Self-adaptive adjustment method and system of spectrometer for physical experiment

Abstract

The invention relates to the technical field of spectrometers, and provides a self-adaptive adjustment method and system for a spectrometer for physical experiments, and the method comprises the steps: employing a marking film layer which is laid on an objective table of the spectrometer and has a non-repetitive microscopic geometric pattern, and enabling the marking film layer to generate unique diffraction stripes as a dynamic reference when the marking film layer is irradiated by a collimator; a speckle image is captured through a telescope system, multi-dimensional geometric features such as the curvature of a center contour, the symmetry of a peripheral diffraction ring and a high-order diffraction point space vector are extracted and input into a light path deviation analysis model, and the correction adjusting quantity for optical axis inclination, concentricity deviation and space angle deviation can be accurately calculated. Through combination of dynamic reference and multi-dimensional feature analysis, high-precision and self-adaptive adjustment of a spectrometer optical path is realized, and the problem of instability caused by environmental interference or mark degradation of a traditional single reference object is solved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of spectrometer, in particular to a self-adaptive adjustment method and system of spectrometer for physical experiment. BACKGROUND

[0002] The content of this part only provides background information related to the present application, which may not constitute prior art.

[0003] The optical fiber manufacturing process needs to strictly control the key optical parameters such as refractive index uniformity and core-cladding refractive index difference, which directly affect the signal transmission loss and stability and need to be accurately detected and verified. The spectrometer commonly used in physical experiments has the functions of accurately measuring the dispersion of light and the refractive index of matter, and becomes the core detection equipment in the optical fiber manufacturing link, that is, by placing the optical fiber sample on the spectrometer stage, using its light splitting principle to analyze the refraction and diffraction characteristics of different wavelength incident light after the optical fiber, the optical structure parameters of the optical fiber can be reversely calculated whether they meet the standard.

[0004] However, the traditional spectrometer relies on manual repeated adjustment of the stage level, telescope optical axis alignment and slit focal length, which is tedious and easy to be affected by human error, and is difficult to adapt to the high-efficiency detection needs of the continuous production of optical fiber industrialization. Therefore, the self-adaptive adjustment technology of the spectrometer emerges as the times require: by integrating a photoelectric sensing module to collect the deviation of the light splitting signal in real time, and combining a closed-loop control algorithm to drive the mechanical structure to automatically calibrate the optical axis and optimize the light splitting path, the measurement accuracy advantage of the spectrometer is retained, and the automation and stability of the detection process are realized, effectively supporting the efficient verification of optical parameters in optical fiber manufacturing and ensuring the quality consistency of optical fiber products.

[0005] In the prior art, a spectrometer telescope automatic adjustment method and system are disclosed in Chinese Patent No. CN118818696A, and the adjustment process relies on the green cross in the picture as the only reference target. This reference method has insufficient stability - if the environmental light conditions change, such as light intensity fluctuation and external stray light interference, it will affect the color recognition accuracy of the green cross; if the green cross is worn, blocked or the marker clarity decreases, etc., it will directly cause the reference standard to fail, and the center point coordinates and offset cannot be normally obtained, and the adjustment process is interrupted. In terms of adjustment dimension, this method only adjusts the horizontal and pitch angles of the eyepiece, and can only solve the alignment problem of the center of the green cross and the center of the picture, without considering other deviation types that may exist in the light path of the spectrometer. The adjustment dimension is single, cannot realize comprehensive correction of the overall deviation of the light path, and cannot meet the needs of high-precision experiments for the overall stability of the light path.

[0006] Therefore, there is an urgent need for a self-adaptive adjustment method and system of spectrometer for physical experiment to solve the problems of the prior art. SUMMARY

[0007] To solve the above technical problems, the purpose of the present application is to provide an adaptive adjustment method and system for a spectrometer for physical experiments, which uses diffraction fringes generated by non-repetitive micro-geometric patterns as a dynamic reference standard and combines a multi-dimensional geometric feature analysis optical path deviation model to achieve adaptive correction of the spectrometer optical axis tilt, concentricity deviation and spatial angle deviation, overcoming the instability problem of traditional single reference under environmental interference and marker degradation.

[0008] The purpose of the present application is achieved by the following technical solutions: In a first aspect, the present application provides an adaptive adjustment method for a spectrometer for physical experiments, comprising: S101, a marker film layer with a preset pattern is laid on the surface of the spectrometer stage, the preset pattern is composed of non-repetitive micro-geometric patterns; when the collimated light beam emitted by the parallel light tube irradiates the marker film layer, the preset pattern forms a corresponding diffraction fringe distribution in the telescope system, and the diffraction fringe distribution is used as a dynamic reference standard; S102, rotate the telescope arm to a preset initial angle, capture the diffraction fringe distribution image through the imaging sensor built-in the telescope; extract the target geometric feature parameters in the fringe distribution image, including the profile curvature of the central dense area, the distribution symmetry of the peripheral diffraction ring, and the spatial vector arrangement of the high-order diffraction points; S103, input the target geometric feature parameters into the optical path deviation analysis model to calculate the adjustment amount, the deviation analysis model includes: decomposing the extracted profile curvature into two orthogonal direction curvature components; comparing the actual curvature component in any orthogonal direction with the corresponding reference threshold, and determining the tilt direction of the optical axis along the orthogonal direction according to the comparison result; according to the determined tilt direction, calculate the deviation degree of the curvature component and the corresponding reference threshold, and according to the corresponding relationship between the preset tilt deviation and the optical axis correction adjustment amount, obtain the first adjustment amount for correcting the optical axis tilt in the corresponding orthogonal direction; Based on the distribution symmetry of the peripheral diffraction ring, select several groups of symmetric feature points on the diffraction ring, calculate the coordinate deviation values of each group of symmetric points, and perform mean value fitting on the coordinate deviation values to obtain the concentricity deviation; generate the second adjustment amount according to the concentricity deviation and the corresponding offset direction; Establish a spatial rectangular coordinate system of the high-order diffraction points, compare the spatial vectors of each high-order diffraction point with the preset reference vector, calculate the included angle between each vector by vector cross product, and obtain the spatial included angle by least square fitting; according to the deviation direction and the deviation degree corresponding to the spatial included angle, based on the corresponding relationship between the spatial included angle deviation and the rotation correction adjustment amount of the telescope arm or the stage, calculate the third adjustment amount for making the spatial vectors of the high-order diffraction points consistent with the preset reference vector; S104, adjust the corresponding mechanism of the spectrometer according to the first adjustment amount, the second adjustment amount and the third adjustment amount to complete the adjustment of the spectrometer optical path.

[0009] Furthermore, the contour curvature of the central dense region in the target's geometric features is extracted using the following method: The Otsu algorithm based on grayscale thresholding is used to segment the diffraction pattern image into a central dense region and an outer diffraction ring region; the Canny edge detection operator is applied to the central dense region to extract the pixel set of its contour boundary. A curve fitting algorithm based on moving least squares is used to fit the pixel set to obtain a smooth contour curve function, and the contour curvature feature is obtained by calculating the second derivative of the contour curve function at each pixel.

[0010] Furthermore, the contour curve function includes:

[0011]

[0012] in, The ordinate of the fitted contour curve; The x-coordinate of the current fitted point. For the first The x-coordinate of each contour sampling point; For the first The ordinate of each contour sampling point; This represents the total number of contour sampling points; For the first The weight of each sampling point; is the standard deviation of the weighting function.

[0013] Furthermore, the symmetry of the distribution of the outer diffraction rings in the target's geometric features is obtained through the following method: A circle detection algorithm based on Hough transform is used to identify and locate the complete contours of each outer diffraction ring and the coordinates of its center. A polar coordinate system is established with the center of the ring as the origin. Multiple sets of symmetrically distributed feature points are selected at equal angular intervals on each diffraction ring contour along two sets of orthogonal preset symmetry directions. The distribution symmetry features are determined by calculating the absolute value of the difference between the horizontal and vertical coordinates of each set of symmetrical feature points in the rectangular coordinate system.

[0014] Furthermore, the spatial vector arrangement of higher-order diffraction points in the target's geometric features is obtained through the following method: A grayscale intensity threshold is set, and all higher-order diffraction points above the grayscale intensity threshold are identified and marked from the speckle distribution image. A spatial rectangular coordinate system is established with the center of the optical axis of the telescope system as the origin. The three-dimensional spatial coordinates of each higher-order diffraction point are determined by the pixel coordinates of each higher-order diffraction point and its relative position to the origin. Based on the three-dimensional spatial coordinates, the spatial vector connecting the origin and each higher-order diffraction point is calculated, and the direction angle and elevation angle of each vector are recorded to obtain the spatial vector arrangement characteristics.

[0015] Furthermore, the step of identifying and marking all higher-order diffraction points above the grayscale intensity threshold from the speckle distribution image specifically includes: Traverse each pixel in the pattern distribution image, compare the pixel gray value with the preset gray intensity threshold point by point, and filter out all candidate pixels whose gray value is greater than or equal to the threshold. Based on the principle of connected component analysis, candidate pixels that are spatially adjacent are aggregated into independent connected regions, and each connected region corresponds to a higher-order diffraction point. Calculate the geometric centroid coordinates of each connected region and use the geometric centroid coordinates as the center position of the corresponding higher-order diffraction point; Mark the center positions of all identified higher-order diffraction points in the pattern distribution image and record their coordinate data.

[0016] Furthermore, before traversing each pixel of the pattern distribution image, the following steps are also included: The image of the mottled pattern distribution is preprocessed, and a Gaussian filtering algorithm is used to remove image noise interference in order to enhance the image signal-to-noise ratio.

[0017] Secondly, the present invention provides an adaptive adjustment system for a spectrometer used in physical experiments, comprising: The reference module is used to lay a marker film layer with a preset pattern on the surface of the spectrometer stage. The preset pattern is composed of a non-repeating micro-geometric pattern. When the collimated beam emitted by the collimator irradiates the marker film layer, the preset pattern forms a corresponding diffraction pattern distribution in the telescope system, and the diffraction pattern distribution is used as a dynamic reference. The target geometric feature acquisition module is used to rotate the telescope arm to a preset initial angle and capture the diffraction pattern distribution image through the telescope's built-in imaging sensor; it extracts the target geometric feature parameters from the pattern distribution image, including the contour curvature of the central dense area, the distribution symmetry of the outer diffraction rings, and the spatial vector arrangement of higher-order diffraction points; The adjustment amount calculation module is used to input the target geometric feature parameters into the optical path deviation analysis model to calculate the adjustment amount. The deviation analysis model includes: decomposing the extracted contour curvature into curvature components in two orthogonal directions; comparing the actual curvature component in any orthogonal direction with the corresponding reference threshold, and determining the tilt direction of the optical axis along the orthogonal direction based on the comparison result; calculating the degree of deviation between the curvature component and the corresponding reference threshold based on the determined tilt direction; and obtaining the first adjustment amount for correcting the tilt of the optical axis in the corresponding orthogonal direction based on the preset correspondence between the tilt deviation and the optical axis correction adjustment amount. Based on the symmetry of the outer diffraction rings, several sets of symmetrical feature points are selected on the diffraction rings, the coordinate deviation values ​​of each set of symmetrical points are calculated, and the mean of the coordinate deviation values ​​is fitted to obtain the concentricity offset; a second adjustment amount is generated based on the concentricity offset and the corresponding offset in the opposite direction. A spatial rectangular coordinate system for higher-order diffraction points is established. The spatial vectors of each higher-order diffraction point are compared with the preset reference vector. The angle between each vector is calculated by the cross product of the vectors. The angle is fitted by the least squares method to obtain the spatial angle. Based on the deviation direction and degree corresponding to the spatial angle, and based on the correspondence between the spatial angle deviation and the rotation correction adjustment amount of the telescope arm or stage, a third adjustment amount is calculated to make the spatial vector of the higher-order diffraction point consistent with the preset reference vector. The execution module is used to adjust the corresponding mechanism of the spectrometer according to the first adjustment amount, the second adjustment amount, and the third adjustment amount to complete the adjustment of the spectrometer optical path.

[0018] Thirdly, the present invention provides an electronic device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to perform the steps corresponding to the method in the first aspect.

[0019] Fourthly, the present invention provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps corresponding to the method in the first aspect.

[0020] In summary, the technical solutions of the embodiments of the present invention have at least the following advantages and beneficial effects: This invention involves laying a marker film layer containing a pre-defined pattern of non-repetitive micro-geometric textures on the surface of the stage, and using the diffraction pattern distribution formed by collimated beam illumination from a collimator as a dynamic reference. The telescope arm is then rotated to a preset initial angle, and the pattern image is captured by a built-in imaging sensor. Target geometric feature parameters such as the contour curvature of the central dense region, the symmetry of the outer diffraction ring distribution, and the spatial vector arrangement of higher-order diffraction points are extracted. These parameters are then input into an optical path deviation analysis model. The model calculates a first adjustment amount to correct the optical axis tilt by comparing the orthogonal components of the contour curvature, a second adjustment amount to calculate the concentricity shift by fitting the mean coordinate deviation of the symmetrical points of the outer diffraction rings, and a third adjustment amount to correct the spatial angle deviation by fitting the spatial vector angle of the higher-order diffraction points. Finally, the corresponding mechanism of the spectrometer is adjusted according to these three adjustment amounts to complete the optical path adjustment. By using diffraction patterns generated by non-repetitive micro-geometric patterns as a dynamic reference benchmark and combining it with an optical path deviation model based on multi-dimensional geometric feature analysis, adaptive correction of spectrometer optical axis tilt, concentricity shift, and spatial angle deviation is achieved, overcoming the instability problem of traditional single reference under environmental interference and marker degradation. Attached Figure Description

[0021] Figure 1 A flowchart of an adaptive adjustment method for a spectrometer used in physical experiments provided by the present invention; Figure 2 A schematic diagram of the adaptive adjustment system of a spectrometer for physical experiments provided by the present invention; Figure 3 This is a schematic diagram of the structure of an electronic device provided by the present invention. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0023] An adaptive adjustment method for a spectrometer used in physical experiments, as proposed in this embodiment of the invention, includes: S101, a marker film layer with a preset pattern is laid on the surface of the spectrometer stage. The preset pattern is composed of a non-repetitive micro-geometric pattern. When the collimated beam emitted by the collimator irradiates the marker film layer, the preset pattern forms a corresponding diffraction pattern distribution in the telescope system, and the diffraction pattern distribution is used as a dynamic reference.

[0024] Specifically, a marker film with a pre-defined pattern is deposited on the surface of the spectrometer stage. This pre-defined pattern consists of non-repeating microscopic geometric patterns. Since the spectrometer stage is the core component carrying the optical path reference and the subsequently measured element, differences in its surface flatness and material reflectivity can lead to unstable beam illumination. Therefore, depositing the marker film provides a uniform and standardized beam interaction surface, eliminating the interference of stage variations on the light interaction effect. The pre-defined pattern is a pre-designed set of specific geometric structures, characterized by "non-repeating microscopic geometric patterns," meaning the pattern size is on the microscopic scale, and the geometric structure in any region is unique.

[0025] When the collimated beam emitted by the collimator illuminates the marking film, the preset pattern forms a corresponding diffraction pattern distribution in the telescope system, which serves as a dynamic reference. The principle lies in the fact that the core function of the collimator is to generate and emit a collimated beam. The propagation characteristics of the collimated beam ensure that the beam's shape and energy distribution do not change with the propagation distance when it illuminates the marking film, guaranteeing the stability of the light-pattern interaction conditions. When the collimated beam contacts the preset pattern of the marking film, based on the principle of light diffraction, the light diffracts due to the obstruction and guidance of the microscopic geometric pattern, forming diffraction patterns with specific brightness and darkness. After propagating through the spectrometer's optical path, these patterns are captured by the imaging components built into the telescope system, forming a diffraction pattern distribution that corresponds one-to-one with the preset pattern. The diffraction pattern distribution is used as a dynamic reference standard because traditional spectrometers often rely on static markers (such as fixed lines and crosshairs) for adjustment. These static markers are easily affected by external interference (such as slight vibrations of the stage or component deformation caused by changes in ambient temperature) and deviate from their initial positions, causing the reference standard to become disconnected from the actual optical path state. In contrast, the dynamic reference standard is composed of diffraction patterns formed by real-time illumination, which can reflect the beam propagation state and the positional relationship of the marker film in the current optical path in real time. It can dynamically follow changes in the optical path and ensure that the reference standard is always consistent with the actual optical path state.

[0026] S102, rotate the telescope arm to the preset initial angle, and capture the diffraction pattern distribution image through the built-in imaging sensor of the telescope; extract the target geometric feature parameters in the pattern distribution image, including the contour curvature of the central dense area, the distribution symmetry of the outer diffraction rings, and the spatial vector arrangement of higher-order diffraction points.

[0027] Specifically, rotating the telescope arm to a preset initial angle ensures the telescope system is positioned at a pre-defined reference observation location, guaranteeing uniform initial observation conditions for capturing diffraction patterns. Subsequently, the telescope's built-in imaging sensor acquires an image of the diffraction pattern distribution. This process records the pattern morphology formed under the current optical path in real time, providing raw image data for feature extraction. Based on this, three types of target geometric feature parameters are extracted from the pattern distribution image: the contour curvature of the central dense region, the symmetry of the distribution of the outer diffraction rings, and the spatial vector arrangement of higher-order diffraction points. These feature parameters reflect the actual state of the optical path from different dimensions. The specific extraction method is as follows: The principle behind the extraction of the contour curvature of the central dense region is that the central dense region is the core area where the energy of the diffraction pattern is concentrated, and its contour shape is directly related to the perpendicularity of the incident beam. First, Otsu's Algorithm, based on grayscale thresholding, is used to segment the diffraction pattern image into a central dense region and an outer diffraction ring region. This segmentation effectively distinguishes two regions with significantly different energy distributions, reducing interference from irrelevant regions. Next, the Canny Edge Detection Operator is applied to extract the contour boundary pixel set of the central dense region. Accurate boundary point identification provides reliable data for subsequent contour fitting. Then, the moving least squares method is used to fit the pixel set, obtaining a smooth contour curve function. This eliminates errors caused by pixel dispersion, making the contour shape closer to the real state. Finally, the second derivative of the contour curve function at each pixel is calculated to obtain the contour curvature feature. The curvature feature quantifies the degree of curvature in the central region, thus providing a basis for determining the optical axis tilt direction. Its beneficial effect is that multi-step processing improves the accuracy of curvature extraction, ensuring a more precise depiction of the central region's shape. The specific calculation formula is as follows: Contour curve functions include: (1) Using Gaussian weights, we can obtain: (2) in, The ordinate of the fitted contour curve; The x-coordinate of the current fitted point. For the first The x-coordinate of each contour sampling point; For the first The ordinate of each contour sampling point; This represents the total number of contour sampling points; For the first The weight of each sampling point; is the standard deviation of the weighting function.

[0028] The contour curvature feature is obtained by taking the second derivative of the contour curve function at each pixel point: (3) (4) (5) In the formula, For the outline in Curvature at that point; The first derivative of the fitted curve reflects the slope of the curve; The second derivative of the fitted curve reflects the concavity or convexity of the curve.

[0029] The principle behind the symmetry of the outer diffraction rings is that their symmetrical distribution is closely related to the concentricity of the optical path, and the symmetry deviation directly reflects the offset of the optical path center. First, a circle detection algorithm based on the Hough Transform is used to identify and locate the complete contours of each outer diffraction ring and its center coordinates. This algorithm can accurately detect circular contours even in the presence of noise, ensuring the reliability of diffraction ring positioning. Then, a polar coordinate system is established with the center as the origin. Along two sets of orthogonal preset symmetry directions (i.e., the x-axis and y-axis), at least eight sets of symmetrically distributed feature points are selected at equal angular intervals on each diffraction ring contour. The selection of symmetrical points allows for a quantitative assessment of the symmetry of the diffraction rings. Finally, by calculating the absolute value of the difference between the horizontal and vertical coordinates of each set of symmetrical feature points in the Cartesian coordinate system, the symmetry characteristic is determined. This characteristic directly reflects whether the diffraction rings are symmetrically distributed around the center. Its beneficial effect is that symmetrical point analysis enables a quantitative assessment of the optical path concentricity, providing a clear indicator for subsequent concentricity adjustment. The specific calculation formula is as follows: The equation of the diffraction ring circle in pixel coordinates (polar coordinate form) is: (6) (7) in, The coordinates of any point on the diffraction ring or the pixel coordinates of the diffraction point in the image; The coordinates of the center of the diffraction ring; The radius of the diffraction ring; It is the polar angle, ranging from [0, 360°], corresponding to the orientation of a point on the circle.

[0030] The absolute value of the coordinate deviation between any two sets of symmetrical points is: (8) (9) Mean deviation of symmetrical points (reflecting distribution symmetry): (10) in, , The first , The coordinate deviation of a group of symmetrical points in the x and y directions; , These are the coordinates of two sets of symmetrical points; The total number of symmetrical points. The value represents the average deviation of symmetrical points (in pixels). The smaller the value, the better the symmetry.

[0031] The principle behind the spatial vector arrangement of higher-order diffraction points is that these points are formed by the higher-order diffraction interaction between the light beam and the microscopic texture, and their spatial distribution reflects the three-dimensional orientation of the light path. First, a grayscale intensity threshold is set, and all higher-order diffraction points above this threshold are identified and marked from the pattern distribution image. This preprocessing involves using a Gaussian filter to remove image noise and enhance the signal-to-noise ratio, reducing noise interference and improving accuracy. Next, each pixel in the pattern distribution image is traversed, and its grayscale value is compared point-by-point with the preset grayscale intensity threshold. Candidate pixels with grayscale values ​​greater than or equal to the threshold are selected. This grayscale threshold selection allows for the initial differentiation of higher-order diffraction points. Diffraction points and background regions: Based on the principle of connected component analysis, spatially adjacent candidate pixels are aggregated into independent connected regions. Each connected region corresponds to a higher-order diffraction point. This aggregation process can integrate discrete pixels into diffraction points with actual physical meaning. The geometric centroid coordinates of each connected region are calculated and used as the center position of the corresponding higher-order diffraction point. The core position of the diffraction point can be accurately located through centroid calculation. The center positions of all identified higher-order diffraction points are marked in the pattern distribution image and their coordinate data are recorded to provide basic data for subsequent spatial vector calculation. Next, a spatial rectangular coordinate system is established with the center of the telescope system's optical axis as the origin. The three-dimensional spatial coordinates of each higher-order diffraction point are determined by their pixel coordinates and relative positions to the origin. Finally, based on these three-dimensional spatial coordinates, a spatial vector connecting the origin and each higher-order diffraction point is calculated, and the orientation and elevation angles of each vector are recorded to obtain the spatial vector arrangement characteristics. This characteristic comprehensively reflects the spatial distribution and attitude of the higher-order diffraction points. Its beneficial effect lies in achieving accurate characterization of the spatial distribution of higher-order diffraction points through multi-step processing, providing a reliable basis for subsequent optical path spatial attitude adjustment. The specific calculation formula is as follows: (11) (12) (13) in, The three-dimensional spatial coordinates of the higher-order diffraction points; Pixel scale factor, which defines the correspondence between pixels and their actual physical size; Telescope objective lens focal length.

[0032] Therefore, the spatial vector of the higher-order diffraction point can be known. for: (14) Direction angle (rotation angle around the Z-axis) for: (15) Pitch angle (angle with the Z-axis) for: (16) Wherein, vector magnitude for: (17) S103, Input the target geometric feature parameters into the optical path deviation analysis model to calculate the adjustment amount; specifically, the working process of the optical path deviation analysis model includes the calculation of adjustment amount in three dimensions: Regarding the calculation of the first adjustment amount, the extracted central dense region contour curvature must first be decomposed into curvature components in two orthogonal directions (e.g., horizontal and vertical directions, x-axis and y-axis directions). The principle behind this decomposition is that the tilt of the optical axis causes a more significant curvature in the tilt direction of the central dense region's contour. Orthogonal decomposition transforms the complex overall curvature into features in two independent directions, corresponding to the tilt state of the optical axis in each direction. For example, if the horizontal curvature component is significantly greater than the vertical component, it indicates that the optical axis is more likely to tilt horizontally. Subsequently, the actual curvature component in any orthogonal direction is compared with the corresponding reference threshold (i.e., the standard curvature value when the optical axis is in a vertical state). The tilt direction of the optical axis along that orthogonal direction can be determined by the relationship between the actual value and the threshold—if the actual curvature component is greater than the reference threshold, it indicates a positive tilt along that direction; otherwise, it indicates a negative tilt. The principle behind this determination is that the reference threshold reflects the characteristics under ideal optical path conditions, and the deviation direction directly corresponds to the tilt trend of the optical axis. Based on this, the degree of deviation between the curvature component and the corresponding reference threshold (i.e., the difference between the two) is calculated. According to the preset correspondence between the tilt deviation and the optical axis correction adjustment amount (this relationship is established in advance through experiments or simulations, for example, each 0.2 unit increase in deviation corresponds to a 1 degree rotation of the adjustment screw), the first adjustment amount used to correct the optical axis tilt in the corresponding orthogonal direction can be obtained. Its beneficial effect is that the adjustment amount is strictly matched with the degree of deviation, ensuring the accurate correction of the optical axis tilt.

[0033] Therefore, the calculation formula can be obtained as follows: (18) in, This is the first adjustment amount, used to correct the optical axis tilt; The curvature deviation - adjustment proportional coefficient is calibrated by the spectrometer's mechanical structure; The principal curvature is the actual measured value. The preset reference curvature threshold is calibrated by the standard optical path.

[0034] For the calculation of the second adjustment amount, based on the symmetry of the outer diffraction ring distribution, several sets of symmetrical feature points on the diffraction ring are first selected (e.g., 4 sets of symmetrical points each in the horizontal and vertical directions, for a total of 8 sets). The principle for selecting symmetrical points is that the symmetrical distribution of the diffraction ring directly reflects the concentricity of the optical path, and the coordinate deviation of the symmetrical points can quantify the concentricity shift. For example, a large absolute value of the x-coordinate difference of the symmetrical points in the horizontal direction indicates that there is a shift in the center of the optical path along the x-direction. Next, the coordinate deviation values ​​of each set of symmetrical points (i.e., the coordinate difference of the symmetrical points on the same coordinate axis) are calculated, and these coordinate deviation values ​​are averaged to reduce the influence of single-point errors and obtain a more reliable concentricity shift (e.g., the average x-coordinate deviation of multiple sets of symmetrical points is 0.3 pixels, corresponding to an actual concentricity shift of 0.1 millimeters). The principle of mean fitting is to reduce noise interference through statistical averaging, ensuring the accuracy of the shift calculation, and the beneficial effect is to improve the stability of the concentricity assessment. Finally, a second adjustment amount is generated based on the obtained concentricity offset and the corresponding offset in the opposite direction. For example, if the concentricity is offset by 0.1 mm in the positive x direction, the stage is adjusted to move by 0.1 mm in the negative x direction. The principle is to offset the offset by adjusting in the opposite direction. The beneficial effect is that the concentricity of the optical path can be quickly corrected to ensure that the centers of each optical element are aligned.

[0035] In the specific calculation, the offset between the center of the diffraction ring and the center of the reference ring is calculated using the Euclidean distance: (19) in, This is the concentricity offset. These are the coordinates of the center of the diffraction rings actually detected; The coordinates of the preset reference center are used.

[0036] The second adjustment amount is: (20) in, This is the second adjustment amount, used to correct the center offset. The offset-adjustment ratio coefficient is calibrated by the spectrometer optical system.

[0037] For the calculation of the third adjustment factor, a spatial rectangular coordinate system is first established with the center of the telescope system's optical axis as the origin (x-axis for the horizontal direction, y-axis for the vertical direction, and z-axis for the optical axis propagation direction). This provides a unified spatial positioning reference for higher-order diffraction points, ensuring consistency in subsequent vector calculations. Then, the spatial vectors of each higher-order diffraction point are compared with the preset reference vector (i.e., the spatial vector distribution of higher-order diffraction points when the optical path attitude is correct). The angle between each vector is calculated through the vector dot product—the magnitude of the vector cross product is related to the sine of the angle between two vectors, quantifying the difference in vector direction. For example, an angle of 3 degrees between two vectors indicates a significant attitude deviation. The principle behind this calculation is that the difference in vector direction directly reflects the deviation of the three-dimensional attitude of the optical path, and its beneficial effect is the accurate description of the degree of spatial attitude deviation. Next, the least squares method is used to fit these angles to reduce the influence of individual diffraction point errors, obtaining the average spatial angle of the overall attitude deviation (e.g., an average angle of 2.5 degrees after fitting). The principle is to obtain the optimal fitting result by minimizing the sum of squared errors, which improves the reliability of attitude deviation assessment. Finally, based on the deviation direction and degree corresponding to the spatial angle, and based on the preset correspondence between the spatial angle deviation and the rotation correction adjustment amount of the telescope arm or stage (e.g., for every 1 degree deviation of the angle, the telescope arm rotates 0.8 degrees), the third adjustment amount is calculated. For example, if the spatial angle deviates by 3 degrees in the horizontal direction, the telescope arm will rotate 2.4 degrees in the opposite direction. The principle is to change the observation angle by rotating the adjustment, so that the spatial vector of the higher-order diffraction point is consistent with the reference vector, thus achieving precise correction of the three-dimensional attitude of the optical path.

[0038] In specific calculations, the spatial vector angle is calculated using the dot product of the angle between the actual diffraction point vector and the reference vector: (twenty one) (twenty two) (twenty three) in, The angle between spatial vectors; is the spatial vector of the actual higher-order diffraction point; , , These are the coordinates of the actual higher-order diffraction points on the X, Y, and Z axes in a spatial rectangular coordinate system, respectively. As a preset reference vector; , , These are the coordinates of the preset reference vector along the X, Y, and Z axes in a Cartesian coordinate system.

[0039] Third adjustment amount for: (twenty four) in, The included angle deviation-adjustment ratio coefficient is calibrated by the mechanical structure of the spectrometer stage / telescope arm.

[0040] S104, adjust the corresponding mechanism of the spectrometer according to the first adjustment amount, the second adjustment amount and the third adjustment amount to complete the adjustment of the spectrometer optical path.

[0041] Specifically, adjusting the corresponding mechanism according to the first adjustment amount refers to using the first adjustment amount (used to correct the tilt of the optical axis in the orthogonal direction) to drive the pitch and horizontal adjustment screws of the telescope system or collimator—wherein, the pitch adjustment screw corresponds to vertical tilt correction, and the horizontal adjustment screw corresponds to horizontal tilt correction. The principle is that optical axis tilt causes the curvature of the central dense region's contour to deviate from a reference threshold. By adjusting the screws to change the spatial angle of the optical element, the perpendicularity of the incident beam can be restored, thereby bringing the curvature of the central dense region's contour back to the standard value. For example, if the first adjustment amount indicates that the horizontal direction needs correction of 1.5 degrees, rotating the horizontal adjustment screw by 1.5 degrees can eliminate the asymmetry of the central region's contour caused by the horizontal tilt of the optical axis. Its beneficial effect is ensuring the perpendicularity of the beam propagation direction, providing a stable axial reference for subsequent optical path operations.

[0042] The adjustment mechanism based on the second adjustment amount refers to the translation adjustment mechanism of the stage (such as the horizontal and vertical translation knobs) operated based on the second adjustment amount (used to correct the concentricity offset of the optical path). The principle is that concentricity offset causes deviations in the coordinates of the symmetrical points of the outer diffraction rings. This offset can be offset by reverse translation of the stage, ensuring that the diffraction rings are symmetrically distributed around the center. For example, when the second adjustment amount indicates a concentricity offset of 0.2 mm in the vertical direction, adjusting the stage to reverse the vertical direction by 0.2 mm will bring the coordinate difference of the symmetrical points of the outer diffraction rings close to zero. The beneficial effect is ensuring that the collimator, telescope, and stage are collinear, avoiding distortion of the diffraction pattern due to center misalignment.

[0043] The mechanism adjusted according to the third adjustment amount refers to the rotation adjustment mechanism of the telescope arm or the stage that is driven by the third adjustment amount (used to correct the three-dimensional attitude deviation of the optical path). The principle is that the angle between the spatial vector of a higher-order diffraction point and the reference vector reflects the three-dimensional attitude deviation of the optical path. By adjusting the rotation to change the observation angle or the bearing angle, the spatial vector arrangement of the higher-order diffraction points can be brought back to the reference state. For example, if the third adjustment amount requires the telescope arm to rotate 2 degrees clockwise, after operating the rotation mechanism to complete this adjustment, the direction angle and elevation angle of the higher-order diffraction points will be consistent with the reference vector. Its beneficial effect is to correct the attitude deviation of the optical path in three-dimensional space, ensuring that the relative positional relationship of each optical element meets the experimental requirements.

[0044] Through the synergistic effect of the above three dimensions of adjustment, the optical path state of the spectrometer can be precisely calibrated, so that the collimated beam emitted by the collimator, the marker film layer carried by the stage, and the observation optical path of the telescope system form a stable matching relationship. The dynamic reference standard (diffraction pattern distribution) can accurately reflect the actual state of the optical path, thus providing a high-precision optical path basis for physical experiments (such as grating constant measurement, prism apex angle determination, etc.). This effectively solves the instability problem of traditional single reference under environmental interference and marker degradation, and realizes the adaptive and quantitative adjustment of the spectrometer optical path.

[0045] Based on the same inventive concept, this invention provides an adaptive adjustment system for a spectrometer used in physical experiments, comprising: Reference module 201 is used to lay a marker film layer with a preset pattern on the surface of the spectrometer stage. The preset pattern is composed of a non-repetitive micro-geometric pattern. When the collimated beam emitted by the collimator irradiates the marker film layer, the preset pattern forms a corresponding diffraction pattern distribution in the telescope system, and the diffraction pattern distribution is used as a dynamic reference. The target geometric feature acquisition module 202 is used to rotate the telescope arm to a preset initial angle and capture the diffraction pattern distribution image through the imaging sensor built into the telescope; extract the target geometric feature parameters in the pattern distribution image, including the contour curvature of the central dense area, the distribution symmetry of the outer diffraction rings, and the spatial vector arrangement of higher-order diffraction points; The adjustment amount calculation module 203 is used to input the target geometric feature parameters into the optical path deviation analysis model to calculate the adjustment amount; the deviation analysis model includes: decomposing the extracted contour curvature into curvature components in two orthogonal directions; comparing the actual curvature component in any orthogonal direction with the corresponding reference threshold, and determining the tilt direction of the optical axis along the orthogonal direction based on the comparison result; calculating the degree of deviation between the curvature component and the corresponding reference threshold based on the determined tilt direction; and obtaining a first adjustment amount for correcting the tilt of the optical axis in the corresponding orthogonal direction based on the preset correspondence between tilt deviation and optical axis correction adjustment amount. Based on the symmetry of the outer diffraction rings, several sets of symmetrical feature points are selected on the diffraction rings, and the coordinate deviation values ​​of each set of symmetrical points are calculated. The mean of the coordinate deviation values ​​is fitted to obtain the concentricity offset. A second adjustment amount is generated in the opposite direction of the concentricity offset and the corresponding offset. A spatial rectangular coordinate system for higher-order diffraction points is established. The spatial vectors of each higher-order diffraction point are compared with a preset reference vector. The angle between each vector is calculated by the cross product of the vectors. The angle is fitted using the least squares method to obtain the spatial angle. Based on the deviation direction and degree corresponding to the spatial angle, and based on the correspondence between the spatial angle deviation and the rotation correction adjustment amount of the telescope arm or stage, a third adjustment amount is calculated to make the spatial vector of the higher-order diffraction point consistent with the preset reference vector. The execution module 204 is used to adjust the corresponding mechanism of the spectrometer according to the first adjustment amount, the second adjustment amount and the third adjustment amount to complete the adjustment of the spectrometer optical path.

[0046] Based on the same inventive concept, the present invention provides an electronic device, including: a memory 302, a processor 301, and a computer program stored in the memory 302 and executable on the processor 301. When the processor 301 executes the computer program, it implements an adaptive adjustment method for a spectrometer used in physical experiments.

[0047] Based on the same inventive concept, the present invention provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements an adaptive adjustment method for a spectrometer used in physical experiments.

[0048] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A method for adaptive adjustment of a spectrometer for physical experiments, characterized in that, The method comprises the following steps: S101, a mark film layer with a preset pattern is laid on the surface of a spectrometer objective table, the preset pattern is composed of non-repetitive micro-geometric patterns, and when a collimated light beam emitted by a collimator tube irradiates the mark film layer, the preset pattern forms a corresponding diffraction spot pattern in a telescope system, and the diffraction spot pattern is taken as a dynamic reference datum; S102, the telescope arm is rotated to a preset initial angle, an imaging sensor built in the telescope captures a diffraction spot pattern image, target geometric feature parameters in the diffraction spot pattern image are extracted, including the profile curvature of a central dense area, the distribution symmetry of a peripheral diffraction ring, and the spatial vector arrangement of high-order diffraction points; S103, the target geometric feature parameters are input into a light path deviation analysis model to calculate an adjustment amount; The deviation analysis model comprises: the profile curvature is decomposed into two orthogonal direction curvature components; the actual curvature component in any orthogonal direction is compared with a corresponding reference threshold value, and the inclination direction of the optical axis along the orthogonal direction is determined according to the comparison result; according to the determined inclination direction, the deviation degree of the curvature component from the corresponding reference threshold value is calculated, and a first adjustment amount for correcting the inclination of the optical axis in the corresponding orthogonal direction is obtained according to a preset corresponding relationship between the inclination deviation and the optical axis correction adjustment amount; Based on the distribution symmetry of the peripheral diffraction ring, a plurality of groups of symmetric feature points on the diffraction ring are selected, the coordinate deviation values of the groups of symmetric points are calculated, the coordinate deviation values are subjected to mean value fitting, and a concentricity offset amount is obtained; a second adjustment amount is generated according to the concentricity offset amount and a corresponding offset direction; A spatial rectangular coordinate system of the high-order diffraction points is established, the spatial vectors of the high-order diffraction points are compared with a preset reference vector, the included angles between the vectors are calculated through vector cross product, the included angles are fitted by using the least square method, and the spatial included angles are obtained; according to the deviation direction and the deviation degree corresponding to the spatial included angles, a third adjustment amount for making the spatial vectors of the high-order diffraction points consistent with the preset reference vector is calculated based on the corresponding relationship between the spatial included angle deviation and the rotation correction adjustment amount of the telescope arm or the objective table; S104, the corresponding mechanisms of the spectrometer are adjusted according to the first adjustment amount, the second adjustment amount and the third adjustment amount to complete the adjustment of the light path of the spectrometer.

2. The self-adaptive adjusting method of a spectrometer for physical experiments according to claim 1, characterized in that, The profile curvature of the central dense area in the target geometric feature is obtained by the following method: The Otsu algorithm based on gray threshold segmentation is used to segment the diffraction spot pattern image into a central dense area and a peripheral diffraction ring area; the Canny edge detection operator is applied to the central dense area to extract the pixel point set of the profile boundary thereof; The moving least square method based curve fitting algorithm is used to fit the pixel point set to obtain a smooth profile curve function, and the profile curvature feature is obtained by calculating the second derivative of the profile curve function at each pixel point.

3. The self-adapting adjusting method of a spectrometer for physical experiments according to claim 2, characterized in that, The profile curve function comprises: wherein, is the fitted profile curve ordinate; is the current fitted point abscissa, is the abscissa of the th profile sample point; is the ordinate of the th profile sample point; is the total number of profile sample points; is the weight of the th sample point; is the weight function standard deviation.

4. The self-adjusting method of a spectrometer for physical experiments according to claim 1, wherein, The distribution symmetry of the peripheral diffraction ring in the target geometric feature is obtained by the following method: A circle detection algorithm based on Hough transform is used to identify and locate the complete profile and the center coordinates of each peripheral diffraction ring; an polar coordinate system is established with the center as the origin, and along two orthogonal preset symmetry directions, a plurality of groups of symmetrically distributed feature points are selected on each diffraction ring profile at equal angle intervals; by calculating the absolute value of the horizontal and vertical coordinate difference of each group of symmetric feature points in the rectangular coordinate system, the symmetry distribution characteristics are determined.

5. The self-adjusting method of a spectrometer for physical experiments according to claim 1, wherein, The spatial vector arrangement of the high-order diffraction points in the target geometric feature is obtained by the following method: A gray intensity threshold is set, and all high-order diffraction points higher than the gray intensity threshold are identified and marked from the speckle distribution image; a space rectangular coordinate system is established with the center of the telescope system optical axis as the origin, and the three-dimensional space coordinates of each point are determined through the pixel coordinates of each high-order diffraction point and the relative position relationship thereof with the origin; based on the three-dimensional space coordinates, the spatial vectors connecting the origin and each high-order diffraction point are calculated, and the direction angle and the pitch angle of each vector are recorded to obtain the spatial vector arrangement characteristics.

6. The self-adjusting method of a spectrometer for physical experiments according to claim 5, wherein, The step of identifying and marking all high-order diffraction points higher than the gray intensity threshold from the speckle distribution image specifically includes: Iterate through each pixel point of the speckle distribution image, compare the pixel gray value with the preset gray intensity threshold point by point, and screen out all candidate pixel points with gray value greater than or equal to the threshold; Based on the principle of connected domain analysis, the candidate pixel points adjacent in space position are aggregated into independent connected regions, and each connected region corresponds to a high-order diffraction point; The geometric barycenter coordinates of each connected region are calculated, and the geometric barycenter coordinates are taken as the center position of the corresponding high-order diffraction point; The center positions of all identified high-order diffraction points are marked in the speckle distribution image, and the coordinate data thereof are recorded.

7. The self-adjusting method of a spectrometer for physical experiments according to claim 6, wherein, Before the step of iterating through each pixel point of the speckle distribution image, it further includes: The speckle distribution image is preprocessed, and a Gaussian filtering algorithm is used to remove image noise interference to enhance the signal-to-noise ratio of the image.

8. An adaptive adjustment system for a spectrometer used in physical experiments, characterized in that, It includes: A reference module is used to lay a mark film layer with a preset pattern on the surface of a spectrometer stage, the preset pattern is composed of a non-repetitive micro-geometric pattern, and when a collimated light beam emitted by a collimator tube irradiates the mark film layer, the preset pattern forms a corresponding diffraction speckle distribution in a telescope system, and the diffraction speckle distribution is used as a dynamic reference standard; A target geometric feature acquisition module is used to rotate a telescope arm to a preset initial angle, capture a diffraction speckle distribution image through an imaging sensor built in the telescope, extract target geometric feature parameters in the speckle distribution image, including the profile curvature of a central dense area, the distribution symmetry of a peripheral diffraction ring, and the spatial vector arrangement of high-order diffraction points; An adjustment amount calculation module is used to input the target geometric feature parameters into an optical path deviation analysis model to calculate an adjustment amount; and An optical path deviation correction module is used to adjust the optical path deviation of the collimator tube based on the adjustment amount. The deviation analysis model comprises: decomposing the extracted profile curvature into two orthogonal direction curvature components; comparing the actual curvature component of any orthogonal direction with the corresponding reference threshold value, and determining the tilt direction of the optical axis along the orthogonal direction according to the comparison result; calculating the deviation degree of the curvature component and the corresponding reference threshold value according to the determined tilt direction, and obtaining a first adjustment amount for correcting the optical axis tilt of the corresponding orthogonal direction according to a preset corresponding relationship between the tilt deviation and the optical axis correction adjustment amount; Based on the distribution symmetry of the peripheral diffraction ring, a plurality of groups of symmetric feature points on the diffraction ring are selected, coordinate deviation values of each group of symmetric points are calculated, the coordinate deviation values are subjected to mean value fitting, and a concentricity offset is obtained; a second adjustment amount is generated according to the concentricity offset and the corresponding offset reverse direction; A spatial rectangular coordinate system of the high-order diffraction point is established, spatial vectors of each high-order diffraction point are compared with a preset reference vector, the included angle between each vector is calculated through vector cross product, the included angle is fitted by using the least square method, and the spatial included angle is obtained; a third adjustment amount for making the spatial vectors of the high-order diffraction points consistent with the preset reference vector is calculated according to the corresponding deviation direction and the deviation degree of the spatial included angle, and based on the corresponding relationship between the spatial included angle deviation and the telescope arm or the rotation correction adjustment amount of the object table. The execution module is configured to adjust the corresponding mechanism of the spectrometer according to the first adjustment amount, the second adjustment amount and the third adjustment amount to complete the adjustment of the optical path of the spectrometer.

9. An electronic device, comprising: The electronic device comprises a memory, a processor and a computer program stored on the memory and executable on the processor, and the processor implements the adaptive adjustment method of the spectrometer for physical experiments according to any one of claims 1-7 when executing the computer program.

10. A computer-readable storage medium having stored thereon a computer program, characterized in that, The program is executed by the processor to implement the adaptive adjustment method of the spectrometer for physical experiments according to any one of claims 1-7.

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