Voltage sensor and voltage measuring method

The voltage sensor, composed of a variable capacitor module and a switching unit, adaptively adjusts the voltage division ratio, solving the problem of fixed voltage sensor range. This expands the voltage measurement range and improves accuracy, enabling high-precision measurement of different voltage levels.

CN121899476APending Publication Date: 2026-04-21SOUTHERN POWER GRID DIGITAL GRID RESEARCH INSTITUTE CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SOUTHERN POWER GRID DIGITAL GRID RESEARCH INSTITUTE CO LTD
Filing Date
2026-02-12
Publication Date
2026-04-21

AI Technical Summary

Technical Problem

Existing voltage sensors have a fixed range, which leads to a deterioration in the signal-to-noise ratio when measuring small signals, making it impossible to meet the requirements of precision measurement.

Method used

The voltage sensor, composed of a variable capacitor module and a switching unit, adaptively adjusts the voltage division ratio by adjusting the equivalent capacitance value of the variable capacitor module and the state of the switching unit, so that the sampled voltage returns to the preset sampling range, thereby expanding the voltage measurement range and improving the accuracy.

Benefits of technology

It enables high-precision measurement of voltage sensors over a wide range, ensuring the accuracy and stability of measurement results and adapting to measurement needs at different voltage levels.

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Abstract

The invention relates to a voltage sensor and a voltage measuring method. The variable capacitance module comprises a first polar plate and a second polar plate. The first pole plate is connected with voltage to-be-tested equipment; the second pole plate comprises a plurality of pole pieces which are arranged at intervals; the plurality of pole pieces are arranged in sequence, and the previous pole piece is connected with the next pole piece through the switch unit; a first input end of the analog-to-digital conversion module is connected with a first end of the sampling capacitor module, a second input end of the analog-to-digital conversion module is connected with a second end of the sampling capacitor module, an output end of the analog-to-digital conversion module is connected with the processing control module, and the analog-to-digital conversion module outputs acquisition voltage; determining the voltage of the voltage to-be-tested equipment according to the collected voltage when the collected voltage is in the preset sampling interval; under the condition that the acquired voltage exceeds the preset sampling interval, controlling a target switch unit to be switched on or switched off so as to enable the acquired voltage to be in the preset sampling interval; the measurement range of the voltage sensor can be expanded, and the measurement precision is improved.
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Description

Technical Field

[0001] This application relates to the field of voltage monitoring technology, and in particular to a voltage sensor and a voltage measurement method. Background Technology

[0002] Voltage monitoring is a crucial component in power systems, new energy vehicles, and precision electronic equipment.

[0003] In related technologies, voltage sensors typically employ a "voltage divider + analog-to-digital converter (ADC) sampling" architecture. However, such sensors in practical applications suffer from the following significant drawbacks: 1. Fixed range limitation: The parameters of the sampling capacitor or voltage divider resistor are fixed, resulting in a fixed range. 2. Deterioration of signal-to-noise ratio (SNR) during small-signal measurements: When the voltage to be measured is small (e.g., in the low range after voltage division), the signal amplitude is extremely low. At this time, the quantization noise, thermal noise of the ADC itself, and the background noise of the front-end circuit are relatively large. Since the signal amplitude is close to the least significant bit (LSB) of the ADC, the noise will overwhelm the true signal, leading to a sharp decrease in measurement accuracy and even data jumps. For example, when measuring a 0.1V voltage, if the system noise floor is 5mV, the relative error is as high as 5%, which cannot meet the requirements for precision measurement. Summary of the Invention

[0004] Therefore, it is necessary to provide a voltage sensor, a voltage measurement method, a computer-readable storage medium, and a computer program product to address the aforementioned technical problems, which can expand the measurement range of the voltage sensor and improve the measurement accuracy.

[0005] In a first aspect, this application provides a voltage sensor, including: a variable capacitor module, a sampling capacitor module, an analog-to-digital converter module, and a processing and control module;

[0006] The variable capacitor module includes a first electrode plate and a second electrode plate disposed opposite to the first electrode plate; wherein, the first electrode plate is used to connect to the voltage test device; the second electrode plate includes a plurality of electrodes disposed at intervals; the plurality of electrodes are arranged sequentially, and the previous electrode plate is connected to the next electrode plate through a switching unit;

[0007] The first terminal of the sampling capacitor module is connected to the electrode of the target, and the second terminal of the sampling capacitor module is grounded.

[0008] The first input terminal of the analog-to-digital converter module is connected to the first terminal of the sampling capacitor module, the second input terminal of the analog-to-digital converter module is connected to the second terminal of the sampling capacitor module, and the output terminal of the analog-to-digital converter module is connected to the processing control module. The analog-to-digital converter module is used to output the sampled voltage.

[0009] The processing control module is connected to the switching unit and is configured as follows:

[0010] When the acquired voltage is within a preset sampling range, the voltage of the voltage-tested device is determined based on the acquired voltage; and...

[0011] If the acquired voltage exceeds the preset sampling range, the switching unit of the control target is turned on or off so that the acquired voltage is within the preset sampling range.

[0012] In one embodiment, the plurality of phase-spaced electrodes include a plurality of first electrodes and a plurality of second electrodes;

[0013] The plurality of first electrode plates are arranged sequentially along a first direction, and the preceding first electrode plate and the following first electrode plate are connected through the switching unit;

[0014] The plurality of second electrode plates are arranged sequentially along a second direction, which intersects with the first direction, and the previous second electrode plate and the next second electrode plate are connected through the switching unit;

[0015] The plurality of first electrodes are located on a first side, wherein the first side is the side of the first second electrode among the plurality of second electrodes that is away from the second second electrode;

[0016] The first first electrode among the plurality of first electrodes and the first second electrode among the plurality of second electrodes are connected through the switching unit.

[0017] In one embodiment, the first of the plurality of first electrodes is the target electrode.

[0018] In one embodiment, the first surface area of ​​the surface of the first electrode opposite to the first electrode plate is smaller than the second surface area of ​​the surface of the second electrode opposite to the first electrode plate.

[0019] In one embodiment, the sum of the first surface areas of the plurality of first electrodes is equal to the second surface area of ​​a second electrode.

[0020] In one embodiment, the analog-to-digital conversion module includes a signal amplification unit and an analog-to-digital conversion unit;

[0021] The first input terminal of the signal amplification unit is connected to the first terminal of the sampling capacitor module, and the second input terminal of the signal amplification unit is connected to the second terminal of the sampling capacitor module.

[0022] The input terminal of the analog-to-digital converter is connected to the output terminal of the signal amplification unit, and the output terminal of the analog-to-digital converter is connected to the processing control module.

[0023] The analog-to-digital conversion unit is used to output the acquired voltage based on the voltage signal output by the signal amplification unit.

[0024] In one embodiment, the processing control module includes a processing unit and a control unit;

[0025] The processing unit is connected to the analog-to-digital conversion module and is configured to: determine the voltage of the voltage-tested device according to a preset voltage division formula and the acquired voltage when the acquired voltage is within a preset sampling range;

[0026] The control unit is connected to both the processing unit and the switching unit, and is configured to: compare the acquired voltage with the preset sampling range; if the acquired voltage exceeds the preset sampling range, control the processing unit to determine the target equivalent capacitance value of the variable capacitor module according to the preset voltage divider formula and the acquired voltage, determine the target switching state of the target switching unit according to the target equivalent capacitance value, and control the target switching unit to be turned on or off according to the target switching state, wherein the target switching state includes being turned on or off.

[0027] In one embodiment, it further includes:

[0028] The display module, connected to the processing control module, is used to display the voltage of the voltage test device.

[0029] Based on the same inventive concept, in a second aspect, this application also provides a voltage measurement method applied to a voltage sensor, wherein the voltage sensor includes at least a variable capacitor module, a sampling capacitor module, and an analog-to-digital conversion module;

[0030] The variable capacitor module includes a first electrode plate and a second electrode plate disposed opposite to the first electrode plate; wherein, the first electrode plate is used to connect to the voltage test device; the second electrode plate includes a plurality of electrodes disposed at intervals; the plurality of electrodes are arranged sequentially, and the previous electrode plate is connected to the next electrode plate through a switching unit;

[0031] The first terminal of the sampling capacitor module is connected to the electrode of the target, and the second terminal of the sampling capacitor module is grounded.

[0032] The first input terminal of the analog-to-digital converter module is connected to the first terminal of the sampling capacitor module, the second input terminal of the analog-to-digital converter module is connected to the second terminal of the sampling capacitor module, and the output terminal of the analog-to-digital converter module is connected to the processing control module. The analog-to-digital converter module is used to output the sampled voltage.

[0033] The method includes:

[0034] When the acquired voltage is within a preset sampling range, the voltage of the voltage-tested device is determined based on the acquired voltage.

[0035] If the acquired voltage exceeds the preset sampling range, the switching unit of the control target is turned on or off so that the acquired voltage is within the preset sampling range.

[0036] In one embodiment, controlling the switching unit of the target to turn on or off when the acquired voltage exceeds a preset sampling range, so that the acquired voltage is within the preset sampling range, includes:

[0037] If the acquired voltage exceeds the preset sampling range, the target equivalent capacitance value of the variable capacitor module is determined according to the preset voltage divider formula and the acquired voltage.

[0038] The target switching state of the target's switching unit is determined based on the target equivalent capacitance value, wherein the target switching state includes being on or off;

[0039] The target's switching unit is turned on or off according to the target's switching state.

[0040] Based on the same inventive concept, in a third aspect, this application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the voltage measurement method of the second aspect described above.

[0041] Based on the same inventive concept, in a fourth aspect, this application also provides a computer program product, including a computer program that, when executed by a processor, implements the voltage measurement method of the second aspect described above.

[0042] The aforementioned voltage sensor, voltage measurement method, computer-readable storage medium, and computer program product include a voltage sensor comprising a variable capacitor module, a sampling capacitor module, an analog-to-digital converter module, and a processing control module. The variable capacitor module includes a first electrode plate and a second electrode plate disposed opposite to the first electrode plate; wherein the first electrode plate is used to connect to the voltage device under test; the second electrode plate includes multiple electrodes spaced apart; the multiple electrodes are arranged sequentially, with each electrode plate connected to the next via a switching unit. A first terminal of the sampling capacitor module is connected to the target electrode plate, and a second terminal of the sampling capacitor module is grounded. A first input terminal of the analog-to-digital converter module is connected to the first terminal of the sampling capacitor module, a second input terminal of the analog-to-digital converter module is connected to the second terminal of the sampling capacitor module, and an output terminal of the analog-to-digital converter module is connected to the processing control module, the analog-to-digital converter module being used to output the acquired voltage. The processing control module is connected to the switching unit and is configured to: determine the voltage of the voltage device under test based on the acquired voltage when the acquired voltage is within a preset sampling range; and control the switching unit of the target to turn on or off when the acquired voltage exceeds the preset sampling range, so that the acquired voltage is within the preset sampling range.

[0043] The preset sampling interval can be a preset optimal sampling interval. When the voltage output by the analog-to-digital converter module is within the preset sampling interval, the voltage of the device under test can be determined based on the sampled voltage. The voltage of the device under test determined in this way is a high-precision voltage because the sampled voltage is within the optimal sampling interval.

[0044] If the voltage output by the analog-to-digital converter module exceeds the preset sampling range, the target's switching unit will be turned on or off first. This will adjust the equivalent capacitance value of the variable capacitor module, thereby changing the voltage division ratio in the voltage sensor. This will bring the voltage back to the preset sampling range, that is, back to the optimal sampling range. Then, the voltage of the device under test will be determined based on the voltage. The voltage of the device under test determined at this time is also a voltage with high measurement accuracy.

[0045] Thus, the solution in this application embodiment always determines the voltage of the device under test based on the collected voltage when the collected voltage output by the analog-to-digital conversion module is within the preset sampling range. This ensures that the determined voltage of the device under test is a voltage with high measurement accuracy. Furthermore, for voltage measurements over a large range, the collected voltage is brought back to the preset sampling range by adjusting the equivalent capacitance value of the variable capacitor module. This also enables measurement within the preset sampling range. Essentially, it can adaptively adjust the voltage division ratio according to the magnitude of the voltage under test, thereby expanding the measurement range of the voltage sensor. Attached Figure Description

[0046] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the description of the embodiments of this application or related technologies will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0047] Figure 1 This is one of the structural block diagrams of a voltage sensor in one embodiment;

[0048] Figure 2 This is a schematic diagram of the structure of a variable capacitor module in one embodiment;

[0049] Figure 3 This is a second structural block diagram of a voltage sensor in one embodiment;

[0050] Figure 4 This is the third structural block diagram of the voltage sensor in one embodiment;

[0051] Figure 5 This is the fourth block diagram of the voltage sensor in one embodiment. Detailed Implementation

[0052] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0053] It should be noted that the terms "first," "second," etc., used in this application can be used to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish the first element from the second element. The terms "comprising" and "having," and any variations thereof, used in this application, are intended to cover non-exclusive inclusion. The term "multiple" used in this application refers to two or more. The term "and / or" used in this application refers to one of the embodiments, or any combination of multiple embodiments.

[0054] In one exemplary embodiment, combined with Figure 1 and Figure 2 A voltage sensor is provided, which includes a variable capacitor module 10, a sampling capacitor module 20, an analog-to-digital converter module 30, and a processing control module 40.

[0055] The variable capacitor module 10 includes a first electrode plate 11 and a second electrode plate 12 disposed opposite to the first electrode plate 11; wherein, the first electrode plate 11 is used to connect the voltage test device; the second electrode plate 12 includes a plurality of electrode pieces 120120 disposed at intervals; the plurality of electrode pieces 120 are arranged sequentially, and the previous electrode piece 120 and the next electrode piece 120 are connected through a switching unit 13.

[0056] The variable capacitor module 10 is a capacitor module with an adjustable equivalent capacitance value. By changing the equivalent capacitance value of the variable capacitor module 10, the voltage division ratio in the voltage sensor can be changed. Based on this, the voltage division ratio can be adaptively adjusted according to the magnitude of the voltage to be measured, thereby improving measurement accuracy. Furthermore, by controlling the switching unit 13 of the target to be turned on or off, the number of connected electrodes can be adjusted, thereby changing the equivalent capacitance value of the variable capacitor module 10.

[0057] A dielectric layer may be disposed between the first electrode plate 11 and the second electrode plate 12. Figure 2 (Not shown in the diagram), the specific material of the dielectric layer in this embodiment is not limited and can be set as needed based on actual application. The second electrode plate 12 is composed of multiple electrode sheets 120 arranged at intervals. The specific number of these multiple electrode sheets 120 is not limited in this embodiment and can be set as needed based on actual application. In addition, the shape and surface area of ​​each of the multiple electrode sheets 120 can be the same or different, and there is no specific limitation on this. It can be set as needed based on actual application.

[0058] For the variable capacitor module 10, its first electrode plate 11 can be connected to the voltage test device to realize the connection between the variable capacitor module 10 and the voltage test device; and at least one target electrode plate 120 of the plurality of electrode plates 120 can be connected to one end of the sampling capacitor module 20 to realize the connection between the variable capacitor module 10 and the sampling capacitor module 20. This embodiment does not specifically limit the electrode plates of the sampling capacitor module 20, and can be set as needed based on actual application.

[0059] As an example, the device under voltage test is, for example, but not limited to, a power transmission cable. As an example, the voltage range of the power transmission cable is 1.22V to 15.84V. As an example, the switching unit 13 is, for example, but not limited to, a MOSFET (Metal Oxide Semiconductor Field Effect Transistor).

[0060] The first end of the sampling capacitor module 20 is connected to the target electrode 120, and the second end of the sampling capacitor module 20 is grounded.

[0061] The equivalent capacitance value of the sampling capacitor module 20 can be set as needed based on the actual application, and there is no specific limitation on it. As an example, the equivalent capacitance value of the sampling capacitor module 20 is 100uF. As an example, the sampling capacitor module 20 can be composed of at least one capacitor connected together.

[0062] The first input terminal of the analog-to-digital converter module 30 is connected to the first terminal of the sampling capacitor module 20, the second input terminal of the analog-to-digital converter module 30 is connected to the second terminal of the sampling capacitor module 20, and the output terminal of the analog-to-digital converter module 30 is connected to the processing control module 40. The analog-to-digital converter module 30 is used to output the sampled voltage.

[0063] The analog-to-digital conversion module 30 is used to output the sampled voltage based on the voltage division of the variable capacitor module 10 and the sampling capacitor module 20. As an example, the analog-to-digital conversion module 30 may include at least an analog-to-digital converter (ADC).

[0064] The processing control module 40 can be connected to each switching unit 13 respectively. The processing control module 40 can be configured to: determine the voltage of the device under test based on the acquired voltage when the acquired voltage is within a preset sampling range; and control the switching unit 13 of the target to be turned on or off when the acquired voltage exceeds the preset sampling range, so that the acquired voltage is within the preset sampling range.

[0065] As an example, the processing control module 40 may include a Fast Fourier Transform Processor (FFT).

[0066] The preset sampling interval can be a preset optimal sampling interval. For example, if Uref is the reference voltage of the analog-to-digital converter, the preset sampling interval can be [0.6Uref, 0.8Uref]. For example, if Uref is 3.3V, then the preset sampling interval can be [1.98V, 2.64V]. The target switching unit 13 and its target switching state can both be determined by the processing control module 40 based on the acquired voltage, where the target switching state includes being on or off.

[0067] When the voltage output by the analog-to-digital converter module 30 is within the preset sampling range, the voltage of the device under test can be determined based on the voltage. The voltage of the device under test determined at this time is a high-precision voltage because the voltage is within the optimal sampling range.

[0068] If the voltage output by the analog-to-digital converter module 30 exceeds the preset sampling range, the target switching unit 13 will be controlled to turn on or off to adjust the equivalent capacitance value of the variable capacitor module 10, thereby changing the voltage division ratio in the voltage sensor and bringing the collected voltage back to the preset sampling range, that is, back to the optimal sampling range. Then, the voltage of the device under test will be determined based on the collected voltage. The voltage of the device under test determined at this time is also a voltage with high measurement accuracy.

[0069] Thus, the solution in this embodiment always determines the voltage of the device under test based on the collected voltage when the collected voltage output by the analog-to-digital conversion module 30 is within the preset sampling range. This ensures that the determined voltage of the device under test is a voltage with high measurement accuracy. Furthermore, for voltage measurements over a larger range, the collected voltage is brought back to the preset sampling range by adjusting the equivalent capacitance value of the variable capacitor module 10. This also enables measurement within the preset sampling range. Essentially, it can adaptively adjust the voltage division ratio according to the magnitude of the voltage under test, thereby expanding the measurement range of the voltage sensor.

[0070] In one exemplary embodiment, reference is made to Figure 3 The analog-to-digital conversion module 30 may include a signal amplification unit 31 and an analog-to-digital conversion unit 32. The first input terminal of the signal amplification unit 31 is connected to the first terminal of the sampling capacitor module 20, and the second input terminal of the signal amplification unit 31 is connected to the second terminal of the sampling capacitor module 20. The input terminal of the analog-to-digital conversion unit 32 is connected to the output terminal of the signal amplification unit 31, and the output terminal of the analog-to-digital conversion unit 32 is connected to the processing control module 40. The analog-to-digital conversion unit 32 is grounded. The analog-to-digital conversion unit 32 is used to output a sampled voltage based on the voltage signal output by the signal amplification unit 31.

[0071] The signal amplification unit 31 amplifies the acquired voltage signal. The gain of the signal amplification unit 31 can be set as needed based on the actual application, and there is no specific limitation. For example, the signal amplification unit 31 is an instrumentation amplifier (INA). For example, the analog-to-digital conversion unit 32 can be an analog-to-digital converter. In this embodiment, including the signal amplification unit 31 in the analog-to-digital conversion module 30 is beneficial for further improving the accuracy, stability, and anti-interference capability of the voltage sensor.

[0072] In one exemplary embodiment, reference is made to Figure 4The voltage sensor may also include a display module 50. The display module 50 is connected to the processing and control module 40 and is used to display the voltage of the device under test. In this embodiment, the display module 50 can display any quantity that needs to be shown to the user, so that the user can read the value of the relevant quantity in a timely and intuitive manner through the display module 50. For example, it can also display the equivalent capacitance value of the variable capacitor module 10, the equivalent capacitance value of the sampling capacitor module 20, the sampled voltage, the gain of the signal amplification unit 31, the number of connected electrodes, etc. There is no limitation on this, and it can be set as needed based on actual application.

[0073] In one exemplary embodiment, reference is made to Figure 5 The voltage sensor may also include a power supply module 60. The power supply module 60 can be used to supply power to the display module 50, the processing control module 40, and the analog-to-digital conversion module 30.

[0074] As an example, power module 60 may include a lithium battery.

[0075] In one exemplary embodiment, the voltage sensor may further include a housing, in which the variable capacitor module 10, sampling capacitor module 20, analog-to-digital converter module 30, processing control module 40, display module 50, and power supply module 60 are all located to encapsulate the voltage sensor.

[0076] In one exemplary embodiment, reference is made to Figure 2 The plurality of phase-spaced electrode plates 120 constituting the second electrode plate 12 include a plurality of first electrode plates 121 and a plurality of second electrode plates 122. The plurality of first electrode plates 121 are arranged sequentially along a first direction y, with each preceding first electrode plate 121 connected to the next via a switching unit 13. The plurality of second electrode plates 122 are arranged sequentially along a second direction x, which intersects the first direction y, and each preceding second electrode plate 122 is connected to the next via the switching unit 13. The plurality of first electrode plates 121 are located on a first side, wherein the first side is the side of the first second electrode plate 122 that is furthest from the second second electrode plate 122. The first first electrode plate 121 and the first second electrode plate 122 are connected via the switching unit 13. This facilitates the combination of various equivalent capacitance values ​​of the variable capacitance module 10, which is beneficial for improving measurement accuracy.

[0077] As an example, refer to Figure 2 The first electrode 121 among the plurality of first electrodes 121 is the target electrode. That is, the first electrode 121 among the plurality of first electrodes 121 is used to achieve the connection with the sampling capacitor module 20.

[0078] In one exemplary embodiment, the first surface area of ​​the surface of the first electrode 121 opposite to the first electrode plate 11 is smaller than the second surface area of ​​the surface of the second electrode 122 opposite to the first electrode plate 11. This facilitates the combination of multiple equivalent capacitance values ​​of the variable capacitor module 10, which helps to improve measurement accuracy.

[0079] As an example, when a single first electrode 121 is connected, that is, when the variable capacitor module 10 includes only a single first electrode 121, the equivalent capacitance value of the variable capacitor module 10 is 10uF. As an example, when a single first electrode 121 and a single second electrode 122 are connected, that is, when the variable capacitor module 10 includes only a single first electrode 121 and a single second electrode 122, the equivalent capacitance value of the variable capacitor module 10 is 50uF. That is, the capacitance value corresponding to a single first electrode 121 is 10uF, and the capacitance value corresponding to a single second electrode 122 is 40uF. It is understood that this embodiment does not limit the capacitance value corresponding to a single first electrode 121 or a single second electrode 122; 10uF and 40uF are merely examples.

[0080] In one exemplary embodiment, the sum of the first surface areas of the plurality of first electrodes 121 is equal to the second surface area of ​​a second electrode 122. Similarly, this facilitates the combination of various equivalent capacitance values ​​for the variable capacitor module 10, which is beneficial for improving measurement accuracy.

[0081] As an example, the first surface area of ​​the first electrode 121 is S1, and the second surface area of ​​the second electrode 122 is S2. Assuming there are n first electrodes 121, then S2 = n × S1. Assuming there are m second electrodes 122, then the third surface area of ​​the surface of the first electrode 11 opposite to the second electrode 12 is S3, and S3 is greater than n × S1 + m × S2.

[0082] In one exemplary embodiment, the processing control module 40 includes a processing unit and a control unit.

[0083] The processing unit is connected to the analog-to-digital conversion module 30. The processing unit is configured to determine the voltage of the device under test based on the preset voltage division formula and the acquired voltage when the acquired voltage is within the preset sampling range.

[0084] As an example, the preset voltage divider formula can be as follows:

[0085]

[0086] In the formula, The sampled voltage is the output of the analog-to-digital converter unit 32. For the gain of signal amplification unit 31, This is the equivalent capacitance value of the sampling capacitor module 20. This is the equivalent capacitance value of the variable capacitor module 10. The voltage of the device under test is denoted as .

[0087] The control unit is connected to the processing unit and the switching unit 13. The control unit is configured to: compare the acquired voltage with a preset sampling range; if the acquired voltage exceeds the preset sampling range, the control processing unit determines the target equivalent capacitance value of the variable capacitor module 10 according to the preset voltage division formula and the acquired voltage, and determines the target switching state of the target switching unit 13 according to the target equivalent capacitance value, and controls the target switching unit 13 to be turned on or off according to the target switching state, wherein the target switching state includes being turned on or off.

[0088] The following is combined with Figure 2 and Figure 5 Using the voltage test device as a power transmission cable, the reference voltage Uref of the analog-to-digital conversion unit 32 as 3.3V, the preset sampling range as [1.98V, 2.64V], the equivalent capacitance of the sampling capacitor module 20 as 100uF, the voltage range of the power transmission cable as 1.22V~15.84V, the number of first electrode plates 121 n as 4, the number of second electrode plates 122 m as 3, the capacitance value corresponding to a single first electrode plate 121 as 10uF, and the capacitance value corresponding to a single second electrode plate 122 as 40uF as an example, the solution of this application embodiment is further illustrated by example:

[0089] Step 1: Control all switching units 13 to be turned on, thereby connecting all n first plates 121 and m second plates 122 into the circuit. At this time, the equivalent capacitance value of the variable capacitor module 10 is C20. Then, the circuit voltage is collected by the analog-to-digital converter unit 32 as the sampling voltage VADC1.

[0090] Step 2: The processing control module 40 compares whether the acquired voltage VADC1 is within [1.98V, 2.64V].

[0091] If the voltage is VADC1, the equivalent capacitance C20 of the variable capacitor module 10, the equivalent capacitance of the sampling capacitor module 20 (100uF), and the gain of the signal amplification unit 31 are substituted into the preset voltage divider formula to calculate Vs1, which is the high-precision voltage of the power transmission cable.

[0092] If the value exceeds the limit, the sampled voltage VADC1, the equivalent capacitance value C20 of the variable capacitor module 10, the equivalent capacitance value of the sampling capacitor module 20 (100uF), and the gain of the signal amplification unit 31 are substituted into the preset voltage divider formula to calculate Vs1. However, this Vs1 will not be used as the high-precision voltage for the power transmission cable. Instead, based on the actual application scenario, experience, or a preset table, a sampled voltage value VADC2 within the range of [1.98V, 2.64V] is estimated. Then, VADC2, Vs1, the equivalent capacitance value of the sampling capacitor module 20 (100uF), and the gain of the signal amplification unit 31 are substituted into the preset voltage divider formula to calculate an equivalent capacitance value C21 for the variable capacitor module 10. This C21 is the target equivalent capacitance value of the variable capacitor module 10. Subsequently, based on C21, the number of first electrode plates 121 and second electrode plates 122 that need to be connected to the circuit are calculated, and the target switching unit 13 that needs to be turned on or off is determined. Then, the target switching unit 13 is controlled to be turned on or off, thereby obtaining the equivalent capacitance value of the variable capacitor module 10, C21. At this time, C21 will make the newly output sampling voltage VADC3 within [1.98V, 2.64V], that is, the sampling voltage returns to the preset sampling range. Finally, the newly output sampling voltage VADC3, C21, the equivalent capacitance value of the sampling capacitor module 20 (100uF), and the gain of the signal amplification unit 31 can be substituted into the preset voltage divider formula to calculate Vs2. Vs2 can be used as the high-precision voltage of the power transmission cable.

[0093] Based on the same inventive concept, in an exemplary embodiment, a voltage measurement method is provided. The voltage measurement method is applied, for example but not limited to, to a voltage sensor, which includes at least a variable capacitor module 10, a sampling capacitor module 20, and an analog-to-digital converter module 30.

[0094] The variable capacitor module 10 includes a first electrode plate 11 and a second electrode plate 12 disposed opposite to the first electrode plate 11. The first electrode plate 11 is used to connect to the voltage test device. The second electrode plate 12 includes multiple electrode pieces 120 spaced apart from each other. The multiple electrode pieces 120 are arranged sequentially, with each electrode piece connected to the next via a switching unit 13. The first terminal of the sampling capacitor module 20 is connected to the electrode piece of the target device, and the second terminal of the sampling capacitor module 20 is grounded. The first input terminal of the analog-to-digital converter module 30 is connected to the first terminal of the sampling capacitor module 20, the second input terminal of the analog-to-digital converter module 30 is connected to the second terminal of the sampling capacitor module 20, and the output terminal of the analog-to-digital converter module 30 is connected to the processing control module 40. The analog-to-digital converter module 30 is used to output the sampled voltage.

[0095] Voltage measurement methods may include the following steps:

[0096] If the collected voltage is within the preset sampling range, the voltage of the device under test is determined based on the collected voltage.

[0097] If the sampled voltage exceeds the preset sampling range, the control target's switching unit is turned on or off to keep the sampled voltage within the preset sampling range.

[0098] The voltage measurement method and voltage sensor provided in the embodiments of this application belong to the same inventive concept, can solve the same technical problem, and thus achieve the same technical effect. Repeated content will not be repeated here.

[0099] In an exemplary embodiment, controlling the target's switching unit to turn on or off when the sampled voltage exceeds a preset sampling range, so that the sampled voltage is within the preset sampling range, may include the following steps:

[0100] When the acquired voltage exceeds the preset sampling range, the target equivalent capacitance value of the variable capacitor module is determined according to the preset voltage divider formula and the acquired voltage.

[0101] The target switching state of the target's switching unit is determined based on the target equivalent capacitance value, wherein the target switching state includes being on or off.

[0102] The target's switching unit is turned on or off according to the target's switching state.

[0103] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages in other steps. It is understood that the steps in different embodiments can be freely combined as needed, and all non-contradictory solutions formed by such combinations are within the scope of protection of this application.

[0104] Based on the same inventive concept, in an exemplary embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above-described method embodiments.

[0105] Based on the same inventive concept, in an exemplary embodiment, a computer-readable storage medium is provided that stores a computer program thereon, the computer program being executed by a processor as the steps in the above-described method embodiments.

[0106] Based on the same inventive concept, in an exemplary embodiment, a computer program product is provided, including a computer program that, when executed by a processor, performs the steps in the above-described method embodiments.

[0107] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, artificial intelligence (AI) processors, etc., and are not limited to these.

[0108] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as the combination of these technical features does not contradict each other, it should be considered within the scope of this application. The above embodiments only illustrate several implementation methods of this application, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of this application. It should be noted that for those skilled in the art, several modifications and improvements can be made without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A voltage sensor, characterized in that, include: Variable capacitor module, sampling capacitor module, analog-to-digital converter module, and processing control module; The variable capacitor module includes a first electrode plate and a second electrode plate disposed opposite to the first electrode plate; wherein, the first electrode plate is used to connect to the voltage test device; the second electrode plate includes a plurality of electrodes disposed at intervals; the plurality of electrodes are arranged sequentially, and the previous electrode plate is connected to the next electrode plate through a switching unit; The first terminal of the sampling capacitor module is connected to the electrode of the target, and the second terminal of the sampling capacitor module is grounded. The first input terminal of the analog-to-digital converter module is connected to the first terminal of the sampling capacitor module, the second input terminal of the analog-to-digital converter module is connected to the second terminal of the sampling capacitor module, and the output terminal of the analog-to-digital converter module is connected to the processing control module. The analog-to-digital converter module is used to output the sampled voltage. The processing control module is connected to the switching unit and is configured as follows: When the acquired voltage is within a preset sampling range, the voltage of the voltage-tested device is determined based on the acquired voltage; and... If the acquired voltage exceeds the preset sampling range, the switching unit of the control target is turned on or off so that the acquired voltage is within the preset sampling range.

2. The voltage sensor according to claim 1, characterized in that, The plurality of phase-spaced electrode plates include a plurality of first electrode plates and a plurality of second electrode plates; The plurality of first electrode plates are arranged sequentially along a first direction, and the preceding first electrode plate and the following first electrode plate are connected through the switching unit; The plurality of second electrode plates are arranged sequentially along a second direction, which intersects with the first direction, and the previous second electrode plate and the next second electrode plate are connected through the switching unit; The plurality of first electrodes are located on a first side, wherein the first side is the side of the first second electrode among the plurality of second electrodes that is away from the second second electrode; The first first electrode among the plurality of first electrodes and the first second electrode among the plurality of second electrodes are connected through the switching unit.

3. The voltage sensor according to claim 2, characterized in that, The first of the plurality of first electrodes is the target electrode.

4. The voltage sensor according to claim 2, characterized in that, The first surface area of ​​the surface of the first electrode that is opposite to the first electrode plate is smaller than the second surface area of ​​the surface of the second electrode that is opposite to the first electrode plate.

5. The voltage sensor according to claim 4, characterized in that, The sum of the first surface areas of the plurality of first electrodes is equal to the second surface area of ​​the second electrode.

6. The voltage sensor according to any one of claims 1-5, characterized in that, The analog-to-digital conversion module includes a signal amplification unit and an analog-to-digital conversion unit; The first input terminal of the signal amplification unit is connected to the first terminal of the sampling capacitor module, and the second input terminal of the signal amplification unit is connected to the second terminal of the sampling capacitor module. The input terminal of the analog-to-digital converter is connected to the output terminal of the signal amplification unit, and the output terminal of the analog-to-digital converter is connected to the processing control module. The analog-to-digital conversion unit is used to output the acquired voltage based on the voltage signal output by the signal amplification unit.

7. The voltage sensor according to any one of claims 1-5, characterized in that, The processing control module includes a processing unit and a control unit; The processing unit is connected to the analog-to-digital conversion module and is configured to: determine the voltage of the voltage-tested device according to a preset voltage division formula and the acquired voltage when the acquired voltage is within a preset sampling range; The control unit is connected to both the processing unit and the switching unit, and is configured to: compare the acquired voltage with the preset sampling range; if the acquired voltage exceeds the preset sampling range, control the processing unit to determine the target equivalent capacitance value of the variable capacitor module according to the preset voltage divider formula and the acquired voltage, determine the target switching state of the target switching unit according to the target equivalent capacitance value, and control the target switching unit to be turned on or off according to the target switching state, wherein the target switching state includes being turned on or off.

8. The voltage sensor according to any one of claims 1-5, characterized in that, Also includes: The display module, connected to the processing control module, is used to display the voltage of the voltage test device.

9. A voltage measurement method, characterized in that, Applied to voltage sensors, the voltage sensor includes at least a variable capacitor module, a sampling capacitor module, and an analog-to-digital conversion module; The variable capacitor module includes a first electrode plate and a second electrode plate disposed opposite to the first electrode plate; wherein, the first electrode plate is used to connect to the voltage test device; the second electrode plate includes a plurality of electrodes disposed at intervals; the plurality of electrodes are arranged sequentially, and the previous electrode plate is connected to the next electrode plate through a switching unit; The first terminal of the sampling capacitor module is connected to the electrode of the target, and the second terminal of the sampling capacitor module is grounded. The first input terminal of the analog-to-digital converter module is connected to the first terminal of the sampling capacitor module, the second input terminal of the analog-to-digital converter module is connected to the second terminal of the sampling capacitor module, and the output terminal of the analog-to-digital converter module is connected to the processing control module. The analog-to-digital converter module is used to output the sampled voltage. The method includes: When the acquired voltage is within a preset sampling range, the voltage of the voltage-tested device is determined based on the acquired voltage. If the acquired voltage exceeds the preset sampling range, the switching unit of the control target is turned on or off so that the acquired voltage is within the preset sampling range.

10. The voltage measurement method according to claim 9, characterized in that, The step of controlling the switching unit of the target to turn on or off when the acquired voltage exceeds the preset sampling range, so that the acquired voltage is within the preset sampling range, includes: If the acquired voltage exceeds the preset sampling range, the target equivalent capacitance value of the variable capacitor module is determined according to the preset voltage divider formula and the acquired voltage. The target switching state of the target's switching unit is determined based on the target equivalent capacitance value, wherein the target switching state includes being on or off; The target's switching unit is turned on or off according to the target's switching state.