Inclined flat plate-based magnetic measurement method and device, magnetic measurement device and computer readable storage medium

Abstract

The invention relates to the technical field of magnetic measurement, and discloses a magnetic measurement method based on an inclined plate, which is applied to a magnetic measurement device and comprises a light source, a polarizer, rotatable plate glass, an objective lens, an analyzer and a detector. The detection light enters the plate glass along a first axis and forms a set angle with the plate glass, and a sample is arranged on a focal plane of the objective lens; the method comprises: turning on a light source to emit detection light; controlling the plate glass to rotate to obtain a target signal; the detection light passes through the polarizer, the flat glass and the objective lens to irradiate the surface of the sample, and the detection light reflected by the surface of the sample passes through the objective lens and the polarization analyzer to reach the detector; in the rotating process of the plate glass, at least two incident positions of the detection light on the objective lens are symmetrical about the optical axis of the objective lens; and obtaining the magnetic characteristics of the sample according to the target signal. The signal-to-noise ratio is improved by controlling the plate glass to rotate. The invention further discloses a magnetic measurement device based on the inclined flat plate, a magnetic measurement device and a computer readable storage medium.

Description

Technical Field

[0001] This application relates to the field of magnetic measurement technology, and for example to a magnetic measurement method and apparatus based on an inclined plate, a magnetic measurement device, and a computer-readable storage medium. Background Technology

[0002] When a linearly polarized beam of light is reflected by a magnetic medium, the polarization plane of the reflected light undergoes a small angular deflection (Kerr rotation angle) relative to the polarization plane of the incident light. This phenomenon is known as the magneto-optical Kerr effect. This effect, combined with microscopic imaging techniques, forms magnetic measurement devices, which are widely used in magnetic material measurements and magnetic domain observation. However, in actual measurements, the magneto-optical Kerr effect itself is very weak, and the magneto-optical Kerr signal is easily interfered with by various noises, including the instability of the light source, the roughness of the sample surface, and deviations in the optical system. These noise sources superimpose with the weak magneto-optical Kerr signal, making it difficult to distinguish between signal and noise, thus affecting the accuracy and reliability of the measurement results.

[0003] In the process of implementing the embodiments of this disclosure, at least the following problems were found in the related art: By employing relevant technologies, photoelastic modulation technique has improved the detection sensitivity to some extent. However, in practical applications, environmental interference, sample or microscope vibration and drift, as well as non-ideal polarized light, result in a low signal-to-noise ratio of the magneto-optical Kerr signal, leading to inaccurate measurement results.

[0004] It should be noted that the information disclosed in the background section above is only used to enhance the understanding of the background of this application, and therefore may include information that does not constitute prior art known to those skilled in the art. Summary of the Invention

[0005] To provide a basic understanding of some aspects of the disclosed embodiments, a brief summary is given below. This summary is not intended as a general commentary, nor is it intended to identify key / important components or describe the scope of protection of these embodiments, but rather as a prelude to the detailed description that follows.

[0006] This disclosure provides a magnetic measurement method and apparatus based on an inclined plate, a magnetic measurement device, and a computer-readable storage medium to reduce noise interference, improve the signal-to-noise ratio of the signal acquired by the magnetic measurement device, and thus make the measurement results more accurate.

[0007] In some embodiments, a magnetic measurement method based on a tilted plate is applied to a magnetic measurement device, including a light source, a polarizer, a rotatable plate glass, an objective lens, an analyzer, and a detector; wherein, detection light is incident on the plate glass along a first axis and at a set angle with the plate glass, and the sample is placed on the focal plane of the objective lens; the method includes: turning on the light source to emit detection light; controlling the plate glass to rotate to obtain a target signal; wherein, the detection light passes through the polarizer, the plate glass, and the objective lens to illuminate the sample surface, and the detection light reflected from the sample surface passes through the objective lens and the analyzer to reach the detector; during the rotation of the plate glass, at least two incident positions of the detection light on the objective lens are symmetrical about the optical axis of the objective lens; and the magnetic characteristics of the sample are obtained according to the target signal.

[0008] Optionally, controlling the rotation of the flat glass includes: controlling the flat glass to rotate about a first axis.

[0009] Optionally, controlling the rotation of the flat glass includes: controlling the flat glass to rotate about an axis parallel to the first axis and passing through the flat glass.

[0010] Optionally, controlling the rotation of the flat glass also includes controlling the flat glass to rotate one revolution according to a set cycle.

[0011] Optionally, obtaining the target signal includes: acquiring light intensity signals in real time through a detector; and determining that the signal output by the detector is the target signal when the flat glass has rotated at least one revolution.

[0012] Optionally, the magnetic measuring device further includes a computer system connected to the detector; obtaining the magnetic characteristics of the sample based on the target signal includes: acquiring the target signal through the computer system and calculating at least one magnetic characteristic related to the sample based on the target signal.

[0013] Optionally, the computer system is connected to the detector via a lock-in amplifier; acquiring the target signal through the computer system includes: amplifying the target signal output by the detector through the lock-in amplifier; and acquiring the target signal amplified by the lock-in amplifier through the computer system.

[0014] Optionally, the set angle is determined as follows: the target angle of the detection light incident on the flat glass is determined based on the incident angle range that affects the polarization state of the detection light; the set angle is determined based on the target angle.

[0015] Optionally, the target angle of the detection light incident on the flat glass is determined according to the incident angle range that affects the polarization state of the detection light, including: determining any angle outside the incident angle range that affects the polarization state of the detection light as the target angle; or, determining the angle within the incident angle range that has the least impact on the polarization state of the detection light as the target angle.

[0016] Optionally, the set period can be determined by the following method: determining the set period based on a first duration of detection light irradiating the sample and / or a second duration required for system response.

[0017] In some embodiments, the magnetic measurement device based on a tilted plate includes a processor and a memory storing program instructions, wherein the processor is configured to execute the magnetic measurement method based on the tilted plate when executing the program instructions.

[0018] In some embodiments, the magnetic measurement device includes: a light source, a polarizer, a rotatable plate glass, an objective lens, an analyzer, and a detector; wherein, detection light is incident on the plate glass along a first axis and at a set angle with the plate glass, and the sample is placed on the focal plane of the objective lens; the detection light passes through the polarizer, the plate glass, and the objective lens to illuminate the sample surface, and the detection light reflected from the sample surface passes through the objective lens and the analyzer to reach the detector; during the rotation of the plate glass, at least two incident positions of the detection light on the objective lens are symmetrical about the optical axis of the objective lens.

[0019] Optionally, the first axis is collinear with the optical axis of the objective lens.

[0020] Optionally, the first axis intersects the optical axis of the objective lens.

[0021] Optionally, the magnetic measuring device further includes: the magnetic measuring device based on the inclined plate described above.

[0022] In some embodiments, a computer-readable storage medium stores program instructions that, when executed, perform the above-described magnetic measurement method based on an inclined plate.

[0023] The magnetic measurement method and apparatus based on an inclined plate, the magnetic measurement device, and the computer-readable storage medium provided in this disclosure can achieve the following technical effects: The magnetic measurement device includes a light source, a polarizer, a rotatable flat glass plate, an objective lens, an analyzer, and a detector. Detection light is incident on the flat glass plate along a first axis at a predetermined angle, with the sample positioned on the focal plane of the objective lens. The light source is activated to emit detection light, and the flat glass plate is rotated to obtain a target signal. The detection light passes through the polarizer, the flat glass plate, and the objective lens to illuminate the sample surface. The detection light reflected from the sample surface passes through the objective lens and the analyzer to reach the detector. During the rotation of the flat glass plate, at least two incident positions of the detection light on the objective lens are symmetrical about the optical axis of the objective lens. Finally, the magnetic characteristics of the sample are obtained based on the target signal. Since the Kerr contrast is proportional to the magnetization component of the reflected light along its propagation direction, controlling the rotation of the flat glass plate changes the illumination direction of the detection light on the sample. This allows the detection light at different times to be incident on the sample surface from a direction symmetrical about the optical axis of the objective lens, thus changing the magnetization component of the reflected detection light with the change in illumination direction. Simultaneously, the light intensity signal collected by the detector also changes with the change in the magnetization component of the reflected detection light. At this point, the target signal output by the detector shifts between a positive signal with an amplitude greater than the reference zero and a negative signal with an amplitude less than the reference zero, thereby transforming the original DC signal or AC signal with the initial intensity or amplitude into an AC signal with a larger amplitude than the initial intensity. This reduces noise interference, improves the signal-to-noise ratio of the signal acquired by the magnetic measuring device, and makes the measurement results more accurate.

[0024] The above general description and the description below are exemplary and illustrative only and are not intended to limit this application. Attached Figure Description

[0025] One or more embodiments are illustrated by way of example with reference to the accompanying drawings. These illustrations and drawings do not constitute a limitation on the embodiments. Elements having the same reference numerals in the drawings are shown as similar elements. The drawings are not to be scaled. And wherein: Figure 1 This is a schematic diagram of the optical path structure of a magnetic measurement device provided by related technologies; Figure 2 This is a schematic diagram of the optical path structure of a magnetic measuring device provided in an embodiment of this disclosure; Figure 3 This is a schematic diagram of the optical path structure of another magnetic measuring device provided in an embodiment of this disclosure; Figure 4 This is a schematic diagram of a magnetic measurement method based on an inclined plate provided in an embodiment of this disclosure; Figure 5 This is a schematic diagram of a target signal provided in an embodiment of this disclosure; Figure 6 This is a schematic diagram of a magnetic measuring device based on an inclined plate provided in an embodiment of this disclosure.

[0026] Figure label: 10: Light source; 20: Polarizer; 30: Flat glass; 40: Beam splitter; 50: Objective lens; 60: Analyzer; 70: Detector; 80: Sample; 81: First optical segment; 82: Second optical segment; 83: First incident position; 84: First exit position; 85: Third optical segment; 86: Fourth optical segment; 87: Second incident position; 88: Second exit position; 89: Optical axis; 800: Magnetic measuring device based on inclined plate; 801: Processor; 802: Memory; 803: Communication interface; 804: Bus. Detailed Implementation

[0027] To provide a more detailed understanding of the features and technical content of the embodiments of this disclosure, the implementation of the embodiments of this disclosure will be described in detail below with reference to the accompanying drawings. The accompanying drawings are for illustrative purposes only and are not intended to limit the embodiments of this disclosure. In the following technical description, for ease of explanation, several details are used to provide a full understanding of the disclosed embodiments. However, one or more embodiments may still be implemented without these details. In other cases, well-known structures and devices may be simplified in their depiction to simplify the drawings.

[0028] It should be noted that, unless otherwise specified, the embodiments and features described in the present disclosure can be combined with each other.

[0029] Combination Figure 1 As shown, the magnetic measurement device provided by the related technology includes a light source 10, a polarizer 20, a beam splitter 40, an objective lens 50, an analyzer 60, and a detector 70. The focal point of the objective lens 50 is located on the sample 80. The detection light emitted from the light source 10 is polarized by the polarizer 20 to become linearly polarized light, and then passes through the beam splitter 40 and the objective lens 50 to illuminate the surface of the sample 80. When the detection light is incident on the surface of the sample 80, the polarization direction of the reflected detection light changes under the magneto-optical Kerr effect, causing a Kerr rotation of the polarization plane of the detection light relative to the polarization plane of the incident detection light. After the detection light reflected from the sample 80 passes through the beam splitter 40 and the analyzer 60, the change in the polarization state of the reflected detection light causes a change in the light intensity sensed by the detector 70. Therefore, the magnetic moment of the sample 80 can be measured by recording the light intensity of the reflected detection light through the detector 70, or a magnetic field can be applied to the sample through a magnetic field generator to measure the hysteresis loop.

[0030] However, because the magneto-optical Kerr effect signal is usually very weak, the contrast change it causes is weaker than the contrast change caused by uneven illumination of the light source 10 or differences in the surface morphology of the sample 80, resulting in a low signal-to-noise ratio (SNR) of the magneto-optical Kerr signal. In practical applications, the magneto-optical Kerr signal of a certain magnetization state can be used as a background, and the difference between it and the magneto-optical Kerr signal of another magnetization state can be calculated. The difference can remove the image contrast signal caused by uneven illumination or the morphology of the sample 80, while retaining the Kerr signal caused by the magnetic changes of the sample 80, thereby improving the SNR of the magneto-optical Kerr signal. However, due to environmental interference, sample 80 or microscope vibration, drift, non-ideal polarized light, etc., the SNR of the magneto-optical Kerr signal is still low, leading to inaccurate measurement results.

[0031] To address the aforementioned issues, improve the signal-to-noise ratio, and enhance measurement accuracy, this disclosure provides a magnetic measurement device, comprising a magnetic field generator, a light source 10, a polarizer 20, a rotatable flat glass 30, a beam splitter 40, an objective lens 50, an analyzer 60, and a detector 70. The light source 10 can be a laser or a light-emitting diode (LED) source, and the detector 70 can be a photodetector or a camera. The focal point of the objective lens 50 is located on the sample 80. The detection light emitted from the light source 10 passes sequentially through the polarizer 20 and then enters the flat glass 30 along a first axis at a predetermined angle. The flat glass 30 rotates once according to a predetermined cycle, causing the detection light to pass through the beam splitter 40 and the objective lens 50 from different directions before entering the sample 80. Finally, the light is reflected by the sample 80 and passes through the objective lens 50, the beam splitter 40, and the analyzer 60 before reaching the detector 70. During the rotation of the flat glass 30, at least two incident positions of the detection light on the objective lens 50 are symmetrical about the optical axis of the objective lens 50. In addition, the magnetic measuring device also includes a computer system connected to the detector 70. The computer system and the detector 70 are connected via a lock-in amplifier. Optionally, the first axis is collinear with the optical axis of the objective lens 50. This allows the detection light emitted from the flat glass 30 to be incident perpendicularly onto the objective lens 50, making the incident positions of the detection light at different times circular. Optionally, the first axis intersects with the optical axis of the objective lens. This allows the detection light emitted from the flat glass 30 to be incident onto the objective lens 50 from a direction other than perpendicular to the objective lens 50, making the projections of the incident positions of the detection light at different times onto the plane perpendicular to the optical axis of the objective lens 50 circular. Optionally, the magnetic measuring device also includes a magnetic field generating device. This allows the magnetic hysteresis loop of the sample to be measured by applying a magnetic field to the sample through the magnetic field generating device.

[0032] Specifically, in combination Figure 2As shown, the detection light emitted by the light source 10 is polarized by the polarizer 20, becoming linearly polarized light. At this time, the flat glass 30 rotates to the third position. The detection light enters the flat glass 30 along the first axis from the first incident position 83 and exits the flat glass 30 from the first exit position 84. The incident and exit detection lights remain parallel to each other, only their positions change. The detection light emitted from the first exit position 84 passes through the beam splitter 40 and the objective lens 50, and enters the sample 80 from the first direction, i.e. Figure 2 The first optical segment 81 is then reflected by the sample 80 and exits the sample 80 from a second direction symmetrical about the optical axis 89. Figure 2 The second optical segment 82 passes through the objective lens 50, beam splitter 40, and analyzer 60 before reaching the detector 70. After the flat glass 30 rotates to the first position for a predetermined time interval, it combines... Figure 3 As shown, when the flat glass 30 rotates to the fourth position symmetrical to the optical axis 89, the detection light enters the flat glass 30 from the second incident position 87 along the first axis and exits the flat glass 30 from the second exit position 88. The incident and exit detection lights remain parallel to each other, only their positions change. The detection light emitted from the second exit position 88 passes through the beam splitter 40 and the objective lens 50, and enters the sample 80 from the second direction, i.e. Figure 2 The third optical segment 85 is then reflected by the sample 80 and exits the sample 80 from a first direction symmetrical about the optical axis 89, i.e. Figure 3 The fourth optical segment 86 passes through objective lens 50, beam splitter 40, and analyzer 60 before reaching detector 70. Combined with... Figure 2 and Figure 3 It can be seen that the first incident position 83 and the second incident position 87 are in the same spatial position, but different on the flat glass 30. The first exit position 84 and the second exit position 88 are symmetrical about the optical axis 89. This makes the position of the detection light incident on the objective lens 50 when the flat glass 30 is rotated to the third and fourth positions different, and thus makes the first direction and the second direction of the light from the objective lens 50 to the sample 80 symmetrical about the optical axis 89.

[0033] The magnetic measuring device also includes a processor, which is electrically connected to the aforementioned electrical components and is used to control the operation of the aforementioned electrical components.

[0034] The following are magnetic measurement methods based on inclined plates provided in embodiments of this disclosure. Any of these methods can be executed in a magnetic measuring device, or in a server or terminal device communicatively connected to the magnetic measuring device. In these embodiments, the magnetic measuring device is used as the executing entity to describe the scheme.

[0035] Based on the structure of the magnetic measuring device described above, such as Figure 4As shown, this disclosure provides a magnetic measurement method based on an inclined plate, including: S41, the magnetic measuring device turns on the light source to emit detection light.

[0036] S42, the magnetic measuring device controls the rotation of the plate glass to obtain the target signal; wherein, the detection light passes through the polarizer, the plate glass and the objective lens to illuminate the sample surface, and the detection light reflected from the sample surface passes through the objective lens and the analyzer to reach the detector; during the rotation of the plate glass, at least two incident positions of the detection light on the objective lens are symmetrical about the optical axis of the objective lens.

[0037] S43, the magnetic measuring device obtains the magnetic characteristics of the sample based on the target signal.

[0038] In this embodiment, the flat glass is a parallel plate, meaning that even if the outgoing and incoming light rays are translated, they remain parallel optical elements. When the detection light passes through the flat glass, since the upper and lower surfaces of the flat glass are parallel, according to the law of refraction, the detection light undergoes two refractions upon entering and leaving the flat glass. This refraction alters the propagation path of the detection light. Therefore, without considering factors such as absorption by the flat glass material, the outgoing and incoming detection light are parallel in direction, but a lateral displacement occurs, i.e., the detection light is translated.

[0039] In this embodiment of the disclosure, the position of the flat glass can be adjusted by any device. For example, the flat glass can be fixed on a rotating platform equipped with a scale and a fine-tuning knob, and the angle of the rotating platform can be adjusted manually or electrically to facilitate precise adjustment and positioning; or, the motor shaft can be directly connected to the rotation shaft of the flat glass, and the rotation of the motor shaft can drive the flat glass to rotate.

[0040] In this embodiment of the disclosure, the Kerr rotation angle generated by the detection light under the magneto-optical Kerr effect can be obtained by analyzing the target signal, thereby enabling the calculation of at least one magnetic feature of the sample based on the Kerr rotation angle. Specifically, the magnetic features of the sample can be calculated using the linear relationship of the Kerr magneto-optical effect, the theoretical model of the magneto-optical Kerr effect, or by using a method of fitting data, which will not be elaborated further here.

[0041] The magnetic measurement method based on a tilted plate provided in this disclosure includes a magnetic measurement device comprising a light source, a polarizer, a rotatable plate glass, an objective lens, an analyzer, and a detector. Detection light is incident on the plate glass along a first axis at a predetermined angle, and the sample is positioned on the focal plane of the objective lens. The light source is activated to emit detection light, and the plate glass is rotated to obtain a target signal. The detection light passes through the polarizer, the plate glass, and the objective lens to illuminate the sample surface. The detection light reflected from the sample surface passes through the objective lens and the analyzer to reach the detector. During the rotation of the plate glass, at least two incident positions of the detection light on the objective lens are symmetrical about the optical axis of the objective lens. Finally, the magnetic characteristics of the sample are obtained based on the target signal. Since the Kerr contrast is proportional to the magnetization component of the reflected light along its propagation direction, by controlling the rotation of the plate glass to change the illumination direction of the detection light on the sample, the detection light at different times is incident on the sample surface from a direction symmetrical about the optical axis of the objective lens. This allows the magnetization component of the reflected detection light to change with the change in illumination direction, and simultaneously, the light intensity signal collected by the detector also changes with the change in the magnetization component of the reflected detection light. At this point, the target signal output by the detector shifts between a positive signal with an amplitude greater than the reference zero and a negative signal with an amplitude less than the reference zero, thereby transforming the original DC signal or AC signal with the initial intensity or amplitude into an AC signal with a larger amplitude than the initial intensity. This reduces noise interference, improves the signal-to-noise ratio of the signal acquired by the magnetic measuring device, and makes the measurement results more accurate.

[0042] Optionally, the magnetic measuring device controls the rotation of the flat glass, including: the magnetic measuring device controls the flat glass to rotate about a first axis.

[0043] In this embodiment, the detection light emitted from the flat glass also rotates around a first axis as the flat glass rotates. Its trajectory cross-section is approximately circular. Combined with... Figure 2 and Figure 3 As shown, the flat glass rotates around the first position as the center of rotation, from... Figure 2 Rotate to the third position in Figure 3 The fourth position in the diagram. The detection beams emitted from the third and fourth positions are parallel to each other and symmetrical about the first axis.

[0044] In this way, although the position of the detection light does not change during the rotation of the plate glass, the detection light emitted from the plate glass will also rotate with the rotation of the plate glass, so that the detection light will illuminate different positions on the objective lens from different directions, and thus the detection light can enter the surface of the sample from different directions.

[0045] Optionally, the magnetic measuring device controls the rotation of the flat glass, including: the magnetic measuring device controls the flat glass to rotate about an axis parallel to the first axis and passing through the flat glass.

[0046] In this embodiment, controlling the plate glass to rotate about an axis parallel to the first axis and passing through the plate glass means controlling the plate glass to rotate about an axis parallel to the first axis and passing through the second position, with a second position other than the first position where the detection light illuminates the plate glass as the center of rotation. The detection light emitted from the plate glass still rotates about the first axis as the plate glass rotates. Its trajectory cross-section is approximately circular. Furthermore, the detection lights emitted during the rotation of the plate glass are parallel to each other and symmetrical about the first axis.

[0047] In this embodiment of the present disclosure, the magnetic measuring device controls the flat glass to rotate around a first axis or any axis parallel to the first axis, with any position on the flat glass as the rotation center. As long as the detection light is irradiated on the flat glass, the detection light can be irradiated on different positions on the objective lens from different directions, thereby enabling the detection light to be incident on the surface of the sample from different directions.

[0048] In this way, even if the center of rotation is not the position where the detection light is irradiated on the plate glass, i.e. the first position, the detection light emitted from the plate glass will still rotate with the plate glass as the plate glass rotates around other axes parallel to the first axis during the rotation process. This allows the detection light to irradiate different positions on the objective lens from different directions, thereby enabling the detection light to enter the sample surface from different directions.

[0049] Optionally, the magnetic measuring device controls the rotation of the flat glass, and further includes: the magnetic measuring device controls the flat glass to rotate one revolution according to a set cycle.

[0050] In this embodiment of the disclosure, the magnetic measuring device controlling the flat glass to rotate one revolution according to a set cycle means that after the set cycle has elapsed, the flat glass rotates one revolution and returns to its initial position. The flat glass may also rotate multiple revolutions to return to its initial position after the set cycle has elapsed.

[0051] In this way, the flat glass rotates from its initial position once within a set period of time and then returns to its initial position. That is, the duration of each rotation of the flat glass is the same, which makes the direction of illumination on the sample surface change periodically. Correspondingly, the light intensity signal collected by the detector and the target signal output also change periodically.

[0052] Optionally, the magnetic measuring device obtains the target signal by: the magnetic measuring device acquiring the light intensity signal in real time through the detector; and when the flat glass rotates at least one revolution, the magnetic measuring device determining that the signal output by the detector is the target signal.

[0053] In this embodiment, the target signal can be either the signal collected or output by the detector when the flat glass rotates one revolution, or the signal collected or output by the detector and / or lock-in amplifier when the flat glass rotates two revolutions. Specifically, the target signal can be the signal collected or output by the detector and / or lock-in amplifier when the flat glass completes any number of revolutions. In practical applications, the magnetic measuring device can determine the signal output by the detector and / or lock-in amplifier as the target signal when the flat glass rotates a set number of revolutions. The set number of revolutions can be a default setting or a user-set setting, determined according to the user's measurement needs or the current measurement environment, which will not be elaborated further here.

[0054] In this embodiment of the disclosure, the collected light intensity signal can be converted into an electrical signal (target signal) by a detector (such as a photodetector, a charge-coupled device camera, or a complementary metal-oxide-semiconductor camera).

[0055] In this embodiment of the disclosure, combined with Figure 5 As shown, the vertical axis represents the amplitude corresponding to light intensity, and the horizontal axis represents time. θ represents the maximum amplitude of the target signal, -θ represents the minimum amplitude of the target signal, and 0 is the reference zero point. As the flat glass rotates, the target signal changes periodically, with one cycle representing one rotation of the flat glass.

[0056] Thus, when the flat glass plate rotates at least one revolution, it passes through the rotational positions corresponding to the maximum amplitude (positive signal) and minimum amplitude (negative signal) of the target signal during its rotation. Therefore, the light intensity signal collected by the detector and the target signal output contain the maximum and minimum amplitudes of the periodically changing target signal, thereby transforming the original DC signal with the initial intensity or AC signal with the initial amplitude into an AC signal with an amplitude approximately twice the initial intensity.

[0057] Optionally, the magnetic measuring device obtains the magnetic characteristics of the sample based on the target signal, including: the magnetic measuring device acquires the target signal through a computer system and calculates at least one magnetic characteristic related to the sample based on the target signal.

[0058] In this way, by analyzing the target signal, the magnetic measuring device can obtain the Kerr rotation angle of the detection light under the action of the magneto-optical Kerr effect, and then calculate the magnetic characteristics of the sample, such as the magnetic moment or hysteresis loop, based on the Kerr rotation angle.

[0059] Optionally, the magnetic measuring device acquires the target signal through a computer system, including: the magnetic measuring device amplifies the target signal output by the detector through a lock-in amplifier; the magnetic measuring device acquires the target signal amplified by the lock-in amplifier through the computer system.

[0060] In this way, the magnetic measurement device amplifies the target signal output by the detector through a lock-in amplifier, and acquires the amplified target signal through a computer system. The core operation of the lock-in amplifier lies in the orthogonality principle of sinusoidal signals. When two sinusoidal signals with the same frequency are in phase, their product, after integration, will have an average value that reaches half of the product of their respective amplitudes. Utilizing this characteristic, during the measurement process, the lock-in amplifier can multiply and integrate the target signal output by the detector with the reference signal, thereby generating a target signal with the same frequency as both but a larger amplitude. The amplitude of the target signal is proportional to the amplitude of the target signal output by the detector, achieving accurate extraction and measurement of signals at specific frequencies. This effectively separates weak signals with the same frequency as the reference signal from background noise, further improving the signal-to-noise ratio and ensuring the accuracy of the measurement results.

[0061] Optionally, the magnetic measuring device determines the set angle as follows: the magnetic measuring device determines the target angle at which the detection light is incident on the flat glass based on the incident angle range that affects the polarization state of the detection light; the magnetic measuring device determines the set angle based on the target angle.

[0062] In this embodiment of the disclosure, the range of incident angles that affect the polarization state of the detection light can be obtained through methods such as testing or simulation.

[0063] In this embodiment of the present disclosure, before the magnetic measuring device controls the rotation of the flat glass, the position of the flat glass can be adjusted by a displacement device or other equipment so that the flat glass is at a set angle with the first axis.

[0064] In this way, the magnetic measuring device determines the target angle at which the detection light is incident on the flat glass based on the range of incident angles that affect the polarization state of the detection light, and thereby determines the angle between the flat glass and the first axis, i.e., the set angle. This minimizes the influence of the flat glass on the polarization state of the detection light, thus improving the accuracy of the test results.

[0065] Optionally, the magnetic measuring device determines the target angle of the detection light incident on the flat glass according to the incident angle range that affects the polarization state of the detection light, including: the magnetic measuring device determines any angle outside the incident angle range that affects the polarization state of the detection light as the target angle; or, the magnetic measuring device determines the angle within the incident angle range that has the least impact on the polarization state of the detection light as the target angle.

[0066] In this way, the magnetic measuring device determines any angle outside the incident angle range that affects the polarization state of the detection light as the target angle. By selecting any angle outside the incident angle range as the target angle, angles that might affect the polarization state of the detection light can be avoided, thereby reducing errors caused by polarization state changes and ensuring that the detection light maintains a consistent polarization state during incident and reflection. Alternatively, the magnetic measuring device determines the angle within the incident angle range that has the least impact on the polarization state of the detection light as the target angle. By selecting the angle with the least impact on the polarization state within the incident angle range as the target angle, the perturbation to the polarization state of the detection light can be minimized, thereby maximizing the maintenance of polarization consistency of the detection light. Both methods reduce measurement errors caused by polarization state changes and improve the signal-to-noise ratio.

[0067] Optionally, the magnetic measuring device determines the set period according to the following method: the magnetic measuring device determines the set period based on a first duration of detection light irradiating the sample and / or a second duration required for system response.

[0068] In this embodiment of the disclosure, in addition to determining the set period based on the first duration of the detection light irradiating the sample and / or the second duration required for the system response, the magnetic measuring device can also determine the set period based on the first duration of the detection light irradiating the sample and / or the second duration required for the system response and / or the third duration required for the detection light to incident on the sample. This includes: the magnetic measuring device determining the set period corresponding to the first duration of the detection light irradiating the sample and / or the second duration required for the system response and / or the third duration required for the detection light to incident on the sample according to a preset correspondence. The preset correspondence can be stored locally or in the cloud.

[0069] Thus, the first duration of the detection light illuminating the sample refers to the time the detection light needs to remain on the sample, allowing the detector to acquire the corresponding light intensity signal in a timely manner. The third duration of the detection light incident on the sample refers to the time required for the detection light to travel from the source, through the polarizer, beam splitter, and objective lens, to finally reach the sample and be reflected back to the system. By considering the above factors in determining the set period, it is ensured that the detection light has sufficient time to interact with the sample, thereby generating the magneto-optical Kerr effect. The second duration of the system response refers to the time required for the analyzer and detector to respond to the detection light and convert the light intensity signal into an electrical signal. By considering the above factors in determining the set period, it is ensured that the system can accurately capture and process the reflected detection light for subsequent signal analysis. By comprehensively considering the above two parameters in determining the set period, it is ensured that after the flat glass rotates to the first position, there is sufficient time for the detection light to interact with the sample and generate a signal, while also ensuring that the system has sufficient time to respond to and process these signals. This reduces signal distortion or loss caused by system delays or premature acquisition, thereby improving the accuracy and reliability of the signal.

[0070] Combination Figure 6 As shown, this disclosure provides a magnetic measurement device 800 based on an inclined plate, including a processor 801 and a memory 802. Optionally, the device may further include a communication interface 803 and a bus 804. The processor 801, communication interface 803, and memory 802 can communicate with each other via the bus 804. The communication interface 803 can be used for information transmission. The processor 801 can call logical instructions in the memory 802 to execute the magnetic measurement method based on an inclined plate described in the above embodiment.

[0071] Furthermore, the logic instructions in the aforementioned memory 802 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium.

[0072] The memory 802, as a computer-readable storage medium, can be used to store software programs and computer-executable programs, such as the program instructions / modules corresponding to the methods in the embodiments of this disclosure. The processor 801 executes functional applications and data processing by running the program instructions / modules stored in the memory 802, thereby implementing the magnetic measurement method based on the tilted plate in the above embodiments.

[0073] The memory 802 may include a program storage area and a data storage area. The program storage area may store the operating system and application programs required for at least one function; the data storage area may store data created based on the use of the terminal device. Furthermore, the memory 802 may include high-speed random access memory and may also include non-volatile memory.

[0074] This disclosure provides a magnetic measuring device, including a magnetic measuring device body and the aforementioned magnetic measuring device 800 based on an inclined plate. The magnetic measuring device 800 based on the inclined plate is mounted on the magnetic measuring device body. The mounting relationship described herein is not limited to placement within the magnetic measuring device, but also includes mounting connections with other components of the magnetic measuring device, including but not limited to physical connections, electrical connections, or signal transmission connections. Those skilled in the art will understand that the magnetic measuring device 800 based on the inclined plate can be adapted to any feasible magnetic measuring device body, thereby realizing other feasible embodiments.

[0075] This disclosure provides a computer-readable storage medium storing computer-executable instructions configured to perform the above-described magnetic measurement method based on an inclined plate.

[0076] The technical solutions of this disclosure can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes one or more instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in this disclosure. The aforementioned storage medium can be a non-transitory storage medium, including: a USB flash drive, a portable hard drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, and other media capable of storing program code.

[0077] The foregoing description and accompanying drawings fully illustrate embodiments of this disclosure to enable those skilled in the art to practice them. Other embodiments may include structural, logical, electrical, procedural, and other changes. The embodiments represent only possible variations. Individual components and functions are optional unless explicitly required, and the order of operation may vary. Parts and features of some embodiments may be included in or replace parts and features of other embodiments. Moreover, the terminology used in this application is for descriptive purposes only and is not intended to limit the claims. Throughout this document, each embodiment may emphasize differences from other embodiments, and similar or identical parts between embodiments may be referred to mutually. For methods, products, etc., disclosed in the embodiments, if they correspond to the method section disclosed in the embodiments, then the relevant parts may be referred to the description of the method section.

[0078] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the embodiments of this disclosure. Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

Claims

1. A magnetic measurement method based on an inclined plate, characterized in that, An application is made in a magnetic measurement device, comprising a light source, a polarizer, a rotatable flat glass plate, an objective lens, an analyzer, and a detector; wherein, detection light is incident on the flat glass plate along a first axis and at a predetermined angle with the plate glass plate, and the sample is positioned on the focal plane of the objective lens; the method includes: Turn on the light source to emit detection light; The plate glass is rotated to obtain the target signal; the detection light passes through the polarizer, the plate glass and the objective lens to illuminate the sample surface, and the detection light reflected from the sample surface passes through the objective lens and the analyzer to reach the detector; during the rotation of the plate glass, the detection light has at least two incident positions on the objective lens that are symmetrical about the optical axis of the objective lens. The magnetic characteristics of the sample are obtained based on the target signal.

2. The method according to claim 1, characterized in that, Controlling the rotation of the flat glass includes: Control the flat glass to rotate around the first axis.

3. The method according to claim 1, characterized in that, Controlling the rotation of the flat glass includes: Control the flat glass to rotate about an axis parallel to the first axis and passing through the flat glass.

4. The method according to claim 1, characterized in that, Obtaining the target signal includes: The light intensity signal is collected in real time by a detector; The signal output by the detector is determined to be the target signal after the flat glass has rotated at least one revolution.

5. A magnetic measuring device based on an inclined plate, comprising a processor and a memory storing program instructions, characterized in that, The processor is configured to execute the magnetic measurement method based on an inclined plate as described in any one of claims 1 to 4 when running the program instructions.

6. A magnetic measuring device, characterized in that, include: The system comprises a light source, a polarizer, a rotatable flat glass, an objective lens, an analyzer, and a detector. The detection light is incident on the flat glass along a first axis at a predetermined angle, and the sample is positioned on the focal plane of the objective lens. The detection light passes through the polarizer, the flat glass, and the objective lens to illuminate the sample surface. The detection light reflected from the sample surface passes through the objective lens and the analyzer to reach the detector. During the rotation of the flat glass, at least two incident positions of the detection light on the objective lens are symmetrical about the optical axis of the objective lens.

7. The magnetic measuring device according to claim 6, characterized in that, include: The first axis is collinear with the optical axis of the objective lens.

8. The magnetic measuring device according to claim 6, characterized in that, include: The first axis intersects the optical axis of the objective lens.

9. The magnetic measuring device according to claim 6, characterized in that, include: The magnetic measuring device based on an inclined plate as described in claim 5.

10. A computer-readable storage medium storing program instructions, characterized in that, When the program instructions are executed, they cause the computer to perform the magnetic measurement method based on an inclined plate as described in any one of claims 1 to 4.

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