Common map-oriented quality inspection method and system, and storage medium
By constructing a multi-dimensional quality inspection indicator system and automated judgment methods, the problems of low efficiency and poor accuracy in existing ordinary map quality inspection have been solved, achieving efficient and objective quality inspection results and ensuring the scientific nature and reliability of map quality assessment.
Patent Information
- Application Number
- CN202511583110.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-10-31
- Publication Date
- 2026-02-27
AI Technical Summary
Existing methods for quality inspection of conventional maps are inefficient, inaccurate, lack multi-dimensional testing, and have insufficient objectivity in their standards, making it impossible to quickly pinpoint the root cause of quality problems.
By acquiring the quality inspection map of the same region and scale, along with multiple standard maps, geometric, attribute, and topological data are extracted to construct a benchmark map and generate multi-dimensional quality inspection indicators. Objective standard values are then generated using the statistical mean method to achieve automated quality inspection.
It improves the efficiency and accuracy of quality inspection, reduces human error, provides scientific and efficient quality assessment methods, and ensures the accuracy and usability of map data in various application scenarios.