A method and apparatus for composite restriction testing control of a source table

Abstract

This application discloses a composite constraint test control method and apparatus for source meters. First, it initializes the source meter testing system in response to a digital trigger signal and sets the test operating parameters and constraint test group parameters. Then, it compares the currently acquired measurement data sequentially with each constraint test group parameter to obtain the comparison results. Next, it executes the constraint test comparison process based on the enabled state indicated by the acquired comparison results. Finally, it outputs the test result signal corresponding to each constraint test group parameter. By transforming the source meter from a single measuring instrument into an intelligent testing and control node on the production line, real-time data analysis and decision-making are achieved through composite constraints, and seamless linkage with the production line is established through the output test result signal, ultimately achieving fully automated, high-efficiency, and high-reliability production testing and sorting.

Description

Technical Field

[0001] This application relates to the field of measuring instrument technology, and specifically to a composite limit test control method and device for source meters. Background Technology

[0002] A source meter (SMU) is an instrument that can simultaneously function as a precision power supply, current source, voltmeter, and ammeter. It measures the corresponding response (such as current or voltage) by applying an excitation (such as voltage or current). Source meters typically have a safety limit set for the source or measurement during testing. For example, when applying voltage (source), a current compliance value (current limiting) is set to prevent excessive current from burning out components. Existing source meter testing functions can only filter configurations based on single conditions and cannot meet complex measurement and testing requirements. Summary of the Invention

[0003] The main technical problem addressed in this application is how to enable the source table to complete measurement and testing under conditions where multiple parameters are simultaneously set with limitations.

[0004] According to the first aspect, one embodiment provides a composite constraint test control method for a source table, comprising:

[0005] The monitoring and measurement triggering system outputs a digital trigger signal for initiating the composite limit test, and initializes the source table test system in response to the digital trigger signal;

[0006] Set the test operating parameters for the circuit loop in the source meter test system and at least one set of preset limiting test group parameters;

[0007] The system monitors and measures the trigger source signal output by the system, and responds to the trigger source signal to obtain the measurement data of the current circuit loop.

[0008] The currently acquired measurement data is compared sequentially with the parameters of each of the aforementioned limiting test groups to obtain comparison results; wherein, the comparison results are used to indicate whether the capability is enabled.

[0009] When the comparison result flag is enabled, the limitation test comparison process is executed.

[0010] The restriction test comparison process includes sorting operations, grading operations, and / or compliance test operations;

[0011] The sorting operation is used to output a first output signal that indicates the quality of the measurement data corresponding to the current limiting test group parameters, based on whether the measurement data of the current circuit loop is within a preset first threshold range.

[0012] The grading operation is used to output a second output signal that indicates the good or bad grade of the measurement data corresponding to the current limiting test group parameters, based on whether the measurement data of the current circuit loop is within a preset second threshold range.

[0013] The compliance test operation is used to output a third output signal indicating that the parameters of the current restricted test group meet the preset compliance conditions, based on whether the test working parameters of the current circuit loop meet a preset limiting condition.

[0014] In one embodiment, the first output signal is a passIO pattern signal; the second output signal is a passIO signal; and the third output signal is a FAIL Pattern IO signal.

[0015] In one embodiment, the sorting operation includes:

[0016] The first threshold range is between the first minimum value and the first maximum value;

[0017] When the measured data of the current circuit loop is greater than the first minimum value and less than the first maximum value, the first output signal corresponding to the current limit test group parameter is output, and the limit test comparison process corresponding to the current limit test group parameter is terminated.

[0018] If the measured data of the current circuit loop is less than the first minimum value or greater than the first maximum value, the limit test comparison process corresponding to the next set of limit test group parameters will be executed sequentially.

[0019] In one embodiment, the hierarchical operation includes:

[0020] The second threshold range is between the second minimum value and the second maximum value;

[0021] If the measured data of the current circuit loop is less than the second minimum value or greater than the second maximum value, and the current limiting test group parameter is the last group, then the second output signal is output;

[0022] If the measured data of the current circuit loop is less than the second minimum value or greater than the second maximum value, and the current limiting test group parameter is not the last group, then the limiting test comparison process corresponding to the next group of limiting test group parameters will be executed sequentially.

[0023] When the measured data of the current circuit loop is greater than the second minimum value and less than the second maximum value, and the first output signal is output, the second output signal is output, and the limitation test comparison process corresponding to the current limitation test group parameters ends;

[0024] If the measured data of the current circuit loop is greater than the second minimum value and less than the second maximum value, and the first output signal is not output, the measured data corresponding to the current limiting test group parameters is reacquired, and the reacquired measured data is compared with the current limiting test group parameters to re-execute the limiting test comparison process corresponding to the current limiting test group parameters.

[0025] In one embodiment, the compliance testing operation includes:

[0026] Obtain the test operating parameters of the current circuit loop;

[0027] When the test parameters of the current circuit loop are obtained and reach the preset first limit value, the third output signal corresponding to the current limit test group parameters is output; otherwise, the limit test comparison process corresponding to the next set of limit test group parameters is executed sequentially.

[0028] In one embodiment, the composite constraint test control method further includes:

[0029] When the comparison result flag is enabled but not enabled, and it is the comparison result with the last group of the limit test group parameters, the measurement trigger system's run termination procedure is executed to output test result data.

[0030] In one embodiment, the composite constraint test control method further includes:

[0031] When the comparison result flag is enabled or disabled, and it is a comparison result with the last group of the limit test group parameters, the measurement trigger system's run termination procedure is executed to output test result data;

[0032] If the comparison result flag is not enabled, the limitation test comparison process for the next set of limitation test group parameters is executed sequentially.

[0033] According to a second aspect, one embodiment provides a computer-readable storage medium storing a computer program that can be executed by a processor to implement the method as described in the first aspect.

[0034] According to a third aspect, one embodiment provides a computer program product including a computer program and / or instructions, which, when executed by a processor, implement the composite constraint test control method as described in the first aspect.

[0035] According to a fourth aspect, one embodiment provides a composite constraint test control device for a source table, used for applying the composite constraint test control method as described in the first aspect, the composite constraint test control device comprising:

[0036] The human-machine interface module is used to set the test operating parameters of the circuit loop in the source meter test system and at least one set of preset limiting test group parameters;

[0037] The monitoring and measurement triggering system is used to output digital trigger signals to initialize the source meter test system;

[0038] The data acquisition module is used to acquire the measurement data of the current circuit loop;

[0039] The comparison module is used to compare the currently acquired measurement data with the parameters of each of the limiting test groups in turn to obtain the comparison results;

[0040] The output module is used to output the composite constraint test results based on the comparison results.

[0041] According to the composite constraint test control method of the above embodiments, the source meter is transformed from a single measuring instrument into an intelligent test and control node on the production line. Real-time data analysis and decision-making are achieved through composite constraints, and the output test result signal is seamlessly linked with the production line, ultimately achieving fully automatic, high-efficiency, and high-reliability production testing and sorting. Attached Figure Description

[0042] Figure 1 This is a flowchart illustrating a composite constraint test control method in one embodiment;

[0043] Figure 2 This is a structural functional block diagram of a composite limitation test control device in one embodiment;

[0044] Figure 3 This is a flowchart illustrating the composite constraint test control method in another embodiment. Detailed Implementation

[0045] The present invention will now be described in further detail with reference to specific embodiments and accompanying drawings. Similar elements in different embodiments are referred to by associated similar element reference numerals. In the following embodiments, many details are described to facilitate a better understanding of this application. However, those skilled in the art will readily recognize that some features may be omitted in different situations, or may be replaced by other elements, materials, or methods. In some cases, certain operations related to this application are not shown or described in the specification. This is to avoid obscuring the core parts of this application with excessive description. For those skilled in the art, detailed description of these related operations is not necessary; they can fully understand the related operations based on the description in the specification and general technical knowledge in the art.

[0046] Furthermore, the features, operations, or characteristics described in the specification can be combined in any suitable manner to form various embodiments. At the same time, the steps or actions in the method description can be rearranged or adjusted in a manner obvious to those skilled in the art. Therefore, the various orders in the specification and drawings are only for the clear description of a particular embodiment and do not imply a necessary order, unless otherwise stated that a particular order must be followed.

[0047] The serial numbers assigned to components in this document, such as "first" and "second," are used only to distinguish the described objects and have no sequential or technical meaning. The terms "connection" and "linkage" used in this application, unless otherwise specified, include both direct and indirect connections (linkages).

[0048] In conventional industrial measurement and testing (e.g., in the testing of chips or components with specific attributes), there are preset requirements for working conditions and circuit operating environment. However, existing source meter testing equipment and functions cannot meet such application scenarios, which require both meeting these testing needs and enabling rapid testing of each device to improve efficiency.

[0049] Implementing composite limit test control functions of source meters can protect expensive or sensitive DUTs (some devices are very vulnerable in specific operating areas where high voltage and high current occur simultaneously; a single parameter not exceeding the limit is harmless, but exceeding the limit of two parameters may lead to a dangerous area), define a more precise safe operating area (many device datasheets, such as transistors and power devices, provide an SOA curve that defines the safe combination range of voltage and current; composite limits can be programmed to simulate the boundaries of this curve), improve test automation and reliability (source meters can automatically determine whether the DUT is operating in an abnormal state and stop in time to avoid generating invalid data or cascading damage), and implement complex test logic (it can be used to find inflection points or trigger points, for example, when the voltage reaches 5V or the current reaches 10mA, stop scanning and record that point, etc.).

[0050] The most basic setting logic for composite limit test control of source tables involves logical AND and logical OR. The following describes logical AND and logical OR using the common "voltage-current" composite limit as an example, specifically including:

[0051] When testing the reverse characteristics of a diode, it is necessary to prevent it from breaking down due to excessive power.

[0052] Voltage limit condition: V_measured > V_limit, for example, reverse voltage > 30V;

[0053] Current limiting condition: I_measured > I_limit, for example, reverse leakage current > 100mA;

[0054] Use logical AND: voltage limit condition AND current limit condition;

[0055] Trigger action: Source output off or alarm triggered;

[0056] Testing process: The instrument monitors the measured voltage and current in real time. Protection will only be triggered if both voltage and current exceed 30V and 100mA simultaneously. If only the voltage is high but the current is low (before soft breakdown), or the current is high but the voltage is low, the test can continue. This precisely protects the device in the high-power danger zone of "high voltage-high current".

[0057] Use logic OR: voltage limit condition OR current limit condition;

[0058] If either voltage or current exceeds the limit, the source output will be shut down or an alarm will be triggered.

[0059] As can be seen from the above examples, the main function of composite limit testing is to perform limit tests on a set of measurement data, filter out measurement data that meet the set conditions or do not meet the specified conditions, and output the corresponding IO pattern trigger value. The Pattern IO trigger value output refers to the pattern value set through the IO output of the downstream port, which is generally output using a pulse high / low level to represent a binary number.

[0060] In this embodiment of the application, from the perspective of a specific application scenario of automated testing and sorting (Binning), the test process of the source table is set, which includes real-time measurement, compound condition judgment (grading / sorting), generation of decision results and output of action instructions through IO interface, thereby realizing and completing the compound restriction test control of the source table.

[0061] Example 1:

[0062] Please refer to Figure 1 This is a flowchart illustrating a composite constraint test control method in one embodiment. This composite constraint test control method is applied to a source table test system and specifically includes:

[0063] Step 101: Monitor the digital trigger signal.

[0064] The system monitors and measures the output of a digital trigger signal used to initiate a composite limit test, and initializes the source table test system in response to the digital trigger signal.

[0065] Step 102: Set the test parameters.

[0066] The test operating parameters of the circuit loop in the source meter test system and at least one set of preset limiting test group parameters are set. In one embodiment, the test operating parameters and limiting test group parameters are set through a human-computer interaction interface.

[0067] Step 103: Obtain measurement data.

[0068] The system monitors and measures the trigger source signal output by the system, and responds to the trigger source signal to obtain the measurement data of the current circuit loop.

[0069] Step 104: Obtain the comparison results.

[0070] The currently acquired measurement data is compared sequentially with the parameters of each group of limit test groups to obtain the comparison results, which are used to indicate whether to enable or disable the test.

[0071] Step 105: Perform the limitation test comparison process.

[0072] When the comparison result indicator is enabled, the limitation test comparison process is executed. The limitation test comparison process includes a sorting operation, a grading operation, and a compliance test operation. The sorting operation outputs a first output signal indicating the quality of the measurement data for the current limitation test group parameters, based on whether the measurement data of the current circuit loop is within a preset first threshold range. The grading operation outputs a second output signal indicating the quality level of the measurement data for the current limitation test group parameters, based on whether the measurement data of the current circuit loop is within a preset second threshold range. The compliance test operation outputs a third output signal indicating whether the test parameters of the current circuit loop meet a preset constraint condition. In one embodiment, the first output signal is a passIO pattern signal, the second output signal is a passIO signal, and the third output signal is a FAIL Pattern IO signal. In source meter applications, the PassIO signal is a digital input / output control signal primarily used for trigger control (synchronous control, triggering, and communication with external devices), status indication (output enable status, outputting the current operating status of the source meter, such as measurement completion or error status), and hardware handshake (communication with peripherals or collaborative test process control). The hardware implementation of the PassIO signal typically uses a dedicated pin on a D-sub connector, TTL level (0-5V), or is configured as an input or output connection. In source meter applications, the PassIO Pattern signal is an extension and advanced form of the PassIO function. While a single PassIO signal is a single digital signal, the PassIO Pattern signal is a parallel digital bus signal used to transmit multi-bit encoded status or trigger information. It can broadcast complex, multi-step test sequence statuses from within the source meter in real time at hardware speed, or receive complex external trigger commands. The hardware implementation of the PassIO Pattern signal is typically achieved through multiple dedicated pins on a multi-pin connector (such as a 9-pin D-sub) on the rear panel of the source meter. Common pin widths are 4 or 8 bits, capable of representing 16 or 256 different states. Each line represents a binary bit, for example, PassIO Bit0, Bit1, Bit2, and Bit3. In source meter applications, the FAIL Pattern IO signal is a multi-bit status register, with each bit corresponding to a specific test condition or channel failure state. It is output in parallel, updated in real time, and directly reflects the instrument's internal decision. The hardware implementation of the FAIL Pattern IO signal is generally an 8-bit parallel bus (8 signal lines), using TTL or LVTTL level signals, or a dedicated digital I / O connector.

[0073] When the comparison result flag is enabled but not enabled, and it is a comparison result with the last group of limit test group parameters, the measurement trigger system's run termination procedure is executed to output test result data.

[0074] If the comparison result indicates that the enable is not enabled, the limitation test comparison process for the next group of limitation test parameters will be executed sequentially.

[0075] In one embodiment, the first threshold ranges between a first minimum value and a first maximum value, and the sorting operation includes:

[0076] When the measured data of the current circuit loop is greater than the first minimum value and less than the first maximum value, the first output signal corresponding to the current limit test group parameter is output, and the limit test comparison process corresponding to the current limit test group parameter ends.

[0077] If the measured data of the current circuit loop is less than the first minimum value or greater than the first maximum value, the limit test comparison process for the corresponding next set of limit test parameters will be executed sequentially.

[0078] In one embodiment, the second threshold ranges between a second minimum value and a second maximum value, and the grading operation includes:

[0079] If the measured data of the current circuit loop is less than the second minimum value or greater than the second maximum value, and the current limiting test group parameter is the last group, then the second output signal is output.

[0080] If the measured data of the current circuit loop is less than the second minimum value or greater than the second maximum value, and the current limit test group parameter is not the last group, then the limit test comparison process of the corresponding next limit test group parameter will be executed sequentially.

[0081] When the measured data of the current circuit loop is greater than the second minimum value and less than the second maximum value, and the first output signal is output, the second output signal is output, and the limitation test comparison process corresponding to the current limitation test group parameters ends.

[0082] If the measurement data of the current circuit loop is greater than the second minimum value and less than the second maximum value, and no first output signal is output, the measurement data corresponding to the current limit test group parameters is reacquired, and the reacquired measurement data is compared with the current limit test group parameters to re-execute the limit test comparison process corresponding to the current limit test group parameters.

[0083] In one embodiment, the compliance testing operation includes:

[0084] The test operating parameters of the current circuit loop are obtained. When the obtained test operating parameters of the current circuit loop reach the preset first limit value, the third output signal corresponding to the current limit test group parameters is output. Otherwise, the limit test comparison process corresponding to the next limit test group parameters is executed in sequence.

[0085] Please refer to Figure 2 This is a structural functional block diagram of a composite limitation test control device in one embodiment. The composite limitation test control device is used to apply the composite limitation test control method described above. The device includes a human-machine interface module 10, a monitoring and measurement triggering system 20, a data acquisition module 30, a comparison module 40, and an output module 50. The human-machine interface module 10 is used to set the test operating parameters of the circuit loop in the source meter test system and at least one set of preset limitation test group parameters. The monitoring and measurement triggering system 20 is used to output digital trigger signals to initialize the source meter test system. The data acquisition module 30 is used to acquire the measurement data of the current circuit loop. The comparison module 40 is used to compare the currently acquired measurement data sequentially with each set of limitation test group parameters to obtain comparison results. The output module 50 is used to output the composite limitation test result based on the comparison results.

[0086] To facilitate understanding of the implementation and application of the composite constraint test control method disclosed in the embodiments of this application, the following specific embodiments are described, including:

[0087] Please refer to Figure 3This is a flowchart illustrating the composite limit test control method in another embodiment. In this embodiment, the main function of the composite limit test is to perform limit tests on a set of measurement data, filter out measurement data that meet the set conditions or do not meet the specified conditions, and output the corresponding IO pattern trigger value. Here, Pattern IO output refers to the pattern value set through the IO output of the back port, used to represent binary numbers with high and low levels of pulse output. The limit test comparison process involves sorting, grading, and compliance testing operations. The grading operation checks whether the measurement data value obtained during the current test is within the set conditions of the current test group, i.e., less than the set UP limit and greater than the set low limit. If the condition is met, it is considered a pass; otherwise, it is considered a fail. The purpose of the grading operation is to detect failed measurement values. The sorting operation checks whether the measurement data value obtained during the current test is within the set conditions of the current test group, i.e., less than the set UP value and greater than the set low value. If the condition is met, it is considered a pass; otherwise, it is considered a fail. The purpose of the sorting operation is to detect pass measurement values. The purpose of compliance testing is to determine whether the current output conditions have reached the limit, for example, whether the voltage source output has reached a constant current state or the current source output has reached a constant voltage state. In this embodiment, the composite limit test control method includes:

[0088] Step 201: Start the measurement triggering system and send an SOT signal (digital trigger signal) to start the measurement limit test.

[0089] Step 202: The measurement triggering system waits for the arrival of the trigger source signal according to the set triggering conditions and performs data measurement of the current circuit loop conditions.

[0090] Step 203: The obtained current measurement value is compared with the limit test group. In one embodiment, the limit test group (i.e., the limit test group parameter) is from group 1 to group 12, and the current test group for each comparison is initialized to test group 1.

[0091] Step 204: Determine whether the current limit test group is enabled.

[0092] If the current test group is enabled, proceed to steps 208, 209, and 210 to execute the limit test comparison process. If the current test group is not enabled, determine whether the current limit test group is the last test group, i.e., whether the current test group is the 12th test group of the last group.

[0093] Step 205: Determine whether to perform the next data measurement. If the current test group is not the last test group, set the next test group as the current limit test group and continue to execute step 204.

[0094] Step 206: If the current test group is the last test group, determine whether the measurement trigger system has finished running.

[0095] Step 207: If the measurement trigger system has finished running, the current limit test process ends, and the IO pattern output of the overall limit test result is directly output, i.e., the corresponding pattern output for pass or fail. If the measurement trigger system has not finished running, step 202 is repeated.

[0096] The limit test comparison process includes steps 208, 209, and 210.

[0097] Step 208, sorting operation.

[0098] Determine if the current measured value is between the maximum and minimum values. If the current test result is PASS, output the pass IO pattern value for the current limit test group, and the limit test process ends.

[0099] If the test result is FAIL, the test result of the current test group is FAIL, continue to step 207.

[0100] Step 209, tiered operation.

[0101] Determine if the current measured value is between the maximum and minimum values. If the current test result is PASS, determine if pattern IO should be output immediately. If pattern IO should be output immediately, and if the current test group is the last test group, output the pattern IO output value for graded PASS. If the current test group is not the last test group, continue to step 207; if pattern IO should not be output immediately, wait for the next measured value to be tested, and then execute step 202. If the current test result is FAIL, determine if pattern IO should be output immediately. If pattern IO should be output immediately, output the fail IO pattern value for the current limit test group, and the current limit test process ends; if pattern IO should not be output immediately, wait for the next measured value to be tested, and then execute step 202.

[0102] Step 210, compliance testing.

[0103] Compliance testing operations include FAIL IN mode and FAIL OUT mode.

[0104] The FAIL IN mode checks if the current measurement conditions have reached the limit. If the limit is reached, the test result is FAIL; otherwise, it is PASS. The FAIL OUT mode checks if the current measurement conditions have reached the limit. If the limit is reached, the test result is PASS; otherwise, it is FAIL.

[0105] If the current test group's test result is FAIL, output the compliance FAIL Pattern IO value for the current test group. If the current test group's test result is PASS, continue to step 207.

[0106] The composite limit test control method disclosed in this application is used to perform multiple limit tests on measured values, supporting three operation modes: sorting, grading, and compliance testing. The method sequentially executes the following steps: startup (sending an SOT signal to start the measurement trigger system), triggering and measuring (the system waits for trigger conditions, performs data measurement after triggering, and obtains the current measurement data), initializing the test group (starting comparison from the first limit test group, with the current test group set as the first group), checking the test group's enable status, and if the current test group is enabled, entering the limit test comparison process. If not enabled, it determines whether it is the last test group (the 12th group). If not, the next group is set as the current test group, and the above process is re-executed. If it is the last test group, it determines whether the measurement trigger system has finished running. When the system has finished running, the IOpattern (pass / fail) of the overall limit test result is output, and the process ends. If the system has not finished running, the process is re-executed. In one embodiment, the measurement trigger system can support multiple trigger measurements, each trigger acquiring one measured value and executing the above test process, and when the system finishes running, the overall test result is output. In one embodiment, the source meter's measurement triggering system provides a specified number of continuous limit test data, and the externally output high and low levels and pulses provide the indication basis for the Pattern IO output value. In another embodiment, the composite limit test control method supports arbitrary combinations of multiple limit test modes (sorting, grading, and compliance testing), enabling the filtering of different combinations of measurement conditions at the same time—that is, filtering of multiple operating conditions, rather than simply judging and filtering measurement data. In yet another embodiment, the composite limit test control method supports timely response to different conditions based on different Pattern IO outputs during rapid measurements. The composite limit test control method disclosed in this application can achieve the filtering of abnormal constant current and constant voltage states.

[0107] The composite constraint test control method disclosed in this application first initializes the source meter test system in response to a digital trigger signal and sets the test operating parameters and constraint test group parameters; then, it compares the currently acquired measurement data sequentially with each group of constraint test group parameters to obtain the comparison results; next, it executes the constraint test comparison process based on the enabled state indicated by the acquired comparison results; finally, it outputs the test result signal corresponding to each group of constraint test group parameters. By transforming the source meter from a single measuring instrument into an intelligent test and control node on the production line, real-time data analysis and decision-making are achieved through composite constraints, and seamless linkage with the production line is achieved through the output test result signal, ultimately realizing fully automated, high-efficiency, and high-reliability production testing and sorting.

[0108] Those skilled in the art will understand that all or part of the functions of the various methods in the above embodiments can be implemented by hardware or by computer programs. When all or part of the functions in the above embodiments are implemented by computer programs, the program can be stored in a computer-readable storage medium, which may include: read-only memory, random access memory, disk, optical disk, hard disk, etc., and the program is executed by a computer to achieve the above functions. For example, the program can be stored in the memory of a device, and when the program in the memory is executed by the processor, all or part of the above functions can be achieved. In addition, when all or part of the functions in the above embodiments are implemented by computer programs, the program can also be stored in a server, another computer, disk, optical disk, flash drive, or external hard drive, etc., and can be downloaded or copied to the memory of a local device, or the system of the local device can be updated. When the program in the memory is executed by the processor, all or part of the functions in the above embodiments can be achieved.

[0109] The above examples illustrate the present invention only to aid in understanding it and are not intended to limit the scope of the invention. Those skilled in the art can make various simple deductions, modifications, or substitutions based on the principles of this invention.

Claims

1. A composite constraint test control method for source tables, characterized in that, include: The monitoring and measurement triggering system outputs a digital trigger signal for initiating the composite limit test, and initializes the source table test system in response to the digital trigger signal; Set the test operating parameters for the circuit loop in the source meter test system and at least one set of preset limiting test group parameters; The system monitors and measures the trigger source signal output by the system, and responds to the trigger source signal to obtain the measurement data of the current circuit loop. The currently acquired measurement data is compared sequentially with the parameters of each of the aforementioned limiting test groups to obtain comparison results; wherein, the comparison results are used to indicate whether the capability is enabled. When the comparison result flag is enabled, the limitation test comparison process is executed. The restriction test comparison process includes sorting operations, grading operations, and / or compliance test operations; The sorting operation is used to output a first output signal that indicates the quality of the measurement data corresponding to the current limiting test group parameters, based on whether the measurement data of the current circuit loop is within a preset first threshold range. The grading operation is used to output a second output signal that indicates the good or bad grade of the measurement data corresponding to the current limiting test group parameters, based on whether the measurement data of the current circuit loop is within a preset second threshold range. The compliance test operation is used to output a third output signal that indicates whether the test working parameters of the current circuit loop meet a preset limiting condition. The sorting operation includes: The first threshold range is between the first minimum value and the first maximum value; When the measured data of the current circuit loop is greater than the first minimum value and less than the first maximum value, the first output signal corresponding to the current limit test group parameter is output, and the limit test comparison process corresponding to the current limit test group parameter is terminated. If the measured data of the current circuit loop is less than the first minimum value or greater than the first maximum value, the limit test comparison process corresponding to the next set of limit test group parameters is executed sequentially. The hierarchical operation includes: The second threshold range is between the second minimum value and the second maximum value; If the measured data of the current circuit loop is less than the second minimum value or greater than the second maximum value, and the current limiting test group parameter is the last group, then the second output signal is output; If the measured data of the current circuit loop is less than the second minimum value or greater than the second maximum value, and the current limiting test group parameter is not the last group, then the limiting test comparison process corresponding to the next group of limiting test group parameters will be executed sequentially. When the measured data of the current circuit loop is greater than the second minimum value and less than the second maximum value, and the first output signal is output, the second output signal is output, and the limitation test comparison process corresponding to the current limitation test group parameters ends; If the measured data of the current circuit loop is greater than the second minimum value and less than the second maximum value, and the first output signal is not output, the measured data corresponding to the current limiting test group parameters is reacquired, and the reacquired measured data is compared with the current limiting test group parameters to re-execute the limiting test comparison process corresponding to the current limiting test group parameters.

2. The composite constraint test control method as described in claim 1, characterized in that, The first output signal is the passIO pattern signal; the second output signal is the passIO signal; and the third output signal is the FAILPattern IO signal.

3. The composite constraint test control method as described in claim 1, characterized in that, The compliance testing operations include: Obtain the test operating parameters of the current circuit loop; When the test parameters of the current circuit loop are obtained and reach the preset first limit value, the third output signal corresponding to the current limit test group parameters is output; otherwise, the limit test comparison process corresponding to the next set of limit test group parameters is executed sequentially.

4. The composite constraint test control method as described in claim 1, characterized in that, Also includes: When the comparison result flag is enabled but not enabled, and is a comparison result with the last set of limit test group parameters, the measurement trigger system's run termination procedure is executed.

5. The composite constraint test control method as described in claim 1, characterized in that, Also includes: When the comparison result flag is enabled or disabled, and it is a comparison result with the last group of the limit test group parameters, the measurement trigger system's run termination procedure is executed to output test result data; If the comparison result flag is not enabled, the limitation test comparison process for the next set of limitation test group parameters is executed sequentially.

6. A computer-readable storage medium, characterized in that, The medium stores a computer program that can be executed by a processor to implement the composite constraint test control method as described in any one of claims 1-5.

7. A computer program product, comprising a computer program and / or instructions, characterized in that, When the computer program and / or instructions are executed by the processor, they implement the composite constraint test control method according to any one of claims 1-5.

8. A composite limit test control device for a source table, characterized in that, For applying the composite constraint test control method as described in any one of claims 1-5, the composite constraint test control device comprises: The human-machine interface module is used to set the test operating parameters of the circuit loop in the source meter test system and at least one set of preset limiting test group parameters; The monitoring and measurement triggering system is used to output digital trigger signals to initialize the source meter test system; The data acquisition module is used to acquire the measurement data of the current circuit loop; The comparison module is used to compare the currently acquired measurement data with the parameters of each of the limiting test groups in turn to obtain the comparison results; The output module is used to output the composite constraint test results based on the comparison results.

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