Display device

Abstract

The invention discloses a display device which comprises a plurality of data lines, a plurality of first fan-out wires, a first test switch group and a second test switch group. The first test switch group is arranged in the first peripheral area, the plurality of first fan-out wires are arranged in the second peripheral area, the first test switch group comprises a plurality of first switches, and the plurality of first switches are correspondingly connected with the plurality of data lines; the second test switch group is arranged in the second peripheral area, the second test switch group comprises a plurality of second switches, and the plurality of second switches are connected to the corresponding data lines through a plurality of first fan-out wires; in a first test stage, the plurality of first switches receive a first control signal to transmit a first test signal to the plurality of data lines; in a second test stage, the plurality of second switches receive a second control signal to transmit a second test signal to the plurality of data lines through the plurality of first fan-out traces. According to the invention, while the narrow frame trend is catered, the detection accuracy and the normal use of the subsequent display panel can be ensured.

Description

Technical Field

[0001] The present invention relates to a display device, and in particular to a display device with a narrow frame. Background Art

[0002] With the advancement of technology, people have higher and higher requirements for the screen-to-body ratio of display devices. Based on this, there is an existing technology that sets the circuit used for testing during the display panel manufacturing process on the upper frame of the display panel to simplify the circuit design of the lower frame of the display panel. Please refer to Figure 1 , Figure 1 This is a partial schematic diagram of a display panel of the prior art. The display panel has a display area AA', an upper frame area BA1' and a lower frame area BA2', wherein the upper frame area BA1' and the lower frame area BA2' are respectively adjacent to opposite sides of the display area AA'. The display area AA' is provided with multiple data lines (not shown), and the upper frame area BA1' is provided with a switch group T1' for performing image detection, and the switch group T1' is connected to the upper end of each data line. The lower frame area BA2' is provided with multiple connection pads (not shown) and multiple fan-out traces (not shown), wherein the multiple connection pads are used to bind the driver IC when the display panel is detected to be normal, and the two ends of each fan-out trace are respectively connected to the connection pad corresponding to the driver IC and the lower end of the data line, so that the data signal output by the driver IC can be transmitted from the lower end of each data line to each data line via the fan-out trace. When performing image detection, the test signal generated by the signal generator is transmitted from the upper end of the data line to each data line via the switch group T1' so that the inspector can determine whether there is any display abnormality in the display panel. Because the test signal is transmitted from the upper end of the data line, a broken fan-out trace in the lower frame area BA2' will not affect the display in the display area AA', resulting in such defects not being effectively detected during the image inspection phase. Therefore, even if the display panel is tested as normal during the image inspection phase, it may still not display properly when connected to the driver IC and used normally due to an abnormality such as a broken fan-out trace.

[0003] Therefore, how to ensure detection accuracy and subsequent normal use of display panels while catering to the trend of narrow-frame design is a technical problem that needs to be solved. Summary of the Invention

[0004] An object of the present invention is to provide a display device to solve the above problems.

[0005] To achieve the above objectives, the present invention provides a display device comprising a display area, a first peripheral area, and a second peripheral area, wherein the first peripheral area is adjacent to a first side of the display area, the second peripheral area is adjacent to a second side of the display area, and the first side is opposite to the second side. The display device includes multiple data lines, multiple first fan-out lines, a first test switch group, and a second test switch group. The plurality of data lines are arranged in the display area and extend along a first direction; the plurality of first fan-out traces are arranged in the second peripheral area, and the plurality of first fan-out traces are connected to the plurality of data lines in a one-to-one correspondence; the first test switch group is arranged in the first peripheral area, and the first test switch group includes a plurality of first switches, and the plurality of first switches are connected to the plurality of data lines in a corresponding manner; the second test switch group is arranged in the second peripheral area, and the second test switch group includes a plurality of second switches, and the plurality of second switches are connected to the corresponding data lines via the plurality of first fan-out traces; in a first test phase, the plurality of first switches receive a first control signal to transmit a first test signal to the plurality of data lines; in a second test phase, the plurality of second switches receive a second control signal to transmit a second test signal to the plurality of data lines via the plurality of first fan-out traces, wherein the size of the plurality of first switches is larger than the size of the plurality of second switches.

[0006] As an optional technical solution, the display device further includes a test pad group arranged in the second peripheral area, the test pad group includes a first test pad, a second test pad and at least one third test pad, the at least one third test pad is connected to the multiple first switches and the multiple second switches via at least one signal line, the first test pad is connected to the control end of the multiple first switches, and the second test pad is connected to the control end of the multiple second switches; in the first test phase, the first control signal transmitted by the first test pad causes the multiple first switches to open, and the multiple first switches receive the first test signal from the at least one third test pad and transmit it to the multiple data lines; in the second test phase, the second control signal transmitted by the second test pad causes the multiple second switches to open, and the multiple second switches receive the second test signal from the at least one third test pad and transmit it to the multiple data lines via the multiple first fan-out lines.

[0007] As an optional technical solution, the display device further includes a plurality of touch lines arranged in the display area and extending along the first direction, and a touch test switch group and a plurality of second fan-out routing lines arranged in the second peripheral area. The second test switch group is located between the display area and the touch test switch group. The touch test switch group includes a plurality of touch test switches, and the plurality of touch test switches are electrically connected to the plurality of touch lines via the plurality of second fan-out routing lines.

[0008] As an optional technical solution, the display device further includes a first signal line and a second signal line, the first test pad and the control ends of the multiple first switches are connected to the first signal line, and the second test pad and the control ends of the multiple second switches are connected to the second signal line.

[0009] As an optional technical solution, the test pad group further includes at least one fourth test pad, which is connected to the multiple touch test switches via at least one signal line, and the control ends of the multiple touch test switches are connected to the second signal line. In the first test phase and / or the second test phase, the second control signal transmitted by the second test pad causes the multiple touch test switches to open, and the multiple touch test switches receive the touch test signal from the at least one fourth test pad and transmit it to the multiple touch lines.

[0010] As an optional technical solution, the test pad group further includes a touch test pad, at least one fourth test pad and a third signal line, the at least one fourth test pad is connected to the multiple touch test switches via at least one signal line, and the third signal line connects the touch test pad and the control ends of the multiple touch test switches; in the first test phase and / or the second test phase, the touch test pad transmits a third control signal to open the multiple touch test switches, and the multiple touch test switches receive the touch test signal from the at least one fourth test pad and transmit it to the multiple touch lines.

[0011] As an optional technical solution, in the first test phase, the first test pad transmits a high-level signal as the first control signal, the multiple first switches are opened, and the multiple data lines receive the first test signal; in the second test phase, the second test pad transmits a high-level signal as the second control signal, the multiple second switches are opened, and the multiple data lines receive the second test signal via the multiple first fan-out lines.

[0012] As an optional technical solution, the size of the multiple touch test switches is larger than the size of the multiple second switches.

[0013] As an optional technical solution, the display device further includes a driving unit, which is disposed in the second peripheral area, and a projection range of the driving unit in the second peripheral area covers the second test switch group and the touch test switch group.

[0014] As an optional technical solution, the display device further includes a driving unit, which includes a sinking area and a straight area. The sinking area is located on at least one side of the straight area, and the size of the sinking area is smaller than the size of the straight area. The second test switch group is located within the projection range of the straight area on the second peripheral area, and the second test switch group is connected to at least part of the multiple first fan-out lines; the touch test switch group is located within the projection range of the sinking area and the straight area on the second peripheral area.

[0015] In summary, the display device of the present invention provides a first test switch group comprising multiple first switches on a first side adjacent to the display area to confirm the normal operation of circuits within the display area during a first test phase. Simultaneously, a second test switch group comprising multiple second switches is provided on a second side adjacent to the display area to confirm the normal operation of multiple first fan-out lines within the second peripheral area, as well as the connection between the multiple first fan-out lines and corresponding data lines, during a second test phase. The multiple second switches are smaller than the multiple first switches, thereby minimizing the space occupied by the second test switch group. This ensures test accuracy and subsequent normal operation of the display panel while meeting the trend toward narrow bezels.

[0016] The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments, but this does not limit the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 A partial schematic diagram of a display panel in the prior art; Figure 2 is a partial schematic diagram of an embodiment of a display device of the present invention; Figure 3 is a partial circuit diagram of an embodiment of a display device of the present invention; Figure 4 To correspond Figure 3 Timing diagram of Figure 5 is a partial schematic diagram of another embodiment of a display device of the present invention; Figure 6 FIG. 1 is a partial circuit diagram of another embodiment of a display device according to the present invention. DETAILED DESCRIPTION

[0018] In order to provide a further understanding of the purpose, structure, features and functions of the present invention, the following detailed description is given in conjunction with the embodiments.

[0019] Please refer to Figure 2 and Figure 3 , Figure 2 is a partial schematic diagram of an embodiment of a display device of the present invention, Figure 3 FIG. 1 is a partial circuit diagram of an embodiment of a display device of the present invention. Figure 4 To correspond Figure 3Timing diagram. The display device 100 of the present invention has a display area AA, a first peripheral area BA1, and a second peripheral area BA2. The first peripheral area BA1 is adjacent to the first side of the display area AA (the upper side in this embodiment), and the second peripheral area BA2 is adjacent to the second side of the display area AA (the lower side in this embodiment), and the first side is opposite to the second side. The display device 100 includes multiple data lines d1, multiple first fan-out lines f1, a first test switch group T1, and a second test switch group T2. The multiple data lines d1 are arranged in the display area AA and extend along the first direction F1 and are arranged at intervals along the second direction F2. The multiple first fan-out lines f1 are arranged in the second peripheral area BA2, and the multiple first fan-out lines f1 are connected to the multiple data lines d1 in a one-to-one correspondence. The first test switch group T1 is arranged in the first peripheral area BA1. The first test switch group T1 includes multiple first switches t1. The multiple first switches t1 are correspondingly connected to the multiple data lines d1 (specifically, the upper ends of the multiple data lines d1). The second test switch group T2 is disposed in the second peripheral area BA2 and includes a plurality of second switches t2. The plurality of second switches t2 are connected to corresponding data lines d1 (specifically, the lower ends of the plurality of data lines d1) via a plurality of first fan-out traces f1. During a first test phase ct1, the plurality of first switches t1 receive a first control signal us to transmit a first test signal s1 to the plurality of data lines d1. During a second test phase ct2, the plurality of second switches t2 receive a second control signal ds to transmit a second test signal s2 to the plurality of data lines d1 via the plurality of first fan-out traces f1. The plurality of first switches t1 are larger than the plurality of second switches t2.

[0020] like Figure 2 and Figure 3 As shown, the display device 100 further includes a test pad set disposed in the second peripheral area BA2. The test pad set includes a first test pad p1, a second test pad p2, and at least one third test pad p3. The at least one third test pad p3 is connected to a plurality of first switches t1 and a plurality of second switches t2 via at least one signal line. The first test pad p1 is connected to the control terminals of the plurality of first switches t1 to provide a first control signal us to each first switch t1. The second test pad p2 is connected to the control terminals of the plurality of second switches t2 to provide a second control signal ds to each second switch t2. During a first test phase ct1, the first test pad p1 transmits the first control signal us to turn on the plurality of first switches t1. The plurality of first switches t1 then receive a first test signal s1 from the at least one third test pad p3 and transmit the signal to a plurality of data lines d1. During a second test phase ct2, the second test pad p2 transmits the second control signal ds to turn on the plurality of second switches t2. The plurality of second switches t2 then receive a second test signal s2 from the at least one third test pad p3 and transmit the signal to a plurality of data lines d1 via a plurality of first fan-out traces f1.

[0021] In one embodiment, during a first test phase ct1, a signal generator generates a corresponding signal. A first test pad p1 receives a first control signal us and transmits it via a signal line, for example, located on the left side of the display area AA, to a plurality of first switches t1 located in the first peripheral area BA1 (located above the display area AA in this embodiment). The first control signal us then causes the plurality of first switches t1 to open. At least one third test pad p3 receives a first test signal s1 and transmits it via a signal line, for example, located on the left side of the display area AA, to the first ends of the plurality of first switches t1. Since the plurality of first switches t1 are open, the first test signal s1 is transmitted from the second ends of the plurality of first switches t1 to the corresponding data lines d1. In one embodiment, there are three at least one test pad p3, each receiving three data signals (e.g., R / G / B data signals) for transmission via the plurality of first switches t1 and the plurality of data lines d1 to the corresponding pixel units. The pixel units then display the corresponding images based on the received data signals. The tester then confirms whether the display device 100 being tested is functioning properly based on the displayed image of the display device 100, such as confirming whether the circuits within the display area AA are functioning properly.

[0022] In one embodiment, during the second test phase ct2, the signal generator generates a corresponding signal, and the second test pad p2 receives the second control signal ds, causing the plurality of second switches t2 located in the second peripheral area BA2 to open. Simultaneously, at least one third test pad p3 receives the second test signal s2 and transmits it to the first ends of the plurality of second switches t2. The signal is then transmitted from the second ends of the plurality of second switches t2 to the corresponding first fan-out traces f1 and data lines d1, causing the display device 100 to display the corresponding image. Furthermore, during the second test phase ct2, the first test pad p1 receives the first control signal us generated by the signal generator, causing the plurality of first switches t1 to close. Since each data line d1 can only receive data signals from the corresponding first fan-out line f1 during this test phase, if there is an abnormality in a first fan-out line f1 itself or in its connection with the corresponding data line, the pixel unit corresponding to the corresponding first data line will not display normally. The tester can confirm whether the display device 100 currently under test is normal based on the screen display of the display device 100. Specifically, the tester can confirm whether the multiple first fan-out lines f1 in the second peripheral area BA2 and the connections between the multiple first fan-out lines f1 and the corresponding data lines d1 are normal. It should be noted that Figure 3 The circuit in the figure is for illustration only and is not limited to this in actual operation.

[0023] The display device 100 of the present invention employs a first test switch group T1 comprising multiple first switches t1 disposed on a first side adjacent to the display area AA to verify the normal operation of circuits within the display area AA during a first test phase ct1. Simultaneously, a second test switch group T2 comprising multiple second switches t2 disposed on a second side adjacent to the display area AA verifies the normal operation of multiple first fan-out lines f1 within the second peripheral area BA2 and the connections between the multiple first fan-out lines f1 and corresponding data lines d1 during a second test phase ct2. The multiple second switches t2 are smaller than the multiple first switches t1, minimizing the space occupied by the second test switch group T2. This ensures test accuracy and subsequent normal operation of the display panel while meeting the trend toward narrow bezels.

[0024] like Figure 4 As shown, during the first test phase ct1, the second test pad p2 can also simultaneously receive a corresponding control signal generated by the signal generator, causing the plurality of second switches t2 located in the second peripheral area BA2 to open. The first test signal s1 received by at least one third test pad p3 can also be simultaneously transmitted to the first ends of the plurality of second switches t2 and then from the second ends of the plurality of second switches t2 to the corresponding first fan-out trace f1. At this time, by simultaneously opening the plurality of first switches t1 and second switches t2, the display device 100 can display the corresponding image, thereby confirming whether the display device 100 currently being tested is functioning properly. In other embodiments, this is not a limitation.

[0025] In the present invention, the size of each second switch t2 can be smaller than that of each first switch t1. The first and second switches t1 can be thin-film transistors. The channel length of the second switch t2 can be the same as that of the first switch t1. Furthermore, the channel width of the second switch t2 is much smaller than that of the first switch t1, resulting in the size of the second switch t2 being much smaller than that of the first switch t1. For example, the width-to-length ratio (W / L) of the second switch t2 is 30 μm / 4 μm, while the width-to-length ratio (W / L) of the first switch t1 is 250 μm / 4 μm. During testing, each second switch t2 may experience undercharging. However, the first test phase ct1 utilizes the first test switch group T1 to transmit test signals. Meanwhile, in the second test phase ct2, it is not necessary to perform screen detection on the entire display area AA. Instead, it is only necessary to test each first fan-out trace f1 and the connection between each first fan-out trace f1 and the corresponding data line, so that each second test signal s2 can be transmitted to the lower end of each data line d1. Therefore, even if the width-to-length ratio of the switch is significantly reduced, each second switch t2 can still ensure the test in the second test phase ct2.

[0026] like Figure 3As shown, the display device 100 further includes a plurality of touch lines tm disposed in the display area AA, extending along a first direction F1 and spaced apart along a second direction F2; and a touch test switch group T3 and a plurality of second fan-out traces f2 disposed in the second peripheral area BA2. The touch test switch group T3 includes a plurality of touch test switches t3, which are electrically connected to the plurality of touch lines tm via the plurality of second fan-out traces f2. During the first test phase ct1 and / or the second test phase ct2, the touch test switch group T3 receives a touch test signal and transmits it to each touch line t1 to test the touch function of the display device 100.

[0027] like Figure 2 As shown, the test pad set further includes at least one fourth test pad p4, which is connected to multiple touch test switches t3 via at least one signal line. The control terminals of the multiple touch test switches t3 are connected to the second signal line l2. During the first test phase ct1 and / or the second test phase ct2, the second test pad p2 transmits a second control signal ds to open the multiple touch test switches t3. The multiple touch test switches t3 receive touch test signals from the at least one fourth test pad p4 and transmit them to the multiple touch lines tm. In one embodiment, there are two at least four test pads p4, each receiving two potential signals (e.g., even / odd signals, labeled te and to in the figure) and transmitting them to the corresponding touch lines tm via the multiple touch test switches t3 and the multiple second fan-out traces f2.

[0028] In one embodiment, during the first test phase ct1, a signal generator generates a corresponding signal, and the second test pad p2 receives a second control signal ds. This second control signal ds causes the plurality of second switches t2 and the plurality of touch test switches t3 connected to the second signal line l2 to open. Simultaneously, the first test signal s1 received by at least one third test pad p3 is transmitted to the first ends of the plurality of second switches t2 and from the second ends of the plurality of second switches t2 to the corresponding first fan-out trace f1. The touch test signal received by at least one fourth test pad p4 is transmitted to the first ends of the plurality of touch test switches t3 and from the second ends of the plurality of touch test switches t3 to the corresponding second fan-out trace f2, and then to the corresponding touch line tm via the corresponding second fan-out trace f2. Thus, during the first test phase ct1, display function testing is performed by opening the plurality of first switches t1 and second switches t2, while touch function testing is performed simultaneously via the touch test signals transmitted by the plurality of touch test switches t3.

[0029] In one embodiment, the plurality of first switches t1, the plurality of second switches t2, and the plurality of touch test switches t3 are N-type thin film transistors. The display device 100 further includes a first signal line l1 and a second signal line l2. The control ends of the first test pad p1 and the plurality of first switches t1 are connected to the first signal line l1. The control ends of the second test pad p2 and the plurality of second switches t2 are connected to the second signal line l2. Figure 4 As shown, during the first test phase ct1, the first test pad p1 transmits a high-level signal as the first control signal us via the first signal line l1, causing multiple first switches t1 to open and multiple data lines d1 to receive the first test signal s1 for performing a corresponding screen test. During the second test phase ct2, the second test pad p2 transmits a high-level signal as the second control signal ds via the second signal line l2, causing multiple second switches t2 to open and multiple data lines d1 to receive the second test signal s2 via multiple first fan-out traces for performing a corresponding screen test. In other embodiments, the first switch t1, second switch t2, and touch test switch t3 are not limited to this. In one embodiment, the size of the multiple touch test switches t3 is larger than the size of the multiple second switches t2. This ensures the electrical performance of the multiple test switches t3, such as charging efficiency, and ensures effective testing of each touch line tm.

[0030] like Figure 2 As shown, the display device 100 further includes a driver unit 110. The driver unit 110 is disposed in the second peripheral area BA2, and the projection of the driver unit 110 in the second peripheral area BA2 covers the second test switch group T2 and the touch test switch group T3. When the display device 100 is determined to be normal in both the first test phase ct1 and the second test phase ct2, the driver unit 110 can be assembled. The driver unit 110 is configured to provide data signals and touch sensing signals during the normal use phase nd, and transmit them to the data lines d1 and the touch lines tm via the first fan-out trace f1 and the second fan-out trace f2. During the normal use phase nd, the first switches t1, the second switches t2, and the touch test switches t3 are closed upon receiving corresponding control signals (e.g., low-level signals), without affecting the transmission of the signals generated by the driver unit 110.

[0031] like Figure 2 In the embodiment shown, the driving unit 110 is rectangular, but in actual operation, it is not limited to this. Figure 5 , Figure 5This is a partial schematic diagram of another embodiment of a display device according to the present invention. In this embodiment, the driving unit 110 includes a linear region a and a sinking region b. The sinking region b is located on at least one side of the linear region a and has a smaller size (in the first direction F1) than the linear region a. A second test switch group T2 is located within the projection of the linear region a onto the second peripheral region. The second test switch group T2 is connected to at least a portion of a plurality of first fan-out traces f1, such as the first fan-out trace f1 corresponding to the data line d1 in the middle region of the display area AA. Alternatively, the second test switch group T2 can be connected to the first fan-out traces f1 corresponding to all data lines d1. A touch test switch group T3 is located within the projection of the sinking region b and the linear region a onto the second peripheral region.

[0032] like Figure 3 In the embodiment shown, the control ends of the plurality of second switches t2 and the plurality of touch test switches t3 are connected to the same test pad via the same signal line. When the driving unit 110 includes a straight area a and a sinking area b, especially when the second test switch group T2 is not connected to all data lines d1, the touch test switch group T3 can be designed independently from the second test switch group T2. Figure 6 , Figure 6 This is a partial circuit diagram of another embodiment of a display device according to the present invention. The display device 100 further includes a touch test pad (not shown) disposed in the second peripheral area BA2, at least one fourth test pad p4, and a third signal line l3. The at least one fourth test pad p4 is connected to a plurality of touch test switches t3 via at least one signal line. The third signal line l3 connects the touch test pad and the control terminals of the plurality of touch test switches t3. During the first test phase ct1 and / or the second test phase ct2, the touch test pad transmits a third control signal tp to open the plurality of touch test switches t3. The plurality of touch test switches t3 receive the touch test signal from the at least one fourth test pad p4 and transmit it to the plurality of touch lines tm. This ensures effective touch function detection.

[0033] In summary, the display device of the present invention provides a first test switch group comprising multiple first switches on a first side adjacent to the display area to verify the normal operation of circuits within the display area during a first test phase ct1. Simultaneously, a second test switch group comprising multiple second switches is provided on a second side adjacent to the display area to verify the normal operation of multiple first fan-out traces f1 within the second peripheral area, as well as the connection between the multiple first fan-out traces f1 and the corresponding data lines, during a second test phase ct2. The multiple second switches are smaller than the multiple first switches, thereby minimizing the space occupied by the second test switch group. This ensures test accuracy and subsequent normal operation of the display panel while meeting the trend toward narrow bezels.

[0034] Of course, the present invention may have many other embodiments. Without departing from the spirit and essence of the present invention, those skilled in the art may make various corresponding changes and modifications based on the present invention, but these corresponding changes and modifications should all fall within the scope of protection of the claims attached to the present invention.

Claims

1. A display device comprising a display area, a first peripheral area, and a second peripheral area, wherein the first peripheral area is adjacent to a first side of the display area, the second peripheral area is adjacent to a second side of the display area, and the first side is opposite to the second side, wherein: The display device comprises: A plurality of data lines are arranged in the display area and extend along a first direction; A plurality of first fan-out routing lines are provided in the second peripheral area, and the plurality of first fan-out routing lines are connected to the plurality of data lines in a one-to-one correspondence; a first test switch group disposed in the first peripheral area, the first test switch group comprising a plurality of first switches, the plurality of first switches being correspondingly connected to the plurality of data lines; and A second test switch group is disposed in the second peripheral area, the second test switch group includes a plurality of second switches, and the plurality of second switches are connected to corresponding data lines via the plurality of first fan-out traces; In a first test phase, the plurality of first switches receive a first control signal to transmit a first test signal to the plurality of data lines; in a second test phase, the plurality of second switches receive a second control signal to transmit a second test signal to the plurality of data lines via the plurality of first fan-out traces, wherein the size of the plurality of first switches is larger than the size of the plurality of second switches.

2. The display device according to claim 1, wherein The display device further includes a test pad group disposed in the second peripheral area, the test pad group including a first test pad, a second test pad, and at least one third test pad. The at least one third test pad is connected to the plurality of first switches and the plurality of second switches via at least one signal line, the first test pad is connected to the control ends of the plurality of first switches, and the second test pad is connected to the control ends of the plurality of second switches. In the first test phase, the first control signal transmitted by the first test pad causes the plurality of first switches to be turned on, and the plurality of first switches receive the first test signal from the at least one third test pad and transmit the signal to the plurality of data lines. In the second test phase, the second control signal transmitted by the second test pad causes the plurality of second switches to be turned on, and the plurality of second switches receive the second test signal from the at least one third test pad and transmit the signal to the plurality of data lines via the plurality of first fan-out lines.

3. The display device according to claim 2, wherein: The display device further includes a plurality of touch lines arranged in the display area and extending along a first direction, and a touch test switch group and a plurality of second fan-out routing lines arranged in the second peripheral area. The second test switch group is located between the display area and the touch test switch group. The touch test switch group includes a plurality of touch test switches, and the plurality of touch test switches are electrically connected to the plurality of touch lines via the plurality of second fan-out routing lines.

4. The display device according to claim 3, wherein: The display device further includes a first signal line and a second signal line. The first test pad and the control ends of the first switches are connected to the first signal line. The second test pad and the control ends of the second switches are connected to the second signal line.

5. The display device according to claim 4, wherein: The test pad set further includes at least one fourth test pad, which is connected to the multiple touch test switches via at least one signal line. The control ends of the multiple touch test switches are connected to the second signal line. During the first test phase and / or the second test phase, the second control signal transmitted by the second test pad causes the multiple touch test switches to be turned on. The multiple touch test switches receive the touch test signal from the at least one fourth test pad and transmit it to the multiple touch lines.

6. The display device according to claim 4, wherein: The test pad group further includes a touch test pad, at least one fourth test pad and a third signal line. The at least one fourth test pad is connected to the multiple touch test switches via at least one signal line. The third signal line connects the touch test pad and the control ends of the multiple touch test switches. During the first test phase and / or the second test phase, the touch test pad transmits a third control signal to turn on the multiple touch test switches. The multiple touch test switches receive the touch test signal from the at least one fourth test pad and transmit it to the multiple touch lines.

7. The display device according to claim 3, wherein: In the first test phase, the first test pad transmits a high-level signal as the first control signal, the multiple first switches are turned on, and the multiple data lines receive the first test signal. In the second test phase, the second test pad transmits a high-level signal as the second control signal, the multiple second switches are turned on, and the multiple data lines receive the second test signal via the multiple first fan-out traces.

8. The display device according to claim 3, wherein The size of the plurality of touch test switches is larger than that of the plurality of second switches.

9. The display device according to claim 3, wherein: The display device further includes a driving unit, which is disposed in the second peripheral area. A projection range of the driving unit in the second peripheral area covers the second test switch group and the touch test switch group.

10. The display device according to claim 3, wherein The display device further includes a driving unit, which includes a sinking area and a straight area. The sinking area is located on at least one side of the straight area, and the size of the sinking area is smaller than the size of the straight area. The second test switch group is located within the projection range of the straight area on the second peripheral area, and the second test switch group is connected to at least part of the multiple first fan-out lines; the touch test switch group is located within the projection range of the sinking area and the straight area on the second peripheral area.

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