Clock drift test equipment for crystal oscillator

Abstract

The invention relates to the technical field of crystal testing equipment, in particular to crystal oscillator clock drift testing equipment which comprises a rack, a feeding mechanism, a swing arm transfer mechanism, a rotating mechanism, a testing mechanism, a transfer restoration mechanism and a storage mechanism. The rotating mechanism and the storage mechanism are linearly distributed, the swing arm transfer mechanism is arranged at the side parts of the feeding mechanism and the rotating mechanism, and the transfer restoration mechanism corresponds to the swing arm transfer mechanism and the testing mechanism; the transferring and correcting mechanism comprises a transferring unit and a correcting unit, the swing arm transferring mechanism is used for moving the crystal supplied by the feeding mechanism to the rotating mechanism and then transferring the crystal of which the posture is adjusted through rotation of the rotating mechanism to the correcting unit, the correcting unit corrects the crystal, and then the testing mechanism tests the crystal located in the correcting unit. And the swing arm transfer mechanism transfers the tested crystal to the storage mechanism. According to the invention, the test accuracy and the test efficiency of the crystal are improved.

Description

Technical Field

[0001] This invention relates to the field of crystal testing equipment technology, and more particularly to a clock drift testing device for crystal oscillators. Background Technology

[0002] In the production of crystal oscillators, due to production errors, defective products with unstable frequencies and large frequency drifts may be produced. Therefore, it is necessary to add a process to the production process to test the frequency drift of the crystal oscillator, that is, to test the crystal clock oscillator with a clock drift test device and reject defective products.

[0003] Existing patent CN118289472A discloses a crystal oscillator electro-cleaning device, comprising: a frame; a feeding mechanism; a positioning mechanism; a transfer mechanism, the transfer mechanism including a transfer bracket, a transfer motor mounted on the transfer bracket, and a suction nozzle assembly driven and connected to the transfer motor; a transfer mechanism, the transfer mechanism including a linear motor module fixed to the frame and a alignment platform assembly driven and connected to the linear motor module, the suction nozzle assembly being used to transfer the crystal oscillator from the positioning mechanism to the alignment platform assembly; and an electro-cleaning mechanism. In this patent, the crystal is easily affected by vibrations from various mechanisms during detection, thus affecting the accuracy of crystal detection. Summary of the Invention

[0004] This invention aims to at least solve one of the technical problems existing in related technologies. To this end, this invention provides a clock drift testing device for crystal oscillators, which solves the technical problems of poor crystal testing stability and mutual interference of vibrations among various components in the prior art, thereby improving the testing accuracy and efficiency of crystals.

[0005] The present invention provides a clock drift testing device for crystal oscillators, including a frame and a feeding mechanism, a swing arm transfer mechanism, a rotation mechanism, a testing mechanism, a transfer and correction mechanism, and a storage mechanism disposed on the frame; The rotating mechanism and the storage mechanism are linearly distributed, the swing arm transfer mechanism is disposed on the side of the feeding mechanism and the rotating mechanism, and the transfer and alignment mechanism corresponds to the swing arm transfer mechanism and the testing mechanism; The transfer and correction mechanism includes a transfer unit and two sets of correction units slidably disposed on the transfer unit. The test mechanism is provided with two sets of correction units corresponding to the correction units. The frame includes an upper frame, a middle frame and a lower frame arranged in sequence. Two sets of testing mechanisms are respectively set on the upper frame and the lower frame. The transfer and alignment mechanism is connected to the upper frame and the lower frame and spans across the middle frame. The feeding mechanism, the swing arm transfer mechanism, the rotating mechanism and the storage mechanism are set on the middle frame. The swing arm transfer mechanism is used to move the crystal supplied by the feeding mechanism to the rotating mechanism, and then transfer the crystal after the rotating mechanism has rotated and adjusted its posture to the alignment unit. The alignment unit aligns the crystal, and then the testing mechanism tests the crystal located in the alignment unit. Finally, the swing arm transfer mechanism transfers the tested crystal to the storage mechanism.

[0006] A further improvement of the clock drift testing device for crystal oscillators of the present invention is that the swing arm transfer mechanism includes: A swing arm support plate is installed on the top surface of the middle frame. A horizontal first slide rail is fixed on the side of the swing arm support plate near the feeding mechanism. A first slider is slidably mounted on the first slide rail. A swing arm follower block is connected to the first slider. The swing arm follower block has a swing arm follower strip hole extending in the vertical direction. A second slide rail extending in the vertical direction is provided on the side of the swing arm follower block away from the first slide rail. A second slider is slidably mounted on the second slide rail. A swing arm mounting plate is installed on the second slider. A swing arm drive motor is provided, which is located on the side of the swing arm support plate away from the feeding mechanism. The swing arm drive shaft of the swing arm drive motor passes through the swing arm support plate. The swing arm drive shaft is connected to a swing arm drive linkage. The swing arm drive linkage is connected to a swing arm drive bearing. The swing arm drive bearing passes through the swing arm follower strip hole. The swing arm mounting plate is connected to the swing arm drive bearing. A swing arm suction nozzle unit is connected to the swing arm mounting plate.

[0007] A further improvement of the present invention regarding a clock drift testing device for a crystal oscillator is that the swing arm nozzle unit comprises: The suction nozzle connecting block is installed on the swing arm mounting plate; The nozzle support plate is installed on the nozzle connecting block; A suction nozzle slide rail is installed on the suction nozzle support plate and extends in the vertical direction; A suction nozzle mounting bracket is slidably mounted on the suction nozzle slide rail. The suction nozzle mounting bracket is equipped with a suction head, which is used to pick up crystals.

[0008] A further improvement of the present invention for a clock drift testing device for a crystal oscillator is that a plurality of camera mechanisms are provided on the top of the swing arm support plate. The camera mechanism includes: Camera mounting base plate installed on top of the swing arm support plate; A camera support erected on the camera mounting base plate; A horizontal camera mounting top plate is installed on the camera support. The camera body is mounted on the camera mounting plate; A light source mounting plate is installed on the camera support pillar. The light source mounting plate is located below the camera mounting top plate. The light source mounting plate is equipped with a light source body, and the light source body and the camera body are correspondingly arranged.

[0009] A further improvement of the clock drift testing device for crystal oscillators of the present invention is that the rotating mechanism includes: Rotary adjustment base installed on the middle frame; A height adjustment plate is installed on the top surface of the rotating adjustment base, and the rotating adjustment base is used to adjust the horizontal position of the height adjustment plate; A height adjustment block that slides onto the height adjustment vertical plate; A rotating motor mounting bracket is installed on top of the height adjustment block; A rotary drive motor is mounted on the bottom surface of the rotary motor mounting bracket. The rotary drive motor's rotary drive shaft passes through the rotary motor mounting bracket. A motor flange is provided at the top of the rotary drive shaft. The motor flange is located above the rotary motor mounting bracket. A rotating block is connected to the motor flange. A crystal rotation slot for placing crystals is opened at the top of the rotating block. The feeding detection unit, installed on the rotating motor mounting bracket, is used to detect the crystal position and placement of the crystal in the crystal rotating slot.

[0010] A further improvement of the present invention for a clock drift testing device for a crystal oscillator is that the transfer unit includes a transfer guide rail fixed to the upper frame and the lower frame, two transfer motors installed at both ends of the transfer guide rail, and a transfer slider slidably disposed on the transfer guide rail and driven and connected to the transfer motors.

[0011] A further improvement of the clock drift testing device for crystal oscillators of the present invention is that the correction unit includes: The alignment adapter plate is installed on the transfer slider; The alignment plate is erected on the alignment transition plate; A leveling pad is connected to the leveling plate. The leveling pad is horizontal. A leveling slide rail is provided on the top surface of the leveling pad. A leveling slider is slidably mounted on the leveling slide rail. A leveling slide rail connecting plate is provided on the top surface of the leveling slider. A leveling push bearing is provided on the bottom surface of the leveling slide rail connecting plate. A correction motor is installed on the bottom surface of the correction pad. The correction drive shaft of the correction motor passes through the correction pad. The correction drive shaft is connected to a correction cam. The correction cam is located above the correction pad. The correction cam is driven and connected to the correction push bearing. The correction motor drives the correction cam to rotate, thereby pushing the correction push bearing and thus pushing the correction slide rail connecting plate to move. The lower base plate of the alignment pad is installed on the alignment pad. The lower base plate of the alignment pad is provided with a plurality of alignment adsorption holes spaced apart. The alignment adsorption holes are connected to a vacuum device. A plurality of first positioning blocks are provided at intervals on the top of the lower base plate of the alignment pad. The first positioning blocks are provided in a one-to-one correspondence with the alignment adsorption holes. The alignment slide rail connecting plate is provided with a second positioning block at the position of each of the first positioning blocks. The second positioning blocks slide on the top surface of the lower base plate of the alignment pad ...

[0012] A further improvement of the present invention regarding a clock drift testing device for a crystal oscillator is that the housing mechanism comprises: A slide rail mounting plate is installed on the middle frame, and a slide rail cylinder is installed on the slide rail mounting plate. The slide rail cylinder has a cylinder plunger. A receiving adapter plate connected to the cylinder plunger and slidably mounted on the slide rail cylinder; A storage rear baffle that is vertically installed on the storage adapter plate; The OK box and NG box are rotatably connected to the storage back panel. The top of the OK box has a first feed port, and the top of the NG box has a second feed port. A material guiding unit is installed on the storage back panel and located above the OK box and NG box, and the material guiding unit is connected to the first feed port and the second feed port.

[0013] A further improvement of the clock drift testing device for crystal oscillators of the present invention is that the testing mechanism comprises: Test support columns installed on the upper frame or the lower frame, and test adjustment plates installed on the test support columns; A downward pressure plate is installed on the test adjustment plate. A downward pressure drive motor is installed on the top of the test adjustment plate. The downward pressure drive shaft of the downward pressure drive motor passes through the downward pressure plate. The downward pressure drive shaft is connected to a downward pressure drive crankshaft. A downward pressure guide rail extending in the vertical direction is installed on the downward pressure guide rail. A downward pressure slider is slidably mounted on the downward pressure guide rail. A downward pressure follower plate is connected to the downward pressure follower plate. The downward pressure follower plate has a downward pressure follower strip hole extending in the horizontal direction. The downward pressure drive crankshaft is slidably mounted in the downward pressure follower strip hole. A test mounting plate is installed on the pressure follower plate. A test support plate is slidably connected to the test mounting plate. A test circuit board is provided on the top surface of the test support plate. A probe mounting plate is provided on the bottom surface of the test support plate. The probe mounting plate is connected to the test circuit board. A number of probes are installed on the probe mounting plate. The probes are used to detect the crystal.

[0014] A further improvement of the present invention for a clock drift testing device for a crystal oscillator is that the feeding mechanism includes: a feeding base mounted on the central frame; a circular vibration feeding unit mounted on the feeding base; and a linear vibration feeding unit mounted on the circular vibration feeding unit, wherein the crystal of the circular vibration feeding unit is vibrated to the linear vibration feeding unit, and the end of the linear vibration feeding unit is provided with a feeding port, the feeding port corresponding to the swing arm transfer mechanism.

[0015] This invention sets three suction nozzle units on the swing arm mechanism, enabling different materials to move simultaneously from the hopper outlet to the feeding rotation mechanism, from the feeding rotation mechanism to the straightening mechanism, and from the straightening mechanism to the product storage mechanism. That is, material placement and cleaning are carried out simultaneously, which improves the operating speed. In addition, the test machine is set to two, and while testing is carried out on one side, material placement is carried out on the other side, which also improves the operating speed.

[0016] This invention improves the synchronization of crystal detection and transport by incorporating a camera mechanism at the top of the swing arm mechanism. The addition of a rotation mechanism and a correction unit enhances the efficiency of crystal adjustment, facilitating crystal detection by the testing mechanism.

[0017] This invention sets up the frame as multiple frames, with the feeding mechanism, swing arm transfer mechanism, rotation mechanism, testing mechanism, transfer and alignment mechanism, and storage mechanism set up in different frames. This avoids the vibration of the feeding mechanism, swing arm transfer mechanism, and rotation mechanism affecting the testing mechanism, thereby improving the accuracy of crystal detection.

[0018] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in this invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of a clock drift testing device for crystal oscillators provided by the present invention.

[0021] Figure 2 This is a schematic diagram of the feeding mechanism in a clock drift testing device for crystal oscillators provided by the present invention.

[0022] Figure 3 This is a schematic diagram of a rotating mechanism in a clock drift testing device for a crystal oscillator provided by the present invention.

[0023] Figure 4 This is a schematic diagram of a swing arm transfer mechanism in a clock drift testing device for crystal oscillators provided by the present invention. Figure 1 .

[0024] Figure 5 This is a schematic diagram of a swing arm transfer mechanism in a clock drift testing device for crystal oscillators provided by the present invention. Figure 2 .

[0025] Figure 6 This is a schematic diagram of the swing arm drive motor in a clock drift testing device for crystal oscillators provided by the present invention.

[0026] Figure 7 This is a schematic diagram of the swing arm nozzle unit in a clock drift testing device for crystal oscillators provided by the present invention.

[0027] Figure 8 This is a schematic diagram of the camera mechanism in a clock drift testing device for a crystal oscillator provided by the present invention.

[0028] Figure 9 This is a schematic diagram of a transfer correction mechanism in a clock drift testing device for crystal oscillators provided by the present invention.

[0029] Figure 10 This is a schematic diagram of a correction unit in a clock drift testing device for crystal oscillators provided by the present invention. Figure 1 .

[0030] Figure 11 This is a schematic diagram of a correction unit in a clock drift testing device for crystal oscillators provided by the present invention. Figure 2 .

[0031] Figure 12 This is a schematic diagram of the testing mechanism in a clock drift testing device for crystal oscillators provided by the present invention. Figure 1 .

[0032] Figure 13 This is a schematic diagram of the testing mechanism in a clock drift testing device for crystal oscillators provided by the present invention. Figure 2 .

[0033] Figure 14This is a schematic diagram of a test support plate in a clock drift test device for crystal oscillators provided by the present invention.

[0034] Figure 15 This is a schematic diagram of a storage mechanism in a clock drift testing device for crystal oscillators provided by the present invention. Figure 1 .

[0035] Figure 16 This is a schematic diagram of a storage mechanism in a clock drift testing device for crystal oscillators provided by the present invention. Figure 2 .

[0036] Figure 17 This is an exploded schematic diagram of the rotating mechanism in a clock drift testing device for crystal oscillators provided by the present invention.

[0037] Figure 18 This is an exploded view of the test support plate in a clock drift test device for crystal oscillators provided by the present invention.

[0038] Figure label: 11. Upper frame; 12. Middle frame; 13. Lower frame; 2. Feeding mechanism; 3. Swing arm transfer mechanism; 4. Rotation mechanism; 5. Testing mechanism; 6. Transfer and alignment mechanism; 7. Storage mechanism; 21. Feeding base; 22. Circular vibratory feeding unit; 23. Direct vibratory feeding unit; 24. Feeding port; 301. Swing arm support plate; 302. Swing arm drive motor; 303. First slide rail; 304. First slider; 305. First limit block; 306. Swing arm follower block; 307. Second slide rail; 308. Second slider; 309. Swing arm mounting plate; 31. Swing arm nozzle unit; 32. Camera mechanism; 3021. Swing arm drive linkage; 3022. Swing arm drive bearing; 310. Nozzle connecting block; 311. Nozzle support plate; 312. Nozzle buffer spring; 313. Nozzle mounting bracket; 314. Nozzle head; 315. Nozzle detection sheet metal; 316. Nozzle detection sensor; 321. Camera support column; 322. Camera mounting top plate; 323. Camera body; 324. Light source mounting plate; 325. Light source body; 401. Rotary adjustment base plate; 402. Bidirectional rotary adjustment cylinder; 403. Rotary adjustment top plate; 404. Height adjustment vertical plate; 405. Height adjustment block; 406. Height adjustment limit sheet metal; 407. Height adjustment limit plate; 408. Rotary motor mounting bracket; 409. Rotary drive motor; 410. Rotation detection sensor; 411. Motor flange; 412. Rotary block; 413. Rotation detection bracket; 414. Rotation detection optical fiber; 501. Test support column; 502. Test adjustment plate; 503. Downward pressure plate; 504. Downward pressure drive motor; 505. Downward pressure guide rail; 506. Downward pressure slider; 507. Downward pressure follower plate; 508. Test mounting plate; 509. Test drive cylinder; 510. Test support plate; 511. Test circuit board; 512. Test probe support plate; 513. Probe mounting plate; 514. Test cylindrical pin; 515. Test adjustment block; 516. Test adjustment bolt; 518. Test fixing block; 519. U-shaped groove; 60. Transfer unit; 601. Transfer guide rail; 602. Transfer motor; 603. Transfer slider; 61. Correction unit; 610. Correction adapter plate; 611. Correction upright plate; 612. Correction pad plate; 613. Correction motor; 614. Correction sensing sheet metal; 615. Correction sensing sensor; 616. Correction slide rail; 617. Correction slider; 618. Correction slide rail connecting plate; 619. Correction limit block; 620. Correction top plate; 621. Correction bottom plate; 622. First positioning block; 623. First pressure plate; 624. Correction auxiliary plate; 625. Second positioning block; 701. Slide rail mounting plate; 702. Slide rail cylinder; 703. Storage adapter plate; 704. Storage back panel; 705. Storage sheet metal; 706. OK box; 707. NG box; 708. Conduit bracket; 709. First feed pipe; 710. Second feed pipe; 711. Buckle seat; 712. Spherical door buckle. Detailed Implementation

[0039] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention. The following embodiments are used to illustrate this invention but should not be used to limit the scope of this invention.

[0040] The following is combined Figure 1 and Figure 9 The present invention describes a clock drift testing device for a crystal oscillator, comprising a frame and a feeding mechanism 2, a swing arm transfer mechanism 3, a rotation mechanism 4, a testing mechanism 5, a transfer and correction mechanism 6, and a storage mechanism 7 disposed on the frame. The rotating mechanism 4 and the storage mechanism 7 are linearly distributed. The swing arm transfer mechanism 3 is located on the side of the feeding mechanism 2 and the rotating mechanism 4. The transfer and alignment mechanism 6 corresponds to the swing arm transfer mechanism 3 and the testing mechanism 5. The transfer and correction mechanism 6 includes a transfer unit 60 and two sets of correction units 61 slidably disposed on the transfer unit 60. The testing mechanism 5 is provided with two sets of correction units 61. The swing arm transfer mechanism 3 is used to move the crystal supplied by the feeding mechanism 2 to the rotating mechanism 4, and then transfer the crystal after the rotating mechanism 4 has rotated and adjusted its posture to the correction unit 61. The correction unit 61 corrects the crystal, and then the testing mechanism 5 tests the crystal located in the correction unit 61. Then the swing arm transfer mechanism 3 transfers the tested crystal to the storage mechanism 7.

[0041] In a preferred embodiment, to avoid the impact of vibration of the feeding mechanism 2 on crystal testing, the frame includes an upper frame 11, a middle frame 12, and a lower frame 13 arranged sequentially. Two sets of testing mechanisms 5 are respectively set on the upper frame 11 and the lower frame 13. The transfer and alignment mechanism 6 is connected to the upper frame 11 and the lower frame 13 and spans across the middle frame 12. The feeding mechanism 2, the swing arm transfer mechanism 3, the rotation mechanism 4, and the storage mechanism 7 are set on the middle frame 12. Thus, the vibration of the feeding mechanism 2, the swing arm transfer mechanism 3, and the rotation mechanism 4 can only be transmitted to the middle frame 12, and the upper frame 11 and the lower frame 13 can remain stable. This allows the crystal to remain stable during testing and improves the accuracy of crystal testing.

[0042] Furthermore, such as Figure 4 , Figure 5 and Figure 6 As shown, the swing arm transfer mechanism 3 includes: A swing arm support plate 301 is installed on the top surface of the middle frame 12. A horizontal first slide rail 303 is fixed on the side of the swing arm support plate 301 near the feeding mechanism 2. A first slider 304 is slidably mounted on the first slide rail 303. A swing arm follower block 306 is connected to the first slider 304. The swing arm follower block 306 has a swing arm follower strip hole extending in the vertical direction. A second slide rail 307 extending in the vertical direction is provided on the side of the swing arm follower block 306 away from the first slide rail 303. A second slider 308 is slidably mounted on the second slide rail 307. A swing arm mounting plate 309 is installed on the second slider 308. A swing arm drive motor 302 is located on the side of the swing arm support plate 301 away from the feeding mechanism 2. The swing arm drive shaft of the swing arm drive motor 302 passes through the swing arm support plate 301. The swing arm drive shaft is connected to a swing arm drive link 3021. The swing arm drive link 3021 is connected to a swing arm drive bearing 3022. The swing arm drive bearing 3022 passes through the swing arm follower strip hole. The swing arm mounting plate 309 is connected to the swing arm drive bearing 3022. The swing arm suction nozzle unit 31 is connected to the swing arm mounting plate 309.

[0043] Preferably, the swing arm support plate 301 is provided with two first limiting blocks 305, which are used to limit the swing range of the swing arm drive link 3021, thereby limiting the movement position of the swing arm mounting plate 309.

[0044] Furthermore, such as Figure 4 and Figure 7 As shown, the swing arm suction nozzle unit 31 includes: a suction nozzle connecting block 310 mounted on the swing arm mounting plate 309; a suction nozzle support plate 311 mounted on the suction nozzle connecting block 310; a suction nozzle slide rail mounted on the suction nozzle support plate 311 and extending in the vertical direction; and a suction nozzle mounting frame 313 slidably mounted on the suction nozzle slide rail, wherein a suction head 314 is mounted on the suction nozzle mounting frame 313, and the suction head 314 is used to pick up crystals.

[0045] Preferably, a nozzle buffer spring 312 is provided between the nozzle mounting bracket 313 and the nozzle support plate 311 to prevent hard collisions between the nozzle mounting bracket 313 and the nozzle support plate 311, and to ensure the stability and accuracy of the suction head 314 when picking up and releasing crystals.

[0046] Specifically, the nozzle mounting bracket 313 is equipped with a nozzle detection sheet metal 315, and the nozzle support plate 311 is equipped with a nozzle detection sensor 316. The nozzle detection sensor 316 senses the position of the nozzle detection sheet metal 315 to determine the position of the nozzle 314.

[0047] Furthermore, such as Figure 4 and Figure 8 As shown, several camera mechanisms 32 are provided on the top of the swing arm support plate 301; The camera mechanism 32 includes: a camera mounting base plate installed on top of the swing arm support plate 301; a camera support column 321 erected on the camera mounting base plate; a horizontal camera mounting top plate 322 installed on the camera support column 321; a camera body 323 installed on the camera mounting top plate 322; and a light source mounting plate 324 installed on the camera support column 321. The light source mounting plate 324 is located below the camera mounting top plate 322, and a light source body 325 is installed on the light source mounting plate 324. The light source body 325 and the camera body 323 are correspondingly arranged.

[0048] Preferably, the swing arm suction nozzle unit 31 is provided with 3 sets, namely the feeding suction nozzle, the intermediate suction nozzle and the aligning suction nozzle; the camera mechanism 32 is provided with 2 sets, namely the feeding camera and the secondary camera.

[0049] Furthermore, such as Figure 3 and Figure 17As shown, the rotating mechanism 4 includes: a rotating adjustment base mounted on the middle frame 12; a height adjustment plate 404 mounted on the top surface of the rotating adjustment base, the rotating adjustment base being used to adjust the horizontal position of the height adjustment plate 404; a height adjustment block 405 slidably mounted on the height adjustment plate 404; a rotating motor mounting bracket 408 mounted on the top of the height adjustment block 405; a rotating drive motor 409 mounted on the bottom surface of the rotating motor mounting bracket 408, the rotating drive shaft of the rotating drive motor 409 passing through the rotating motor mounting bracket 408, a motor flange 411 provided at the top of the rotating drive shaft, the motor flange 411 being located above the rotating motor mounting bracket 408, the motor flange 411 being connected to a rotating block 412, the top of the rotating block 412 being provided with a crystal rotating slot for placing crystals; and a feeding detection unit mounted on the rotating motor mounting bracket 408, the feeding detection unit being used to detect the crystal position and crystal placement in the crystal rotating slot.

[0050] Specifically, the feeding detection unit includes a rotating detection bracket 413 mounted on the rotating motor mounting bracket 408 and a rotating detection fiber 414 mounted on the rotating detection bracket 413. The rotating detection fiber 414 is used to detect the position of the crystal at the position of the rotating block 412, thereby improving the accuracy of crystal position detection and the efficiency of crystal position adjustment.

[0051] Specifically, the rotary adjustment base includes a rotary adjustment base plate 401 mounted on the middle frame 12, a bidirectional rotary adjustment cylinder 402 mounted on the rotary adjustment base plate 401, and a rotary adjustment top plate 403 connected to the bidirectional rotary adjustment cylinder 402. A height adjustment plate 404 is erected on the rotary adjustment top plate 403. The horizontal position of the rotary adjustment top plate 403 is adjusted by the operation of the bidirectional rotary adjustment cylinder 402, thereby changing the horizontal position of the crystal rotation slot so that the crystal rotation slot and the swing arm suction nozzle unit 31 correspond.

[0052] Preferably, the height-adjusting plate 404 is U-shaped, and the height-adjusting block 405 is slidably disposed on the inner side of the U-shape of the height-adjusting plate 404. The height-adjusting plate 404 is equipped with a height-adjusting limiting sheet metal 406 and a height-adjusting limiting plate 407. The height-adjusting block 405 is located between the height-adjusting limiting sheet metal 406 and the height-adjusting limiting plate 407 to prevent the height-adjusting block 405 from detaching from the height-adjusting plate 404.

[0053] Preferably, the height adjustment limit plate 407 is equipped with a rotation detection sensor 410, which is used to detect the rotation position of the rotation indicator of the rotation drive motor 409.

[0054] Furthermore, such as Figure 1 and Figure 9As shown, the transfer unit 60 includes a transfer guide rail 601 fixed to the upper frame 11 and the lower frame 13, two transfer motors 602 installed at both ends of the transfer guide rail 601, and a transfer slider 603 slidably mounted on the transfer guide rail 601 and driven by the transfer motors 602.

[0055] Preferably, the transfer guide rail can be two unit sections, respectively installed on the upper frame and the lower frame.

[0056] Specifically, such as Figure 10 and Figure 11 As shown, the correction unit 61 includes: a correction adapter plate 610 mounted on the transfer slider 603; a correction upright plate 611 erected on the correction adapter plate 610; a correction pad 612 connected to the correction upright plate 611, the correction pad 612 being horizontal, a correction slide rail 616 being provided on the top surface of the correction pad 612, a correction slider 617 sliding on the correction slide rail 616, a correction slide rail connecting plate 618 being provided on the top surface of the correction slider 617, and a correction push bearing being provided on the bottom surface of the correction slide rail connecting plate 618; a correction motor 613 mounted on the bottom surface of the correction pad 612, the correction drive shaft of the correction motor 613 passing through the correction pad 612, the correction drive shaft being connected to a correction cam, the correction cam being located above the correction pad 612, and the correction... A cam drive is connected to the correction push bearing. The correction motor 613 drives the correction cam to rotate, thereby pushing the correction push bearing and thus moving the correction slide rail connecting plate 618. The correction lower base plate 621 is installed on the correction pad 612. The correction lower base plate 621 is provided with a number of correction adsorption holes at intervals. The correction adsorption holes are connected to the vacuum equipment. A number of first positioning blocks 622 are provided at intervals on the top of the correction lower base plate 621. The first positioning blocks 622 and the correction adsorption holes are arranged one-to-one. The correction slide rail connecting plate 618 is provided with a second positioning block 625 corresponding to the position of each first positioning block 622. The second positioning block 625 slides on the top surface of the correction lower base plate 621. A correction groove is formed between the first positioning block 622 and the second positioning block 625.

[0057] Specifically, a correction auxiliary plate 624 is provided on the top of the correction slide rail connecting plate 618, and a second positioning block 625 is installed on the correction auxiliary plate 624; a correction top plate 620 is provided on the top of the correction slide rail connecting plate 618, a correction bottom plate 621 is installed on the correction top plate 620, a correction pad plate 612 is provided with a correction limiting block 619, which is used to limit the movement position of the correction slide rail connecting plate 618; a first pressure plate 623 is provided on the top of the correction bottom plate 621, and a first positioning block is sandwiched between the correction bottom plate 621 and the first pressure plate 623 to improve the positional stability of the first positioning block 622.

[0058] Specifically, the straightening plate 611 is equipped with a straightening sensing sheet metal 614, which is connected to a straightening sensing sensor 615. The straightening sensing sensor 615 is used to sense the position of the straightening indicator plate of the straightening motor 613, so as to facilitate the detection of the movement position of the second positioning block 625.

[0059] Furthermore, such as Figure 15 and Figure 16 As shown, the storage mechanism 7 includes: A slide rail mounting plate 701 is installed on the middle frame 12. A slide rail cylinder 702 is installed on the slide rail mounting plate 701. The slide rail cylinder 702 has a cylinder plunger. A storage adapter plate 703 is connected to the cylinder plunger and slidably mounted on the slide rail cylinder 702; A storage rear baffle 704 is vertically installed on the storage adapter plate 703; OK box 706 and NG box 707 are rotatably connected to the storage rear baffle 704. The top of OK box 706 has a first feed port, and the top of NG box 707 has a second feed port. A material guiding unit is installed on the back baffle 704 and located above the OK box 706 and NG box 707. The material guiding unit is connected to the first feed port and the second feed port.

[0060] Specifically, the back panel 704 is connected to a storage sheet metal 705, which surrounds the OK box 706 and the NG box 707. The back panel 704 is connected to a fastener 711, which forms two ball grooves. A spherical latch 712 is installed in the two ball grooves. The OK box 706 and the NG box 707 are respectively connected to the spherical latch 712. The OK box 706 or the NG box 707 can be rotated by rotating the spherical latch 712 in the ball groove, thereby facilitating the replacement of the OK box 706 and the NG box 707. The OK box 706 stores crystals that have passed the test by the testing mechanism 5, and the NG box 707 stores crystals that have failed the test by the testing mechanism 5.

[0061] Preferably, the feeding unit includes a conduit support 708 installed on the storage back baffle 704 and located above the OK box 706 and NG box 707, a first feed pipe 709 and a second feed pipe 710 connected to the conduit support 708, the first feed pipe 709 being connected to the first feed port, and the second feed pipe 710 being connected to the second feed port.

[0062] Furthermore, such as Figure 12 , Figure 13 , Figure 14 and Figure 18 As shown, the testing unit 5 includes: Test support column 501 installed on upper frame 11 and lower frame 13, and test adjustment plate 502 installed on test support column 501; A downward pressure plate 503 is installed on the test adjustment plate 502. A downward pressure drive motor 504 is installed on the top of the test adjustment plate 502. The downward pressure drive shaft of the downward pressure drive motor 504 passes through the downward pressure plate 503. The downward pressure drive shaft is connected to a downward pressure drive crankshaft. A downward pressure guide rail 505 extending in the vertical direction is installed on the downward pressure plate 503. A downward pressure slider 506 is slidably mounted on the downward pressure guide rail 505. A downward pressure follower plate 507 is connected to the downward pressure follower plate 507. A downward pressure follower strip hole extending in the horizontal direction is opened on the downward pressure drive crankshaft, which is slidably mounted in the downward pressure follower strip hole. The test mounting plate 508 is mounted on the pressure follower plate 507. The test mounting plate 508 is slidably connected to the test support plate 510. The test support plate 510 has a test circuit board 511 on its top surface and a probe mounting plate 513 on its bottom surface. The probe mounting plate 513 is connected to the test circuit board 511 and has several probes mounted on it. The probes are used to detect the crystal.

[0063] Specifically, such as Figure 12 , Figure 13 , Figure 14 and Figure 18 As shown, a test drive cylinder 509 is mounted on the bottom surface of the test mounting plate 508, and a test support plate 510 is connected to the test drive cylinder 509; a test cylindrical pin 514 and a test probe support plate 512 are provided on the bottom surface of the test support plate 510, and a probe mounting plate 513 is connected to the test probe support plate 512, which is also connected to the test cylindrical pin 514.

[0064] Specifically, such as Figure 12 , Figure 13 , Figure 14 and Figure 18 As shown, a U-shaped groove 519 is formed on the bottom surface of the test support plate 510. A test fixing block 518 is fixed in the U-shaped groove 519 and a test adjustment block 515 is slidably mounted thereon. A test adjustment bolt 516 is screwed onto the test fixing block 518 and the test adjustment block 515. The test adjustment block 515 is partially located at the bottom of the test probe support plate 512. The test adjustment block 515 forms an adjustment part at the bottom position of the test probe support plate 512. The thickness of the adjustment part near the test fixing block 518 is less than the thickness away from the test fixing block 518. By screwing the test adjustment bolt 516, the position of the test adjustment block 515 in the U-shaped groove 519 is moved, thereby adjusting the overlapping position of the adjustment part and the test probe support plate 512. This causes the test probe support plate 512 to rotate around the test cylindrical pin 514, thereby causing the probe mounting plate 513 to rotate and adjusting the angle of the probe mounting plate 513.

[0065] Furthermore, such as Figure 2As shown, the feeding mechanism 2 includes: a feeding base 21 installed on the middle frame 12; a circular vibration feeding unit 22 installed on the feeding base 21; and a linear vibration feeding unit 23 installed on the circular vibration feeding unit 22. The crystal in the circular vibration feeding unit 22 is vibrated to the linear vibration feeding unit 23. The end of the linear vibration feeding unit 23 is provided with a feeding port 24, which corresponds to the swing arm transfer mechanism 3. The crystal in the circular vibration feeding unit 22 enters the linear vibration feeding unit 23 after vibration, and then the linear vibration feeding unit 23 vibrates the crystal to the feeding port 24, so that the swing arm suction nozzle unit 31 can pick up the crystal.

[0066] In one specific implementation, the feeding mechanism 2 vibrates the crystal to the feeding port 24; The swing arm drive motor 302 rotates, causing the feed nozzle to reach the feed port. The feed nozzle's suction head picks up the crystal, and then the swing arm drive motor 302 continues to rotate, transferring the crystal to the crystal rotation slot of the rotating block 412. At the same time, the discharge detection unit detects whether the crystal is placed in the crystal rotation slot and whether the crystal has rotated to the correct position. If the crystal placed in the crystal rotation slot is in the reverse direction, the rotation drive motor 409 rotates, thereby driving the rotating block 412 to rotate, turning the reversed crystal to the forward direction. If the crystal is in the forward direction, it does not rotate. The swing arm drive motor 302 rotates, and the suction head of the middle suction nozzle picks up the crystal from the crystal rotation slot and then transfers it to the alignment unit, where the alignment unit aligns the crystal. When the correction unit is full of crystals, the testing mechanism tests the crystals on the correction unit. After the test is completed, the station on another correction unit is also full of crystals. The transfer unit 60 drives another correction unit to be tested by another testing mechanism. The correction nozzle transfers the crystals detected by the secondary camera to the NG box or OK box, so that qualified products enter the OK box and defective products enter the NG box. After all tests are completed, the equipment is paused, and the operator quickly removes the OK and NG boxes using the spherical latch 712 to collect the materials.

[0067] This invention sets up three frames, with no rigid connection between the upper frame 11, middle frame 12, and lower frame 13, so that the operation of the feeding mechanism 2, swing arm transfer mechanism 3, rotation mechanism 4, and storage mechanism 7 will not affect the testing mechanism, thus reducing the impact of vibration in the surrounding environment on the test.

[0068] This invention sets up three swing arm suction nozzle units 31, so that the crystal can move from the feeding port to the rotating mechanism, from the rotating mechanism to the straightening unit, and from the straightening unit to the storage mechanism at the same time. That is, the material placement and cleaning are carried out at the same time, which improves the running speed. In addition, the testing mechanism and the straightening unit are set up as two, so that the material is placed on the other side while testing on one side, which also improves the running speed.

[0069] The present invention provides a buffer when the crystal falls into the OK box 706 or NG box 707 by setting a material guiding unit, so as to avoid damage to the material.

[0070] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A clock drift testing device for crystal oscillators, characterized in that, Includes a frame and a feeding mechanism, a swing arm transfer mechanism, a rotating mechanism, a testing mechanism, a transfer and alignment mechanism, and a storage mechanism mounted on the frame; The rotating mechanism and the storage mechanism are linearly distributed, the swing arm transfer mechanism is disposed on the side of the feeding mechanism and the rotating mechanism, and the transfer and alignment mechanism corresponds to the swing arm transfer mechanism and the testing mechanism; The transfer and correction mechanism includes a transfer unit and two sets of correction units slidably disposed on the transfer unit. The test mechanism is provided with two sets of correction units corresponding to the correction units. The frame includes an upper frame, a middle frame and a lower frame arranged in sequence. Two sets of testing mechanisms are respectively set on the upper frame and the lower frame. The transfer and alignment mechanism is connected to the upper frame and the lower frame and spans across the middle frame. The feeding mechanism, the swing arm transfer mechanism, the rotating mechanism and the storage mechanism are set on the middle frame. The swing arm transfer mechanism is used to move the crystal supplied by the feeding mechanism to the rotating mechanism, and then transfer the crystal after the rotating mechanism has rotated and adjusted its posture to the alignment unit. The alignment unit aligns the crystal, and then the testing mechanism tests the crystal located in the alignment unit. Finally, the swing arm transfer mechanism transfers the tested crystal to the storage mechanism.

2. The clock drift testing device for crystal oscillators according to claim 1, characterized in that, The swing arm transfer mechanism includes: A swing arm support plate is installed on the top surface of the middle frame. A horizontal first slide rail is fixed on the side of the swing arm support plate near the feeding mechanism. A first slider is slidably mounted on the first slide rail. A swing arm follower block is connected to the first slider. The swing arm follower block has a swing arm follower strip hole extending in the vertical direction. A second slide rail extending in the vertical direction is provided on the side of the swing arm follower block away from the first slide rail. A second slider is slidably mounted on the second slide rail. A swing arm mounting plate is installed on the second slider. A swing arm drive motor is provided, which is located on the side of the swing arm support plate away from the feeding mechanism. The swing arm drive shaft of the swing arm drive motor passes through the swing arm support plate. The swing arm drive shaft is connected to a swing arm drive linkage. The swing arm drive linkage is connected to a swing arm drive bearing. The swing arm drive bearing passes through the swing arm follower strip hole. The swing arm mounting plate is connected to the swing arm drive bearing. A swing arm suction nozzle unit is connected to the swing arm mounting plate.

3. The clock drift testing device for crystal oscillators according to claim 2, characterized in that, The swing arm suction nozzle unit includes: The suction nozzle connecting block is installed on the swing arm mounting plate; The nozzle support plate is installed on the nozzle connecting block; A suction nozzle slide rail is installed on the suction nozzle support plate and extends in the vertical direction; A suction nozzle mounting bracket is slidably mounted on the suction nozzle slide rail. The suction nozzle mounting bracket is equipped with a suction head, which is used to pick up crystals.

4. The clock drift testing device for a crystal oscillator according to claim 3, characterized in that, The top of the swing arm support plate is equipped with several sets of camera mechanisms. The camera mechanism includes: Camera mounting base plate installed on top of the swing arm support plate; A camera support erected on the camera mounting base plate; A horizontal camera mounting top plate is installed on the camera support. The camera body is mounted on the camera mounting plate; A light source mounting plate is installed on the camera support pillar. The light source mounting plate is located below the camera mounting top plate. The light source mounting plate is equipped with a light source body, and the light source body and the camera body are correspondingly arranged.

5. A clock drift testing device for a crystal oscillator according to claim 1, characterized in that, The rotating mechanism includes: Rotary adjustment base installed on the middle frame; A height adjustment plate is installed on the top surface of the rotating adjustment base, and the rotating adjustment base is used to adjust the horizontal position of the height adjustment plate; A height adjustment block that slides onto the height adjustment vertical plate; A rotating motor mounting bracket is installed on top of the height adjustment block; A rotary drive motor is mounted on the bottom surface of the rotary motor mounting bracket. The rotary drive motor's rotary drive shaft passes through the rotary motor mounting bracket. A motor flange is provided at the top of the rotary drive shaft. The motor flange is located above the rotary motor mounting bracket. A rotating block is connected to the motor flange. A crystal rotation slot for placing crystals is opened at the top of the rotating block. The feeding detection unit, installed on the rotating motor mounting bracket, is used to detect the crystal position and placement of the crystal in the crystal rotating slot.

6. The clock drift testing device for crystal oscillators according to claim 1, characterized in that, The transfer unit includes a transfer guide rail fixed to the upper frame and the lower frame, two transfer motors installed at both ends of the transfer guide rail, and a transfer slider slidably mounted on the transfer guide rail and driven by the transfer motors.

7. A clock drift testing device for a crystal oscillator according to claim 6, characterized in that, The correction unit includes: The alignment adapter plate is installed on the transfer slider; The alignment plate is erected on the alignment transition plate; A leveling pad is connected to the leveling plate. The leveling pad is horizontal. A leveling slide rail is provided on the top surface of the leveling pad. A leveling slider is slidably mounted on the leveling slide rail. A leveling slide rail connecting plate is provided on the top surface of the leveling slider. A leveling push bearing is provided on the bottom surface of the leveling slide rail connecting plate. A correction motor is installed on the bottom surface of the correction pad. The correction drive shaft of the correction motor passes through the correction pad. The correction drive shaft is connected to a correction cam. The correction cam is located above the correction pad. The correction cam is driven and connected to the correction push bearing. The correction motor drives the correction cam to rotate, thereby pushing the correction push bearing and thus pushing the correction slide rail connecting plate to move. The lower base plate of the alignment pad is installed on the alignment pad. The lower base plate of the alignment pad is provided with a plurality of alignment adsorption holes spaced apart. The alignment adsorption holes are connected to a vacuum device. A plurality of first positioning blocks are provided at intervals on the top of the lower base plate of the alignment pad. The first positioning blocks are provided in a one-to-one correspondence with the alignment adsorption holes. The alignment slide rail connecting plate is provided with a second positioning block at the position of each of the first positioning blocks. The second positioning blocks slide on the top surface of the lower base plate of the alignment pad ...

8. A clock drift testing device for a crystal oscillator according to claim 1, characterized in that, The storage mechanism includes: A slide rail mounting plate is installed on the middle frame, and a slide rail cylinder is installed on the slide rail mounting plate. The slide rail cylinder has a cylinder plunger. A receiving adapter plate connected to the cylinder plunger and slidably mounted on the slide rail cylinder; A storage rear baffle that is vertically installed on the storage adapter plate; The OK box and NG box are rotatably connected to the storage back panel. The top of the OK box has a first feed port, and the top of the NG box has a second feed port. A material guiding unit is installed on the storage back panel and located above the OK box and NG box, and the material guiding unit is connected to the first feed port and the second feed port.

9. A clock drift testing device for a crystal oscillator according to claim 1, characterized in that, The testing facility includes: Test support columns installed on the upper frame or the lower frame, and test adjustment plates installed on the test support columns; A downward pressure plate is installed on the test adjustment plate. A downward pressure drive motor is installed on the top of the test adjustment plate. The downward pressure drive shaft of the downward pressure drive motor passes through the downward pressure plate. The downward pressure drive shaft is connected to a downward pressure drive crankshaft. A downward pressure guide rail extending in the vertical direction is installed on the downward pressure guide rail. A downward pressure slider is slidably mounted on the downward pressure guide rail. A downward pressure follower plate is connected to the downward pressure follower plate. The downward pressure follower plate has a downward pressure follower strip hole extending in the horizontal direction. The downward pressure drive crankshaft is slidably mounted in the downward pressure follower strip hole. A test mounting plate is installed on the pressure follower plate. A test support plate is slidably connected to the test mounting plate. A test circuit board is provided on the top surface of the test support plate. A probe mounting plate is provided on the bottom surface of the test support plate. The probe mounting plate is connected to the test circuit board. A number of probes are installed on the probe mounting plate. The probes are used to detect the crystal.

10. A clock drift testing device for a crystal oscillator according to claim 1, characterized in that, The feeding mechanism includes: Feeding base installed on the middle frame; A circular vibratory feeding unit installed on the feeding base; The direct vibration feeding unit is installed in the circular vibration feeding unit. The crystal of the circular vibration feeding unit is vibrated to the direct vibration feeding unit. The end of the direct vibration feeding unit is provided with a feeding port, which corresponds to the swing arm transfer mechanism.

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