Transformer testing tooling and transformer testing apparatus

Abstract

The application provides a transformer testing tool and a transformer testing device. The transformer testing tool comprises a testing assembly, a fastening seat and a communication assembly. The testing assembly comprises a testing circuit board and a testing base. The testing circuit board is fixedly installed on the testing base. The fastening seat comprises a seat body and a fastening pressure head. The seat body is fixedly installed on the testing base. An accommodation space for accommodating multiple transformers under test is arranged in the seat body. The fastening pressure head is detachably connected to the seat body. The fastening pressure head can be pressed against the transformer under test. The communication assembly is arranged between the testing assembly and the fastening seat. One end of the communication assembly is electrically connected to the testing circuit board. The other end of the communication assembly is electrically connected to the transformer under test. The communication assembly is used for establishing an electrical path between the testing circuit board and the transformer under test during testing, so that the testing circuit board can accurately obtain electrical parameters of the transformer under test.

Description

Technical Field

[0001] This application belongs to the technical field of transformer testing devices, and more specifically, relates to a transformer testing fixture and a transformer testing device. Background Technology

[0002] Traditional transformer testing typically relies on a single testing instrument to inspect each transformer individually. While this method can meet basic testing needs to some extent, its efficiency is low, especially in mass production or large-scale testing scenarios, becoming a significant bottleneck restricting the overall efficiency of the testing process. When multiple transformers need to be tested simultaneously, testers often need to repeatedly connect instruments, set parameters, and record data. This is not only cumbersome and time-consuming, but also prone to introducing human error during multiple switching of test objects, affecting the accuracy and consistency of test results. Furthermore, since a single instrument can only process one sample at a time, the testing cycle is significantly lengthened. Particularly in industrial production lines, the testing requirements for large batches of transformers often make the testing stage an inefficient bottleneck in the entire production or quality inspection process, failing to meet the urgent needs of modern manufacturing for efficient and automated testing technologies. Summary of the Invention

[0003] The purpose of this application is to provide a transformer testing fixture and a transformer testing device to solve the technical problem of low transformer testing efficiency in the prior art.

[0004] To achieve the above objectives, the technical solution adopted in this application is as follows: A transformer testing fixture is provided, comprising: The test assembly includes a test circuit board and a test base, wherein the test circuit board is mounted on the test base and is used for electrical connection with the transformer under test. A fastening base includes a base body and a fastening head. The base body is mounted on the test base and has an accommodating space for accommodating multiple transformers under test. The fastening head is detachably connected to the base body and can press against the transformer under test. A connecting component is disposed between the test component and the fastening base. One end of the connecting component is electrically connected to the test circuit board, and the other end of the connecting component is electrically connected to the transformer under test.

[0005] As a further improvement to the above technical solution: Optionally, the test base includes a first fixing plate and a second fixing plate, which are respectively disposed on opposite end faces of the test circuit board. The test circuit board is sandwiched between the first fixing plate and the second fixing plate. The first fixing plate has a clearance groove so that the connecting component can pass through the first fixing plate and be electrically connected to the test circuit board.

[0006] Optionally, the communication component includes a probe and a probe mounting plate. The probe is mounted on the probe mounting plate and passes through the probe mounting plate. One end of the probe is electrically connected to the corresponding pin of the transformer under test, and the other end of the probe is electrically connected to the test circuit board. The probe mounting plate is mounted on the base.

[0007] Optionally, the fastening head includes a fixed base and a movable head. The fixed base is detachably connected to the base body and has a threaded hole. The movable head passes through the fixed base and is threadedly connected to the threaded hole, so that one end of the movable head presses against the transformer under test or moves away from the transformer under test.

[0008] Optionally, the fastening seat further includes elastic clamping arms and snap-fit ​​protrusions. The elastic clamping arms are arranged in pairs and are located on opposite side walls of the fastening pressure head. The snap-fit ​​protrusions are located at corresponding positions on the seat body. The ends of the elastic clamping arms have snap-fit ​​hooks that engage with the snap-fit ​​protrusions. When the snap-fit ​​hooks engage with the snap-fit ​​protrusions, the fastening pressure head is fixedly connected to the seat body.

[0009] Optionally, the test circuit board includes conductive adhesive, which is disposed on pads corresponding to the communicating components.

[0010] The beneficial effects of the transformer testing fixture provided in this application are as follows: The transformer testing fixture provided in this application includes a testing component, a fastening base, and a connection component. The testing component includes a test circuit board and a test base. The test circuit board is fixedly mounted on the test base and has test circuitry for acquiring the electrical parameters of the transformer under test. The test circuit board is used to electrically connect with the transformer under test to detect various performance indicators. The test base provides stable mechanical support for the test circuit board and serves as the mounting base for other functional components, ensuring the overall structural stability and rational layout. The fastening base includes a seat body and a fastening head. The seat body is fixedly mounted on the test base and has an internal space for accommodating multiple transformers under test. This space is designed according to the external dimensions of the transformers under test to ensure accurate positioning and stable placement during testing. The fastening head is detachably connected to the seat body, and its position corresponds to the accommodating space. During testing, the fastening head presses against the transformer under test, thereby fixing it in place, preventing displacement or loosening during testing, and ensuring the reliability of the electrical connection. The connectivity component is positioned between the test assembly and the mounting base. One end is electrically connected to the test circuit board, and the other end is electrically connected to the transformer under test (DUT). It establishes an electrical path between the test circuit board and the DUT during testing, enabling the test circuit board to accurately acquire the electrical parameters of the DUT. The connectivity component is designed to accommodate simultaneous connections of multiple DUTs, ensuring electrical isolation and accurate signal transmission between them, thus supporting parallel testing of multiple transformers.

[0011] The transformer testing fixture of this application can effectively overcome the shortcomings of existing testing devices in terms of testing efficiency, ease of operation and batch processing capability, and realize the simultaneous positioning, fixing and electrical connection of multiple transformers under test, providing a structural basis for improving the overall efficiency of transformer testing and the stability of the testing process.

[0012] This application also provides a transformer testing device, including a test host and the above-mentioned transformer testing fixture, wherein the test host is signal connected to the test circuit board.

[0013] As a further improvement to the above technical solution: Optionally, the test host includes a matrix switch unit, which is a 40x17 matrix structure.

[0014] Optionally, the test host includes a channel switch and at least two ten-channel insulation withstand voltage testers, wherein the insulation withstand voltage testers are connected to the transformer under test on the transformer test fixture via the channel switch.

[0015] Optionally, the test host includes: The test module is used for insulation withstand voltage testing between windings of the transformer under test, insulation withstand voltage testing between windings and core, and insulation withstand voltage testing between windings and casing. The self-test module is used to perform self-tests on the power supply status, the initialization status of the test instrument, and the functional integrity check. The debugging module is used to adjust the input load of the transformer under test. The calibration module compares the withstand voltage and leakage current measured under no-load conditions with the system preset values ​​to determine whether the insulation withstand voltage function is normal. The data processing module is used to store, retrieve, and query test data. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 An exploded view of the transformer testing fixture provided in this application; Figure 2 Exploded view of the fastening base and connecting assembly of the transformer testing fixture provided in this application Figure 1 ; Figure 3 Exploded view of the fastening base and connecting assembly of the transformer testing fixture provided in this application Figure 2 ; Figure 4 A partial cross-sectional view of the fastening base and connecting components of the transformer testing fixture provided in this application.

[0018] The following are the labeling elements in the figure: 1. Test assembly; 11. Test circuit board; 12. Test base; 121. First fixing plate; 1211. Clearance groove; 122. Second fixing plate; 2. Fastening seat; 21. Seat body; 22. Fastening pressure head; 221. Fixing seat; 222. Movable pressure head; 23. Elastic clamping arm; 231. Snap-fit ​​hook; 24. Snap-fit ​​protrusion; 3. Connecting assembly; 31. Probe; 32. Probe mounting plate. Detailed Implementation

[0019] Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain the present invention, and should not be construed as limiting the present invention.

[0020] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.

[0021] Furthermore, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of the present invention.

[0022] The present invention will now be described in further detail with reference to specific embodiments and accompanying drawings.

[0023] To address the problem that existing transformer testing devices, due to structural limitations, cannot simultaneously accommodate multiple test objects, necessitating the connection, measurement, and disassembly of each transformer individually during testing, resulting in low testing efficiency, cumbersome operation, and difficulty in meeting batch testing requirements, such as... Figures 1 to 4 As shown, this application provides a transformer testing fixture, which includes a testing component 1, a fastening base 2, and a connecting component 3.

[0024] The test component 1 includes a test circuit board 11 and a test base 12. The test circuit board 11 is fixedly mounted on the test base 12 and has test circuits for acquiring the electrical parameters of the transformer under test. The test circuit board 11 is used to electrically connect with the transformer under test to detect various performance indicators of the transformer. The test base 12 provides stable mechanical support for the test circuit board 11 and serves as the mounting base for other functional components, ensuring the stability of the overall structure and the rationality of the layout.

[0025] The fastening base 2 includes a base body 21 and a fastening head 22. The base body 21 is fixedly installed on the test base 12 and has an internal space for accommodating multiple transformers under test. This space is designed according to the external dimensions of the transformers under test to ensure that they can be accurately positioned and maintained in a stable position during testing. The fastening head 22 is detachably connected to the base body 21 and its position corresponds to the accommodating space. During testing, the fastening head 22 can press against the transformers under test, thereby fixing them in place, preventing displacement or loosening during testing, and ensuring the reliability of the electrical connection.

[0026] The connecting component 3 is positioned between the test component 1 and the fastening base 2. One end of it is electrically connected to the test circuit board 11, and the other end is electrically connected to the transformer under test. It establishes an electrical path between the test circuit board 11 and the transformer under test during the test, enabling the test circuit board 11 to accurately acquire the electrical parameters of the transformer under test. The design of the connecting component 3 allows it to accommodate the simultaneous connection of multiple transformers under test, ensuring electrical isolation and accurate signal transmission between them, thus supporting parallel testing of multiple transformers.

[0027] The transformer testing fixture of this application can effectively overcome the shortcomings of existing testing devices in terms of testing efficiency, ease of operation and batch processing capabilities, and realize the simultaneous positioning, fixing and electrical connection of multiple transformers under test, providing a structural basis for improving the overall efficiency of transformer testing and the stability of the testing process.

[0028] like Figure 1 As shown in a specific embodiment of this application, the test base 12 adopts a split structure, including a first fixing plate 121 and a second fixing plate 122. The two fixing plates are respectively disposed on opposite end faces of the test circuit board 11. The test circuit board 11 is clamped and fixed between the first fixing plate 121 and the second fixing plate 122, thereby ensuring the installation stability of the test circuit board 11 on the test base 12, and providing a structural foundation for subsequent electrical connections and component assembly. The first fixing plate 121 is provided with a clearance groove 1211. The position of the clearance groove 1211 matches the layout path of the connecting component 3. Its function is to provide a channel for the connecting component 3 to pass through the first fixing plate 121, so that the connecting component 3 can smoothly pass through the first fixing plate 121 and make electrical connections with the test circuit board 11 without structural interference with the test circuit board 11, ensuring the effective transmission of electrical signals.

[0029] like Figures 2 to 4As shown, in one specific embodiment of this application, the communication component 3 adopts a probe-type electrical connection structure, including a probe 31 and a probe mounting plate 32. The probe 31 is fixedly mounted on the probe mounting plate 32 and extends through the probe mounting plate 32, with electrical connection interfaces formed at both ends. One end of the probe 31 forms stable contact with the corresponding pin of the transformer under test, realizing the transmission of electrical signals between the transformer under test and the communication component 3; the other end of the probe 31 is electrically connected to the corresponding test point on the test circuit board 11, transmitting the obtained electrical parameters of the transformer under test to the test circuit board 11 for detection processing. The probe mounting plate 32, serving as the support component for the probe 31, is fixedly mounted on the base 21. Its mounting position corresponds to the accommodating space on the base 21 and the pressing area of ​​the fastening head 22, ensuring that the probe 31 can accurately align with the pin positions of the transformer under test. This allows the connecting component 3 to establish parallel electrical connection channels between the test circuit board 11 and multiple transformers under test when multiple transformers under test are simultaneously installed in the accommodating space of the fastening base 2. This provides a reliable electrical connection foundation for simultaneously conducting electrical parameter tests on multiple transformers. The mating structure of the probe 31 and the probe mounting plate 32 ensures the stability of the electrical connection and facilitates adaptive adjustments based on the pin layout of different transformer models, thereby meeting the testing requirements of various transformer specifications.

[0030] like Figures 2 to 4As shown in a specific embodiment of this application, the fastening pressure head 22 adopts a threaded adjustment structure, including a fixed base 221 and a movable pressure head 222. The fixed base 221 is detachably connected to the base body 21 and has a threaded hole, the axis of which is adapted to the placement direction of the transformer under test. The movable pressure head 222 passes through the fixed base 221 and forms a threaded connection with the threaded hole on the fixed base 221. By rotating the movable pressure head 222, its axial position in the threaded hole can be adjusted, thereby controlling the contact state between one end of the movable pressure head 222 and the transformer under test. When it is necessary to fix the transformer under test, the movable pressure head 222 is screwed into the threaded hole, so that one end presses against the transformer under test. The self-locking characteristic of the thread maintains a stable clamping force, preventing the transformer under test from shifting or loosening during the test. When it is necessary to install or remove the transformer under test, the movable pressure head 222 is screwed out of the threaded hole in the opposite direction, so that one end is away from the transformer under test, so that the operator can easily pick up and put down the transformer under test. This structure allows the clamping head 22 to be flexibly adjusted according to actual testing needs, ensuring the stability of the transformer under test during the testing process and facilitating installation before testing and disassembly after testing. It provides a structural basis for the rapid clamping and testing of multiple transformers under test. The detachable connection between the mounting base 221 and the base body 21 also facilitates the replacement of mounting bases 221 of appropriate sizes according to different transformer specifications, thereby improving the applicability of the testing fixture.

[0031] like Figures 2 to 4As shown, in a specific embodiment of this application, the fastening seat 2 further includes elastic clamping arms 23 and snap-fit ​​protrusions 24, used to achieve quick assembly / disassembly and secure connection between the fastening pressure head 22 and the seat body 21. The elastic clamping arms 23 are symmetrically arranged in pairs on opposite side walls of the fastening pressure head 22, and their structure has a certain elastic deformation capability, enabling them to produce appropriate deformation under stress. Correspondingly, the seat body 21 is provided with snap-fit ​​protrusions 24 at positions corresponding to the elastic clamping arms 23. The position, shape, and size of the snap-fit ​​protrusions 24 are adapted to the end structure of the elastic clamping arms 23. The end of the elastic clamping arm 23 is provided with a snap-fit ​​hook portion 231, which has a specific bending angle and profile, used to form a reliable snap-fit ​​engagement with the snap-fit ​​protrusions 24. When the fastening head 22 is installed on the base 21, applying an appropriate force causes the elastic clamping arm 23 to deform elastically, guiding the snap-fit ​​hook 231 to the position of the snap-fit ​​protrusion 24. Then, the force is released, and the elastic clamping arm 23, relying on its own elastic restoring force, drives the snap-fit ​​hook 231 to engage with the snap-fit ​​protrusion 24, thus firmly fixing the fastening head 22 to the base 21 and ensuring a stable connection during testing. When it is necessary to remove the fastening head 22, applying force again causes the elastic clamping arm 23 to deform elastically, causing the snap-fit ​​hook 231 to disengage from the snap-fit ​​protrusion 24, thus separating the fastening head 22 from the base 21. This not only simplifies the installation and removal process of the fastening head 22 and improves the operational convenience of the testing fixture during use, but also ensures the connection reliability of the fastening head 22 during testing, providing structural protection for the stable fixing and testing of multiple transformers under test.

[0032] In one specific embodiment of this application, the test circuit board 11 is provided with conductive adhesive at the corresponding position where it connects to the connecting component 3. This conductive adhesive is applied to the surface of the pads on the test circuit board 11. The conductive adhesive effectively improves the contact performance between the pads and the connecting component 3 (e.g., probe 31), ensuring stable transmission of electrical signals during testing. Since the connecting component 3 may slide or rub against the pads during installation or use, the application of conductive adhesive can significantly reduce wear on the pad surface and reduce damage to the pad surface caused by repeated insertion / removal or pressing operations, thereby improving the contact stability and electrical connection reliability between the pads and the connecting component 3. Simultaneously, the conductive adhesive also has a certain degree of conductivity and adhesion, which helps to enhance the electrical connection quality between the pads and the connecting component 3, reduce contact resistance, and ensure that the electrical parameters of the transformer under test are accurately transmitted to the test circuit board 11 during testing. Furthermore, the flexible properties of the conductive adhesive can compensate for positional deviations between the pads and the connecting component 3 to a certain extent, improving the fault tolerance of the connection.

[0033] This application provides a transformer testing device, including a test host and the transformer testing fixture described in the above embodiment. The test host serves as the control and data processing core of the entire testing device, establishing a signal connection with the test circuit board 11 in the transformer testing fixture. It sends test commands to the test circuit board 11 and receives test data from it. The test host can analyze, process, and display the electrical parameters of the transformer under test collected by the test circuit board 11 according to a preset test program, thereby completing the performance evaluation of the transformer under test.

[0034] In one specific embodiment of this application, the test host integrates a matrix switching unit. This matrix switching unit adopts a 40×17 matrix structure design to achieve flexible switching and routing control of multiple signals during the test. The relays selected in the matrix switching unit have a 5kV withstand voltage capability and are designed with sufficient voltage margin to ensure reliable insulation performance and electrical stability under high-voltage test conditions. Simultaneously, the relay material is selected from materials with extremely high insulation properties, strictly controlling insulation performance at the material level to minimize the influence of the material's own characteristics on the test results, thereby improving the accuracy and reliability of the test data.

[0035] For common 48-pin network transformers, which typically contain 16 windings, corresponding to 16 electrical nodes and 1 casing node, each test station requires a 2×17 high-voltage relay matrix to meet testing needs. Building upon this, to achieve multi-station parallel testing, the matrix switching unit of the test host is expanded to a 40×17 scale, corresponding to 20 test stations, capable of simultaneously connecting and testing 20 transformers with no more than 48 pins. This matrix structure design effectively supports independent control and switching of multi-channel signals, ensuring that the electrical parameters of each transformer under test can be accurately transmitted to the test circuit board 11 through the corresponding relay channel, and then the test host performs data acquisition and analysis. Through the integrated application of this matrix switching unit, the test host can complete the parallel testing of multiple transformers under test in a single test, significantly improving testing efficiency while ensuring electrical isolation and signal integrity between test channels, providing a reliable hardware foundation for multi-station, high-precision transformer testing.

[0036] In one specific embodiment of this application, the test host integrates a channel switch and at least two ten-channel insulation withstand voltage testers. These insulation withstand voltage testers establish signal connections with the transformers under test on the transformer testing fixture via the channel switch. Each ten-channel insulation withstand voltage tester can independently generate 10 parallel withstand voltage test signals for testing the insulation performance of the transformers under test. The test system is designed to test 20 transformers under test simultaneously, and therefore two ten-channel insulation withstand voltage testers are configured to output a total of 20 parallel test signals. These test signals are connected to the test fixture via dedicated cables, on which 20 transformers under test are fixedly mounted. During the test, the 20 transformers under test can simultaneously undergo insulation withstand voltage testing, significantly improving test efficiency.

[0037] The channel switcher is used to accurately connect each pin of the transformer under test to the corresponding withstand voltage tester channel. This channel switcher enables various insulation withstand voltage tests, including insulation withstand voltage tests between windings, insulation withstand voltage tests between windings and the core, and insulation withstand voltage tests between windings and the casing. This allows the test system to perform parallel testing of different insulation performance parameters of multiple transformers under test in a single test, ensuring comprehensive test coverage and accurate results. The application of the channel switcher not only simplifies the test connection process but also improves the flexibility and scalability of the test system. It allows the test host to dynamically adjust the connection method of the test channels according to different test requirements, thereby meeting the insulation withstand voltage test requirements of various types of transformers.

[0038] In one specific embodiment of this application, the test host integrates a test module, a self-test module, a debugging module, a calibration module, and a data processing module. These modules work together to achieve functional control, status monitoring, data analysis, and system maintenance during the transformer testing process.

[0039] The testing module is primarily responsible for the insulation withstand voltage testing of the transformer under test, including insulation withstand voltage tests between windings, between windings and the core, and between windings and the casing. This module can automatically complete the power-on process and test procedure according to preset test requirements, communicate and excite standard instruments via bus control, and collect, display, and record test data. Simultaneously, the testing module can monitor the operating status of the transformer under test in real time, ensuring safety during the testing process, providing an intuitive human-machine interface, ensuring reliable recording and accurate storage of test data, and supporting real-time display of key test parameters. To facilitate observation of data trends, the testing module has optimized the layout of the graphical display area, enabling a clear presentation of the dynamic changes in test data.

[0040] The self-test module automatically detects the power status and instrument initialization status of the test system and performs functional integrity checks. During program startup, the self-test module quickly checks the power status and standard instrument initialization status to ensure the system is in normal operating condition. In functional self-test mode, the module verifies the integrity of each functional board to ensure all functions of the test system are available, thereby improving the reliability and stability of the testing process.

[0041] The debugging module is mainly used to adjust the input load of the transformer under test, so as to adjust the test conditions according to actual needs during the test, optimize the test environment, and ensure the accuracy and repeatability of the test results.

[0042] The calibration module ensures the measurement accuracy of the test system. Its core function is to determine whether the insulation withstand voltage function is normal by comparing the withstand voltage and leakage current measured under no-load conditions with the system's preset values. During calibration, the module provides a user-friendly interface, supports efficient calibration operations, and automatically records calibration information for later review. The insulation withstand voltage function is calibrated using a no-load test method. By measuring the withstand voltage and leakage current under no-load conditions and comparing them with the system's preset values, the module determines whether the insulation withstand voltage function meets the requirements. For the calibration of the electrical parameter testing function, the module uses a self-made "standard part" for testing and calibration. The software analyzes the test data of the "standard part" and compares it with the expected values ​​to determine whether the electrical parameter testing function is normal.

[0043] The data processing module is primarily used for storing, querying, and analyzing test data, providing support for post-test result evaluation. This module can easily access current and historical test data and provides data parsing capabilities, facilitating in-depth analysis of test results by testers. During data analysis, the data processing module offers powerful data display capabilities, supporting various data display methods, including single-curve display, independent display of multiple curves, and simultaneous display of multiple curves. By dividing the display windows, this module can present large amounts of test data simultaneously, helping testers understand test results more intuitively and improving data analysis efficiency.

[0044] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A transformer testing fixture, characterized in that, include: The test assembly (1) includes a test circuit board (11) and a test base (12). The test circuit board (11) is mounted on the test base (12) and is used to electrically connect with the transformer under test. The fastening base (2) includes a base body (21) and a fastening head (22). The base body (21) is mounted on the test base (12). The base body (21) has a accommodating space for accommodating multiple transformers under test. The fastening head (22) is detachably connected to the base body (21) and can press against the transformer under test. A connecting component (3) is disposed between the test component (1) and the fastening base (2). One end of the connecting component (3) is electrically connected to the test circuit board (11), and the other end of the connecting component (3) is electrically connected to the transformer under test. The test base (12) includes a first fixing plate (121) and a second fixing plate (122). The first fixing plate (121) and the second fixing plate (122) are respectively disposed on opposite end faces of the test circuit board (11). The test circuit board (11) is sandwiched between the first fixing plate (121) and the second fixing plate (122). The first fixing plate (121) has a clearance groove (1211) so that the connecting component (3) can pass through the first fixing plate (121) and be electrically connected to the test circuit board (11). The communication component (3) includes a probe (31) and a probe mounting plate (32). The probe (31) is mounted on the probe mounting plate (32) and passes through the probe mounting plate (32). One end of the probe (31) is electrically connected to the corresponding pin of the transformer under test, and the other end of the probe (31) is electrically connected to the test circuit board (11). The probe mounting plate (32) is mounted on the base (21). The fastening head (22) includes a fixed base (221) and a movable head (222). The fixed base (221) is detachably connected to the base body (21). The fixed base (221) is provided with a threaded hole. The movable head (222) passes through the fixed base (221) and is threadedly connected to the threaded hole, so that one end of the movable head (222) presses against the transformer under test or moves away from the transformer under test. The fastening seat (2) further includes elastic clamping arms (23) and snap-fit ​​protrusions (24). The elastic clamping arms (23) are arranged in pairs and are located on opposite side walls of the fastening head (22). The snap-fit ​​protrusions (24) are located at corresponding positions on the seat body (21). The end of the elastic clamping arm (23) has a snap-fit ​​hook (231) that engages with the snap-fit ​​protrusion (24). When the snap-fit ​​hook (231) engages with the snap-fit ​​protrusion (24), the fastening head (22) is fixedly connected to the seat body (21).

2. The transformer testing fixture as described in claim 1, characterized in that, The test circuit board (11) includes conductive adhesive, which is disposed on the pads corresponding to the connecting component (3).

3. A transformer testing device, characterized in that, It includes a test host and a transformer test fixture as described in claim 1 or 2, wherein the test host is connected to the test circuit board (11) via signal connection.

4. The transformer testing device as described in claim 3, characterized in that, The test host includes a matrix switch unit, which is a 40x17 matrix structure.

5. The transformer testing device as described in claim 3, characterized in that, The test host includes a channel switcher and at least two ten-channel insulation withstand voltage testers. The insulation withstand voltage testers are connected to the transformer under test on the transformer test fixture via the channel switcher.

6. The transformer testing device as described in claim 3, characterized in that, The test host includes: The test module is used for insulation withstand voltage testing between windings of the transformer under test, insulation withstand voltage testing between windings and core, and insulation withstand voltage testing between windings and casing. The self-test module is used to perform self-tests on the power supply status, the initialization status of the test instrument, and the functional integrity check. The debugging module is used to adjust the input load of the transformer under test. The calibration module compares the withstand voltage and leakage current measured under no-load conditions with the system preset values ​​to determine whether the insulation withstand voltage function is normal. The data processing module is used to store, retrieve, and query test data.

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