Test fixture and test method

Abstract

The invention discloses a test fixture and a test method, and relates to the technical field of server testing, the test fixture comprises a first interface module, a processing module, a storage module and an input and output module; the first interface module is used for providing an interface with a to-be-detected mainboard and acquiring a running log generated by the to-be-detected mainboard; the storage module is used for backing up a running log generated by the mainboard to be detected; the input and output module is used for receiving a calling instruction sent by a user; the processing module is used for obtaining the running log from the storage module based on the calling instruction and sending the running log to the input and output module; the input and output module is further used for outputting the running log. According to the method, the storage module is used for backing up the running log of the mainboard to be detected, and the input and output module is used for outputting the running log, so that a user can timely and completely collect the log, the problem of slow fault positioning progress caused by untimely and incomplete log collection is solved, and related personnel can conveniently and timely analyze a fault generation reason.

Description

Technical Field

[0001] The present application relates to the field of server testing technology, and in particular to a testing fixture and a testing method. Background Art

[0002] Peripherals with Open Core Protocol (OCP) interfaces, such as network cards, host bus adapters (HBAs), and host channel adapters (HCAs), are key external devices in current servers and storage systems. These interfaces support hot-swappability, allowing faulty or problematic cards to be removed and replaced while the system is operating normally, greatly facilitating system maintenance and upgrades.

[0003] However, due to the wide variety of OCP interface peripherals used and the high probability of problems, R&D personnel need to collect logs on-site to locate the problem. When a problem occurs on-site, a technician typically remotely guides the customer in collecting logs, which are then fed back to the technician for analysis. Because customers are unfamiliar with the product, remote log collection can lead to misunderstandings and communication. Consequently, customers often collect incomplete logs or the wrong log types. This can lead to missed critical logs, incorrect problem analysis, or an inability to reproduce on-site problems, ultimately slowing down fault location. Furthermore, some on-site problems are difficult to reproduce after the fact, making it particularly important to obtain logs promptly after an on-site equipment failure.

[0004] In summary, a test fixture that can overcome the above defects is in urgent need of appearance. Summary of the Invention

[0005] The present application provides a test fixture and a test method to at least solve the problem of slow fault location caused by untimely and incomplete server log collection in the related art.

[0006] The present application provides a test fixture, comprising: a first interface module, a second interface module, a current acquisition module, a voltage acquisition module, a processing module, a storage module, and an input / output module; the processing module is communicatively connected to the first interface module, the storage module, and the input / output module, respectively; the storage module is communicatively connected to the first interface module; the current acquisition module is respectively connected to the first interface module and the processing module; and the voltage acquisition module is respectively connected to the first interface module and the processing module; The first interface module is connected to the mainboard to be detected, and is used to provide an interface with the mainboard to be detected and obtain the operation log generated by the mainboard to be detected; The second interface module is connected to the peripheral device to be detected and is in communication with the first interface module, and is used to provide an interface with the peripheral device to be detected, and together with the first interface module, constitute a communication link between the peripheral device to be detected and the mainboard to be detected; The current acquisition module is used to acquire the current value of the preset pin in the first interface module; The voltage acquisition module is used to acquire the voltage value of the preset pin; The storage module is used to back up the operation log generated by the motherboard to be detected, and to store the current value and the voltage value; The input and output module is used to receive a call instruction issued by a user and send the call instruction to the processing module; The processing module is configured to obtain an operation log from the storage module based on the call instruction, send the operation log to the input / output module, obtain the current value and the voltage value, and obtain a power consumption test result of the peripheral device to be detected according to the current value and the voltage value; The input and output module is further configured to output the operation log and the power consumption test result.

[0007] The present application also provides a testing method, which is applied to any of the above-mentioned test fixtures, and the testing method includes: Backing up the operation log generated by the mainboard to be tested after the mainboard to be tested is powered on; Receive the call instruction issued by the user; The operation log is obtained in response to the calling instruction, and the operation log is output.

[0008] The present application also provides an electronic device, comprising: a memory for storing a computer program; and a processor for implementing the steps of any one of the above-mentioned testing methods when executing the computer program.

[0009] The present application also provides a computer-readable storage medium, in which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above-mentioned testing methods are implemented.

[0010] The present application also provides a computer program product, including a computer program, which implements the steps of any of the above-mentioned testing methods when executed by a processor.

[0011] Through this application, since the storage module can back up the operation log generated by the mainboard to be tested, and can send the operation log to the user device through the input and output module, the user can collect the log in a timely and complete manner, solving the problem of slow fault location caused by untimely and incomplete log collection, making it convenient for relevant personnel to analyze the cause of the fault in a timely manner, locate the problem, and improve the testing and maintenance efficiency of the equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] In order to more clearly illustrate the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0013] Figure 1 A schematic diagram of the structure of a test fixture provided in an embodiment of the present application; Figure 2 A schematic diagram of the position of another test fixture provided in an embodiment of the present application; Figure 3 A schematic diagram of the structure of another test fixture provided in an embodiment of the present application; Figure 4 A flow chart of a testing method provided in an embodiment of the present application; Figure 5 A flow chart of another testing method provided in an embodiment of the present application; Figure 6 A flow chart of another testing method provided in an embodiment of the present application; Figure 7 A flowchart of another testing method provided in an embodiment of the present application. DETAILED DESCRIPTION

[0014] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0015] It should be noted that, in the description of this application, the terms "comprises," "includes," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. The terms "first," "second," etc., in this application are used to distinguish similar objects, and are not used to describe a particular order or sequence.

[0016] In order to enable those skilled in the art to better understand the present application, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0017] In conjunction with the specific application environment architecture or specific hardware architecture on which the execution of the test method depends, the specific application environment architecture or specific hardware architecture is described here.

[0018] In order to solve the problem of slow fault location caused by untimely and incomplete server log collection in related technologies, this application proposes a test fixture and a test method. The application is further described in detail below with reference to the accompanying drawings.

[0019] First, refer to Figure 1 A test fixture 100 provided in an embodiment of the present application is described.

[0020] like Figure 1 As shown, the test fixture 100 in the present application includes: a first interface module 110, a processing module 120, a storage module 130, and an input-output module 140; the processing module 120 is respectively communicated with the first interface module 110, the storage module 130, and the input-output module 140, and the storage module is communicated with the first interface module.

[0021] The first interface module 110 is used to connect to the mainboard to be detected, to provide an interface with the mainboard to be detected and to obtain the operation log generated by the mainboard to be detected.

[0022] Storage module 130 is used to back up the operation logs generated by the motherboard under test. Specifically, storage module 130 can use non-volatile memory, such as Electrically Erasable Programmable Read-Only Memory (EEPROM), a hard drive, or flash memory. Using non-volatile memory ensures that data is not lost after a system power outage.

[0023] The input / output module 140 is used to receive user-issued call instructions and send the call instructions to the processing module. The input / output module 140 is also used to output the operation log. Specifically, the input / output module includes a communication module and / or a universal serial interface module. For example, the communication module can be a wireless communication module that supports the Wireless Fidelity (WIFI) protocol or the Bluetooth protocol, or it can be a wired communication module that can provide an Ethernet port. The universal serial interface includes, but is not limited to, a Universal Serial Bus (USB) interface, an RS-232 interface, and the like.

[0024] The processing module 120 is used to retrieve the operation log from the storage module based on the call instruction and send the operation log to the input and output module. Specifically, the processing module 120 can be a microcontroller unit (MCU), a central processing unit (CPU), a digital signal processor (DSP), a single-chip microcomputer, an embedded device, etc.

[0025] The test fixture 100 may further include a second interface module 150. The second interface module 150 is connected to the peripheral device to be tested and is in communication with the first interface module to provide an interface with the peripheral device to be tested and together with the first interface module constitute a communication link between the peripheral device to be tested and the motherboard to be tested.

[0026] Specifically, the peripheral device to be tested can be hardware that supports the Open Core Protocol (OCP), such as a network card, host bus adapter (HBA), or high-performance communication card (HCA). OCP is an efficient, bus-independent, configurable, and highly scalable interface protocol primarily used for on-chip subsystem communication, ensuring efficient system operation and flexible expansion. Accordingly, the interface of the peripheral device to be tested can be a PCIe interface or a U.2 interface.

[0027] When the peripheral device to be detected is a peripheral device supporting OCP, the first interface module 110 and the second interface module 150 include a PCIe interface component or a U.2 interface component.

[0028] The peripheral device to be detected may also be a solid state drive (SSD) or a non-volatile memory express (NVME). Accordingly, the first interface module 110 and the second interface module 150 include a PCIe interface component, an M.2 interface component, or a U.2 interface component.

[0029] The interfaces between the first interface module 110 and the motherboard to be tested, and between the second interface module 150 and the peripheral device to be tested, form complementary physical interfaces and signal transmission coupling units. For example, when the motherboard to be tested has a slot interface, the interface component of the first interface module 110 utilizes a gold finger, the interface component of the second interface module 150 utilizes a slot, and the interface of the peripheral device to be tested utilizes a gold finger. The gold finger of the first interface module 110 and the conductive spring in the slot of the motherboard to be tested, and the conductive spring in the slot of the second interface module 150 and the gold finger outside the target, form a rigid plug-in structure. Pre-set guide positioning grooves (or foolproof design) ensure precise docking along a specific axis, meeting relevant specifications for insertion and removal force, vibration resistance, and mechanical life (e.g., number of insertions and removal cycles). Simultaneously, the conductive contacts of the gold finger and the corresponding contacts in the slot form a one-to-one electrical pathway, enabling bidirectional transmission of signals (including data, clock, and control signals) and power.

[0030] A one-to-one mapping electrical path is also formed between the gold finger of the first interface module 110 and the conductive spring in the slot of the second interface module 150, realizing bidirectional transmission of signals (including data, clock, and control signals) and power. The two together constitute the physical layer connection between the motherboard to be tested and the peripheral to be tested.

[0031] The test fixture of the present application uses a storage module to timely back up the operation log generated by the motherboard to be tested, and sends it to the user device through the input and output module, so that relevant personnel can collect customer on-site fault problem logs in a timely and complete manner, making it convenient for relevant personnel to timely analyze the cause of the fault and locate the problem.

[0032] The test fixture of the present application also includes a current acquisition module and a voltage acquisition module; the current acquisition module is connected to the first interface module and the processing module respectively, and the voltage acquisition module is connected to the first interface module and the processing module respectively.

[0033] The current acquisition module is used to acquire the current value of a preset pin in the first interface module, and the voltage acquisition module is used to acquire the voltage value of the preset pin. Accordingly, the storage module is also used to store the current and voltage values; the processing module is also used to obtain the current and voltage values ​​and, based on the current and voltage values, to obtain a power consumption test result of the peripheral device to be tested; and the input / output module is used to output the power consumption test result.

[0034] The preset pins are selected based on the pin definitions of the interface components within the interface module. Specifically, they are the pins responsible for power supply (including the main power pin, auxiliary power pin, and ground pin). These pins are the physical carriers for transmitting power signals from the power supply to the load. Therefore, the current and voltage values ​​collected directly reflect the power supply status of the interface module and the operating characteristics of the peripheral device.

[0035] The current acquisition module acquires the current value of the peripheral device to be tested when it is in operation by acquiring the current value of the preset pin in the first interface module, and the voltage acquisition module acquires the voltage value of the peripheral device to be tested when it is in operation by acquiring the voltage value of the preset pin. The power consumption test result finally obtained may include instantaneous power consumption and / or total power consumption within the target time. Here, the current acquisition module and the voltage acquisition module can be implemented using existing voltage acquisition circuits and current acquisition circuits. For example, the voltage acquisition circuit may include but is not limited to a signal input circuit that receives the original voltage signal, a signal conditioning circuit that processes the original signal to meet the input requirements of the subsequent circuit, an analog-to-digital conversion circuit that converts the conditioned analog voltage signal into a digital signal for processing by the processing module, etc. Therefore, the structures of the current acquisition module and the voltage acquisition module will not be described in detail.

[0036] Specifically, the current acquisition module acquires the current signal of the peripheral device to be detected, and the voltage acquisition module acquires the voltage signal of the peripheral device to be detected. The acquired voltage and current signals are converted into analog-to-digital signals, that is, the analog signals of current and voltage are converted into digital signals of 0 or 1, and input into the processing module; the processing module obtains the instantaneous power consumption through product processing in order to determine whether the limit power consumption exceeds the standard; the total power consumption within the target time is obtained through integration processing in order to draw a real-time power consumption curve.

[0037] It can be seen that the test fixture of the present application can realize the collection of peripheral power consumption, so that relevant personnel can more accurately evaluate the power consumption of the entire machine and the power consumption design of the computer room construction is more precise.

[0038] In some embodiments of the present application, the test fixture further includes a power module, which is detachably connected to the test fixture; the power module is used to supply power to the motherboard to be tested and the test fixture when a power supply failure occurs on the motherboard to be tested.

[0039] The test fixture disclosed in this embodiment has a power module with a modular and detachable design, which can achieve physical connection and power transmission with the test fixture through a standard interface, such as a USB interface, and is intended to provide redundant power supply guarantee for fault diagnosis and testing of the motherboard to be tested.

[0040] Specifically, the power module is an independent portable unit that can integrate a lithium battery pack, a power control circuit, and a USB interface circuit.

[0041] The test fixture is equipped with a standard USB Type-C female connector, which is connected to the test fixture's power supply circuit and the power pins of the first interface module via dedicated power transmission lines. If the motherboard under test fails to power on due to a power failure, the operator inserts the power module into the test fixture via the USB Type-C connector. The voltage detection module within the power module first checks the voltage on the power pins of the first interface module. If no valid voltage is detected, the power control circuit immediately activates, and the preset voltage output by the lithium battery is transmitted to the motherboard under test via the USB connector. Since the power module and the test fixture are connected via a USB interface, which is versatile and convenient and supports hot-swap operations, operators can replace the power module without shutting down the test fixture, significantly improving fault diagnosis efficiency.

[0042] The motherboard under test's memory stores pre-failure logs. Therefore, after the motherboard is powered on, the test fixture can read and store the motherboard's pre-failure operational logs, including but not limited to system boot records, hardware status information, error codes, and other critical data. This log information can be transmitted to an external device (such as a laptop or server) via the test fixture's communication interface (e.g., Ethernet or USB) for analysis, helping technicians quickly locate the cause of the motherboard failure.

[0043] Next, see Figure 2 and Figure 3 Another test fixture provided in an embodiment of the present application is described below.

[0044] Figure 2 A schematic diagram of the position of another test fixture provided in an embodiment of the present application, such as Figure 2 As shown, the test fixture is set between the motherboard to be tested 200 and the OCP interface peripheral 300 to achieve signal transmission and function expansion based on the OCP interface.

[0045] The mainboard 200 to be tested serves as the core processing unit to be tested. It establishes physical and electrical connections with the OCP interface gold fingers 101 of the intermediate PCB board 103 through its OCP interface pins for transmitting data, control signals and power.

[0046] The test fixture includes a PCB board 103, which serves as a hardware carrier for signal transfer and function carrying, and integrates two sets of OCP interfaces: OCP interface gold finger 101: Located on one side of the PCB board, it physically contacts the OCP interface of the motherboard to be tested 200 through the gold finger to achieve bidirectional signal transmission and support input / output of data, control, and power; OCP interface slot 102: Located on the other side of the PCB board, it is used to physically adapt and electrically connect the OCP interface peripheral 300, and also supports bidirectional signal transmission to achieve data, control, and power interaction.

[0047] The OCP interface peripheral 300 is an extended function module, such as a network card, HBA card, HCA card, etc. It is inserted into the OCP interface slot 102 of the PCB board through its OCP interface, establishes a signal path with the mainboard 200 to be tested, and realizes function expansion or test collaboration.

[0048] The OCP interface signal of the mainboard 200 to be detected is bridged to the OCP interface peripheral 300 through the OCP interface gold finger 101 and the slot 102 of the PCB board 103 .

[0049] Figure 3 A schematic diagram of the structure of another test fixture provided in an embodiment of the present application is shown as follows: Figure 3 As shown, the test fixture includes: OCP interface gold finger 101, OCP interface slot 102, PCB board 103, MCU controller 104, current and voltage acquisition circuit 105, EEPROM 106, touch screen 107, buzzer and LED light 108, USB interface circuit 109 and WiFi communication circuit 111. Among them, MCU controller 104, current and voltage acquisition circuit 105, EEPROM 106, USB interface circuit 109 and WiFi communication circuit 111 are arranged on PCB board 103, which provides physical support for their signal transmission and circuit power supply.

[0050] The test fixture in this embodiment can not only collect the operation log of the target host, but also monitor the real-time power consumption of the OCP interface peripherals, and store and display the operation log and power consumption test results.

[0051] The current and voltage acquisition circuit 105 monitors the power signals (voltage and current) transmitted by the OCP interface gold finger 101 in real time. After converting the analog electrical signals into digital signals, the digital signals are transmitted to the MCU controller 104 via hardware wiring for power status diagnosis, such as overvoltage / overcurrent protection and power consumption analysis. Specifically, the current and voltage acquisition circuit 105 respectively collects the current and voltage of the 12V power supply pin and the 3.3V power supply pin on the OCP interface gold finger 101. The MCU controller 104 is the entire control core and communicates with the motherboard under test via the Inter-Integrated Circuit (IIC) bus. The IIC consists of two lines: the Serial Clock Line (SCL) and the Serial Data Line (SDA). The SCL line transmits a clock signal. During IIC communication, the master device sends clock pulses over the SCL line to synchronize data transmission, coordinate the sending and receiving of data on the data line, and ensure consistent timing between the sender and receiver during data transmission. The SDA line primarily transmits actual data information. Data is sent and received serially over the SDA line, synchronized with the clock signal, enabling data exchange between devices.

[0052] The specific functions of the MCU controller 104 include: Receive data from the current and voltage acquisition circuit 105 and determine the power supply status; The collected current and voltage values ​​are calculated to calculate the power consumption, and the real-time power consumption is written into the Vital Product Data (VPD) for storage; Read and write log data stored in EEPROM106; Control the buzzer and LED light 108 to issue status alarms, such as triggering a buzzer sound and a red light flashing when overcurrent occurs; Drive the touch screen 107 to display real-time parameters, such as voltage, current, and device status; It interacts with external devices such as computers and mobile phones through the USB interface circuit 109 and the WIFI communication circuit 111.

[0053] The EEPROM 106 serves as a non-volatile storage unit, communicating with the MCU controller 104 and the mainboard to be tested via the IIC bus, and storing the collected operation logs and power consumption test data.

[0054] For example, servers and computers typically use a baseboard management controller (BMC) to monitor and manage the hardware status of the server or computer motherboard. The BMC provides real-time monitoring of the hardware status and key server hardware parameters, such as CPU temperature, voltage, fan speed, power supply status, memory health, and hard drive operation. It also logs hardware events, including fault information, status changes, and alarm trigger times, to facilitate fault diagnosis. Therefore, the EEPROM can retrieve and store the operation log from the BMC of the motherboard under test.

[0055] When EEPROM106 interacts with the motherboard to be detected, it is necessary to first clarify the address of the EEPROM. The address must be set according to the requirements of the motherboard to be detected. Specifically, the address of the EEPROM is set by a dip switch (not shown in the figure). For example, before use, the slot address must be confirmed according to the BMC of the motherboard to be detected. The dip switch can be set to 0 or 1 as required. 8 different addresses can be set through 3 dip switches to meet the usage requirements of different slots. For example, if the state of the dip switch is represented in binary, "000" corresponds to address 0, "001" corresponds to address 1, and so on, until "111" corresponds to address 7. Table 1 Dial switch truth table, the corresponding address relationship is shown in Table 1 below: Table 1

[0056] In the OCP interface multi-function test fixture of this embodiment, the three dip switches are usually set on the circuit board of the test fixture and are in an easily accessible position, such as on the side or bottom of the test fixture, so that the operator can easily set them according to the motherboard requirements before connecting the motherboard to be tested.

[0057] In this embodiment, the touch screen 107, the buzzer and LED light 108, and the WIFI communication circuit 111 are respectively connected to the MCU controller 104. Through the WIFI communication circuit 111, the test fixture can interact with external devices such as computers and mobile phones.

[0058] The touch screen 107 serves as an input device for receiving fault retrieval instructions and / or power consumption threshold setting instructions from the user; it also serves as a display device for displaying the power consumption test results and / or operation logs obtained by the MCU controller 104, making it convenient for testers to record; it can also receive user input (such as setting voltage thresholds, starting log collection) to achieve parameter configuration and function control.

[0059] It is understandable that the input device may also be a keyboard, mouse or other device, and this application does not specifically limit the input device and input form.

[0060] After receiving the user's fault retrieval instruction and / or power consumption threshold setting instruction, the MCU controller 104 performs fault retrieval according to the fault retrieval instruction to obtain the retrieval result of the corresponding fault; and / or determines the power consumption limit according to the power consumption limit setting instruction; when the power consumption test result exceeds the power consumption limit and / or a corresponding fault occurs, the MCU controller 104 generates an alarm message and outputs it to the buzzer and LED light 108.

[0061] The buzzer and LED light 108 serve as alarm devices and are controlled by the MCU controller 104 to output alarm information generated by the MCU controller 104. Specifically, the buzzer and LED light 108 can be driven by high and low level signals to implement abnormal status alarms and normal status indication functions, providing users with visual and audible status feedback.

[0062] External devices can also interact with the test fixture via USB interface circuit 109. USB interface circuit 109 communicates with MCU controller 104 via a Universal Asynchronous Receiver / Transmitter (UART) bus, providing a standard USB port for connecting to a personal computer and transferring collected data, such as exporting log files, power consumption curves, and data to a personal computer for post-processing.

[0063] In addition, the USB interface circuit 109 is also used to provide power to the test fixture and the mainboard.

[0064] When the motherboard is operating normally, the OCP interface gold finger 101 is connected to the motherboard to be tested and powers each module on the PCB board 103 through the power network of the PCB board 103. When the motherboard loses power, it can draw power from an external power supply device (not shown in the figure) through the USB interface circuit 109 to provide a 3.3V power signal for the motherboard.

[0065] The test fixture provided in this embodiment can achieve the following functions: 1) Power consumption can be monitored and summarized by collecting current and voltage values; thus, accurate power consumption values ​​can be obtained, improving test accuracy. This effectively solves the problem of long test cycles and low test accuracy caused by the existing OCP network card that uses welding wires to draw test voltage and connects an ammeter in series after the current branch is disconnected to measure current. 2) It can be inserted into the OCP slot to perform the motherboard power-on self-test function, collect relevant logs and export them via USB or Bluetooth. It can also interact with the motherboard's BMC to obtain the BMC power status. If the device BMC can start normally, the MCU controller interacts with the motherboard's BMC to export abnormal situation logs through the fixture. This solves the problem of being unable to obtain logs without a computer and serial port on site, making it easier for customers or maintenance personnel to self-test faulty equipment on site. 3) If the motherboard fails to boot, the card can be powered externally, perhaps through a USB port, to the motherboard's BMC. This allows the BMC to process the operating status and retrieve pre-failure motherboard logs. This independent USB power supply overcomes the traditional reliance on the motherboard's main power supply. Even if the motherboard fails to boot due to a power failure, the BMC can still be activated and pre-failure logs (such as BIOS boot parameters and hardware self-test codes) can be retrieved. This addresses the traditional log loss issue caused by main power failure, significantly improving the success rate of fault diagnosis. Furthermore, the standardized USB interface eliminates the need for a custom power adapter, making it compatible with mainstream server / BMC architectures and reducing the hardware cost and adaptation complexity of test equipment.

[0066] 4) Collected logs can be input into the MCU controller, and keyword searches can be set on the touch screen. The MCU filters massive log data in real time, automatically marking error codes that match the keywords (such as ERR123: Power Supply Fault), and providing highlighted displays or sound prompts, such as a buzzer, effectively improving fault location efficiency.

[0067] 5) Remote access can be achieved through the WIFI module, breaking through the physical location restrictions. Thus, technicians can connect to the WIFI on the computer device to remotely obtain or analyze log data in a timely manner, reducing on-site response time.

[0068] In this embodiment, a test method is provided, which can be used for the above Figures 1 to 3 In any of the test fixtures shown, Figure 4 A flow chart of a testing method provided in an embodiment of the present application is provided, and the testing method includes the following steps.

[0069] Step S410: back up the operation log generated by the mainboard to be tested after the mainboard to be tested is powered on.

[0070] After the motherboard under test is powered on and booted, the system automatically triggers a log backup mechanism. Through the hardware interface, the system collects the motherboard's operating logs in real time or periodically, including system startup information, hardware status, error codes, and other data. The logs are then stored in the test fixture's storage module, enabling log backup and preventing log loss due to motherboard failure.

[0071] Step S420: Receive a call instruction from the user.

[0072] The test fixture can monitor and receive user commands sent via computers, mobile apps, or host systems through communication interfaces such as Wi-Fi and Ethernet. It can also receive user commands through local input devices. Commands can include, but are not limited to, log query commands, such as obtaining fault logs for a specific time period.

[0073] Step S430: Obtain the operation log in response to the call instruction, and output the operation log.

[0074] The processing module of the test fixture, such as the MCU controller, parses the user's call instructions and extracts the corresponding operation log from the local storage module, for example, by filtering by time and type; and transmits the operation log back to the user device through the original communication interface such as Wi-Fi, Ethernet, etc.

[0075] The testing method of the present application timely backs up the operation log generated by the motherboard to be tested, so that users can collect on-site fault problem logs in a timely and complete manner, making it convenient for R&D personnel to timely analyze the cause of the fault and locate the problem.

[0076] Next, see Figure 5 Another test method provided by an embodiment of the present application is described below. The test method of this embodiment can be applied to test fixtures including but not limited to input devices and alarm devices.

[0077] Figure 5 A flow chart of another testing method provided in the embodiment of the present application is shown as follows: Figure 5 As shown, the method includes the following steps S510 to S550, and each step is described in detail below.

[0078] Step S510: Receive a power consumption threshold setting instruction from a user and set the power consumption threshold.

[0079] First, a power consumption threshold configuration instruction is received from the user through an interactive interface (such as a touch screen or host computer software). The power consumption threshold may include an instantaneous power consumption threshold and / or a total power consumption threshold within a target time. The instantaneous power consumption threshold refers to the maximum allowable power consumption at a single moment. For example, the instantaneous power consumption of a peripheral device must not exceed 5W. The target time total power consumption threshold is the upper limit of the cumulative power consumption within a specified time period. For example, the total power consumption within 1 hour must not exceed 3600J, or 1Wh.

[0080] Specifically, the power consumption threshold may be set through an input device, such as a touch screen, or through other devices, which is not specifically limited in this embodiment.

[0081] Step S520: Acquire the current value and voltage value of the preset pin in the first interface module.

[0082] The current value and voltage value can be obtained by collecting the power supply current and voltage of the peripheral device to be detected in real time or periodically through a current collection circuit and a voltage collection circuit, such as the current and voltage collection circuit 105 in the above embodiment, to provide basic data for power consumption calculation.

[0083] Step S530: Obtain the instantaneous power consumption of the peripheral device to be detected according to the current value and the voltage value, and obtain the total power consumption of the peripheral device to be detected within a target time according to the current value and the voltage value.

[0084] Specifically, the instantaneous power consumption P at the current moment can be calculated according to the following formula (1): P = I × V (1) Where I is the current value and V is the voltage value.

[0085] Specifically, the total power consumption W within the target time can be calculated cumulatively according to the following formula (2): W = Σ(I × V × Δt) (2) Wherein, Δt is the acquisition period.

[0086] Step S540: Store the instantaneous power consumption test result and the total power consumption test result in the storage module respectively.

[0087] Preferably, the instantaneous power consumption and the total power consumption within the target time can be displayed on the display in the form of a curve graph, and the technician can export the power consumption data and the power consumption curve graph through the input and output module, such as a USB interface or Bluetooth.

[0088] Step S550: determine whether the instantaneous power consumption is greater than the instantaneous power consumption threshold and determine whether the total power consumption is greater than the total power consumption threshold, and generate first alarm information based on the determination results.

[0089] The first alarm information can be output through the alarm device.

[0090] For example, when the instantaneous power consumption is greater than the instantaneous power consumption threshold, if the alarm device is an LED light, the red LED light will be on until the power consumption value drops below the safe value; otherwise, the green LED light will be on; When the total power consumption is greater than the total power consumption threshold, the red LED light will be on until the power consumption value drops to a safe value; otherwise, the green LED light will be on.

[0091] When the alarm device further includes a buzzer, optionally, the buzzer sounds after the power consumption exceeds a set threshold value, and stops sounding until the power consumption value drops to a safe value.

[0092] This embodiment is different from the traditional single power consumption test (which only measures instantaneous or total power consumption). It covers both instantaneous peak power consumption (such as the surge when the peripheral starts up) and long-term cumulative power consumption (such as energy consumption exceeding the limit during continuous operation). It can effectively solve the problem of missed detection of "instantaneous normal but total power consumption exceeds the limit" or "total power consumption is normal but instantaneous overload damages the equipment".

[0093] Users can customize thresholds (such as instantaneous thresholds and / or total power consumption thresholds) to adapt to different peripheral types (such as low-power sensors and high-performance network cards) and different test scenarios (such as short-term stress tests and long-term stability tests) without modifying the hardware circuit.

[0094] Next, see Figure 6 Another test method provided by an embodiment of the present application is described below. This test method is used for power-on self-test and can be applied to test fixtures including but not limited to MCU controllers, input devices, and alarm devices. The execution subject of this method is the MCU controller.

[0095] Figure 6 A flow chart of another testing method provided in the embodiment of the present application is shown as follows: Figure 6 As shown, the method includes the following steps S610 to S640, and each step is described in detail below.

[0096] Step S610: Obtain the boot process log.

[0097] Here, the boot process log includes but is not limited to: Basic Input / Output System (BIOS) / Unified Extensible Firmware Interface (UEFI) startup information, such as hardware self-test code and startup item loading records; System initialization logs, such as driver loading status and service startup errors; Hardware status data, such as CPU temperature and memory verification results; The speed, bandwidth, connection status, etc. of the peripheral device.

[0098] The test fixture of this embodiment can collect the relevant logs of the mainboard CPU during the device startup process. By collecting the logs, the abnormal state or fault state of the CPU in the mainboard can be discovered in time.

[0099] Step S620: Receive a fault search instruction issued by the user, where the fault search instruction includes a search keyword for the fault to be detected.

[0100] The user inputs a search keyword of a fault to be searched, such as CPU Over Temperature, in the interactive interface through an input device, such as a touch screen.

[0101] Step S630: Determine whether the operation log contains the search keyword.

[0102] After collecting logs, the MCU controller searches for them based on the specified keywords. This retrieval process can use fuzzy matching, such as entering "Error" to retrieve all logs containing errors, or precise matching, such as entering the full error code, to adapt to different troubleshooting needs.

[0103] Step S640: When the search keyword is included in the operation log, a second alarm message is generated and outputted via an alarm device. For example, if the alarm device is an LED light and a buzzer, the red LED light is on and the buzzer sounds; when the operation log does not include the search keyword, the green LED light is on and the buzzer does not sound.

[0104] This embodiment can monitor the motherboard self-test process by interacting with the motherboard to obtain motherboard self-test information. When a keyword is retrieved, it indicates that the device has a corresponding fault or error. The buzzer sounds and the red LED light indicates the power level, making it easy for on-site personnel to promptly detect the fault and replace it.

[0105] Next, see Figure 7 This section describes another test method provided by an embodiment of the present application. This method is used to detect motherboard faults using a BMC and can be applied to a test fixture that includes, but is not limited to, an MCU controller, input devices, and alarm devices. The method is performed by the MCU controller in the test fixture.

[0106] Figure 7 A flow chart of another testing method provided in the embodiment of the present application is shown as follows: Figure 7 As shown, the method includes steps S710 to S780, and each step is described in detail below.

[0107] Step S710: Detect the operating status of the BMC in the motherboard to be detected.

[0108] Specifically, the IIC bus collects real-time BMC operating parameters, including hardware status (e.g., BMC chip temperature and power supply voltage); software status (e.g., BMC firmware version and service progress); and communication link status (e.g., connection stability with the motherboard CPU and test fixture). This step provides basic status data for subsequent diagnosis, covering multiple dimensions of BMC fault monitoring.

[0109] Step S720: Determine whether the BMC is operating normally.

[0110] Specifically, the data collected by S710 may be judged based on preset normal state thresholds, such as power supply voltage ≥ 3.3 V, temperature ≤ 85° C., and communication packet loss rate ≤ 1%.

[0111] Step S730: When the BMC is operating abnormally, a third alarm is generated and output via an alarm device. For example, if the alarm device is an LED and a buzzer, the red LED will illuminate and the buzzer will sound. If the BMC's supply voltage falls below the normal threshold and cannot start, the BMC is powered on by connecting the power module to the USB port and then obtaining a fault log from the BMC. If the BMC is operating normally, the buzzer will not sound, the green LED will illuminate, and the log will be obtained from the BMC.

[0112] Here, the reason why the BMC power supply voltage is lower than the normal threshold and cannot start working may be that a CPU failure or a mainboard failure causes a failure to supply power to the BMC. Step S740: Store the acquired log in the EEPROM.

[0113] The acquired logs, including normal full logs or abnormal key logs, are stored in the non-volatile memory EEPROM to achieve persistent storage of logs. Even if the test fixture loses power, the data will not be lost.

[0114] Step S750: Export the log, specifically by exporting it via a USB port, exporting it via Bluetooth, or remotely viewing and exporting it via Wi-Fi; Step S760: receiving a fault search instruction issued by the user, wherein the fault search instruction includes a search keyword for the fault to be searched; Step S770: determine whether the operation log contains the search keyword; Step S780: When the operation log contains the search keyword, the buzzer sounds and the red LED light turns on; otherwise, the buzzer does not sound and the green LED light turns on.

[0115] The test fixture of this embodiment detects the operating status of the BMC on the motherboard, that is, whether the BMC is powered off. If the BMC can start normally, the MCU controller can exchange data with the motherboard's BMC, store abnormal situation logs in the EEPROM, and export them through the fixture. This solves the problem of being unable to obtain logs due to the lack of a computer and serial port on site, and facilitates customers or maintenance personnel to obtain self-test information of faulty equipment on site.

[0116] If the motherboard fails to boot, the board can be powered externally, perhaps through a USB port, to power up the motherboard's BMC, thereby retrieving pre-failure motherboard logs from the BMC. Unlike traditional solutions that only retrieve logs when the BMC is functioning normally, this embodiment forcibly activates the BMC core module via USB emergency power when the BMC loses power, retrieving critical pre-failure logs and improving the integrity of fault diagnosis data.

[0117] The fixture can input the collected logs into the MCU, set keyword search, and display the error or fault code on the monitor after retrieving the key error. It can also set error or fault keywords for self-test through the input device, making it easier for on-site personnel to perform equipment maintenance and management.

[0118] An embodiment of the present application further provides an electronic device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor is configured to run the computer program to execute the steps in any one of the above-mentioned test method embodiments.

[0119] An embodiment of the present application further provides a computer-readable storage medium, in which a computer program is stored. The computer program is configured to execute the steps of any of the above-mentioned test method embodiments when running.

[0120] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk, or an optical disk.

[0121] An embodiment of the present application further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the steps in any one of the above-mentioned test method embodiments are implemented.

[0122] An embodiment of the present application further provides another computer program product, including a non-volatile computer-readable storage medium, wherein the non-volatile computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in any of the above-mentioned test method embodiments are implemented.

[0123] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0124] The above is a detailed introduction to a test fixture and test method provided by the present application. This article uses specific examples to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present application, several improvements and modifications can be made to the present application, and these improvements and modifications also fall within the scope of protection of the claims of the present application.

Claims

1. A test fixture, characterized in that: include: A first interface module, a second interface module, a current acquisition module, a voltage acquisition module, a processing module, a storage module, and an input / output module; The processing module is respectively connected to the first interface module, the storage module, and the input / output module; the storage module is respectively connected to the first interface module; the current acquisition module is respectively connected to the first interface module and the processing module; and the voltage acquisition module is respectively connected to the first interface module and the processing module; The first interface module is connected to the mainboard to be detected, and is used to provide an interface with the mainboard to be detected and obtain the operation log generated by the mainboard to be detected; The second interface module is connected to the peripheral device to be detected and is in communication with the first interface module, and is used to provide an interface with the peripheral device to be detected, and together with the first interface module, constitute a communication link between the peripheral device to be detected and the mainboard to be detected; The current acquisition module is used to acquire the current value of the preset pin in the first interface module; The voltage acquisition module is used to acquire the voltage value of the preset pin; The storage module is used to back up the operation log generated by the motherboard to be detected, and to store the current value and the voltage value; The input and output module is used to receive a call instruction issued by a user and send the call instruction to the processing module; The processing module is configured to obtain an operation log from the storage module based on the call instruction, send the operation log to the input / output module, obtain the current value and the voltage value, and obtain a power consumption test result of the peripheral device to be detected according to the current value and the voltage value; The input and output module is further configured to output the operation log and the power consumption test result.

2. The test fixture according to claim 1, characterized in that: The input-output module is further connected to the first interface module, and the test fixture further comprises a power module, which is detachably connected to the input-output module; The power supply module is used to supply power to the mainboard to be detected and the test fixture by accessing the input and output module when a power failure occurs on the mainboard to be detected.

3. The test fixture according to claim 1, wherein: The test fixture further includes an input device communicatively connected to the processing module; The input device is used to receive a fault retrieval instruction and / or a power consumption limit setting instruction input by a user; The processing module is further configured to perform fault retrieval according to the fault retrieval instruction to obtain a retrieval result of a corresponding fault; and / or determine a power consumption limit according to the power consumption limit setting instruction.

4. The test fixture according to claim 3, characterized in that: The test fixture further includes a display device and / or an alarm device; the display device and / or the alarm device are communicatively connected to the processing module; The processing module is further configured to generate an alarm message when the power consumption test result exceeds the power consumption limit and / or a corresponding fault occurs; The display device is used to display the power consumption test result obtained by the processing module and / or the operation log; The alarm device is used to output the alarm information.

5. A testing method, applied to the testing fixture according to any one of claims 1 to 4, characterized in that: The test method includes: Backing up the operation log generated by the mainboard to be tested after the mainboard to be tested is powered on; Receive the call instruction issued by the user; The operation log is obtained in response to the calling instruction, and the operation log is output.

6. The testing method according to claim 5, characterized in that: The test method further comprises: Receive a power consumption threshold setting instruction from a user and set the power consumption threshold; Acquire a current value and a voltage value of a preset pin in the first interface module, and obtain a power consumption test result of the peripheral device to be detected according to the current value and the voltage value; When the power consumption test result exceeds the power consumption threshold, first alarm information is generated.

7. The testing method according to claim 5, characterized in that: The test method further comprises: Receiving a fault search instruction issued by a user, wherein the fault search instruction includes a search keyword for a fault to be searched; Determining whether the operation log contains the search keyword; When the operation log contains the search keyword, a second alarm message is generated.

8. The testing method according to claim 5, wherein: Before obtaining the operation log generated by the motherboard to be tested, the testing method further includes: Detecting the operating status of the baseboard management controller in the mainboard to be detected; When the baseboard management controller is in an abnormal operating state, third alarm information is generated.

9. The testing method according to claim 8, characterized in that: The method for obtaining the operation log generated by the motherboard to be detected includes: When the baseboard management controller is in an abnormal operating state, the baseboard management controller is powered on by connecting the input and output modules through a power module, and then an operating log before the mainboard to be detected fails in the baseboard management controller is obtained.

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