High-frequency device, high-frequency system, radar system and method for monitoring high-frequency device
By setting up a local oscillator, output port, input port, phase comparator, and monitoring device in the high-frequency equipment, the frequency signal transmission path can be monitored, solving the signal coordination problem in multiple cascaded transceiver unit systems and ensuring system stability and functional safety.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-25
- Publication Date
- 2026-03-24
AI Technical Summary
In high-frequency systems with multiple cascaded transceiver units, existing technologies struggle to effectively monitor and coordinate frequency signal transmission between the various transceiver units, leading to system instability and potential functional failures.
By setting up a local oscillator, output port, input port, phase comparison device, and monitoring device in high-frequency equipment, the generation, transmission, and phase difference monitoring of frequency signals can be realized. The frequency signals are synchronized between transceivers using coupling elements, and functional faults and phase changes are identified through phase comparison.
It enables effective monitoring of the frequency signal transmission path in high-frequency systems, identifies and prevents erroneous operating states, protects active circuit components, identifies phase changes caused by temperature fluctuations and aging, and performs recalibration.
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Figure CN121729631A_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The invention relates to a high-frequency device and to a method for monitoring such a high-frequency device. The invention also relates to a radar system having such a high-frequency device. BACKGROUND
[0002] Modern radar systems, for example for environmental recognition in motor vehicles, often utilize a plurality of transmission and reception channels. For this purpose, in particular a cascade of a plurality of transceivers is suitable. For this purpose, in addition to digital signals, high-frequency signals can also be exchanged as reference signals. In this context, for a reliable angle estimation by means of the radar system, a stable phase relationship of the reference signals at all transceivers is important.
[0003] The document DE 102018117688 A1 describes, for example, a radar method in which a high-frequency signal is transmitted from a transmission path of a first channel to a second transmission unit. SUMMARY
[0004] The invention provides a high-frequency device, a high-frequency system, a radar system and a method for monitoring a high-frequency device having the features of the independent claims. Further advantageous embodiments are the subject of the dependent claims.
[0005] According to this provision: A high-frequency device has a local oscillator, an output port, an input port, a phase comparison device and a monitoring device. The local oscillator is designed to generate a local frequency signal. This can be, for example, a signal, in particular with a predetermined frequency or a predetermined frequency curve. The output port is designed to provide the local frequency signal generated by the local oscillator. In particular, the local frequency signal can be provided via the output port for forwarding to a further high-frequency device. The input port is designed to receive an externally provided reference frequency signal. In particular, the reference frequency signal provided at the input port can be a frequency signal which is guided from the output port to the input port, for example via a suitable coupling element. The phase comparison device is designed to determine a phase difference between the local frequency signal from the local oscillator and the reference frequency signal at the input port. The monitoring device is designed to detect a functional fault in the high-frequency device. This can be, in particular, a functional fault in the transmission of the local frequency signal generated by the local oscillator. The functional fault can be determined, in particular, in the case of use of the determined phase difference, i.e. the phase difference between the local frequency signal from the local oscillator and the frequency signal at the input port.
[0006] Furthermore provided is: A high-frequency system has a first transceiver and at least one second transceiver and a coupling element. Here, the transceivers each comprise a high-frequency device according to the invention. The coupling element is designed to mutually couple the input ports and the output ports of the first transceiver and the second transceiver. In this way, for example, a frequency signal from an output port, in particular of the first transceiver, can be provided to both input ports of the first transceiver and the second transceiver. If a plurality of second transceivers is provided, a frequency signal from an output port of the first transceiver can also be provided, if necessary, to all input ports in the second transceivers here. Furthermore, by means of the coupling element, a local oscillator signal of a second or further transceiver can also be directed to a respective input port of the first transceiver.
[0007] Furthermore, it is provided that A radar system with a high-frequency system according to the invention. Here, the first transceiver and the second transceiver are each designed to output radar signals and to receive and process radar echoes to the transmitted radar signals.
[0008] Finally, it is provided that A method for monitoring a high-frequency device. The method comprises a step for generating a local frequency signal. The local frequency signal can be generated, in particular, by means of a local oscillator. Furthermore, the method comprises a step for providing the local frequency signal at an output port of the high-frequency device. Furthermore, the method comprises a step for receiving a reference frequency signal. The reference frequency signal can be received, in particular, at an input port of the high-frequency device. The method further comprises a step for determining a phase difference between the local frequency signal and the reference frequency signal. Finally, the method comprises a step for detecting a functional fault, in particular, in the transmission of the local frequency signal. The functional fault can be detected, in particular, using the determined phase difference between the local frequency signal and the reference frequency signal.
[0009] Advantages of the invention The invention is based on the recognition that in a high-frequency system with a plurality of cascaded transceiver units, the signals emitted by the individual transceiver units should be coordinated with one another. For this purpose, for example, a local frequency signal can be generated by a master high-frequency unit, which local frequency signal can also be provided to one or more further (secondary) high-frequency units. For this purpose, in each high-frequency unit, an output for providing the local frequency signal and an input for receiving a frequency signal from a further high-frequency unit can be provided. For correct functioning, it is necessary here for the frequency signals to be transmitted correctly and reliably.
[0010] Herein, the application provides for monitoring the provision and distribution of frequency signals. In particular, by means of the concept according to the application it is possible to check the functionality of the transmission path for distributing frequency signals and of the local oscillators used. The concept provided according to the application can be implemented here with minimal hardware and software outlay.
[0011] In particular, the required modifications can be implemented in conventional high-frequency devices such that each high-frequency device can be used both as a primary device for generating and providing a local frequency signal and as a secondary device for receiving and utilizing a reference frequency signal from a primary device. It is thus possible to use the same high-frequency device for all high-frequency devices of a cascaded high-frequency system having a plurality of high-frequency devices.
[0012] By means of the monitoring according to the application, on the one hand, it is possible to identify defects, for example, sudden partial degradations. For example, a change in the electrical phase due to a change at a solder joint or the like can be detected. By means of the detection of such defects, it is possible to avoid false operating states and undefined behavior of the system. In particular, it is also possible to protect active circuit components in the high-frequency device that are threatened in the event of an error in the transmission of the local frequency signal. It is thus possible to monitor and protect the functional safety of the entire system.
[0013] Furthermore, by means of the monitoring of the transmission of frequency signals according to the application, it is also possible to identify and, if necessary, correct changes due to temperature fluctuations or aging and the associated phase reference fluctuations. For example, it is possible to perform a recalibration during operation on the basis of the monitoring according to the application.
[0014] According to an embodiment, the input port is designed for receiving the local frequency signal provided at the output port as a reference frequency signal. In particular, it is possible to provide an external coupling device between the output port and the input port via which the reference signal from the output port is provided at the input port.
[0015] According to an embodiment, the monitoring device is designed for storing an initial phase difference between the local frequency signal from the local oscillator and the frequency signal at the input port. For this purpose, a suitable storage element can be provided if necessary. In this case, the monitoring device can be designed for detecting a functional failure if the phase difference between the local frequency signal from the local oscillator and the frequency signal at the input port deviates from the stored initial phase difference by more than a predetermined threshold value. In particular, when observing the deviation between the initial phase difference and the currently determined phase difference, it is possible to observe on the basis of the magnitude, i.e. unsigned.
[0016] According to an embodiment, the high-frequency device comprises a first frequency multiplier and a second frequency multiplier. The first frequency multiplier is designed for multiplying the frequency of the local frequency signal by a predetermined factor. The second frequency multiplier is designed for multiplying the frequency of the reference frequency signal by a predetermined factor. In other words, the frequencies of the local frequency signal and the reference frequency signal are multiplied by the same factor. In this case, the phase comparison device can be designed for determining the phase difference using the signals having the multiplied frequencies.
[0017] According to an embodiment, a reception path and a first mixer are provided in the high-frequency device. The reception path is designed for receiving an external high-frequency signal. Furthermore, the reception path comprises a coupling element. The coupling element is designed for coupling the high-frequency signal into the reception path. Here, the high-frequency signal coupled into the reception path is generated using a reference signal received at an input port. The first mixer is designed for mixing the signal in the reception path and a local frequency signal generated by a local oscillator. The resulting signal can be provided by the mixer to the phase comparison device. Here, the coupling element in the reception path and the mixer can be components of a circuit device for built-in self-test (BIST).
[0018] According to an embodiment, a transmission path is provided in the high-frequency device. The transmission path can be designed for outputting a high-frequency signal. Furthermore, the transmission path is designed for generating the high-frequency signal using a reference signal received at an input port. A further coupling element can be provided in the transmission path. The further coupling element is designed for coupling out the high-frequency signal to be output and providing the coupled-out high-frequency signal at the coupling element of the reception path. The further coupling element for coupling out the high-frequency signal from the transmission path can also be part of a BIST circuit device. This embodiment is possible in particular if the sources of the high-frequency signals in the transmission path and the reception path can be selected independently between the local oscillator signal and the reference signal.
[0019] According to an embodiment, the high-frequency device comprises a test device. The test device can be an internal circuit for self-test (BIST) in particular. The test device comprises a test signal generator and a second mixer. The test signal generator is designed for generating a test signal. The second mixer is designed for mixing the test signal with the high-frequency signal to be coupled into the reception path before the coupling. In this case, the determination of the phase difference between the local frequency signal and the reference frequency signal can be carried out in the frequency range of the test signal.
[0020] According to an embodiment, the coupling device comprises a ring coupler, a hybrid coupler or a network with multiple Wilkinson power dividers. Such a coupling device between individual high-frequency devices can provide a frequency signal from a local oscillator provided at the output port of a primary high-frequency device at one or more further secondary high-frequency devices. Furthermore, at least the coupling device is also able to simultaneously provide a frequency signal at the input port of the primary high-frequency device. In particular, the coupling device also enables a frequency signal from an output port of a secondary high-frequency device to be provided at an input port of the secondary high-frequency device.
[0021] According to an embodiment, the second transceiver is designed for signal generation and processing using the local high-frequency signal of the first transceiver received at the input port of the second transceiver. In other words, the signal generation or processing in the second transceiver is not based on a locally generated frequency signal, but on an externally provided frequency signal. Thereby, a plurality of transceivers can be synchronized with one another.
[0022] The above configurations and extensions can be combined with one another arbitrarily within reasonable limits. Further configurations, extensions and implementation forms of the application also include combinations of the features of the application described above or below with respect to the embodiments which are not explicitly mentioned. In particular, individual aspects can also be added to the respective basic form of the application by the person skilled in the art as improvements or supplements. BRIEF DESCRIPTION OF DRAWINGS
[0023] Further features and advantages of the present application will be explained below with the aid of the drawings. Shown here are: Figure 1 schematic diagram of a high-frequency system with high-frequency devices according to an embodiment; Figure 2 schematic diagram of a phase comparison device according to an embodiment; Figures 3a-3d schematic diagram of an embodiment of a coupling device which can be used in a high-frequency system according to an embodiment; Figure 4 schematic diagram of a high-frequency system with multiple high-frequency devices according to an embodiment; Figure 5 schematic diagram of a high-frequency system with multiple high-frequency devices according to another embodiment; Figure 6 flow diagram on which a method for operating high-frequency devices according to an embodiment is based; and Figure 7 schematic diagram of a conventional high-frequency system. DETAILED DESCRIPTION
[0024] Figure 7A schematic diagram of a conventional high-frequency system with two cascaded high-frequency devices 100, 200 is shown. The two high-frequency devices 100, 200 can be transceivers for a radar system, for example. Each of the transceivers can comprise one or more transmit paths 140 for emitting radar signals and one or more receive paths 130 for receiving radar echoes. A local oscillator 110 can be provided in the primary high-frequency device 100. The local oscillator 110 can provide a frequency signal for the transmit paths 140 as well as for the receive paths 130.
[0025] In addition, the frequency signal of the local oscillator 110 can be provided at an output port 121. The frequency signal provided at the output port 121 can be provided at an input port 222 of the secondary high-frequency device 200 via a suitable connection. Thus, the secondary high-frequency device 200 can utilize the frequency signal from the primary high-frequency device 100 as a reference frequency signal for the transmit paths 240 and the receive paths 230.
[0026] Figure 1 A schematic diagram of a high-frequency system with a plurality of high-frequency devices 1, 2 according to an embodiment of the application is shown. The high-frequency devices 1, 2 of the high-frequency system can likewise be transceivers, in particular transceivers of a radar system, for example. In particular, the individual high-frequency devices 1, 2 can be integrated circuits or components, for example, in which the components described below are integrated in a microchip, for example. Here, the individual high-frequency devices 1, 2 can be arranged on a common carrier substrate, for example a common circuit board, for example.
[0027] The high-frequency devices 1, 2 of the high-frequency system differ from conventional high-frequency devices in particular in that a possibility is provided in the high-frequency devices 1, 2 according to the application to monitor the generation and transmission of a frequency signal, in particular a local frequency signal. Errors, for example interruptions in the signal guidance or similar errors, can thereby be identified. In addition, changes in the phase curve due to temperature fluctuations or aging effects can also be identified and, if necessary, corrected, for example.
[0028] Here, the individual high-frequency devices 1, 2 in the high-frequency system can be constructed identically in principle. Thus, identical components can be used for the high-frequency devices referred to below as primary high-frequency devices 1 or secondary high-frequency devices 2. Here, the high-frequency device in which a local frequency signal is generated by means of a local oscillator 10 is referred to as a primary high-frequency device 1. The locally generated frequency signal can also be provided to a further secondary high-frequency device 2, so that all high-frequency devices 1, 2 can be operated on the basis of the same frequency signal. For the operational operation, the signal of the local oscillator 10 of the secondary high-frequency device 2 is not utilized here.
[0029] Even if only one secondary high-frequency device 2 is described in the examples described herein, respectively, the application is not limited to this implementation. Rather, two or more secondary high-frequency devices 2 can also be provided.
[0030] The individual high-frequency devices 1, 2 are connected to one another via a coupling device 3. This coupling device 3 makes it possible to provide the frequency signal provided at the output port 21 of the local oscillator 11 at the input port 22 of the primary high-frequency device 1 and of the secondary high-frequency device 2. In addition, the coupling device 3 can also provide the frequency signal from the secondary high-frequency device 2 provided at the output port 21 during the test run described below at the input port of the secondary high-frequency device 2 and, if necessary, at the input port 22 of the primary high-frequency device 1. Possible implementations of this coupling device 3 will be described in more detail below.
[0031] Since the primary high-frequency device 1 and the secondary high-frequency device 2 can be identical in structure as described above, the structure of the high-frequency device will be explained in more detail below only by way of example for the primary high-frequency device 1.
[0032] The high-frequency device 1 comprises the local oscillator 10 already described above, at least one transmission path 41 and, if necessary, one or more further optional transmission paths 42. In addition, the high-frequency device 1 comprises at least one reception path 31 and, if necessary, one or more further reception paths 32. For processing, a memory and a signal processing device 60 are provided.
[0033] The frequency signal generated by the local oscillator 10 can be provided directly at the transmission paths 41, 42 and at the reception paths 31, 32 in the primary high-frequency device 1. Alternatively, in the secondary high-frequency device 2, the reference frequency signal from the input port 22 can be provided at the transmission paths 41, 42 and at the reception paths 31, 32. In order to select the respective frequency signal depending on the operation as primary high-frequency device 1 or secondary high-frequency device 2, for example, a switching element 53 can be provided.
[0034] Optionally, the frequency of the frequency signal from the local oscillator 10 can be increased by means of a frequency multiplier 51. For this purpose, any suitable known circuit solution is possible. In the same way, the reference frequency signal from the input port 22 can also be increased by means of a further frequency multiplier 52. Here, both frequency multipliers 51, 52 use the same factor to increase the frequency signal, respectively.
[0035] In Figure 1In the embodiment shown in the middle, the frequency signal from the local oscillator 10, if necessary after frequency multiplication, and the frequency signal provided at the input port 22, if necessary after the same frequency multiplication, are supplied to the phase comparison device 70. Here, the frequency signal present at the input port 22 can be the frequency signal which, via the coupling device 3, comes from the output port 21 and thus from the local oscillator 10. Alternatively, suitable amplifiers can be provided at the output port 21 as well as at the input port 22.
[0036] The phase comparison device 70 determines the phase difference between the local frequency signal from the local oscillator 10 and the frequency signal at the input port 22. Using the phase difference determined, the monitoring device 80 can subsequently detect possible functional faults. To this end, for example, the currently determined phase difference can be compared with a previously determined reference value. If the current phase difference deviates from the reference value by more than a predetermined threshold value, this can be evaluated as an indication of a possible functional fault. If the currently determined phase difference deviates by less than a predetermined threshold value, the phase difference can be tolerated and no functional fault is detected.
[0037] As a reference value for evaluating the phase difference, for example, an initial phase difference can first be determined and stored at commissioning or initialization. To this end, for example, a suitable memory can be provided.
[0038] Here, the functional fault can be, for example, an interference, for example an interruption in the signal flow for forwarding the local frequency signal. But other disturbances or errors can also be detected, for example a sudden occurrence of a degradation, for example a change in the phase curve due to a damaged solder joint or the like. It can be determined, for example, whether there is an error or the like in the signal flow from the local oscillator 10 via the output port 21, the coupling device 3, the input port 22 to the phase comparison device 70.
[0039] Since the same check can also be carried out in the secondary high-frequency device 2 using the local oscillator provided therein, in this way the complete signal flow path for the propagation of the frequency signal can be checked.
[0040] In addition to the check for functional faults, for example interferences, in particular interruptions, changes in the phase curve can also be detected. Such changes in the phase curve can occur, for example, due to temperature fluctuations or aging effects. Here, a change in the phase difference can be determined, for example with respect to an initially stored phase difference. This deviation can be used, for example, for recalibration during operation.
[0041] In one embodiment, for monitoring the phase difference, also the PLL implemented in the high-frequency device 1, 2 can be utilized. This can be adjusted to the same integer multiple of the signal at the common reference input in order to provide a phase reference for the implemented phase-recognizing mixer.
[0042] Figure 2 A schematic diagram showing the schematic structure of a phase comparison device 70 according to one embodiment is shown. In the embodiment shown here, for example, on the input side a mixer 71 can be supplied with a signal from the local oscillator 10 on the one hand (after frequency multiplication if necessary) and with a signal from the input port 22 on the other hand (again after the same frequency multiplication if necessary). The resulting output signal of the mixer 71 can then be supplied to a frequency filter 72 and, if necessary, to an amplifier 73. For further digital processing, the resulting signal can be digitized by means of a suitable analog-digital converter 74. The digital output signal thus obtained can then be supplied to a monitoring device 80 for further evaluation.
[0043] As will be explained in more detail below, further alternative embodiments for determining the phase difference are also possible.
[0044] Figure 3a A schematic diagram showing a coupling device 3 according to one embodiment is shown. On the side shown on the left, the output ports 21 of the respective high-frequency devices 1, 2 can be connected. As already explained, an arrangement with more than two high-frequency devices 1, 2, in particular a plurality of secondary high-frequency devices 2, is in principle also possible. In this case, the output ports 21 of all high-frequency devices 1, 2 can be connected to the coupling device 3. Similarly, the input ports 22 of all high-frequency devices 1, 2 can be connected to the respective ports (shown on the right) of the coupling device 3.
[0045] Figure 3b A schematic diagram showing a coupling device 3 according to one embodiment is shown. In the embodiment shown here, for example, a ring coupler can be provided in the coupling device 3.
[0046] Figure 3c A schematic diagram showing a coupling device 3 according to another embodiment is shown. In the embodiment shown here, for example, a hybrid coupler can be provided in the coupling device 3.
[0047] Figure 3d A schematic diagram showing a coupling device 3 according to yet another embodiment is shown. In the embodiment shown here, for example, a network with a Wilkinson power divider can be provided in the coupling device 3.
[0048] Figure 4A schematic diagram of a high-frequency device 1 according to another embodiment is shown. Since the primary high-frequency device 1 and the secondary high-frequency device 2 in the high-frequency system are usually embodied identically as described above, only the high-frequency device in the form of the primary high-frequency device 1 is described for the following embodiment. The discussions apply analogously to the secondary high-frequency device 2.
[0049] According to Figure 4 The high-frequency device 1 according to
[0050] For checking the signal path for providing the frequency signal from the local oscillator 10, for example, the signal from the input port 22, if necessary after frequency multiplication, can be combined with a test signal from the test signal generator 90 by means of the mixer 91. In this way, the frequency signal from the input port 22 is fed into the signal path of the respective receiving path 31.
[0051] Furthermore, the signal from the local oscillator 10, after a respective identical frequency multiplication, can be supplied to the mixer 36 in the receiving path 31. The output signal of the mixer 36 can be supplied to the digital signal processing 60 after a respective further processing, for example, filtering by the filter 37, amplification by the amplifier 38, and analog-digital conversion in the A / D converter 39. Here, in the signal processing 60, the phase difference between the frequency signal from the local oscillator 10 and the frequency signal at the input port 22 can be determined by means of the unit 70. As described above, this phase difference can be evaluated in order to detect a functional fault or to perform a recalibration if necessary.
[0052] For selecting or distributing the local frequency signal from the local oscillator 10 and the frequency signal from the input port 22, a switching element 53 can be provided in the high-frequency device 1, which can supply the respective frequency signal (from the local oscillator 10 or from the input port 22) to the receiving paths 31, in particular to the mixers 36, and to the transmitting path 41. Furthermore, a switching element 54 can be provided, which can supply the respective frequency signal (from the input port 22 or from the local oscillator 10) to the mixer 91 in the path for self-testing.
[0053] Figure 5 A schematic diagram of a high-frequency device 1 according to another embodiment is shown. In accordance with Figure 5In an embodiment, the frequency signal from the local oscillator 10 or the input port 22 can alternatively be supplied to the at least one transmission path 41 by means of the switching element 54. In order to examine the signal path for distributing the frequency signal between the individual high-frequency devices 1, 2, the frequency signal from the input port 22 can here be supplied to the at least one transmission path 41. The output signal of the transmission path 41 can be coupled out by means of a further coupling element 45, and the coupled-out signal can be mixed with a test signal from a test signal generator 90 by means of a mixer 91, analogously to the previously described embodiment.
[0054] If the frequency signal from the local oscillator 10 is supplied to the mixer 36 in the reception path 31 here, the phase difference between the frequency signal of the local oscillator 10 and the frequency signal at the input port 22 can also be determined here analogously to the previously described embodiment.
[0055] Figure 6 A flow chart on the basis of which a method for monitoring a high-frequency device 1, 2 according to an embodiment is shown. The method can in principle comprise any steps as it has been described previously in connection with the high-frequency system, in particular the high-frequency device 1, 2, for the purpose of carrying out an examination of the signal path for transmitting a frequency signal. Similarly, the previously described high-frequency device 1, 2 can also comprise any components required for implementing the method described below.
[0056] In step S1, a local frequency signal is generated. The local frequency signal can in particular be generated by means of a local oscillator 10.
[0057] In step S2, the local frequency signal is provided at an output port 21 of the high-frequency device 1, 2.
[0058] In step S3, a reference frequency signal is received at an input port 22 of the high-frequency device 1, 2. The received reference frequency signal can in particular be the frequency signal which is forwarded from the output port 21 to the input port 22 by means of the coupling device 3.
[0059] In step S4, a phase difference between the local frequency signal and the reference frequency signal is determined.
[0060] Finally, in step S5, a functional fault in the transmission of the local frequency signal is detected. The functional fault can in particular be detected using the determined phase difference between the local frequency signal and the reference frequency signal.
[0061] In addition to detecting a functional fault, the phase difference can also be used to perform a recalibration during operation of the high-frequency device 1, 2. This can in particular be done when a change in the phase response of the propagation path occurs due to changes over time, for example due to temperature fluctuations or aging effects.
[0062] In summary, the present application relates to the monitoring of a transmission path of a distribution of a frequency signal for synchronizing a plurality of cascaded high-frequency devices. For this purpose, the frequency signal is supplied to a phase comparison device via two different paths, wherein one path comprises at least a part of the signal path for transmitting the frequency signal to a further high-frequency device.
Claims
1. A high-frequency device (1, 2), comprising: Local oscillator (10), the local oscillator being designed to generate a local frequency signal; Output port (21), the output port is designed to provide the local frequency signal generated by the local oscillator (10); Input port (22), the input port is designed to receive an externally provided reference frequency signal; A phase comparator (70) is designed to determine the phase difference between the local frequency signal from the local oscillator (10) and the reference frequency signal at the input port (22); A monitoring device (80) is designed to detect a functional failure in the transmission of the local frequency signal generated by the local oscillator (10) using the phase difference between the local frequency signal from the local oscillator (10) and the frequency signal at the input port (22).
2. The high-frequency equipment (1, 2) according to claim 1, wherein, The input port (22) is designed to receive the local frequency signal provided at the output port (21) as a reference frequency signal via an external coupling device (3).
3. The high-frequency device (1, 2) according to claim 1 or 2, wherein, The monitoring device (80) is designed to store an initial phase difference between the local frequency signal from the local oscillator (10) and the frequency signal at the input port (22), and to detect a functional failure if the phase difference between the local frequency signal from the local oscillator (10) and the frequency signal at the input port (22) deviates from the stored initial phase difference by a predetermined threshold.
4. The high-frequency device (1, 2) according to any one of claims 1 to 3, comprising: A first frequency multiplier (51), the first frequency multiplier being designed to multiply the frequency of the local frequency signal by a predetermined factor, and A second frequency multiplier (52) is designed to multiply the frequency of the reference frequency signal by the predetermined factor. in, The phase comparison device (70) determines the phase difference using a signal with a multiplied frequency.
5. The high-frequency device (1, 2) according to any one of claims 1 to 4, comprising: Receiver path (31), the receiver path is designed to receive external high-frequency signals, wherein, The receiving path (31) includes a coupling element (35) designed to couple a high-frequency signal into the receiving path (31), the high-frequency signal having been generated using a reference signal received at the input port (22), and A mixer (36) is designed to mix the input signal in the receiving path (31) with the local frequency signal generated by the local oscillator (10) and provide it at the phase comparison device (70).
6. The high-frequency device (1, 2) according to claim 5, having a transmission path (41) designed for outputting high-frequency signals, in, The transmission path (41) is designed to generate the high-frequency signal using the reference signal received at the input port (22), and The transmitting path (41) includes an additional coupling element (45) designed to couple the high-frequency signal to be output and provide the coupled high-frequency signal at the coupling element (35) of the receiving path (31).
7. The high-frequency equipment (1, 2) according to claim 6, comprising a testing device, wherein, The test apparatus includes a test signal generator (90) and an additional mixer (91). The test signal generator (90) is designed to generate test signals, and The additional mixer (91) is designed to mix the test signal with the high-frequency signal to be coupled in before coupling the input into the receiving path (31).
8. A high-frequency system, comprising: First transceiver; Second transceiver; and Coupling device (3). in, The first transceiver and the second transceiver each comprise the high-frequency device (1, 2) according to any one of claims 1 to 7, and The coupling device (3) is designed to couple the input ports (22) and output ports (21) of the first transceiver and the second transceiver to each other.
9. The high-frequency system according to claim 8, wherein, The coupling device (3) includes a ring coupler, a hybrid coupler, or a network with multiple Wilkinson power dividers.
10. The high-frequency system according to claim 8 or 9, wherein, The second transceiver is designed to perform signal generation and processing using a local high-frequency signal from the first transceiver received at the input port (22) of the second transceiver.
11. A radar system comprising a high-frequency system according to any one of claims 8 to 10, wherein, The first transceiver and the second transceiver are respectively designed to output radar signals and receive and process radar echoes in response to the transmitted radar signals.
12. A method for monitoring high-frequency devices (1, 2), comprising the following steps: A local frequency signal (S1) is generated using a local oscillator (10); The local frequency signal (S2) is provided at the output port of the high-frequency devices (1, 2); A reference frequency signal (S3) is received at the input port (21) of the high-frequency devices (1, 2); Determine (S4) the phase difference between the local frequency signal and the reference frequency signal; and Using the obtained phase difference between the local frequency signal and the reference frequency signal, a functional fault is detected (S5) during the transmission of the local frequency signal.
Citation Information
Patent Citations
Radar front end with RF oscillator monitoring
DE102018117688A1