Method and device for detecting quality of full-color micro-layer, electronic equipment and storage medium

Abstract

The application provides a quality detection method and device of a full-color micro-layer, electronic equipment and a storage medium, wherein the method comprises: controlling a multi-spectrum light source to irradiate a full-color micro-layer to be detected with visible light of different wavelengths respectively; for each visible light, identifying the brightness value of each pixel point in the full-color micro-layer under the irradiation of the visible light; for each pixel point in the full-color micro-layer, determining the display color of the pixel point according to the brightness value of the pixel point under the irradiation of each visible light; taking the color of the pixel point in the original image as the standard color of the pixel point, comparing the display color of the pixel point with the standard color to obtain the comparison result of the pixel point; and judging whether there is a quality defect in the full-color micro-layer according to the comparison result of each pixel point. Through the method, the problem of poor subjectivity and consistency of defect detection is solved, the detection accuracy and efficiency are improved, and the false detection rate is reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the quality detection technical field, and particularly to a quality detection method and device of full-color micro-layer, electronic equipment and storage medium. BACKGROUND

[0002] Full-color micro-layer technology is a leading technology for forming high-resolution color images on the surface of a substrate. This technology is widely used in the fields of photovoltaic module beautification and industrial product appearance customization. Its core value lies in the integration of functional materials (such as photovoltaic panels) and environmental aesthetics.

[0003] Currently, when detecting the quality of full-color micro-layer, artificial visual inspection is usually used to detect whether there are scratches, ink spots and other quality defects on the surface of the full-color micro-layer. Due to the differences in experience, vision state and subjective standard of different detection personnel, the defect determination results are inconsistent. Moreover, the multi-color superposition and texture change of the full-color micro-layer can cover up defects such as bubbles and dirt, and artificial visual inspection is difficult to separate abnormal areas in a complex background. In addition, long-term repeated detection can easily cause distraction, especially in a strong light environment, the misjudgment rate significantly increases with the working time. Furthermore, artificial visual inspection is low in efficiency and difficult to match the automatic production line. SUMMARY

[0004] Therefore, the purpose of the present application is to provide a quality detection method and device of full-color micro-layer, electronic equipment and storage medium, so as to solve the problems of subjectivity and inconsistency of defect detection, and improve the detection accuracy and efficiency and reduce the misjudgment rate.

[0005] In a first aspect, the embodiments of the present application provide a quality detection method of full-color micro-layer, a plurality of visible lights with different wavelengths are integrated in a multi-spectral light source, and the method comprises:

[0006] controlling the multi-spectral light source to switch the visible lights with different wavelengths, so that the multi-spectral light source uses the visible lights with different wavelengths to irradiate the full-color micro-layer to be detected respectively;

[0007] For each of the visible lights in the multi-spectral light source, when the multi-spectral light source uses the visible light to irradiate the full-color micro-layer, the brightness value of each pixel point in the full-color micro-layer under the irradiation of the visible light is identified;

[0008] For each pixel point in the full-color micro-layer, the display color of the pixel point is determined according to the brightness values of the pixel point under the irradiation of each visible light;

[0009] The color of the pixel point in the original image is taken as a standard color of the pixel point, and the display color of the pixel point is compared with the standard color to obtain a comparison result of each pixel point; wherein the full-color micro layer is made according to the original image;

[0010] According to the comparison result of each pixel point, it is judged whether there is a quality defect in the full-color micro layer.

[0011] In combination with the first aspect, the first possible implementation manner of the first aspect is provided, wherein the identifying the luminance value of each pixel point in the full-color micro layer under the irradiation of the visible light by the multispectral light source comprises:

[0012] The luminance value of each pixel point in the full-color micro layer under the irradiation of the visible light by the multispectral light source is identified by a spectral camera; wherein the illumination light path of the multispectral light source and the imaging light path of the spectral camera are coaxially arranged by using a semi-transparent light splitting plate.

[0013] In combination with the first possible implementation manner of the first aspect, the second possible implementation manner of the first aspect is provided, wherein a semi-transparent light splitting plate is arranged at 45 degrees above the full-color micro layer, and one side of the semi-transparent light splitting plate is coated with a semi-transparent and semi-reflective film coating;

[0014] When the multispectral light source irradiates the full-color micro layer to be detected by using the visible light, the light of the visible light sequentially passes through a collimating lens and a first polarizer, and is irradiated to one side of the semi-transparent and semi-reflective film coating of the semi-transparent light splitting plate at 45 degrees, and part of the light reflected by the semi-transparent light splitting plate is vertically irradiated to the full-color micro layer to form an illumination light path.

[0015] The reflected light of the full-color micro layer is irradiated to one side of the semi-transparent and semi-reflective film coating of the semi-transparent light splitting plate at 45 degrees, and the reflected light is transmitted through the semi-transparent light splitting plate and sequentially passes through a second polarizer and an imaging lens to enter the spectral camera to form an imaging light path.

[0016] In combination with the first possible implementation manner of the first aspect, the third possible implementation manner of the first aspect is provided, wherein the identifying the luminance value of each pixel point in the full-color micro layer under the irradiation of the visible light by the multispectral light source comprises:

[0017] When the multi-spectrum light source uses the visible light to irradiate the full-color micro-pattern layer, reflected light of the full-color micro-pattern layer under the visible light enters the spectrum camera through the tunable filter; wherein, the tunable filter splits the reflected light entering the spectrum camera into visible light of multiple sub-wavelengths by switching; the sub-wavelength is a wavelength in a wavelength range of a color corresponding to the visible light;

[0018] The spectrum camera outputs a brightness value of each sub-wavelength corresponding to light of each pixel point in the full-color micro-pattern layer under the visible light.

[0019] With reference to the third possible implementation manner of the first aspect, a fourth possible implementation manner of the first aspect is provided in the embodiments of the present application, and the fourth possible implementation manner comprises:

[0020] For each pixel point in the full-color micro-pattern layer, brightness values of the pixel point under light of each sub-wavelength are connected into a curve in a size order of the sub-wavelengths to obtain a reflectance spectrum of the pixel point.

[0021] The display color of the pixel point is determined according to a curve shape in the reflectance spectrum of the pixel point.

[0022] With reference to the fourth possible implementation manner of the first aspect, a fifth possible implementation manner of the first aspect is provided in the embodiments of the present application, and the fifth possible implementation manner comprises:

[0023] The curve shape in the reflectance spectrum of the pixel point is compared with curve shapes in standard reflectance spectra corresponding to multiple preset colors respectively, and a standard reflectance spectrum with the highest similarity to the curve shape in the reflectance spectrum of the pixel point is found from the standard reflectance spectra.

[0024] The preset color corresponding to the standard reflectance spectrum is determined as the display color of the pixel point.

[0025] With reference to the first aspect, a sixth possible implementation manner of the first aspect is provided in the embodiments of the present application, and the sixth possible implementation manner comprises:

[0026] In the multi-spectrum light source, wavelength intervals between any two adjacent wavelengths of the multiple visible light of different wavelengths are the same.

[0027] a control module configured to control the multi-spectrum light source to switch different wavelengths of visible light so that the multi-spectrum light source irradiates the full-color micro-pattern layer with different wavelengths of visible light respectively;

[0028] a recognition module configured to, for each of the visible light in the multi-spectrum light source, recognize a brightness value of each pixel in the full-color micro-pattern layer under irradiation of the visible light when the multi-spectrum light source irradiates the full-color micro-pattern layer with the visible light;

[0029] a determination module configured to, for each pixel in the full-color micro-pattern layer, determine a display color of the pixel according to the brightness value of the pixel under irradiation of each of the visible light;

[0030] a comparison module configured to compare the display color of the pixel with a standard color of the pixel in an original image to obtain a comparison result of each pixel, wherein the full-color micro-pattern layer is made according to the original image;

[0031] a judgment module configured to judge whether there is a quality defect in the full-color micro-pattern layer according to the comparison result of each pixel.

[0032] In a third aspect, an embodiment of the present application further provides an electronic device, including a processor, a memory and a bus, the memory stores machine readable instructions executable by the processor, when the electronic device is running, the processor and the memory communicate through the bus, and the machine readable instructions are executed by the processor to perform the steps in any possible implementation manner of the first aspect.

[0033] In a fourth aspect, an embodiment of the present application further provides a computer readable storage medium, the computer readable storage medium stores a computer program, and the computer program is executed by a processor to perform the steps in any possible implementation manner of the first aspect.

[0034] The quality detection method and device of the full-color micro layer, the electronic device and the storage medium provided by the embodiments of the present application, wherein the luminance values of each pixel point in the full-color micro layer under irradiation of each visible light are identified by controlling the multi-spectrum light source to switch different wavelengths of visible light; the luminance value represents the reflection / absorption characteristics of the full-color micro coating under a specific visible light (i.e. a specific color light), so that the display color of each pixel point can be determined based on the luminance value of each pixel point under irradiation of each visible light; the full-color micro layer is made according to an original image, and by taking the color of the pixel point in the original image as the standard color of the pixel point, whether the display color of the pixel point is the same as the standard color can be compared to detect whether there is a quality defect in the full-color micro layer. Through the detection method of the embodiments, the detection result is not affected by the subjective experience, vision state and subjective standard of the detection personnel, the unified detection standard can be achieved, and the problem of inconsistent determination results caused by subjective differences can be solved. Moreover, based on the luminance values of the pixel points under each wavelength, the display color of the pixel point is reconstructed, the visual confusion caused by color superposition in manual visual inspection is avoided, and the detection accuracy is improved. Moreover, the manual visual inspection is completely replaced by the automatic detection method, the problem of rising false detection rate caused by manual fatigue is solved, and the problems of low efficiency and difficulty in matching the production line in manual visual inspection are solved.

[0035] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the following preferred embodiments are described in detail below, and the accompanying drawings are described as follows. BRIEF DESCRIPTION OF DRAWINGS

[0036] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the embodiments. It should be understood that the following drawings only show some embodiments of the present application, and therefore should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can also be obtained without creative labor on the basis of these drawings.

[0037] Figure 1 A flow chart of a quality detection method of a full-color micro layer provided by an embodiment of the present application is shown;

[0038] Figure 2 A schematic diagram of a coaxial arrangement of an illumination light path and an imaging light path is shown;

[0039] Figure 3 A structural schematic diagram of a quality detection device of a full-color micro layer provided by an embodiment of the present application is shown;

[0040] Figure 4 A structural schematic diagram of an electronic device provided by an embodiment of the present application is shown. DETAILED DESCRIPTION

[0041] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the claimed present application, but only represents selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the present application.

[0042] Considering that artificial visual inspection has subjective differences leading to inconsistent defect judgment results, visual confusion caused by color superposition, rising false detection rate caused by artificial fatigue, and low artificial visual inspection efficiency and difficulty in matching production lines. Based on this, the embodiments of the present application provide a quality detection method and device for full-color micro-layer, electronic equipment and storage medium, which are described below through embodiments.

[0043] It is worth noting that in the present embodiment, the full-color micro-layer refers to a colored layer formed by inkjet printing on the surface of the substrate (such as the surface of photovoltaic) through spraying, printing, coating, laminating, etc. For example, the manufacturing process of the full-color micro-layer can be to input the electronic version of the original image into the inkjet printing device, and the inkjet printing device prints a colored layer consistent with the content in the original image on the surface of the substrate (such as the surface of photovoltaic) based on the original image.

[0044] In order to facilitate the understanding of the present embodiment, first, a quality detection method for a full-color micro-layer disclosed in the embodiments of the present application is described in detail. The multispectral light source is integrated with multiple visible lights of different wavelengths, such as Figure 1 As shown in the figure, the following steps S101-S105 are included:

[0045] S101: Control the multispectral light source to switch different wavelengths of visible light, so that the multispectral light source uses different wavelengths of visible light to irradiate the full-color micro-layer to be detected.

[0046] In this embodiment, the colors of the visible lights of different wavelengths are different. In the multiple visible lights of different wavelengths integrated in the multispectral light source, the wavelength interval between any two adjacent wavelengths is the same.

[0047] For example, the multispectral light source integrates 6 visible lights of different wavelengths, i.e., a visible light of 390 nm (violet light), a visible light of 450 nm (blue light), a visible light of 510 nm (green light), a visible light of 570 nm (yellow light), a visible light of 630 nm (red light), and a visible light of 690 nm (deep red light).

[0048] In this embodiment, the multispectral light source switches the visible lights of different wavelengths at a millisecond level to irradiate the full-color micro layer with the visible lights of different wavelengths.

[0049] In this embodiment, the visible lights of different wavelengths are switched quickly to eliminate the interference of ambient light.

[0050] S102: For each visible light in the multispectral light source, identify the brightness value of each pixel point in the full-color micro layer under the irradiation of the visible light when the multispectral light source irradiates the full-color micro layer with the visible light.

[0051] In this embodiment, when the full-color micro layer is irradiated with one of the visible lights (and the other visible lights are in the off state), the brightness value of each pixel point in the full-color micro layer under the irradiation of the visible light is identified at this time, thereby obtaining the brightness value of each pixel point in the full-color micro layer under the irradiation of each visible light.

[0052] In a possible implementation, when performing step S102 to identify the brightness value of each pixel point in the full-color micro layer under the irradiation of the visible light when the multispectral light source irradiates the full-color micro layer with the visible light, the following steps can be performed:

[0053] When the multispectral light source irradiates the full-color micro layer with the visible light, identify the brightness value of each pixel point in the full-color micro layer under the irradiation of the visible light by a spectral camera; wherein the illumination light path of the multispectral light source and the imaging light path of the spectral camera are coaxially arranged by a semi-transparent light splitting plate.

[0054] In this embodiment, when the surface of the full-color micro layer appears a shadow, the identified brightness value of the pixel point at the shadow is not accurate enough, which will affect the accuracy of the display color of the pixel point at the shadow. Based on this, in order to avoid the surface of the full-color micro layer from appearing a shadow, the illumination light path of the multispectral light source and the imaging light path of the spectral camera are coaxially arranged by a semi-transparent light splitting plate in this embodiment, thereby avoiding the surface of the full-color micro layer from appearing a shadow.

[0055] In this embodiment, the transparency of the translucent light splitting sheet is 50%.

[0056] In a possible implementation, as shown in FIG. 1, a translucent light splitting sheet is arranged at an angle of 45 degrees above the full-color micro-layer, and one side of the translucent light splitting sheet is coated with a semi-transparent and semi-reflective film coating. Figure 2

[0057] When the multi-spectral light source uses the visible light to irradiate the full-color micro-layer, the light rays of the visible light pass through the collimating lens and the first polarizer in sequence, and irradiate the semi-transparent and semi-reflective film coating side of the translucent light splitting sheet at an angle of 45 degrees. The part of the light rays reflected by the translucent light splitting sheet irradiate the full-color micro-layer vertically, forming an illumination light path (as shown by the dotted line in FIG. 1). Figure 2

[0058] The reflected light rays of the full-color micro-layer irradiate the semi-transparent and semi-reflective film coating side of the translucent light splitting sheet at an angle of 45 degrees. After being transmitted through the translucent light splitting sheet, the reflected light rays pass through the second polarizer and the imaging lens in sequence and enter the spectral camera, forming an imaging light path (as shown by the solid line in FIG. 1). Figure 2

[0059] In this embodiment, the collimating lens is used to convert the visible light (scattered light) emitted by the multi-spectral light source into a parallel light beam. The first polarizer and the second polarizer are used to allow only light with a specific vibration direction to pass (such as only allowing light waves that are “vertically shaken” to pass), and to block chaotic reflected light.

[0060] The second polarizer is tightly attached to the front end of the imaging lens, and is used to block mirror-reflected stray light. The imaging lens is used to focus the reflected light rays of the full-color micro-layer onto the multi-spectral camera.

[0061] In a possible implementation, when step S102 is performed, the following steps S1021-S1022 can be performed:

[0062] S1021: When the multi-spectral light source uses the visible light to irradiate the full-color micro-layer, the reflected light rays of the full-color micro-layer under the visible light pass through the tunable filter and enter the spectral camera; wherein the tunable filter splits the reflected light rays entering the spectral camera into visible light of multiple sub-wavelengths by switching; the sub-wavelength is a wavelength within a wavelength range of a color corresponding to the visible light;

[0063] S1022: The spectral camera outputs a brightness value of each pixel point in the full-color micro-layer under the light of each sub-wavelength corresponding to the visible light.

[0064] In this embodiment, a tunable filter is further arranged in front of the spectral camera. In different visible light irradiation stages of the multi-spectral light source, only one visible light (for example, 450 nm blue light) is used for irradiation each time, and other visible lights are turned off. ​​​

[0065] The reflected light of the full-color micro-layer under the visible light (e.g. 450 nm blue light) enters the tunable filter into the spectral camera. The tunable filter switches at high speed, and splits the reflected light entering the spectral camera into multiple (e.g. 10) sub-wavelengths.

[0066] For example, when the visible light is 450 nm blue light, the wavelength range of the visible light is 450-495 nm, and then the sub-wavelengths in the wavelength range of the color corresponding to the visible light can be: 450 nm, 455 nm, 460 nm, 465 nm, 470 nm, 475 nm, 480 nm, 485 nm, 490 nm, and 495 nm.

[0067] Then, the spectral camera can output the luminance value of each sub-wavelength (e.g. 450 nm, 455 nm, 460 nm, 465 nm, 470 nm, 475 nm, 480 nm, 485 nm, 490 nm, and 495 nm) corresponding to the light of each pixel point in the full-color micro-layer under the visible light (e.g. 450 nm blue light). That is, each pixel point generates 10 luminance values under single irradiation.

[0068] Then, when using different visible light (e.g. 6) respectively, each pixel point generates 6x10 luminance values.

[0069] S103: For each pixel point in the full-color micro-layer, the display color of the pixel point is determined according to the luminance value of the pixel point under the irradiation of each visible light.

[0070] In this embodiment, the luminance value represents the reflection / absorption characteristics of the pixel point in the full-color micro-layer under the visible light of a specific color.

[0071] For example, when the pixel point in the full-color micro-layer is irradiated by 450 nm blue light, the blue ink pixel point is bright (strong reflection), and the yellow area is dark (strong absorption). When the pixel point in the full-color micro-layer is irradiated by 620 nm red light, the red ink pixel point is bright, and the cyan area is dark.

[0072] For example, when the pixel point in the full-color micro-layer is irradiated by 450 nm blue light, if the luminance value of the pixel point is 85, it indicates that the pixel point reflects blue light. When the pixel point in the full-color micro-layer is irradiated by 510 nm green light, if the luminance value of the pixel point is 10, it indicates that the pixel point hardly reflects green light. When the pixel point in the full-color micro-layer is irradiated by 630 nm red light, if the luminance value of the pixel point is 92, it indicates that the pixel point strongly reflects red light.

[0073] Suppose, if the pixel point is "not reflective" under all blue / green wavebands of visible light, then it can be excluded that its display color is blue / green. If the pixel point is "highlighted" only under red light, then it can be confirmed that its display color is red.

[0074] Even if there is environmental light interference, such as the addition of blue light to the environment light, the brightness value of the pixel point under blue light changes from 20 to 40, but the brightness value of the pixel point under red light is still 220, then the display color of the pixel point can still be determined as red.

[0075] In a possible implementation, when step S103 is performed, the following steps S1031-S1032 can be performed in particular:

[0076] S1031: For each pixel point in the full-color micro-layer, connect the brightness values of the pixel point under illumination of each sub-wavelength in order of the size of each sub-wavelength to obtain a curve in the reflectance spectrum of the pixel point.

[0077] S1032: Determine the display color of the pixel point according to the curve shape in the reflectance spectrum of the pixel point.

[0078] In this embodiment, for each pixel point, the 6x10 brightness values corresponding to the pixel point are connected to obtain the reflectance spectrum of the pixel point.

[0079] For example, the reflectance spectrum of red: the curve is only convex at 620 nm (like a red mountain peak).

[0080] The reflectance spectrum of the color-biased red (purple): the curve is convex at 620 nm and has a small bump at 450 nm.

[0081] In a possible implementation, when step S1032 is performed, the following steps S10321-S10322 can be performed in particular:

[0082] S10321: Compare the curve shape in the reflectance spectrum of the pixel point with the curve shape in the standard reflectance spectrum corresponding to each of a plurality of preset colors, and find the standard reflectance spectrum with the highest similarity to the curve shape in the reflectance spectrum of the pixel point from each standard reflectance spectrum.

[0083] S10322: Determine the preset color corresponding to the standard reflectance spectrum as the display color of the pixel point.

[0084] In this embodiment, by built-in "a plurality of standard reflectance spectrums corresponding to each of a plurality of preset colors", by comparing the curve shapes of the standard reflectance spectrums and the reflectance spectrums of each pixel point, the true display color of each pixel point is locked.

[0085] S104: Color of the pixel point in the original image is taken as a standard color of the pixel point, and whether the display color of the pixel point is same as the standard color is compared to obtain a comparison result of each pixel point; wherein the full-color micro-layer is made according to the original image.

[0086] In this embodiment, the full-color micro-layer can be printed by an inkjet printer according to the original image, and therefore the color of each pixel point in the original image is taken as a standard color of each pixel point, and whether the display color of the pixel point is same as the standard color is compared.

[0087] S105: Whether there is a quality defect in the full-color micro-layer is judged according to the comparison result of each pixel point.

[0088] In this embodiment, if the display color of the pixel point is not same as the standard color, it indicates that a quality defect occurs at the position of the pixel point in the full-color micro-layer. The quality defect can be, for example, that the printed color itself is not accurate, there is a scratch leading to inaccurate color, there is an ink dot leading to inaccurate color, or there is dust leading to inaccurate color.

[0089] If the display color of the pixel point is same as the standard color, it indicates that no quality defect occurs at the position of the pixel point in the full-color micro-layer.

[0090] Based on the same technical concept, the embodiment of the present application further provides a quality detection device of a full-color micro-layer, and a plurality of visible lights of different wavelengths are integrated in a multi-spectrum light source. Figure 3 As shown in the figure, the device comprises:

[0091] A control module 301 is configured to control the multi-spectrum light source to switch the visible lights of different wavelengths, so that the multi-spectrum light source uses the visible lights of different wavelengths to irradiate the full-color micro-layer to be detected respectively.

[0092] A recognition module 302 is configured to, for each visible light in the multi-spectrum light source, recognize a brightness value of each pixel point in the full-color micro-layer under irradiation of the visible light when the multi-spectrum light source uses the visible light to irradiate the full-color micro-layer.

[0093] A determination module 303 is configured to, for each pixel point in the full-color micro-layer, determine a display color of the pixel point according to the brightness value of the pixel point under irradiation of each visible light.

[0094] A comparison module 304 is configured to take color of the pixel point in the original image as a standard color of the pixel point, compare whether the display color of the pixel point is same as the standard color, and obtain a comparison result of each pixel point; wherein the full-color micro-layer is made according to the original image.

[0095] The judging module 305 is configured to judge whether there is a quality defect in the full-color micro layer according to the comparison result of each pixel point.

[0096] Optionally, the identifying module 302 is configured to, when identifying the luminance value of each pixel point in the full-color micro layer under the visible light irradiation of the multi-spectrum light source, specifically configured to:

[0097] When the multi-spectrum light source irradiates the full-color micro layer with the visible light, the luminance value of each pixel point in the full-color micro layer under the visible light irradiation is identified by a spectral camera; wherein the illumination light path of the multi-spectrum light source and the imaging light path of the spectral camera are coaxially arranged by using a semi-transparent light splitting plate.

[0098] Optionally, a semi-transparent light splitting plate is arranged at an angle of 45 degrees above the full-color micro layer, and one side of the semi-transparent light splitting plate is coated with a semi-transparent and semi-reflective film coating;

[0099] When the multi-spectrum light source irradiates the full-color micro layer to be detected with the visible light, the light of the visible light sequentially passes through a collimating lens and a first polarizer, and is irradiated to one side of the semi-transparent and semi-reflective film coating of the semi-transparent light splitting plate at an angle of 45 degrees, and part of the light reflected by the semi-transparent light splitting plate is vertically irradiated to the full-color micro layer, forming an illumination light path.

[0100] The reflected light of the full-color micro layer is irradiated to one side of the semi-transparent and semi-reflective film coating of the semi-transparent light splitting plate at an angle of 45 degrees, and the reflected light is transmitted through the semi-transparent light splitting plate and sequentially passes through a second polarizer and an imaging lens to enter the spectral camera, forming an imaging light path.

[0101] Optionally, the identifying module 302 is configured to, when identifying the luminance value of each pixel point in the full-color micro layer under the visible light irradiation of the multi-spectrum light source by the spectral camera, specifically configured to:

[0102] When the multi-spectrum light source irradiates the full-color micro layer with the visible light, the reflected light of the full-color micro layer under the visible light enters the spectral camera through a tunable filter; wherein the tunable filter splits the reflected light entering the spectral camera into visible light of multiple sub-wavelengths by switching; the sub-wavelength is a wavelength in the wavelength range of the color corresponding to the visible light.

[0103] The spectral camera outputs the luminance value of each pixel point in the full-color micro layer under the light irradiation of each sub-wavelength corresponding to the visible light.

[0104] Optionally, the determining module 303, when determining the display color of each pixel in the full-color micro-layer according to the luminance value of the pixel under each visible light, is configured to:

[0105] connecting the luminance values of the pixel under each sub-wavelength light into a curve according to the size order of each sub-wavelength, to obtain the reflectance spectrum of the pixel;

[0106] determining the display color of the pixel according to the curve shape in the reflectance spectrum of the pixel.

[0107] Optionally, the determining module 303, when determining the display color of the pixel according to the curve shape in the reflectance spectrum of the pixel, is configured to:

[0108] comparing the curve shape in the reflectance spectrum of the pixel with the curve shape in the standard reflectance spectrum corresponding to each of the plurality of preset colors, to find the standard reflectance spectrum with the highest similarity to the curve shape in the reflectance spectrum of the pixel from the plurality of standard reflectance spectrums;

[0109] determining the preset color corresponding to the standard reflectance spectrum as the display color of the pixel.

[0110] Optionally, the wavelength interval between any two adjacent wavelengths in the plurality of visible lights of different wavelengths integrated in the multi-spectrum light source is the same.

[0111] Figure 4 A structural schematic diagram of an electronic device provided by the embodiment of the present application, comprising: a processor 401, a memory 402 and a bus 403, the memory 402 stores machine readable instructions executable by the processor 401, when the electronic device runs the above-mentioned information processing method, the processor 401 and the memory 402 communicate through the bus 403, and the processor 401 executes the machine readable instructions to execute the method steps described in the embodiment one.

[0112] The embodiment of the present application further provides a computer readable storage medium, the computer readable storage medium stores a computer program, and the computer program is run by a processor to execute the method steps described in the embodiment one.

[0113] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process of the above-mentioned apparatus, electronic device and computer readable storage medium can refer to the corresponding process in the foregoing method embodiment, which will not be repeated here.

[0114] In several embodiments provided in the present application, it should be understood that the disclosed methods, devices, electronic devices and computer readable storage media can be implemented in other manners. The above described device embodiments are only schematic. For example, the division of the modules is only a logical function division. There can be another division manner for the actual implementation. For example, a plurality of modules or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the displayed or discussed mutual couplings or direct couplings or communication connections can be indirect couplings or communication connections through some interface, device or module, and can be in electrical, mechanical or other forms.

[0115] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, i.e., they can be located in one place, or distributed on multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the embodiment.

[0116] In addition, the functional units in each embodiment of the present application can be integrated into one processing unit, or each unit can be physically present alone, or two or more units can be integrated into one unit.

[0117] If the functions are realized in the form of software function units and sold or used as independent products, they can be stored in a non-volatile computer readable storage medium executable by a processor. Based on this understanding, the technical solutions of the present application or the part of the present application that essentially contributes to the prior art or the part of the technical solutions can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes a plurality of instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in the embodiments of the present application. The aforementioned storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, and various program code storage media.

[0118] Finally, it should be noted that the above-described embodiments are merely specific implementations of this application, used to illustrate the technical solutions of this application, and not to limit them. The scope of protection of this application is not limited thereto. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that any person skilled in the art can still modify or easily conceive of changes to the technical solutions described in the foregoing embodiments, or make equivalent substitutions for some of the technical features, within the scope of the technology disclosed in this application. Such modifications, changes, or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be covered within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of protection of the claims.

Claims

1. A method for detecting the quality of a full-color micro-layer, characterized in that, The multispectral light source is integrated with multiple visible lights of different wavelengths, and the method comprises: Controlling the multispectral light source to switch the visible lights of different wavelengths so that the multispectral light source uses the visible lights of different wavelengths respectively to irradiate the full-color micro-pattern layer to be detected; when one of the visible lights is used to irradiate the full-color micro-pattern layer, the other visible lights are in an off state; For each of the visible lights in the multispectral light source, when the multispectral light source uses the visible light to irradiate the full-color micro-pattern layer, the reflected light of the full-color micro-pattern layer under the visible light enters a tunable filter and then enters a spectral camera; the tunable filter splits the reflected light entering the spectral camera into multiple visible lights of sub-wavelengths by switching; the sub-wavelengths are wavelengths in the wavelength range of the color corresponding to the visible light; The spectral camera outputs the brightness value of each sub-wavelength corresponding to the light of each pixel point in the full-color micro-pattern layer under the visible light; For each pixel point in the full-color micro-pattern layer, the brightness values of the pixel point under the light of each sub-wavelength are connected into a curve in the order of the sizes of the sub-wavelengths, and the reflectance spectrum of the pixel point is obtained; The curve shape in the reflectance spectrum of the pixel point is compared with the curve shapes in the standard reflectance spectra corresponding to multiple preset colors respectively, and the standard reflectance spectrum with the highest similarity to the curve shape in the reflectance spectrum of the pixel point is found from the standard reflectance spectra; The preset color corresponding to the standard reflectance spectrum is determined as the display color of the pixel point; The color of the pixel point in the original image is taken as the standard color of the pixel point, and the display color and the standard color of the pixel point are compared to obtain the comparison result of each pixel point; the full-color micro-pattern layer is made according to the original image; According to the comparison result of each pixel point, it is judged whether there is a quality defect in the full-color micro-pattern layer.

2. The method of claim 1, wherein, The illumination light path of the multispectral light source and the imaging light path of the spectral camera are coaxially arranged by using a semi-transparent light splitting plate.

3. The method of claim 2, wherein, A semi-transparent light splitting plate is arranged at a 45-degree angle above the full-color micro-pattern layer, and one side of the semi-transparent light splitting plate is coated with a semi-transparent and semi-reflective film coating; When the multispectral light source uses the visible light to irradiate the full-color micro-pattern layer to be detected, the light of the visible light sequentially passes through a collimating lens and a first polarizer, is irradiated to one side of the semi-transparent and semi-reflective film coating of the semi-transparent light splitting plate at a 45-degree angle, and part of the reflected light of the semi-transparent light splitting plate is perpendicularly irradiated to the full-color micro-pattern layer to form an illumination light path; The reflected light of the full-color micro-pattern layer is irradiated to one side of the semi-transparent and semi-reflective film coating of the semi-transparent light splitting plate at a 45-degree angle, and the reflected light is transmitted through the semi-transparent light splitting plate and then sequentially passes through a second polarizer and an imaging lens to enter the spectral camera to form an imaging light path.

4. The method of claim 1, wherein, The wavelength interval between any two adjacent wavelengths of the multiple visible lights of different wavelengths integrated in the multispectral light source is the same.

5. A quality detection device for full-color micro-layers, characterized in that, The multispectral light source is integrated with multiple visible lights of different wavelengths, and the device comprises: A control module is configured to control the multi-spectrum light source to switch different wavelengths of visible light so that the multi-spectrum light source uses different wavelengths of visible light to irradiate the full-color micro-pattern layer to be detected respectively; when one of the visible light is used to irradiate the full-color micro-pattern layer, the other visible light is in an off state. An identification module is configured to, for each of the visible light in the multi-spectrum light source, when the multi-spectrum light source uses the visible light to irradiate the full-color micro-pattern layer, the reflected light of the full-color micro-pattern layer under the visible light enters a tunable optical filter into a spectral camera; wherein the tunable optical filter splits the reflected light entering the spectral camera into a plurality of sub-wavelength visible light by switching; the sub-wavelength is a wavelength in the wavelength range of the color corresponding to the visible light; and the identification module is configured to output, by the spectral camera, the brightness value of each sub-wavelength corresponding to the light irradiation of each pixel point in the full-color micro-pattern layer under the visible light. A determination module is configured to, for each pixel point in the full-color micro-pattern layer, connect the brightness value of the pixel point under the light irradiation of each sub-wavelength in order of the size of each sub-wavelength to obtain a reflectance spectrum of the pixel point; compare the curve shape in the reflectance spectrum of the pixel point with the curve shape in the standard reflectance spectrum corresponding to each of a plurality of preset colors, find the standard reflectance spectrum with the highest similarity to the curve shape in the reflectance spectrum of the pixel point from the standard reflectance spectrums, and determine the preset color corresponding to the standard reflectance spectrum as the display color of the pixel point. A comparison module is configured to compare the color of the pixel point in the original image with the standard color of the pixel point, compare the display color of the pixel point with the standard color, and obtain a comparison result of each pixel point; wherein the full-color micro-pattern layer is made according to the original image. A judgment module is configured to judge whether there is a quality defect in the full-color micro-pattern layer according to the comparison result of each pixel point.

6. An electronic device, comprising: The processor, the memory and the bus, the memory stores machine readable instructions executable by the processor, when the electronic device is running, the processor and the memory communicate through the bus, the machine readable instructions are executed by the processor to execute the steps of the method of any one of claims 1 to 4. The computer readable storage medium stores a computer program, the computer program is executed by the processor to execute the steps of the method of any one of claims 1 to 4.

7. A computer readable storage medium characterized in that, ​

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