X-ray-based ultra-high voltage combined electrical apparatus insulation level calculation method and system

Abstract

The application discloses an X-ray-based ultra-high voltage combined electric appliance insulation level calculation method and system, which comprises the following steps: obtaining the partial discharge voltage of an ultra-high voltage GIS commissioning withstand voltage test; calculating the electric field intensity through electric field simulation under the condition of containing electric charges; after actual temperature correction, the minimum insulation level at the time of commissioning is calculated in combination with the partial discharge voltage; X-ray parameters are set to irradiate and stimulate the GIS, and the corresponding partial discharge voltage is obtained; if the voltage is less than the voltage at the time of commissioning, the minimum insulation level of the solid insulation containing defects is deduced in combination with the X-ray parameters and the variation law of the discharge charge in the solid insulation and the photoionization action parameters; and finally, the insulation level reduction amplitude is calculated. The application realizes unified insulation level calculation of SF6 gas and solid insulation, quantitatively obtains the reduction amplitude, accurately captures the weak links of insulation, provides a reliable basis for GIS health diagnosis and life prediction, and guarantees the safe and stable operation of the power system.

Description

Technical Field

[0001] This invention relates to the field of ultra-high voltage combined electrical equipment technology, specifically to a method and system for calculating the insulation level of ultra-high voltage combined electrical equipment based on X-rays. Background Technology

[0002] Ultra-high voltage (UHV) gas-insulated switchgear (GIS) is a critical component of power systems. Its complex internal structure and numerous components necessitate high insulation levels. Both the internal solid and gas insulation must withstand very high voltages, and even minor defects can significantly reduce the insulation level. Therefore, accurate insulation level calculation is of paramount importance. Patent publication CN111308279A discloses a method for calculating the insulation strength of high-voltage electrical equipment based on gas decomposition products. This method calculates the insulation strength by analyzing the gas decomposition products during partial discharge. However, this method only addresses gas insulation. GIS contains both gas and solid insulation, making it difficult to calculate the specific reaction processes. Calculating the insulation level of GIS requires a unified calculation of both the SF6 gas insulation and solid insulation of the entire gas chamber. Obtaining the insulation level provides crucial reference for GIS health diagnosis and lifespan prediction, ensuring its safe and stable operation. While X-rays can induce partial discharge in the insulation components of GIS, this method has not yet been applied to insulation level calculation. Therefore, a unified insulation level calculation method for GIS gas and solid insulation is urgently needed. Summary of the Invention

[0003] To address the shortcomings of existing technologies, this invention provides an X-ray-based method for calculating the insulation level of ultra-high voltage combined electrical appliances (GIS). The aim is to achieve a unified calculation of the gas insulation and solid insulation of the entire gas chamber of ultra-high voltage GIS, obtaining more accurate insulation level results and providing an important reference for the health diagnosis and life prediction of GIS.

[0004] To achieve the above objectives, the present invention provides the following technical solution: a method for calculating the insulation level of ultra-high voltage combined electrical appliances based on X-rays, comprising the following steps:

[0005] Step S1: Obtain the partial discharge voltage of the ultra-high voltage GIS during the withstand voltage test during commissioning, calculate the electric field strength through electric field simulation, correct the electric field strength according to the current actual temperature and air pressure conditions, and calculate the minimum insulation level of the ultra-high voltage GIS when it is first put into operation based on the corrected electric field strength and the partial discharge voltage during the withstand voltage test.

[0006] Step S2: Set X-ray parameters and irradiate and excite the ultra-high voltage GIS to obtain the partial discharge voltage under X-ray irradiation excitation; if the partial discharge voltage under X-ray irradiation excitation is less than the partial discharge voltage during the commissioning withstand voltage test, then deduce the minimum insulation level of the ultra-high voltage GIS solid insulation with defects under X-ray irradiation based on the partial discharge voltage under X-ray irradiation excitation and the X-ray parameters.

[0007] Step S3: Based on the minimum insulation level of the ultra-high voltage GIS when it is first put into operation and the minimum insulation level of the solid insulation of the ultra-high voltage GIS with defects under X-ray irradiation, calculate the reduction rate of the insulation level of the ultra-high voltage GIS.

[0008] Furthermore, the electric field strength is calculated using an electric field simulation method under charge conditions. This simulation method combines the correlation between electric displacement, charge density, electric field strength, electric potential, ground potential, standard permittivity, and relative permittivity. Then, the electric field strength obtained from the simulation is corrected according to the current actual temperature and air pressure conditions.

[0009] Furthermore, based on the corrected electric field strength and the partial discharge voltage during the withstand voltage test... Calculate the minimum insulation level of ultra-high voltage GIS when it is first put into operation. The specific process is as follows: Extract the actual electric field strength along the surface of SF6 gas and solid insulation from the corrected electric field strength of ultra-high voltage GIS. The actual electric field strength along the surface of SF6 gas and solid insulation and the partial discharge voltage during the commissioning withstand voltage test are taken. The minimum value of the ratio is used as the minimum insulation level of the ultra-high voltage GIS when it is first put into operation. .

[0010] Furthermore, the specific process of step S2 is as follows: setting X-ray parameters and irradiating and exciting the ultra-high voltage GIS, and obtaining the partial discharge voltage under X-ray irradiation excitation. Partial discharge voltage under X-ray irradiation excitation Partial discharge voltage during commissioning withstand voltage test The size is used to determine if Calculate the actual electric field strength along the surface between SF6 gas and solid insulation and the partial discharge voltage under X-ray irradiation excitation according to the method in step S1. The minimum value of the ratio is used as the insulation level between SF6 gas and solid insulation surfaces under X-ray irradiation. Simultaneously, by combining the charge change law of internal discharge in solid insulation and the relevant parameters of X-ray photoionization, the final electric field strength is derived, and then the minimum insulation level of the solid insulation is calculated. ,Pick and The minimum value is used as the minimum insulation level of ultra-high voltage GIS solid insulation containing defects under X-ray irradiation. .

[0011] Furthermore, combining the charge change law of internal discharge in solid insulation and the relevant parameters of X-ray photoionization, the specific process of deriving the final electric field strength is as follows: the minimum insulation level of solid insulation. The calculation first clarifies the charge equation during the internal discharge process of solid insulation when defects exist. Relevant parameters of the charge equation include electron number density, positive ion number density, negative ion number density, electron mobility, positive ion mobility, negative ion mobility, electron diffusion coefficient, positive ion diffusion coefficient, negative ion diffusion coefficient, collisional ionization coefficient, electron adhesion coefficient, positive ion-electron recombination coefficient, positive and negative ion recombination coefficient, elementary charge, standard permittivity, relative permittivity, potential gradient (electric field strength), and the electric field strength generated by the charge. Then, the relevant parameters of the charge equation describe the changes in the number of positive ions, negative ions, and electrons, combined with the partial discharge voltage under X-ray irradiation excitation. The electric potential is determined by its relationship with the ground potential, and the electric field formed by the charge is obtained based on the correlation between the electric potential and the amount of charge, thus obtaining the final electric field strength. At the same time, the photoionization effect of X-rays is characterized by the conversion coefficient, X-ray dose, gas density, and effective ionization volume of the gas.

[0012] Furthermore, the minimum insulation level of the solid insulation is calculated. The specific process is as follows: based on the partial discharge voltage obtained under X-ray irradiation excitation The final electric field strength is obtained by taking the partial discharge voltage under X-ray irradiation excitation. The minimum value of the ratio to the final electric field strength is used to calculate the minimum insulation level of the solid insulation. .

[0013] Furthermore, based on the minimum insulation level of the ultra-high voltage GIS when it is first put into operation and the minimum insulation level of the solid insulation of the ultra-high voltage GIS with defects under X-ray irradiation, the specific process for calculating the reduction of the insulation level of the ultra-high voltage GIS is as follows: by calculating the ratio of the difference between the minimum insulation level of the ultra-high voltage GIS when it is first put into operation and the minimum insulation level of the solid insulation of the ultra-high voltage GIS with defects under X-ray irradiation to the minimum insulation level of the ultra-high voltage GIS when it is first put into operation, and converting this ratio into a percentage form, the reduction of the insulation level of the ultra-high voltage GIS is obtained.

[0014] An X-ray-based system for calculating the insulation level of ultra-high voltage combined electrical appliances includes:

[0015] The minimum insulation level calculation module for ultra-high voltage GIS during commissioning is used to obtain the partial discharge voltage of ultra-high voltage GIS during the withstand voltage test during commissioning. It calculates the electric field strength through electric field simulation, corrects the electric field strength according to the current actual temperature and air pressure conditions, and calculates the minimum insulation level of ultra-high voltage GIS when it is first put into operation based on the corrected electric field strength and the partial discharge voltage during the withstand voltage test.

[0016] The module for calculating the minimum insulation level of ultra-high voltage GIS solid insulation with defects under X-ray irradiation is used to set X-ray parameters and irradiate ultra-high voltage GIS to obtain the partial discharge voltage under X-ray irradiation. If the partial discharge voltage under X-ray irradiation is less than the partial discharge voltage during the commissioning withstand voltage test, the minimum insulation level of ultra-high voltage GIS solid insulation with defects under X-ray irradiation is deduced based on the partial discharge voltage under X-ray irradiation and the X-ray parameters.

[0017] The module for calculating the reduction in insulation level of ultra-high voltage GIS is used to calculate the reduction in insulation level of ultra-high voltage GIS based on the minimum insulation level of ultra-high voltage GIS when it is first put into operation and the minimum insulation level of ultra-high voltage GIS solid insulation with defects under X-ray irradiation.

[0018] An electronic device includes a processor, a memory, and a bus, wherein the processor and the memory are connected via the bus, wherein the memory is used to store a set of program code, and the processor is used to call the program code stored in the memory to execute an X-ray-based method for calculating the insulation level of ultra-high voltage combined electrical appliances.

[0019] A non-volatile computer storage medium storing computer-executable instructions that execute an X-ray-based method for calculating the insulation level of ultra-high voltage combined electrical appliances.

[0020] Compared with existing technologies, the present invention has the following advantages:

[0021] (1) This invention integrates X-ray irradiation excitation technology, electric field simulation method with charge conditions and actual operating condition parameter correction mechanism to first obtain the minimum insulation level of ultra-high voltage GIS when it is put into operation, and then uses X-ray irradiation to identify solid insulation defects. Combining the law of discharge charge change in solid insulation and X-ray photoionization parameters, the final electric field strength is derived. This invention realizes the unified insulation level calculation of SF6 gas insulation and solid insulation in ultra-high voltage GIS, and at the same time quantitatively obtains the insulation level reduction range, comprehensively captures the weak links of the insulation system, provides a reliable basis for GIS health diagnosis and life prediction, and effectively ensures the safe and stable operation of the power system.

[0022] (2) Based on the characteristic that X-ray irradiation excitation can provide initial effective electrons, this invention can accurately determine whether there are defects in solid insulation. It solves the problem that traditional methods cannot simultaneously cover the calculation of gas insulation and solid insulation levels and cannot effectively identify hidden defects inside solid insulation. This makes the insulation level assessment of ultra-high voltage GIS more targeted and helps to promptly identify potential insulation risks.

[0023] (3) This invention uses electric field simulation with charge conditions and combines actual temperature and air pressure to correct the electric field strength. At the same time, it accurately describes the change law of particle number through charge equation and optimizes the derivation process of final electric field strength by combining key parameters of X-ray photoionization. This effectively avoids the result deviation caused by neglecting the coupling effect of multiple factors in traditional calculation methods, significantly improves the accuracy and scientific nature of insulation level calculation, and provides more rigorous technical support for the insulation status assessment of ultra-high voltage GIS. Attached Figure Description

[0024] Figure 1 This is a flowchart of the method of the present invention;

[0025] Figure 2 This is a graph showing the insulation level curves at different locations along the surface of a newly commissioned ultra-high voltage combined electrical appliance, calculated in this embodiment of the invention.

[0026] Figure 3 These are all insulation level curves calculated in this embodiment of the invention when the solid insulation of the ultra-high voltage combined electrical appliance has defects;

[0027] Figure 4 This is a comparison curve of all insulation levels when there are small and large defects in the solid insulation of ultra-high voltage combined electrical appliances calculated in the embodiments of the present invention. Detailed Implementation

[0028] Example 1

[0029] like Figure 1 As shown, the present invention provides a technical solution: a method for calculating the insulation level of ultra-high voltage combined electrical appliances based on X-rays, comprising the following steps:

[0030] Step S1: Obtain the partial discharge voltage of the ultra-high voltage GIS during the withstand voltage test during commissioning. The electric field strength is calculated through electric field simulation, and then corrected according to the actual temperature and air pressure conditions. Based on the corrected electric field strength and the partial discharge voltage during the withstand voltage test, the electric field strength is then calculated. Calculate the minimum insulation level of ultra-high voltage GIS when it is first put into operation. .

[0031] The electric field strength is calculated using an electric field simulation method under charged conditions. This simulation method requires considering the correlation between parameters such as electric displacement, charge density, electric field strength, electric potential, ground potential, standard permittivity, and relative permittivity. Then, the electric field strength obtained from the simulation is corrected according to the current actual temperature and air pressure conditions. The correction process requires referring to the correspondence between actual air pressure, standard air pressure, actual temperature, and standard temperature to obtain the electric field strength under the current actual temperature and air pressure conditions.

[0032] The electric field simulation method under charge conditions can be expressed as follows:

[0033] ;

[0034] ;

[0035] ;

[0036] ;

[0037] In the formula, Represents the divergence operator; The divergence of electric displacement is represented by the following: It is the electric displacement; Indicates charge density; Indicates electric field strength; Represents the gradient operator; Represents the gradient of electric potential; Represents electric potential; It represents the standard dielectric constant (also called the vacuum dielectric constant). Represents the relative permittivity; This indicates the partial discharge voltage during the withstand voltage test of ultra-high voltage GIS during commissioning; This represents the ground potential, that is, the potential at the grounding terminal.

[0038] The electric field strength, corrected for the current actual temperature and air pressure conditions, can be expressed as:

[0039] ;

[0040] In the formula, This represents the electric field strength after correction based on the current actual temperature and air pressure conditions. Indicates actual air pressure, referring to the air pressure in the actual operating environment of ultra-high voltage GIS; Standard pressure refers to the air pressure under the standard operating conditions on which the electric field simulation is based (usually standard atmospheric pressure). Indicates standard temperature; This indicates the actual temperature.

[0041] Among them, based on the corrected electric field strength and the partial discharge voltage during the withstand voltage test Calculate the minimum insulation level of ultra-high voltage GIS when it is first put into operation. The specific process is as follows: Extract the actual electric field strength along the surface of SF6 gas and solid insulation from the corrected electric field strength of ultra-high voltage GIS. (Since there are no internal defects in the insulation of the newly commissioned ultra-high voltage GIS, the weakest point in its insulation level is the surface between the SF6 gas and the solid insulation.) Take the actual electric field strength of the surface between the SF6 gas and the solid insulation and the partial discharge voltage during the commissioning withstand voltage test. The minimum value of the ratio is used as the minimum insulation level of the ultra-high voltage GIS when it is first put into operation. .

[0042] Step S2: Set X-ray parameters and irradiate the ultra-high voltage GIS to obtain the partial discharge voltage under X-ray irradiation excitation. If the partial discharge voltage under X-ray irradiation excitation Less than the partial discharge voltage during the commissioning withstand voltage test Based on the partial discharge voltage under X-ray irradiation excitation And X-ray parameters were used to extrapolate the minimum insulation level of ultra-high voltage GIS solid insulation with defects under X-ray irradiation.

[0043] X-ray irradiation excitation can provide initial effective electrons for partial discharge, thereby reducing the initiation voltage. If defects exist in the solid insulation, the initiation voltage will be significantly reduced; if no defects exist, it has no effect on the overall insulation level (if there are no defects, no partial discharge will occur, and X-ray irradiation will not produce one either. If defects exist, the partial discharge initiation voltage will decrease after X-ray irradiation). Therefore, the partial discharge voltage under X-ray irradiation excitation is first analyzed. Partial discharge voltage during commissioning withstand voltage test The size is used to determine if This indicates that there are defects in the ultra-high voltage GIS and the overall insulation level is reduced. Further calculation of the reduced insulation level is required: calculate the actual surface electric field strength between SF6 gas and solid insulation and the partial discharge voltage under X-ray irradiation excitation according to the method in step S1. The minimum value of the ratio is used as the value under X-ray irradiation. Insulation level of gas-solid insulation along the surface Simultaneously, by combining the charge change law of internal discharge in solid insulation and the relevant parameters of X-ray photoionization, the final electric field strength is derived, and then the minimum insulation level of the solid insulation is calculated. ,Pick and The minimum value is used as the minimum insulation level of ultra-high voltage GIS solid insulation containing defects under X-ray irradiation. .

[0044] In addition, the final electric field strength is derived by combining the charge change law of internal discharge in solid insulation and the relevant parameters of X-ray photoionization, and then the minimum insulation level of solid insulation is calculated. The specific process is as follows: minimum insulation level of solid insulation The calculation requires first clarifying the charge equation during the internal discharge process of solid insulation when defects exist. The relevant parameters of the charge equation include electron number density, positive ion number density, negative ion number density, electron mobility, positive ion mobility, negative ion mobility, electron diffusion coefficient, positive ion diffusion coefficient, negative ion diffusion coefficient, collisional ionization coefficient, electron adhesion coefficient, positive ion-electron recombination coefficient, positive and negative ion recombination coefficient, elementary charge, standard permittivity, relative permittivity, potential gradient (i.e., electric field strength), and the electric field strength generated by the charge. Then, the above parameters are used to describe the changes in the number of positive ions, negative ions, and electrons, combined with the partial discharge voltage under X-ray excitation. The relationship with ground potential is used to determine the electric potential. Based on the correlation between electric potential and the amount of charge, the electric field formed by the charge is derived, thus obtaining the final electric field strength. Simultaneously, the photoionization effect of X-rays needs to be characterized by the following parameters: conversion coefficient, X-ray dose, gas density, and effective ionization volume of the gas. Based on the obtained partial discharge voltage under X-ray irradiation excitation... The final electric field strength is obtained by taking the partial discharge voltage under X-ray irradiation excitation. The minimum value of the ratio to the final electric field strength is used to calculate the minimum insulation level of the solid insulation. .

[0045] The charge equation is expressed as:

[0046] Description of the number of positive ions: ;

[0047] Description of the number of negative ions: ;

[0048] Description of the number of electrons: ;

[0049] ;

[0050] The electric field formed by the charge satisfies: ;

[0051] The electric field strength formed by the charge is: ;

[0052] Final electric field strength: ;

[0053] In the formula, Represents the positive ion number density; Indicates time; Indicates the mobility of positive ions; Indicates the diffusion coefficient of positive ions; Indicates electron mobility; Indicates the recombination coefficient of positive and negative ions; Indicates the negative ion number density; Indicates the positive ion-electron recombination coefficient; Represents electron number density; The source term parameters (positive ion / electron generation rate, which is directly related to the electron number density produced by photoionization) represent the X-ray photoionization effect. Indicates the mobility of negative ions; This represents the diffusion coefficient of negative ions; Indicates the electron adhesion coefficient; Indicates the electron diffusion coefficient; Indicates the collision ionization coefficient; This represents the electric potential (potential) at the solid insulation defect of ultra-high voltage GIS under X-ray irradiation excitation. Indicates the standard dielectric constant; Represents the relative permittivity; Represents the elementary charge; This represents the final electric field strength; Represents the coefficient (a proportionality constant related to the calculation of electric field of charge); It represents the distance from the charge (the radial distance from a point in space to the charge source); The number of electrons produced by the photoionization of X-rays is described by the following formula: , Represents the conversion factor, taken as... ; Indicates X-ray dose; To represent the density of a gas, take... ; It is the effective ionization volume of the gas.

[0054] Among them, the minimum insulation level of solid insulation The calculation process is as follows: .

[0055] Step S3: Based on the minimum insulation level of the ultra-high voltage GIS at the time of commissioning And the minimum insulation level of ultra-high voltage GIS solid insulation with defects under X-ray irradiation. The reduction in insulation level of ultra-high voltage GIS can be expressed as: .

[0056] A second embodiment of the present invention also provides an X-ray-based system for calculating the insulation level of ultra-high voltage combined electrical appliances, comprising:

[0057] The minimum insulation level calculation module for ultra-high voltage GIS during commissioning is used to obtain the partial discharge voltage of ultra-high voltage GIS during the withstand voltage test during commissioning. It calculates the electric field strength through electric field simulation, corrects the electric field strength according to the current actual temperature and air pressure conditions, and calculates the minimum insulation level of ultra-high voltage GIS when it is first put into operation based on the corrected electric field strength and the partial discharge voltage during the withstand voltage test.

[0058] The module for calculating the minimum insulation level of ultra-high voltage GIS solid insulation with defects under X-ray irradiation is used to set X-ray parameters and irradiate ultra-high voltage GIS to obtain the partial discharge voltage under X-ray irradiation. If the partial discharge voltage under X-ray irradiation is less than the partial discharge voltage during the commissioning withstand voltage test, the minimum insulation level of ultra-high voltage GIS solid insulation with defects under X-ray irradiation is deduced based on the partial discharge voltage under X-ray irradiation and the X-ray parameters.

[0059] The module for calculating the reduction in insulation level of ultra-high voltage GIS is used to calculate the reduction in insulation level of ultra-high voltage GIS based on the minimum insulation level of ultra-high voltage GIS when it is first put into operation and the minimum insulation level of ultra-high voltage GIS solid insulation with defects under X-ray irradiation.

[0060] A third embodiment of the present invention also provides an electronic device, including a processor, a memory, and a bus, wherein the processor and the memory are connected via the bus, wherein the memory is used to store a set of program code, and the processor is used to call the program code stored in the memory to execute a method for calculating the insulation level of ultra-high voltage combined electrical appliances based on X-rays.

[0061] The fourth embodiment of the present invention also provides a non-volatile computer storage medium storing computer-executable instructions that execute an X-ray-based method for calculating the insulation level of ultra-high voltage combined electrical appliances.

[0062] In this embodiment, as shown... Figure 2 , Figure 3 and Figure 4 The diagram shows the insulation level for the entire area, with the final insulation level being the minimum value on the curve. Figure 2 The minimum insulation level is 0.3, which is for newly commissioned combined electrical appliances. Figure 3 The minimum insulation level is 0.267. Figure 4The minimum insulation level is 0.267 for small defects and 0.248 for large defects. The insulation level reduction for small and large defects is 11% and 17.3%, respectively. The larger the defect size, the smaller the insulation level value, and the more likely the GIS will break down. The minimum insulation level calculated by this invention can reflect the health level of the GIS. The smaller the insulation level, the more likely it is to break down and the shorter its service life.

[0063] In this embodiment, the charge equation describing the internal discharge process of solid insulation when defects exist in step S2 is shown in Table 1, where the parameters and specific values ​​are as follows.

[0064] Table 1. Parameter values ​​related to the charge equation

[0065]

[0066] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A method for calculating the insulation level of ultra-high voltage combined electrical appliances based on X-rays, characterized in that, Includes the following steps: Step S1: Obtain the partial discharge voltage of the ultra-high voltage GIS during the withstand voltage test during commissioning, calculate the electric field strength through electric field simulation, correct the electric field strength according to the current actual temperature and air pressure conditions, and calculate the minimum insulation level of the ultra-high voltage GIS when it is first put into operation based on the corrected electric field strength and the partial discharge voltage during the withstand voltage test. Step S2: Set X-ray parameters and irradiate and excite the ultra-high voltage GIS to obtain the partial discharge voltage under X-ray irradiation excitation; if the partial discharge voltage under X-ray irradiation excitation is less than the partial discharge voltage during the commissioning withstand voltage test, then deduce the minimum insulation level of the ultra-high voltage GIS solid insulation with defects under X-ray irradiation based on the partial discharge voltage under X-ray irradiation excitation and the X-ray parameters. Step S3: Based on the minimum insulation level of the ultra-high voltage GIS when it is first put into operation and the minimum insulation level of the solid insulation of the ultra-high voltage GIS with defects under X-ray irradiation, calculate the reduction rate of the insulation level of the ultra-high voltage GIS. The specific process of step S2 is as follows: set the X-ray parameters and irradiate the ultra-high voltage GIS to obtain the partial discharge voltage under X-ray irradiation excitation. Partial discharge voltage under X-ray irradiation excitation Partial discharge voltage during commissioning withstand voltage test The size is used to determine if Calculate according to the method in step S1 Actual surface electric field strength of gas-solid insulation and partial discharge voltage under X-ray irradiation excitation The minimum value of the ratio is used as the value under X-ray irradiation. Insulation level of gas-solid insulation along the surface Simultaneously, by combining the charge change law of internal discharge in solid insulation and the relevant parameters of X-ray photoionization, the final electric field strength is derived, and then the minimum insulation level of the solid insulation is calculated. ,Pick and The minimum value is used as the minimum insulation level of ultra-high voltage GIS solid insulation containing defects under X-ray irradiation. ; Simultaneously, combining the charge change law of internal discharge in solid insulation and the relevant parameters of X-ray photoionization, the specific process of deriving the final electric field strength is as follows: the minimum insulation level of solid insulation. The calculation first clarifies the charge equation during the internal discharge process of solid insulation when defects exist. Relevant parameters of the charge equation include electron number density, positive ion number density, negative ion number density, electron mobility, positive ion mobility, negative ion mobility, electron diffusion coefficient, positive ion diffusion coefficient, negative ion diffusion coefficient, collisional ionization coefficient, electron adhesion coefficient, positive ion-electron recombination coefficient, positive and negative ion recombination coefficient, elementary charge, standard permittivity, relative permittivity, potential gradient (electric field strength), and the electric field strength generated by the charge. Then, the relevant parameters of the charge equation describe the changes in the number of positive ions, negative ions, and electrons, combined with the partial discharge voltage under X-ray irradiation excitation. The electric potential is determined by its relationship with the ground potential, and the electric field formed by the charge is obtained based on the correlation between the electric potential and the amount of charge, thus obtaining the final electric field strength. At the same time, the photoionization effect of X-rays is characterized by the conversion coefficient, X-ray dose, gas density, and effective ionization volume of the gas.

2. The method for calculating the insulation level of ultra-high voltage combined electrical appliances based on X-rays according to claim 1, characterized in that: The electric field strength is calculated using an electric field simulation method under charged conditions. This simulation method combines the correlation between electric displacement, charge density, electric field strength, electric potential, ground potential, standard permittivity, and relative permittivity. Then, the electric field strength obtained from the simulation is corrected according to the current actual temperature and air pressure conditions.

3. The method for calculating the insulation level of ultra-high voltage combined electrical appliances based on X-rays according to claim 2, characterized in that: Based on the corrected electric field strength and the partial discharge voltage during the withstand voltage test Calculate the minimum insulation level of ultra-high voltage GIS when it is first put into operation. The specific process is as follows: extracting from the corrected electric field strength of ultra-high voltage GIS Actual electric field strength along the surface of gas-solid insulation ,Pick Actual surface electric field strength of gas-solid insulation and partial discharge voltage during commissioning withstand voltage test The minimum value of the ratio is used as the minimum insulation level of the ultra-high voltage GIS when it is first put into operation. .

4. The method for calculating the insulation level of ultra-high voltage combined electrical appliances based on X-rays according to claim 3, characterized in that: Calculate the minimum insulation level for solid insulation. The specific process is as follows: based on the partial discharge voltage obtained under X-ray irradiation excitation The final electric field strength is obtained by taking the partial discharge voltage under X-ray irradiation excitation. The minimum value of the ratio to the final electric field strength is used to calculate the minimum insulation level of the solid insulation. .

5. The method for calculating the insulation level of ultra-high voltage combined electrical appliances based on X-rays according to claim 4, characterized in that: The specific process for calculating the reduction in the insulation level of ultra-high voltage GIS based on the minimum insulation level of the ultra-high voltage GIS when it is first put into operation and the minimum insulation level of the solid insulation of ultra-high voltage GIS with defects under X-ray irradiation is as follows: By calculating the ratio of the difference between the minimum insulation level of the ultra-high voltage GIS when it is first put into operation and the minimum insulation level of the solid insulation of ultra-high voltage GIS with defects under X-ray irradiation to the minimum insulation level of the ultra-high voltage GIS when it is first put into operation, and converting this ratio into a percentage form, the reduction in the insulation level of ultra-high voltage GIS is obtained.

6. An X-ray-based insulation level calculation system for ultra-high voltage combined electrical appliances, used to execute the X-ray-based insulation level calculation method for ultra-high voltage combined electrical appliances as described in any one of claims 1-5, characterized in that, include: The minimum insulation level calculation module for ultra-high voltage GIS during commissioning is used to obtain the partial discharge voltage of ultra-high voltage GIS during the withstand voltage test during commissioning. It calculates the electric field strength through electric field simulation, corrects the electric field strength according to the current actual temperature and air pressure conditions, and calculates the minimum insulation level of ultra-high voltage GIS when it is first put into operation based on the corrected electric field strength and the partial discharge voltage during the withstand voltage test. The module for calculating the minimum insulation level of ultra-high voltage GIS solid insulation with defects under X-ray irradiation is used to set X-ray parameters and irradiate ultra-high voltage GIS to obtain the partial discharge voltage under X-ray irradiation. If the partial discharge voltage under X-ray irradiation is less than the partial discharge voltage during the commissioning withstand voltage test, the minimum insulation level of ultra-high voltage GIS solid insulation with defects under X-ray irradiation is deduced based on the partial discharge voltage under X-ray irradiation and the X-ray parameters. The module for calculating the reduction in insulation level of ultra-high voltage GIS is used to calculate the reduction in insulation level of ultra-high voltage GIS based on the minimum insulation level of ultra-high voltage GIS when it is first put into operation and the minimum insulation level of ultra-high voltage GIS solid insulation with defects under X-ray irradiation.

7. An electronic device, characterized in that, The device includes a processor, a memory, and a bus. The processor and the memory are connected via the bus. The memory is used to store a set of program codes, and the processor is used to call the program codes stored in the memory to execute the X-ray-based method for calculating the insulation level of ultra-high voltage combined electrical appliances as described in any one of claims 1-5.

8. A non-volatile computer storage medium storing computer-executable instructions, characterized in that, The computer can execute instructions to perform the X-ray-based method for calculating the insulation level of ultra-high voltage combined electrical appliances as described in any one of claims 1-5.

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