Accelerated life testing system and method for brain-computer interface implants

Abstract

The application relates to an accelerated life test system and method of a brain-computer interface implant, the accelerated life test system comprising: an implant test module group comprising at least one implant test module, the implant test module being used for accommodating the brain-computer interface implant and testing the electrochemical performance of the brain-computer interface implant by using a test solution; a circulating pipeline connected with the implant test module group, the circulating pipeline being used for providing the test solution, the test solution having a preset active oxygen concentration; a liquid monitoring module connected with the circulating pipeline, the liquid monitoring module being configured to monitor an electrochemical signal of the test solution; and a central control module connected with the implant test module group, the circulating pipeline and the liquid monitoring module respectively, the central control module being configured to control the active oxygen concentration according to the electrochemical signal. The application can improve the overall test efficiency and test accuracy of the brain-computer interface implant.

Description

Technical Field

[0001] This application mainly relates to the field of brain-computer interface implant testing technology, and specifically to an accelerated life testing system and method for brain-computer interface implants. Background Technology

[0002] In vitro accelerated life testing is the primary method for verifying the effectiveness and reliability of brain-computer interface implants. It typically relies on animal experiments and simple water bath circulation devices for testing. Animal experiments usually have long testing cycles, and significant individual animal differences make it difficult to quantify data between groups, thus failing to meet the testing needs of large-scale implants. Simple water bath circulation devices, on the other hand, suffer from low automation, numerous instabilities, and poor system reliability.

[0003] Furthermore, current testing protocols do not adequately consider the inflammatory environment of implants within the body, making it difficult to simulate electrode aging caused by reactive oxygen species. The miniaturized and integrated nature of the implants also presents challenges for electrochemical performance testing, requiring testing in a liquid environment to assess changes in electrochemical performance during accelerated aging, in order to evaluate whether the electrodes still possess the ability to acquire signals or provide nerve stimulation. Current testing protocols suffer from low overall testing efficiency for implants. Summary of the Invention

[0004] The technical problem to be solved by this application is to provide an accelerated life testing system and method for brain-computer interface implants, which can improve the overall testing efficiency and accuracy of brain-computer interface implants.

[0005] The technical solution adopted in this application to solve the above-mentioned technical problems is an accelerated life testing system for brain-computer interface implants, comprising: an implant testing module, including at least one implant testing module, the implant testing module being used to accommodate the brain-computer interface implant and use a test solution to test the electrochemical performance of the brain-computer interface implant; a circulation pipeline connected to the implant testing module, the circulation pipeline being used to provide the test solution, the test solution having a preset reactive oxygen species (ROS) concentration; a liquid monitoring module connected to the circulation pipeline, the liquid monitoring module being configured to monitor the electrochemical signal of the test solution; and a central control module connected to the implant testing module, the circulation pipeline and the liquid monitoring module respectively, the central control module being configured to control the ROS concentration according to the electrochemical signal.

[0006] In one embodiment of this application, during the testing of the electrochemical performance, the central control module uses the following operations to control the reactive oxygen species (ROS) concentration: obtaining a first relationship between time and current based on the current test run time and the current temperature of the test solution; obtaining a second relationship between current and ROS concentration based on the first relationship and the feedback current value in the electrochemical signal; obtaining the current ROS concentration based on the second relationship; in response to the current ROS concentration being less than a preset concentration threshold, instructing the addition of hydrogen peroxide solution to the test solution; or in response to the current ROS concentration being greater than or equal to the preset concentration threshold, instructing the cessation of adding hydrogen peroxide solution to the test solution, thereby causing the test solution to reach the preset ROS concentration.

[0007] In one embodiment of this application, each implant testing module includes: a cavity for accommodating the brain-computer interface implant, the cavity having an inlet port and an outlet port, the inlet port being configured to inject the test solution according to an injection command, and the outlet port being configured to discharge the test solution according to an outlet command; a temperature sensor disposed within the cavity, the temperature sensor being configured to transmit the temperature of the test solution to the central control module, enabling the central control module to perform PID temperature regulation; and a heating device disposed outside the cavity, the heating device being configured to indirectly heat the test solution within the cavity based on the heat transfer effect.

[0008] In one embodiment of this application, the circulation pipeline includes: a test solution storage tank connected to the implant test module to provide the test solution; a hydrogen peroxide storage tank connected to the test solution storage tank via a first suction pump, a first solenoid valve, and a first flow meter, capable of injecting hydrogen peroxide solution from the hydrogen peroxide storage tank into the test solution storage tank; and a purified water inlet pipeline connected to the test solution storage tank via a second suction pump, a second solenoid valve, and a second flow meter, capable of injecting external purified water into the test solution storage tank.

[0009] In one embodiment of this application, the circulation pipeline further includes: an internal circulation inlet pipeline, which is connected to the test solution storage tank and the inlet interface of each implant test module through multiple inlet solenoid valves; and an internal circulation waste liquid pipeline, which is connected to the drain interface of each implant test module through multiple drain solenoid valves.

[0010] In one embodiment of this application, the internal circulation waste liquid pipeline is also connected to the test solution storage tank; the inlet solenoid valve is also connected to the inlet peristaltic pump, and the outlet solenoid valve is also connected to the outlet peristaltic pump; the central control module is further configured to circulate and refresh the test solution in the cavity using the following injection and drainage operations: in response to the current test running time reaching a preset duration, simultaneously opening the inlet solenoid valve and the outlet solenoid valve; the preset duration is related to the half-life time of reactive oxygen species concentration at the current test solution temperature; controlling the inlet peristaltic pump to operate at a preset rate to inject the test solution from the test solution storage tank into the cavity; controlling the outlet peristaltic pump to operate at the preset rate to discharge the test solution in the cavity to the test solution storage tank through the internal circulation waste liquid pipeline; in response to the test solution in the cavity having been circulated and refreshed, controlling the inlet peristaltic pump and the outlet peristaltic pump to stop operating; closing the inlet solenoid valve and the outlet solenoid valve.

[0011] In one embodiment of this application, each implant testing module further includes a capillary plate located within the cavity and disposed opposite to the inlet and outlet ports.

[0012] In one embodiment of this application, each implant testing module further includes: an electrical sealing part disposed within the cavity, the electrical sealing part being used to insulate and isolate the electrical circuitry of the brain-computer interface implant from the test solution, and to seal the cable lines within the cavity; and a sealing ring disposed at the cover plate of the cavity, wherein during the testing of the electrochemical performance, the cover plate and the sealing ring are in close contact to form a sealed chamber within the cavity.

[0013] In one embodiment of this application, the test solution storage tank is equipped with a weighing sensor, which is used to collect the weight of the test solution in the test solution storage tank; the central control module is further configured to: in response to the solution weight being less than a preset weight threshold, control the purified water inlet pipeline and / or the hydrogen peroxide storage tank to inject the hydrogen peroxide solution and / or the purified water into the test solution storage tank; or in response to the solution weight being greater than the preset weight threshold, instruct the discharge of the test solution in the test solution storage tank to maintain the liquid level of the test solution storage tank at a preset liquid level.

[0014] To address the aforementioned technical problems, this application also proposes an accelerated lifespan testing method for brain-computer interface implants. Using the accelerated lifespan testing system for brain-computer interface implants described above, the method includes: controlling the hydrogen peroxide storage tank and purified water inlet pipe of the circulation pipeline to inject hydrogen peroxide solution and purified water into a test solution storage tank, so that the test solution in the test solution storage tank reaches a preset reactive oxygen species (ROS) concentration; injecting the test solution into the cavity of the implant testing module containing the brain-computer interface implant; heating the test solution and performing PID temperature regulation based on the temperature of the test solution to maintain the test solution at a preset temperature; acquiring the electrochemical signal of the test solution in real time and controlling the ROS concentration based on the electrochemical signal; and obtaining the electrochemical performance data of the brain-computer interface implant after a preset test duration.

[0015] The technical solution of this application provides an independent and adaptable testing space for brain-computer interface implants through an implant testing module. This allows for flexible testing of the placement and electrochemical performance of different types of implants (such as invasive and semi-invasive brain-computer interface implants) or multiple implants of the same type. The circulation tubing stably supplies a test solution with a preset reactive oxygen species (ROS) concentration, effectively simulating the inflammatory environment of the implant within the body. A liquid monitoring module monitors the electrochemical signals of the test solution in real time, providing fundamental data for ROS concentration regulation. The central control module, through interaction with various components, dynamically adjusts the ROS concentration to ensure the stability of the testing environment. This application improves the overall testing efficiency and accuracy of brain-computer interface implants. Attached Figure Description

[0016] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, the specific embodiments of this application will be described in detail below with reference to the accompanying drawings, wherein:

[0017] Figure 1 This is a schematic diagram of an accelerated life testing system for a brain-computer interface implant according to an embodiment of this application;

[0018] Figure 2 This is a schematic diagram of an accelerated life testing system for a brain-computer interface implant according to another embodiment of this application;

[0019] Figure 3 This is a schematic diagram of an implant testing module in one embodiment of this application;

[0020] Figure 4 It is along Figure 3 A schematic diagram of a partial cross-sectional view of line AA' shown in the diagram;

[0021] Figure 5 This is a perspective view of an implant testing module in one embodiment of this application;

[0022] Figure 6 This is a flowchart of an accelerated lifespan testing method for a brain-computer interface implant according to an embodiment of this application;

[0023] Figure 7 This is a block diagram of an accelerated life testing device for a brain-computer interface implant according to an embodiment of this application.

[0024] Explanation of reference numerals in the accompanying drawings for specific embodiments:

[0025] 1. Implant testing module;

[0026] 11. Implant testing module;

[0027] 100. Accelerated life testing system for brain-computer interface implants;

[0028] 12. Cavity;

[0029] 13. Liquid inlet port;

[0030] 14. Drainage interface;

[0031] 15. Capillary plate;

[0032] 16. Electrical sealing part;

[0033] 17. Sealing ring;

[0034] 18. Cover plate;

[0035] 19. Base;

[0036] 2. Circulation piping;

[0037] 21. Test solution storage tank;

[0038] 22. Hydrogen peroxide storage tank;

[0039] 221. First suction pump;

[0040] 222. First solenoid valve;

[0041] 223. First flow meter;

[0042] 23. Purified water inlet pipeline;

[0043] 231. Second suction pump;

[0044] 232. Second solenoid valve;

[0045] 233. Second flow meter;

[0046] 24. Internal circulation inlet pipeline;

[0047] 241. Inlet solenoid valve;

[0048] 242. Inlet peristaltic pump;

[0049] 25. Internal circulation waste liquid pipeline;

[0050] 251. Drain solenoid valve;

[0051] 252. Peristaltic pump for drainage;

[0052] 3. Liquid monitoring module;

[0053] 4. Central control module;

[0054] 5. Purified water system. Detailed Implementation

[0055] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, the specific embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0056] Many specific details are set forth in the following description in order to provide a full understanding of this application. However, this application may also be implemented in other ways different from those described herein, and therefore this application is not limited to the specific embodiments disclosed below.

[0057] As illustrated in this application, unless the context clearly indicates otherwise, the words "a," "an," "an," and / or "the" do not specifically refer to the singular and may also include the plural. Generally speaking, the terms "comprising" and "including" only indicate the inclusion of explicitly identified steps and elements, which do not constitute an exclusive list, and the method or apparatus may also include other steps or elements.

[0058] Flowcharts are used in this application to illustrate the operations performed by the system according to embodiments of this application. It should be understood that the preceding or following operations are not necessarily performed in exact order. Instead, various steps can be processed in reverse order or simultaneously. Furthermore, other operations may be added to these processes, or one or more steps may be removed from these processes.

[0059] This application proposes an accelerated life testing system for brain-computer interface implants, which can be applied to scenarios requiring efficient, accurate, and batch life testing of medical devices such as brain-computer interface implants.

[0060] Figure 1 This is a schematic diagram of an accelerated life testing system for a brain-computer interface implant according to an embodiment of this application, with reference to... Figure 1 As shown, the accelerated life testing system 100 for brain-computer interface implants in this embodiment includes: an implant testing module 1, a circulation pipeline 2, a fluid monitoring module 3, and a central control module 4.

[0061] Figure 2This is a schematic diagram of an accelerated life testing system for a brain-computer interface implant according to another embodiment of this application. (Reference) Figure 1 and Figure 2 As shown, for example, the accelerated life testing system 100 for brain-computer interface implants can be integrated into a system cabinet, with an external personal computer (PC), i.e., a host computer, communicating with the central control module 4. The host computer is used to issue control commands and receive test data. The relevant components of the system will be described in detail below.

[0062] refer to Figure 2 As shown, the implant testing module 1 includes at least one implant testing module 11. The implant testing module 11 is used to house a brain-computer interface implant (not shown) and to test the electrochemical performance of the brain-computer interface implant using a test solution. Exemplarily, the implant testing module 1 of this application adopts a modular design, allowing for the installation of multiple (e.g., 20) quickly pluggable implant testing modules 11. Control signals and feedback signals are transmitted between the implant testing module 1 and each implant testing module 11 via electrical connection. The implant testing module 1 also interacts with the central control module 4 via electrical connection. The implant testing module 1 enables simultaneous testing of multiple batches of implants of different types, meeting the needs of large-sample testing.

[0063] refer to Figure 1 and Figure 2 As shown, the circulation line 2 is connected to the implant test module 1. The circulation line 2 is used to provide the test solution, which has a preset active oxygen concentration. For example, the circulation line 2 serves as the supply and circulation channel for the test solution. One end is connected to the external purified water system 5 and the hydrogen peroxide storage device (such as the hydrogen peroxide storage tank 22), and the other end is connected to each implant test module 11, ensuring that each test module can obtain a test solution with a stable concentration. The specific composition and connection method of the circulation line 2 will be described in detail later.

[0064] The liquid monitoring module 3 is connected to the circulation pipeline 2 and is configured to monitor the electrochemical signals of the test solution. For example, the core components of the liquid monitoring module 3 include an electrochemical test probe (such as a counter electrode and a working electrode) and an electrochemical workstation. The electrochemical test probe is immersed in the test solution storage tank 21 of the circulation pipeline 2, and the electrochemical signals (such as feedback current values) of the test solution are acquired using a chronoamperometry method. The signals are then transmitted in real time to the central control module 4 to provide raw data for calculating the reactive oxygen species concentration.

[0065] The central control module 4 is connected to the implant testing module 1, the circulation tubing 2, and the fluid monitoring module 3, respectively. The central control module 4 is configured to control the concentration of reactive oxygen species based on electrochemical signals. For example, the central control module 4 is connected to the implant testing module 1 via a microcontroller unit (MCU). The central control module 4 communicates with the host computer software in the PC, the fluid monitoring module 3, the implant testing module 1, and the circulation tubing 2 via data communication and signal control. The central control module 4 receives preset parameters from the host computer and feedback signals from each module, and outputs control commands according to preset logic to achieve automated control of the testing process.

[0066] The technical solution of this application provides an independent and adaptable testing space for brain-computer interface implants through the implant testing module 1, which can flexibly meet the needs of different types of implants or multiple implants of the same type for placement and electrochemical performance testing; the circulation pipeline 2 can stably supply a test solution with a preset reactive oxygen species (ROS) concentration, effectively simulating the inflammatory environment in which the implant exists in the body; the liquid monitoring module 3 monitors the electrochemical signal of the test solution in real time, providing basic data for the regulation of ROS concentration; the central control module 4, through interaction with various components, can dynamically adjust the ROS concentration to ensure the stability of the testing environment. This application improves the overall testing efficiency and accuracy of brain-computer interface implants.

[0067] In some embodiments, during the testing of the electrochemical performance of the brain-computer interface implant, the central control module 4 uses the following operation to control the reactive oxygen species concentration:

[0068] Based on the current test run time and the current temperature of the test solution, the first equation relating time and current is obtained.

[0069] Based on the first relationship and the feedback current value in the electrochemical signal, a second relationship between current and reactive oxygen concentration is obtained.

[0070] The current reactive oxygen species concentration is obtained based on the second relational formula;

[0071] In response to the current reactive oxygen species concentration being less than a preset concentration threshold, an instruction is given to add hydrogen peroxide solution to the test solution; or in response to the current reactive oxygen species concentration being greater than or equal to a preset concentration threshold, an instruction is given to stop adding hydrogen peroxide solution to the test solution, thereby bringing the test solution to the preset reactive oxygen species concentration.

[0072] For example, the central control module 4 first obtains the current test solution temperature collected by the temperature sensor, calls the first relational formula at the corresponding temperature, and calculates the theoretical current value in combination with the current test running time; then it obtains the feedback current value collected by the liquid monitoring module 3, and obtains the corrected current value by correcting the deviation between the actual feedback current value and the theoretical current value; and substitutes the corrected current value into the second relational formula to calculate the current active oxygen concentration C.

[0073] The preset concentration threshold is set to 20mM (adapting to the reactive oxygen species concentration range of the in vivo inflammatory environment). When C < 20mM, the central control module 4 instructs the hydrogen peroxide storage tank 22 to inject hydrogen peroxide solution into the test solution storage tank 21 until C ≥ 20mM, thus stopping the injection to ensure that the test solution always maintains the preset reactive oxygen species concentration.

[0074] Existing testing methods only involve statically adding hydrogen peroxide solution, resulting in large concentration fluctuations. However, this application achieves precise dynamic control of reactive oxygen species concentration through collaborative calculation using dual relationships, making the testing environment closer to the actual situation in living organisms.

[0075] Figure 3 This is a schematic diagram of an implant testing module in one embodiment of this application. (Reference) Figure 3 As shown, in some embodiments, each implant test module 11 includes: a cavity 12, a temperature sensor (not shown) and a heating device (not shown).

[0076] For example, cavity 12 is used to accommodate brain-computer interface implant. Cavity 12 is provided with inlet port 13 and outlet port 14. Inlet port 13 is configured to inject test solution according to injection command, and outlet port 14 is configured to discharge test solution according to discharge command. Inlet port 13 and outlet port 14 are respectively connected to corresponding pipes of circulation pipe 2. Solenoid valves are provided at the interfaces for injecting test solution and discharging waste liquid.

[0077] A temperature sensor is installed inside the cavity 12. The temperature sensor is configured to transmit the temperature of the test solution to the central control module 4, so that the central control module 4 can perform proportional-integral-derivative (PID) temperature regulation.

[0078] The heating device is located outside the cavity 12 and is configured to indirectly heat the test solution inside the cavity 12 based on the heat transfer effect. For example, the heating device is located outside the cavity 12 and is in close contact with the six surfaces of the cavity 12. It heats and keeps the test solution inside the cavity 12 warm through the heat transfer effect. The heat is transferred to the test solution through a material with good thermal conductivity (such as thermally conductive ceramics, graphene, silicone grease, etc.).

[0079] The cavity 12 structure of this application provides an independent testing space for the implant. The liquid inlet 13 and liquid outlet 14 enable flexible replacement of the test solution. The combination of temperature sensor and PID control ensures that the temperature of the test solution is stable within the preset range, avoiding the impact of temperature fluctuations on electrochemical performance testing. The heating device adopts an external indirect heat transfer method. Combined with the tight fit design with the six outer surfaces of the cavity 12 and the thermally conductive material with good thermal conductivity, it achieves uniform heating and heat preservation of the test solution, providing a stable high-temperature environment for accelerated life testing. It can achieve accelerated testing at a rate of up to 32 times, significantly shortening the testing cycle.

[0080] refer to Figure 2 As shown, in some embodiments, the circulation line 2 includes: a test solution storage tank 21, a hydrogen peroxide storage tank 22, and a purified water inlet line 23.

[0081] The test solution reservoir 21 is connected to the implant test module 1 to provide the test solution. For example, the test solution reservoir 21 is equipped with a weight sensor to obtain the liquid volume within the reservoir.

[0082] The hydrogen peroxide storage tank 22 is connected to the test solution storage tank 21 via a first suction pump 221, a first solenoid valve 222, and a first flow meter 223, enabling precise injection of the hydrogen peroxide solution from the hydrogen peroxide storage tank 22 into the test solution storage tank 21. For example, the hydrogen peroxide storage tank 22 can store a 7.5%-10% dilute hydrogen peroxide solution, avoiding potential safety issues associated with storing pure hydrogen peroxide. The hydrogen peroxide storage tank 22 is equipped with an external interface for operators to replenish the hydrogen peroxide solution, and a level sensor is installed inside the tank to obtain the current storage level.

[0083] The purified water inlet pipe 23 is connected to the test solution storage tank 21 via a second suction pump 231, a second solenoid valve 232, and a second flow meter 233, enabling precise injection of external purified water into the test solution storage tank 21. For example, the purified water inlet pipe 23 is connected to an external purified water system 5, and the purified water is injected to mix the test solution with the hydrogen peroxide solution in a preset ratio.

[0084] The test solution storage tank 21 of this application provides a stable storage space for the test solution. The independent setting of the hydrogen peroxide storage tank 22 and the purified water inlet pipeline 23 allows for flexible adjustment of the active oxygen concentration of the test solution according to test requirements, adapting to the test environment requirements of different implants.

[0085] refer to Figure 2 As shown, in some embodiments, the circulation pipeline 2 further includes an internal circulation inlet pipeline 24 and an internal circulation waste liquid pipeline 25.

[0086] refer to Figure 2 and Figure 3 As shown, the internal circulation inlet pipeline 24 is connected to the test solution storage tank 21 and the inlet interface 13 of each implant test module 11 via multiple inlet solenoid valves 241. For example, the internal circulation inlet pipeline 24 connects the test solution storage tank 21 and the inlet of each implant test module 11, and is connected to the inlet interface 13 of each implant test module 11 via multiple inlet solenoid valves 241, allowing independent control of the inlet flow of the corresponding test module.

[0087] The internal circulation waste liquid pipeline 25 is connected to the drainage interface 14 of each implant test module 11 via multiple drainage solenoid valves 251. For example, the internal circulation waste liquid pipeline 25 connects the outlet of each implant test module 11 to the external drainage interface 14, and is connected to the drainage interface 14 of each implant test module 11 via multiple drainage solenoid valves 251. The drainage solenoid valves 251 can independently control the drainage on / off of the corresponding test module.

[0088] This application achieves the recycling and independent supply of test solution through the setting of internal circulation inlet pipe 24 and internal circulation waste pipe 25. Multiple inlet solenoid valves 241 and outlet solenoid valves 251 can independently control the liquid circuit on / off of each implant test module 11, so that different test modules can flexibly carry out tests according to their needs without interfering with each other, further improving the system's adaptability to multiple batches and different needs tests, and meeting the needs of large sample size test scenarios.

[0089] Continue to refer to Figure 2 As shown, in some embodiments, the internal circulation waste liquid pipeline 25 is also connected to the test solution storage tank 21; the inlet solenoid valve 241 is also connected to the inlet peristaltic pump 242, and the drain solenoid valve 251 is also connected to the drain peristaltic pump 252. The central control module 4 is also configured to circulate and refresh the test solution in the cavity 12 using the following injection and drainage operations:

[0090] In response to the current test run time reaching the preset duration, the inlet solenoid valve 241 and the outlet solenoid valve 251 are opened simultaneously; the preset duration is related to the half-life of reactive oxygen species concentration at the current test solution temperature;

[0091] The peristaltic pump 242 is controlled to operate at a preset rate to inject the test solution in the test solution storage tank 21 into the cavity 12;

[0092] The peristaltic pump 252 is controlled to operate at a preset rate to discharge the test solution in the cavity 12 to the test solution storage tank 21 through the internal circulation waste liquid pipeline 25.

[0093] In response to the test solution that has been circulated and refreshed in the chamber 12, the inlet peristaltic pump 242 and the outlet peristaltic pump 252 are controlled to stop operating;

[0094] Close the inlet solenoid valve 241 and the outlet solenoid valve 251.

[0095] For example, this application connects the inlet solenoid valve 241 to the inlet peristaltic pump 242 in series, and the outlet solenoid valve 251 to the outlet peristaltic pump 252 in series. The preset rate of the peristaltic pump is adapted to a slow trickle flow mode to avoid convection interference around the implant caused by solution flow. When the test run time reaches the preset duration, the central control module 4 simultaneously sends a command to open the inlet solenoid valve 241 and the outlet solenoid valve 251, and start the inlet peristaltic pump 242 and the outlet peristaltic pump 252. Fresh solution in the test solution storage tank 21 is injected into the cavity 12 through the internal circulation inlet pipe 24, while waste liquid in the cavity 12 is discharged to the test solution storage tank 21 through the internal circulation waste liquid pipe 25. When the test solution in the cavity 12 is completely refreshed, the central control module 4 commands the peristaltic pump to stop operating and closes the solenoid valve, completing one injection and drainage cycle.

[0096] This application achieves waste liquid recycling by connecting the internal circulation waste liquid pipeline 25 to the test solution storage tank 21, reducing resource waste; based on the preset duration of the reactive oxygen species half-life, it ensures that the test solution is renewed before the reactive oxygen species concentration decays, maintaining the stability of the test environment; through the coordinated action of the inlet peristaltic pump 242 and the outlet peristaltic pump 252 and the control of the preset rate (such as the slow trickle method), it avoids the interference of convection on the test environment during the solution replacement process, ensuring that the implant is always in a stable test solution, and improving the reliability of the test results.

[0097] Figure 4 It is along Figure 3 The schematic diagram of a partial cross-sectional view of line AA' shown in the figure. Figure 4 Removed from Figure 3 Components such as cover plate 18 in the middle; Figure 5 This is a perspective view of an implant testing module according to one embodiment of this application. (Reference) Figures 3 to 5 As shown, in some embodiments, each implant testing module 11 further includes a capillary plate 15, which is located within the cavity 12 and is disposed opposite to the inlet port 13 and the outlet port 14.

[0098] For example, the capillary plate 15 can effectively reduce the convection phenomenon of the test solution during the inlet, outlet and circulation process, avoid the uneven test environment around the implant caused by liquid flow, and ensure the accuracy of electrode electrochemical performance detection.

[0099] Continue to refer to Figures 3 to 5As shown, in some embodiments, each implant test module 11 further includes an electrical seal 16 and a sealing ring 17. The electrical seal 16 is disposed within the cavity 12 and is used to insulate and isolate the electrical circuitry of the brain-computer interface implant from the test solution, and to seal the cable lines within the cavity 12.

[0100] For example, the electrical sealing part 16 is equivalent to an electrical sealing chamber, which is used to insulate and isolate the electrical parts of the brain-computer interface implant from the test solution, while also sealing the cable lines to prevent the solution from corroding the electrical lines or causing a short circuit.

[0101] A sealing ring 17 is disposed at the cover plate 18 (i.e., transparent chamber cover) of the cavity 12. During the test, the cover plate 18 and the sealing ring 17 are in close contact, forming a sealed chamber in the cavity 12. For example, the cover plate 18 is connected to the base 19 by screws. During the test, the cover plate 18 is in close contact with the sealing ring 17, forming a completely sealed chamber in the cavity 12, preventing leakage of the test solution, and preventing external air from entering and affecting the solution concentration.

[0102] This application achieves insulation isolation between the implant's electrical circuitry and the test solution through the electrical sealing part 16, avoiding corrosion of electrical components and short-circuit risks caused by the test solution, while protecting the stability of the cable line; the cooperation between the sealing ring 17 and the cover plate 18 forms a sealed chamber to prevent test solution leakage, ensuring the sealing and stability of the test environment, and avoiding interference from external factors on the test process.

[0103] refer to Figure 2 As shown, in some embodiments, a weighing sensor (not shown in the figure) is provided on the test solution storage tank 21. The weighing sensor is used to collect the weight of the test solution in the test solution storage tank 21.

[0104] The central control module 4 is also configured to: in response to the solution weight being less than a preset weight threshold, control the purified water inlet pipe 23 and / or the hydrogen peroxide storage tank 22 to inject hydrogen peroxide solution and / or purified water into the test solution storage tank 21; or in response to the solution weight being greater than the preset weight threshold, instruct the discharge of the test solution in the test solution storage tank 21 to maintain the liquid level of the test solution storage tank 21 at a preset liquid level.

[0105] For example, in practical applications, the monitoring logic of the weighing sensor can have a higher priority than the liquid injection / drainage circulation logic. When the weight is detected to be below the lower limit during the liquid injection / drainage circulation process, the liquid injection / drainage operation is paused, and liquid replenishment is performed first. Liquid injection / drainage continues only after the liquid level is restored, ensuring the stability of the system operation.

[0106] This application uses a weighing sensor to monitor the weight of the solution in the test solution storage tank 21 in real time, and combined with the feedback control of the central control module 4, it achieves stable maintenance of the liquid level. When the liquid level is lower than the preset threshold, the liquid is automatically replenished and the preset active oxygen concentration is maintained. When the liquid level is too high, it is discharged in time to ensure sufficient supply and stable concentration of the test solution, and avoid the impact of liquid level fluctuations on the continuity and accuracy of the test.

[0107] This application also proposes an accelerated lifespan testing method for brain-computer interface implants, using the accelerated lifespan testing system 100 for brain-computer interface implants as described above to test the implants. The accelerated lifespan testing method for brain-computer interface implants of this application can be implemented as follows: Figure 2 The method described above can run on a computer PC, for example, within a computer controller, or on a cloud platform. When the accelerated lifespan testing method for the brain-computer interface implant runs on a cloud platform, data from the computer and the cloud platform interact via a wireless network. For example, the cloud platform may include a private cloud, public cloud, hybrid cloud, community cloud, distributed cloud, interconnected cloud, and multiple clouds, or any combination thereof. This application does not limit the operating environment of the accelerated lifespan testing method for the brain-computer interface implant.

[0108] Figure 6 This is a flowchart of an accelerated lifespan testing method for a brain-computer interface implant according to an embodiment of this application, see reference. Figure 6 As shown, the accelerated lifespan testing method for the brain-computer interface implant in this embodiment includes the following steps:

[0109] Step S1: Control the hydrogen peroxide storage tank and purified water inlet pipe of the circulation pipeline to inject hydrogen peroxide solution and purified water into the test solution storage tank, so that the test solution in the test solution storage tank reaches the preset active oxygen concentration.

[0110] Step S2: Inject the test solution into the cavity of the implant test module containing the brain-computer interface implant, heat the test solution and adjust the temperature using PID control according to the temperature of the test solution to maintain the test solution at the preset temperature.

[0111] Step S3: Collect the electrochemical signal of the test solution in real time, and control the concentration of reactive oxygen species based on the electrochemical signal.

[0112] Step S4: After testing for the preset test duration, obtain the electrochemical performance data of the brain-computer interface implant.

[0113] For example, this application achieves fully automated control of the entire process from test solution preparation and test environment setup to performance testing; through precise configuration and dynamic maintenance of reactive oxygen species concentration and stable control of test temperature, it ensures a high degree of compatibility between the test environment and the inflammatory and immune environment in vivo. This application can rapidly obtain electrochemical performance data of brain-computer interface implants, providing reliable experimental evidence for assessing the expected lifespan of implants, and is adaptable to the needs of multi-batch, large-sample testing, improving testing efficiency and result accuracy.

[0114] This application also includes an accelerated lifespan testing device for brain-computer interface implants, comprising a memory and a processor. The memory stores instructions executable by the processor; the processor executes these instructions to implement the accelerated lifespan testing method for brain-computer interface implants described above.

[0115] Figure 7 This is a block diagram of an accelerated lifespan testing device for a brain-computer interface implant according to an embodiment of this application. (Reference) Figure 7 As shown, the accelerated lifespan testing device 700 for the brain-computer interface implant may include an internal communication bus 701, a processor 702, a read-only memory (ROM) 703, a random access memory (RAM) 704, and a communication port 705. When applied to a personal computer, the accelerated lifespan testing device 700 for the brain-computer interface implant may also include a hard disk 706. The internal communication bus 701 enables data communication between the components of the accelerated lifespan testing device 700 for the brain-computer interface implant. The processor 702 can perform judgments and issue prompts. In some embodiments, the processor 702 may consist of one or more processors. The communication port 705 enables data communication between the accelerated lifespan testing device 700 for the brain-computer interface implant and external devices. In some embodiments, the accelerated lifespan testing device 700 for the brain-computer interface implant can send and receive information and data from a network through the communication port 705. The accelerated life testing device 700 for the brain-computer interface implant may also include different types of program storage units and data storage units, such as a hard disk 706, a read-only memory (ROM) 703, and a random access memory (RAM) 704, capable of storing various data files used for computer processing and / or communication, as well as possible program instructions executed by the processor 702. The processor executes these instructions to implement the main part of the method. The results of the processor processing are transmitted to the user device via a communication port and displayed on the user interface.

[0116] The above-described accelerated lifespan testing method for brain-computer interface implants can be implemented as a computer program, stored in hard disk 706, and loaded into processor 702 for execution, in order to implement the accelerated lifespan testing method for brain-computer interface implants of this application.

[0117] This application also includes a computer-readable medium storing computer program code that, when executed by a processor, implements the accelerated lifespan testing method for the brain-computer interface implant described above.

[0118] When the accelerated life testing method for brain-computer interface implants is implemented as a computer program, it can also be stored as an article of manufacture in a computer-readable storage medium. For example, computer-readable storage media can include, but are not limited to, magnetic storage devices (e.g., hard disks, floppy disks, magnetic stripes), optical discs (e.g., compact discs (CDs), digital multifunction discs (DVDs)), smart cards, and flash memory devices (e.g., electrically erasable programmable read-only memory (EPROM), cards, sticks, key drives). Furthermore, the various storage media described herein can represent one or more devices and / or other machine-readable media used for storing information. The term "machine-readable medium" can include, but is not limited to, wireless channels and various other media (and / or storage media) capable of storing, containing, and / or carrying code and / or instructions and / or data.

[0119] It should be understood that the embodiments described above are merely illustrative. The embodiments described herein may be implemented in hardware, software, firmware, middleware, microcode, or any combination thereof. For hardware implementation, the processor may be implemented within one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), processors, controllers, microcontrollers, microprocessors, and / or other electronic units designed to perform the functions described herein, or combinations thereof.

[0120] Some aspects of this application can be executed entirely by hardware, entirely by software (including firmware, resident software, microcode, etc.), or by a combination of hardware and software. The aforementioned hardware or software may be referred to as a "data block," "module," "engine," "unit," "component," or "system." The processor may be one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DAPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), processors, controllers, microcontrollers, microprocessors, or combinations thereof. Furthermore, aspects of this application may manifest as computer products residing in one or more computer-readable media, including computer-readable program code. For example, computer-readable media may include, but are not limited to, magnetic storage devices (e.g., hard disks, floppy disks, magnetic tapes, etc.), optical discs (e.g., compressed CDs, digital multifunction DVDs, etc.), smart cards, and flash memory devices (e.g., cards, sticks, key drives, etc.).

[0121] A computer-readable medium may contain a propagated data signal containing computer program code, for example, on baseband or as part of a carrier wave. This propagated signal may take various forms, including electromagnetic, optical, and so on, or suitable combinations thereof. A computer-readable medium can be any computer-readable medium other than a computer-readable storage medium, which can be connected to an instruction execution system, apparatus, or device to enable communication, propagation, or transmission of a program for use. The program code located on the computer-readable medium can be propagated through any suitable medium, including radio, cable, fiber optic cable, radio frequency signals, or similar media, or any combination of the above media.

[0122] The basic concepts have been described above. Obviously, for those skilled in the art, the above disclosure is merely illustrative and does not constitute a limitation of this application. Although not explicitly stated herein, those skilled in the art may make various modifications, improvements, and corrections to this application. Such modifications, improvements, and corrections are suggested in this application, and therefore remain within the spirit and scope of the exemplary embodiments of this application.

[0123] Furthermore, this application uses specific terms to describe embodiments of the application. For example, "an embodiment," "one embodiment," and / or "some embodiments" refer to a particular feature, structure, or characteristic related to at least one embodiment of the application. Therefore, it should be emphasized and noted that "an embodiment," "one embodiment," or "an alternative embodiment" mentioned twice or more in different locations in this specification do not necessarily refer to the same embodiment. In addition, certain features, structures, or characteristics in one or more embodiments of the application can be appropriately combined.

[0124] In some embodiments, numbers describing the quantity of components and attributes are used. It should be understood that such numbers used to describe embodiments are sometimes modified by the terms "approximately," "approximately," or "generally." Unless otherwise stated, "approximately," "approximately," or "generally" indicates that the numbers are allowed to vary by ±20%. Accordingly, in some embodiments, the numerical parameters used in this application are approximate values, which may be changed depending on the characteristics required by individual embodiments. In some embodiments, numerical parameters should take into account specified significant digits and employ a general method of digit reservation. Although the numerical ranges and parameters used to confirm their breadth of range in some embodiments of this application are approximate values, in specific embodiments, such values ​​are set as precisely as feasible.

Claims

1. An accelerated lifespan testing system for brain-computer interface implants, characterized in that, include: An implant testing module includes at least one implant testing module, which is used to accommodate the brain-computer interface implant and use a test solution to test the electrochemical performance of the brain-computer interface implant. A circulation tubing is connected to the implant testing module, the circulation tubing being used to provide the testing solution, the testing solution having a preset reactive oxygen species concentration; A liquid monitoring module is connected to the circulation pipeline, and the liquid monitoring module is configured to monitor the electrochemical signal of the test solution; as well as A central control module is connected to the implant testing module, the circulation tubing, and the liquid monitoring module, respectively. The central control module is configured to control the reactive oxygen species (ROS) concentration based on the electrochemical signal. Specifically, during the electrochemical performance testing process, the central control module controls the ROS concentration using the following operations: Based on the current test run time and the current temperature of the test solution, the first equation relating time and current is obtained. Based on the first relationship and the feedback current value in the electrochemical signal, a second relationship between current and reactive oxygen concentration is obtained. The current reactive oxygen species concentration is obtained based on the second equation. In response to the current reactive oxygen species concentration being less than a preset concentration threshold, a command is issued to add hydrogen peroxide solution to the test solution; Alternatively, in response to the current reactive oxygen species concentration being greater than or equal to the preset concentration threshold, an instruction is given to stop adding the hydrogen peroxide solution to the test solution, thereby bringing the test solution to the preset reactive oxygen species concentration.

2. The accelerated life testing system for brain-computer interface implants as described in claim 1, characterized in that, Each implant testing module includes: A cavity for housing the brain-computer interface implant, the cavity having an inlet port and an outlet port, the inlet port being configured to inject the test solution according to an injection command, and the outlet port being configured to discharge the test solution according to an outlet command. A temperature sensor is disposed within the cavity and is configured to transmit the temperature of the test solution to the central control module, thereby enabling the central control module to perform PID temperature regulation. A heating device is disposed outside the cavity, and the heating device is configured to indirectly heat the test solution inside the cavity based on the heat transfer effect.

3. The accelerated life testing system for brain-computer interface implants as described in claim 2, characterized in that, The circulation pipeline includes: A test solution reservoir is connected to the implant test module to provide the test solution; A hydrogen peroxide storage tank is connected to the test solution storage tank via a first suction pump, a first solenoid valve, and a first flow meter, enabling the hydrogen peroxide solution in the hydrogen peroxide storage tank to be injected into the test solution storage tank. The purified water inlet pipeline is connected to the test solution storage tank via a second suction pump, a second solenoid valve, and a second flow meter, enabling external purified water to be injected into the test solution storage tank.

4. The accelerated life testing system for brain-computer interface implants as described in claim 3, characterized in that, The circulation pipeline also includes: The internal circulation inlet pipeline is connected to the test solution storage tank and the inlet interface of each implant test module through multiple inlet solenoid valves. The internal circulation waste liquid pipeline is connected to the drainage interface of each implant test module through multiple drainage solenoid valves.

5. The accelerated life testing system for brain-computer interface implants as described in claim 4, characterized in that, The internal circulation waste liquid pipeline is also connected to the test solution storage tank; the inlet solenoid valve is also connected to the inlet peristaltic pump, and the outlet solenoid valve is also connected to the outlet peristaltic pump; the central control module is also configured to circulate and refresh the test solution in the cavity using the following injection and drainage operations: In response to the current test run time reaching the preset duration, both the liquid inlet solenoid valve and the liquid outlet solenoid valve are opened simultaneously. The preset duration is related to the half-life of reactive oxygen species concentration at the current test solution temperature; The inlet peristaltic pump is controlled to operate at a preset rate to inject the test solution from the test solution storage tank into the cavity; The peristaltic pump is controlled to operate at the preset rate to discharge the test solution in the cavity to the test solution storage tank through the internal circulation waste liquid pipeline; In response to the test solution already circulated and refreshed in the cavity, the inlet peristaltic pump and the outlet peristaltic pump are controlled to stop operating; Close the inlet solenoid valve and the outlet solenoid valve.

6. The accelerated life testing system for brain-computer interface implants as described in claim 2, characterized in that, Each implant testing module also includes a capillary plate located within the cavity and positioned opposite the inlet and outlet ports.

7. The accelerated life testing system for brain-computer interface implants as described in claim 2, characterized in that, Each implant testing module also includes: An electrical sealing part is disposed in the cavity, the electrical sealing part being used to insulate and isolate the electrical circuits of the brain-computer interface implant from the test solution, and to seal the cable circuits within the cavity; A sealing ring is provided at the cover plate of the cavity. During the testing of the electrochemical performance, the cover plate and the sealing ring are in close contact to form a sealed chamber.

8. The accelerated life testing system for brain-computer interface implants as described in claim 3, characterized in that, The test solution storage tank is equipped with a weighing sensor, which is used to collect the weight of the test solution in the storage tank; the central control module is also configured to: In response to the solution weight being less than a preset weight threshold, the purified water inlet pipeline and / or the hydrogen peroxide storage tank are controlled to inject the hydrogen peroxide solution and / or the purified water into the test solution storage tank; or In response to the solution weight being greater than the preset weight threshold, an instruction is given to discharge the test solution from the test solution storage tank in order to maintain the liquid level of the test solution storage tank at the preset liquid level.

9. A method for accelerating the lifespan testing of a brain-computer interface implant, characterized in that, Using the accelerated life testing system for brain-computer interface implants as described in any one of claims 1-8, the method comprises: The hydrogen peroxide storage tank and purified water inlet pipe of the control circulation pipeline are injected into the test solution storage tank to make the test solution in the test solution storage tank reach the preset active oxygen concentration. The test solution is injected into the cavity of the implant test module containing the brain-computer interface implant, the test solution is heated and the temperature is adjusted by PID according to the temperature of the test solution to maintain the test solution at a preset temperature; The electrochemical signal of the test solution is acquired in real time, and the concentration of reactive oxygen species is controlled based on the electrochemical signal. After the preset test duration, the electrochemical performance data of the brain-computer interface implant were obtained.

Images