Analog channel programmable automatic switching device and method

Abstract

The invention belongs to the field of chip testing, and particularly discloses an analog channel programmable automatic switching device and method. Due to the adoption of a combined technical means of the control module and the channel switching module, the device has a programmable automatic switching basis, so that the problem that an analog channel in an analog chip test system is fixed and is difficult to adapt to various test requirements is solved. Specifically, the configurability of the physical connection is established through the channel switching module, and the control module generates a switching instruction based on the test requirement and the channel attribute and transmits the switching instruction to the channel switching module, so that the intelligent adaptation of the connection relationship is realized; the channel switching module dynamically switches the corresponding relation between the test system channel and the test chip pin based on the instruction; compared with the prior art that fixed connection needs to be manually adjusted, automatic and flexible configuration of the test connection relation is achieved, the adaptability and test efficiency of the test system to different analog chips are remarkably improved, and meanwhile manual intervention and operation errors are reduced.

Description

Technical Field

[0001] This application belongs to the field of chip testing, and more specifically, relates to a programmable automatic switching device and method for analog channels. Background Technology

[0002] Digital chip testing systems have a large number of channel resources, each equipped with a PMU. Most channels provide the same voltage and current capabilities, allowing for reuse across different chips without changing the pin connection order. In contrast, current analog chip testing systems have fewer analog channels, fixed resources (the positions of PVI, DVI, OVI, etc.), and inconsistent voltage and current capabilities across each channel, leading to functional inconsistencies. This results in a problem different from digital chip testing systems: different analog chips under test require different analog channels, necessitating changes to the connection order between the analog channels and the DUT. This necessitates the use of external jumpers or the creation of a new test PCB.

[0003] For example, analog channel 1 (CH1) of the simulation test system is DVI_9_0, and analog channel 2 (CH2) is DVI_11_0. If pin 1 of chip A under test needs to be connected to DVI_9_0 and pin 2 needs to be connected to DVI_11_0 of the simulation test system, then CH1 of the simulation test system needs to be connected to pin 1 of chip A, and CH2 of the simulation test system needs to be connected to pin 2 of chip A. Similarly, if pin 1 of chip B under test needs to be connected to DVI_11_0 and pin 2 needs to be connected to DVI_9_0 of the simulation test system, then CH1 of the simulation test system needs to be connected to pin 2 of chip B, and CH2 of the simulation test system needs to be connected to pin 1 of chip B.

[0004] It is known that using a standard general-purpose PCB board requires external jumpers for connection. Using a dedicated PCB board for the chip under test necessitates two different test PCB boards. Using jumpers increases testing errors, while using dedicated PCB boards requires fabricating a different PCB board for each chip, increasing costs and complicating the testing process by requiring board changes. Solving this problem is a crucial research direction for chip testing organizations and test system manufacturers. Summary of the Invention

[0005] In view of the shortcomings of the prior art, the purpose of this application is to provide a programmable automatic switching device and method for analog channels, which aims to solve the problem that the fixed analog channels of the analog chip test system are difficult to adapt to the channel connection conditions required for testing various analog chips.

[0006] To achieve the above objectives, in a first aspect, this application provides an analog channel programmable automatic switching device, comprising: a control module and a channel switching module; multiple input terminals of the channel switching module are respectively connected to multiple analog channels of a test system; multiple output terminals of the channel switching module are respectively connected to multiple pins of a test chip; a first output terminal of the control module is connected to the controlled terminal of the channel switching module; the control module is configured to generate channel switching instructions based on test requirements and channel attributes of the test system, and transmit them to the channel switching module; the channel switching module is configured to establish connection relationships between test system channels and test chip pins for testing, and switch the connection relationships based on the channel switching instructions.

[0007] In one embodiment, it further includes: an input module; the output of the input module is connected to the input of the control module; the input module is configured to receive or identify test requirements for the analog chip under test and transmit them to the control module, the test requirements including at least the pin identifier under test and the required test resource type.

[0008] In one embodiment, the input module includes: a touch screen or a host computer; the touch screen is configured to provide a local human-machine interface to receive test requirements; or, the host computer is configured to send a configuration file or instructions containing test requirements to the control module via a communication interface.

[0009] In one embodiment, the control module includes a storage unit and a processing unit; the storage unit pre-stores a test resource database, which includes attribute parameters of multiple analog test channels, including at least channel type, voltage range, and current range; the processing unit is configured to query the test resource database based on test requirements to match at least one target analog test channel that meets the test requirements; and generate a channel switching instruction containing a mapping relationship between the target channel identifier and the pin identifier under test.

[0010] In one embodiment, the channel switching module includes a switch matrix; multiple input terminals of the switch matrix are respectively connected to multiple analog channels of the test system, and multiple output terminals are respectively connected to multiple pins of the test chip. The switch matrix is ​​configured to establish a one-to-one or one-to-many connection topology between the analog channels and the chip pins based on channel switching instructions.

[0011] In one embodiment, the switch matrix is ​​a crosspoint switch array; each crosspoint in the crosspoint switch array is provided with a switch or relay independently controlled by the control module, and the connection between any input terminal and any output terminal is established or disconnected by controlling the on and off of the switch or relay.

[0012] In one embodiment, the analog channel programmable automatic switching device further includes: a status output module; the input terminal of the status output module is connected to the second output terminal of the control module; the status output module is configured to receive the connection information of the analog channel output by the control module to realize status output.

[0013] In one embodiment, the status output module includes at least one of a status indicator light, an LCD display screen, and / or an alarm, for displaying the current channel connection status, switching results, or fault information in real time.

[0014] In one embodiment, the analog channel programmable automatic switching device further includes: a power supply module and an energy storage module; the power supply module is used to convert the external input power into a stable DC voltage required by the control module and the channel switching module; the energy storage module is connected to the power supply module and is used to provide a holding voltage for the control module and the channel switching module when the mains power fails, and to support the device to complete a safe shutdown or state saving process.

[0015] Secondly, this application provides a method for automatic programmable switching of analog channels, comprising: receiving a test requirement for the analog chip under test, the test requirement including at least the identifier of the pin under test and the required test resource type; generating a channel switching instruction based on the test requirement and a pre-stored test resource database and sending the channel switching instruction to a channel switching module, the channel switching instruction defining the target connection relationship between the test system channel and the test chip pin; and controlling the channel switching module to establish or switch the physical connection between the corresponding analog channel and the chip pin according to the channel switching instruction, so as to perform the test and output the current channel connection status information.

[0016] Overall, the technical solutions conceived in this application have the following beneficial effects compared with the prior art: By employing a combination of control and channel switching modules, the device achieves programmable automatic switching, thus solving the problem of fixed analog channels in analog chip testing systems being unable to adapt to various testing requirements. Specifically, the channel switching module connects its input and output terminals to multiple analog channels of the testing system and multiple pins of the test chip, establishing configurable physical connections. The control module generates switching commands based on testing requirements and channel attributes and transmits them to the channel switching module, achieving intelligent adaptation of connection relationships. The channel switching module then dynamically switches the correspondence between testing system channels and test chip pins based on the commands. Compared to existing technologies where fixed connections require manual adjustment, the synergistic effect of this series of technologies enables automatic and flexible configuration of test connection relationships, significantly improving the test system's adaptability to different analog chips and testing efficiency, while reducing manual intervention and operational errors. Attached Figure Description

[0017] Figure 1 This is one of the structural block diagrams of the analog channel programmable automatic switching device provided in the embodiments of this application; Figure 2 This is the second structural block diagram of the analog channel programmable automatic switching device provided in the embodiments of this application; Figure 3 This is a schematic diagram of the configuration of the analog channel programmable automatic switching device provided in the embodiments of this application; Figure 4 This is a schematic diagram of the switch matrix of the channel switching module provided in the embodiments of this application; Figure 5 This is a one-to-one connection method between the analog channels and the pins of the chip under test in the analog chip testing system provided in this application embodiment; Figure 6 This is another one-to-one connection method for the connection order of the analog channel and the pins of the chip under test in the analog chip testing system provided in this application embodiment; Figure 7 This is a one-to-many connection method for the connection order of the analog channels and the pins of the chip under test in the analog chip testing system provided in this application embodiment; Figure 8 This is a flowchart illustrating the programmable automatic switching method for analog channels provided in this application embodiment.

[0018] In all the accompanying drawings, the same reference numerals are used to denote the same elements or structures, wherein: 10 is the control module; 20 is the channel switching module; 30 is the input module; 40 is the status output module; 50 is the power supply module; and 60 is the energy storage module. Detailed Implementation

[0019] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0020] In this article, the term "and / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. The symbol " / " in this article indicates that the related objects are in an "or" relationship; for example, A / B means A or B.

[0021] The terms "first" and "second," etc., used in the specification and claims herein are used to distinguish different objects, not to describe a specific order of objects. For example, "first response message" and "second response message," etc., are used to distinguish different response messages, not to describe a specific order of response messages.

[0022] In the embodiments of this application, the terms "exemplary" or "for example" are used to indicate that something is an example, illustration, or description. Any embodiment or design that is described as "exemplary" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design. Specifically, the use of the terms "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0023] Currently, a common technical challenge in the field of analog chip testing is that the connection between the analog channels and the test interface of an analog chip testing system is usually fixed. This "fixed" nature refers to the physical connection at the level where specific channels of the testing equipment are rigidly connected to specific locations on the test interface via pre-defined cables, printed circuit board traces, or dedicated adapters. This structural design struggles to adapt to the channel connection requirements of various analog chips. Specifically, different analog chips have vastly different pin counts, functional definitions, and signal types, resulting in different required test signal application and measurement points.

[0024] Based on this, this application proposes a programmable automatic switching device for analog channels. Please refer to... Figure 1 , Figure 1 This is one of the structural block diagrams of the analog channel programmable automatic switching device provided in the embodiments of this application.

[0025] In this embodiment, the analog channel programmable automatic switching device includes a control module 10 and a channel switching module 20. The term "including" here means that the device consists of at least these two modules; they can be independent physical entities or integrated within the same hardware unit.

[0026] It should be noted that the multiple input terminals of the channel switching module 20 are respectively connected to the multiple analog channels of the test system; the multiple output terminals of the channel switching module 20 are respectively connected to the multiple pins of the test chip; and the first output terminal of the control module 10 is connected to the controlled terminal of the channel switching module 20.

[0027] It is understood that the connection here refers to establishing a physical electrical connection, which can be achieved through shielded cables, coaxial connectors, spring probes, or precision traces on a printed circuit board. The number of input terminals is greater than or equal to two, corresponding to multiple analog resource channels of the test equipment, such as the output terminals of analog signal sources like high-precision voltage sources / meters, current sources / meters, and arbitrary waveform generators, or the input terminals of measurement units. The multiple output terminals of the channel switching module 20 are respectively connected to multiple pins of the test chip. These output terminals can be physically similar to the input terminals, but they ultimately achieve electrical contact with multiple pins of the test chip, i.e., the signal terminals, power terminals, and ground terminals of the device under test, through a load board, test socket, or probe card. This connection architecture makes the channel switching module essentially a configurable routing node located between the test system resources and the chip under test.

[0028] Understandably, the first output terminal of the control module 10 is connected to the controlled terminal of the channel switching module 20, defining the driving relationship between the control module and the channel switching module. The first output terminal is the physical interface used by the control module to send control signals, such as a general purpose input / output (GPIO) port, a serial peripheral interface (SPI), an integrated circuit bus (I2C), or an Ethernet port. The controlled terminal is the corresponding interface on the channel switching module that receives control commands, and its form must match the output terminal of the control module. Through this connection, the digital command signals output by the control module can be received and parsed by the channel switching module, thereby driving its internal switching elements. For example, when the channel switching module is composed of a relay matrix, its controlled terminal is typically a digital control bus that receives relay drive voltages; if it is based on a solid-state switch array, the controlled terminal may be a dedicated port for receiving serial switch configuration data.

[0029] It should be noted that the control module 10 is configured to generate channel switching instructions based on test requirements and channel attributes of the test system, and transmit them to the channel switching module 20; the channel switching module 20 is configured to establish the connection relationship between the test system channel and the test chip pin for testing, and switch the connection relationship based on the channel switching instructions.

[0030] It is understood that the control module 10 refers to hardware or a combination of hardware and software capable of performing logical operations, processing information and generating control signals. One possible implementation of this module includes, but is not limited to, a microcontroller (MCU), a field-programmable gate array (FPGA), a digital signal processor (DSP), or a computer running dedicated test management software.

[0031] Understandably, this module is configured to generate channel switching instructions based on test requirements and the channel attributes of the test system. The test requirements can specifically refer to pre-written test programs, test item sequences, or configuration files describing the required excitation and measurement types for each pin of the chip under test. The channel attributes of the test system include the inherent parameters of each analog channel, such as its type (voltage source, current source, high-precision measurement unit, or arbitrary waveform generator), range, accuracy, bandwidth, and physical channel number. The control module parses these requirements and attributes, calculates which physical channel of the test system should be connected to which pin of the test chip during a specific test phase, and then generates the corresponding channel switching instruction. This instruction is essentially a set of digital control signals containing routing information, which is transmitted through its first output terminal.

[0032] Understandably, the channel switching module 20 is the core hardware for realizing the dynamic connection and disconnection of signal paths. Its multiple input terminals and multiple output terminals refer to a series of parallel signal connection points. The input terminals are physically connected to multiple analog channels of the test system through cables, connectors or PCB traces, while the output terminals are connected to multiple pins of the test chip, usually through a load board or probe card.

[0033] Understandably, a typical implementation of the channel switching module 20 is a high-density, high-performance switch array, such as a matrix composed of electromechanical relays, solid-state switches like MOSFET switches, or dedicated multiplexer (MUX) / demultiplexer (DEMUX) integrated circuits. Its configuration refers to the fact that before receiving a control command, each switch within it is in a default state, typically open. The module closes the corresponding switch according to the command, thereby establishing a low-impedance, high-fidelity electrical path between the specified system channel and the chip pins, allowing the transmission of test signals, analog voltages, currents, etc.

[0034] It is understandable that switching the connection relationship based on the channel switching instruction clarifies that the module is controlled by the instruction from the control module 10, and can dynamically change the above path during the test. For example, in a test, a voltage source channel is first connected to the input pin of the chip to apply excitation, and then the connection is disconnected. Then a measurement unit channel is connected to the same pin to read the response. The whole process does not require manual intervention.

[0035] As an alternative, the channel switching module 20 can be a standalone programmable switch matrix instrument or a custom switch network integrated with the test interface board; the function of the control module 10 can be implemented by the host computer software of the test system or by an independent processor embedded in the switching device.

[0036] In this embodiment, the combination of a control module and a channel switching module enables the device to achieve programmable automatic switching, thus solving the problem that fixed analog channels in analog chip testing systems are difficult to adapt to various testing requirements. Specifically, since the input and output terminals of the channel switching module are respectively connected to multiple analog channels of the testing system and multiple pins of the test chip, the physical connection is configurable. The control module generates switching instructions based on testing requirements and channel attributes and transmits them to the channel switching module, realizing intelligent adaptation of the connection relationship. The channel switching module then dynamically switches the correspondence between the test system channels and the test chip pins based on the instructions.

[0037] Compared to existing technologies where fixed connections require manual adjustment, the synergistic effect of this series of technologies enables automatic and flexible configuration of test connection relationships, significantly improving the test system's adaptability to different analog chips and testing efficiency, while reducing manual intervention and operational errors.

[0038] Furthermore, based on the above embodiments, this application proposes improved embodiments. Please refer to... Figure 2 , Figure 2 This is the second structural block diagram of the analog channel programmable automatic switching device provided in the embodiments of this application.

[0039] In this embodiment, the analog channel programmable automatic switching device further includes an input module 30; the output terminal of the input module 30 is connected to the input terminal of the control module 10; the input module 30 is configured to receive or identify test requirements for the analog chip under test and transmit them to the control module 10, and the test requirements include at least the pin identifier under test and the required test resource type.

[0040] It is understandable that the output of input module 30 is connected to the input of control module 10, forming an extended data or instruction input path. Here, input and output refer to the ports through which information or electrical signals flow. The core function of input module 30 is to receive or identify test requirements for the analog chip under test and transmit this requirement information to control module 10. Receiving here means passively acquiring externally provided test requirement information, such as data entered by the operator through a graphical user interface (GUI), command line, or text file; while identification means that the module has a certain degree of automatic information extraction or parsing capability, such as by scanning barcodes or QR codes on the chip under test, reading identifiers embedded in the chip, such as the chip ID, or automatically parsing standard test configuration files bound to the chip model, such as STDF, CSV, or XML format files, to obtain information.

[0041] Understandably, the test requirements in this embodiment are specified as including at least the pin identifier under test and the required test resource type. The pin identifier is information used to uniquely identify a specific physical pin on the chip under test, and its form can be a pin number (e.g., Pin A5), a function name (e.g., VREF+, IN-), or a location code on the test socket. The required test resource type indicates the category of analog channel required to test the pin, such as "high-precision DC voltage source," "high-speed waveform sampler," "precision current measurement unit," or "differential signal generator." By specifying these two types of key information, the input module 30 provides the control module 10 with the basic data necessary to execute its decision logic.

[0042] Compared to previous embodiments that relied solely on preset programs, this improved embodiment introduces an input module 30, which diversifies and automates the input of test requirements. This avoids the tedious process of manually modifying the internal program or complex configuration of the control module every time the model of the chip under test is changed. After receiving these structured test requirements, the control module 10 can more intelligently and directly combine the channel attributes of the test system (e.g., knowing which types of resources the system has and what their respective physical channel numbers are) to generate precise channel switching instructions. Therefore, this improvement makes the configuration process of the entire device more convenient, intuitive, and less prone to errors when dealing with testing multiple types of chips, improving the adaptability and automation level of the test system.

[0043] Specifically, the input module 30 includes a touch screen or a host computer; the touch screen is configured to provide a local human-machine interface to receive test requirements; or, the host computer is configured to send a configuration file or instructions containing test requirements to the control module 10 through a communication interface.

[0044] It is understood that in this embodiment, the input module 30 can be implemented in two typical hardware forms to fulfill its function of receiving or identifying test requirements. One implementation is a touch screen, i.e., a display screen with integrated touch sensing functionality. This touch screen is configured to provide a local human-machine interface (HMI) to receive test requirement parameters input by the operator in a graphical manner, such as forms, pin maps, or drop-down menus. The operator can directly select or fill in information such as the pin identifier to be tested and the required test resource type on the screen. The touch screen converts this structured data into electrical signals and transmits them to the input terminal of the control module 10 through its output terminal.

[0045] Understandably, another implementation is a host computer, which is a standalone computing device, such as a personal computer, industrial control computer, or the main control computer of the test system. The host computer is configured to send configuration files or direct commands containing test requirements to the control module 10 via its communication interface. The configuration file can be a text file written in a predetermined format, specifying the pins and resource types corresponding to each test step; the commands can be real-time commands conforming to a specific communication protocol. The host computer can run dedicated test program writing software or configuration tools to generate this information.

[0046] Alternatively, the input module 30 can be other devices capable of information input, such as an embedded control panel with physical buttons and a display screen, a reader that can read configuration files from storage devices (such as USB flash drives), or a barcode / QR code scanner that can automatically scan and identify chip models and call up corresponding test plans. Regardless of its specific form, its core function is to convert external test requirements for a specific chip under test into a standardized data stream that the control module 10 can receive and process, thereby driving the subsequent automatic channel configuration process. This design separates the definition and execution of test requirements, improving the flexibility of device use and the efficiency of human-machine interaction.

[0047] Furthermore, the control module 10 of this application may include a storage unit and a processing unit; the storage unit pre-stores a test resource database, which includes attribute parameters of multiple analog test channels, including at least channel type, voltage range and current range; the processing unit is configured to query the test resource database based on test requirements to match at least one target analog test channel that meets the test requirements; and generate a channel switching instruction containing a mapping relationship between the target channel identifier and the pin identifier under test.

[0048] Understandably, these two units function collaboratively to achieve intelligent channel matching and instruction generation. Specifically, the storage unit is a non-volatile or volatile data storage medium, such as EEPROM, Flash memory, SD card, or RAM. Its core function is to pre-store a test resource database. This database is a structured collection of data that records the attribute parameters of all available analog test channels in the test system it is connected to.

[0049] Understandably, attribute parameters are key information describing the inherent technical specifications of a channel, including at least: channel type, used to distinguish whether the channel is a voltage source, current source, high-precision digital multimeter, arbitrary waveform generator, or other dedicated analog resource; voltage range, referring to the upper and lower limits of the voltage that the channel can output or safely measure; and current range, referring to the upper and lower limits of the current that the channel can output or safely measure. In addition, the database may contain other parameters, such as channel accuracy, bandwidth, impedance, and physical address.

[0050] It is understandable that the arithmetic unit is the data processing core of the control module 10, and its physical implementation will not be elaborated further. Its configured execution logic is as follows: First, it receives test requirements from the input module 30 or a preset program. Then, based on these requirements, it actively queries the test resource database in the storage unit. The purpose of the query is to match one or more target simulated test channels that meet the test requirements in terms of type and capability among all channels recorded in the database. For example, if the test requirement specifies that a certain pin requires a voltage source with a range of ±10V, the arithmetic unit will traverse the database to find all channels whose type is a voltage source and whose voltage range covers ±10V. Finally, the arithmetic unit generates the final channel switching instruction. This instruction contains specific routing mapping information, that is, it clearly specifies which target channel identifier (e.g., "channel A3") is connected to which "pin under test identifier" (e.g., "pin 5").

[0051] Understandably, through this division of labor and cooperation between the storage unit and the computing unit, the control module 10 is upgraded from a simple instruction relayer to an intelligent decision-making unit with resource management and automatic matching capabilities. This enables the device to automatically and quickly select the most suitable physical channel from the test system resource pool to meet specific test tasks, without the need for manual consultation or memorization of channel parameters. This significantly improves the accuracy and efficiency of configuration and is a key link in achieving automation and intelligence in the test process.

[0052] In addition, in this embodiment, the analog channel programmable automatic switching device further includes: a status output module 40; the input terminal of the status output module 40 is connected to the second output terminal of the control module 10; the status output module 40 is configured to receive the connection information of the analog channel output by the control module 10 to realize status output.

[0053] Understandably, the core function of the status output module 40 is to receive status data from the control module 10 that reflects the current analog channel connection information, and output it in one or more human-perceptible forms, thereby achieving real-time visualization and monitoring of the system's operating status. The connection information here refers to the dynamic information generated by the control module 10 based on the currently effective channel switching command and, optionally, the confirmation signal read back from the channel switching module 20. Its content may include, but is not limited to: which system channels are connected to which chip pins, whether the channel switching command was successfully executed, and whether there are any path faults, such as open circuits, short circuits, or overloads.

[0054] Specifically, the status output module 40 includes at least one of a status indicator light, an LCD display screen, and / or an alarm, for displaying the current channel connection status, switching results, or fault information in real time.

[0055] Understandably, these output devices can be used individually or in combination to achieve redundant or hierarchical status indications. For example, normal status is displayed in detail on the LCD screen, minor warnings are indicated by flashing indicator lights, and serious faults are simultaneously triggered by an audible alarm and a constantly lit red indicator light. By introducing the status output module 40, this device enhances human-machine interaction by transforming open-loop control from command issuance to execution into closed-loop control from command issuance to execution to status feedback.

[0056] Understandably, this involves converting the abstract digital information of internal connections into physical signals that are directly readable, audible, and visible on the human-machine interface. This significantly improves the observability and maintainability of the system testing process, enabling operators to quickly verify the correctness of the connection configuration and immediately locate problems when anomalies occur, thereby ensuring the reliability and efficiency of the testing process.

[0057] In this embodiment, to ensure the stable and reliable operation of the analog channel programmable automatic switching device under various working environments and to address the risk of potential power outages, the analog channel programmable automatic switching device further includes: a power supply module 50 and an energy storage module 60; the power supply module 50 is used to convert the external input power into a stable DC voltage required by the control module 10 and the channel switching module 20; the energy storage module 60 is connected to the power supply module 50 and is used to provide a holding voltage for the control module 10 and the channel switching module 20 when the mains power fails, and to support the device in completing a safe shutdown or state saving process.

[0058] Specifically, at the moment of power failure, the control module 10, relying on the energy provided by the energy storage module, has sufficient time to perform a series of critical protection and data preservation operations. These include: storing currently valid channel switching commands, test configuration parameters, and temporary data into non-volatile memory; issuing commands to the channel switching module 20 to switch all switches to a safe default state (e.g., all disconnected) to prevent damage to the chip under test or test equipment in uncertain conditions; and recording and indicating the power failure event through the status output module 40. After completing these processes, the device shuts down in an orderly manner, thus avoiding data loss, status confusion, or potential electrical risks. This design significantly enhances the data integrity, system security, and reliability of the entire test device, making it suitable for automated test production lines or R&D test environments with high requirements for continuity and stability.

[0059] Finally, by integrating the above modules, we obtain the following: Figure 3 The schematic diagram of the analog channel programmable automatic switching device shown above has all the beneficial effects described above.

[0060] In one feasible implementation, please refer to Figure 4 , Figure 4 This is a schematic diagram of the switch matrix of the channel switching module provided in the embodiments of this application.

[0061] In this embodiment, the channel switching module 20 includes a switch matrix; the multiple input terminals of the switch matrix are respectively connected to multiple analog channels of the test system, and the multiple output terminals are respectively connected to multiple pins of the test chip. The switch matrix is ​​configured to establish a one-to-one or one-to-many connection topology between the analog channels and the chip pins based on the channel switching command.

[0062] Specifically, the switch matrix is ​​a crosspoint switch array; each crosspoint in the crosspoint switch array is equipped with a switch or relay independently controlled by the control module 10, and the connection between any input terminal and any output terminal is established or disconnected by controlling the on and off of the switch or relay.

[0063] Understandably, in this array, all input and output lines are electrically arranged in a crisscrossing grid pattern. At each intersection of an input and output line, a switch or relay is installed, independently controllable by the control module 10. Each such switch, as a basic routing unit, directly determines the electrical connection between the corresponding input and output terminals based on its on / off state. Digital commands sent by the control module 10, containing information on the switch states at all intersections, can simultaneously or sequentially control the on / off combinations of numerous switches in the array. This allows for the establishment of a dedicated, low-resistance conductive path between any input and any output terminal, or the disconnection of existing connections. This architecture enables non-blocking access across the entire matrix, providing extremely high connectivity flexibility.

[0064] Specifically, in Figure 3 In this example, the simulation test system uses eight simulation channels CH1~CH8 and GND as an example. CH1~CH8 correspond to the simulation chip test system DVI_9_0, DVI_9_1, DVI_11_0, DVI_11_1, DVI_13_0, DVI_13_1, OVI_2_0, and OVI_2_1, respectively. The chip under test (DUT) is an 8-pin chip. The channel switching module 20 automatically switches the connection order of each simulation channel (CH1~CH8 and GND) with the pins (PIN1~PIN8) of the chip under test according to the set program, so as to complete the connection of each pin of the chip under test with the different simulation channels of the test system.

[0065] Understandably, the channel switching module 20 connects to each analog channel (CH1~CH8 and ground GND) of the analog test system, and then connects to the chip pins (PIN1~PIN8) of the chip under test (DUT) via multiple sets of electronic switches or relays (S1~S8 groups, GND group). This allows each analog channel of the analog test system to connect to all pins of the DUT through the switching on and off of the electronic switches or relays. By receiving configuration information from the main control module, the main control module determines the on / off state of the electronic switch groups or relay groups to automatically switch the connection order between the analog channels of the analog chip test system and the pins of the chip under test. That is, the main control module controls the on / off state of groups S1~S8 and GND group to control the connection between CH1~CH8 and GND of the analog test system and pins PIN1~PIN8 of the DUT. This can be a one-to-one or one-to-many connection.

[0066] Specifically, please refer to Figure 5 , Figure 5 This is a one-to-one connection method between the analog channel and the pins of the chip under test in the analog chip testing system provided in this application embodiment.

[0067] exist Figure 5 In this process, the control module 10 controls the conduction of S1-1, S2-2, S3-3, S4-4, S5-5, S6-6, S7-7, and GND-8 in the electronic switch group, so that the analog channel CH1 of the analog test system is connected to PIN1 of the chip under test, the analog channel CH2 of the analog test system is connected to PIN2 of the chip under test, the analog channel CH3 of the analog test system is connected to PIN3 of the chip under test, the analog channel CH4 of the analog test system is connected to PIN4 of the chip under test, the analog channel CH5 of the analog test system is connected to PIN5 of the chip under test, the analog channel CH6 of the analog test system is connected to PIN6 of the chip under test, the analog channel CH7 of the analog test system is connected to PIN7 of the chip under test, and the analog channel GND of the analog test system is connected to PIN8 of the chip under test.

[0068] Specifically, please refer to Figure 6 , Figure 6 This is another one-to-one connection method for the connection order of the analog channel and the pins of the chip under test in the analog chip testing system provided in this application embodiment.

[0069] exist Figure 6 In this process, the control module 10 controls the conduction of S1-8, S2-7, S3-6, S4-5, S5-4, S6-3, S7-2, and GND-1 in the electronic switch group, so that the analog channel CH1 of the analog test system is connected to PIN8 of the chip under test, the analog channel CH2 of the analog test system is connected to PIN7 of the chip under test, the analog channel CH3 of the analog test system is connected to PIN6 of the chip under test, the analog channel CH4 of the analog test system is connected to PIN5 of the chip under test, the analog channel CH5 of the analog test system is connected to PIN4 of the chip under test, the analog channel CH6 of the analog test system is connected to PIN3 of the chip under test, the analog channel CH7 of the analog test system is connected to PIN2 of the chip under test, and the analog channel GND of the analog test system is connected to PIN1 of the chip under test.

[0070] Specifically, please refer to Figure 7 , Figure 7 This is a one-to-many connection method for the connection order of the analog channel and the pins of the chip under test in the analog chip testing system provided in this application embodiment.

[0071] exist Figure 7In the process, the control module 10 controls the conduction of S1-1, S1-2, S1-3, S2-4, S2-5, S3-6, GND-7, and GND-8 in the electronic switch group, so that the analog channel CH1 of the analog test system is connected to PIN1, PIN2, and PIN3 of the chip under test, the analog channel CH2 of the analog test system is connected to PIN4 and PIN5 of the chip under test, the analog channel CH3 of the analog test system is connected to PIN6 of the chip under test, and the analog channel GND of the analog test system is connected to PIN7 and PIN8 of the chip under test.

[0072] In addition to the above embodiments, this application proposes an embodiment of a programmable automatic switching method for analog channels. Please refer to... Figure 8 , Figure 8 This is a flowchart illustrating the programmable automatic switching method for analog channels provided in this application embodiment.

[0073] In this embodiment, the analog channel programmable automatic switching method includes steps S10 to S30.

[0074] Step S10: Receive test requirements for the analog chip under test. The test requirements include at least the pin identifier under test and the required test resource type.

[0075] It is understood that after the device is connected to an external power supply for the simulation test system or powered on using an internal battery, it receives test requirements for the simulated chip under test. This step is the input and starting point of the method. The entity executing this action can be the input module 30 in the aforementioned device embodiment, or the communication interface integrated with the control module 10. The receiving methods include, but are not limited to: manually inputting parameters from a graphical user interface (GUI), reading and parsing a predefined configuration file (such as XML or JSON format), or obtaining instruction streams from external test management software via a communication bus.

[0076] It is understandable that the test requirements are an abstraction of the test logic of the chip under test. The test requirements include at least the identification of the pins under test, which specifies the specific physical location on the chip under test that needs to be stimulated or measured (such as pin numbers A1, B2, or function names VDD, IN+). The required test resource types define the category and basic performance requirements of the test system analog channels required to operate on the pin (e.g., ±10V precision voltage source, 100mA current measurement unit, 16-bit differential sampling ADC, etc.).

[0077] Step S20: Based on the test requirements and the pre-stored test resource database, generate a channel switching instruction and send the channel switching instruction to the channel switching module. The channel switching instruction defines the target connection relationship between the test system channel and the test chip pin.

[0078] Understandably, based on the test requirements and the pre-stored test resource database, a channel switching command is generated and sent. The execution entity is the control module 10, specifically executed by its processing unit. The pre-stored test resource database is a structured data table stored in a storage unit, recording the attribute parameters of all available analog channels in the test system, such as unique identifiers, channel types, voltage / current / frequency ranges, accuracy, physical addresses, etc. The operational logic of this step is as follows: the processing unit parses the test requirements received in step S10, then queries the database, matching one or more available target analog test channels that meet the technical specifications for each required test resource type from the resource pool.

[0079] In other words, engineers can also input information using the test channel control input module to configure the pin connection order of the channel switching module, redefine the analog channel connections, or use a previously defined and saved configuration. The input module 30 feeds back the analog channel connection status to the control module 10. The control module 10 transmits the analog channel configuration information to the channel switching module, causing it to automatically switch the connection order of each analog channel with the pins of the chip under test according to the set program, thereby completing the connection of each pin of the chip under test with the different analog channels of the test system.

[0080] In step S30, the control channel switching module establishes or switches the physical connection between the corresponding analog channel and the chip pin according to the channel switching instruction, so as to perform the test and output the current channel connection status information.

[0081] It is understandable that the execution and feedback phase of the method involves the control channel switching module establishing or switching physical connections according to channel switching instructions and outputting status information. The control action is initiated by the control module 10, which essentially drives the hardware actions of the channel switching module 20. Upon receiving the instruction, the channel switching module 20 drives its internal switching elements (relays, solid-state switches, etc.) to perform on / off operations, thereby establishing a new or switching old electrical path, ultimately forming a physical connection between the specified system simulation channel and the chip pin. This connection, used for testing, provides the physical basis for subsequently applying test signals and reading response data.

[0082] Simultaneously, the current channel connection status information is output, which can be achieved by the status output module 40. This can take forms including, but not limited to, refreshing the connection list on the display screen, illuminating the corresponding channel status indicator lights, or reporting the connection topology via the network. Outputting status information completes the control loop, enabling operators or the host system to confirm whether the connection configuration is correctly established, monitor the connection status during testing, and provide feedback to external engineers for verification. At this point, the analog chip testing system has, according to the required settings, completed the connection of each pin of the chip under test (DUT) to the different analog channels of the testing system through this device.

[0083] In summary, this method transforms the fixed connection relationship that originally required manual wiring into a dynamic connection process that can be defined by software and executed automatically through three logically rigorous steps: demand input, intelligent matching and instruction generation, and execution and feedback. This fundamentally solves the problem in the background technology that fixed analog channels are difficult to adapt to diverse chip testing, and realizes efficient, flexible and automated scheduling of hardware resources in the test system.

[0084] The programmable automatic switching method for analog channels provided in this application is a concrete manifestation of the functions implemented in the aforementioned device embodiments in terms of process. Since each step of this method embodiment is collaboratively executed by the corresponding modules in the aforementioned device embodiments, its essence is to map the structure and function of the device into an executable operational flow. Therefore, the technical effects achieved by this method through a series of steps—receiving and parsing test requirements, intelligently matching channel resources to generate switching instructions, and controlling the establishment of physical connections and status feedback—such as solving the inflexibility of fixed analog channel connections, improving test automation and adaptability, and reducing manual intervention and errors, are completely consistent with the technical effects achieved by the aforementioned device embodiments in principle and purpose. Both originate from the same inventive concept, namely, dynamically configuring the connection relationship between the test system channels and the pins of the chip under test through programmable automatic control logic. Therefore, the beneficial effects of this method will not be repeated here.

[0085] In the description of the embodiments of this application, unless otherwise stated, "multiple" means two or more, for example, multiple processing units means two or more processing units, multiple elements means two or more elements, etc.

[0086] It should be understood that expressions such as “comprising” and “may include” used in this application indicate the existence of the disclosed functions, operations, or constituent elements, and do not limit one or more additional functions, operations, and constituent elements. In this application, terms such as “comprising” and / or “having” are to be interpreted as indicating a particular characteristic, number, operation, constituent element, component, or combination thereof, but not to exclude the existence or possibility of adding one or more other characteristics, numbers, operations, constituent elements, components, or combinations thereof.

[0087] Furthermore, in this application, the expression "and / or" includes any and all combinations of the associated listed words. For example, the expression "A and / or B" may include A, may include B, or may include both A and B.

[0088] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. An analog channel programmable automatic switching device, characterized by, include: Control module and channel switching module; The multiple input terminals of the channel switching module are respectively connected to multiple analog channels of the test system; the multiple output terminals of the channel switching module are respectively connected to multiple pins of the test chip. The first output terminal of the control module is connected to the controlled terminal of the channel switching module; The control module is configured to generate channel switching instructions based on test requirements and the channel attributes of the test system, and transmit them to the channel switching module. The channel switching module is configured to establish a connection between the test system channel and the test chip pin for testing, and to switch the connection based on the channel switching command.

2. The analog channel programmable automatic switching apparatus of claim 1, wherein, Also includes: Input module; The output terminal of the input module is connected to the input terminal of the control module; The input module is configured to receive or identify test requirements for the analog chip under test and transmit them to the control module. The test requirements include at least the pin identifier and the required test resource type.

3. The analog channel programmable automatic switching device as described in claim 2, characterized in that, The input module includes: a touch screen or a host computer; The touchscreen is configured to provide a local human-computer interaction interface to receive the test requirements; Alternatively, the host computer is configured to send a configuration file or instructions containing the test requirements to the control module via a communication interface.

4. The analog channel programmable automatic switching device as described in claim 1, characterized in that, The control module includes: a storage unit and a processing unit; The storage unit pre-stores a test resource database, which includes attribute parameters for multiple analog test channels. The attribute parameters include at least channel type, voltage range, and current range. The computing unit is configured to query the test resource database based on the test requirements to match at least one target simulated test channel that meets the test requirements; and generate a channel switching instruction containing a mapping relationship between the target channel identifier and the pin identifier under test.

5. The analog channel programmable automatic switching device as described in claim 1, characterized in that, The channel switching module includes: a switch matrix; The multiple input terminals of the switch matrix are respectively connected to multiple analog channels of the test system, and the multiple output terminals are respectively connected to multiple pins of the test chip. The switch matrix is ​​configured to establish a one-to-one or one-to-many connection topology between the analog channels and the chip pins based on the channel switching command.

6. The analog channel programmable automatic switching device as described in claim 5, characterized in that, The switch matrix is ​​a crosspoint switch array; Each intersection in the intersection switch array is equipped with a switch or relay independently controlled by the control module. By controlling the on and off states of the switch or relay, a connection between any input terminal and any output terminal can be established or disconnected.

7. The analog channel programmable automatic switching device as described in claim 1, characterized in that, The analog channel programmable automatic switching device further includes: a status output module; The input terminal of the status output module is connected to the second output terminal of the control module; The status output module is configured to receive connection information of the analog channel output by the control module to achieve status output.

8. The analog channel programmable automatic switching device as described in claim 7, characterized in that, The status output module includes at least one of a status indicator light, an LCD display screen, and / or an alarm, used to display the current channel connection status, switching results, or fault information in real time.

9. The analog channel programmable automatic switching device as described in claim 1, characterized in that, The analog channel programmable automatic switching device also includes: a power supply module and an energy storage module; The power module is used to convert the external input power into a stable DC voltage required by the control module and the channel switching module. The energy storage module is connected to the power supply module and is used to provide a holding voltage for the control module and channel switching module when the mains power fails, and to support the device to complete a safe shutdown or state saving process.

10. A method for automatic programmable switching of analog channels, characterized in that, include: Receive test requirements for the analog chip under test, the test requirements including at least the pin identifier and the required test resource type; Based on the test requirements and the pre-stored test resource database, a channel switching instruction is generated and sent to the channel switching module. The channel switching instruction defines the target connection relationship between the test system channel and the test chip pin. The channel switching module controls the establishment or switching of the physical connection between the corresponding analog channel and the chip pin according to the channel switching instruction, so as to perform the test and output the current channel connection status information.

Images