Automatic test system, method and program product for narrow-linewidth laser

Abstract

The invention belongs to the technical field of photoelectric device testing, and particularly discloses a narrow-linewidth laser automatic testing system and method and a program product, and the system comprises a noise linewidth analyzer, a relative intensity noise analyzer, an optical switch module, an adjustable optical attenuator, an optical power meter and a processor. And the working states of the noise line width analyzer, the relative intensity noise analyzer, the optical switch module, the adjustable optical attenuator and the optical power meter are uniformly butted and controlled through the processor. According to the invention, the tedious process of manual optical fiber switching and instrument operation can be thoroughly eliminated, automatic and high-efficiency testing of multiple performance parameters of the narrow-linewidth laser is realized, and through automatic power management and optical path switching, connection uncertainty and power setting errors caused by manual operation are eliminated, and the test efficiency is improved. The method guarantees the consistency and accuracy of the test result, and is suitable for the performance evaluation of the narrow-linewidth laser in the scenes of high-speed optical communication, coherent detection and the like.

Description

Technical Field

[0001] This invention belongs to the field of optoelectronic device testing technology, specifically relating to an automated testing system, method, and program for narrow linewidth lasers. Background Technology

[0002] Narrow-linewidth lasers, as core light sources in the optoelectronic field, directly determine their effectiveness in high-end technological applications through their performance parameters. With the rapid development of advanced optoelectronic technologies such as lidar, coherent optical communication, fiber optic sensing, quantum communication, and silicon photonics chips, the performance requirements for narrow-linewidth lasers are increasingly stringent. Narrow-linewidth lasers not only need to possess extremely low phase and frequency noise, but also need to maintain stable power output and low relative intensity noise (RIN) over a wide bandwidth. Therefore, accurate and efficient testing of multiple performance parameters of narrow-linewidth lasers has become a crucial step in their research and development and production process.

[0003] While numerous instruments exist on the market capable of testing the performance of narrow-linewidth lasers, the following significant problems remain in practical testing: 1. Dispersed testing equipment: The testing process requires the sequential use of multiple devices, including current sources, power meters, spectrometers, RIN analyzers, and phase noise analyzers. This results in low system integration, cumbersome operation, and unavoidable repeatability errors introduced by multiple fiber optic connections. 2. Power compatibility challenges: The input power requirements of various instruments inherently conflict, making traditional manual optical attenuation adjustment inefficient and inaccurate. 3. Data fragmentation: Test data is distributed across different devices, lacking a unified system for data aggregation and processing, hindering a comprehensive evaluation of laser performance bottlenecks. Summary of the Invention

[0004] The purpose of this invention is to provide an automated testing system, method, and program for narrow linewidth lasers to solve the aforementioned problems in the prior art.

[0005] To achieve the above objectives, the present invention adopts the following technical solution: In a first aspect, an automated testing system for narrow-linewidth lasers is provided, comprising a noise linewidth analyzer, a relative intensity noise analyzer, an optical switch module, an adjustable optical attenuator, an optical power meter, and a processor; wherein: The optical switch module is used to connect to the narrow linewidth laser under test and guide the laser output from the narrow linewidth laser under test to an optical power meter or an adjustable optical attenuator. An adjustable optical attenuator is used to attenuate the introduced laser light, outputting a first attenuated laser light to a noise linewidth analyzer and an output of a second attenuated laser light to a relative intensity noise analyzer. The noise linewidth analyzer is used to receive the first attenuated laser and use the first attenuated laser to perform frequency noise testing, obtain noise linewidth test data, and feed the noise linewidth test data back to the processor. The relative intensity noise analyzer is used to receive the second attenuated laser and use the second attenuated laser to perform relative intensity noise testing, obtain relative intensity noise test data, and feed the relative intensity noise test data back to the processor. An optical power meter is used to measure the optical power of the introduced laser to obtain the original output optical power, measure the optical power of the first attenuated laser output by the adjustable optical attenuator to obtain the first attenuated optical power, measure the optical power of the second attenuated laser output by the adjustable optical attenuator to obtain the second attenuated optical power, and feed back the original output optical power, the first attenuated optical power and the second attenuated optical power to the processor. The processor is used to summarize noise linewidth test data, relative intensity noise test data, raw output optical power, first attenuation optical power and second attenuation optical power, and generate a comprehensive test report for the narrow linewidth laser under test.

[0006] In one possible design, the processor is used to send a switching control signal to the optical switch module, causing the optical switch module to guide the laser output from the narrow-linewidth laser under test to an optical power meter or an adjustable optical attenuator according to the switching control signal; the processor is used to control the operating status of the noise linewidth analyzer, the relative intensity noise analyzer, and the optical power meter; the processor is used to perform adaptive power allocation based on the original output optical power, generate an attenuation control signal, and send the attenuation control signal to the adjustable optical attenuator, causing the adjustable optical attenuator to perform optical attenuation processing on the introduced laser according to the attenuation control signal.

[0007] In one possible design, the processor is used to calculate a first optical attenuation based on the original output optical power and a set first optical power target value, calculate a second optical attenuation based on the original output optical power and a set second optical power target value, and generate an attenuation control signal based on the first optical attenuation and the second optical attenuation.

[0008] In one possible design, the processor is configured to calculate a first optical power difference based on a first optical power target value and a first attenuated optical power, calculate a second optical power difference based on a second optical power target value and a second attenuated optical power, and when it is determined that the first optical power difference and / or the second optical power difference exceed a set tolerance value, generate an attenuation adjustment signal based on the first optical power difference and / or the second optical power difference, and send the attenuation adjustment signal to an adjustable optical attenuator, so that the adjustable optical attenuator performs optical attenuation adjustment processing on the introduced laser according to the attenuation adjustment signal.

[0009] In one possible design, the noise linewidth analyzer is a GP-LWM-100 noise linewidth analyzer, and the noise linewidth test data includes frequency noise power spectral density, intrinsic linewidth, and integrated linewidth.

[0010] In one possible design, the relative intensity noise analyzer is a GP-RT100 type relative intensity noise analyzer, and the relative intensity noise test data includes the relative intensity noise spectrum and the relative intensity noise at a specific frequency point.

[0011] In one possible design, the system also includes an environmental monitoring sensor group for collecting test environment data and sending the test environment data to a processor, which summarizes the test environment data into a comprehensive test report for the narrow linewidth laser under test.

[0012] In one possible design, the environmental detection sensor group includes a temperature sensor, and the test environment data includes the test environment temperature.

[0013] Secondly, an automated testing method for narrow-linewidth lasers is provided, applied to the processor mentioned in the first aspect, including: Send a switching control signal to the optical switch module, so that the optical switch module will guide the laser output of the narrow linewidth laser under test to the optical power meter according to the switching control signal; The raw output optical power fed back by the optical power meter is obtained, which is obtained by the optical power meter measuring the optical power of the laser light it introduces; A switching control signal is sent to the optical switch module, which then directs the laser output from the narrow-linewidth laser under test to the adjustable optical attenuator according to the switching control signal. The optical switch module also performs adaptive power allocation based on the original output optical power, generates an attenuation control signal, and sends the attenuation control signal to the adjustable optical attenuator. The adjustable optical attenuator then performs optical attenuation processing on the introduced laser according to the attenuation control signal, outputs the first attenuated laser to the noise linewidth analyzer, and outputs the second attenuated laser to the relative intensity noise analyzer. The first attenuated optical power and the second attenuated optical power fed back by the optical power meter are obtained. The first attenuated optical power is obtained by measuring the optical power of the first attenuated laser output by the adjustable optical attenuator by the optical power meter. The second attenuated optical power is obtained by measuring the optical power of the second attenuated laser output by the adjustable optical attenuator by the optical power meter. The noise linewidth test data fed back by the noise linewidth analyzer and the relative intensity noise test data fed back by the relative intensity noise analyzer are obtained. The noise linewidth test data is obtained by the noise linewidth analyzer receiving the first attenuated laser and performing frequency noise test. The relative intensity noise test data is obtained by the relative intensity noise analyzer receiving the second attenuated laser and performing relative intensity noise test. By summarizing the noise linewidth test data, relative intensity noise test data, original output optical power, first attenuation optical power and second attenuation optical power, a comprehensive test report of the narrow linewidth laser under test is generated.

[0014] Thirdly, a readable storage medium is provided, on which instructions are stored, which, when executed on a processor, cause the processor to perform the automated testing method for narrow-linewidth lasers described in the second aspect. A program product is also provided, which, when executed on a processor, performs the automated testing method for narrow-linewidth lasers described in the second aspect.

[0015] Beneficial effects: This invention can completely eliminate the tedious process of manually switching optical fibers and operating instruments, and realize the automated and efficient testing of multiple performance parameters of narrow linewidth lasers. Furthermore, through automated power management and optical path switching, it eliminates the connection uncertainty and power setting error introduced by human operation, ensuring the consistency and accuracy of test results. It is suitable for performance evaluation of narrow linewidth lasers in scenarios such as high-speed optical communication and coherent detection. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a system design block diagram in Embodiment 1 of the present invention; Figure 2 This is a schematic diagram of the method flow in Embodiment 2 of the present invention; Figure 3 This is a schematic diagram of the system architecture in Embodiment 3 of the present invention. Detailed Implementation

[0018] It should be noted that the descriptions of these embodiments are intended to aid in understanding the invention and do not constitute a limitation thereof. The specific structural and functional details disclosed herein are merely for describing exemplary embodiments of the invention. However, the invention may be embodied in many alternative forms and should not be construed as being limited to the embodiments described herein.

[0019] It should be understood that, unless otherwise explicitly specified and limited, the corresponding terms should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be a connection within two components. Those skilled in the art can understand the specific meaning of the above terms in the embodiments according to the specific circumstances.

[0020] Specific details are provided in the following description to provide a complete understanding of the exemplary embodiments. However, those skilled in the art will understand that the exemplary embodiments can be implemented without these specific details. For example, apparatus may be shown in block diagrams to avoid obscuring the examples with unnecessary details. In other embodiments, well-known processes, structures, and techniques may be omitted with non-essential details to avoid obscuring the embodiments.

[0021] Example 1: This embodiment provides an automated testing system for narrow linewidth lasers, such as... Figure 1 As shown, the system includes a noise linewidth analyzer, a relative intensity noise analyzer, an optical switch module, an adjustable optical attenuator, an optical power meter, and a processor. The processor is connected to the noise linewidth analyzer, the relative intensity noise analyzer, the optical switch module, the adjustable optical attenuator, and the optical power meter. The optical switch module is connected to the adjustable optical attenuator and the optical power meter. The adjustable optical attenuator is connected to the noise linewidth analyzer, the relative intensity noise analyzer, and the optical power meter. The optical switch module is used to connect to the narrow linewidth laser under test and guide the laser output from the narrow linewidth laser under test to an optical power meter or an adjustable optical attenuator. An adjustable optical attenuator is used to attenuate the introduced laser light, outputting a first attenuated laser light to a noise linewidth analyzer and an output of a second attenuated laser light to a relative intensity noise analyzer. The noise linewidth analyzer is used to receive the first attenuated laser and use the first attenuated laser to perform frequency noise testing, obtain noise linewidth test data, and feed the noise linewidth test data back to the processor. The relative intensity noise analyzer is used to receive the second attenuated laser and use the second attenuated laser to perform relative intensity noise testing, obtain relative intensity noise test data, and feed the relative intensity noise test data back to the processor. An optical power meter is used to measure the optical power of the introduced laser to obtain the original output optical power, measure the optical power of the first attenuated laser output by the adjustable optical attenuator to obtain the first attenuated optical power, measure the optical power of the second attenuated laser output by the adjustable optical attenuator to obtain the second attenuated optical power, and feed back the original output optical power, the first attenuated optical power and the second attenuated optical power to the processor. The processor is used to send switching control signals to the optical switch module, causing the optical switch module to guide the laser output from the narrow-linewidth laser under test to the optical power meter according to the switching control signals; it is used to control the working status of the noise linewidth analyzer, the relative intensity noise analyzer, and the optical power meter; it is used to perform adaptive power allocation based on the original output optical power, generate an attenuation control signal, and send the attenuation control signal to the adjustable optical attenuator, so that the adjustable optical attenuator performs optical attenuation processing on the introduced laser according to the attenuation control signal; and it is used to summarize the noise linewidth test data, the relative intensity noise test data, the original output optical power, the first attenuated optical power, and the second attenuated optical power to generate a comprehensive test report of the narrow-linewidth laser under test.

[0022] In specific implementation, the noise linewidth analyzer used is the GP-LWM-100 model. The GP-LWM-100 integrates photoelectric conversion, signal processing, and calculation units, providing measurement functions for parameters such as frequency noise power spectral density (PSD), intrinsic linewidth (≤1Hz), and integrated linewidth (≤0.1kHz), and supports USB 3.0 / Ethernet remote control. The noise linewidth test data includes frequency noise power spectral density, intrinsic linewidth, and integrated linewidth. Frequency noise power spectral density (PSD) characterizes the frequency domain characteristics of the instantaneous frequency fluctuations of the laser. The intrinsic linewidth is the Lorentz linewidth component determined by white frequency noise. The integrated linewidth can be obtained by integrating the entire frequency noise power spectral density curve, reflecting the actual bus width. Linewidth is one of the most critical parameters for evaluating the frequency stability and coherence characteristics of narrow-linewidth lasers. A narrower linewidth means better monochromaticity and lower phase noise in the laser output light, which is essential for applications such as high-speed coherent optical communication systems (affecting signal demodulation quality), high-precision fiber optic sensing (determining measurement accuracy and distance), and quantum information processing. By measuring the linewidth, we can assess whether the laser meets the performance requirements of specific application scenarios and provide direct evidence for further optimization of laser design (such as cavity structure and feedback control).

[0023] The relative intensity noise analyzer used is the GP-RT100 model. The GP-RT100 provides relative intensity noise (RIN) spectrum measurement with a maximum bandwidth of 50 GHz, a sensitivity of -160 dBc / Hz, and supports remote control via USB 3.0 / Ethernet. The relative intensity noise test data includes the relative intensity noise spectrum and the relative intensity noise at specific frequency points. The unit of the relative intensity noise (RIN) spectrum is dBc / Hz, characterizing the frequency domain characteristics of the fluctuation intensity of the laser's output optical power relative to the average power; the relative intensity noise at specific frequency points includes RIN values ​​at relaxation oscillation peaks and specified offset frequencies.

[0024] The optical switch module can use low polarization dependent loss (PDL) and high stability fiber optic devices (such as FC / APC interfaces) to ensure measurement consistency. The adjustable optical attenuator can automatically adjust the optical power entering each analyzer to keep it within the optimal input range (e.g., GP-LWM-100: -8~0dBm; GP-RT100: 0~+10dBm).

[0025] When the processor performs adaptive power allocation based on the original output optical power, it can calculate a first optical attenuation based on the original output optical power and a set first optical power target value, calculate a second optical attenuation based on the original output optical power and a set second optical power target value, and generate an attenuation control signal based on the first and second optical attenuation values. Specifically, the original output optical power of the narrow-linewidth laser under test is P. orig The optimal input power range of the GP-LWM-100 is -8dBm to 0dBm, corresponding to the first optical power target value P. target，LWM =-4dBm (median value), the optimal input power range of GP-RT100 is 0dBm~10dBm, corresponding to the second optical power target value P target，RT =+5dBm (median value). The processor utilizes the raw output optical power P orig Subtract the first optical power target value P target，LWM The first optical attenuation is obtained, and the original output optical power P is used. orig Subtract the second optical power target value P target，RT The second optical attenuation value is obtained. When the processor determines that the first optical power difference and / or the second optical power difference does not exceed a set tolerance value, it generates an attenuation control signal based on the first and second optical attenuation values. When the processor determines that the first optical power difference and / or the second optical power difference exceeds the set tolerance value, it generates an attenuation adjustment signal based on the first and / or second optical power difference and sends the attenuation adjustment signal to the adjustable optical attenuator. This allows the adjustable optical attenuator to adjust the optical attenuation of the introduced laser light according to the attenuation adjustment signal, forming a closed-loop control to ensure that the power is in an optimal state.

[0026] The system may also include an environmental detection sensor group (including a temperature sensor), which is used to collect test environment data (including test environment temperature) and send the test environment data to a processor, which is used to summarize the test environment data into a comprehensive test report of the narrow linewidth laser under test.

[0027] The processor can also perform noise correlation analysis using frequency noise power spectral density (PSD) and RIN spectrum when generating comprehensive test reports. This involves displaying the PSD and RIN noise curves side-by-side on the same frequency coordinate system to aid in analyzing the coupling mechanism of the two types of noise and related peaks (such as relaxation oscillation peaks). The system can also establish a database to store relevant test data and comprehensive test reports, supporting historical data comparison and statistical analysis.

[0028] This system completely eliminates the tedious process of manually switching optical fibers and operating instruments, enabling automated and efficient testing of multiple performance parameters of narrow-linewidth lasers. Furthermore, through automated power management and optical path switching, it eliminates connection uncertainties and power setting errors introduced by human operation, ensuring the consistency and accuracy of test results. It is suitable for performance evaluation of narrow-linewidth lasers in scenarios such as high-speed optical communication and coherent detection.

[0029] Example 2: This embodiment provides an automated testing method for narrow-linewidth lasers, applied to the processor in Embodiment 1, such as... Figure 2 As shown, the method includes the following steps: S1. Send a switching control signal to the optical switch module, so that the optical switch module guides the laser output from the narrow linewidth laser under test to the optical power meter according to the switching control signal; S2. Obtain the raw output optical power fed back by the optical power meter, wherein the raw output optical power is obtained by the optical power meter measuring the optical power of the laser light introduced into the laser. S3. Send a switching control signal to the optical switch module, so that the optical switch module guides the laser output from the narrow linewidth laser under test to the adjustable optical attenuator according to the switching control signal, and performs adaptive power allocation according to the original output optical power to generate an attenuation control signal. The attenuation control signal is sent to the adjustable optical attenuator, so that the adjustable optical attenuator performs optical attenuation processing on the introduced laser according to the attenuation control signal, outputs the first attenuated laser to the noise linewidth analyzer, and outputs the second attenuated laser to the relative intensity noise analyzer. S4. Obtain the first attenuated optical power and the second attenuated optical power fed back by the optical power meter. The first attenuated optical power is obtained by measuring the optical power of the first attenuated laser output by the adjustable optical attenuator using the optical power meter. The second attenuated optical power is obtained by measuring the optical power of the second attenuated laser output by the adjustable optical attenuator using the optical power meter. S5. Obtain the noise linewidth test data fed back by the noise linewidth analyzer and the relative intensity noise test data fed back by the relative intensity noise analyzer. The noise linewidth test data is obtained by the noise linewidth analyzer receiving the first attenuated laser and performing a frequency noise test. The relative intensity noise test data is obtained by the relative intensity noise analyzer receiving the second attenuated laser and performing a relative intensity noise test. S6. Summarize the noise linewidth test data, relative intensity noise test data, original output optical power, first attenuation optical power and second attenuation optical power, and generate a comprehensive test report for the narrow linewidth laser under test.

[0030] Example 3: This embodiment provides an automated testing system for narrow linewidth lasers, such as... Figure 3 As shown, at the hardware level, it includes: The data interface is used to establish data communication between the processor and the noise linewidth analyzer, relative intensity noise analyzer, optical switch module, adjustable optical attenuator and optical power meter; Memory, used to store instructions; The processor is used to read instructions stored in the memory and execute the narrow linewidth laser automated testing method in Embodiment 2 according to the instructions.

[0031] Optionally, the system also includes an internal bus, through which the processor, memory, and data interface can be interconnected. This internal bus can be a PCIe (Peripheral Component Interconnect Eexpress) bus, which can be divided into an address bus, a data bus, a control bus, etc. The memory can include, but is not limited to, Random Access Memory (RAM), Read Only Memory (ROM), Flash Memory, First Input First Output (FIFO), and / or First In Last Out (FILO). The processor can be a general-purpose processor, including a Central Processing Unit (CPU), a Network Processor (NP), etc.; it can also be a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field-Programmable Gate Array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.

[0032] Example 4: This embodiment provides a readable storage medium storing instructions that, when executed on a processor, cause the processor to perform the automated testing method for narrow-linewidth lasers in Embodiment 2. This embodiment also provides a program product that, when executed on a processor, performs the automated testing method for narrow-linewidth lasers in Embodiment 2.

[0033] Finally, it should be noted that the above description is merely a preferred embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. An automated testing system for narrow linewidth lasers, characterized in that, Includes a noise linewidth analyzer, a relative intensity noise analyzer, an optical switch module, an adjustable optical attenuator, an optical power meter, and a processor; among which: The optical switch module is used to connect to the narrow linewidth laser under test and guide the laser output from the narrow linewidth laser under test to an optical power meter or an adjustable optical attenuator. An adjustable optical attenuator is used to attenuate the introduced laser light, outputting a first attenuated laser light to a noise linewidth analyzer and an output of a second attenuated laser light to a relative intensity noise analyzer. The noise linewidth analyzer is used to receive the first attenuated laser and use the first attenuated laser to perform frequency noise testing, obtain noise linewidth test data, and feed the noise linewidth test data back to the processor. The relative intensity noise analyzer is used to receive the second attenuated laser and use the second attenuated laser to perform relative intensity noise testing, obtain relative intensity noise test data, and feed the relative intensity noise test data back to the processor. An optical power meter is used to measure the optical power of the introduced laser to obtain the original output optical power, measure the optical power of the first attenuated laser output by the adjustable optical attenuator to obtain the first attenuated optical power, measure the optical power of the second attenuated laser output by the adjustable optical attenuator to obtain the second attenuated optical power, and feed back the original output optical power, the first attenuated optical power and the second attenuated optical power to the processor. The processor is used to summarize noise linewidth test data, relative intensity noise test data, raw output optical power, first attenuation optical power and second attenuation optical power, and generate a comprehensive test report for the narrow linewidth laser under test.

2. The automated testing system for narrow linewidth lasers according to claim 1, characterized in that, The processor is used to send a switching control signal to the optical switch module, so that the optical switch module guides the laser output from the narrow linewidth laser under test to the optical power meter or the adjustable optical attenuator according to the switching control signal; the processor is used to control the working state of the noise linewidth analyzer, the relative intensity noise analyzer and the optical power meter; the processor is used to perform adaptive power allocation according to the original output optical power, generate an attenuation control signal and send the attenuation control signal to the adjustable optical attenuator, so that the adjustable optical attenuator performs optical attenuation processing on the introduced laser according to the attenuation control signal.

3. The automated testing system for narrow linewidth lasers according to claim 2, characterized in that, The processor is used to calculate a first optical attenuation based on the original output optical power and a set first optical power target value, calculate a second optical attenuation based on the original output optical power and a set second optical power target value, and generate an attenuation control signal based on the first optical attenuation and the second optical attenuation.

4. The automated testing system for narrow linewidth lasers according to claim 3, characterized in that, The processor is configured to calculate a first optical power difference based on a first optical power target value and a first attenuated optical power, calculate a second optical power difference based on a second optical power target value and a second attenuated optical power, and when it is determined that the first optical power difference and / or the second optical power difference exceeds a set tolerance value, generate an attenuation adjustment signal based on the first optical power difference and / or the second optical power difference, and send the attenuation adjustment signal to an adjustable optical attenuator, so that the adjustable optical attenuator performs optical attenuation adjustment processing on the introduced laser according to the attenuation adjustment signal.

5. The automated testing system for narrow linewidth lasers according to claim 1, characterized in that, The noise linewidth analyzer used is the GP-LWM-100 noise linewidth analyzer, and the noise linewidth test data includes frequency noise power spectral density, intrinsic linewidth, and integral linewidth.

6. The automated testing system for narrow linewidth lasers according to claim 1, characterized in that, The relative intensity noise analyzer used is the GP-RT100 model. The relative intensity noise test data includes the relative intensity noise spectrum and the relative intensity noise at a specific frequency point.

7. The automated testing system for narrow linewidth lasers according to claim 1, characterized in that, The system also includes an environmental detection sensor group, which is used to collect test environment data and send the test environment data to a processor. The processor is used to summarize the test environment data into a comprehensive test report of the narrow linewidth laser under test.

8. The automated testing system for narrow linewidth lasers according to claim 7, characterized in that, The environmental detection sensor group includes a temperature sensor, and the test environment data includes the test environment temperature.

9. An automated testing method for narrow linewidth lasers, applied to the processor described in any one of claims 1-8, characterized in that, include: Send a switching control signal to the optical switch module, so that the optical switch module will guide the laser output of the narrow linewidth laser under test to the optical power meter according to the switching control signal; The raw output optical power fed back by the optical power meter is obtained, which is obtained by the optical power meter measuring the optical power of the laser light it introduces; A switching control signal is sent to the optical switch module, which then directs the laser output from the narrow-linewidth laser under test to the adjustable optical attenuator according to the switching control signal. The optical switch module also performs adaptive power allocation based on the original output optical power, generates an attenuation control signal, and sends the attenuation control signal to the adjustable optical attenuator. The adjustable optical attenuator then performs optical attenuation processing on the introduced laser according to the attenuation control signal, outputs the first attenuated laser to the noise linewidth analyzer, and outputs the second attenuated laser to the relative intensity noise analyzer. The first attenuated optical power and the second attenuated optical power fed back by the optical power meter are obtained. The first attenuated optical power is obtained by measuring the optical power of the first attenuated laser output by the adjustable optical attenuator by the optical power meter. The second attenuated optical power is obtained by measuring the optical power of the second attenuated laser output by the adjustable optical attenuator by the optical power meter. The noise linewidth test data fed back by the noise linewidth analyzer and the relative intensity noise test data fed back by the relative intensity noise analyzer are obtained. The noise linewidth test data is obtained by the noise linewidth analyzer receiving the first attenuated laser and performing frequency noise test. The relative intensity noise test data is obtained by the relative intensity noise analyzer receiving the second attenuated laser and performing relative intensity noise test. By summarizing the noise linewidth test data, relative intensity noise test data, original output optical power, first attenuation optical power and second attenuation optical power, a comprehensive test report of the narrow linewidth laser under test is generated.

10. A program product, characterized in that, When the program product is run on the processor, the automated testing method for narrow linewidth lasers as described in claim 9 is executed.

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