Display device, inspection method thereof, and electronic device including the display device

Abstract

The invention relates to a display device, an inspection method thereof, and an electronic device including the display device. The display device includes: a display panel including a plurality of pixels; a sensing circuit for generating sensing values of the plurality of pixels by sensing characteristics of the plurality of pixels; and a panel defect normalizer for compensating the sensing value, the panel defect normalizer comprising: a preliminary defect pixel detector for detecting preliminary defect pixels; a defective pixel detector for detecting defective pixels; a defect line detector for detecting a defect line; a defect line compensator for compensating a sensing value of the defect line; and a defective pixel compensator for compensating the sensing value of the defective pixel.

Description

Technical Field

[0001] Embodiments of this disclosure relate to a display device capable of sensing the characteristics of pixels, a method for inspecting the display device, and an electronic device including the display device. Background Technology

[0002] During the manufacturing process of a display device, the characteristics of pixels can be sensed, and defects in the display device can be detected based on the sensed values ​​of the pixels. Defects in the display device can include line defects corresponding to defects in a pixel column or pixel row comprising pixels arranged in one direction, and dot defects corresponding to defects in a single pixel.

[0003] The information disclosed in this background section is intended to enhance the understanding of the background of this disclosure, and therefore may contain information that does not constitute prior art. Summary of the Invention

[0004] Detecting only line defects during the manufacturing process of a display device can reduce manufacturing time, but it may introduce dot defects. Therefore, this could reduce the overall yield. Conversely, detecting dot defects in all pixels during manufacturing can increase yield, but it may also increase manufacturing time.

[0005] Embodiments of this disclosure may relate to display devices with increased yield and reduced manufacturing time, inspection methods for display devices, and electronic devices including display devices.

[0006] According to one or more embodiments of the present disclosure, a display device includes: a display panel including a plurality of pixels; a sensing circuit configured to generate sensed values ​​of the plurality of pixels by sensing characteristics of the plurality of pixels; and a panel defect normalizer configured to compensate for the sensed values, the panel defect normalizer including: a preliminary defect pixel detector configured to detect a preliminary defect pixel by comparing a sensed value of a target pixel with a sensed value of an adjacent pixel adjacent to the target pixel in a first direction; a defect pixel detector configured to detect a defect pixel by comparing a sensed value of a preliminary defect pixel with a sensed value of a peripheral pixel surrounding the preliminary defect pixel; a defect line detector configured to detect a defect line by counting the number of preliminary defect pixels included in a line extending in a second direction intersecting the first direction; a defect line compensator configured to compensate for the sensed values ​​of the defect lines; and a defect pixel compensator configured to compensate for the sensed values ​​of the defect pixels.

[0007] In an embodiment, the preliminary defect pixel detector can be configured to identify a target pixel as a preliminary defect pixel when the difference between the sensed value of the target pixel and the sensed values ​​of its neighboring pixels is greater than a threshold.

[0008] In an embodiment, the defective pixel detector may include a first defective pixel detector configured to identify a preliminary defective pixel as a defective pixel if: the difference between the maximum value and the minimum value among all sensed values ​​is greater than a first threshold, wherein all sensed values ​​include a center sensed value and peripheral sensed values, the center sensed value may be the sensed value of a sub-pixel of the preliminary defective pixel, and the peripheral sensed values ​​may be the sensed values ​​of a sub-pixel of a peripheral pixel; the difference between the median value and the minimum value among all sensed values ​​is less than a second threshold; the difference between the median value among peripheral sensed values ​​and the median value among center sensed values ​​is greater than a third threshold; the maximum value among all sensed values ​​is less than a fourth threshold; and the minimum value among all sensed values ​​is greater than a fifth threshold.

[0009] In an embodiment, the defective pixel detector may include a second defective pixel detector, which is configured to identify a preliminary defective pixel as a defective pixel when the value obtained by subtracting the median value from the minimum value in the peripheral sensing values ​​is greater than a threshold. The central sensing value may be the sensing value of a sub-pixel of the preliminary defective pixel, and the peripheral sensing value may be the sensing value of a sub-pixel of the peripheral pixel.

[0010] In an embodiment, the defective pixel detector may include a third defective pixel detector, which is configured to identify a preliminary defective pixel as a defective pixel when the value obtained by subtracting the maximum value in the center sensing value from the intermediate value in the peripheral sensing value is greater than a threshold. The peripheral sensing value may be the sensing value of a sub-pixel of the peripheral pixel, and the center sensing value may be the sensing value of a sub-pixel of the preliminary defective pixel.

[0011] In an embodiment, the defect line detector can be configured to identify a line as a defect line when the number of initial defect pixels included in the line is greater than a threshold.

[0012] In an embodiment, the defect line compensator can be configured to replace the sensed value of the defect line with the average of the sensed values ​​of adjacent lines adjacent to the defect line in a first direction.

[0013] In one embodiment, the defective pixel compensator can be configured to replace the sensed value of the defective pixel with the average of the sensed values ​​of the peripheral pixels surrounding the defective pixel.

[0014] In an embodiment, the panel defect regularizer may further include a defect storage unit configured to store the location of initial defect pixels, the location of defect lines, and the location of defect pixels.

[0015] In an embodiment, the panel defect normalizer may further include a defect distinguisher configured to distinguish in-line defect pixels included in the defect line from out-of-line defect pixels not included in the defect line based on the location of the defect line and the location of the defect pixels.

[0016] In an embodiment, the defective pixel compensator can be configured not to compensate for the sensed values ​​of defective pixels within the line.

[0017] In an embodiment, the characteristics of the multiple pixels may be one of the threshold voltage of the driving transistor included in the multiple pixels, the electron mobility of the driving transistor, and the degradation of the light-emitting element included in the multiple pixels.

[0018] According to one or more embodiments of the present disclosure, an inspection method for a display device includes: detecting a preliminary defective pixel by comparing a sensed value of a target pixel with a sensed value of a neighboring pixel adjacent to the target pixel in a first direction; detecting a defective pixel by comparing a sensed value of the preliminary defective pixel with a sensed value of a peripheral pixel surrounding the preliminary defective pixel; detecting a defective line by counting the number of preliminary defective pixels included in a line extending in a second direction intersecting the first direction; compensating for the sensed value of the defective line; and compensating for the sensed value of the defective pixel.

[0019] In an embodiment, the detection of preliminary defective pixels may include: when the difference between the sensed value of the target pixel and the sensed values ​​of its neighboring pixels is greater than a threshold, the target pixel is identified as a preliminary defective pixel.

[0020] In an embodiment, the detection of defective pixels may include identifying a preliminary defective pixel as a defective pixel if: the difference between the maximum value and the minimum value among all sensed values ​​is greater than a first threshold, wherein all sensed values ​​include a center sensed value and peripheral sensed values, the center sensed value may be the sensed value of a sub-pixel of the preliminary defective pixel, and the peripheral sensed values ​​may be the sensed values ​​of a sub-pixel of a peripheral pixel; the difference between the median value and the minimum value among all sensed values ​​is less than a second threshold; the difference between the median value among peripheral sensed values ​​and the median value among center sensed values ​​is greater than a third threshold; the maximum value among all sensed values ​​is less than a fourth threshold; and the minimum value among all sensed values ​​is greater than a fifth threshold.

[0021] In an embodiment, the detection of defective pixels may include: when the value obtained by subtracting the median value from the minimum value in the peripheral sensing values ​​is greater than a threshold, the initial defective pixel is determined as a defective pixel. The central sensing value may be the sensing value of a sub-pixel of the initial defective pixel, and the peripheral sensing value may be the sensing value of a sub-pixel of the peripheral pixel.

[0022] In an embodiment, the detection of defective pixels may include: determining a preliminary defective pixel as a defective pixel when the value obtained by subtracting the maximum value in the center sensing value from the intermediate value in the peripheral sensing value is greater than a threshold. The peripheral sensing value may be the sensing value of a sub-pixel of the peripheral pixel, and the center sensing value may be the sensing value of a sub-pixel of the preliminary defective pixel.

[0023] In one embodiment, the detection of a defect line may include: identifying the line as a defect line when the number of preliminary defect pixels included in the line is greater than a threshold.

[0024] In an embodiment, compensation for the sensed value of the defect line may include replacing the sensed value of the defect line with the average of the sensed values ​​of adjacent lines adjacent to the defect line in a first direction.

[0025] According to one or more embodiments of this disclosure, an electronic device includes: a processor configured to generate image data; a display device configured to display an image based on the image data; and a power module connected to the processor and the display device. The display device includes: a display panel including a plurality of pixels; a sensing circuit configured to generate sensed values ​​for the plurality of pixels by sensing characteristics of the plurality of pixels; and a panel defect normalizer configured to compensate for the sensed values. The panel defect normalizer includes: a preliminary defect pixel detector configured to detect a preliminary defect pixel by comparing a sensed value of a target pixel with a sensed value of a neighboring pixel adjacent to the target pixel in a first direction; a defect pixel detector configured to detect a defect pixel by comparing a sensed value of the preliminary defect pixel with a sensed value of a peripheral pixel surrounding the preliminary defect pixel; a defect line detector configured to detect a defect line by counting the number of preliminary defect pixels included in a line extending in a second direction intersecting the first direction; a defect line compensator configured to compensate for the sensed values ​​of the defect lines; and a defect pixel compensator configured to compensate for the sensed values ​​of the defect pixels.

[0026] According to some embodiments of this disclosure, defective pixels can be detected from (e.g., only from) preliminary defective pixels detected for detecting defect lines, thereby increasing the yield of the display device and reducing the manufacturing time of the display device.

[0027] However, this disclosure is not limited to the foregoing aspects and features, and the foregoing and other aspects and features will be set forth in part with reference to the accompanying drawings in the following detailed description and will be apparent in part from thereto, or may be learned by practicing one or more of the embodiments presented in this disclosure. Attached Figure Description

[0028] The above and other aspects and features of this disclosure will become clearer from the following detailed description of illustrative, non-limiting embodiments with reference to the accompanying drawings.

[0029] Figure 1 This is a block diagram illustrating a display device according to an embodiment.

[0030] Figure 2A It is a diagram. Figure 1 The image is composed of pixels.

[0031] Figure 2B It is a diagram. Figure 1 The image is composed of pixels.

[0032] Figure 3 It is a diagram. Figure 1 The circuit diagram of the sub-pixel.

[0033] Figure 4 It is a diagram. Figure 1 A block diagram of an example panel defect normalizer.

[0034] Figure 5 It is a diagram. Figure 4 A diagram illustrating the operation of the initial defect pixel detector.

[0035] Figure 6 It is a diagram. Figure 4 The diagram shows the operation of the first defect pixel detector.

[0036] Figure 7 It is a diagram. Figure 4 The diagram shows the operation of the second defect pixel detector.

[0037] Figure 8 It is a diagram. Figure 4 A diagram illustrating the operation of the defect line detector.

[0038] Figure 9 It is a diagram. Figure 4 A diagram illustrating the operation of the defect line compensator.

[0039] Figure 10 It is a diagram. Figure 4 A diagram illustrating the operation of the defective pixel compensator.

[0040] Figure 11 It is a diagram. Figure 1 A block diagram of an example panel defect normalizer.

[0041] Figure 12 It is a diagram. Figure 11 A diagram illustrating the operation of the third defect pixel detector.

[0042] Figure 13 This is a flowchart illustrating an inspection method for a display device according to an embodiment.

[0043] Figure 14 This is a block diagram illustrating an electronic device according to an embodiment.

[0044] Figure 15 These are diagrams illustrating some electronic devices according to various embodiments. Detailed Implementation

[0045] In the following description, embodiments will be illustrated in more detail with reference to the accompanying drawings, in which the same reference numerals refer to the same elements throughout. However, this disclosure may be implemented in a variety of different forms and should not be construed as being limited to the embodiments shown herein. Rather, these embodiments are provided as examples so that this disclosure will be thorough and complete, and will fully convey the aspects and features of this disclosure to those skilled in the art. Accordingly, processes, elements, and techniques that are unnecessary for those skilled in the art to fully understand the aspects and features of this disclosure may not be described. Unless otherwise stated, the same reference numerals denote the same elements throughout the drawings and written description, and therefore, redundant descriptions may not be repeated.

[0046] When a particular embodiment can be implemented differently, the particular process sequence may differ from the described sequence. For example, two consecutively described processes may be performed simultaneously or substantially simultaneously, or in the reverse order of the described sequence.

[0047] Furthermore, as those skilled in the art will understand, given that each suitable feature of the various embodiments of this disclosure as a whole may be combined in part or in whole or in combination with one another and may be technically associated with and operable in a variety of suitable ways, and unless otherwise stated or implied, each embodiment may be implemented independently of one another or in combination with one another in any suitable way.

[0048] In the accompanying drawings, for clarity, the relative dimensions, thicknesses, and proportions of elements, layers, and regions may be exaggerated and / or simplified. For ease of illustration, spatial relative terms such as “below,” “under,” “below,” “below,” “above,” and “above” may be used herein to describe the relationship of one element or feature as shown in the drawings to another element(s). It will be understood that, in addition to the orientations depicted in the drawings, spatial relative terms are intended to include different orientations of the device in use or operation. For example, if the device in the drawings is flipped, an element described as “below,” “below,” or “below” other elements or features will then be oriented “above” other elements or features. Thus, the example terms “below” and “below” can encompass both above and below orientations. The device may be oriented in other ways (e.g., rotated 90 degrees or in other orientations), and the spatial relative descriptive terms used herein should be interpreted accordingly.

[0049] Furthermore, it should be anticipated that the shapes shown in the drawings may vary in practice depending on, for example, tolerances and / or manufacturing techniques. Accordingly, the embodiments of this disclosure should not be construed as limited to the specific shapes shown in the drawings, but should be interpreted in light of possible shape variations, for example, due to manufacturing processes. Therefore, the shapes shown in the drawings may not depict the actual shape of an area of ​​the device, and this disclosure is not limited thereto.

[0050] In the accompanying drawings, the first direction, second direction, and third direction are not limited to directions corresponding to the three axes of the Cartesian coordinate system, and can be interpreted more broadly. For example, the first direction, second direction, and third direction can be perpendicular or substantially perpendicular to each other, or they can represent different directions that are not perpendicular to each other.

[0051] It will be understood that although the terms “first,” “second,” “third,” etc., may be used herein to describe various elements, components, areas, layers, and / or parts, these elements, components, areas, layers, and / or parts should not be limited by these terms. These terms are used to distinguish one element, component, area, layer, or part from another element, component, area, layer, or part. Therefore, the first element, component, area, layer, or part described below may be referred to as the second element, component, area, layer, or part without departing from the spirit and scope of this disclosure.

[0052] It will be understood that when an element or layer is referred to as being "on," "connected to," or "attached to" another element or layer, it may be directly on, directly connected to, or directly attached to that other element or layer, or one or more intermediary elements or layers may exist. Similarly, when a layer, region, or element is referred to as being "electrically connected" to another layer, region, or element, it may be directly electrically connected to that other layer, region, or element, or it may be indirectly electrically connected to that other layer, region, or element, with one or more intermediary layers, regions, or elements between them. Furthermore, it will be understood that when an element or layer is referred to as being "between" two elements or layers, it may be the only element or layer between those two elements or layers, or one or more intermediary elements or layers may exist.

[0053] The terminology used herein is for the purpose of describing particular embodiments and is not intended to limit this disclosure. As used herein, the singular form “a” is intended to include the plural form as well, unless the context clearly indicates otherwise. It will be further understood that, when used in this specification, the terms “comprising,” “including,” and “having” indicate the presence of the stated features, integrals, steps, operations, elements, and / or components, but do not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components, and / or combinations thereof. As used herein, the term “and / or” includes any and all combinations of one or more of the associated listed items. For example, the expression “A and / or B” means A, B, or A and B. Expressions such as “at least one of”, when placed after a list of elements, modify the entire list of elements without modifying individual elements in the list. For example, the expressions “at least one of a, b, and c” and “at least one selected from the group consisting of a, b, and c” mean only a, only b, only c, both a and b, both a and c, both b and c, all a, b, and c, or variations thereof.

[0054] As used herein, the terms “substantially,” “approximately,” and similar terms are used as terms of approximation rather than terms of degree and are intended to describe the inherent biases of measured or calculated values ​​that will be recognized by one of ordinary skill in the art. Furthermore, when describing embodiments of this disclosure, the use of “may” means “one or more embodiments of this disclosure.” As used herein, the terms “use” and “be used” may be considered synonymous with the terms “utilize” and “be exploited,” respectively.

[0055] Unless otherwise specified, all terms used herein (including technical and scientific terms) shall have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure pertains. It will be further understood that, unless expressly defined herein, terms (e.g., those defined in common dictionaries) shall be interpreted as having the meaning consistent with their meaning in the relevant field and / or the context of this specification, and shall not be interpreted in an idealized or overly formal sense.

[0056] Figure 1 This is a block diagram illustrating a display device 100 according to an embodiment. Figure 2A It is a diagram. Figure 1 The image is a pixel PX. Figure 2B It is a diagram. Figure 1 The image is a pixel PX.

[0057] refer to Figure 1 The display device 100 may include a display panel 110, a gate driver 120, a data driver 130, a sensing circuit 140, a controller 150, and a panel defect straightener 160.

[0058] Display panel 110 may include multiple pixels PX. Each pixel PX may include multiple subpixels. Subpixels may display different colors from each other, and pixel PX may display a color (e.g., a single color) that is a combination of multiple colors displayed by the corresponding multiple subpixels.

[0059] In an embodiment, pixel PX may include a first sub-pixel SP1, a second sub-pixel SP2, and a third sub-pixel SP3. However, this disclosure is not limited thereto, and in an embodiment, pixel PX may include two, four, or more sub-pixels.

[0060] In an embodiment, the first sub-pixel SP1, the second sub-pixel SP2, and the third sub-pixel SP3 can be a red sub-pixel, a green sub-pixel, and a blue sub-pixel, respectively. However, this disclosure is not limited thereto, and in an embodiment, the first sub-pixel SP1, the second sub-pixel SP2, and the third sub-pixel SP3 can be a magenta sub-pixel, a yellow sub-pixel, and a cyan sub-pixel, respectively.

[0061] In an embodiment, such as Figure 2A As shown, the first sub-pixel SP1, the second sub-pixel SP2, and the third sub-pixel SP3 can be arranged within pixel PX along the first direction DR1. Figure 2A The arrangement of sub-pixels SP1, SP2, and SP3 shown in the diagram can be referred to as an H-stripe arrangement. In an embodiment, as... Figure 2B As shown, within pixel PX, the first sub-pixel SP1 can be arranged at the top center, the second sub-pixel SP2 can be arranged at the bottom left, and the third sub-pixel SP3 can be arranged at the bottom right. Figure 2B The arrangement of subpixels SP1, SP2, and SP3 shown in the diagram can be referred to as a Q-striped arrangement. In the following text, as a representative example, subpixels SP1, SP2, and SP3 will be described in more detail as an H-striped arrangement.

[0062] The gate driver 120 can provide a scan signal SC and a sensing signal SS to sub-pixels SP1, SP2, and SP3. The gate driver 120 can generate the scan signal SC and the sensing signal SS based on a gate control signal GCS. The gate control signal GCS may include a gate start signal and a gate clock signal, etc. In an embodiment, the gate driver 120 can be installed in the peripheral area of ​​the display panel 110.

[0063] The data driver 130 can provide the data voltage VDAT to sub-pixels SP1, SP2, and SP3. The data driver 130 can generate the data voltage VDAT based on the image signal IMS and the data control signal DCS. The data driver 130 can convert the image signal IMS, which may be in digital form, into the analog form of the data voltage VDAT. The data control signal DCS may include load signals and data clock signals, etc.

[0064] Sensing circuit 140 can sense the characteristics of pixel PX to generate a sensed value for pixel PX. Sensing circuit 140 can receive a sensed voltage VSEN that includes information about the characteristics of pixel PX, and can generate sensed data SD that includes a sensed value corresponding to the sensed voltage VSEN. In embodiments, data driver 130 and sensing circuit 140 can be implemented together as a single integrated circuit, or as separate integrated circuits.

[0065] The controller 150 can control the operation of the gate driver 120, the data driver 130, and the sensing circuit 140. The controller 150 can provide the gate control signal GCS to the gate driver 120 and the image signal IMS and data control signal DCS to the data driver 130. The controller 150 can generate the image signal IMS based on the image data IMD. The controller 150 can generate the gate control signal GCS and the data control signal DCS based on the controller control signal CCS. The controller control signal CCS may include a horizontal synchronization signal, a vertical synchronization signal, a master clock signal, and a data enable signal, etc. In an embodiment, the data driver 130 and the controller 150 can be implemented together as a single integrated circuit (e.g., a timing controller embedded data driver (TED)) or as separate integrated circuits.

[0066] The panel defect adjuster 160 can compensate for sensed values ​​included in the sensed data SD. The panel defect adjuster 160 can detect defect lines and defective pixels based on the sensed values, and can compensate for the sensed values ​​of defect lines and defective pixels. In one embodiment, the controller 150 may include the panel defect adjuster 160. In another embodiment, the panel defect adjuster 160 may be implemented as an integrated circuit discrete from the integrated circuit of the controller 150.

[0067] Figure 3 It is a diagram. Figure 1 The circuit diagram of the sub-pixel SP. Figure 3 The diagram shows... Figure 1 One of the first sub-pixel SP1, the second sub-pixel SP2, and the third sub-pixel SP3.

[0068] refer to Figure 3The sub-pixel SP can receive a scan signal SC, a sensing signal SS, a data voltage VDAT, a first power voltage ELVDD, and a second power voltage ELVSS. The sub-pixel SP can emit light with a brightness corresponding to the data voltage VDAT. Furthermore, the sub-pixel SP can output a sensing voltage VSEN. In an embodiment, the voltage level of the second power voltage ELVSS can be lower than the voltage level of the first power voltage ELVDD. The sub-pixel SP may include a light-emitting element EL, a first transistor T1, a second transistor T2, a third transistor T3, and a first capacitor C1.

[0069] The light-emitting element EL can emit light with a brightness corresponding to the driving current. The light-emitting element EL may include an anode connected to the second node N2 and a cathode receiving a second power voltage ELVSS. In embodiments, the light-emitting element EL may be an organic light-emitting diode, an inorganic light-emitting diode, a micro light-emitting diode, or a quantum dot light-emitting diode.

[0070] The first transistor T1 can generate a drive current corresponding to the data voltage VDAT. The first transistor T1 may include a gate connected to the first node N1, a first terminal (e.g., drain) receiving the first power voltage ELVDD, and a second terminal (e.g., source) connected to the second node N2. The first transistor T1 may be referred to as a drive transistor.

[0071] The second transistor T2 can transmit the data voltage VDAT to the first node N1 in response to the scan signal SC. The second transistor T2 may include a gate for receiving the scan signal SC, a first terminal (e.g., drain) for receiving the data voltage VDAT, and a second terminal (e.g., source) connected to the first node N1. The second transistor T2 may be referred to as a scan transistor or a write transistor.

[0072] The third transistor T3 can transmit an initialization voltage VINT to the second node N2 in response to the sensing signal SS. Furthermore, the third transistor T3 can output the voltage of the second node N2 as the sensing voltage VSEN in response to the sensing signal SS. The third transistor T3 may include a gate for receiving the sensing signal SS, a first terminal (e.g., drain) for receiving the initialization voltage VINT or outputting the sensing voltage VSEN, and a second terminal (e.g., source) connected to the second node N2. The third transistor T3 may be referred to as a sensing transistor or an initialization transistor.

[0073] The sensed voltage VSEN can include information about the characteristics of the sub-pixel SP. In an embodiment, the characteristics of the sub-pixel SP can be one of the threshold voltage of the first transistor T1, the electron mobility of the first transistor T1, and the degradation of the light-emitting element EL.

[0074] In this embodiment, each of the first transistor T1, the second transistor T2, and the third transistor T3 may be an n-channel metal-oxide-semiconductor (NMOS) transistor. In this embodiment, each of the first transistor T1, the second transistor T2, and the third transistor T3 may be an oxide semiconductor transistor.

[0075] The first capacitor C1 can store the data voltage VDAT. The first capacitor C1 may include a first terminal connected to the first node N1 and a second terminal connected to the second node N2. The first capacitor C1 may be referred to as a storage capacitor.

[0076] Figure 4 It is a diagram. Figure 1 A block diagram of an example of a panel defect normalizer 160. Figure 5 It is a diagram. Figure 4 A diagram showing the operation of the initial defect pixel detector 161. Figure 6 It is a diagram. Figure 4 A diagram showing the operation of the first defect pixel detector 162a. Figure 7 It is a diagram. Figure 4 A diagram showing the operation of the second defect pixel detector 162b. Figure 8 It is a diagram. Figure 4 A diagram illustrating the operation of the defect line detector 163. Figure 9 It is a diagram. Figure 4 A diagram illustrating the operation of the defect line compensator 166. Figure 10 It is a diagram. Figure 4 A diagram illustrating the operation of the defective pixel compensator 167.

[0077] refer to Figures 4 to 10 The panel defect adjuster 160 can compensate for the sensing data SD including the sensing value of pixel PX to generate compensated sensing data SD_C including the compensated sensing value of pixel PX. The panel defect adjuster 160 may include a preliminary defect pixel detector 161, a defect pixel detector 162, a defect line detector 163, a defect memory 164, a defect distinguisher 165, a defect line compensator 166, and a defect pixel compensator 167.

[0078] The preliminary defect pixel detector 161 can detect the preliminary defect pixel PDP by comparing the sensed value SV_TP of the target pixel TP with the sensed values ​​of the neighboring pixels adjacent to the target pixel TP in the first direction DR1.

[0079] In an embodiment, when the difference between the sensed value SV_TP of the target pixel TP and the sensed values ​​of its neighboring pixels is greater than a threshold TH, the preliminary defect pixel detector 161 can determine the target pixel TP as a preliminary defect pixel PDP. For example, as Figure 5As shown, when the difference between the sensing value SV_AP1 of the first adjacent pixel AP1 adjacent to the left of the target pixel TP and the sensing value SV_TP of the target pixel TP is greater than the threshold TH, and the difference between the sensing value SV_TP of the target pixel TP and the sensing value SV_AP2 of the second adjacent pixel AP2 adjacent to the right of the target pixel TP is greater than the threshold TH, the preliminary defect pixel detector 161 can determine the target pixel TP as the preliminary defect pixel PDP.

[0080] The defective pixel detector 162 can detect the defective pixel DP by comparing the sensed value of the initial defective pixel PDP with the sensed values ​​of peripheral pixels surrounding the initial defective pixel PDP (e.g., surrounding the periphery of the initial defective pixel PDP). The defective pixel detector 162 may include a first defective pixel detector 162a and a second defective pixel detector 162b.

[0081] like Figure 6 As shown, when the difference between the maximum value MX_TSV and the minimum value MN_TSV among all sensed values ​​(including the center sensed value and the peripheral sensed value, where the center sensed value is the sensed value of the sub-pixels SP1, SP2 and SP3 of the initial defective pixel PDP, and the peripheral sensed value is the sensed value of the sub-pixels SP1, SP2 and SP3 of the peripheral pixel) is greater than the first threshold TH1, the difference between the median value ME_TSV and the minimum value MN_TSV among all sensed values ​​is less than the second threshold TH2, the difference between the median value ME_PSV among the peripheral sensed values ​​and the median value ME_CSV among the center sensed values ​​is greater than the third threshold TH3, the maximum value MX_TSV among all sensed values ​​is less than the fourth threshold TH4, and the minimum value MN_TSV among all sensed values ​​is greater than the fifth threshold TH5, the first defective pixel detector 162a can determine the initial defective pixel PDP as the defective pixel DP.

[0082] In an embodiment, such as Figure 6As shown, the peripheral pixels surrounding the initial defect pixel PDP (e.g., surrounding the periphery of the initial defect pixel PDP) may include a first peripheral pixel PP1 adjacent to the left side of the initial defect pixel PDP, a second peripheral pixel PP2 adjacent to the right side of the initial defect pixel PDP, a third peripheral pixel PP3 adjacent to the upper side of the initial defect pixel PDP, and a fourth peripheral pixel PP4 adjacent to the lower side of the initial defect pixel PDP. For example, the maximum value MX_TSV among all sensed values ​​may be the maximum sensed value among 15 sensed values ​​including the sensed values ​​of the sub-pixels SP1, SP2, and SP3 of the initial defect pixel PDP, the sensed values ​​of the sub-pixels SP1, SP2, and SP3 of the first peripheral pixel PP1, the sensed values ​​of the sub-pixels SP1, SP2, and SP3 of the second peripheral pixel PP2, the sensed values ​​of the sub-pixels SP1, SP2, and SP3 of the third peripheral pixel PP3, and the sensed values ​​of the sub-pixels SP1, SP2, and SP3 of the fourth peripheral pixel PP4. The minimum value MN_TSV among all sensed values ​​can be the smallest sensed value among 15 sensed values, and the median value ME_TSV among all sensed values ​​can be the 8th largest sensed value among 15 sensed values. For example, the median value ME_PSV among peripheral sensed values ​​can be the 6th or 7th largest sensed value among 12 sensed values, including the sensed values ​​of sub-pixels SP1, SP2, and SP3 of the first peripheral pixel PP1, the sensed values ​​of sub-pixels SP1, SP2, and SP3 of the second peripheral pixel PP2, the sensed values ​​of sub-pixels SP1, SP2, and SP3 of the third peripheral pixel PP3, and the sensed values ​​of sub-pixels SP1, SP2, and SP3 of the fourth peripheral pixel PP4. For example, the median value ME_CSV among center sensed values ​​can be the second largest sensed value among three sensed values, including the sensed values ​​of sub-pixels SP1, SP2, and SP3 of the initial defect pixel PDP.

[0083] like Figure 7 As shown, when the value obtained by subtracting the intermediate value ME_PSV from the minimum value MN_CSV in the center sensed value is greater than the threshold TH6, the second defective pixel detector 162b can determine the initial defective pixel PDP as the defective pixel DP. The center sensed value is the sensed value of the sub-pixels SP1, SP2, and SP3 of the initial defective pixel PDP, and the outer sensed value is the sensed value of the sub-pixels SP1, SP2, and SP3 of the outer pixel. For example, the minimum value MN_CSV in the center sensed value can be the minimum sensed value among the three sensed values ​​including the sensed values ​​of the sub-pixels SP1, SP2, and SP3 of the initial defective pixel PDP.

[0084] like Figure 8As shown, the defect line detector 163 can detect the defect line DL by counting the number of preliminary defect pixels PDP included in the line LN extending in the second direction DR2. The second direction DR2 may intersect or cross the first direction DR1. For example, the second direction DR2 may be orthogonal or substantially orthogonal to the first direction DR1.

[0085] In an embodiment, such as Figure 8 As shown, when the number of initial defect pixels PDP in the line LN, NUM_PDP, is greater than the threshold TH7, the defect line detector 163 can identify the line LN as the defect line DL.

[0086] The defect memory 164 can store the position of the initial defect pixel PDP, the position of the defect line DL, and the position of the defect pixel DP.

[0087] The defect distinguisher 165 can distinguish in-line defect pixels included in the defect line DL from out-of-line defect pixels not included in the defect line DL based on the position of the defect line DL and the position of the defect pixel DP. The defect storage 164 can delete the positions of in-line defect pixels from the stored positions of defect pixels DP. Accordingly, unnecessary increase in the storage space of the defect storage 164 can be prevented or substantially prevented.

[0088] The defect line compensator 166 can compensate for the sensed value of the defect line DL.

[0089] In an embodiment, such as Figure 9 As shown, the defect line compensator 166 can replace the sensed value SV_DL of the defect line DL with the average of the sensed values ​​of the adjacent lines adjacent to the defect line DL in the first direction DR1. For example, the defect line compensator 166 can replace the sensed value SV_DL of the defect line DL with the average of the sensed values ​​of the first adjacent line AL1 adjacent to the left of the defect line DL, the sensed value SV_AL2 of the second adjacent line AL2 adjacent to the right of the defect line DL, the sensed value SV_AL3 of the third adjacent line AL3 adjacent to the left of the defect line DL and between it and the first adjacent line AL1, and the sensed value SV_AL4 of the fourth adjacent line AL4 adjacent to the right of the defect line DL and between it and the second adjacent line AL2. For example, the defect line compensator 166 can replace the sensing value SV_DL of the defect line DL with the average of three of the four sensing values, excluding the maximum or minimum sensing value, including the sensing value SV_AL1 of the first adjacent line AL1, the sensing value SV_AL2 of the second adjacent line AL2, the sensing value SV_AL3 of the third adjacent line AL3, and the sensing value SV_AL4 of the fourth adjacent line AL4.

[0090] The defective pixel compensator 167 can compensate for the sensed value of the defective pixel DP.

[0091] In an embodiment, such as Figure 10 As shown, the defective pixel compensator 167 can replace the sensed value SV_DP of the defective pixel DP with the average of the sensed values ​​of the peripheral pixels surrounding the defective pixel DP (e.g., surrounding the periphery of the defective pixel DP). For example, the defective pixel compensator 167 can replace the sensed value SV_DP of the defective pixel DP with the average of the sensed values ​​of the first peripheral pixel PP1 adjacent to the left of the defective pixel DP, the sensed value SV_PP2 of the second peripheral pixel PP2 adjacent to the right of the defective pixel DP, the sensed value SV_PP3 of the third peripheral pixel PP3 adjacent to the upper side of the defective pixel DP, and the sensed value SV_PP4 of the fourth peripheral pixel PP4 adjacent to the lower side of the defective pixel DP. For example, the defective pixel compensator 167 can replace the sensing value SV_DP of the defective pixel DP with the average of the sensing values ​​of the first peripheral pixel PP1 adjacent to the left of the defective pixel DP, the second peripheral pixel PP2 adjacent to the right of the defective pixel DP, the third peripheral pixel PP3 adjacent to the top of the defective pixel DP, the fourth peripheral pixel PP4 adjacent to the bottom of the defective pixel DP, the fifth peripheral pixel adjacent to the upper left of the defective pixel DP, the sixth peripheral pixel adjacent to the upper right of the defective pixel DP, the seventh peripheral pixel adjacent to the lower left of the defective pixel DP, and the eighth peripheral pixel adjacent to the lower right of the defective pixel DP.

[0092] In an embodiment, the defect pixel compensator 167 may not compensate for the sensed values ​​of defective pixels within the defect line DL. When the defect line compensator 166 compensates for the sensed values ​​of the defect line DL, the sensed values ​​of defective pixels within the line can be compensated, and correspondingly, the defect pixel compensator 167 may not compensate for the sensed values ​​of defective pixels within the line to prevent or substantially prevent the sensed values ​​of defective pixels within the line from being repeatedly compensated.

[0093] In the comparative example, when only defective lines are detected during the manufacturing process of the display device, the manufacturing time of the display device can be reduced. However, the display device may include defective pixels, and therefore, the yield of the display device may be reduced. Furthermore, in the comparative example, when defective pixels are detected for all pixels during the manufacturing process of the display device, the yield of the display device can be increased, but the manufacturing time of the display device may also be increased. For example, the detection time for defective lines may be approximately 10 seconds, and the detection time for defective pixels for all pixels may be approximately 50 seconds. Accordingly, when only defective lines are detected, the defect processing time may be approximately 10 seconds, and when defective pixels are detected for both defective lines and all pixels, the defect processing time may be approximately 60 seconds.

[0094] In some embodiments of this disclosure, defective pixels can be detected only for initially detected defective pixels to detect defect lines, thereby increasing the yield of the display device and reducing the manufacturing time of the display device. For example, the detection time for defective pixels for initially defective pixels can be approximately 0.5 seconds. Correspondingly, when detecting defective pixels for both defect lines and initially defective pixels, the defect processing time can be approximately 10.5 seconds.

[0095] Figure 11 It is a diagram. Figure 1 A block diagram of an example of a panel defect normalizer 160_1. Figure 12 It is a diagram. Figure 11 A diagram showing the operation of the third defect pixel detector 162c.

[0096] refer to Figure 11 and Figure 12 The panel defect normalizer 160_1 may include a preliminary defect pixel detector 161, a defect pixel detector 162_1, a defect line detector 163, a defect memory 164, a defect distinguisher 165, a defect line compensator 166, and a defect pixel compensator 167. (The following may be omitted:) Figure 11 and Figure 12 The panel defect straightener 160_1 shown in the middle diagram is the same as the one mentioned above. Figures 4 to 10 Redundant description of components that are the same as or substantially the same as (or similar to) the components of the panel defect straightener 160.

[0097] The defect pixel detector 162_1 may include a first defect pixel detector 162a, a second defect pixel detector 162b, and a third defect pixel detector 162c.

[0098] In an embodiment, such as Figure 12As shown, when the value obtained by subtracting the maximum value MX_CSV in the center sensing value from the intermediate value ME_PSV in the peripheral sensing values ​​is greater than the threshold TH8, the third defective pixel detector 162c can determine the initial defective pixel PDP as the defective pixel DP. The peripheral sensing values ​​are the sensing values ​​of the sub-pixels SP1, SP2, and SP3 of the peripheral pixel, and the center sensing values ​​are the sensing values ​​of the sub-pixels SP1, SP2, and SP3 of the initial defective pixel PDP. For example, the maximum value MX_CSV in the center sensing values ​​can be the largest of the three sensing values ​​that include the sensing values ​​of the sub-pixels SP1, SP2, and SP3 of the initial defective pixel PDP.

[0099] Figure 13 This is a flowchart illustrating an inspection method for a display device according to an embodiment.

[0100] refer to Figures 5 to 10 , Figure 12 and Figure 13 The inspection method of the display device can begin, and a preliminary defective pixel PDP can be detected by comparing the sensing value SV_TP of the target pixel TP with the sensing values ​​of neighboring pixels adjacent to the target pixel TP in the first direction DR1 (step S100). A defective pixel DP can be detected by comparing the sensing value of the preliminary defective pixel PDP with the sensing values ​​of peripheral pixels surrounding the preliminary defective pixel PDP (e.g., surrounding the periphery of the preliminary defective pixel PDP) (step S200). A defective line DL can be detected by counting the number of preliminary defective pixels PDP included in the line LN extending in the second direction DR2 (step S300). The sensing value of the defective line DL can be compensated (step S400). The sensing value of the defective pixel DP can be compensated (step S500), and the method can end.

[0101] In the detection of preliminary defective pixel PDP (step S100), when the difference between the sensed value SV_TP of the target pixel TP and the sensed values ​​of its neighboring pixels is greater than the threshold TH, the target pixel TP can be identified as a preliminary defective pixel PDP. For example, as Figure 5 As shown, when the difference between the sensing value SV_AP1 of the first adjacent pixel AP1 adjacent to the left of the target pixel TP and the sensing value SV_TP of the target pixel TP is greater than the threshold TH, and the difference between the sensing value SV_TP of the target pixel TP and the sensing value SV_AP2 of the second adjacent pixel AP2 adjacent to the right of the target pixel TP is greater than the threshold TH, the target pixel TP can be identified as a preliminary defect pixel PDP.

[0102] In the detection of defective pixel DP (step S200), such as Figure 6As shown, when the difference between the maximum value MX_TSV and the minimum value MN_TSV among all sensed values ​​(including the center sensed value and the peripheral sensed value, where the center sensed value is the sensed value of the sub-pixels SP1, SP2 and SP3 of the initial defective pixel PDP, and the peripheral sensed value is the sensed value of the sub-pixels SP1, SP2 and SP3 of the peripheral pixel) is greater than the first threshold TH1, the difference between the median value ME_TSV and the minimum value MN_TSV among all sensed values ​​is less than the second threshold TH2, the difference between the median value ME_PSV among the peripheral sensed values ​​and the median value ME_CSV among the center sensed values ​​is greater than the third threshold TH3, the maximum value MX_TSV among all sensed values ​​is less than the fourth threshold TH4, and the minimum value MN_TSV among all sensed values ​​is greater than the fifth threshold TH5, the initial defective pixel PDP can be determined as the defective pixel DP.

[0103] In an embodiment, such as Figure 6 As shown, the peripheral pixels surrounding the initial defect pixel PDP (e.g., surrounding the periphery of the initial defect pixel PDP) may include a first peripheral pixel PP1 adjacent to the left side of the initial defect pixel PDP, a second peripheral pixel PP2 adjacent to the right side of the initial defect pixel PDP, a third peripheral pixel PP3 adjacent to the upper side of the initial defect pixel PDP, and a fourth peripheral pixel PP4 adjacent to the lower side of the initial defect pixel PDP. For example, the maximum value MX_TSV among all sensed values ​​may be the maximum sensed value among 15 sensed values ​​including the sensed values ​​of the sub-pixels SP1, SP2, and SP3 of the initial defect pixel PDP, the sensed values ​​of the sub-pixels SP1, SP2, and SP3 of the first peripheral pixel PP1, the sensed values ​​of the sub-pixels SP1, SP2, and SP3 of the second peripheral pixel PP2, the sensed values ​​of the sub-pixels SP1, SP2, and SP3 of the third peripheral pixel PP3, and the sensed values ​​of the sub-pixels SP1, SP2, and SP3 of the fourth peripheral pixel PP4. The minimum value MN_TSV among all sensed values ​​can be the smallest sensed value among 15 sensed values, and the median value ME_TSV among all sensed values ​​can be the 8th largest sensed value among 15 sensed values. For example, the median value ME_PSV among peripheral sensed values ​​can be the 6th or 7th largest sensed value among 12 sensed values, including the sensed values ​​of sub-pixels SP1, SP2, and SP3 of the first peripheral pixel PP1, the sensed values ​​of sub-pixels SP1, SP2, and SP3 of the second peripheral pixel PP2, the sensed values ​​of sub-pixels SP1, SP2, and SP3 of the third peripheral pixel PP3, and the sensed values ​​of sub-pixels SP1, SP2, and SP3 of the fourth peripheral pixel PP4. For example, the median value ME_CSV among center sensed values ​​can be the second largest sensed value among three sensed values, including the sensed values ​​of sub-pixels SP1, SP2, and SP3 of the initial defect pixel PDP.

[0104] In the detection of defective pixel DP (step S200), such as Figure 7 As shown, if (for example, when) the value obtained by subtracting the intermediate value ME_PSV from the minimum value MN_CSV in the center sense values ​​is greater than the threshold TH6, then the initial defective pixel PDP can be determined as the defective pixel DP. The center sense values ​​are the sense values ​​of the sub-pixels SP1, SP2, and SP3 of the initial defective pixel PDP, and the outer sense values ​​are the sense values ​​of the sub-pixels SP1, SP2, and SP3 of the outer pixels. For example, the minimum value MN_CSV in the center sense values ​​can be the minimum sense value among the three sense values ​​that include the sense values ​​of the sub-pixels SP1, SP2, and SP3 of the initial defective pixel PDP.

[0105] In the detection of defective pixel DP (step S200), such as Figure 12 As shown, when the value obtained by subtracting the maximum value MX_CSV in the center sensing value from the median value ME_PSV in the peripheral sensing values ​​is greater than the threshold TH8, the initial defective pixel PDP can be determined as the defective pixel DP. The peripheral sensing values ​​are the sensing values ​​of the sub-pixels SP1, SP2, and SP3 of the peripheral pixel, and the center sensing values ​​are the sensing values ​​of the sub-pixels SP1, SP2, and SP3 of the initial defective pixel PDP. For example, the maximum value MX_CSV in the center sensing values ​​can be the largest of the three sensing values ​​that include the sensing values ​​of the sub-pixels SP1, SP2, and SP3 of the initial defective pixel PDP.

[0106] In the detection of defect line DL (step S300), such as Figure 8 As shown, when the number of initial defective pixels (PDP) in the line LN (NUM_PDP) is greater than the threshold TH7, the line LN can be identified as a defective line DL.

[0107] In the compensation of the sensed value of the defect line DL (step S400), such as Figure 9As shown, the sensed value SV_DL of the defect line DL can be replaced by the average of the sensed values ​​of the adjacent lines adjacent to the defect line DL in the first direction DR1. For example, the sensed value SV_DL of the defect line DL can be replaced by the average of the sensed values ​​SV_AL1 of the first adjacent line AL1 adjacent to the left of the defect line DL, the sensed value SV_AL2 of the second adjacent line AL2 adjacent to the right of the defect line DL, the sensed value SV_AL3 of the third adjacent line AL3 adjacent to the left of the defect line DL and between it and the first adjacent line AL1, and the sensed value SV_AL4 of the fourth adjacent line AL4 adjacent to the right of the defect line DL and between it and the second adjacent line AL2. For example, the sensed value SV_DL of the defect line DL can be replaced by the average of three sensed values ​​other than the maximum or minimum sensed value among the four sensed values ​​including the sensed values ​​SV_AL1 of the first adjacent line AL1, the sensed value SV_AL2 of the second adjacent line AL2, the sensed value SV_AL3 of the third adjacent line AL3, and the sensed value SV_AL4 of the fourth adjacent line AL4.

[0108] In the compensation of the sensed value of the defective pixel DP (step S500), such as Figure 10 As shown, the sensed value SV_DP of the defective pixel DP can be replaced by the average of the sensed values ​​of the peripheral pixels surrounding the defective pixel DP (e.g., surrounding the periphery of the defective pixel DP). For example, the sensed value SV_DP of the defective pixel DP can be replaced by the average of the sensed values ​​SV_PP1 of the first peripheral pixel PP1 adjacent to the left of the defective pixel DP, the sensed value SV_PP2 of the second peripheral pixel PP2 adjacent to the right of the defective pixel DP, the sensed value SV_PP3 of the third peripheral pixel PP3 adjacent to the upper side of the defective pixel DP, and the sensed value SV_PP4 of the fourth peripheral pixel PP4 adjacent to the lower side of the defective pixel DP. For example, the sensing value SV_DP of the defective pixel DP can be replaced by the average of the sensing values ​​SV_PP1 of the first peripheral pixel PP1 adjacent to the left of the defective pixel DP, the sensing value SV_PP2 of the second peripheral pixel PP2 adjacent to the right of the defective pixel DP, the sensing value SV_PP3 of the third peripheral pixel PP3 adjacent to the top of the defective pixel DP, the sensing value SV_PP4 of the fourth peripheral pixel PP4 adjacent to the bottom of the defective pixel DP, the sensing value of the fifth peripheral pixel adjacent to the upper left of the defective pixel DP, the sensing value of the sixth peripheral pixel adjacent to the upper right of the defective pixel DP, the sensing value of the seventh peripheral pixel adjacent to the lower left of the defective pixel DP, and the sensing value of the eighth peripheral pixel adjacent to the lower right of the defective pixel DP.

[0109] Figure 14 This is a block diagram illustrating an electronic device 10 according to an embodiment.

[0110] refer toFigure 14 The electronic device 10 may include a display module 11, a processor 12, a memory 13, and a power module 14.

[0111] The processor 12 may include at least one of a central processing unit (CPU), an application processor (AP), a graphics processing unit (GPU), a communication processor (CP), an image signal processor (ISP), and a controller.

[0112] Memory 13 can store data information used for the operation of processor 12 or display module 11. When processor 12 executes an application stored in memory 13, Figure 1 Image data IMD and Figure 1 The controller control signal CCS can be transmitted to the display module 11, and the display module 11 can output image information based on the image data IMD and the controller control signal CCS.

[0113] The power module 14 may include a power source such as a power adapter and / or battery device, as well as a power conversion module that converts the power supplied by the power source to generate power for the operation of the electronic device 10.

[0114] According to some of the above embodiments, at least one of the components of the electronic device 10 may be included. Figure 1 The display device 100 may include some individual modules that are functionally included in a single module within the display device 100, while other individual modules may be provided separately from the display device 100. For example, the display device 100 may include a display module 11, and the processor 12, memory 13, and power module 14 may be provided as other devices within the electronic device 10 besides the display device 100.

[0115] Figure 15 These are diagrams illustrating some electronic devices according to various embodiments.

[0116] refer to Figure 15 The electronic devices that can be used with display devices according to some embodiments may include not only image display electronic devices such as smartphones 10_1a, tablet PCs 10_1b, laptops 10_1c, TVs 10_1d, and desktop monitors 10_1e, but also wearable electronic devices including display modules such as smart glasses 10_2a, head-mounted displays 10_2b, and smartwatches 10_2c, as well as vehicle electronic devices 10_3 including display modules such as interior mirror displays and central information displays (CIDs) arranged on instrument panels, central dashboards, and dashboards of automobiles.

[0117] The display device according to some embodiments can be applied to display devices included in computers (e.g., laptops), mobile phones, smartphones, smart tablets, smartwatches, PMPs, PDAs, or MP3 players, etc.

[0118] Electronic or electrical devices and / or any other related devices or components (e.g., preliminary defect pixel detectors, first defect pixel detectors, second defect pixel detectors, third defect pixel detectors, defect line detectors, defect distinguishers, defect line compensators, and defect pixel compensators, etc.) according to embodiments of the present disclosure described herein can be implemented using any suitable hardware, firmware (e.g., application-specific integrated circuits), software, or a combination of software, firmware, and hardware. For example, various components of these devices may be formed on a single integrated circuit (IC) chip or on multiple separate IC chips. Furthermore, various components of these devices may be implemented on flexible printed circuit films, tape-on-a-carrier packages (TCPs), or rigid printed circuit boards (PCBs), or formed on a substrate. Additionally, various components of these devices may be processes or threads that run on one or more processors in one or more computing devices, execute computer program instructions, and interact with other system components to perform the various functions described herein. The computer program instructions are stored in memory implemented in the computing device using standard memory devices such as random access memory (RAM). The computer program instructions may also be stored on other non-transitory computer-readable media such as CD-ROMs or flash drives. Furthermore, those skilled in the art will recognize that the functions of various computing devices can be combined or integrated into a single computing device, or the functions of a particular computing device can be distributed across one or more other computing devices without departing from the spirit and scope of the exemplary embodiments of this disclosure.

[0119] The foregoing is a description of some embodiments of this disclosure and should not be construed as limiting it. Although some embodiments have been described, those skilled in the art will readily understand that various modifications can be made to the embodiments without departing from the spirit and scope of this disclosure. It will be understood that, unless otherwise described, the description of features or aspects within each embodiment should generally be considered applicable to other similar features or aspects in other embodiments. Therefore, as will be apparent to those skilled in the art, unless specifically indicated otherwise, features, characteristics, and / or elements described in connection with a particular embodiment may be used alone or in combination with features, characteristics, and / or elements described in connection with other embodiments. Therefore, it should be understood that the foregoing is a description of various exemplary embodiments and should not be construed as limiting to the specific embodiments disclosed herein, and various modifications to the disclosed embodiments and other exemplary embodiments are intended to be included within the spirit and scope of this disclosure as defined in the claims and their equivalents.

Claims

1. A display apparatus comprising: a display panel including a plurality of pixels; a sensing circuit configured to generate sensing values of the plurality of pixels by sensing characteristics of the plurality of pixels; and a panel defect regularizer configured to compensate for the sensing values, the panel defect regularizer including: a preliminary defective pixel detector configured to detect a preliminary defective pixel by comparing a sensing value of a target pixel with sensing values of neighboring pixels adjacent to the target pixel in a first direction; a defective pixel detector configured to detect a defective pixel by comparing a sensing value of the preliminary defective pixel with sensing values of peripheral pixels surrounding the preliminary defective pixel; a defective line detector configured to detect a defective line by counting a number of the preliminary defective pixels included in a line extending in a second direction crossing the first direction; a defective line compensator configured to compensate for a sensing value of the defective line; and a defective pixel compensator configured to compensate for a sensing value of the defective pixel.

2. The display device according to claim 1, wherein The preliminary defective pixel detector is configured to determine the target pixel as the preliminary defective pixel when a difference between the sensing value of the target pixel and the sensing values of the neighboring pixels is greater than a threshold value.

3. The display device according to claim 1, wherein The defective pixel detector includes a first defective pixel detector configured to determine the preliminary defective pixel as the defective pixel when: a difference between a maximum value among all sensing values and a minimum value among the all sensing values is greater than a first threshold value, the all sensing values including a center sensing value which is a sensing value of a sub-pixel of the preliminary defective pixel and a peripheral sensing value which is a sensing value of a sub-pixel of the peripheral pixel; a difference between a middle value among the all sensing values and the minimum value among the all sensing values is less than a second threshold value; a difference between a middle value among the peripheral sensing values and a middle value among the center sensing values is greater than a third threshold value; the maximum value among the all sensing values is less than a fourth threshold value; and the minimum value among the all sensing values is greater than a fifth threshold value.

4. The display device according to claim 1, wherein The defective pixel detector includes a second defective pixel detector configured to determine the preliminary defective pixel as the defective pixel when a value obtained by subtracting a middle value among peripheral sensing values from a minimum value among center sensing values is greater than a threshold value, the center sensing values being sensing values of sub-pixels of the preliminary defective pixel, the peripheral sensing values being sensing values of sub-pixels of the peripheral pixel.

5. The display device according to claim 1, wherein The defective pixel detector includes a third defective pixel detector configured to determine the preliminary defective pixel as the defective pixel when a value obtained by subtracting a maximum value among center sensing values from a middle value among peripheral sensing values is greater than a threshold value, the peripheral sensing values being sensing values of sub-pixels of the peripheral pixel, the center sensing values being sensing values of sub-pixels of the preliminary defective pixel.

6. The display device according to claim 1, wherein The defect line detector is configured to determine the line as the defect line when the number of the preliminary defect pixels included in the line is greater than a threshold value.

7. The display device according to claim 1, wherein The defect line compensator is configured to replace the sensed values of the defect line with an average of sensed values of adjacent lines adjacent to the defect line in the first direction.

8. The display device according to claim 1, wherein The defect pixel compensator is configured to replace the sensed value of the defect pixel with an average of sensed values of peripheral pixels surrounding the defect pixel.

9. The display device according to claim 1, wherein The panel defect regularizer further includes a defect storage configured to store positions of the preliminary defect pixels, a position of the defect line, and a position of the defect pixel.

10. The display device of claim 9, wherein, The panel defect regularizer further includes a defect differentiator configured to differentiate a line-in defect pixel included in the defect line from a line-out defect pixel not included in the defect line based on the position of the defect line and the position of the defect pixel.

11. The display device of claim 10, wherein, The defect pixel compensator is configured to not compensate for a sensed value of the line-in defect pixel.

12. The display device of claim 1, wherein, The characteristic of the plurality of pixels is one of a threshold voltage of a driving transistor included in the plurality of pixels, an electron mobility of the driving transistor, and a deterioration of a light emitting element included in the plurality of pixels.

13. A method of inspecting a display apparatus, comprising: detecting a preliminary defect pixel by comparing a sensed value of a target pixel with sensed values of adjacent pixels adjacent to the target pixel in a first direction; detecting a defect pixel by comparing a sensed value of the preliminary defect pixel with sensed values of peripheral pixels surrounding the preliminary defect pixel; detecting a defect line by counting a number of preliminary defect pixels included in a line extending in a second direction intersecting the first direction; compensating for a sensed value of the defect line; and compensating for a sensed value of the defect pixel. The detection of the preliminary defect pixel includes determining the target pixel as the preliminary defect pixel when a difference between the sensed value of the target pixel and the sensed values of the adjacent pixels is greater than a threshold value.

14. The inspection method of claim 13, wherein, The detection of the defect pixel includes determining the preliminary defect pixel as the defect pixel when:

15. The inspection method of claim 13, wherein, a difference between a maximum value of all sensed values and a minimum value of the all sensed values is greater than a first threshold value, the all sensed values including a center sensed value that is a sensed value of a sub-pixel of the preliminary defect pixel and a peripheral sensed value that is a sensed value of a sub-pixel of the peripheral pixel; a difference between a middle value of the all sensed values and the minimum value of the all sensed values is less than a second threshold value; a difference between a middle value of the peripheral sensed values and a middle value of the center sensed values is greater than a third threshold value; the maximum value of the all sensed values is less than a fourth threshold value; and the minimum value of the all sensed values is greater than a fifth threshold value. ​ 16. The inspection method of claim 13, wherein, The detection of the defective pixel includes determining the preliminary defective pixel as the defective pixel when a value obtained by subtracting an intermediate value among peripheral sensing values from a minimum value among central sensing values is greater than a threshold value, the central sensing values being sensing values of sub-pixels of the preliminary defective pixel, the peripheral sensing values being sensing values of sub-pixels of the peripheral pixels.

17. The inspection method of claim 13, wherein, The detection of the defective pixel includes determining the preliminary defective pixel as the defective pixel when a value obtained by subtracting a maximum value among central sensing values from an intermediate value among peripheral sensing values is greater than a threshold value, the peripheral sensing values being sensing values of sub-pixels of the peripheral pixels, the central sensing values being sensing values of sub-pixels of the preliminary defective pixel.

18. The inspection method of claim 13, wherein, The detection of the defective line includes determining the line as the defective line when the number of the preliminary defective pixels included in the line is greater than a threshold value.

19. The inspection method of claim 13, wherein, The compensation of the sensing values of the defective line includes replacing the sensing values of the defective line with an average of sensing values of an adjacent line adjacent to the defective line in the first direction. 20.An electronic device comprising: a processor configured to generate image data; a display device according to any one of claims 1 to 12 configured to display an image based on the image data; and a power module connected to the processor and the display device.

Images