Blade defect detection method and device

Abstract

The invention discloses a blade defect detection method and device, and the method comprises the steps: S1, scanning the surface of a blade through a line laser three-dimensional contourgraph, obtaining the three-dimensional shape data of the surface of the blade, and recognizing the defects of a blade surface; s2, according to the three-dimensional shape data of the blade surface, generating a blade contour scanning path and a blade surface scanning path containing depth information of each view field; s3, based on the knife face scanning path, scanning the surface of the blade in a view-by-view manner, automatically focusing each view field to an optimal imaging position, obtaining a knife face microscopic image, and identifying a knife face defect; s4, based on a blade contour scanning path, driving a lens to walk along the blade contour in a full-circumference manner, turning a light path through a reflector group rotating around the lens, then obtaining an edge microscopic image by a camera, and identifying edge defects; and S5, generating a blade defect detection report, and storing a detection result. According to the invention, full-automatic detection of all defects of the tool face and the edge can be completed, and the problem of low efficiency of traditional step-by-step manual detection is solved.

Description

Technical Field

[0001] This invention relates to the field of microscopic image inspection technology, and more specifically, to a method and apparatus for detecting blade defects. Background Technology

[0002] Blade surfaces can have various defects such as chipping, holes, cracks, material adhesion, and burrs. For blade defects, it's necessary to inspect not only the size but also the depth. Currently, common methods for detecting blade surface defects include manual visual inspection supplemented by microscopic observation, relying on the experience of quality inspectors to determine whether a product is good or defective.

[0003] Because defects come in a variety of forms, including the size and depth of chipping, the chipping size on the side of the blade, and various defects on the blade surface, existing instruments cannot detect them all, nor can they be automated. Relying on manual inspection is inefficient and the quality is uncontrollable. Furthermore, observing tiny defects with the naked eye for a long time is detrimental to the health of workers.

[0004] Furthermore, blades come in various shapes, and their outer contours and the undulations of the blade surface vary depending on the design. Therefore, when observing the blade surface using a microscope, the small depth of field necessitates repeated manual focusing, resulting in extremely low efficiency. Moreover, manual operation makes it difficult to guarantee the integrity of the scanning path and the accuracy of the detection. Summary of the Invention

[0005] One of the objectives of this invention is to provide a method for detecting blade defects, which has the advantages of improving detection efficiency and enabling comprehensive automated detection of the blade surface and sides.

[0006] To achieve the above technical objectives, this invention discloses a method for detecting blade defects, comprising: S1. Use a line laser 3D profilometer to scan the blade surface, obtain the 3D morphology data of the blade surface, and identify blade surface defects; S2. Based on the three-dimensional topography data of the blade surface, generate a blade contour scanning path and a blade surface scanning path containing depth information of each field of view; S3. Based on the blade scanning path, a microscope is used to scan the blade surface field by field. For each field of view, the microscope is automatically focused to the best imaging position according to the depth information of each field of view and a microscopic image of the blade surface is obtained to identify blade surface defects. S4. Based on the blade contour scanning path, drive the lens of the microscope to travel around the entire circumference of the blade contour. After the light path is deflected by the reflective mirror group rotating around the lens, the camera of the microscope acquires the edge microscopic image to identify side defects. S5. Generate a blade defect detection report and store the detection results.

[0007] Furthermore, S1 also includes determining whether the blade is qualified. If yes, proceed to S2; otherwise, proceed to S5. S3 also includes determining whether the blade is qualified. If yes, proceed to S4; otherwise, proceed to S5.

[0008] Furthermore, in S3, a transfer mechanism is used to transfer the blade from below the line laser 3D profilometer to below the microscope; in S4, the microscope is mounted on a three-axis transfer mechanism, and the mirror assembly is configured to be electrically driven to rotate around the lens. During the scanning process, the lens is driven to position itself at the blade edge, while the mirror assembly is controlled to rotate so that the blade edge position is always within the depth of field of the lens.

[0009] Furthermore, in S5, the blade defect detection report includes one or more of the following: defect category, defect distribution location map, surface defect depth, surface defect height, and pass / fail determination.

[0010] The second objective of this invention is to provide a blade defect detection device, which has the advantages of improving detection efficiency and enabling comprehensive automated detection of the blade surface and sides.

[0011] To achieve the above-mentioned technical objectives, this invention discloses a blade defect detection device for implementing the aforementioned method, comprising: Line laser 3D profilometer is used to scan the blade surface, acquire the 3D topographic data of the blade surface, and generate the blade profile scanning path and the blade surface scanning path containing depth information of each field of view. The microscope, located at the rear end of the line laser three-dimensional profilometer, includes a lens and a camera. It automatically focuses according to the blade scanning path to acquire a microscopic image of the blade surface. It is equipped with a mirror group that rotates around the lens. The camera is positioned according to the blade profile scanning path and acquires a microscopic image of the edge. The image processor acquires images collected by the line laser 3D profilometer and the microscope, identifies blade defects, and generates a blade defect detection report.

[0012] Furthermore, it also includes a transfer mechanism that transfers the blade from below the line laser 3D profilometer to below the lens.

[0013] Furthermore, it also includes a three-axis transfer mechanism for driving the lens to focus and travel along the full circumference of the blade profile.

[0014] Furthermore, the microscope includes a sliding mechanism, which comprises a connecting plate, a sliding plate, and a mirror assembly. The connecting plate is rotatably disposed below the lens and along the radial direction of the lens. The sliding plate has a first sliding position and a second sliding position on the connecting plate. The sliding plate is provided with a field of view window to form a first optical path vertically from the upper surface of the blade toward the lens at the first sliding position to acquire the blade surface image. The mirror assembly is mounted below the sliding plate to form a second optical path reflected from the side of the blade to the lens at the second sliding position to acquire the edge microscopic image.

[0015] Furthermore, the sliding mechanism also includes a pusher having a push rod located on the side of the sliding plate, the push rod pushing the sliding plate to switch between the first sliding position and the second sliding position.

[0016] Furthermore, it also includes a rotating mechanism, which includes a rotating drive that drives the connecting plate to rotate along the axis of the lens.

[0017] By adopting the above technical solution, the present invention has the following advantages compared with the prior art: 1. The present invention designs a dual-station collaborative detection system: the first station generates the scanning path of the second station based on the three-dimensional shape of the cutting surface of the line laser three-dimensional profilometer, and the microscope of the second station achieves direct positioning and focusing without depth search based on the scanning path, thereby improving the quality and efficiency of image acquisition.

[0018] 2. This invention divides the scanning path into a blade face scanning path and a blade contour scanning path, respectively scanning the surface defects and side defects of the blade. Through the coordinated work of line laser and microscopic imaging, it completes the fully automatic detection of all defects on the blade face and sides, solving the problem of low efficiency in traditional step-by-step manual inspection.

[0019] 3. This invention is based on the blade contour scanning path to drive the lens for rapid positioning and focusing. Combined with the coordinated rotational motion of the 45° reflector group, the blade edge is always within the depth of field of the lens, realizing dynamic fitting scanning of the blade side surface. It effectively detects edge chipping at the blade contour line edge and cracks on the blade side, eliminates the blind spot on the side in traditional detection, and realizes full-surface detection of the blade without dead angles. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the detection method of the present invention; Figure 2 This is another schematic diagram of the detection method of the present invention; Figure 3 This is a schematic diagram of the chipping defect in the blade of the present invention; Figure 4 This is a schematic diagram of the blade adhesion defects of the present invention; Figure 5 This is a schematic diagram of the blade defect detection device of the present invention; Figure 6 This is a schematic diagram of the planar structure of the sliding mechanism of the microscope described in this invention; Figure 7 This is a schematic diagram of the first optical path of the microscope described in this invention; Figure 8 This is a schematic diagram of the second optical path of the microscope described in this invention; Figure 9 This is a three-dimensional structural diagram of the rotating mechanism of the microscope described in this invention; Figure 10 The attached diagram illustrates the separation structure of the sliding mechanism of the microscope described in this invention. (Note: The reference numerals are not included in the translation.) Figure 11 Explanation of reference numerals in the three-dimensional structural diagram of the connecting plate of the microscope described in this invention; Figure 12 This is a three-dimensional structural diagram of the sliding plate of the microscope described in this invention; Figure 13 This is a schematic diagram of the microscopic field of view of the microscope described in this invention.

[0021] Explanation of reference numerals in the attached figures: 100. Lens; 200. Sliding mechanism; 300. First optical path; 400. Second optical path; 500. Rotation mechanism; 600. Three-axis transfer mechanism; 700. Worktable; 800. Line laser 3D profilometer; 900. Transfer mechanism; 210. Connecting plate; 220. Sliding plate; 230. Mirror assembly; 221. Viewing window; 240. Pusher; 241. Push rod; 231. Plane mirror; 510. Rotation drive component. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. Furthermore, it should be noted that: The terms “upper,” “lower,” “left,” “right,” “vertical,” “horizontal,” “inner,” and “outer” are based on the orientation or positional relationship shown in the accompanying drawings and are used merely for the convenience of describing the present invention and simplifying the description. They are not intended to indicate or imply that the device or element of the present invention must have a specific orientation and therefore should not be construed as a limitation of the present invention.

[0023] When an element is referred to as "fixed to," "set on," or "located on" another element, it can be directly on or indirectly on that other element. When an element is referred to as "connected to," it can be directly connected to or indirectly connected to that other element.

[0024] Unless otherwise expressly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication between two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0025] Example 1 This invention proposes a method for detecting blade defects, comprising: S1. Use a line laser 3D profilometer to scan the blade surface, obtain the 3D morphology data of the blade surface, and identify blade surface defects; S2. Based on the three-dimensional topography data of the blade surface, generate a blade contour scanning path and a blade surface scanning path containing depth information of each field of view; S3. Based on the blade scanning path, a microscope is used to scan the blade surface field by field. For each field of view, the camera is automatically focused to the best imaging position according to the depth information of each field of view to obtain a microscopic image of the blade surface and identify blade surface defects. S4. Based on the blade contour scanning path, drive the microscope lens to travel around the entire circumference of the blade contour. After the light path is deflected by the mirror group rotating around the lens, the microscope camera acquires the edge microscopic image to identify side defects. S5. Generate a blade defect detection report and store the detection results.

[0026] Among them, the line laser 3D profilometer in S1 is a metrology instrument used for constructing 3D solid point cloud models. It obtains 3D topographic data of the object surface through laser scanning. In this invention, it is used to replace manual visual inspection and quickly obtain 3D topographic data of the blade surface. It can not only provide the depth information required for focusing in S2, but also preliminarily identify some image defects, so as to solve the problem of low efficiency of traditional manual inspection.

[0027] Three-dimensional topography data refers to point cloud data containing the three-dimensional coordinate information of each point on the surface of an object. Specifically, it can be generated by laser scanning followed by point cloud processing algorithms. In this invention, it serves as the basic data source, used both to directly identify macroscopic surface defects and to provide spatial coordinates for subsequent microscopic inspection path planning.

[0028] The blade contour scanning path refers to the lens motion trajectory generated based on three-dimensional topographic data, which can be achieved by extracting feature points on the blade edge and fitting a motion curve. In this invention, it guides the lens to move along the blade contour, ensuring the optimal observation distance is maintained when inspecting the side of the blade, so that the side of the blade is always within the depth of field of the microscope.

[0029] The field-of-view depth information refers to the Z-axis focusing parameters corresponding to each microscopic observation area, which can be generated by extracting the height values ​​of each area from three-dimensional topographic data. In this invention, focusing parameters are provided to the microscope to achieve automatic focusing, thereby overcoming the limitations of microscope depth of field, obtaining clear images, and improving the efficiency of detecting microscopic defects on the blade surface.

[0030] A mirror assembly refers to an optical lens with a specific reflection angle. In a specific example of the present invention, it is a 45° mirror assembly. By deflecting the lens optical path, the side profile is imaged onto the microscope field of view, thereby achieving the acquisition of a side image.

[0031] Through the above-described scheme, this invention achieves fully automated detection of defects on the surface and sides of cutting blades, overcoming the limitations of traditional manual inspection relying on microscope observation, significantly improving inspection efficiency, eliminating the need for repeated manual focusing, and realizing accurate detection of cutting blades with complex three-dimensional morphology. Simultaneously, the automatic focusing mechanism and the full circumferential scanning mechanism of the sides ensure the comprehensiveness and accuracy of the inspection, greatly reducing the risk of missed detections.

[0032] In some of the solutions described above in this invention, if the defect identification process relies on human experience, it may lead to problems such as low detection efficiency, insufficient accuracy, and poor consistency. This is especially true for complex and diverse defect types, where it is difficult for humans to achieve a unified standard for judgment. To address this, this invention further proposes to use AI algorithms to identify cutting surface defects in S1, S3, and S4, respectively. The AI ​​algorithm used can be any existing technology, and this invention does not impose specific limitations. For example, a deep learning model can be trained using a sufficient number of samples labeled with defect information. Then, the images acquired by S1, S3, and S4 are input into the trained deep learning model to automatically identify defects such as chipping, cracks, and dents on the cutting edge. In this way, the entire detection process is automated and intelligent, enabling the identification of blade defects without human intervention. This not only improves detection efficiency, but the consistency and repeatability of the AI ​​algorithm also avoid misjudgments caused by subjective factors or fatigue in manual judgment, thus improving the reliability of the detection results.

[0033] In the above examples of the present invention, the blade defect detection report is a digital document that integrates multi-dimensional detection results, thereby facilitating subsequent review of the blade manufacturing process. This includes reviewing common defects and their locations, exploring the causes of these defects, and serving as a reference for continuous quality improvement. However, in a simple detection scenario, such as pre-shipment quality inspection or batch inspection during blade use, to improve detection efficiency, the blade defect detection report may not necessarily include all detected defects in S1, S3, and S4.

[0034] Specifically, in the process of detecting blade defects in stages using a line laser 3D profilometer and microscope, if the blade already has serious defects at the current detection stage, sufficient to classify it as NG (Not Acceptable), continuing to execute subsequent detection steps would lead to wasted detection resources and reduced efficiency. To address this, this invention further proposes that after completing the 3D topography data acquisition in stage S1, a pass / fail determination be performed immediately. If the blade is acceptable, proceed to S2; otherwise, skip to S5 to generate an inspection report. After completing the microscope scan in stage S3, another pass / fail determination is performed. If acceptable, proceed to S4; otherwise, skip to S5.

[0035] The pass / fail criteria in stage S1 and stage S3 can be configured independently. The algorithm in stage S1 can prioritize screening macroscopic defects, while the algorithm in stage S3 can focus on screening microscopic defects (such as material defects, voids, bubbles, and poor coating). The judgment result is linked to the control signal of the transfer mechanism. When the S1 stage judgment is unqualified, the transfer mechanism can directly transfer the blade to avoid entering the microscope inspection area, or the microscope can refrain from inspecting the blade while it is flowing through the microscope inspection area.

[0036] In some of the above-mentioned solutions of the present invention, it is proposed to use a line laser three-dimensional profilometer and a microscope for image acquisition respectively. In order to improve the detection efficiency, the present invention further proposes to use a transfer mechanism to transfer the blade from below the line laser three-dimensional profilometer to below the microscope, thereby realizing uninterrupted pipeline detection. In some of the solutions described above in this invention, due to the complexity of the blade profile (such as irregular edges or larger at the top and smaller at the bottom) and the dynamic changes in the position of the edge, it is difficult to ensure that the blade edge is always within the fixed depth of field of the lens by simply relying on the microscope path planning and movement, which may lead to local defocusing or blurring of images when acquiring side images. To address this, the present invention further proposes mounting the microscope on a three-axis transfer mechanism and configuring the mirror assembly to rotate around the lens. During the scanning process, since the scanning path obtained by the line laser three-dimensional profilometer contains the XYZ coordinates of the blade, the microscope can locate itself within a certain distance of the blade edge position based on these coordinates. At the same time, the mirror assembly is rotated to ensure that the reflected light from the mirror assembly coincides with the blade profile normal, so that the blade edge position is always within the depth of field of the lens.

[0037] Among them, a three-axis transfer mechanism refers to a mechanism that can move in three directions: X, Y, and Z. Specifically, during the scanning process, the XY movement mechanism drives the microscope to move to the preset coordinates on the blade edge according to the scanning path of the blade contour. Then, it drives the microscope to move along the blade edge, ensuring that the lens is always aligned with the blade edge position. The rotation mechanism controls the mirror group to rotate around the lens accordingly, adjusting the direction of light reflection during the microscope's movement. When the blade edge changes along the Z-axis due to contour changes, the microscope is controlled to adjust the distance between the lens and the blade edge in real time based on the field of view depth information in the blade scanning path, keeping the blade edge position within the lens's depth of field. These coordinated dynamic adjustment mechanisms effectively avoid local defocusing or image blurring caused by changes in edge position, thereby obtaining high-resolution edge microscopic image data. Thus, as... Figure 3 and Figure 4 Minor defects on the edges or sides can be identified, improving the accuracy and reliability of defect detection.

[0038] In some of the solutions described above in this invention, if the inspection report only includes basic pass / fail judgment results, it will not be able to fully reflect the specific type, location distribution, and severity of defects, resulting in a lack of data support for subsequent quality traceability and process improvement. Furthermore, incomplete information may affect the accuracy of defect analysis. To address this, this invention further proposes a blade defect inspection report that includes defect category, defect distribution location map, surface defect depth, surface defect height, and pass / fail judgment. The inspection report is generated in electronic document format, containing text descriptions and graphical data, facilitating storage and subsequent analysis.

[0039] The defect category can include at least one type of chipping, cracking, hole, material adhesion, or burr, used to distinguish the morphological characteristics of different defects; the defect distribution location map can be a two-dimensional coordinate map or a three-dimensional model map, marking the relative position of the defects on the blade surface; the surface defect height can be quantified to a micrometer level, and the peak-valley height difference of the defect area is measured by a line laser three-dimensional profilometer; the pass / fail judgment can be based on a preset defect size threshold, for example, if the chipping depth exceeds 50 micrometers, it is judged as unqualified. Example 2 The present invention further proposes a blade defect detection device, which includes a microscope, a line laser three-dimensional profilometer 800, and a transfer mechanism 900. It should be understood that Embodiment 2 is a carrier for implementing Embodiment 1, and the two are interdependent. Therefore, parts not discussed in detail in Embodiment 2 can be referred to the discussion in Embodiment 1, and similarly, parts not discussed in detail in Embodiment 1 can be referred to the discussion in Embodiment 2.

[0040] like Figure 6-12 As shown, the microscope includes a lens 100, which forms an image field of view for acquiring a target object. It also includes a sliding mechanism 200, which includes a connecting plate 210, a sliding plate 220, and a mirror assembly 230. The connecting plate 210 is rotatably disposed below the lens 100. Along the radial direction of the lens 100, the sliding plate 220 has a first sliding position and a second sliding position on the connecting plate 210. The sliding plate 220 is provided with a field of view window 221, which provides a viewing window for the lens, so as to form a first light path 300 vertically from the upper surface of the target object toward the image field of view in the first sliding position. The mirror assembly 230 is mounted below the sliding plate 220, so as to form a second light path 400 reflected from the side of the target object to the image field of view in the second sliding position.

[0041] like Figure 6 As shown, in one example of the present invention, the sliding plate 220 is slidably disposed on the connecting plate 210 by means of a slider groove structure or a slide rail structure.

[0042] The sliding components include, but are not limited to, sliding and movable structures such as slider and slide rail structures, slide rail structures, and electric slide rails. The rotating parts and the sliding plate 220 achieve precise and stable movement through the sliding components, enabling the lens 100 to switch working states quickly and accurately.

[0043] As attached Figure 6 As shown, in one example of the invention, the sliding mechanism 200 further includes a pusher 240, which has a push rod 241 located on the side of the sliding plate. The push rod 241 pushes the sliding plate 220 to switch between a first sliding position and a second sliding position. (See attached diagram) Figure 7 As shown, push rod 241 pushes sliding plate 220 to the first sliding position, forming the first optical path to obtain the blade surface image. (See attached image.) Figure 8 As shown, push rod 241 pushes sliding plate 220 to the second sliding position, at which point a second optical path is formed to obtain edge microscopic images.

[0044] The pusher 240 can be a linear motor, and the push rod 241 pushes the sliding plate 220 to move back and forth, thereby allowing the lens 100 to switch between the first optical path 300 and the second optical path 400.

[0045] As attached Figure 6As shown, in one example of the present invention, the mirror assembly 230 includes a pair of inclined plane mirrors 231, which are arranged in parallel on both sides of the viewing window 221.

[0046] The plane mirror 231 refers to an optical lens with a specific reflection angle. In a specific example of the present invention, it is a 45° plane mirror 231. Through the optical path of the deflecting lens 100, the side profile is imaged onto the microscope field of view, thereby realizing the acquisition of the blade edge image on the side.

[0047] When the plane mirror 231 and the lens 100 work together to obtain a 45° viewing angle, its core function is to change the direction and angle of the light path, reflect the light from the target object into the lens 100, so that the microscope moved above the blade can obtain a viewing angle at a 45° angle to the direct line of sight, and obtain the blade's lateral viewing angle information. In some of the above-described embodiments of the present invention, the edge side image of the blade is obtained by rotating the plane mirror 231.

[0048] As attached Figure 6 As shown, in one example of the present invention, a rotating mechanism 500 is also included. The rotating mechanism 500 includes a rotating drive 510, which drives the connecting plate 210 to rotate along the axis of the lens 100. At this time, the push rod 241 is not connected to the sliding plate 220, that is, the push rod only has a pushing function, and its direction is reversed by the rotating sliding mechanism 200. The push rod 241 can have two pushing strokes to adapt to the length difference of the starting points of the two strokes.

[0049] As attached Figure 5 As shown, in one example of the present invention, the rotation drive 510 is disposed on the lens 100 or the body on which it is mounted, and drives the connecting plate 210 to rotate via gears or a timing belt.

[0050] Furthermore, the rotary drive can be a servo motor or a stepper motor, whose output shaft is connected to a transmission assembly, such as a gear drive, a synchronous belt drive, or a worm gear drive.

[0051] In one example of the present invention, the rotary drive is a gear drive, with its driving wheel connected to the output shaft of the rotary drive and its driven wheel connected to the sliding mechanism 200 of the plane mirror 231, driving the plane mirror 231 to rotate around the microscope, as shown in the figure. The rotary drive can be connected to the stage on which the microscope is mounted, as attached. Figure 6 As shown, the sliding mechanism 200 can also be directly connected to the body of the microscope lens 100.

[0052] In one example of the present invention, a three-axis transfer mechanism 600 is also included. The three-axis transfer mechanism 600 is used to drive the lens 100 to move in the XYZ axis directions. It can be as follows: Figure 1 The three-axis transfer mechanism shown can also be other robotic arms that include XYZ axis degrees of freedom; or it can also include a worktable 700, which carries the target object and moves in the XYZ axis direction.

[0053] As attached Figure 5 As shown, the line laser 3D profilometer 800 is located at the front end of the microscope, collects the surface depth information of the blade, and sends it to the microscope so that the microscope can adjust its positional relationship with the blade.

[0054] Specifically, the line laser 3D profilometer 800 scans the blade surface and generates 3D topographic data, while simultaneously outputting the blade profile scanning path and the blade face scanning path. The generated scanning path contains depth information for each field of view, and this parameter is converted into a rapid autofocus command for the microscope. Thus, by positioning the microscope at the rear of the line laser 3D profilometer 800 and configuring a plane mirror 231 that can rotate around the microscope head 100, automatic microscopic imaging is achieved based on the blade face scanning path to complete the acquisition of blade face images, eliminating the need for manual focusing and improving inspection efficiency. Furthermore, the three-axis transfer mechanism 600 positions the lens 100 on the side of the blade according to the profile scanning path, allowing the lens 100 to travel along the blade's profile. Simultaneously, the rotation mechanism 500 rotates the mirror assembly 230 to acquire microscopic images of the side edges.

[0055] like Figure 1 As shown, the transfer mechanism 900 transfers the blade from below the line laser 3D profilometer 800 to below the microscope, thereby enabling uninterrupted, automated inspection.

[0056] The transfer mechanism 900 can be a conveyor belt or a displacement stage. The transfer mechanism 900 transfers the target object from below the line laser 3D profilometer 800 to below the microscope to improve efficiency. When the transfer mechanism 900 is a conveyor belt, the belt surface transports the blades, and its path is configured to sequentially pass through the detection stations directly below the line laser 3D profilometer 800 and the microscope. A certain distance is set between the two stations, the belt transport speed is configured, and the belt surface running direction is perpendicular or parallel to the scanning direction of the detection equipment. The conveyor belt drive system can be equipped with a servo motor and encoder to improve transmission accuracy.

[0057] Specifically, after the conveyor belt starts, the blade is placed at the beginning of the belt surface and moves at a constant speed with the belt surface to below the line laser 3D profilometer 800 to complete the 3D scan. It is then transported to the microscope for microscopic imaging. Since the conveyor belt path has been pre-calibrated, the distance between the two stations is known, and the belt drive speed is known, the movement of the blade between the two detection stations does not require secondary positioning. The microscope can determine the time it takes for the blade currently scanned at the line laser 3D profilometer 800 to reach the subsequent station.

[0058] The above description is merely a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A method for detecting defects in a cutting blade, characterized in that, include: S1. Use a line laser 3D profilometer to scan the blade surface, obtain the 3D morphology data of the blade surface, and identify blade surface defects; S2. Based on the three-dimensional topography data of the blade surface, generate a blade contour scanning path and a blade surface scanning path containing depth information of each field of view; S3. Based on the blade scanning path, a microscope is used to scan the blade surface field by field. For each field of view, the microscope is automatically focused to the best imaging position according to the depth information of each field of view and a microscopic image of the blade surface is obtained to identify blade surface defects. S4. Based on the blade contour scanning path, drive the lens of the microscope to travel around the entire circumference of the blade contour. After the light path is deflected by the reflective mirror group rotating around the lens, the camera of the microscope acquires the edge microscopic image to identify side defects. S5. Generate a blade defect detection report and store the detection results.

2. The blade defect detection method as described in claim 1, characterized in that: S1 also includes determining whether the blade is qualified. If yes, proceed to S2; otherwise, proceed to S5. S3 also includes determining whether the blade is qualified. If yes, proceed to S4; otherwise, proceed to S5.

3. The blade defect detection method as described in claim 1, characterized in that: In S3, a transfer mechanism is used to transfer the blade from below the line laser three-dimensional profilometer to below the microscope; In S4, the microscope is mounted on a three-axis transfer mechanism, and the mirror assembly is configured to rotate electrically around the lens. During the scanning process, the lens is driven to position itself at the blade edge, while the mirror assembly is controlled to rotate so that the blade edge position is always within the depth of field of the lens.

4. The blade defect detection method as described in claim 1, characterized in that: In S5, the blade defect detection report includes one or more of the following: defect category, defect distribution location map, surface defect depth, surface defect height, and pass / fail determination.

5. A blade defect detection device, used to implement the method as described in any one of claims 1-4, characterized in that, include: Line laser 3D profilometer is used to scan the blade surface, acquire the 3D topographic data of the blade surface, and generate the blade profile scanning path and the blade surface scanning path containing depth information of each field of view. The microscope, located at the rear end of the line laser three-dimensional profilometer, includes a lens and a camera. It automatically focuses according to the blade scanning path to acquire a microscopic image of the blade surface. It is equipped with a mirror group that rotates around the lens. The camera is positioned according to the blade profile scanning path and acquires a microscopic image of the edge. The image processor acquires images from the line laser 3D profilometer and the camera, identifies blade defects, and generates a blade defect detection report.

6. The blade defect detection device as described in claim 5, characterized in that: It also includes a transfer mechanism that transfers the blade from below the line laser 3D profilometer to below the lens.

7. The blade defect detection device as described in claim 5, characterized in that: It also includes a three-axis transfer mechanism, which is used to drive the lens to focus and travel along the full circumference of the blade profile.

8. The blade defect detection device as described in claim 5, characterized in that: The microscope includes a sliding mechanism, which comprises a connecting plate, a sliding plate, and a mirror assembly. The connecting plate is rotatably disposed below the lens along the radial direction of the lens. The sliding plate has a first sliding position and a second sliding position on the connecting plate. The sliding plate is provided with a field of view window to form a first optical path vertically from the upper surface of the blade toward the lens at the first sliding position, so as to acquire the blade surface image. The mirror assembly is mounted below the sliding plate to form a second optical path reflected from the side of the blade to the lens at the second sliding position, so as to acquire the edge microscopic image.

9. The blade defect detection device as described in claim 8, characterized in that: The sliding mechanism further includes a pusher having a push rod located on the side of the sliding plate, the push rod pushing the sliding plate to switch between the first sliding position and the second sliding position.

10. The blade defect detection device as described in claim 8, characterized in that: It also includes a rotating mechanism, which includes a rotating drive that drives the connecting plate to rotate along the axis of the lens.

Images