Fault state detection method of temperature sensor, electronic equipment and storage medium

Abstract

The invention discloses a fault state detection method of a temperature sensor. The method comprises the following steps: acquiring a first original temperature data set of a first target temperature sensor, wherein the first original temperature data set comprises original temperature data sampled by the first target temperature sensor in a sampling period and a corresponding timestamp; determining a first temperature rise rate sequence according to the first original temperature data set; and determining a first temperature rise rate state of the first temperature rise rate sequence according to the temperature rise rate threshold. And under the condition that the first temperature rise rate state is abnormal, determining a temperature rise rate abnormal point in the first temperature rise rate sequence and an abnormal sampling interval in a sampling period corresponding to the temperature rise rate abnormal point. And determining whether the first target temperature sensor has a fault according to a second temperature rise rate state of at least one second target temperature sensor associated with the first target temperature sensor in the abnormal sampling interval. Therefore, the accuracy of fault state detection can be improved, and the false alarm rate and the missing report rate are reduced.

Description

Technical Field

[0001] This invention relates to the field of battery testing technology, and in particular to a method for detecting the fault status of a temperature sensor, an electronic device, and a computer-readable storage medium. Background Technology

[0002] In related technologies, fault diagnosis of temperature sensors in battery management systems is often based on fixed temperature thresholds. However, this approach cannot distinguish whether the increase in battery temperature is caused by factors such as the environment in which the battery management system operates, or by a fault in the temperature sensor itself, resulting in insufficient accuracy in fault diagnosis. Summary of the Invention

[0003] This application provides a method for detecting the fault status of a temperature sensor, an electronic device, and a computer-readable storage medium.

[0004] This application provides a method for detecting the fault state of a temperature sensor, the method comprising:

[0005] Obtain the first raw temperature dataset of the first target temperature sensor, which includes the raw temperature data sampled by the first target temperature sensor during the sampling period and the corresponding timestamps.

[0006] Based on the first original temperature dataset, determine the first temperature rise rate sequence;

[0007] Based on the temperature rise rate threshold, determine the first temperature rise rate state of the first temperature rise rate sequence;

[0008] In the case of an abnormal state of the first temperature rise rate, the abnormal point of temperature rise rate in the first temperature rise rate sequence is determined, and the abnormal sampling interval within the sampling period corresponding to the abnormal point of temperature rise rate is determined.

[0009] Based on the second temperature rise rate state of at least one second target temperature sensor associated with the first target temperature sensor in the abnormal sampling interval, it is determined whether the first target temperature sensor is faulty.

[0010] Thus, a first raw temperature dataset from the first target temperature sensor is obtained, comprising raw temperature data sampled by the first target temperature sensor within a sampling period and corresponding timestamps. Next, a first temperature rise rate sequence is determined based on the first raw temperature dataset. Then, a first temperature rise rate state is determined based on a temperature rise rate threshold. Next, if the first temperature rise rate state is abnormal, abnormal temperature rise rate points in the first temperature rise rate sequence and the abnormal sampling intervals within the sampling period corresponding to these abnormal points are identified. Finally, based on the second temperature rise rate state of at least one second target temperature sensor associated with the first target temperature sensor within the abnormal sampling interval, it is determined whether the first target temperature sensor is faulty. In this way, determining abnormal temperature rise rate points using a temperature rise rate threshold and combining this with synchronous detection by at least one associated second target temperature sensor can improve the accuracy of temperature sensor fault state detection and reduce false alarm and false negative rates.

[0011] In some implementations, determining the first temperature rise rate sequence based on the first original temperature dataset includes:

[0012] The raw temperature data in the first raw temperature dataset is transformed to determine the target temperature sequence.

[0013] Based on the target temperature sequence, determine the first temperature rise rate sequence that is time-matched to the target temperature sequence.

[0014] Thus, the raw temperature data in the first raw temperature dataset undergoes data transformation to determine the target temperature sequence. Next, based on the target temperature sequence, a first temperature rise rate sequence that temporally matches the target temperature sequence is determined. This data transformation process ensures the standardization and accuracy of the target temperature sequence, providing a reliable data source for the subsequent calculation of the first temperature rise rate sequence. Furthermore, by determining a first temperature rise rate sequence that temporally matches the target temperature sequence, the limitation of relying on static temperature values ​​in identifying transient anomalies can be avoided, providing a data foundation for subsequent anomaly detection based on temperature rise rate thresholds.

[0015] In some embodiments, the target temperature sequence includes the temperature values ​​of the first target temperature sensor within the sampling period and the corresponding timestamps. The step of determining the first temperature rise rate sequence that time-matches the target temperature sequence includes:

[0016] Based on the order of the timestamps corresponding to the temperature values ​​in the target temperature sequence, the target temperature sequence is divided into multiple temperature subsequences, wherein each temperature subsequence includes two adjacent timestamps and the corresponding temperature values;

[0017] Calculate the time difference and temperature difference between two timestamps within each temperature subsequence, where the time difference is the difference between the later timestamp and the earlier timestamp, and the temperature difference is the difference between the temperature value corresponding to the later timestamp and the temperature value corresponding to the earlier timestamp.

[0018] Calculate the temperature rise rate for each segment of the temperature subsequence based on the temperature difference and the time difference.

[0019] Based on the order of the timestamps corresponding to the temperature subsequences, the temperature rise rates corresponding to each segment of the temperature subsequences are arranged sequentially to form the first temperature rise rate sequence.

[0020] Thus, based on the timestamps corresponding to the temperature values ​​in the target temperature sequence, the target temperature sequence is divided into multiple temperature subsequences in order of the timestamps. Each temperature subsequence includes two adjacent timestamps and their corresponding temperature values. Next, the time difference and temperature difference between the two timestamps within each temperature subsequence are calculated. The time difference is the difference between the preceding and following timestamps, and the temperature difference is the difference between the temperature value corresponding to the following timestamp and the temperature value corresponding to the preceding timestamp. Then, based on the temperature difference and time difference, the temperature rise rate of each temperature subsequence is calculated. Finally, based on the order of the timestamps corresponding to the temperature subsequences, the temperature rise rates corresponding to each temperature subsequence are arranged sequentially to form the first temperature rise rate sequence. In this way, by determining the first temperature rise rate sequence that matches the time sequence of the target temperature sequence, the limitation of relying on static temperature values ​​in identifying instantaneous anomalies can be avoided, providing a data foundation for subsequent anomaly detection based on temperature rise rate thresholds.

[0021] In some embodiments, the method further includes:

[0022] Based on the obtained operating condition data of the battery management system, the temperature rise rate threshold is determined. The battery management system includes a first target temperature sensor and a second target temperature sensor. The operating condition data includes at least one of the following: the system operating status of the battery management system, the ambient temperature of the environment in which the battery management system is located, and the charging and discharging current value of the battery management system.

[0023] Thus, based on the acquired operating condition data of the battery management system, a temperature rise rate threshold is determined. The battery management system includes a first target temperature sensor and a second target temperature sensor. The operating condition data includes at least one of the following: the system operating status of the battery management system, the ambient temperature of the environment in which the battery management system operates, and the charging / discharging current value of the battery management system. By determining the temperature rise rate threshold using the operating condition data of the battery management system, the temperature rise rate threshold can be accurately matched to different application scenarios, thereby improving the accuracy of temperature sensor fault state detection and reducing false alarm and false negative rates.

[0024] In some implementations, determining the temperature rise rate threshold based on the acquired battery management system operating data includes:

[0025] When the battery management system is in a static state, the first base temperature rise rate threshold is updated based on the ambient temperature to determine the temperature rise rate threshold, wherein the first base temperature rise rate threshold is a pre-determined base temperature rise rate threshold when the battery management system is in the static state.

[0026] Thus, when the battery management system is in a static state, the first base temperature rise rate threshold is updated based on the ambient temperature to determine the temperature rise rate threshold. This first base temperature rise rate threshold is a pre-determined base temperature rise rate threshold for the battery management system in a static state. By selecting the first base temperature rise rate threshold in a static state and updating it based on the ambient temperature, the temperature rise rate threshold can be matched to scenarios with different ambient temperatures under static conditions, providing a reliable criterion for subsequent fault diagnosis based on the temperature rise rate sequence.

[0027] In some embodiments, when the battery management system is in a quiescent state, updating the first base temperature rise rate threshold based on the ambient temperature to determine the temperature rise rate threshold includes:

[0028] When the ambient temperature is greater than a first ambient temperature threshold or less than a second ambient temperature threshold, the temperature rise rate threshold is determined by multiplying a first preset relaxation coefficient by a first base temperature rise rate threshold, wherein the second ambient temperature threshold is less than the first ambient temperature threshold.

[0029] When the ambient temperature is less than or equal to the first ambient temperature threshold and greater than or equal to the second ambient temperature threshold, the first base temperature rise rate threshold is determined as the temperature rise rate threshold.

[0030] Thus, when the ambient temperature is greater than a first ambient temperature threshold or less than a second ambient temperature threshold, the temperature rise rate threshold is determined by multiplying a first preset relaxation coefficient by a first base temperature rise rate threshold, wherein the second ambient temperature threshold is less than the first ambient temperature threshold. Next, when the ambient temperature is less than or equal to the first ambient temperature threshold and greater than or equal to the second ambient temperature threshold, the first base temperature rise rate threshold is determined as the temperature rise rate threshold. In this way, by dividing the ambient temperature range using the first and second ambient temperature thresholds, precise adaptation between the temperature rise rate threshold and the ambient temperature can be achieved under static conditions, thereby improving the accuracy and reliability of temperature sensor fault diagnosis in static states.

[0031] In some implementations, determining the temperature rise rate threshold based on the acquired battery management system operating data includes:

[0032] When the battery management system is in operation, the second basic temperature rise rate threshold is updated based on the ambient temperature and the charge / discharge current value to determine the temperature rise rate threshold, wherein the second basic temperature rise rate threshold is a pre-determined basic temperature rise rate threshold when the battery management system is in operation.

[0033] Thus, when the battery management system is in operation, the second basic temperature rise rate threshold is updated based on the ambient temperature and charge / discharge current values ​​to determine the temperature rise rate threshold. This second basic temperature rise rate threshold is a pre-determined base temperature rise rate threshold for the battery management system under operating conditions. By selecting the second basic temperature rise rate threshold in a static state and updating it based on ambient temperature and charge / discharge current values, the temperature rise rate threshold can be matched to scenarios with different ambient temperatures and charge / discharge current values ​​during operation, providing a reliable criterion for subsequent fault diagnosis based on the temperature rise rate sequence.

[0034] In some embodiments, when the battery management system is in operation, updating the second base temperature rise rate threshold based on the ambient temperature and the charge / discharge current value to determine the temperature rise rate threshold includes:

[0035] If the ambient temperature is greater than the first ambient temperature threshold or less than the second ambient temperature threshold, and the charging / discharging current value is greater than or equal to the first preset current threshold, the temperature rise rate threshold is determined according to the product of the second preset relaxation coefficient, the first preset current correlation adjustment coefficient and the second basic temperature rise rate threshold, wherein the second ambient temperature threshold is less than the first ambient temperature threshold.

[0036] If the charging and discharging current value is less than the first preset current threshold, and the charging and discharging current value is greater than or equal to the second preset current threshold, the temperature rise rate threshold is determined according to the product of the second preset relaxation coefficient, the second preset current correlation adjustment coefficient and the second basic temperature rise rate threshold, wherein the first preset current threshold is greater than the second preset current threshold.

[0037] If the charge / discharge current value is less than the second preset current threshold, the temperature rise rate threshold is determined based on the product of the second preset relaxation coefficient and the second basic temperature rise rate threshold.

[0038] Thus, when the ambient temperature is greater than a first ambient temperature threshold or less than a second ambient temperature threshold, if the charging / discharging current value is greater than or equal to a first preset current threshold, the temperature rise rate threshold is determined based on the product of a second preset relaxation coefficient, a first preset current correlation adjustment coefficient, and a second basic temperature rise rate threshold, where the second ambient temperature threshold is less than the first ambient temperature threshold. If the charging / discharging current value is less than the first preset current threshold but greater than or equal to the second preset current threshold, the temperature rise rate threshold is determined based on the product of a second preset relaxation coefficient, a second preset current correlation adjustment coefficient, and a second basic temperature rise rate threshold, where the first preset current threshold is greater than the second preset current threshold. If the charging / discharging current value is less than the second preset current threshold, the temperature rise rate threshold is determined based on the product of a second preset relaxation coefficient and a second basic temperature rise rate threshold. In this way, when the battery is in an extreme environment where the ambient temperature is greater than the first ambient temperature threshold or less than the second ambient temperature threshold, dynamically adjusting the temperature rise rate threshold by the charging / discharging current value can improve the accuracy of temperature sensor fault diagnosis in extreme environments, thereby effectively reducing the false alarm rate and the missed alarm rate.

[0039] In some embodiments, when the battery management system is in operation, updating the second base temperature rise rate threshold based on the ambient temperature and the charge / discharge current value to determine the temperature rise rate threshold includes:

[0040] When the ambient temperature is less than or equal to a first ambient temperature threshold and greater than or equal to a second ambient temperature threshold, if the charging and discharging current value is greater than or equal to a first preset current threshold, the temperature rise rate threshold is determined according to the product of the first preset current correlation adjustment coefficient and the second basic temperature rise rate threshold, wherein the second ambient temperature threshold is less than the first ambient temperature threshold.

[0041] If the charging and discharging current value is less than the first preset current threshold and the charging and discharging current value is greater than or equal to the second preset current threshold, the temperature rise rate threshold is determined according to the product of the second preset current correlation adjustment coefficient and the second basic temperature rise rate threshold, wherein the first preset current threshold is greater than the second preset current threshold.

[0042] If the charge / discharge current value is less than the second preset current threshold, the second basic temperature rise rate threshold is determined as the temperature rise rate threshold.

[0043] Thus, when the ambient temperature is less than or equal to a first ambient temperature threshold and greater than or equal to a second ambient temperature threshold, if the charging / discharging current value is greater than or equal to a first preset current threshold, the temperature rise rate threshold is determined by multiplying the first preset current correlation adjustment coefficient and the second basic temperature rise rate threshold, where the second ambient temperature threshold is less than the first ambient temperature threshold. If the charging / discharging current value is less than the first preset current threshold and greater than or equal to the second preset current threshold, the temperature rise rate threshold is determined by multiplying the second preset current correlation adjustment coefficient and the second basic temperature rise rate threshold, where the first preset current threshold is greater than the second preset current threshold. If the charging / discharging current value is less than the second preset current threshold, the second basic temperature rise rate threshold is determined as the temperature rise rate threshold. In this way, when the battery is in a suitable environment where the ambient temperature is less than or equal to the first ambient temperature threshold and greater than or equal to the second ambient temperature threshold, dynamically adjusting the temperature rise rate threshold by the charging / discharging current value can improve the accuracy of temperature sensor fault diagnosis under suitable conditions, thereby effectively reducing the false alarm rate and the missed alarm rate.

[0044] In some implementations, determining the first temperature rise rate state of the first temperature rise rate sequence based on a temperature rise rate threshold includes:

[0045] If there is an absolute value of a temperature rise rate greater than the temperature rise rate threshold in the first temperature rise rate sequence, the first temperature rise rate state is determined to be abnormal.

[0046] If there is no absolute value of the temperature rise rate greater than the temperature rise rate threshold in the first temperature rise rate sequence, the first temperature rise rate state is determined to be normal.

[0047] Thus, if the absolute value of a temperature rise rate in the first temperature rise rate sequence is greater than a temperature rise rate threshold, the first temperature rise rate state is determined to be abnormal. Then, if the absolute value of a temperature rise rate in the first temperature rise rate sequence is not greater than the temperature rise rate threshold, the first temperature rise rate state is determined to be normal. In this way, by comparing the absolute value of the temperature rise rate with the temperature rise rate threshold, both abnormal scenarios of instantaneous temperature rise and instantaneous temperature drop can be covered simultaneously, improving the comprehensiveness of the temperature rise rate state judgment.

[0048] In some embodiments, the method further includes:

[0049] Obtain the second raw temperature dataset of the second target temperature sensor. The second raw temperature dataset includes the raw temperature data sampled by the second target temperature sensor within the sampling period and the corresponding timestamps.

[0050] Based on the second original temperature dataset, determine the second temperature rise rate sequence;

[0051] If there is an abnormal temperature rise rate point in the abnormal sampling interval of the second temperature rise rate sequence, the second temperature rise rate state is determined to be abnormal.

[0052] If there are no abnormal points in the temperature rise rate of the second temperature rise rate sequence within the abnormal sampling interval, the second temperature rise rate is determined to be normal.

[0053] Thus, a second raw temperature dataset is obtained from the second target temperature sensor. This dataset includes the raw temperature data sampled by the second target temperature sensor within the sampling period and the corresponding timestamps. Next, based on this second raw temperature dataset, a second temperature rise rate sequence is determined. Then, if an abnormal temperature rise rate point exists within the abnormal sampling interval of the second temperature rise rate sequence, the second temperature rise rate state is determined to be abnormal. Finally, if no abnormal temperature rise rate point exists within the abnormal sampling interval of the second temperature rise rate sequence, the second temperature rise rate state is determined to be normal. In this way, by verifying the second temperature rise rate state of the second target temperature sensor, the fault state of the first target temperature sensor can be accurately determined.

[0054] In some implementations, determining whether the first target temperature sensor is faulty based on the second temperature rise rate state of at least one second target temperature sensor associated with the first target temperature sensor in the abnormal sampling interval includes:

[0055] If the second temperature rise rate is abnormal, it is determined that the first target temperature sensor is functioning normally.

[0056] If the second temperature rise rate is normal, it is determined that the first target temperature sensor is faulty.

[0057] Thus, if the second temperature rise rate is abnormal, the first target temperature sensor is determined to be functioning normally. Then, if the second temperature rise rate is normal, the first target temperature sensor is determined to be faulty. In this way, through cross-verification with the second target temperature sensor, the first target temperature sensor can avoid being unable to determine whether the temperature rise is normal due to regional temperature increase or abnormal due to its own fault, based solely on its own temperature rise rate. This allows for accurate determination of the fault status of the first target temperature sensor.

[0058] In some embodiments, the method further includes:

[0059] If it is determined that the first target temperature sensor is faulty, determine the jump state and jump frequency of the abnormal temperature rise rate point;

[0060] The fault type is determined by analyzing the transition state and the transition frequency.

[0061] Thus, if a fault is confirmed in the first target temperature sensor, the jump states and frequencies at the abnormal temperature rise rate points are determined. Next, the jump states and frequencies are analyzed to determine the fault type. In this way, further determining the fault type of the first target temperature sensor, even when a fault is confirmed, provides a basis for subsequent maintenance, thereby reducing troubleshooting steps and lowering costs.

[0062] In some implementations, the jump state includes the temperature rise amplitude, duration period, pre-jump temperature, and return temperature at the abnormal temperature rise rate point. Analyzing the jump state and the jump frequency to determine the fault type includes:

[0063] If the temperature rise is greater than a first preset temperature threshold, the jump frequency is a first preset number, the duration is a first duration, and the difference between the temperature before the jump and the return temperature is less than or equal to a preset temperature threshold, the fault type is determined to be the first type.

[0064] If the temperature rise is less than the first preset temperature threshold and greater than or equal to the second preset temperature threshold, the jump frequency is the first preset number, the duration is the second duration, and the difference between the temperature before the jump and the return temperature is less than or equal to the preset temperature threshold, the fault type is determined to be the second type.

[0065] If the temperature rise is less than the first preset temperature threshold and greater than or equal to the second preset temperature threshold, the jump frequency is the first preset number, the duration is the first duration, and the difference between the temperature before the jump and the return temperature is greater than the preset temperature threshold, then the fault type is determined to be the second type.

[0066] If the temperature rise is less than the second preset temperature threshold and greater than or equal to the third preset temperature threshold, the jump frequency is greater than the first preset number, the duration is the first duration, and the difference between the temperature before the jump and the return temperature is less than or equal to the preset temperature threshold, the fault type is determined to be the third type.

[0067] Thus, if the temperature rise is greater than a first preset temperature threshold, the frequency of temperature jumps is a first preset number, the duration is a first duration, and the difference between the temperature before the jump and the return temperature is less than or equal to a preset temperature threshold, the fault type is determined to be type one. Next, if the temperature rise is less than the first preset temperature threshold but greater than or equal to a second preset temperature threshold, the frequency of temperature jumps is a first preset number, the duration is a second duration, and the difference between the temperature before the jump and the return temperature is less than or equal to a preset temperature threshold, the fault type is determined to be type two. Then, if the temperature rise is less than the first preset temperature threshold but greater than or equal to the second preset temperature threshold, the frequency of temperature jumps is a first preset number, the duration is a first duration, and the difference between the temperature before the jump and the return temperature is greater than a preset temperature threshold, the fault type is determined to be type two. Finally, if the temperature rise is less than the second preset temperature threshold but greater than or equal to the third preset temperature threshold, the frequency of temperature jumps is greater than the first preset number, the duration is the first duration, and the difference between the temperature before the jump and the return temperature is less than or equal to the preset temperature threshold, the fault type is determined to be type three. This quantified standard improves the accuracy of fault type identification, provides a basis for subsequent maintenance, reduces troubleshooting steps, and lowers costs.

[0068] This application provides an electronic device, which includes a processor and a memory. The memory stores a computer program, and the processor executes the computer program to implement the steps of the method described above.

[0069] This application provides a computer-readable storage medium storing a computer program thereon, which, when executed by a processor, implements the steps of the method described above.

[0070] Additional aspects and advantages of embodiments of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of embodiments of this application. Attached Figure Description

[0071] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, wherein:

[0072] Figure 1 This is one of the flowcharts illustrating a fault state detection method for a temperature sensor according to certain embodiments of this application;

[0073] Figure 2 This is a second schematic flowchart of a fault state detection method for a temperature sensor according to certain embodiments of this application;

[0074] Figure 3This is the third flowchart illustrating the fault state detection method for a temperature sensor according to certain embodiments of this application;

[0075] Figure 4 This is the fourth flowchart illustrating a fault state detection method for a temperature sensor according to certain embodiments of this application.

[0076] Figure 5 This is the fifth flowchart illustrating a fault state detection method for a temperature sensor according to certain embodiments of this application.

[0077] Figure 6 This is a schematic flowchart of a fault state detection method for a temperature sensor according to certain embodiments of this application (Sixth).

[0078] Figure 7 This is the seventh flowchart of a fault state detection method for a temperature sensor according to certain embodiments of this application;

[0079] Figure 8 This is the eighth flowchart of a fault state detection method for a temperature sensor according to certain embodiments of this application;

[0080] Figure 9 This is the ninth flowchart of a fault state detection method for a temperature sensor according to certain embodiments of this application;

[0081] Figure 10 This is the tenth flowchart illustrating a fault state detection method for a temperature sensor according to certain embodiments of this application.

[0082] Figure 11 This is eleventh of the flowcharts illustrating a fault state detection method for a temperature sensor according to certain embodiments of this application.

[0083] Figure 12 This is the twelfth flowchart of a fault state detection method for a temperature sensor according to certain embodiments of this application;

[0084] Figure 13 This is a flowchart of a fault state detection method for a temperature sensor according to certain embodiments of this application, number thirteen.

[0085] Figure 14 This is the fourteenth schematic flowchart of a fault state detection method for a temperature sensor according to certain embodiments of this application. Detailed Implementation

[0086] The embodiments of this application are described in detail below. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the embodiments of this application, and should not be construed as limiting the embodiments of this application.

[0087] In fields such as new energy storage and electric vehicles, temperature sensors in battery management systems (BMS) are core sensing components ensuring safe battery operation. The accuracy of the data they collect directly determines the effectiveness of the BMS in assessing battery thermal state, adjusting charging and discharging strategies, and providing fault warnings. In related technologies, fault diagnosis for temperature sensors commonly employs a judgment scheme based on a fixed temperature threshold.

[0088] However, this diagnostic method, which relies on a fixed temperature threshold, has significant technical limitations. It cannot effectively distinguish between two fundamentally different temperature rise scenarios, leading to a substantial reduction in the accuracy of fault diagnosis. On the one hand, the actual operating environment of a battery management system is complex and variable. Temperature rises may originate from normal regional temperature fluctuations rather than sensor malfunctions. For example, under high-current charging and discharging conditions, the heat generation power of the battery cells increases significantly, causing a natural temperature rise in localized areas within the battery compartment, potentially exceeding the preset threshold. Similarly, sudden increases in ambient temperature, such as from outdoor exposure in summer, temporary start-up or shutdown of the cooling system, or heat conduction between adjacent cells in the battery module, can all cause the temperature values ​​collected by the sensors to temporarily exceed the fixed threshold. These are normal changes in the system's thermal state, not sensor malfunctions. However, the fixed threshold method cannot identify these differences in operating conditions, misjudging such normal temperature rises as sensor malfunctions, resulting in frequent false alarms.

[0089] On the other hand, temperature rises caused by faults in the temperature sensor itself have fundamentally different characteristics from normal temperature rises, but may be missed because they do not reach a fixed threshold: the sensor may experience instantaneous jumps or false increases in temperature readings due to problems such as poor signal line contact, aging circuitry, electromagnetic interference, characteristic drift, or loose connectors. However, the temperature anomalies caused by such faults may only last for a very short time or may not reach the preset fixed threshold. For example, if the fault causes the temperature to rise to 55°C, which is lower than the preset upper limit of 60°C, the fixed threshold method cannot capture such dynamic anomalies, thus missing fault diagnosis.

[0090] Thus, insufficient accuracy in detecting fault conditions of the temperature sensor may affect battery safety. For example, frequent false alarms can interfere with the judgment of maintenance personnel, potentially causing them to overlook genuine fault alarms or even miss critical safety hazards.

[0091] Based on the above issues, please refer to Figure 1This application provides a method for detecting the fault state of a temperature sensor, the method comprising:

[0092] 011: Obtain the first raw temperature dataset from the first target temperature sensor;

[0093] 012: Determine the first temperature rise rate sequence based on the first original temperature dataset;

[0094] 013: Determine the first temperature rise rate state of the first temperature rise rate sequence based on the temperature rise rate threshold;

[0095] 014: In the case of an abnormal state of the first temperature rise rate, determine the abnormal point of the temperature rise rate in the first temperature rise rate sequence, and the abnormal sampling interval within the sampling period corresponding to the abnormal point of the temperature rise rate.

[0096] 015: Determine whether the first target temperature sensor is faulty based on the second temperature rise rate state of at least one second target temperature sensor associated with the first target temperature sensor in the abnormal sampling interval.

[0097] This application also provides an electronic device, including a memory and a processor. The fault state detection method for a temperature sensor according to this application can be implemented by the electronic device described in this application. Specifically, the memory stores a computer program, and the processor is configured to acquire a first raw temperature dataset from a first target temperature sensor, determine a first temperature rise rate sequence based on the first raw temperature dataset, and determine a first temperature rise rate state of the first temperature rise rate sequence based on a temperature rise rate threshold. The processor is further configured to, in the event of an abnormal first temperature rise rate state, determine an abnormal temperature rise rate point in the first temperature rise rate sequence and an abnormal sampling interval within the sampling period corresponding to the abnormal temperature rise rate point, and determine whether the first target temperature sensor is faulty based on a second temperature rise rate state of at least one second target temperature sensor associated with the first target temperature sensor in the abnormal sampling interval.

[0098] This application also provides a battery testing apparatus. The temperature sensor fault state detection method of this application can be implemented by the battery testing apparatus of this application. Specifically, the battery testing apparatus includes an acquisition module and a determination module. The acquisition module is used to acquire a first raw temperature dataset from a first target temperature sensor. The determination module is used to determine a first temperature rise rate sequence based on the first raw temperature dataset, and to determine a first temperature rise rate state of the first temperature rise rate sequence based on a temperature rise rate threshold. The determination module is further used to determine, in the event of an abnormal temperature rise rate state, an abnormal temperature rise rate point in the first temperature rise rate sequence, and an abnormal sampling interval within the sampling period corresponding to the abnormal temperature rise rate point. And, based on the second temperature rise rate state of at least one second target temperature sensor associated with the first target temperature sensor in the abnormal sampling interval, determine whether the first target temperature sensor is faulty.

[0099] Specifically, the first target temperature sensor refers to the temperature sensor to be used for fault condition detection, such as the NTC negative temperature coefficient thermistor deployed in the battery management system.

[0100] The first raw temperature dataset refers to the initial data set directly collected by the first target temperature sensor during a continuous sampling period, including the raw temperature value obtained from each sampling and the corresponding sampling timestamp.

[0101] The sampling period refers to the fixed data acquisition interval preset by the first target temperature sensor, which is the basis for ensuring the timeliness and comparability of temperature data.

[0102] The first temperature rise rate sequence refers to the set of dynamic temperature rise rates calculated based on the temperature change and time interval of the first target temperature sensor, reflecting how fast the temperature changes over time.

[0103] The temperature rise rate threshold refers to the critical value used to determine whether the temperature rise rate is abnormal. It is not a fixed value and needs to be dynamically adjusted according to the real-time operating conditions of the battery management system to ensure the accuracy of fault state detection in different scenarios.

[0104] Temperature rise rate anomalies refer to data points in the first temperature rise rate sequence whose absolute values ​​exceed the temperature rise rate threshold. They are indicators of abnormal temperature changes.

[0105] The abnormal sampling interval refers to the sampling time period corresponding to the abnormal temperature rise rate, that is, the specific time range in which the abnormal temperature rise occurs, providing a time reference for the subsequent synchronous verification of the second target temperature sensor.

[0106] The second target temperature sensor refers to a temperature sensor that is physically adjacent to the first target temperature sensor. It is used to provide synchronized temperature data and eliminate interference from regional environmental factors.

[0107] The second temperature rise rate state refers to the determination result of whether the temperature rise rate of the second target temperature sensor is abnormal within the abnormal sampling range of the first target temperature sensor, and it is completely consistent with the determination criteria of the first temperature rise rate state.

[0108] First, the first target temperature sensor continuously collects temperature data of the monitored area according to a preset sampling period, and records the precise timestamp of each collection. All data are aggregated to form the first raw temperature dataset, which is stored in the system database for later use.

[0109] Subsequently, the first raw temperature dataset is extracted from the database and processed to form a continuous first temperature rise rate sequence.

[0110] Then, each data point in the first temperature rise rate sequence is compared with a preset temperature rise rate threshold to determine the first temperature rise rate state.

[0111] Next, in the case of an abnormal temperature rise rate, all abnormal temperature rise rate points whose absolute values ​​exceed the threshold are marked, and the continuous interval including the adjacent sampling times before and after each abnormal temperature rise rate point is taken as the abnormal sampling interval. For example, if the abnormal temperature rise rate points include consecutive abnormal temperature rise rate points A1 and A2, and the adjacent sampling times before and after temperature rise rate point A1 are T3 and T4 respectively, and the adjacent sampling times before and after temperature rise rate point A2 are T4 and T5 respectively, then the abnormal sampling interval is [T3, T5].

[0112] Finally, the original temperature data of all second target temperature sensors within the above-mentioned abnormal sampling interval are obtained. Using the same calculation method as the first target temperature sensor, the second temperature rise rate sequence of each second target temperature sensor is obtained, and its second temperature rise rate status within the abnormal sampling interval is determined. Thus, the second temperature rise rate status is used to help determine whether the first target temperature sensor is faulty.

[0113] In summary, the temperature sensor fault state detection method and electronic device provided in this application obtain a first raw temperature dataset from a first target temperature sensor. This dataset includes raw temperature data sampled by the first target temperature sensor within a sampling period and corresponding timestamps. Next, a first temperature rise rate sequence is determined based on the first raw temperature dataset. Then, a first temperature rise rate state of the first temperature rise rate sequence is determined based on a temperature rise rate threshold. If the first temperature rise rate state is abnormal, abnormal temperature rise rate points in the first temperature rise rate sequence and abnormal sampling intervals within the sampling period corresponding to these abnormal points are determined. Finally, based on the second temperature rise rate state of at least one second target temperature sensor associated with the first target temperature sensor in the abnormal sampling interval, it is determined whether the first target temperature sensor is faulty. Thus, by determining abnormal temperature rise rate points using a temperature rise rate threshold and combining this with synchronous detection using at least one associated second target temperature sensor, the accuracy of temperature sensor fault state detection can be improved, and the false alarm rate and false negative rate can be reduced.

[0114] Please see Figure 2 In some implementations, step 012 (determining the first temperature rise rate sequence based on the first raw temperature dataset) includes:

[0115] 0121: Perform data transformation processing on the raw temperature data in the first raw temperature dataset to determine the target temperature sequence;

[0116] 0122: Based on the target temperature sequence, determine the first temperature rise rate sequence that matches the time sequence of the target temperature sequence.

[0117] In some implementations, the processor is further configured to perform data transformation processing on the raw temperature data in the first raw temperature dataset to determine a target temperature sequence, and, based on the target temperature sequence, determine a first temperature rise rate sequence that time-matches the target temperature sequence.

[0118] In some implementations, the determining module is further configured to perform data transformation processing on the raw temperature data in the first raw temperature dataset to determine a target temperature sequence, and, based on the target temperature sequence, determine a first temperature rise rate sequence that time-matches the target temperature sequence.

[0119] Specifically, raw temperature data refers to the raw temperature-related signals or values ​​directly sensed and output by the first target temperature sensor. These may have issues such as non-standardized formats and cannot be directly used for rate calculation.

[0120] Data conversion processing can be understood as a standardization operation performed on the raw temperature data, which can eliminate format differences and make the data meet the requirements of subsequent calculations. For example, converting non-floating-point values ​​to floating-point values.

[0121] It should be noted that the raw temperature data may also include issues such as missing data and invalid data. Therefore, in some implementations, missing value supplementation and invalid value removal may be performed on the raw temperature data.

[0122] The target temperature sequence refers to the standardized data sequence obtained after data conversion and processing, including the effective temperature value of the first target temperature sensor within the sampling period and the corresponding acquisition timestamp, with clear temporal relationship and unified data format.

[0123] Temporal matching refers to the generation of the first temperature rise rate sequence strictly following the time order of the target temperature sequence. Each temperature rise rate data corresponds to the temperature change of two adjacent sampling times in the target temperature sequence, ensuring that the correspondence between the temperature rise rate and the time dimension is not disordered, and guaranteeing the temporal correlation and accuracy of the data.

[0124] First, the raw temperature data in the first raw temperature dataset undergoes row data transformation to determine the target temperature sequence. Then, based on the target temperature sequence, a time-matched first temperature rise rate sequence is determined. This transforms static temperature values ​​into dynamic temperature rise rate data.

[0125] Thus, the raw temperature data in the first raw temperature dataset undergoes data transformation to determine the target temperature sequence. Next, based on the target temperature sequence, a first temperature rise rate sequence that temporally matches the target temperature sequence is determined. This data transformation process ensures the standardization and accuracy of the target temperature sequence, providing a reliable data source for the subsequent calculation of the first temperature rise rate sequence. Furthermore, by determining a first temperature rise rate sequence that temporally matches the target temperature sequence, the limitation of relying on static temperature values ​​in identifying transient anomalies can be avoided, providing a data foundation for subsequent anomaly detection based on temperature rise rate thresholds.

[0126] Please see Figure 3 In some embodiments, the target temperature sequence includes the temperature values ​​of the first target temperature sensor within the sampling period and the corresponding timestamps. Step 0122 (determining a first temperature rise rate sequence that matches the time sequence of the target temperature sequence based on the target temperature sequence) includes:

[0127] 01221: Based on the order of the timestamps corresponding to the temperature values ​​in the target temperature sequence, the target temperature sequence is divided into multiple temperature subsequences;

[0128] 01222: Calculate the time difference and temperature difference between two timestamps within each temperature subsequence;

[0129] 01223: Calculate the temperature rise rate for each temperature subsequence based on the temperature difference and time difference;

[0130] 01224: Based on the order of the timestamps corresponding to the temperature subsequences, the temperature rise rates corresponding to each temperature subsequence are arranged sequentially to form the first temperature rise rate sequence.

[0131] In some implementations, the processor is further configured to divide the target temperature sequence into multiple temperature subsequences according to the order of the timestamps corresponding to the temperature values ​​in the target temperature sequence, and to calculate the time difference and temperature difference between two timestamps within each temperature subsequence. The processor is also configured to calculate the temperature rise rate of each temperature subsequence based on the temperature difference and time difference, and to arrange the temperature rise rates corresponding to each temperature subsequence sequentially based on the order of the timestamps corresponding to the temperature subsequences to form a first temperature rise rate sequence.

[0132] In some implementations, the determining module is further configured to divide the target temperature sequence into multiple temperature subsequences according to the order of the timestamps corresponding to the temperature values ​​in the target temperature sequence, and to calculate the time difference and temperature difference between two timestamps within each temperature subsequence. The determining module is also configured to calculate the temperature rise rate of each temperature subsequence based on the temperature difference and time difference, and to arrange the temperature rise rates corresponding to each temperature subsequence sequentially based on the order of the timestamps corresponding to the temperature subsequences, forming a first temperature rise rate sequence.

[0133] Specifically, a timestamp refers to the time identifier that records the moment of each temperature data acquisition, such as the format YYYY-MM-DDHH:MM:SS.XXX, which is the basis for determining the acquisition sequence and calculating the time difference.

[0134] A temperature subsequence refers to the smallest computational unit extracted from the target temperature sequence. It consists of the timestamps of two consecutive consecutive acquisition times and the corresponding two temperature values. Each subsequence corresponds to only one "temperature-time" change process and is the basis for calculating the single-segment temperature rise rate.

[0135] The time difference refers to the difference between the timestamp of the later acquisition time and the timestamp of the previous acquisition time in the same temperature subsequence. The unit is seconds (s). It can reflect the actual time interval between two adjacent temperature acquisitions and is a time dimension parameter of the calculation rate.

[0136] Temperature difference refers to the difference between the temperature value at the later acquisition time and the temperature value at the previous acquisition time in the same temperature subsequence. The unit is degrees Celsius (°C). It reflects the temperature change range between two adjacent acquisitions and is a temperature dimension parameter of the calculation rate.

[0137] The rate of temperature rise refers to the amount of temperature change per unit time. It is calculated by dividing the temperature difference by the time difference and is measured in °C / s. It is an indicator that quantifies how fast the temperature changes.

[0138] After acquiring the target temperature sequence, temperature subsequences are extracted sequentially from the start to the end of the sampling period, following the natural chronological order of the timestamps. For example, if the target temperature sequence contains timestamps t01-t1-t2-t3-…-tn and corresponding temperature values ​​T01-T1-T2-T3-…-Tn, the resulting temperature subsequences are {(t01,T01), (t1,T1)}, {(t1,T1), (t2,T2)}, …, {(tn-1,Tn-1), (tn,Tn)}, ensuring that each subsequence covers the temperature change of a complete adjacent sampling interval.

[0139] Next, for each temperature subsequence, two calculations are performed: time difference calculation and temperature difference calculation.

[0140] Then, for each temperature subsequence, the temperature rise rate is calculated by dividing the temperature difference by the time difference.

[0141] Finally, according to the splitting order of the temperature subsequence, that is, the order of the corresponding timestamps, all the calculated single-segment temperature rise rate values ​​are arranged in sequence to form a complete first temperature rise rate sequence.

[0142] Thus, based on the timestamps corresponding to the temperature values ​​in the target temperature sequence, the target temperature sequence is divided into multiple temperature subsequences in order of the timestamps. Each temperature subsequence includes two adjacent timestamps and their corresponding temperature values. Next, the time difference and temperature difference between the two timestamps within each temperature subsequence are calculated. The time difference is the difference between the preceding and following timestamps, and the temperature difference is the difference between the temperature value corresponding to the following timestamp and the temperature value corresponding to the preceding timestamp. Then, based on the temperature difference and time difference, the temperature rise rate of each temperature subsequence is calculated. Finally, based on the order of the timestamps corresponding to the temperature subsequences, the temperature rise rates corresponding to each temperature subsequence are arranged sequentially to form the first temperature rise rate sequence. In this way, by determining the first temperature rise rate sequence that matches the time sequence of the target temperature sequence, the limitation of relying on static temperature values ​​in identifying instantaneous anomalies can be avoided, providing a data foundation for subsequent anomaly detection based on temperature rise rate thresholds.

[0143] Please see Figure 4 In some implementations, the method further includes:

[0144] 016: Determine the temperature rise rate threshold based on the obtained battery management system operating data.

[0145] In some implementations, the processor is also used to determine a temperature rise rate threshold based on the acquired operating data of the battery management system.

[0146] In some implementations, the determining module is further configured to determine a temperature rise rate threshold based on the acquired operating condition data of the battery management system.

[0147] Specifically, a battery management system refers to a control system used to manage battery packs. It has functions such as data acquisition, status monitoring, and fault diagnosis. It includes a first target temperature sensor, a second target temperature sensor, and modules for charge and discharge control and environmental monitoring, which can ensure the safe and stable operation of the battery system.

[0148] Operating condition data refers to a set of parameters reflecting the real-time operating scenarios and environmental conditions of the battery management system (BMS). This includes at least one of the following: the system operating status of the BMS, the ambient temperature of the environment in which the BMS operates, and the charging / discharging current value of the BMS. Operating condition data serves as the basis for dynamically adjusting the temperature rise rate threshold; the accuracy and real-time nature of the operating condition data determine the adaptability of the temperature rise rate threshold.

[0149] System operating status refers to the working mode of the battery management system, mainly divided into resting state and operating state. In some implementations, the resting state refers to the battery pack not engaging in charging or discharging behavior, i.e., the absolute value of the current is continuously below 1A for a duration greater than or equal to 301s. The operating state refers to the battery pack being in the process of charging or discharging, where the absolute value of the current exceeds the resting state threshold, and the cells actively generate heat, leading to temperature changes.

[0150] Ambient temperature refers to the average temperature of the surrounding environment where the battery management system is located. It is usually based on the temperature collected by preset temperature measurement points inside the battery compartment, reflecting the impact of the external environment on temperature sensor data collection and battery heat dissipation.

[0151] The charge / discharge current refers to the current generated during battery charging or discharging, measured in amperes. The absolute value of the charge / discharge current directly determines the heat generation capacity of the battery pack; that is, the larger the charge / discharge current, the more heat is generated by the cell, and the higher the normal temperature rise rate.

[0152] The battery management system uses built-in sensors and control modules to collect operating condition data in real time. Then, based on the collected operating condition data, the final temperature rise rate threshold is determined.

[0153] Thus, based on the acquired operating condition data of the battery management system, a temperature rise rate threshold is determined. The battery management system includes a first target temperature sensor and a second target temperature sensor. The operating condition data includes the system operating status of the battery management system, the ambient temperature of the environment in which the battery management system operates, and the charging and discharging current values ​​of the battery management system. By determining the temperature rise rate threshold using the operating condition data of the battery management system, the temperature rise rate threshold can be accurately matched to different application scenarios, thereby improving the accuracy of temperature sensor fault state detection and reducing false alarm and false negative rates.

[0154] Please see Figure 5 In some implementations, step 016 (determining the temperature rise rate threshold based on the acquired battery management system operating data) includes:

[0155] 0161: When the battery management system is in a static state, the first basic temperature rise rate threshold is updated based on the ambient temperature to determine the temperature rise rate threshold.

[0156] In some implementations, the determining module is further configured to update the first base temperature rise rate threshold based on the ambient temperature when the battery management system is in a quiescent state, thereby determining the temperature rise rate threshold.

[0157] In some implementations, the processor is also configured to update a first base temperature rise rate threshold based on ambient temperature when the battery management system is in a quiescent state, thereby determining the temperature rise rate threshold.

[0158] Specifically, the first base temperature rise rate threshold refers to the preset base temperature rise rate threshold adapted to the static state. Since the battery temperature should be nearly stable when static, the value of the first base value is relatively low, such as 2℃ / s.

[0159] First, the battery management system's built-in sensors and data acquisition module collect real-time data on system operating status and ambient temperature. Then, if the system is determined to be in a static state, a pre-calibrated first base temperature rise rate threshold is retrieved from the system storage module. This threshold is then adjusted and updated based on the ambient temperature data to determine the final temperature rise rate threshold.

[0160] Thus, when the battery management system is in a static state, the first base temperature rise rate threshold is updated based on the ambient temperature to determine the temperature rise rate threshold. This first base temperature rise rate threshold is a pre-determined base temperature rise rate threshold for the battery management system in a static state. By selecting the first base temperature rise rate threshold in a static state and updating it based on the ambient temperature, the temperature rise rate threshold can be matched to scenarios with different ambient temperatures under static conditions, providing a reliable criterion for subsequent fault diagnosis based on the temperature rise rate sequence.

[0161] Please see Figure 6 In some embodiments, step 0161 (when the battery management system is in a quiescent state, updating the first base temperature rise rate threshold based on the ambient temperature to determine the temperature rise rate threshold) includes:

[0162] 01611: When the ambient temperature is greater than the first ambient temperature threshold or less than the second ambient temperature threshold, the temperature rise rate threshold is determined according to the product of the first preset relaxation coefficient and the first basic temperature rise rate threshold.

[0163] 01612: When the ambient temperature is less than or equal to the first ambient temperature threshold and greater than or equal to the second ambient temperature threshold, the first base temperature rise rate threshold shall be determined as the temperature rise rate threshold.

[0164] In some embodiments, the determining module is further configured to determine a temperature rise rate threshold based on the product of a first preset relaxation coefficient and a first base temperature rise rate threshold when the ambient temperature is greater than a first ambient temperature threshold or less than a second ambient temperature threshold; and to determine the first base temperature rise rate threshold as the temperature rise rate threshold when the ambient temperature is less than or equal to the first ambient temperature threshold and greater than or equal to the second ambient temperature threshold.

[0165] In some embodiments, the processor is further configured to determine a temperature rise rate threshold based on the product of a first preset relaxation coefficient and a first base temperature rise rate threshold when the ambient temperature is greater than a first ambient temperature threshold or less than a second ambient temperature threshold; and to determine the first base temperature rise rate threshold as the temperature rise rate threshold when the ambient temperature is less than or equal to the first ambient temperature threshold and greater than or equal to the second ambient temperature threshold.

[0166] Specifically, the first ambient temperature threshold refers to a preset high temperature critical value, which represents the upper limit temperature for the normal operation of the battery and sensor, such as 50°C. If this value is exceeded, the battery heat dissipation efficiency drops sharply, and the temperature sensor characteristics are prone to fluctuation.

[0167] The second ambient temperature threshold refers to a preset low-temperature critical value, representing the lower limit temperature for the normal operation of the battery and sensor, such as 0°C. Below this value, the resistance characteristics of the temperature sensor are prone to shift, and the battery chemical reaction rate decreases, leading to an alteration in the balance between heat dissipation and heat generation. It should be noted that the second ambient temperature threshold is lower than the first ambient temperature threshold.

[0168] The first preset relaxation factor refers to a threshold correction factor set for extreme ambient temperatures. It can appropriately increase the temperature rise rate threshold to offset the interference of extreme environments on temperature change patterns and avoid misjudgments. In some embodiments, the first preset relaxation factor can be any value between 1.2 and 1.3.

[0169] When the battery management system is determined to be in a static state, the collected real-time ambient temperature is compared with the preset first ambient temperature threshold and second ambient temperature threshold to determine whether the current battery is in an extreme scenario where the ambient temperature is greater than the first ambient temperature threshold or less than the second ambient temperature threshold, or in a suitable environment where the ambient temperature is less than or equal to the first ambient temperature threshold and greater than or equal to the second ambient temperature threshold.

[0170] If the battery is in an extreme scenario, the product of a first preset relaxation factor and a first base temperature rise rate threshold is calculated, and the product is used as the final temperature rise rate threshold. For example, if the first preset relaxation factor is 1.2 and the first base temperature rise rate threshold is 2℃ / s, the temperature rise rate threshold is 2.4℃ / s.

[0171] If the battery is in a suitable environment, the first basic temperature rise rate threshold is directly determined as the final temperature rise rate threshold.

[0172] Thus, when the ambient temperature is greater than a first ambient temperature threshold or less than a second ambient temperature threshold, the temperature rise rate threshold is determined by multiplying a first preset relaxation coefficient by a first base temperature rise rate threshold, where the second ambient temperature threshold is less than the first ambient temperature threshold. Next, when the ambient temperature is less than or equal to the first ambient temperature threshold but greater than or equal to the second ambient temperature threshold, the first base temperature rise rate threshold is determined as the temperature rise rate threshold. In this way, by dividing the ambient temperature range using the first and second ambient temperature thresholds, precise adaptation between the temperature rise rate threshold and the ambient temperature can be achieved under static conditions, thereby improving the accuracy and reliability of temperature sensor fault diagnosis in static states.

[0173] Please see Figure 7 In some embodiments, step 016 (determining the temperature rise rate threshold based on the acquired battery management system operating data) includes:

[0174] 0162: When the battery management system is in operation, the second basic temperature rise rate threshold is updated based on the ambient temperature and charge / discharge current value to determine the temperature rise rate threshold.

[0175] In some implementations, the determining module is further configured to update the second base temperature rise rate threshold based on the ambient temperature and charge / discharge current value, while the battery management system is in operation, and determine the temperature rise rate threshold.

[0176] In some implementations, the processor is also configured to update the second base temperature rise rate threshold based on the ambient temperature and charge / discharge current value, while the battery management system is in operation, to determine the temperature rise rate threshold.

[0177] Specifically, the second base temperature rise rate threshold refers to the preset base temperature rise rate threshold adapted to the operating state. The value is higher than the first reference value, such as 5℃ / s, because the battery cell generates heat during operation, and the normal temperature rise rate is higher than that in the static state.

[0178] First, the battery management system's built-in sensors and data acquisition module collect and determine the system's operating status, ambient temperature data, and charge / discharge current values ​​in real time. Then, if the system is determined to be in operation, a pre-calibrated second base temperature rise rate threshold is retrieved from the system storage module. This second base temperature rise rate threshold is then adjusted and updated based on the ambient temperature data and charge / discharge current values ​​to determine the final temperature rise rate threshold.

[0179] Thus, when the battery management system is in operation, the second basic temperature rise rate threshold is updated based on the ambient temperature and charge / discharge current values ​​to determine the temperature rise rate threshold. This second basic temperature rise rate threshold is a pre-determined base temperature rise rate threshold for the battery management system under operating conditions. By selecting the second basic temperature rise rate threshold in a static state and updating it based on ambient temperature and charge / discharge current values, the temperature rise rate threshold can be matched to scenarios with different ambient temperatures and charge / discharge current values ​​during operation, providing a reliable criterion for subsequent fault diagnosis based on the temperature rise rate sequence.

[0180] Please see Figure 8 In some embodiments, step 0162 (when the battery management system is in operation, updating the second base temperature rise rate threshold based on the ambient temperature and charge / discharge current value, and determining the temperature rise rate threshold) includes:

[0181] 01621: When the ambient temperature is greater than the first ambient temperature threshold or less than the second ambient temperature threshold, if the charging and discharging current value is greater than or equal to the first preset current threshold, the temperature rise rate threshold is determined according to the product of the second preset relaxation coefficient, the first preset current correlation adjustment coefficient and the second basic temperature rise rate threshold.

[0182] 01622: If the charging and discharging current value is less than the first preset current threshold and the charging and discharging current value is greater than or equal to the second preset current threshold, the temperature rise rate threshold is determined according to the product of the second preset relaxation coefficient, the second preset current correlation adjustment coefficient and the second basic temperature rise rate threshold.

[0183] 01623: If the charging and discharging current value is less than the second preset current threshold, the temperature rise rate threshold is determined according to the product of the second preset relaxation coefficient and the second basic temperature rise rate threshold.

[0184] In some embodiments, the determining module is further configured to: If the ambient temperature is greater than a first ambient temperature threshold or less than a second ambient temperature threshold, and the charging / discharging current value is greater than or equal to a first preset current threshold, determine a temperature rise rate threshold based on the product of a second preset relaxation coefficient, a first preset current correlation adjustment coefficient, and a second base temperature rise rate threshold; and if the charging / discharging current value is less than the first preset current threshold but greater than or equal to the second preset current threshold, determine a temperature rise rate threshold based on the product of a second preset relaxation coefficient, a second preset current correlation adjustment coefficient, and a second base temperature rise rate threshold; and if the charging / discharging current value is less than the second preset current threshold, determine a temperature rise rate threshold based on the product of a second preset relaxation coefficient and a second base temperature rise rate threshold.

[0185] In some embodiments, the processor is further configured to: If the ambient temperature is greater than a first ambient temperature threshold or less than a second ambient temperature threshold, and the charge / discharge current value is greater than or equal to a first preset current threshold, determine a temperature rise rate threshold based on the product of a second preset relaxation coefficient, a first preset current correlation adjustment coefficient, and a second base temperature rise rate threshold; and if the charge / discharge current value is less than the first preset current threshold but greater than or equal to the second preset current threshold, determine a temperature rise rate threshold based on the product of the second preset relaxation coefficient, the second preset current correlation adjustment coefficient, and the second base temperature rise rate threshold; and if the charge / discharge current value is less than the second preset current threshold, determine a temperature rise rate threshold based on the product of the second preset relaxation coefficient and the second base temperature rise rate threshold.

[0186] Specifically, the second preset relaxation factor refers to a threshold correction factor set for extreme ambient temperatures. It can appropriately increase the temperature rise rate threshold to offset the interference of extreme environments on temperature change patterns and avoid misjudgments. It should be noted that the value of the second preset relaxation factor can be the same as the first preset relaxation factor.

[0187] The first preset current threshold refers to a preset high current critical value, such as 100A, which is the dividing point between high current operating mode and medium current operating mode. When the charging and discharging current value is greater than the first preset current threshold, the battery heat generation power surges and the normal temperature rise rate is relatively high.

[0188] The second preset current threshold refers to the preset low-to-medium current boundary value, such as 10A, which is the dividing point between medium-current operating mode and low-current operating mode. When the battery is in low-current operating mode, the battery heat generation is close to a static state, and there is no need to relax the threshold.

[0189] The first preset current correlation adjustment coefficient refers to the threshold correction coefficient that is pre-calibrated to adapt to the high current working mode, such as 1.5. The value is higher than the second preset current correlation adjustment coefficient. It is used to increase the temperature rise rate threshold to match the normal high temperature rise rate under high current.

[0190] The second preset current correlation adjustment coefficient refers to the threshold correction coefficient for the adapted current operating mode scenario, such as 1.2. It should be noted that the first and second preset current correlation adjustment coefficients can be adjusted according to actual needs.

[0191] When the battery management system is determined to be in a static state, the collected real-time ambient temperature is compared with the preset first ambient temperature threshold and second ambient temperature threshold to determine whether the current battery is in an extreme scenario where the ambient temperature is greater than the first ambient temperature threshold or less than the second ambient temperature threshold, or in a suitable environment where the ambient temperature is less than or equal to the first ambient temperature threshold and greater than or equal to the second ambient temperature threshold.

[0192] If the battery is in an extreme scenario, the charging and discharging current values ​​are compared with the first preset current threshold and the second preset current threshold to determine the current charging and discharging current range of the battery.

[0193] If the battery's charging and discharging current value is greater than or equal to the first preset current threshold, that is, the battery is in a high current operating mode, then the product of the second preset relaxation coefficient, the first preset current correlation adjustment coefficient, and the second basic temperature rise rate threshold is determined as the temperature rise rate threshold.

[0194] If the battery's charging and discharging current value is less than the first preset current threshold and the charging and discharging current value is greater than or equal to the second preset current threshold, that is, the battery is in medium current operating mode, then the product of the second preset relaxation coefficient, the second preset current correlation adjustment coefficient and the second basic temperature rise rate threshold is determined as the temperature rise rate threshold.

[0195] If the battery's charging and discharging current is less than the second preset current threshold, meaning the battery is in a low-current operating mode, then the product of the second preset relaxation coefficient and the second basic temperature rise rate threshold is determined as the temperature rise rate threshold.

[0196] Thus, when the ambient temperature is greater than a first ambient temperature threshold or less than a second ambient temperature threshold, if the charging / discharging current value is greater than or equal to a first preset current threshold, the temperature rise rate threshold is determined based on the product of a second preset relaxation coefficient, a first preset current correlation adjustment coefficient, and a second basic temperature rise rate threshold, where the second ambient temperature threshold is less than the first ambient temperature threshold. If the charging / discharging current value is less than the first preset current threshold but greater than or equal to the second preset current threshold, the temperature rise rate threshold is determined based on the product of a second preset relaxation coefficient, a second preset current correlation adjustment coefficient, and a second basic temperature rise rate threshold, where the first preset current threshold is greater than the second preset current threshold. If the charging / discharging current value is less than the second preset current threshold, the temperature rise rate threshold is determined based on the product of a second preset relaxation coefficient and a second basic temperature rise rate threshold. In this way, when the battery is in an extreme environment where the ambient temperature is greater than the first ambient temperature threshold or less than the second ambient temperature threshold, dynamically adjusting the temperature rise rate threshold by the charging / discharging current value can improve the accuracy of temperature sensor fault diagnosis in extreme environments, thereby effectively reducing the false alarm rate and the missed alarm rate.

[0197] Please see Figure 9 In some embodiments, step 0162 (when the battery management system is in operation, updating the second base temperature rise rate threshold based on the ambient temperature and charge / discharge current value, and determining the temperature rise rate threshold) includes:

[0198] 01624: When the ambient temperature is less than or equal to the first ambient temperature threshold and greater than or equal to the second ambient temperature threshold, if the charging and discharging current value is greater than or equal to the first preset current threshold, the temperature rise rate threshold is determined according to the product of the first preset current correlation adjustment coefficient and the second basic temperature rise rate threshold.

[0199] 01625: If the charging and discharging current value is less than the first preset current threshold and the charging and discharging current value is greater than or equal to the second preset current threshold, the temperature rise rate threshold is determined according to the product of the second preset current correlation adjustment coefficient and the second basic temperature rise rate threshold.

[0200] 01626: If the charging and discharging current value is less than the second preset current threshold, the second basic temperature rise rate threshold is determined as the temperature rise rate threshold.

[0201] In some embodiments, the determining module is further configured to: If the ambient temperature is less than or equal to a first ambient temperature threshold and greater than or equal to a second ambient temperature threshold, and the charging / discharging current value is greater than or equal to a first preset current threshold, determine a temperature rise rate threshold based on the product of a first preset current correlation adjustment coefficient and a second base temperature rise rate threshold; and if the charging / discharging current value is less than the first preset current threshold and greater than or equal to the second preset current threshold, determine a temperature rise rate threshold based on the product of a second preset current correlation adjustment coefficient and a second base temperature rise rate threshold; and if the charging / discharging current value is less than the second preset current threshold, determine the second base temperature rise rate threshold as the temperature rise rate threshold.

[0202] In some embodiments, the processor is further configured to: If the ambient temperature is less than or equal to a first ambient temperature threshold and greater than or equal to a second ambient temperature threshold, and the charging / discharging current value is greater than or equal to a first preset current threshold, determine a temperature rise rate threshold based on the product of a first preset current correlation adjustment coefficient and a second base temperature rise rate threshold; and if the charging / discharging current value is less than the first preset current threshold and greater than or equal to the second preset current threshold, determine a temperature rise rate threshold based on the product of a second preset current correlation adjustment coefficient and a second base temperature rise rate threshold; and if the charging / discharging current value is less than the second preset current threshold, determine the second base temperature rise rate threshold as the temperature rise rate threshold.

[0203] Specifically, if the battery is in a suitable environment where the ambient temperature is less than or equal to the first ambient temperature threshold and greater than or equal to the second ambient temperature threshold, the charging and discharging current values ​​are compared with the first preset current threshold and the second preset current threshold to determine the current charging and discharging current range of the battery.

[0204] If the battery's charging and discharging current value is greater than or equal to the first preset current threshold, that is, the battery is in a high current operating mode, then the product of the first preset current correlation adjustment coefficient and the second basic temperature rise rate threshold is determined as the temperature rise rate threshold.

[0205] If the battery's charging and discharging current value is less than the first preset current threshold and the charging and discharging current value is greater than or equal to the second preset current threshold, that is, the battery is in medium current operating mode, then the product of the second preset current correlation adjustment coefficient and the second basic temperature rise rate threshold is determined as the temperature rise rate threshold.

[0206] If the battery's charging and discharging current is less than the second preset current threshold, meaning the battery is in a low-current operating mode, then the second basic temperature rise rate threshold will be set as the temperature rise rate threshold.

[0207] Thus, when the ambient temperature is less than or equal to a first ambient temperature threshold and greater than or equal to a second ambient temperature threshold, if the charging / discharging current value is greater than or equal to a first preset current threshold, the temperature rise rate threshold is determined based on the product of a first preset current correlation adjustment coefficient and a second basic temperature rise rate threshold. If the charging / discharging current value is less than the first preset current threshold but greater than or equal to the second preset current threshold, the temperature rise rate threshold is determined based on the product of a second preset current correlation adjustment coefficient and a second basic temperature rise rate threshold, where the first preset current threshold is greater than the second preset current threshold. If the charging / discharging current value is less than the second preset current threshold, the second basic temperature rise rate threshold is determined as the temperature rise rate threshold. In this way, when the battery is in a suitable environment where the ambient temperature is less than or equal to the first ambient temperature threshold and greater than or equal to the second ambient temperature threshold, dynamically adjusting the temperature rise rate threshold by the charging / discharging current value can improve the accuracy of temperature sensor fault diagnosis under suitable conditions, thereby effectively reducing the false alarm rate and the missed alarm rate.

[0208] Please see Figure 10 In some embodiments, step 013 (determining the first temperature rise rate state of the first temperature rise rate sequence based on the temperature rise rate threshold) includes:

[0209] 0131: If the absolute value of the temperature rise rate in the first temperature rise rate sequence is greater than the temperature rise rate threshold, the first temperature rise rate state is determined to be abnormal.

[0210] 0132: If there is no absolute value of the temperature rise rate greater than the temperature rise rate threshold in the first temperature rise rate sequence, the first temperature rise rate state is determined to be normal.

[0211] In some embodiments, the determining module is further configured to determine that the first temperature rise rate state is abnormal if the absolute value of the temperature rise rate in the first temperature rise rate sequence is greater than the temperature rise rate threshold, and to determine that the first temperature rise rate state is normal if the absolute value of the temperature rise rate in the first temperature rise rate sequence is not greater than the temperature rise rate threshold.

[0212] In some embodiments, the processor is further configured to determine that the first temperature rise rate state is abnormal if the absolute value of a temperature rise rate in the first temperature rise rate sequence is greater than a temperature rise rate threshold, and to determine that the first temperature rise rate state is normal if the absolute value of no temperature rise rate in the first temperature rise rate sequence is greater than a temperature rise rate threshold.

[0213] Specifically, an abnormal first temperature rise rate means that at least one data point in the first temperature rise rate sequence has a rate of change that exceeds a reasonable range, indicating that a real thermal event may occur in the area monitored by the first target temperature sensor or that the sensor itself is faulty.

[0214] The first temperature rise rate being normal means that the rate of change of all data points in the first temperature rise rate sequence is within a reasonable range, indicating that the temperature change in the area monitored by the first target temperature sensor is stable and without abnormal fluctuations.

[0215] The system iterates through each temperature rise rate value in the first temperature rise rate sequence in chronological order, compares each temperature rise rate value with the temperature rise rate threshold, and then determines the first temperature rise rate state.

[0216] Thus, if the absolute value of a temperature rise rate in the first temperature rise rate sequence is greater than a temperature rise rate threshold, the first temperature rise rate state is determined to be abnormal. Then, if the absolute value of a temperature rise rate in the first temperature rise rate sequence is not greater than the temperature rise rate threshold, the first temperature rise rate state is determined to be normal. In this way, by comparing the absolute value of the temperature rise rate with the temperature rise rate threshold, both abnormal scenarios of instantaneous temperature rise and instantaneous temperature drop can be covered simultaneously, improving the comprehensiveness of the temperature rise rate state judgment.

[0217] Please see Figure 11 In some implementations, the method further includes:

[0218] 017: Obtain the second raw temperature dataset from the second target temperature sensor;

[0219] 018: Determine the second temperature rise rate sequence based on the second original temperature dataset;

[0220] 019: If there are abnormal points in the temperature rise rate in the abnormal sampling interval of the second temperature rise rate sequence, determine that the second temperature rise rate state is abnormal;

[0221] 020: If there are no abnormal points in the temperature rise rate in the abnormal sampling interval of the second temperature rise rate sequence, the second temperature rise rate is determined to be normal.

[0222] In some embodiments, the determining module is further configured to acquire a second raw temperature dataset from the second target temperature sensor, and to determine a second temperature rise rate sequence based on the second raw temperature dataset. The determining module is further configured to determine that the second temperature rise rate state is abnormal if there are abnormal temperature rise rate points in the second temperature rise rate sequence within an abnormal sampling interval, and to determine that the second temperature rise rate state is normal if there are no abnormal temperature rise rate points in the second temperature rise rate sequence within an abnormal sampling interval.

[0223] In some embodiments, the processor is further configured to acquire a second raw temperature dataset from the second target temperature sensor, and determine a second temperature rise rate sequence based on the second raw temperature dataset. The processor is also configured to determine that the second temperature rise rate state is abnormal if there are abnormal temperature rise rate points in the second temperature rise rate sequence within an abnormal sampling interval, and to determine that the second temperature rise rate state is normal if there are no abnormal temperature rise rate points in the second temperature rise rate sequence within an abnormal sampling interval.

[0224] Specifically, the second raw temperature dataset refers to the unprocessed raw data set collected by the second target temperature sensor within the same sampling period as the first target temperature sensor. Its structure is consistent with the first raw temperature dataset, including the raw temperature data at each sampling time and the corresponding timestamp, ensuring that it is time-comparable with the data of the first target temperature sensor.

[0225] The second temperature rise rate sequence refers to a continuous data sequence formed based on the second original temperature dataset using the same calculation method as the first temperature rise rate sequence.

[0226] The abnormal sampling interval refers to the time range defined by the abnormal temperature rise rate of the first target temperature sensor, which can ensure that the status determination of the second target temperature sensor is only for the suspected period of abnormality of the first target temperature sensor.

[0227] The second temperature rise rate status refers to the evaluation result of the rationality of the temperature rise rate change of the second target temperature sensor in the abnormal sampling range, including two categories: normal and abnormal, which is the basis for determining the fault of the first target temperature sensor.

[0228] Obtain a second raw temperature dataset and process it using the same procedure as the first temperature rise rate sequence to determine the second temperature rise rate sequence.

[0229] Subsequently, rate data segments corresponding to the abnormal sampling interval of the first target temperature sensor are extracted from the second temperature rise rate sequence, and each temperature rise rate value in the focused second temperature rise rate data segment is compared with the same temperature rise rate threshold as the first target temperature sensor using the same temperature rise rate threshold.

[0230] Finally, if there are abnormal points in the temperature rise rate sequence within the abnormal sampling interval, the second temperature rise rate state is determined to be abnormal. Conversely, if there are no abnormal points in the second temperature rise rate sequence within the abnormal sampling interval, the second temperature rise rate state is determined to be normal.

[0231] Thus, a second raw temperature dataset is obtained from the second target temperature sensor. This dataset includes the raw temperature data sampled by the second target temperature sensor within the sampling period and the corresponding timestamps. Next, based on this second raw temperature dataset, a second temperature rise rate sequence is determined. Then, if an abnormal temperature rise rate point exists within the abnormal sampling interval of the second temperature rise rate sequence, the second temperature rise rate state is determined to be abnormal. Finally, if no abnormal temperature rise rate point exists within the abnormal sampling interval of the second temperature rise rate sequence, the second temperature rise rate state is determined to be normal. In this way, by verifying the second temperature rise rate state of the second target temperature sensor, the fault state of the first target temperature sensor can be accurately determined.

[0232] Please see Figure 12 In some embodiments, step 015 (determining whether the first target temperature sensor is faulty based on the second temperature rise rate state of at least one second target temperature sensor associated with the first target temperature sensor in the abnormal sampling interval) includes:

[0233] 0151: In the event of an abnormal second temperature rise rate, confirm that the first target temperature sensor is functioning normally;

[0234] 0152: If the second temperature rise rate is normal, it is determined that the first target temperature sensor is faulty.

[0235] In some embodiments, the determining module is further configured to determine that the first target temperature sensor is functioning normally if the second temperature rise rate is abnormal, and to determine that the first target temperature sensor is faulty if the second temperature rise rate is normal.

[0236] In some implementations, the processor is further configured to determine that the first target temperature sensor is functioning normally if the second temperature rise rate is abnormal, and to determine that the first target temperature sensor is faulty if the second temperature rise rate is normal.

[0237] Specifically, since the second target temperature sensor and the first target temperature sensor are physically adjacent and monitor the same area, if the second temperature rise rate is also abnormal, it indicates that the area monitored by the first target temperature sensor is affected by the environment, causing the temperature rise rate to exceed the temperature rise rate threshold. If the second temperature rise rate is normal, it means that only the first target temperature sensor has an abnormal temperature rise rate, and the abnormal temperature rise originates from the first target temperature sensor itself, therefore the first target temperature sensor is faulty.

[0238] Thus, if the second temperature rise rate is abnormal, the first target temperature sensor is determined to be functioning normally. Then, if the second temperature rise rate is normal, the first target temperature sensor is determined to be faulty. In this way, through cross-verification with the second target temperature sensor, the first target temperature sensor can avoid being unable to determine whether the temperature rise is normal due to regional temperature increase or abnormal due to its own fault, based solely on its own temperature rise rate. This allows for accurate determination of the fault status of the first target temperature sensor.

[0239] Please see Figure 13 In some implementations, the method further includes:

[0240] 021: If it is determined that the first target temperature sensor is faulty, determine the jump state and jump frequency of the abnormal temperature rise rate point;

[0241] 022: Analyze the switching state and switching frequency to determine the fault type.

[0242] In some implementations, the determining module is further configured to, upon determining that the first target temperature sensor is faulty, determine the jump state and jump frequency of the abnormal temperature rise rate point, and analyze the jump state and jump frequency to determine the fault type.

[0243] In some implementations, the processor is further configured to, upon determining that the first target temperature sensor is faulty, determine the jump state and jump frequency of the abnormal temperature rise rate point, and analyze the jump state and jump frequency to determine the fault type.

[0244] Specifically, the jump state refers to the set of temperature change characteristics that characterize the abnormal point of temperature rise rate, including temperature rise amplitude, duration period, temperature before jump and return temperature, which can directly reflect the physical manifestation characteristics of temperature sensor failure.

[0245] The frequency of temperature jumps refers to the number of times that abnormal points of temperature rise rate with the same characteristics and the corresponding regression phenomena occur within a preset detection period, reflecting the frequency characteristics of fault occurrence.

[0246] Fault type refers to the subdivision and classification of temperature sensor faults based on the characteristic combination of switching state and switching frequency.

[0247] If a fault is found in the first target temperature sensor, all abnormal temperature rise rate points are located from the first raw temperature dataset and the first temperature rise rate sequence. The transition state of each abnormal temperature rise rate point is determined, and the temperature rise amplitude of each abnormal point is calculated. Subsequently, the number of cycles from the occurrence of the abnormal point to the temperature returning to stability is counted. Then, the specific values ​​of the temperature before the transition and the return temperature are recorded. Furthermore, the transition frequency of the first target temperature sensor within the statistical detection period is determined.

[0248] Then, the switching states and switching frequencies are analyzed to determine the fault type.

[0249] Thus, if a fault is confirmed in the first target temperature sensor, the jump states and frequencies at the abnormal temperature rise rate points are determined. Next, the jump states and frequencies are analyzed to determine the fault type. In this way, further determining the fault type of the first target temperature sensor, even when a fault is confirmed, provides a basis for subsequent maintenance, thereby reducing troubleshooting steps and lowering costs.

[0250] Please see Figure 14 In some implementations, the jump state includes the temperature rise amplitude at the abnormal temperature rise rate point, the duration period, the temperature before the jump, and the return temperature. Step 022 (analyzing the jump state and jump frequency to determine the fault type) includes:

[0251] 0221: If the temperature rise is greater than the first preset temperature threshold, the jump frequency is the first preset number, the duration is the first duration, and the difference between the temperature before the jump and the return temperature is less than or equal to the preset temperature threshold, the fault type is determined to be the first type.

[0252] 0222: If the temperature rise is less than the first preset temperature threshold and greater than or equal to the second preset temperature threshold, the jump frequency is the first preset number, the duration is the second duration, and the difference between the temperature before the jump and the return temperature is less than or equal to the preset temperature threshold, the fault type is determined to be the second type.

[0253] 0223: If the temperature rise is less than the first preset temperature threshold and greater than or equal to the second preset temperature threshold, the jump frequency is the first preset number, the duration is the first duration, and the difference between the temperature before the jump and the return temperature is greater than the preset temperature threshold, the fault type is determined to be the second type.

[0254] 0224: If the temperature rise is less than the second preset temperature threshold and greater than or equal to the third preset temperature threshold, the jump frequency is greater than the first preset number, the duration is the first duration, and the difference between the temperature before the jump and the return temperature is less than or equal to the preset temperature threshold, the fault type is determined to be the third type.

[0255] In some embodiments, the determining module is further configured to determine the fault type as a first type when the temperature rise is greater than a first preset temperature threshold, the jump frequency is a first preset number, the duration is a first duration, and the difference between the temperature before the jump and the return temperature is less than or equal to a preset temperature threshold. And when the temperature rise is less than the first preset temperature threshold but greater than or equal to a second preset temperature threshold, the jump frequency is a first preset number, the duration is a second duration, and the difference between the temperature before the jump and the return temperature is less than or equal to a preset temperature threshold, the determining module is further configured to determine the fault type as a second type when the temperature rise is less than the first preset temperature threshold but greater than or equal to the second preset temperature threshold, the jump frequency is a first preset number, the duration is a first duration, and the difference between the temperature before the jump and the return temperature is greater than a preset temperature threshold. If the temperature rise is less than the second preset temperature threshold and greater than or equal to the third preset temperature threshold, the jump frequency is greater than the first preset number, the duration is the first duration, and the difference between the temperature before the jump and the return temperature is less than or equal to the preset temperature threshold, the fault type is determined to be the third type.

[0256] In some embodiments, the processor is further configured to determine the fault type as a first type when the temperature rise is greater than a first preset temperature threshold, the switching frequency is a first preset number, the duration is a first duration, and the difference between the temperature before the switching and the return temperature is less than or equal to a preset temperature threshold. And when the temperature rise is less than the first preset temperature threshold but greater than or equal to a second preset temperature threshold, the switching frequency is a first preset number, the duration is a second duration, and the difference between the temperature before the switching and the return temperature is less than or equal to a preset temperature threshold, the processor is further configured to determine the fault type as a second type when the temperature rise is less than the first preset temperature threshold but greater than or equal to the second preset temperature threshold, the switching frequency is a first preset number, the duration is a first duration, and the difference between the temperature before the switching and the return temperature is greater than a preset temperature threshold. If the temperature rise is less than the second preset temperature threshold and greater than or equal to the third preset temperature threshold, the jump frequency is greater than the first preset number, the duration is the first duration, and the difference between the temperature before the jump and the return temperature is less than or equal to the preset temperature threshold, the fault type is determined to be the third type.

[0257] Specifically, the temperature rise amplitude refers to the difference between the temperature corresponding to the abnormal temperature rise rate point and the temperature of the immediately adjacent normal sampling point before the jump, reflecting the intensity of the temperature jump.

[0258] The duration of the fault refers to the number of sampling cycles from the occurrence of an abnormal temperature rise rate until the temperature returns to a stable state, reflecting the duration of the fault's impact.

[0259] The temperature before the jump refers to the temperature value of the nearest valid sampling point before the anomaly in the rate of temperature rise occurs. It is the benchmark for judging whether the temperature has returned to normal.

[0260] Regression temperature refers to the temperature value at the sampling point when the temperature first recovers to a stable state after an anomaly in the rate of temperature rise occurs, and is used to determine the completeness of the regression.

[0261] The preset temperature thresholds include a first preset temperature threshold, a second preset temperature threshold, and a third preset temperature threshold. The first preset temperature threshold being greater than or equal to the second preset temperature threshold and greater than or equal to the third preset temperature threshold is a critical standard for quantitatively determining the temperature rise amplitude and regression integrity, and is preset based on the characteristics of the temperature sensor and actual needs.

[0262] The preset temperature difference threshold is used to determine the completeness of temperature regression. That is, if the difference between the temperature before the jump and the regression temperature is less than or equal to the preset temperature difference threshold, it is considered a complete regression; otherwise, it is a partial regression.

[0263] The first preset quantity refers to the criterion for judging a single occurrence of a fault, which is usually set to 1 time, to distinguish whether the fault is a single, occasional occurrence or a frequent occurrence.

[0264] The first duration refers to the short-cycle judgment standard, which is usually set to one sampling cycle, characterizing the instantaneous disappearance of the fault's impact and the rapid return of temperature.

[0265] The second duration refers to the long-cycle judgment standard, which is usually set to three or more sampling cycles, characterizing that the impact of the fault lasts for a period of time before gradually fading away.

[0266] The first type refers to transient spike faults, which are usually caused by transient strong electromagnetic interference or poor signal line contact.

[0267] The second type refers to persistent drift faults, which are usually caused by sensor characteristic drift, aging, or persistent changes in thermal resistance at the connection.

[0268] The third type refers to intermittent jitter faults, which are usually caused by unstable physical connection problems such as loose connectors or poor wiring.

[0269] Thus, if the temperature rise is greater than a first preset temperature threshold, the frequency of temperature jumps is a first preset number, the duration is a first duration, and the difference between the temperature before the jump and the return temperature is less than or equal to a preset temperature threshold, the fault type is determined to be type one. Next, if the temperature rise is less than the first preset temperature threshold but greater than or equal to a second preset temperature threshold, the frequency of temperature jumps is a first preset number, the duration is a second duration, and the difference between the temperature before the jump and the return temperature is less than or equal to a preset temperature threshold, the fault type is determined to be type two. Then, if the temperature rise is less than the first preset temperature threshold but greater than or equal to the second preset temperature threshold, the frequency of temperature jumps is a first preset number, the duration is a first duration, and the difference between the temperature before the jump and the return temperature is greater than a preset temperature threshold, the fault type is determined to be type two. Finally, if the temperature rise is less than the second preset temperature threshold but greater than or equal to the third preset temperature threshold, the frequency of temperature jumps is greater than the first preset number, the duration is the first duration, and the difference between the temperature before the jump and the return temperature is less than or equal to the preset temperature threshold, the fault type is determined to be type three. This quantified standard improves the accuracy of fault type identification, provides a basis for subsequent maintenance, reduces troubleshooting steps, and lowers costs.

[0270] This application also provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, it implements the steps of the temperature sensor fault condition detection method described above.

[0271] It is understood that a computer program includes computer program code. Computer program code can be in the form of source code, object code, executable files, or some intermediate form. Computer-readable storage media can include: any entity or device capable of carrying computer program code, recording media, USB flash drives, external hard drives, magnetic disks, optical disks, computer memory, read-only memory (ROM), random access memory (RAM), and software distribution media, etc.

[0272] This application also provides a computer program product, including a computer program / instructions that, when executed by a processor, implement the above-described method.

[0273] In this specification, the terms "specifically," "furthermore," "particularly," "understandably," etc., refer to specific features, structures, materials, or characteristics described in connection with embodiments or examples that are included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0274] Any process or method description in the flowchart or otherwise herein can be understood as representing a module, segment, or portion of executable request code comprising one or more steps for implementing a particular logical function or process, and the scope of the preferred embodiments of this application includes additional implementations in which functions may be performed not in the order shown or discussed, including substantially simultaneously or in reverse order according to the functions involved, as should be understood by those skilled in the art to which embodiments of this application pertain.

[0275] Although embodiments of this application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting this application. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of this application.

Claims

1. A method of detecting a failure state of a temperature sensor, characterized by, The method comprises: obtaining a first raw temperature data set of a first target temperature sensor, the first raw temperature data set comprising raw temperature data sampled by the first target temperature sensor within a sampling period and corresponding time stamps; determining a first temperature rise rate sequence according to the first raw temperature data set; determining a first temperature rise rate state of the first temperature rise rate sequence according to a temperature rise rate threshold; in a case where the first temperature rise rate state is abnormal, determining a temperature rise rate abnormal point in the first temperature rise rate sequence and an abnormal sampling interval in the sampling period corresponding to the temperature rise rate abnormal point; determining whether the first target temperature sensor is faulty according to a second temperature rise rate state of at least one second target temperature sensor associated with the first target temperature sensor in the abnormal sampling interval.

2. The method of claim 1, wherein, The determining of the first temperature rise rate sequence according to the first raw temperature data set comprises: performing data conversion processing on the raw temperature data in the first raw temperature data set to determine a target temperature sequence; determining the first temperature rise rate sequence matched in time sequence with the target temperature sequence according to the target temperature sequence.

3. The method of claim 2, wherein, The target temperature sequence comprises temperature values of the first target temperature sensor within the sampling period and corresponding time stamps, and the determining of the first temperature rise rate sequence matched in time sequence with the target temperature sequence according to the target temperature sequence comprises: dividing the target temperature sequence into multiple temperature sub-sequences in the order of the time stamps according to the time stamps corresponding to the temperature values in the target temperature sequence, wherein each temperature sub-sequence comprises two adjacent time stamps and corresponding temperature values; respectively calculating a time difference and a temperature difference between the two time stamps in each temperature sub-sequence, wherein the time difference is the difference between a later time stamp and an earlier time stamp, and the temperature difference is the difference between the temperature value corresponding to the later time stamp and the temperature value corresponding to the earlier time stamp; respectively calculating a temperature rise rate of each temperature sub-sequence according to the temperature difference and the time difference; sequentially arranging the temperature rise rates corresponding to each temperature sub-sequence in the order of the time stamps corresponding to the temperature sub-sequences to form the first temperature rise rate sequence.

4. The method according to any one of claims 1 to 3, characterized in that, The method further comprises: determining the temperature rise rate threshold according to obtained working condition data of a battery management system, wherein the battery management system comprises the first target temperature sensor and the second target temperature sensor, and the working condition data comprises at least one of a system running state of the battery management system, an environmental temperature of an environment in which the battery management system is located, and a charge-discharge current value of the battery management system.

5. The method of claim 4, wherein, The determining of the temperature rise rate threshold according to the obtained working condition data of the battery management system comprises: in a case where the battery management system is in a stationary state, updating a first basic temperature rise rate threshold to determine the temperature rise rate threshold according to the environmental temperature, wherein the first basic temperature rise rate threshold is a basic temperature rise rate threshold of the battery management system in the stationary state determined in advance.

6. The method of claim 5, wherein, The first basic temperature rise rate threshold is updated according to the ambient temperature when the battery management system is in the static state, and the temperature rise rate threshold is determined, comprising: When the ambient temperature is greater than a first ambient temperature threshold or less than a second ambient temperature threshold, the temperature rise rate threshold is determined according to the product of a first preset relaxation coefficient and the first basic temperature rise rate threshold, wherein the second ambient temperature threshold is less than the first ambient temperature threshold; When the ambient temperature is less than or equal to the first ambient temperature threshold and greater than or equal to the second ambient temperature threshold, the first basic temperature rise rate threshold is determined as the temperature rise rate threshold.

7. The method of claim 4, wherein, The temperature rise rate threshold is determined according to the obtained working condition data of the battery management system, comprising: When the battery management system is in the running state, the second basic temperature rise rate threshold is updated according to the ambient temperature and the charge-discharge current value, and the temperature rise rate threshold is determined, wherein the second basic temperature rise rate threshold is a pre-determined basic temperature rise rate threshold when the battery management system is in the running state.

8. The method of claim 7, wherein, The second basic temperature rise rate threshold is updated according to the ambient temperature and the charge-discharge current value when the battery management system is in the running state, and the temperature rise rate threshold is determined, comprising: When the ambient temperature is greater than a first ambient temperature threshold or less than a second ambient temperature threshold, if the charge-discharge current value is greater than or equal to a first preset current threshold, the temperature rise rate threshold is determined according to the product of a second preset relaxation coefficient, a first preset current correlation adjustment coefficient and the second basic temperature rise rate threshold, wherein the second ambient temperature threshold is less than the first ambient temperature threshold; If the charge-discharge current value is less than the first preset current threshold and greater than or equal to a second preset current threshold, the temperature rise rate threshold is determined according to the product of the second preset relaxation coefficient, a second preset current correlation adjustment coefficient and the second basic temperature rise rate threshold, wherein the first preset current threshold is greater than the second preset current threshold; If the charge-discharge current value is less than the second preset current threshold, the temperature rise rate threshold is determined according to the product of a second preset relaxation coefficient and the second basic temperature rise rate threshold.

9. The method of claim 7, wherein, The second basic temperature rise rate threshold is updated according to the ambient temperature and the charge-discharge current value when the battery management system is in the running state, and the temperature rise rate threshold is determined, comprising: When the ambient temperature is less than or equal to the first ambient temperature threshold and greater than or equal to the second ambient temperature threshold, if the charge-discharge current value is greater than or equal to a first preset current threshold, the temperature rise rate threshold is determined according to the product of the first preset current correlation adjustment coefficient and the second basic temperature rise rate threshold, wherein the second ambient temperature threshold is less than the first ambient temperature threshold; If the charging and discharging current value is less than the first preset current threshold and greater than or equal to a second preset current threshold, the temperature rise rate threshold is determined according to a product of the second preset current correlation adjustment coefficient and the second basic temperature rise rate threshold, wherein the first preset current threshold is greater than the second preset current threshold. If the charging and discharging current value is less than the second preset current threshold, the second basic temperature rise rate threshold is determined as the temperature rise rate threshold.

10. The method of any one of claims 1-3, wherein, The first temperature rise rate state of the first temperature rise rate sequence is determined according to the temperature rise rate threshold, including: In the case that there is a temperature rise rate whose absolute value is greater than the temperature rise rate threshold in the first temperature rise rate sequence, it is determined that the first temperature rise rate state is abnormal. In the case that there is no temperature rise rate whose absolute value is greater than the temperature rise rate threshold in the first temperature rise rate sequence, it is determined that the first temperature rise rate state is normal.

11. The method of any one of claims 1-3, wherein, The method further includes: obtaining a second original temperature data set of a second target temperature sensor, the second original temperature data set including original temperature data sampled by the second target temperature sensor within a sampling period and corresponding time stamps; determining a second temperature rise rate sequence according to the second original temperature data set; in the case that there is a temperature rise rate abnormal point in the second temperature rise rate sequence in the abnormal sampling interval, it is determined that the second temperature rise rate state is abnormal; in the case that there is no temperature rise rate abnormal point in the second temperature rise rate sequence in the abnormal sampling interval, it is determined that the second temperature rise rate state is normal.

12. The method of claim 11, wherein, The determination of whether the first target temperature sensor is faulty according to the second temperature rise rate state of at least one second target temperature sensor associated with the first target temperature sensor in the abnormal sampling interval includes: in the case that the second temperature rise rate state is abnormal, it is determined that the first target temperature sensor is normal; in the case that the second temperature rise rate state is normal, it is determined that the first target temperature sensor is faulty.

13. The method of any one of claims 1-3, wherein, The method further includes: in the case that it is determined that the first target temperature sensor is faulty, the jump state and the jump frequency of the temperature rise rate abnormal point are determined; the jump state and the jump frequency are analyzed to determine the fault type.

14. The method of claim 13, wherein, The jump state includes the temperature rise amplitude, the duration period, the temperature before jump and the regression temperature of the temperature rise rate abnormal point, and the analysis of the jump state and the jump frequency to determine the fault type includes: in the case that the temperature rise amplitude is greater than a first preset temperature threshold, the jump frequency is a first preset number, the duration period is a first duration length, and the difference between the temperature before jump and the regression temperature is less than or equal to a preset temperature threshold, it is determined that the fault type is a first type. determining that the fault type is a second type in a case where the temperature rise amplitude is less than the first preset temperature threshold and greater than or equal to a second preset temperature threshold, the jump frequency is the first preset number, the duration period is the second duration, and a difference between the temperature before the jump and the return temperature is less than or equal to a preset temperature threshold; determining that the fault type is the second type in a case where the temperature rise amplitude is less than the first preset temperature threshold and greater than or equal to the second preset temperature threshold, the jump frequency is the first preset number, the duration period is the first duration, and the difference between the temperature before the jump and the return temperature is greater than the preset temperature threshold; determining that the fault type is a third type in a case where the temperature rise amplitude is less than the second preset temperature threshold and greater than or equal to a third preset temperature threshold, the jump frequency is greater than the first preset number, the duration period is the first duration, and the difference between the temperature before the jump and the return temperature is less than or equal to a preset temperature threshold.

15. An electronic device, comprising: A processor and a memory are included, the memory has a computer program stored therein, and the processor implements the steps of the method of any one of claims 1-14 when executing the computer program.

16. A computer-readable storage medium, characterized in that, A computer program is stored on the computer readable storage medium, and the computer program implements the steps of the method of any one of claims 1-14 when executed by a processor.

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