Gap plane difference measurement method, measurement module, scanning device, medium and product

Abstract

The embodiment of the invention provides a gap surface difference measurement method, a measurement module, scanning equipment, a medium and a product. The method comprises the following steps: receiving object data of a target object; the object data comprises scanning data; under the condition that the object data comprises the model data, determining a measurement reference characteristic based on the model data; or, in the case where the object data does not include the model data, determining a measurement reference feature based on the scan data or the received reference setting operation; and performing gap and / or surface difference measurement on the scanning data based on the measurement reference features to obtain a gap measurement result and / or a surface difference measurement result. According to the embodiment of the invention, the flexibility of the gap surface difference measurement process is improved through a determination mode of self-adaption to different measurement reference features based on whether the object data comprises the model data.

Description

Technical Field

[0001] The present application relates to the technical field of scanning equipment, and in particular to a gap and flushness measurement method, a measurement module, a scanning equipment, a medium, and a product. Background Art

[0002] Gap and flush measurement is a key technology used in the manufacturing industry to evaluate the fit accuracy and surface flatness between parts, and is widely used in the automotive, aerospace and other fields.

[0003] In related technologies, gap and flushness measurement usually adopts a fixed measurement process, which is difficult to flexibly adjust according to different scenarios, limiting its flexibility and applicability in practical applications.

[0004] Based on this, the present application provides a gap and flushness measurement method, a measurement module, a scanning device, a medium and a product to improve the relevant technology. Summary of the Invention

[0005] The purpose of this application is to provide a gap and flushness measurement method, a measurement module, a scanning device, a medium and a product, which can improve the flexibility and applicability of gap and flushness measurement by adaptively determining the measurement reference features based on whether the object data includes model data.

[0006] The purpose of this application is achieved by the following technical solutions:

[0007] In a first aspect, an embodiment of the present application provides a gap and face difference measurement method, the method comprising: receiving object data of a target object; the object data comprising scanning data; when the object data comprises model data, determining a measurement reference feature based on the model data; or, when the object data does not comprise model data, determining a measurement reference feature based on the scanning data or a received reference setting operation; based on the measurement reference feature, performing gap and / or face difference measurement on the scanning data to obtain a gap measurement result and / or face difference measurement result.

[0008] In some embodiments, when the object data includes model data, before performing gap and / or flush measurement on the scan data, the method further includes: performing a coarse alignment and / or fine alignment operation on the scan data.

[0009] In some embodiments, determining the measurement reference feature based on the model data includes: selecting at least one feature in the model data as the measurement reference feature; wherein, the model data includes CAD data and / or model mesh data, and the selected features include one or more of planes, surfaces, points and lines.

[0010] In some embodiments, the process of determining the measurement reference feature based on the scan data includes: performing a curvature analysis on the scan data to fit the measurement reference feature.

[0011] In some embodiments, the gap and / or face difference measurement of the scan data based on the measurement reference feature includes: generating at least one cross-sectional plane according to the measurement reference feature; processing the scan data based on the cross-sectional plane to obtain cross-sectional data; using the cross-sectional data, performing gap and / or face difference measurement calculations to obtain the gap measurement result and / or the face difference measurement result.

[0012] In some embodiments, the cross-sectional plane includes one or more of a single cross-section, a parallel cross-section, a fan-shaped cross-section, and a curved cross-section.

[0013] In some embodiments, the gap and / or face difference measurement of the scan data based on the measurement reference feature includes: determining at least one target point corresponding to the scan data through interactive operation according to the measurement reference feature, or determining at least one target point corresponding to the scan data according to specified measurement point setting parameters; the interactive operation includes selecting measurement points and / or editing measurement points; based on the determined target points, performing gap and / or face difference measurement calculations to obtain the gap measurement results and / or the face difference measurement results.

[0014] In some embodiments, the scan data includes point cloud data, and determining at least one target point corresponding to the scan data according to specified measurement point setting parameters includes: processing the point cloud data to generate scan grid data; based on the measurement point setting parameters, selecting at least one target point from a grid edge and / or grid surface corresponding to the scan grid data and / or fitting to generate at least one target point; or, based on the point cloud data, selecting at least one target point and / or fitting to generate at least one target point.

[0015] In some embodiments, the gap and / or face difference measurement is performed on the scan data based on the measurement reference feature, including: in a single-group calculation mode, based on a selected single measurement reference feature, performing a group of gap measurements and / or face difference measurements on the scan data to obtain a gap measurement result and / or face difference measurement result corresponding to the single measurement reference feature; or, in a multi-group calculation mode, selecting multiple measurement reference features along the edge line corresponding to the scan data, and performing a corresponding group of gap measurements and / or face difference measurements on the scan data based on each measurement reference feature, to synchronously obtain gap measurement results and / or face difference measurement results corresponding to multiple measurement reference features.

[0016] In some embodiments, the gap and / or face difference measurement of the scan data based on the measurement reference feature includes: performing gap and / or face difference measurement calculation on the scan data based on the measurement reference feature and specified calculation parameters; wherein the calculation parameters include at least one of the following: a measurement edge type parameter, used to indicate the type of the measurement edge, the measurement edge type including one or more of a fillet less than 90 degrees, a fillet greater than 90 degrees, a non-rounded arc surface, and a single edge degenerated into a point or line; a section construction parameter, used to specify the area range for constructing the section; and a measurement point construction parameter, used to specify the construction distance and / or construction angle between target points.

[0017] In some embodiments, the measurement reference feature includes at least one of a reference point, a reference line, and a reference plane; and the gap and / or face difference measurement of the scan data based on the measurement reference feature includes: obtaining the gap measurement result and / or face difference measurement result corresponding to the scan data by calculating the distance between the measurement reference feature and the target feature, and the target feature is determined based on the scan data.

[0018] In some embodiments, the method further includes: obtaining a gap measurement result and / or a facet measurement result corresponding to the model data by calculating the distance between the measurement reference feature and the reference feature, wherein the reference feature is determined based on the model data; performing a deviation calculation based on the gap measurement result and / or facet measurement result corresponding to the scanning data, and the gap measurement result and / or facet measurement result corresponding to the model data to obtain a deviation calculation result corresponding to the target object.

[0019] In a second aspect, an embodiment of the present application provides a measurement module, which includes a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, it implements the gap and flushness measurement method described in any one of the first aspects.

[0020] In a third aspect, an embodiment of the present application provides a scanning device, which includes a scanning module and the measurement module provided in the second aspect, and the scanning module is used to collect scanning data of a target object.

[0021] In some embodiments, the scanning device includes one or more of a handheld laser scanning device, a tracking scanning device, and an automated scanning device.

[0022] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the gap and flushness measurement method described in any one of the first aspects is implemented.

[0023] In a fifth aspect, an embodiment of the present application provides a computer program product, which includes a computer program. When the computer program is executed by a processor, it implements the gap and flushness measurement method described in any one of the first aspects.

[0024] The embodiments of the present application provide a gap and flushness measurement method, a measurement module, a scanning device, a medium, and a product. The method receives object data of a target object; the object data includes scanning data; if the object data includes model data, a measurement reference feature is determined based on the model data; or if the object data does not include model data, a measurement reference feature is determined based on the scanning data or a received reference setting operation; based on the measurement reference feature, a gap and / or flushness measurement is performed on the scan data to obtain a gap measurement result and / or flushness measurement result. The embodiments of the present application improve the adaptability and flexibility in scenarios without model data by flexibly determining the measurement reference feature and performing the measurement based on the scanning data or the received reference setting operation in the absence of model data; and directly using the model data to quickly generate measurement results when model data is available, which can improve measurement efficiency to a certain extent. In this way, the flexibility of the gap and flushness measurement process is improved by adapting to different measurement reference features based on whether the object data includes model data, thereby improving the problem that the fixed gap and flushness measurement process in the related art is difficult to adapt to different scenarios. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The present application is further described below with reference to the accompanying drawings and specific implementation methods.

[0026] Figure 1 It is a flow chart of a gap and flushness measurement method provided in an embodiment of the present application.

[0027] Figure 2 It is a schematic diagram of a different type of cross-sectional plane provided in an embodiment of the present application.

[0028] Figure 3 This is a schematic diagram of selecting measurement reference features under different calculation modes provided in an embodiment of the present application.

[0029] Figure 4 This is a schematic diagram of different measurement edge types provided in an embodiment of the present application.

[0030] Figure 5 This is a structural block diagram of a measurement module provided in an embodiment of the present application. DETAILED DESCRIPTION

[0031] The following will be combined with the drawings in this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the described embodiments are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without making creative efforts are within the scope of protection of this application.

[0032] In the description of the embodiments of this application, it should be understood that the terms "first" and "second" are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly indicate the number of technical features indicated. Therefore, features defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the embodiments of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0033] Gap measurement: It can be used to quantify the assembly gap between two adjacent parts. By measuring the gap width or spatial distribution difference between the two surfaces, it can be used to evaluate whether the fitting accuracy meets the design requirements.

[0034] Flush measurement: It can be used to evaluate the surface flatness or height difference between two adjacent parts. By analyzing the relative position relationship between the surfaces, it can be determined whether there are defects such as steps, depressions or protrusions.

[0035] In related technologies, gap and flush measurement usually adopts a fixed measurement process, which lacks flexible adaptation to model-free data scenarios and model-based data scenarios, limiting its flexibility and applicability in practical applications.

[0036] See also Figure 1 , Figure 1 It is a flow chart of a gap and flushness measurement method provided in an embodiment of the present application.

[0037] In order to solve the problem that the gap and flushness measurement process in related technologies is fixed and lacks flexible adaptation, the embodiment of the present application adaptively determines the measurement reference features and performs the measurement based on whether the model data is included. Figure 1 As shown, an embodiment of the present application provides a method for measuring gap and flushness, which includes steps S101 to S104.

[0038] Step S101: receiving object data of a target object; the object data includes scanning data.

[0039] Step S102: When the object data includes model data, determining a measurement reference feature based on the model data.

[0040] Step S103: When the object data does not include model data, determining measurement reference features based on the scan data or the received reference setting operation.

[0041] Step S104: Based on the measurement reference feature, perform gap and / or flush measurement on the scan data to obtain a gap measurement result and / or flush measurement result.

[0042] In some embodiments, the object data includes scan data (e.g., point cloud data) of the target object. Scan data of the target object collected by a scanning device (e.g., a handheld laser scanner or a tracking scanner) can be received from a scanning device. Exemplarily, the scan data may include multi-source data fusion. For example, the scan data may be fused data from multi-view laser scanning and structured light scanning.

[0043] In some embodiments, the object data includes scan data and model data of the target object. For example, the object data may be manually input or uploaded by a user through an interactive interface. The model data may be, for example, CAD model data or model mesh data of the target object.

[0044] In some embodiments, the datum feature can be used as a geometric feature of the datum for locating or quantifying gaps / flush. The datum feature can be extracted from the model data, or can be determined based on scan data or user interaction.

[0045] In some embodiments, when the object data includes model data, the measurement reference features can be determined by the following steps: selecting at least one measurement point from the model based on the model data, and generating section data and related derived feature points and / or key points according to preset parameters (for example, section construction parameters); using the derived feature points and / or key points as measurement reference features for gap and flush calculation of subsequent scanning data.

[0046] In some embodiments, when the object data does not include model data, local planes, curved surfaces, or straight lines can be extracted as measurement reference features by performing geometric analysis on the scan data.

[0047] In some embodiments, the measurement reference features can be superimposed on the visualization interface of the scan data for user confirmation or adjustment.

[0048] In other embodiments, when the object data does not include model data, the measurement datum feature can be determined based on a received datum setting operation. For example, the measurement datum feature can be determined by receiving a datum setting operation input by a user via an interactive interface or a preset rule. For example, the datum setting operation can include manually selecting a specific point, line, and / or surface, or setting parameters (e.g., distance, angle, coordinates, etc.) to generate the measurement datum feature.

[0049] In some embodiments, the gap measurement may be used to derive a gap value by quantifying the spatial relationship between the target surface and the reference feature.

[0050] For example, a cross section (such as a single cross section, parallel cross sections, or curved cross sections) can be generated based on the measured reference features. Based on the cross-sectional data, gap measurement calculations are performed to obtain a gap distribution. For example, in detecting the gap between a car door and the body, multiple sector-shaped cross sections are generated along the door edge. The minimum gap between the door surface and the body reference plane is calculated for each cross section, forming a gap variation curve.

[0051] In some embodiments, the flushness measurement may be performed by quantifying the height difference between the target feature and the measurement reference feature to obtain a flushness value.

[0052] Exemplarily, when the measurement reference feature is a plane, the face difference distribution can be obtained based on the distance between a parallel or approximately parallel target surface and the reference plane (i.e., the height difference between the two planes in the normal direction). For example, in the face difference detection of a car door and body, multiple parallel sections are generated along the edge of the door, and the normal height difference between the door surface and the body reference plane in each section is calculated to obtain the face difference value. When the measurement reference feature is a straight line, the face difference value can be obtained based on the distance between a parallel or approximately parallel target surface and the reference line; or, the face difference value can be obtained based on the distance between a parallel or approximately parallel target line and the reference line. Among them, the target surface and the target line can be target features determined based on the scanning data.

[0053] In some embodiments, the gap measurement results and / or flush measurement results may be displayed numerically, graphically, or visually for quality control or deviation analysis.

[0054] It will be appreciated that after receiving the object data in step S101, whether the object data includes model data determines whether to proceed to step S102 or step S103. If the object data includes model data, step S102 is executed (determining the measurement datum features based on the model data); if the object data does not include model data, step S103 is executed (determining the measurement datum features based on the scan data or a received datum setting operation). After executing step S102 or S103, the measurement process proceeds to step S104, where gap and / or flush measurement is performed on the scan data based on the determined measurement datum features.

[0055] In the above-described embodiment, by flexibly determining the measurement datum features and performing measurements based on scanned data or received datum setting operations when model data is not available, adaptability and flexibility in scenarios without model data are improved. When model data is available, measurement results are quickly generated directly from the model data, which can improve measurement efficiency to a certain extent. Thus, by adaptively determining different measurement datum features based on whether the object data includes model data, the flexibility of the gap and flushness measurement process is increased, thereby resolving the problem in related art where the fixed gap and flushness measurement process is difficult to adapt to different scenarios.

[0056] Scanning data often comes from multiple perspectives or multiple frames. After coordinate conversion and splicing, these multiple frames of scan data can represent the surface shape of an object, but they may not be in the same coordinate system as the model data. Therefore, for scenes with model data, determining measurement datum features directly based on the model data can lead to calculation errors or errors when applying these measurement datum features to gap and flush measurement of the scanned data. In some embodiments, when the object data includes model data, before performing gap and / or flush measurement on the scanned data, the method may further include performing coarse alignment and / or fine alignment operations on the scanned data.

[0057] Exemplarily, coarse alignment is used to preliminarily align the scan data to the model coordinate system. For example, the initial transformation matrix can be calculated using the measurement reference features determined based on the model data and the matching points in the scan data corresponding to the measurement reference features, and the scan data can be preliminarily aligned to the model coordinate system through the initial transformation matrix. Coarse alignment can quickly eliminate the global pose difference between the scan data and the model. Fine alignment is used to completely align the scan data to the model coordinate system. Exemplarily, the transformation matrix can be iteratively optimized based on the coarse alignment results, for example, by minimizing the point-to-point or point-to-plane distance error, and the scan data can be completely aligned to the model coordinate system based on the optimized transformation matrix. Fine alignment can help eliminate local deviations after coarse alignment and improve alignment accuracy. As another example, the scan data can be preliminarily aligned to the model coordinate system through coarse alignment, and then the local deviations can be eliminated through fine alignment to completely align the scan data to the model coordinate system.

[0058] In the above embodiment, when the object data includes model data, before performing gap and / or face difference measurement on the scan data, the coordinate system deviation between the scan data and the model data can be reduced by aligning the scan data, thereby reducing the error caused by the gap and face difference calculation of the scan data by the measurement reference features determined based on the model data, thereby improving the calculation accuracy.

[0059] In order to alleviate the problem in related technologies that the measurement reference features are set up singly and cannot be flexibly adapted to different scenarios, in some embodiments, determining the measurement reference features based on the model data may include: selecting at least one feature in the model data as the measurement reference feature; wherein, the model data includes CAD data and / or model mesh data, and the selected features include one or more of planes, surfaces, points and lines.

[0060] Exemplarily, the measurement reference features may include one or more of plane, curved surface, point or line features. Plane features can be used to evaluate the flatness of the surface of the target object. Surface features can be natural curved surfaces (such as the curved surface of a roof) or designed curved surfaces (such as the curved surface of a bumper) on the surface of the target object. Point features can be used to mark gaps or face differences at specific locations (such as the mounting points of headlights). Line features can be used as measurement paths or alignment references. For example, line features can be boundary lines, feature lines (such as the seam line of a door edge) or user-specified reference lines on the surface of the target object.

[0061] For example, when the object data includes model data, at least one geometric feature (e.g., a plane, a curved surface, a point, or a line) can be selected from the model data as a measurement reference feature based on user interaction. For example, for a target object with a regular shape, a plane can be selected as the measurement reference feature. For a target object with a complex curved surface, a curved surface or a curve can be selected as the measurement reference feature. For example, a user manually selects a curved surface or curve in the model data as a measurement reference feature through an interactive interface.

[0062] In the above embodiment, by selecting multiple types of features (such as planes, curved surfaces, points, and lines) from the model data as measurement reference features, the diversity of the measurement reference features is increased, which helps improve the measurement accuracy of gap and flush measurement. In addition, because the model data includes CAD data and / or model mesh data, different types of model data can be adapted to different measurement scenarios, further enhancing the flexibility and applicability of the gap and flush measurement method.

[0063] To address the problem that it is difficult to effectively extract measurement reference features when there is no model data, in some embodiments, the process of determining the measurement reference features based on the scan data may include: performing curvature analysis on the scan data to fit the measurement reference features.

[0064] For example, the curvature analysis of the scanned data can be performed based on the covariance matrix decomposition method of the local neighborhood to obtain a curvature analysis result. According to the curvature analysis result, an area with similar geometric characteristics can be selected (such as a plane corresponding to a low curvature area and an edge line corresponding to a high curvature area), and a mathematical fitting method (such as the least squares method) can be used to fit the selected area to generate a measurement reference feature. In addition, the fitting method can be dynamically adjusted according to the curvature analysis result. For example, a plane fitting is used for a low curvature area, and a surface or curve fitting is used for a high curvature area.

[0065] In the above embodiment, in the absence of model data, features are directly extracted from the scan data through curvature analysis, which can effectively identify the geometric characteristics of the target object surface (such as planes, curves, edge lines, etc.), reducing dependence on model data.

[0066] In order to address the problem that when measuring based on measurement reference features, the overall scan data is usually processed directly, and there is a lack of targeted analysis of key areas on the surface of the target object, which may lead to inaccurate measurement results, in some embodiments, the gap and / or face difference measurement of the scan data based on the measurement reference features may include: generating at least one cross-sectional plane according to the measurement reference features; processing the scan data based on the cross-sectional plane to obtain cross-sectional data; using the cross-sectional data, performing gap and / or face difference measurement calculations to obtain the gap measurement results and / or the face difference measurement results.

[0067] Exemplarily, the cross-sectional plane may include one or more of a single cross-section, a parallel cross-section, a fan-shaped cross-section, and a curved cross-section.

[0068] See also Figure 2 , Figure 2 It is a schematic diagram of a different type of cross-sectional plane provided in the embodiment of the present application. Figure 2 A single section, parallel section, fan-shaped section and curved section are shown in the figure. A single section is a simple two-dimensional plane. For example, if the surface of the target object is relatively flat or the measurement area is small, a single section can be used for measurement. Parallel sections are multiple parallel planes that are distributed at fixed intervals and cover multiple areas of the target object. For example, if the surface of the target object is large and gap or face difference measurement is required at multiple positions, parallel sections can be used for measurement. Fan-shaped planes are a set of planes distributed in a fan shape that can expand outward from a center point to cover a larger angle range. For example, if the surface of the target object is arc-shaped or annular, a fan-shaped plane can be used for measurement. A curved plane is a virtual plane generated along the curved shape of the target object surface. For example, if the surface of the target object contains complex bends or concave-convex structures, a curved plane can be used for measurement.

[0069] Illustratively, generating at least one cross-sectional plane based on the measurement datum feature may include automatically constructing at least one cross-sectional plane based on the geometric characteristics of the measurement datum feature. For example, when the measurement datum feature is a plane, a plane offset method may be used to offset the cross-sectional plane in the direction of the normal vector of the datum plane; when the measurement datum feature is a curve, a directional extension method may be used to generate the cross-sectional plane along the tangent direction of the curve; and when the measurement datum feature is a complex surface, an adaptive generation method may be used to dynamically generate the cross-sectional plane based on changes in the curvature of the complex surface. Furthermore, after generating at least one cross-sectional plane, the position or orientation of one or more cross-sectional planes may be adjusted based on adjustment operations input by the user through an interactive interface to accommodate specific measurement requirements.

[0070] For example, cross-sectional data may be extracted based on the intersection of a cross-sectional plane and the scan data.

[0071] For example, key geometric information (e.g., key points, line segments, or regions) of the cross-sectional plane can be extracted based on the cross-sectional data. For example, the points in the cross-sectional data can be fitted to generate a straight line or curve as the key geometric feature of the cross-sectional plane. Based on the key geometric information extracted from the cross-sectional data, the gap value can be obtained by calculating the gap width between the key geometric information of the cross-sectional plane and the measured reference feature. Based on the key geometric information extracted from the cross-sectional data, the surface difference value can be obtained by calculating the normal deviation between the target surface and the reference feature in the cross-sectional data.

[0072] In the above-described embodiment, by generating at least one cross-sectional plane based on the measurement reference features, compared to using a single cross-sectional plane, this method of dynamically generating multiple cross-sectional planes based on the measurement reference features can flexibly adapt to the geometric characteristics of the target object. Based on the cross-sectional planes, the scan data is processed to obtain cross-sectional data, which is used to perform gap and / or flush measurement. This can concentrate the measurement process on specific areas, reduce redundant calculations in non-critical areas, and thus improve measurement efficiency. Furthermore, the introduction of cross-sectional planes can make the measurement process more focused on the key parts of the target object's surface, which helps to improve the accuracy of the measurement results.

[0073] The method of determining measurement points using a fixed measurement process may lack flexibility. In some embodiments, performing gap and / or flush measurement on the scanned data based on the measurement datum feature may include: determining at least one target point corresponding to the scanned data through interactive operations based on the measurement datum feature, or determining at least one target point corresponding to the scanned data according to specified measurement point setting parameters; the interactive operations include selecting and / or editing measurement points; and performing gap and / or flush measurement calculations based on the determined target points to obtain the gap measurement results and / or flush measurement results.

[0074] Exemplarily, the target point may be used as a measurement point for performing gap and / or flush measurement. The target point may be a key position point, such as a point located on a specific area (such as an edge, plane, or curved surface) on the surface of the target object.

[0075] Exemplarily, feature points derived and calculated based on measurement reference features (such as reference points, reference lines or reference surfaces) or determined through interactive operations can be used as target points, for example, they can include one or more of theoretical edge points, offset points, contour points and surface points. Theoretical edge points can be points on the ideal intersection line between two adjacent surfaces in the model. Offset points can be points generated by offsetting a specified distance along a specific direction (such as the surface normal or path direction). Contour points can be key points on the cross-sectional profile, such as inflection points, extreme points, symmetry points, etc. Surface points are corresponding points constructed based on the geometric mapping relationship between known model points and corresponding surface points. For example, corresponding points of model points of unknown surface points on the surface can be constructed based on known model points and corresponding surface points.

[0076] For example, interactive operations may include a user selecting or editing the location and properties of target points through a graphical interface or other interactive tools. Measurement point setting parameters may be used to adaptively adjust the distribution of measurement points based on the geometric characteristics of the target object. For example, the measurement point setting parameters may be user-entered setting parameters (such as the spacing and angle between measurement points), or the measurement point setting parameters may be setting parameters based on preset rules. For example, for a target object with a regular shape, target points may be generated according to the principle of uniform distribution; for a complex curved surface, the density of target points to be generated may be dynamically adjusted according to changes in curvature.

[0077] At least one measurement point is determined as a target point through the interactive operation. For example, at least one point with a curvature value greater than a preset curvature threshold (such as an arc entry point, an arc exit point, or other points with obvious curvature changes) can be selected as the target point based on the scanning data, or the midpoint of the arc, the point of maximum curvature, or the edge intersection point can be selected as the target point.

[0078] In some embodiments, at least one measurement point corresponding to the scan data can be determined as a target point through interactive operation in combination with specified measurement point setting parameters based on the measurement reference characteristics. For example, based on the measurement reference characteristics, a measurement point region can be initially selected through interactive operation, and then a target point can be automatically generated within the measurement point region using specified measurement point setting parameters.

[0079] In some embodiments, the gap measurement calculation can be performed by calculating the gap width between the target point and the measurement reference feature to obtain the gap value. The flushness measurement calculation can be performed by calculating the height difference between the target point and the measurement reference feature to obtain the flushness value.

[0080] In the above embodiment, interactive operation allows users to flexibly adjust the position of target points based on actual needs, alleviating the problem that automated algorithms may overlook critical areas. By determining target points based on measurement point setting parameters, the distribution of measurement points can be flexibly adjusted. Thus, interactive operation or parameterized determination of target points based on measurement datum features can enhance the flexibility of generating measurement points during the measurement process.

[0081] In order to address the problem that it may be difficult to efficiently and accurately select or generate target points based on scan data, thereby affecting the accuracy and efficiency of measurement results, in some embodiments, the scan data includes point cloud data, and determining at least one target point corresponding to the scan data according to specified measurement point setting parameters may include: processing the point cloud data to generate scan mesh data; selecting at least one target point from a mesh edge and / or mesh surface corresponding to the scan mesh data and / or generating at least one target point by fitting based on the measurement point setting parameters; or selecting at least one target point and / or generating at least one target point by fitting based on the point cloud data.

[0082] For example, the point cloud data can be converted into scan mesh data through a triangulation algorithm. The mesh data can more intuitively represent the surface structure of the target object, facilitating subsequent geometric analysis and measurement point selection.

[0083] For example, in non-interactive mode, at least one target point can be automatically selected from the grid edge and / or grid surface corresponding to the scanned grid data according to the measurement point setting parameters (such as the spacing and angle between the measurement points), or at least one measurement point can be automatically selected from the point cloud data as the target point, or at least one measurement point can be generated as the target point by fitting through a geometric fitting algorithm (such as the least squares method). For example, key points on the grid edge (such as corners or boundary points) are preferentially selected, or the grid surface in a regular area (such as a plane or a cylinder) is uniformly sampled to ensure that the distribution of measurement points is reasonable and representative, or for a regular area (such as a plane or a cylinder), the target points can be generated by uniform sampling from the grid surface to ensure a balanced distribution. In addition, the strategy can be dynamically adjusted based on the curvature analysis, and edge points are selected in high curvature areas, and grid surface sampling is used in low curvature areas.

[0084] For example, in interactive mode, the target points can be key points (such as mesh vertices or edge intersections) manually selected or adjusted by the user from the scan data in a visual interface; or the target points can be dynamically fitted based on user-specified geometric constraints (such as parallelism, axis of symmetry).

[0085] For example, in the multi-group calculation mode (ie, the multi-group gap and flushness measurement mode) and when the interactive mode is enabled, multiple groups of gap and flushness target points can be set simultaneously, and each group of target points can be generated using independent measurement point setting parameters.

[0086] In the above embodiments, the efficiency of target point selection and / or fitting generation is significantly improved by flexibly adapting point cloud data processing and measurement point setting parameters to different scenarios. The target points are selected and / or fitted based on the geometric characteristics of the point cloud data (such as grid edges or grid surfaces), which can capture the true geometric features of the target object surface and reduce errors caused by noise or missing points. This can enhance the accuracy of target point selection and / or fitting generation, which can help to obtain high-precision gap and flushness measurement results in the future.

[0087] To address the problem that a fixed measurement mode is difficult to adapt to different scenarios, in some embodiments, the gap and / or face difference measurement of the scan data based on the measurement reference feature may include: in a single-group calculation mode, based on a selected single measurement reference feature, performing a group of gap measurements and / or face difference measurements on the scan data to obtain a gap measurement result and / or face difference measurement result corresponding to the single measurement reference feature; or, in a multi-group calculation mode, selecting multiple measurement reference features along the edge line corresponding to the scan data, and performing a corresponding group of gap measurements and / or face difference measurements on the scan data based on each measurement reference feature to synchronously obtain gap measurement results and / or face difference measurement results corresponding to multiple measurement reference features.

[0088] Single-group calculation mode performs a set of gap and / or flush measurements based on a single measurement datum feature. This is suitable for scenarios with simple surface geometry or concentrated measurement requirements. Multi-group calculation mode selects multiple measurement datum features along the edge of the target object and performs a set of gap and / or flush measurements on each datum feature. This is suitable for scenarios with complex surface geometry or simultaneous measurement of multiple areas.

[0089] Exemplarily, the single-group computing mode or the multi-group computing mode may be determined based on a user selection operation.

[0090] Exemplarily, the edge line corresponding to the scan data may be selected based on a curvature analysis of the scan data, for example, a line with a high curvature may be preferentially selected as the edge line.

[0091] For example, the measurement process in the single-group calculation mode may include calculating a distance difference (gap measurement) and / or a height difference (flush measurement) between the target surface and the measurement reference feature in the scan data based on a selected single measurement reference feature. For example, the selected single measurement reference feature may be a measurement reference feature (e.g., a point or line segment) on an edge line corresponding to the scan data.

[0092] For example, the measurement process in the multi-group calculation mode may include selecting multiple measurement reference features along the edge line corresponding to the scan data, and performing a set of gap and / or a set of flushness measurements in parallel for each measurement reference feature. For each measurement reference feature, the measurement results may include a gap value and / or flushness value, and may also include statistical results (maximum, minimum, or average) of the gap and / or flushness values.

[0093] See also Figure 3 , Figure 3 This is a schematic diagram of selecting measurement reference features in different calculation modes provided in an embodiment of the present application. Figure 3 In the , you can select a point on the edge line as the measurement reference feature to perform gap and flush measurement in the single group calculation mode; you can select multiple points on the entire edge line as the measurement reference feature to perform gap and flush measurement in the multi-group calculation mode. Figure 3 The specific numerical values ​​in the measurement results are only examples and are not used to illustrate the technical solutions, beneficial effects and protection scope of the embodiments of the present application.

[0094] In the above-described embodiment, the use of single-group and multi-group calculation modes for gap and / or flush measurement enables flexible adaptation to the needs of different scenarios. Furthermore, the multi-group calculation mode, by selecting multiple measurement reference features along an edge line, can simultaneously evaluate gap and / or flush in multiple areas. This is particularly suitable for measuring complex geometries, enhancing its applicability in complex scenarios and supporting parallel execution of measurement tasks, thereby improving measurement efficiency.

[0095] In order to effectively improve the flexibility and adaptability of the measurement process, in some embodiments, the gap and / or face difference measurement of the scan data based on the measurement reference feature may include: performing gap and / or face difference measurement calculation on the scan data based on the measurement reference feature and specified calculation parameters.

[0096] Among them, the calculation parameters may include at least one of the following: a measurement edge type parameter, a section construction parameter and a measurement point construction parameter; the measurement edge type parameter can be used to indicate the type of the measurement edge, and the type of the measurement edge includes one or more of a rounded corner less than 90 degrees, a rounded corner greater than 90 degrees, a non-rounded arc surface, and a single edge degenerated into a point or line; the section construction parameter can be used to specify the area range for constructing the section; the measurement point construction parameter can be used to specify the construction distance and / or construction angle between target points.

[0097] For example, the calculation parameters may be specified by the user through an interactive interface or automatically generated by the system according to preset rules.

[0098] See also Figure 4 , Figure 4 This is a schematic diagram of different measurement edge types provided in an embodiment of the present application. Figure 4 In the figure, different types of measurement edges are shown, which may include, but are not limited to, multiple measurement edge types such as rounded corners less than 90 degrees, rounded corners greater than 90 degrees, non-rounded arc surfaces, folded corners, horizontal straight lines, vertical lines, and single edges degenerated into points. The measurement edge type parameters can reflect the geometric characteristics of the edge of the target object, and can be used to guide the measurement algorithm to select a suitable processing method to adapt to different types of edge structures. For example, for rounded corners less than 90 degrees, a high-precision curvature fitting algorithm can be selected for processing. Non-rounded arc surfaces, such as elliptical arcs, are free-form surface edges that do not follow the law of fixed-radius arcs, and can be processed using an adaptive surface fitting algorithm. Blended corners, such as right angles and acute angles, have sharp turning points on their edges, which can be processed by a corner detection algorithm. For another example, in the case where a single edge degenerates into a point or line, the measurement algorithm can be adjusted to reduce errors caused by boundary discontinuity. It should be noted that, Figure 4 The measurement edge types are merely examples and are not intended to limit the technical solutions, beneficial effects, and protection scope of the embodiments of the present application.

[0099] Section construction parameters can be used to specify the area within which to construct the section. For example, they can include one or more of the following parameters: the section's starting position, ending position, sampling interval, and whether to project onto a theoretical surface, so that the section covers the key geometric information of the target area. Measurement point construction parameters are used to specify the construction distance and / or construction angle between target points. For example, they can define the minimum spacing between target points or the distribution rules in a specific direction, thereby improving the uniformity and rationality of the target points.

[0100] Exemplarily, based on the measurement reference feature and the specified calculation parameters, performing the measurement calculation of the gap and / or flush difference on the scan data may include: determining the measurement algorithm corresponding to the current measurement edge based on the measurement edge type parameter. Based on the section construction parameters and the measurement reference feature, generating a section plane and extracting section data. For example, a single section, a parallel section, a fan-shaped section and / or a curved section may be generated on the measurement reference feature according to the area range specified by the section construction parameters, and the section data may be extracted based on the intersection of the section plane and the scan data. Based on the measurement point construction parameters, target points are generated. For example, corresponding target points may be generated at corresponding positions of the section data according to the construction distance and angle. Based on one or more of the measurement edge, section data and target points, performing the measurement calculation of the gap and / or flush difference to obtain the gap measurement result and / or the flush difference measurement result.

[0101] In the above embodiments, in the process of measuring the gap and / or face difference of the scanned data based on the measurement reference features and specified calculation parameters, by introducing a variety of calculation parameters (such as measurement edge type parameters, section construction parameters and / or reference construction parameters, etc.), it is possible to flexibly adapt to the geometric characteristics and measurement requirements of different target objects, thereby effectively improving the flexibility and adaptability of the measurement process.

[0102] In some embodiments, the measurement reference feature includes at least one of a reference point, a reference line, and a reference plane; and the gap and / or face difference measurement of the scan data based on the measurement reference feature includes: obtaining the gap measurement result and / or face difference measurement result corresponding to the scan data by calculating the distance between the measurement reference feature and the target feature, and the target feature is determined based on the scan data.

[0103] In some embodiments, the target features may be determined based on the scan data, and the target features may include one or more of a target point, a target line, and a target surface. For example, the target features may be derived and calculated from the scan data based on measured reference features (e.g., reference points, reference lines, and / or reference surfaces), or determined through interactive operations. Alternatively, some target features may be determined through interactive operations, while others may be derived and calculated.

[0104] For example, a reference point can be constructed based on a selected feature point (i.e., a selected feature point) in the measured reference feature. For example, the reference point can be the edge point closest to the selected feature point or the selected feature point itself. For a planar feature, a center point or an intersection point can be selected as the selected feature point; for a curved surface feature, a curvature extreme point can be selected as the selected feature point.

[0105] For example, derived feature points in the scan data (such as curvature maximum points, edge intersection points, or contour inflection points, etc.) can be determined as target points based on the reference points, and the gap measurement results and / or face difference measurement results corresponding to the scan data can be obtained by calculating the distance between the reference points and the target points.

[0106] Exemplarily, the reference line can be constructed based on a selected line (i.e., a selected line) in the measured reference feature, for example, the reference line can be a contour line, a straight line or curve generated based on fitting of multiple selected feature points, or a geometric construction line derived from other reference features.

[0107] For example, the target surface involved in calculating the gap and flushness measurement result corresponding to the scanning data may be directly determined based on the scanning data, or may be constructed based on the scanning data.

[0108] For example, the direction of the reference line can be used as a normal vector to generate one or more feature surfaces perpendicular to this direction. Based on the feature surfaces, the target surface can be constructed in combination with the edge points or contour points in the scan data. The gap measurement result corresponding to the scan data can be obtained by calculating the distance between the target surfaces on both sides of the gap. For example, a parallel surface can be generated on each side of the object gap or gap, and then the distance between the two parallel surfaces can be calculated. For another example, based on the direction information of the reference line and the derived feature points in the scan data (such as the maximum curvature point, edge intersection point or contour inflection point, etc.), a set of measurement lines parallel to the reference line can be constructed as target lines. The face difference measurement result corresponding to the scan data can be obtained by calculating the distance between the reference line and the target line.

[0109] For example, based on the reference plane and combined with the derived feature points in the scan data (such as maximum curvature points, edge intersections, etc.), a set of planes parallel to the reference plane can be constructed as target planes for use in calculating the face difference corresponding to the scan data; in addition, a plane perpendicular to the cross section and the reference plane can be constructed as the target plane based on the normal of the plane where the cross section is located and the normal of the reference plane, for use in calculating the gap corresponding to the scan data.

[0110] In the above embodiment, by directly generating gap measurement results and / or face difference measurement results corresponding to the scan data based on the measurement reference features (reference points, reference lines and / or reference planes) and by calculating the distance between the measurement reference features and the target features, the measurement results corresponding to the scan data can be quickly obtained, which is suitable for measurement needs of model-free scenes or complex geometric structures.

[0111] In order to improve the reliability of the measurement results, in some embodiments, the method may further include: obtaining the gap measurement result and / or the facet measurement result corresponding to the model data by calculating the distance between the measurement reference feature and the reference feature, and the reference feature is determined based on the model data; performing deviation calculation based on the gap measurement result and / or facet measurement result corresponding to the scanning data, and the gap measurement result and / or facet measurement result corresponding to the model data to obtain the deviation calculation result corresponding to the target object.

[0112] In some embodiments, the reference features are determined based on the model data, and the reference features include one or more of reference points, reference lines, and reference surfaces. For example, the reference features can be derived and calculated from the model data based on measured reference features (such as reference points, reference lines, and / or reference surfaces), or determined through interactive operations. Alternatively, some reference features can be determined through interactive operations, while others can be derived and calculated.

[0113] For example, it can be understood that the reference surface involved in calculating the gap and flushness measurement results corresponding to the model data is different from the target surface involved in calculating the gap and flushness measurement results corresponding to the scan data. The former is a surface on the model, and the latter is a surface determined based on the scan data. However, the two can overlap or approximately overlap, and the above embodiment does not limit this. The relationship between other types of reference features (e.g., reference points, reference lines) and target features (e.g., target points, target lines) is similar to the relationship between the above-mentioned reference surface and the target surface, and will not be repeated in this article.

[0114] Illustratively, the reference features involved in calculating the gap and flush measurement results corresponding to the model data may be the same as or different from the reference features involved in calculating the gap and flush measurement results corresponding to the scan data.

[0115] For example, based on the position information of the reference point or reference line in the model data, the surface label or topological information of the corresponding structural part or mating surface can be retrieved, and the surface group to which it belongs can be determined as the reference surface to participate in the calculation of the gap and flushness measurement results corresponding to the model data.

[0116] For example, the gap measurement result corresponding to the scan data may be compared with the gap measurement result corresponding to the model data point by point or region by region to obtain a gap measurement deviation calculation result corresponding to the target object.

[0117] For example, the deviation calculation result can be expressed in numerical form (such as maximum deviation, average deviation), or can be displayed in the form of a heat map or three-dimensional visualization.

[0118] In the above embodiment, by separately calculating the measurement results corresponding to the scan data and the measurement results corresponding to the model data, and performing a deviation calculation between the two, a more comprehensive assessment of the difference between the actual state of the target object and the design requirements can be made, thereby reducing the one-sidedness that may be caused by a single data source and improving the reliability of the measurement results.

[0119] See also Figure 5 , Figure 5 This is a structural block diagram of a measurement module provided in an embodiment of the present application.

[0120] An embodiment of the present application further provides a measurement module, which includes a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, it implements the gap and flush measurement method provided by any of the aforementioned embodiments.

[0121] The measurement module may include: a memory 110, a processor 120, and a communication interface 130. The memory 110, the processor 120, and the communication interface 130 are connected via an internal connection path.

[0122] The memory 110 is used to store computer programs. In some implementations, the computer programs may include codes for implementing the methods of the embodiments of the present application.

[0123] The processor 120 is configured to execute the computer program stored in the memory 110 to control the communication interface 130 to receive input data and information and output data such as operation results. In some implementations, when the solutions of the embodiments of the present application are implemented through software or firmware, the computer program for implementing the solutions of the embodiments of the present application may be stored in the processor 120 and executed by the processor 120.

[0124] The memory 110 may be a volatile memory or a non-volatile memory, or may include both volatile and non-volatile memories. Among them, the non-volatile memory may be a read-only memory (ROM), a programmable read-only memory (Programmable ROM, PROM), an erasable programmable read-only memory (Erasable PROM, EPROM), an electrically erasable programmable read-only memory (EEPROM) or a flash memory. The volatile memory may be a random access memory (RAM). It should be noted that the memory 110 described herein is intended to include, but is not limited to, any memory of these and other suitable types. As an example, the memory 110 includes a random access memory (RAM), a cache memory and a read-only memory (ROM). Among them, the memory 110 stores a computer program, and the computer program can be executed by the processor 120 so that the processor 120 implements the steps of any of the above methods.

[0125] The processor 120 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. A general-purpose processor may be a microprocessor, or the processor 120 may be any conventional processor.

[0126] During implementation, each step of the above method can be completed by an integrated logic circuit of the hardware in the processor 120 or by instructions in the form of software. The method disclosed in conjunction with the embodiments of the present application can be directly embodied as being executed by a hardware processor, or can be executed by a combination of hardware and software modules in the processor 120. The software module can be located in a mature storage medium in the art, such as a random access memory, a flash memory, a read-only memory, a programmable read-only memory, or an electrically erasable programmable memory, a register, etc. The storage medium is located in the memory 110, and the processor 120 reads the information in the memory 110 and completes the steps of the above method in combination with its hardware. To avoid repetition, it will not be described in detail here.

[0127] In some implementations, the measurement module may include, in addition to the hardware units described above, a software module, where the software module may be, for example, an operating system, a basic input and output system (BIOS), application software, and the like.

[0128] The operating system manages one or more of the measurement module's hardware and software resources and is the core and cornerstone of the measurement module. The operating system handles basic tasks such as managing and allocating memory, prioritizing system resource supply and demand, controlling input and output devices, operating the network, and managing the file system. To facilitate user operation, most operating systems provide an interface for user interaction with the system.

[0129] The BIOS is used to run hardware initialization during the power-on boot phase and provide runtime services for the operating system and applications. In some implementations, the BIOS can also monitor and display the processor temperature and execute functions such as adjusting temperature protection strategies.

[0130] Application software, also known as application program, can be understood as software written for a specific application purpose of the user. It is one of the main categories of computer software.

[0131] An embodiment of the present application further provides a scanning device, which includes a scanning module and the measurement module described in the above embodiment, and the scanning module is used to collect scanning data of a target object.

[0132] In some implementations, the scanning device may include one or more of a handheld laser scanning device, a tracking scanning device, and an automated scanning device.

[0133] An embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the gap and flush measurement method provided in the aforementioned embodiment is implemented.

[0134] An embodiment of the present application further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the gap and flush measurement method provided in the above embodiment is implemented.

[0135] The computer program product may be a portable compact disc read-only memory (CD-ROM) and include program code, and may be run on a terminal device, such as a personal computer. However, the computer program product of the present application is not limited thereto, and the computer program product may be any combination of one or more computer-readable media.

[0136] It should be understood that the specific examples in this application are only intended to help those skilled in the art better understand the implementation methods of this application, rather than to limit the scope of protection of this application.

[0137] It can be understood that in various implementations of the present application, the size of the serial number of each process does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the present application.

[0138] It can be understood that the various embodiments described in this application can be implemented individually or in combination, and this application is not limited to this.

[0139] Unless otherwise indicated, all technical and scientific terms used in this application have the same meaning as those generally understood by those skilled in the art in the technical field of this application. The terms used in this application are only for the purpose of describing specific embodiments and are not intended to limit the scope of this application. The term "one or more" used in this application includes any and all combinations of one or more related listed items. The singular forms "a", "above", and "the" used in this application and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings.

[0140] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0141] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described embodiments may refer to the corresponding processes in other embodiments and will not be repeated here.

[0142] In the several embodiments provided in this application, it should be understood that the disclosed modules, devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of units is only a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another device, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interface, device or unit, which can be electrical, mechanical or other forms.

[0143] Units described as separate components may or may not be physically separate, and components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected according to actual needs to achieve the objectives of the technical solutions of this application.

[0144] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0145] If the function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for enabling a measurement module (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0146] The above are only specific embodiments of the present application, but the scope of protection of this application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.

Claims

1. A method for measuring gap and flushness, characterized in that: The method comprises: receiving object data of a target object; the object data comprising scan data; determining the measurement datum feature based on the model data if the object data includes model data; or determining the measurement datum feature based on the scan data or a received datum setting operation if the object data does not include model data; Based on the measurement reference feature, gap and / or flush measurement is performed on the scan data to obtain a gap measurement result and / or flush measurement result.

2. The method for measuring gap and flushness according to claim 1, wherein: In a case where the object data includes model data, before performing gap and / or flush measurement on the scan data, the method further includes: A coarse alignment and / or a fine alignment operation is performed on the scan data.

3. The method for measuring gap and flushness according to claim 1, wherein: The determining of the measurement reference feature based on the model data includes: selecting at least one feature in the model data as a measurement reference feature; The model data includes CAD data and / or model mesh data, and the selected features include one or more of planes, curved surfaces, points and lines.

4. The method for measuring gap and flushness according to claim 1, wherein: The process of determining the measurement reference features based on the scan data includes: A curvature analysis is performed on the scan data to obtain the measurement reference feature by fitting.

5. The method for measuring gap and flushness according to claim 1, wherein: The step of measuring the gap and / or flushness of the scanned data based on the measurement reference feature includes: generating at least one cross-sectional plane according to the measurement reference feature; Based on the cross-sectional plane, processing the scan data to obtain cross-sectional data; Using the cross-sectional data, gap and / or flush measurement calculations are performed to obtain the gap measurement result and / or the flush measurement result.

6. The method for measuring gap and flushness according to claim 5, wherein: The cross-sectional plane includes one or more of a single cross-sectional plane, a parallel cross-sectional plane, a fan-shaped cross-sectional plane, and a curved cross-sectional plane.

7. The method for measuring gap and flushness according to claim 1, wherein: The step of measuring the gap and / or flushness of the scanned data based on the measurement reference feature includes: Determining at least one target point corresponding to the scan data through an interactive operation based on the measurement reference feature, or determining at least one target point corresponding to the scan data according to specified measurement point setting parameters; the interactive operation includes selecting a measurement point and / or editing a measurement point; Based on the determined target point, a gap and / or flush measurement calculation is performed to obtain the gap measurement result and / or the flush measurement result.

8. The method for measuring gap and flushness according to claim 7, wherein: The scan data includes point cloud data, and determining at least one target point corresponding to the scan data according to the specified measurement point setting parameters includes: Processing the point cloud data to generate scanned mesh data; setting parameters based on the measurement points, selecting at least one target point from a mesh edge and / or mesh surface corresponding to the scanned mesh data and / or generating at least one target point by fitting; or, Based on the point cloud data, at least one target point is selected and / or at least one target point is generated by fitting.

9. The method for measuring gap and flushness according to claim 1, wherein: The step of measuring the gap and / or flushness of the scanned data based on the measurement reference feature includes: In a single-group calculation mode, a group of gap measurements and / or flushness measurements are performed on the scan data based on a selected single measurement reference feature to obtain a gap measurement result and / or flushness measurement result corresponding to the single measurement reference feature; or In the multi-group calculation mode, multiple measurement reference features are selected along the edge line corresponding to the scan data, and based on each measurement reference feature, a corresponding set of gap measurement and / or flush difference measurement is performed on the scan data to synchronously obtain gap measurement results and / or flush difference measurement results corresponding to multiple measurement reference features.

10. The method for measuring gap and flushness according to claim 1, wherein: The step of measuring the gap and / or flushness of the scanned data based on the measurement reference feature includes: performing gap and / or flush measurement calculations on the scan data based on the measurement datum features and specified calculation parameters; The calculation parameters include at least one of the following: The measurement edge type parameter is used to indicate the type of the measurement edge, which includes one or more of a rounded corner less than 90 degrees, a rounded corner greater than 90 degrees, a non-rounded arc surface, and a single edge degenerated into a point or line; Section construction parameters, used to specify the area range for constructing sections; Measure point construction parameters, which specify the construction distance and / or construction angle between target points.

11. The method for measuring gap and flushness according to claim 1, wherein: The measurement reference feature includes at least one of a reference point, a reference line, and a reference plane; and the gap and / or flush measurement of the scanned data based on the measurement reference feature includes: The gap measurement result and / or flushness measurement result corresponding to the scan data are obtained by calculating the distance between the measurement reference feature and the target feature, and the target feature is determined based on the scan data.

12. The method for measuring gap and flushness according to claim 11, wherein: The method further comprises: Obtaining a gap measurement result and / or a flush measurement result corresponding to the model data by calculating a distance between the measurement reference feature and a reference feature, the reference feature being determined based on the model data; Based on the gap measurement results and / or facet measurement results corresponding to the scan data and the gap measurement results and / or facet measurement results corresponding to the model data, deviation calculation is performed to obtain a deviation calculation result corresponding to the target object.

13. A measurement module, characterized in that: The measurement module includes a memory and a processor, the memory stores a computer program, and the processor implements the method according to any one of claims 1 to 12 when executing the computer program.

14. A scanning device, characterized in that: The scanning device includes a scanning module and the measurement module according to claim 13, and the scanning module is used to collect scanning data of the target object.

15. The scanning device according to claim 14, wherein: The scanning device includes one or more of a handheld laser scanning device, a tracking scanning device and an automated scanning device.

16. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method according to any one of claims 1 to 12 is implemented.

17. A computer program product, characterized in that The computer program product comprises a computer program, and when the computer program is executed by a processor, the method according to any one of claims 1 to 12 is implemented.

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