A trimming system and trimming method suitable for resetting a chip

By introducing a test function switching module and a fuse programming control module, combined with a simulation module for pre-adjustment judgment, the problem of long test time for reset chips was solved, and a fast and efficient adjustment process was achieved.

CN121831475BActive Publication Date: 2026-06-26SHANGHAI CHANGYUAN WAYON MICROELECTRONICS
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
SHANGHAI CHANGYUAN WAYON MICROELECTRONICS
Filing Date
2026-03-11
Publication Date
2026-06-26

AI Technical Summary

Technical Problem

In the testing process of existing reset chips, the reset time is relatively long, the multi-functional testing time is relatively long, and the adjustment process is also time-consuming, making it difficult to meet the requirements of high precision and high efficiency.

Method used

A test function switching module and a fuse programming control module are introduced. Test codes are received through external pins, test control signals are generated, and pre-adjustment judgment is performed in conjunction with the simulation module to quickly switch test functions. Parameters are finely adjusted through the fuse array module.

Benefits of technology

This enables a rapid chip reset process, reduces the time required for analog pre-adjustment, and improves testing efficiency and accuracy.

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Abstract

The present application relates to the chip trimming technical field, specifically to a kind of suitable for reset chip's measurement trimming system, fuse array module, fuse burning control module and test function switching module.For the longer reset time when the reset chip is tested in prior art, more time for multifunctional test, test function switching module and fuse burning control module are introduced to realize the delivery of test code and the quick switching of test function, and analog module is used to assist in pre-trimming judgment, which reduces the time for analog pre-trimming, and realizes faster trimming process.
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Citation Information

Patent Citations

  • On-chip test trimming circuit

    CN116298795A

  • Single-pin trimming circuit

    CN117130967A