Methods for determining test parameters and test system

Abstract

This application relates to the field of product testing technology, and discloses a method and system for determining test parameters. The method includes: obtaining the product identifier of the product under test; in response to the existence of the product identifier, obtaining the change / iteration information corresponding to the product under test, and the test items corresponding to the change / iteration information; obtaining the default test parameters and historical test results corresponding to the test items; adjusting the default test parameters based on the historical test results to obtain the current test parameters; the current test parameters are used to test the product under test, and the product under test only needs to be tested according to the test items. Through the above method, the accuracy of the test plan is increased, thereby improving testing efficiency while ensuring product performance and shortening the entire product iteration cycle.

Description

Technical Field

[0001] This application relates to the field of product testing technology, and in particular to methods for determining test parameters and testing systems. Background Technology

[0002] With the rapid development of the electronics and electrical appliance manufacturing industry and the continuous improvement of people's living standards, the updates and iterations of consumer electronics products are becoming more and more frequent. Most products are iterated on the basis of the original product framework. After the iteration, they are still tested and evaluated according to complete test plans or experience-based test plans. The methods are either time-consuming or lack specificity and are inefficient. Therefore, it is an urgent problem to solve the problem of developing timely and targeted accurate test plans. Summary of the Invention

[0003] The method for determining test parameters and the test system provided in this application can increase the accuracy of the test plan, thereby improving test efficiency and shortening the entire product iteration cycle while ensuring product performance.

[0004] In a first aspect, this application provides a method for determining test parameters, the method comprising: obtaining the product identifier of the current product to be tested; in response to the existence of the product identifier, obtaining the change / iteration information corresponding to the current product to be tested, and the test items corresponding to the change / iteration information; obtaining the default test parameters and historical test results corresponding to the test items; adjusting the default test parameters according to the historical test results to obtain the current test parameters; the current test parameters are used to test the current product to be tested, and the current product to be tested only needs to be tested according to the test items.

[0005] The process of adjusting the default test parameters based on historical test results to obtain the current test parameters includes: obtaining the number of anomalies in the historical test results; determining the adjustment factor based on the number of anomalies; wherein the adjustment factor is positively correlated with the number of anomalies; and adjusting the default test parameters using the adjustment factor to obtain the current test parameters.

[0006] The default test parameters include: test duration, number of tests, and / or vibration frequency; adjustment factors include duration adjustment factor, number adjustment factor, and / or frequency adjustment factor; obtaining the number of anomalies in historical test results, including: obtaining the first number of anomalies related to test duration in historical test results; and / or, obtaining the second number of anomalies related to the number of tests in historical test results; and / or, obtaining the third number of anomalies related to vibration frequency in historical test results; determining adjustment factors based on the number of anomalies, including: determining the duration adjustment factor based on the first number of anomalies; and / or, determining the number adjustment factor based on the second number of anomalies; and / or, determining the frequency adjustment factor based on the third number of anomalies; adjusting the default test parameters using the adjustment factors to obtain the current test parameters, including: adjusting the test duration using the duration adjustment factor to obtain the test duration in the current test parameters; and / or, adjusting the number of tests using the number adjustment factor to obtain the number of tests in the current test parameters; and / or, adjusting the vibration frequency using the frequency adjustment factor to obtain the vibration frequency in the current test parameters.

[0007] The test duration includes at least two time periods. The duration adjustment factor is determined based on the first number of anomalies, including: when the first number of anomalies is greater than or equal to 1, obtaining the target time period in which each anomaly occurs within the first number of anomalies; wherein the target time period is one of the at least two time periods; obtaining the first weight corresponding to the target time period; obtaining the first adjustment factor corresponding to each anomaly based on the first weight corresponding to the target time period; obtaining the duration adjustment factor based on the first adjustment factor corresponding to each anomaly; or, when the first number of anomalies is equal to 0, determining the duration adjustment factor based on the historical number of tests.

[0008] The test quantity includes at least two quantity ranges. The quantity adjustment factor is determined based on the second number of anomalies, including: when the second number of anomalies is greater than or equal to 1, obtaining the target quantity range in which each anomaly occurs in the second number of anomalies; wherein the target quantity range is one of the at least two quantity ranges; obtaining the second weight corresponding to the target quantity range; obtaining the second adjustment factor corresponding to each anomaly based on the second weight corresponding to the target quantity range; and obtaining the quantity adjustment factor based on the second adjustment factor corresponding to each anomaly.

[0009] The test frequency includes at least two frequency bands. The frequency adjustment factor is determined based on the number of third anomalies, including: when the number of third anomalies is greater than or equal to 1, obtaining the target frequency band at the time of each anomaly in the third number of anomalies; wherein the target frequency band is one of the at least two frequency bands; obtaining the third weight corresponding to the target frequency band; obtaining the third adjustment factor corresponding to each anomaly based on the third weight corresponding to the target frequency band; obtaining the frequency adjustment factor based on the third adjustment factor corresponding to each anomaly; or, when the number of third anomalies is equal to 0, determining the frequency adjustment factor based on the number of historical tests.

[0010] The method also includes: obtaining the current material information of the product under test based on the product identifier; in response to the fact that the current material information is different from the material information of the previous test product with the same product identifier, it is recommended to enable a data acquisition instrument and / or oscilloscope to collect data from the module corresponding to the current material information during the test.

[0011] The method further includes: after obtaining the current test parameters, displaying the current test parameters on the display interface; and, in response to a confirmation operation on the current test parameters, or in response to a confirmation operation after adjusting the current test parameters, testing the current product to be tested using the current test parameters.

[0012] Secondly, this application provides a testing system, which includes: at least one testing device; a terminal control device, communicatively connected to each testing device, for receiving test parameters and test results sent by each testing device, and for determining test parameters for the current product under test using the method provided in the first aspect.

[0013] The testing equipment includes at least one of the following: constant temperature and humidity chamber, HAST chamber, thermal shock chamber, high temperature chamber, low temperature chamber, vibration table, data acquisition instrument, and oscilloscope.

[0014] The beneficial effects of the embodiments of this application are as follows: Unlike the prior art, the method and system for determining test parameters provided in this application obtain the product identifier of the product under test before testing it; in response to the existence of the product identifier, obtain the change / iteration information corresponding to the product under test, and the test items corresponding to the change / iteration information; obtain the default test parameters and historical test results corresponding to the test items; adjust the default test parameters according to the historical test results to obtain the current test parameters; the current test parameters are used to test the product under test, so that the test parameters can be dynamically adjusted in conjunction with the historical test results corresponding to products with the same product identifier. Changing the test parameters will not change the problem, thereby increasing the accuracy of the test plan, and thus improving test efficiency while ensuring product performance, shortening the entire product iteration cycle. Furthermore, when the product under test is a changed / iterated product, its corresponding test items are determined according to its change / iteration information. Only these test items need to be tested on the product under test, without testing other test items, thereby improving test efficiency while ensuring product performance and shortening the entire product iteration cycle. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. Wherein:

[0016] Figure 1 This is a flowchart illustrating an embodiment of the method for determining test parameters provided in this application;

[0017] Figure 2 This is a flowchart illustrating another embodiment of the method for determining test parameters provided in this application;

[0018] Figure 3 This is a flowchart illustrating an embodiment of step 32 provided in this application;

[0019] Figure 4 This is a flowchart illustrating an embodiment of step 42 provided in this application;

[0020] Figure 5 This is a flowchart illustrating an embodiment of step 52 provided in this application;

[0021] Figure 6 This is a flowchart illustrating another embodiment of the method for determining test parameters provided in this application;

[0022] Figure 7This is a schematic diagram of the structure of an embodiment of the testing system provided in this application;

[0023] Figure 8 This is a schematic diagram of another embodiment of the testing system provided in this application. Detailed Implementation

[0024] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. It is understood that the specific embodiments described herein are only for explaining this application and not for limiting it. Furthermore, it should be noted that, for ease of description, only the parts related to this application are shown in the accompanying drawings, not all structures. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.

[0025] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0026] With the rapid development of the electronics and electrical appliance manufacturing industry and the continuous improvement of people's living standards, the updates and iterations of consumer electronics products are becoming more and more frequent. Most products are iterated on the basis of the original product framework. After the iteration, they are still tested and evaluated according to complete test plans or experience-based test plans. The methods are either time-consuming or lack specificity and are inefficient. Therefore, it is an urgent problem to solve the problem of developing timely and targeted accurate test plans.

[0027] Most existing iterative products are based on the framework of the original products (such as the T113 embedded processor platform), including derivative models, material support, and hardware function upgrades. Derivative models differ from the original products in brand logo and materials, such as the silkscreen printing on the exterior and PCBA materials (the types of components are basically the same, but the manufacturers and material precision vary). Material support mainly occurs when the existing component manufacturers' quantities are insufficient or the quality of existing materials is substandard, requiring other manufacturers to provide materials to complete normal production. These supplementary materials need to be tested on both the components and the entire device before being used. Hardware function upgrades include adding dustproof and waterproof requirements, and adding temperature and humidity functions. Adding dustproof and waterproof functions requires the exterior materials to have a sealed structure, and the internal parts of through-holes such as microphone holes and speaker holes must have waterproof and dustproof measures to meet the requirements. Adding temperature and humidity functions requires the installation of temperature and humidity sensors, necessitating testing not only on the reliability of the materials but also on the overall stability of the device.

[0028] The testing requirements for iterative products are highly correlated with the iteration content. For example, in derivative models where more than 50% of the materials are replaced, all test items need to be tested (e.g., all screen-related reliability tests are required). Similarly, for auxiliary materials, all test items related to the functionality of these materials need to be tested (e.g., all screen-related reliability tests are required). And for hardware upgrades, all test items related to the newly added features need to be tested.

[0029] However, testing all test items in every iteration is a waste of resources and time, and prolongs the time to market for iterated products. Targeted, efficient and effective testing is needed.

[0030] Based on this, the test parameter determination method and test system provided in this application obtain the product identifier of the product under test before testing it; in response to the existence of the product identifier, obtain the change / iteration information corresponding to the product under test, and the test items corresponding to the change / iteration information; obtain the default test parameters and historical test results corresponding to the test items; adjust the default test parameters according to the historical test results to obtain the current test parameters; the current test parameters are used to test the product under test, so that the test parameters can be dynamically adjusted in combination with the historical test results corresponding to products with the same product identifier, and changing the test parameters will not change the problem, thereby increasing the accuracy of the test plan, and thus improving test efficiency while ensuring product performance and shortening the entire product iteration cycle. See any of the following embodiments for specific technical solutions.

[0031] See Figure 1 , Figure 1 This is a flowchart illustrating an embodiment of the method for determining test parameters provided in this application. The method includes:

[0032] Step 11: Obtain the product identifier of the product to be tested.

[0033] In some embodiments, the product identifier may be a product code, such as a production batch number.

[0034] In some embodiments, product identifiers can be used to indicate the type of product, such as Class A products, Class B products, etc. Different types of products may use different or the same testing equipment. The testing equipment also has specific testing parameters tailored to different types of products.

[0035] In some embodiments, the product to be tested mentioned in this application is an electronic product, such as a control circuit board of an electronic device, the entire electronic device, or some modules of an electronic device.

[0036] Step 12: In response to the existence of a product identifier, obtain the change / iteration information corresponding to the product to be tested, as well as the test items corresponding to the change / iteration information.

[0037] In some embodiments, if a product identifier already exists, it means that a product with the same identifier has already been tested. Based on this, for the product under test, its corresponding material information or change comparison document can be obtained, and the change / iteration information corresponding to the product under test can be obtained from the material information or change comparison document. If change / iteration information exists, the changed components or materials may have new effects on the product; therefore, corresponding tests need to be performed again. For example, if the product under test replaces key functional components, such as the main control chip, optoelectronic display module, and safety and compliance devices, such as safety capacitors and fuses, reliability testing is required; changes / iterations to solder, conformal coating, process, structural components, and packaging require vibration testing; if power devices, such as IPM (Intelligent Power Module), IGBT (Insulated-Gate Bipolar Transistor), MOSFET (Metal Oxide Semiconductor Field Effect Transistor), and the main control chip are replaced, temperature rise testing is required.

[0038] In one application scenario, before the product to be tested is sent for testing, multiple parties participate in a review meeting to discuss the specific changes, test items, and timelines, and generate corresponding before-and-after comparison documents. Based on the changes, relevant test items are output.

[0039] In some embodiments, if a product identifier does not exist, the default test parameters are used for testing, and corresponding content is created for the product identifier so that adjustments can be made during subsequent product testing of that product identifier.

[0040] Step 13: Obtain the default test parameters and historical test results corresponding to the test item.

[0041] In some embodiments, if a product identifier already exists, it means that a product with the same product identifier has already been tested, and historical test results will be recorded for these tested products.

[0042] Default test parameters refer to the preset test parameters used by the testing equipment when testing these products. For example, default test parameters may include a default test duration. A default test duration indicates that the product must be tested for the default duration before the test can be completed. In some embodiments, default test parameters may also refer to the standard test parameters used by the testing equipment when testing these products.

[0043] Step 14: Adjust the default test parameters based on the historical test results to obtain the current test parameters; the current test parameters are used to test the current product to be tested.

[0044] In some embodiments, the product to be tested only needs to be tested according to the test items.

[0045] In some embodiments, if no anomalies are found in the historical test results, it indicates that the default test parameters can be appropriately reduced. If anomalies are found in the historical test results, it indicates that the default test parameters can be appropriately increased.

[0046] Based on this, the default test parameters are adjusted according to the historical test results to obtain the current test parameters; the current test parameters are used to test the current product to be tested.

[0047] In other embodiments, the need to test the current product under test using all test items can be determined based on the proportion of the changes / iterations corresponding to the changes in the total number of changeable information items in the current product under test. For example, a percentage threshold can be set; if the proportion is greater than the threshold, it is determined that the current product under test needs to be tested using all test items. When testing using all test items, steps 13 to 14 described above can still be used. If the proportion is less than or equal to the percentage threshold, the test items corresponding to the changes / iterations are obtained.

[0048] In this embodiment, before testing the current product under test, the product identifier of the current product under test is obtained; in response to the existence of the product identifier, the change / iteration information corresponding to the current product under test and the test items corresponding to the change / iteration information are obtained; the default test parameters and historical test results corresponding to the test items are obtained; the default test parameters are adjusted according to the historical test results to obtain the current test parameters; the current test parameters are used to test the current product under test, so that the test parameters can be dynamically adjusted in combination with the historical test results corresponding to products with the same product identifier. Changing the test parameters will not change the problem, thereby increasing the accuracy of the test plan, thereby improving test efficiency while ensuring product performance, shortening the iteration cycle of the entire product, and when the current product under test is a changed / iterated product, its corresponding test items are determined according to its change / iteration information. Only these test items need to be tested on the current product under test, without testing other test items, thereby improving test efficiency while ensuring product performance and shortening the iteration cycle of the entire product.

[0049] See Figure 2 , Figure 2 This is a flowchart illustrating another embodiment of the method for determining test parameters provided in this application. The method includes:

[0050] Step 21: Obtain the product identifier of the product to be tested.

[0051] Step 22: In response to the existence of a product identifier, obtain the change / iteration information corresponding to the product to be tested, as well as the test items corresponding to the change / iteration information.

[0052] Step 23: Obtain the default test parameters and historical test results corresponding to the test item.

[0053] In some embodiments, steps 21 to 23 have the same or similar technical solutions as the other embodiments of this application, and will not be described in detail here.

[0054] Step 24: Obtain the number of anomalies in the historical test results.

[0055] In some embodiments, test anomalies can be recorded during the testing process, and the number of anomalies can be obtained from historical test results.

[0056] Step 25: Determine the adjustment factor based on the number of anomalies; where the adjustment factor is positively correlated with the number of anomalies.

[0057] In some embodiments, the higher the number of anomalies, the higher the value of the adjustment factor. Conversely, the lower the number of anomalies, the lower the value of the adjustment factor.

[0058] Step 26: Adjust the default test parameters using the adjustment factor to obtain the current test parameters; the current test parameters are used to test the current product to be tested.

[0059] In some embodiments, the current test parameters are obtained by multiplying the adjustment factor by the default test parameters.

[0060] In some embodiments, default test parameters include: default test duration, default number of tests, and / or default vibration frequency. The default test duration represents the total testing time for the product under test using the testing equipment. The default number of tests represents the total number of products under test that the testing equipment can test in a single run. The default vibration frequency represents the range of vibration frequencies used when performing vibration testing on the product under test.

[0061] The adjustment factors include duration adjustment factors, quantity adjustment factors, and / or frequency adjustment factors. The duration adjustment factor adjusts the default test duration. The quantity adjustment factor adjusts the default test quantity. The frequency adjustment factor adjusts the default vibration frequency.

[0062] Taking the default test parameters as the test duration as an example, steps 24 to 26 above can correspond to the following process:

[0063] Step 31: Obtain the first number of anomalies related to the default test duration in the historical test results.

[0064] Step 32: Determine the duration adjustment factor based on the number of first anomalies.

[0065] In some embodiments, the testing duration for the product includes at least two time periods. See also Figure 3 Step 32 can be the following process:

[0066] Step 321: When the first number of anomalies is greater than or equal to 1, obtain the target time period in which each anomaly occurs in the first number of anomalies; wherein, the target time period is one of at least two time periods.

[0067] Since the test duration includes at least two time periods, anomalies can occur in any of these two time periods. Because this application assigns a weight to each time period, it is necessary to clearly define the target time period in which each anomaly occurs to facilitate the execution of subsequent step 322.

[0068] Step 322: Obtain the first weight corresponding to the target time period.

[0069] In some embodiments, the test duration includes at least two time periods. The earlier the time period in which the anomaly occurs, the more prominent and obvious the product's anomaly is, and the higher the weight of that earlier time period. For example, the test duration includes a first time period and a second time period consecutively. The weight of the first time period is set to 0.6, and the weight of the second time period is set to 0.4. Alternatively, the test duration includes a first time period, a second time period, a third time period, and a fourth time period consecutively. The weight of the first time period is set to 0.3, the weight of the second time period is set to 0.3, the weight of the third time period is set to 0.2, and the weight of the fourth time period is set to 0.2.

[0070] Based on this, once the target time period is determined, the first weight corresponding to the target time period can be obtained.

[0071] Step 323: Based on the first weight corresponding to the target time period, obtain the first adjustment factor corresponding to each anomaly.

[0072] In some embodiments, the first adjustment factor for each anomaly can be obtained by multiplying the first weight by the time influence factor and then adding 1. For example, if two anomalies are A and B, and the first weight for A is A1 and the first weight for B is A2, then the first adjustment factor for A is 1 + A1. The first adjustment factor corresponding to T.B is 1+A2 T. T represents the time-related factor.

[0073] Step 324: Obtain the duration adjustment factor based on the first adjustment factor corresponding to each anomaly.

[0074] In some embodiments, after obtaining the first adjustment factor corresponding to each anomaly, these first adjustment factors are multiplied to obtain the duration adjustment factor.

[0075] For example, the first adjustment factor corresponding to A above is 1+A1 The first adjustment factor corresponding to T.B is 1+A2 T, then the duration adjustment factor is equal to (1+A1) T) (1+A2) T).

[0076] In some embodiments, when the first number of anomalies is 0, the duration adjustment factor is determined based on the historical test count. In some embodiments, when the first number of anomalies is 0, the historical test count can be counted, and the duration adjustment factor can be obtained by multiplying the historical test count by the duration influence factor. If the duration adjustment factor is greater than a preset value, the duration adjustment factor is multiplied by the default test duration to obtain the test duration in the current test parameters. If the duration adjustment factor is less than or equal to the preset value, the preset value is multiplied by the default test duration to obtain the test duration in the current test parameters. That is, even if the test duration can be shortened, it is necessary to ensure that the test duration meets the minimum test duration requirement before the test can be considered to meet the requirements.

[0077] In one application scenario, let's take a test duration that includes a first time period and a second time period, where the second time period follows the first time period, and the first anomaly count is 1, as an example:

[0078] If the first anomaly count is 1, then the target time period in which this anomaly occurred is obtained. At this point, the target time period corresponds to the first time period. The first weight corresponding to the first time period is obtained. This first weight is multiplied by the time influence factor and then increased by 1 to obtain the first adjustment factor corresponding to this anomaly. Since the anomaly count is 1, the first adjustment factor can be directly used as the duration adjustment factor.

[0079] In one application scenario, let's take a test that includes four consecutive time periods: a first time period, a second time period, a third time period, and a fourth time period. The first exception count is 4, as an example:

[0080] If the number of anomalies is 4, then the target time periods for each of these 4 anomalies are obtained. For example, if all 4 target time periods correspond to the first time period, then the first weight corresponding to the first time period is obtained. This first weight is multiplied by the time influence factor and then increased by 1 to obtain the first adjustment factor corresponding to that anomaly. Since the number of anomalies is 4, the first adjustment factor is raised to the power of 4 to obtain the duration adjustment factor.

[0081] For example, if these four target time periods correspond to two first time periods and two second time periods, then obtain the first weight corresponding to the first time period. Multiply this first weight by the time influence factor and add 1 to obtain the first adjustment factor corresponding to that first time period. Obtain the first weight corresponding to the second time period. Multiply this first weight by the time influence factor and add 1 to obtain the first adjustment factor corresponding to that second time period. Since these four target time periods correspond to two first time periods and two second time periods, raise the first adjustment factor corresponding to the first time period to the power of 2, raise the first adjustment factor corresponding to the second time period to the power of 2, and then sum them to obtain the duration adjustment factor.

[0082] Based on this, the first adjustment factor corresponding to each anomaly can be calculated, and then the first adjustment factors corresponding to all anomalies can be multiplied together to obtain the duration adjustment factor.

[0083] Step 33: Adjust the default test duration using the duration adjustment factor to obtain the test duration in the current test parameters.

[0084] In some embodiments, the test duration in the current test parameters can be obtained by multiplying the duration adjustment factor by the default test duration.

[0085] Since anomalies need to be logged for each test, the test duration in the current test parameters can be divided into time segments in the same way, making it easier to record the time segment corresponding to the anomaly when one occurs. The test duration can be divided into time segments equally or according to a preset ratio. For example, the test duration can be divided according to the weight corresponding to each time segment.

[0086] Taking the default test parameter as the number of tests as an example, steps 24 to 26 above can correspond to the following process:

[0087] Step 41: Obtain the number of second anomalies related to the number of tests in the historical test results.

[0088] Step 42: Determine the quantity adjustment factor based on the number of the second anomaly.

[0089] In some embodiments, the number of tests performed on the product includes at least two quantity ranges. See also Figure 4 Step 42 can be the following process:

[0090] Step 421: When the second number of anomalies is greater than or equal to 1, obtain the target number segment where each anomaly occurs in the second number of anomalies; wherein, the target number segment is one of at least two number segments.

[0091] Since the test quantity includes at least two quantity ranges, anomalies can occur in any of these two ranges. Because each quantity range has a corresponding weight assigned in this application, it is necessary to clearly define the target quantity range in which each anomaly occurs to facilitate the execution of subsequent step 422.

[0092] Step 422: Obtain the second weight corresponding to the target quantity range.

[0093] In some embodiments, the number of tests includes at least two ranges. The earlier the range in which anomalies occur, the fewer the number of anomalies in the product, and the higher the weight of the earlier range, allowing for a larger value to be added to the test quantity later. For example, the number of tests includes a first and a second consecutive range. The weight for the first range is 0.6, and the weight for the second range is 0.4. Alternatively, the number of tests includes a first, second, third, and fourth consecutive range. The weights for the first, second, third, and fourth ranges are 0.3, 0.3, 0.2, and 0.2 respectively.

[0094] Based on this, once the target quantity range is determined, the second weight corresponding to the target quantity range can be obtained.

[0095] Step 423: Based on the second weight corresponding to the target quantity range, obtain the second adjustment factor corresponding to each anomaly.

[0096] In some embodiments, the second adjustment factor for each anomaly can be obtained by multiplying the second weight by the quantity influence factor and then adding 1. For example, if two anomalies are C and D, and the second weight for C is C1 and the second weight for D is C2, then the second adjustment factor for C is 1 + C1. The second adjustment factor corresponding to S.D is 1+C2 S. S represents the quantity influence factor.

[0097] Step 424: Obtain the quantity adjustment factor based on the second adjustment factor corresponding to each anomaly.

[0098] In some embodiments, after obtaining the second adjustment factor corresponding to each anomaly, these second adjustment factors are multiplied to obtain the quantity adjustment factor.

[0099] For example, the second adjustment factor corresponding to C above is 1+C1. The second adjustment factor corresponding to S.D is 1+C2 S, then the quantity adjustment factor equals (1+C1) S) (1+C2) S).

[0100] In some embodiments, if there are no anomalies (the second anomaly count equals 0), then the number of tests does not need to be adjusted. In other words, the number of tests can remain unchanged.

[0101] In one application scenario, let's take the example where the number of tests includes a first and a second consecutive number of tests, with the second number of tests following the first number of tests, and the first anomaly count is 1:

[0102] If the first anomaly count is 1, then the target quantity range at the time of this anomaly is obtained. At this point, the target quantity range corresponds to the first quantity range. The second weight corresponding to the first quantity range is obtained. This second weight is multiplied by the quantity influence factor and then increased by 1 to obtain the second adjustment factor corresponding to this anomaly. Since the anomaly count is 1, the second adjustment factor can be directly used as the quantity adjustment factor.

[0103] In one application scenario, let's take a test scenario where the number of tests includes four consecutive intervals: a first interval, a second interval, a third interval, and a fourth interval. The first exception count is 4.

[0104] If the number of anomalies is 4, then the target quantity range for each of these 4 anomalies is obtained. For example, if all 4 target quantity ranges correspond to the first quantity range, then the second weight corresponding to the first quantity range is obtained. This second weight is multiplied by the quantity influence factor and then increased by 1 to obtain the second adjustment factor corresponding to that anomaly. Since the number of anomalies is 4, the second adjustment factor is raised to the power of 4 to obtain the quantity adjustment factor.

[0105] For example, if these four target quantity segments correspond to two first quantity segments and two second quantity segments, then obtain the second weight corresponding to the first quantity segment. Multiply this second weight by the quantity influence factor and add 1 to obtain the second adjustment factor corresponding to the first quantity segment. Then obtain the second weight corresponding to the second quantity segment. Multiply this second weight by the quantity influence factor and add 1 to obtain the second adjustment factor corresponding to the second quantity segment. Since these four target quantity segments correspond to two first quantity segments and two second quantity segments, raise the second adjustment factor corresponding to the first quantity segment to the power of 2, raise the second adjustment factor corresponding to the second quantity segment to the power of 2, and then sum them to obtain the quantity adjustment factor.

[0106] Based on this, a second adjustment factor can be calculated for each anomaly, and then the second adjustment factors corresponding to all anomalies can be multiplied together to obtain the quantity adjustment factor.

[0107] Step 43: Adjust the number of tests using the quantity adjustment factor to obtain the number of tests in the current test parameters.

[0108] In some embodiments, the number of tests in the current test parameters can be obtained by multiplying the quantity adjustment factor by the default number of tests.

[0109] Since anomalies need to be logged for each test, the number of tests in the current test parameters can be divided into time segments in the same way, making it easier to record the corresponding time segment when an anomaly occurs. The test quantity can be divided into time segments equally or according to a preset ratio. For example, the test quantity can be divided according to the weight corresponding to each time segment.

[0110] Taking the vibration frequency as the default test parameter as an example, steps 24 to 26 above can correspond to the following process:

[0111] Step 51: Obtain the number of third anomalies related to vibration frequency in the historical test results.

[0112] Step 52: Determine the frequency adjustment factor based on the number of the third anomaly.

[0113] In some embodiments, the test frequency includes at least two frequency bands. See also Figure 5 Step 52 can be the following process:

[0114] Step 521: When the third abnormality count is greater than or equal to 1, obtain the target frequency band where each abnormality occurs in the third abnormality count; wherein, the target frequency band is one of at least two frequency bands.

[0115] Since the test frequency includes at least two frequency bands, anomalies can occur in any of these two frequency bands. Because each frequency band has a corresponding weight assigned in this application, it is necessary to determine the target frequency band in which each anomaly occurs to facilitate the execution of subsequent step 522.

[0116] Step 522: Obtain the third weight corresponding to the target frequency band.

[0117] In some embodiments, the test frequency includes at least two frequency bands. For example, the test frequency includes a first frequency band and a second frequency band consecutively. The weight assigned to the first frequency band is 0.4, and the weight assigned to the second frequency band is 0.6. Alternatively, the test frequency includes a first frequency band, a second frequency band, a third frequency band, and a fourth frequency band consecutively. The weight assigned to the first frequency band is 0.2, the weight assigned to the second frequency band is 0.2, the weight assigned to the third frequency band is 0.3, and the weight assigned to the fourth frequency band is 0.3.

[0118] Based on this, once the target frequency band is determined, the third weight corresponding to the target frequency band can be obtained.

[0119] Step 523: Based on the third weight corresponding to the target frequency band, obtain the third adjustment factor corresponding to each anomaly.

[0120] In some embodiments, the third adjustment factor for each anomaly can be obtained by multiplying the third weight by the frequency influence factor and then adding 1. For example, if two anomalies are E and F, and the third weight for E is E1 and the third weight for F is E2, then the third adjustment factor for E is 1 + E1. The third adjustment factor corresponding to P.F is 1+E2 P. P represents the frequency influence factor.

[0121] Step 524: Obtain the frequency adjustment factor based on the third adjustment factor corresponding to each anomaly.

[0122] In some embodiments, after obtaining the third adjustment factor corresponding to each anomaly, these third adjustment factors are multiplied to obtain the frequency adjustment factor.

[0123] For example, the third adjustment factor corresponding to E above is 1+E1. The third adjustment factor corresponding to P.F is 1+E2 P, then the frequency adjustment factor is equal to (1+E1) P) (1+E2) P).

[0124] In some embodiments, when the number of third anomalies is equal to 0, a frequency adjustment factor is determined based on the number of historical tests. This frequency adjustment factor is used to increase the minimum frequency in the test frequency, which helps to reduce the overall test duration.

[0125] In one application scenario, let's take a test frequency consisting of a continuous first frequency segment and a second frequency segment, where the second frequency segment follows the first frequency segment, and the first anomaly count is 1 as an example:

[0126] If the first anomaly count is 1, then the target frequency band at the time of this anomaly is obtained. In this case, the target frequency band corresponds to the first frequency band. The third weight corresponding to the first frequency band is then obtained. This third weight is multiplied by the frequency influence factor and then increased by 1 to obtain the third adjustment factor corresponding to this anomaly. Since the anomaly count is 1, the third adjustment factor can be directly used as the frequency adjustment factor.

[0127] In one application scenario, the test frequency includes consecutive first, second, third, and fourth frequency bands. The example given is that the first anomaly count is 4.

[0128] If the number of anomalies is 4, then the target frequency bands at which these 4 anomalies occurred are obtained. For example, if all 4 target frequency bands correspond to the first frequency band, then the third weight corresponding to the first frequency band is obtained. This third weight is multiplied by the frequency influence factor and then increased by 1 to obtain the third adjustment factor corresponding to that anomaly. Since the number of anomalies is 4, the third adjustment factor is raised to the power of 4 to obtain the frequency adjustment factor.

[0129] For example, if these four target time periods correspond to two first frequency bands and two second frequency bands, then the third weight corresponding to the first frequency band is obtained. This third weight is multiplied by the frequency influence factor and then increased by 1 to obtain the third adjustment factor corresponding to that first frequency band. The third weight corresponding to the second frequency band is then obtained. This third weight is multiplied by the frequency influence factor and then increased by 1 to obtain the third adjustment factor corresponding to that second frequency band. Since these four target frequency bands correspond to two first frequency bands and two second frequency bands, the third adjustment factor corresponding to the first frequency band is raised to the power of 2, and the third adjustment factor corresponding to the second frequency band is raised to the power of 2, and then summed to obtain the frequency adjustment factor.

[0130] Based on this, the third adjustment factor corresponding to each anomaly can be calculated, and then the third adjustment factors corresponding to all anomalies can be multiplied together to obtain the frequency adjustment factor.

[0131] Step 53: Adjust the vibration frequency using the frequency adjustment factor to obtain the vibration frequency in the current test parameters.

[0132] In some embodiments, the maximum frequency value of the test frequency in the current test parameters can be obtained by multiplying the frequency adjustment factor by the maximum frequency value in the default test frequency.

[0133] Since anomalies need to be recorded for each test, the test frequency in the current test parameters can be divided into frequency segments in the same way, making it easier to record the frequency segment corresponding to the anomaly when one occurs. The test frequency can be divided into segments equally or according to a preset ratio. For example, the test frequency can be divided according to the weight corresponding to each frequency segment.

[0134] In some embodiments, the test parameters of test equipment with different testing functions are different. For example, the main test parameters of test equipment used for vibration testing are test time, vibration frequency, and number of tests. For example, the main test parameters of test equipment used for constant temperature and humidity testing are test time and number of tests.

[0135] See Figure 6 , Figure 6 This is a flowchart illustrating another embodiment of the method for determining test parameters provided in this application. The method includes:

[0136] Step 601: Obtain the current material information of the product to be tested based on the product identifier.

[0137] Step 602: In response to the fact that the current material information is different from the material information of the previous test product with the same product identifier, it is recommended to enable the data acquisition instrument and / or oscilloscope to acquire data from the module corresponding to the current material information during the test.

[0138] Because the current material information differs from that of the previous test product with the same product identifier, it is impossible to know whether the module corresponding to the new material will have any anomalies. Therefore, it is recommended to use a data acquisition device and / or oscilloscope to collect data from the module corresponding to the current material information during the testing process to facilitate testing of that module. For example, an oscilloscope can collect information such as voltage for overvoltage or undervoltage detection.

[0139] In some embodiments, if the current material information is identical to the material information of the previous test product with the same product identifier, and the test items corresponding to this material information are normal, it is not recommended to use a data acquisition device and / or oscilloscope to acquire data from the module corresponding to the current material information during the test. Since the current material information is identical to the material information of the previous test product with the same product identifier, and the test items corresponding to this material information are normal, it can be assumed that the module corresponding to this material information is normal. Therefore, it is not necessary to use a data acquisition device and / or oscilloscope to acquire data from the module corresponding to the current material information, thereby reducing test time.

[0140] In some embodiments, after obtaining the current test parameters, the current test parameters are displayed on the display interface; in response to a confirmation operation of the current test parameters, or in response to a confirmation operation after adjusting the current test parameters, the current test parameters are used to test the current product under test. That is, after determining the current test parameters, the user can manually determine whether these parameters are reasonable, adjust unreasonable test parameters, and then confirm these test parameters before sending them to the corresponding testing equipment to test the current product under test using the current test parameters.

[0141] See Figure 7 , Figure 7 This is a schematic diagram of an embodiment of the testing system provided in this application. The testing system 100 includes: a terminal control device 80 and at least one testing device 70. The terminal control device 80 is communicatively connected to each testing device 70, and is used to receive test parameters and test results sent by each testing device 70, and to determine the test parameters for the current product under test using the method provided in any of the above embodiments.

[0142] In some embodiments, the test equipment 70 includes at least one of the following: a constant temperature and humidity chamber, a HAST (Highly Accelerated Stress Test) chamber, a thermal shock chamber, a high temperature chamber, a low temperature chamber, a vibration table, a data acquisition instrument, and an oscilloscope.

[0143] In some embodiments, when the test equipment 70 is a constant temperature and humidity chamber, the terminal control device 80 uses the method provided in any of the above embodiments to determine the test parameters of the constant temperature and humidity chamber for the current product to be tested. For example, the main test parameters that need to be set for the constant temperature and humidity chamber are the test duration and the number of tests.

[0144] In some embodiments, when the test device 70 is a HAST box, the terminal control device 80 uses the method provided in any of the above embodiments to determine the test parameters of the HAST box for the current product to be tested. For example, the main test parameters that need to be set for the HAST box are the test duration and the number of tests.

[0145] In some embodiments, when the test equipment 70 is a thermal shock chamber, the terminal control device 80 uses the method provided in any of the above embodiments to determine the test parameters of the thermal shock chamber for the current product to be tested. For example, the main test parameters that need to be set for the thermal shock chamber are the test duration and the number of tests.

[0146] In some embodiments, when the testing equipment 70 is a high-temperature chamber, the terminal control device 80 uses the method provided in any of the above embodiments to determine the test parameters of the high-temperature chamber for the current product to be tested. For example, the main test parameters that need to be set for the high-temperature chamber are the test duration and the number of tests.

[0147] In some embodiments, when the testing equipment 70 is a cryogenic chamber, the terminal control device 80 uses the method provided in any of the above embodiments to determine the test parameters of the cryogenic chamber for the current product to be tested. For example, the main test parameters that need to be set for the cryogenic chamber are the test duration and the number of tests.

[0148] In some embodiments, when the test device 70 is a vibration table, the terminal control device 80 uses the method provided in any of the above embodiments to determine the test parameters of the vibration table for the current product under test. For example, the main test parameters that need to be set for the vibration table are the test duration and the vibration frequency.

[0149] In some embodiments, examples illustrate how different test devices 70 adjust their test parameters.

[0150] Regarding the test duration, for example, if a dual 85 test involves 10 wired controllers for 500 hours, the 500 hours is divided into four segments: 1: 1~125h, 2: 125~250h, 3: 250~375h, and 4: 375~500h. If a wired controller malfunctions in segment 1, the time adjustment factor is increased by 10%. The impact of 3 / 10 means that the next recommended time fit (test duration) will be 500. The test time is (1+3%)h.

[0151] Regarding the number of tests, for example, if 10 wired controllers are tested for 500 hours using the dual 85 method, the quantity of 10 is divided into 4 segments: 1: 1~3, 2: 4~5, 3: 6~7, 4: 8~10. If any wired controllers within segment 2 fail after 500 hours of testing, the quantity adjustment factor is increased by 10%. The impact of 3 / 10 means that the number of recommendations fitted in the next round is 500. The number of tests is (1+3%) (the number of tests cannot be reduced).

[0152] For vibration frequencies, if the overall machine evaluation involves random vibration in three directions (x, y, z) from 10 to 55 Hz, the frequency is divided into four bands: 1: 10~22 Hz, 2: 23~33 Hz, 3: 34~44 Hz, and 4: 45~55 Hz. If a fault occurs in band 3, the frequency adjustment factor is increased by 10%. The impact of 3 / 4 means that the time fitting amount for the next recommendation is 10~(55). (1+7.5%) test frequency, etc.

[0153] In some embodiments, see Figure 8 The testing system 100 includes a constant temperature and humidity chamber 71, a HAST chamber 72, a thermal shock chamber 73, a high temperature chamber 74, a low temperature chamber 75, a vibration table 76, a data acquisition instrument 78, an oscilloscope 77, and a terminal control device 80.

[0154] Users can scan the product identifier of the product to be tested into the terminal control device 80. If the product identifier exists in the terminal control device 80, the test parameters corresponding to the constant temperature and humidity chamber 71, HAST chamber 72, thermal shock chamber 73, high temperature chamber 74, low temperature chamber 75, and vibration table 76 can be determined according to the method provided in any of the above embodiments, and sent to the corresponding devices. Furthermore, based on the material information in the product to be tested, the user can decide whether to activate the data acquisition instrument 78 and / or oscilloscope 77 to acquire data from the module corresponding to the current material information. That is, the terminal control device 80 can determine the current test parameters of each test device 70 according to the type of each test device 70 and its corresponding historical test results and historical test parameters, according to the method provided in any of the above embodiments.

[0155] In one application scenario, all testing equipment 70 is equipped with monitoring devices and connected to the terminal control device 80, enabling SCADA (Supervisory Control And Data Acquisition) connectivity. Test parameters and results from the testing equipment 70 can be transmitted back to the terminal control device 80. For example, the testing equipment 70 may include a constant temperature and humidity chamber 71, a HAST chamber 72, a thermal shock chamber 73, a high-temperature chamber 74, a low-temperature chamber 75, a vibration table 76, a data acquisition instrument 78, an oscilloscope 77, and other equipment. These devices can monitor and determine whether the test samples are abnormal according to the system program, and transmit the collected data back to the terminal control device 80 at set intervals, providing data support for data dissemination.

[0156] Based on this, the terminal control device 80 can automatically determine and push test parameters. Specifically:

[0157] When testing new products (products to be tested), the product code (product identifier) ​​is entered. The testing equipment 70 automatically records the test parameters used and any abnormalities of the samples during the test. For example, if 10 prototypes (products to be tested) are powered on and run under dual 85 testing for a total of 500 hours, and one prototype's screen goes out in the 20th hour, the abnormality is recorded; otherwise, data is recorded at fixed intervals. If another prototype experiences screen distortion in the 40th hour, and no other abnormalities occur by the end of the test, the product malfunction becomes apparent as the test time increases, indicating that test time is a major factor that cannot be ignored and should be given serious consideration. When performing the same test on a similar product for the second time, the product code is entered, and the testing equipment 70 automatically pops up and pushes suggested test parameters based on the first test parameters and the product abnormality parameters. At this time, combined with the results of the first test, each parameter is processed. The impact factor of test abnormalities is increased by 20% (10% for each abnormality); the impact factor of no abnormality is reduced by 10%, and so on. After calculation, the test plan is pushed. For the nth time performing this test on a similar product, enter the product code. Test equipment 70 will automatically display suggested test parameters based on previous test parameters and abnormal product parameters. Then, combining the results of the previous n-1 tests, process each parameter. For factors affecting test anomalies, add 10% (this 10% is divided into 4 segments for specific applications); for factors without anomalies, reduce the impact by 10%. The added impact must be implemented according to the test plan; test conditions cannot be omitted or reduced. The reduced impact is calculated by lowering the test conditions of relevant factors according to the reduction percentage, and so on. After calculation, the test plan is then pushed out.

[0158] In summary, the test parameter determination method and test system 100 provided in this application obtain the product identifier of the product under test before testing it; in response to the existence of the product identifier, obtain the change / iteration information corresponding to the product under test, as well as the test items corresponding to the change / iteration information; obtain the default test parameters and historical test results corresponding to the test items; adjust the default test parameters according to the historical test results to obtain the current test parameters; the current test parameters are used to test the product under test, so that the test parameters can be dynamically adjusted in combination with the historical test results corresponding to products with the same product identifier, and changing the test parameters will not change the problem, thereby increasing the accuracy of the test plan, thereby improving test efficiency while ensuring product performance, shortening the entire product iteration cycle, and when the product under test is a changed / iterated product, its corresponding test items are determined according to its change / iteration information, and only these test items need to be tested on the product under test, without testing other test items, thereby improving test efficiency while ensuring product performance and shortening the entire product iteration cycle.

[0159] In the several embodiments provided in this application, it should be understood that the disclosed methods and devices can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed.

[0160] If the integrated units in the other embodiments described above are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processing circuit component (processor) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0161] The above description is merely an embodiment of this application and does not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.

Claims

1. A method for determining test parameters, characterized in that, The determination method includes: Obtain the product identifier of the product currently under test; In response to the existence of the product identifier, obtain the change / iteration information corresponding to the current product to be tested, and the test items corresponding to the change / iteration information; Obtain the default test parameters and historical test results corresponding to the test item; Obtain the number of anomalies in the historical test results; An adjustment factor is determined based on the number of anomalies; wherein the adjustment factor is positively correlated with the number of anomalies. The default test parameters are adjusted using the adjustment factor to obtain the current test parameters; the current test parameters are used to test the current product to be tested, and the current product to be tested only needs to be tested according to the test items. The default test parameters include: test duration, number of tests, and / or vibration frequency; the adjustment factors include duration adjustment factor, number of tests adjustment factor, and / or frequency adjustment factor. The step of obtaining the number of anomalies in the historical test results includes: Obtain the first number of anomalies related to the test duration from the historical test results; And / or, obtain the number of second anomalies in the historical test results that are related to the number of tests; And / or, obtain the number of third anomalies related to the vibration frequency in the historical test results; The step of determining the adjustment factor based on the number of anomalies includes: The duration adjustment factor is determined based on the first number of anomalies; And / or, determine the quantity adjustment factor based on the second number of anomalies; And / or, the frequency adjustment factor is determined based on the number of the third anomalies; The step of adjusting the default test parameters using the adjustment factor to obtain the current test parameters includes: The test duration is adjusted using the duration adjustment factor to obtain the test duration in the current test parameters; And / or, adjust the number of tests using the quantity adjustment factor to obtain the number of tests in the current test parameters; And / or, the vibration frequency is adjusted using the frequency adjustment factor to obtain the vibration frequency in the current test parameters.

2. The determination method according to claim 1, characterized in that, The test duration includes at least two time periods, and determining the duration adjustment factor based on the first number of anomalies includes: When the first number of anomalies is greater than or equal to 1, the target time period in which each anomaly occurs within the first number of anomalies is obtained; wherein, the target time period is one of the at least two time periods; Obtain the first weight corresponding to the target time period; Based on the first weight corresponding to the target time period, the first adjustment factor corresponding to each anomaly is obtained; The duration adjustment factor is obtained based on the first adjustment factor corresponding to each anomaly. Alternatively, when the first number of anomalies is equal to 0, the duration adjustment factor is determined based on the number of historical tests.

3. The determination method according to claim 1, characterized in that, The number of tests includes at least two ranges, and determining the number adjustment factor based on the second number of anomalies includes: When the second number of anomalies is greater than or equal to 1, the target number segment at which each anomaly occurs in the second number of anomalies is obtained; wherein, the target number segment is one of the at least two number segments; Obtain the second weight corresponding to the target quantity range; Based on the second weight corresponding to the target quantity range, the second adjustment factor corresponding to each anomaly is obtained; The quantity adjustment factor is obtained based on the second adjustment factor corresponding to each anomaly.

4. The determination method according to claim 1, characterized in that, The test frequency includes at least two frequency bands, and determining the frequency adjustment factor based on the third number of anomalies includes: When the third number of anomalies is greater than or equal to 1, the target frequency band at which each anomaly occurs in the third number of anomalies is obtained; wherein, the target frequency band is one of the at least two frequency bands; Obtain the third weight corresponding to the target frequency band; Based on the third weight corresponding to the target frequency band, the third adjustment factor corresponding to each anomaly is obtained; The frequency adjustment factor is obtained based on the third adjustment factor corresponding to each anomaly; Alternatively, when the third abnormal number is equal to 0, the frequency adjustment factor is determined based on the number of historical tests.

5. The determining method according to any one of claims 1-4, characterized in that, The method further includes: Obtain the current material information of the product to be tested based on the product identifier; If the current material information differs from the material information of the previous test product with the same product identifier, it is recommended to use a data acquisition device and / or oscilloscope to acquire data from the module corresponding to the current material information during the test.

6. The determining method according to any one of claims 1-4, characterized in that, The method further includes: After obtaining the current test parameters, display the current test parameters on the display interface; In response to a confirmation operation of the current test parameters, or in response to a confirmation operation after adjusting the current test parameters, the current test parameters are used to test the current product to be tested.

7. A testing system, characterized in that, The testing system includes: At least one test device; A terminal control device, communicatively connected to each of the test devices, is used to receive test parameters and test results sent by each of the test devices, and to determine the test parameters for the current product under test using the method of any one of claims 1-6.

8. The testing system according to claim 7, characterized in that, The testing equipment includes at least one of the following: constant temperature and humidity chamber, HAST chamber, thermal shock chamber, high temperature chamber, low temperature chamber, vibration table, data acquisition instrument, and oscilloscope.

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