradation occurs in the degraded cell; wherein the target node is the fault-frequent cell or the base station corresponding to the fault-frequent cell.

[0085] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, i.e., they may be located in one location or distributed across multiple network units. Some or all of the modules may be selected based on actual needs to achieve the objectives of the present embodiment. Persons of ordinary skill in the art will be able to understand and implement the present invention without inventive effort.

[0086] Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented using software plus a necessary general-purpose hardware platform, or of course, hardware. Based on this understanding, the essence of the above technical solution, or the portion that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a magnetic disk, or an optical disk, and includes a number of instructions for causing a computer device (such as a personal computer, server, or network device) to execute the methods described in each embodiment or certain portions of the embodiments.

[0087] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A method for processing cell performance degradation, characterized in that: include: Obtaining a preset cell association table; The cell association table records a plurality of fault-prone cells and adjacent cells associated with each of the fault-prone cells; After the performance of the cell degrades, searching the cell association table for the fault-prone cell corresponding to the degraded cell; Determining whether the cause of the performance degradation of the degraded cell is the out-of-service failure of the target node according to the out-of-service failure of the target node before and when the performance degradation occurs in the degraded cell; The target node is the cell where failures frequently occur or a base station corresponding to the cell where failures frequently occur.

2. The method for processing cell performance degradation according to claim 1, wherein: The determining, based on the out-of-service failure of the target node before and when the performance degradation occurs in the degraded cell, whether the cause of the performance degradation of the degraded cell is an out-of-service failure of the target node, includes: determining a performance degradation indicator of the degraded cell; Obtaining the number of outage failures of the target node within a first historical time period and the degradation amount of the performance degradation indicator from before the outage failure of the target node to when the outage failure occurs each time; Determining, based on each of the degradation amounts and the number of occurrences of the outage failure, a correlation between the performance degradation indicator and the frequently faulty cell; It is determined according to the correlation degree and the outage failure condition whether the cause of the performance degradation of the degraded cell is an outage failure of the target node.

3. The method for processing cell performance degradation according to claim 2, wherein: The determining, based on each of the degradation amounts and the number of occurrences of the out-of-service failures, a correlation between the performance degradation indicator and the frequently-failed cell includes: Counting the number of degradations of the performance degradation indicator within the first historical time period; the number of degradations is the number of times the degradation amount exceeds a degradation threshold; The ratio of the degradation times to the outage failure times is used as the correlation degree.

4. The method for processing cell performance degradation according to claim 2, wherein: The determining, based on the correlation degree and the out-of-service fault condition, whether the cause of the performance degradation of the degraded cell is an out-of-service fault of the target node includes: If the correlation degree is higher than a preset threshold, and the out-of-service failure condition is that the target node has an out-of-service failure both before and when the performance degradation occurs in the degraded cell, it is determined that the cause of the performance degradation of the degraded cell is the out-of-service failure of the target node.

5. The method for processing cell performance degradation according to any one of claims 2 to 4, characterized in that: Before obtaining the preset cell association table, the method further includes: Obtaining outage failure data of each cell in a second historical time period, and screening a plurality of cells with frequent failures from each cell according to the outage failure data; Obtaining the number of network connection switching requests between the neighboring cells of each of the fault-prone cells and the corresponding fault-prone cells, and screening a plurality of target neighboring cells from the neighboring cells of each of the fault-prone cells according to the number of network connection switching requests; Obtain the correlation between each performance indicator of each target neighboring area and the corresponding fault-frequent cell. If the correlation corresponding to at least one performance indicator of the target neighboring area is higher than a preset threshold, write the target neighboring area into the cell association table and associate it with the corresponding fault-frequent cell.

6. The method for processing cell performance degradation according to claim 5, characterized in that: The selecting a plurality of target neighboring cells from the neighboring cells of each of the frequently faulty cells according to the number of network connection switching requests includes: sorting the number of network connection switching requests corresponding to each neighboring cell of the frequently faulty cell in descending order; The top N neighboring cells ranked by the number of network connection switching requests are used as the target neighboring cells, where N is a positive integer.

7. A cell performance degradation processing device, characterized in that: include: An acquisition module, used to obtain a preset cell association table; The cell association table records a plurality of fault-prone cells and adjacent cells associated with each of the fault-prone cells; A search module, configured to search the cell association table for the fault-prone cell corresponding to the degraded cell after performance degradation occurs in the cell; a judgment module, configured to judge whether the cause of the performance degradation of the degraded cell is the out-of-service failure of the target node according to the out-of-service failure of the target node before and when the performance degradation occurs in the degraded cell; The target node is the cell where failures frequently occur or a base station corresponding to the cell where failures frequently occur.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, the method for processing cell performance degradation according to any one of claims 1 to 6 is implemented.

9. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method for processing cell performance degradation according to any one of claims 1 to 6 is implemented.

10. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the method for processing cell performance degradation according to any one of claims 1 to 6 is implemented.

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