Method, device and equipment for detecting index value of thin-wall part and medium
By adjusting the gain of the measuring equipment and establishing mapping rules, the problems of low efficiency and accuracy in detecting the index values of thin-walled parts were solved, realizing non-destructive testing and efficient mechanical property prediction, reducing misjudgments and production costs.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- CHENGDU AIRCRAFT INDUSTRY GROUP
- Filing Date
- 2026-01-19
- Publication Date
- 2026-05-15
AI Technical Summary
Existing methods for detecting the index values of thin-walled parts have low efficiency and accuracy, and cannot effectively simulate the porosity defects in the 3D printing process.
By adjusting the gain of the measuring equipment and calibrating its accuracy, the target measuring equipment is determined based on the amplitude and reference value of the standard workpiece. The initial amplitude and index value of the defective workpiece are quantified, and a mapping rule between defect, signal and performance is established to achieve quantitative binding of non-destructive testing and mechanical properties.
It improves the accuracy and efficiency of predicting the mechanical properties of thin-walled parts, reduces the scrap of workpieces due to performance misjudgment, and lowers production costs and cycle time.
Smart Images
Figure CN122042822A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of workpiece index detection technology, and in particular to a method, apparatus, equipment and medium for detecting index values of thin-walled parts. Background Technology
[0002] Irregular thin-walled parts refer to printed composite material components with irregular shapes, complex curved surfaces or special hollow structures, and thin walls. Printing manufacturing technology can realize the high degree of freedom in the forming of materials and structures of complex components, which is conducive to the manufacturing of functional composites with multiple material properties and innovative structures. After the printed parts are formed, the mechanical properties of the parts need to be tested and evaluated.
[0003] Existing methods for testing the index values of thin-walled parts generally involve preparing typical test blocks for furnace operation and conducting mechanical property tests on these typical test blocks to predict the actual product parts. However, this method cannot simulate the porosity defects caused by poor filament ejection during the actual 3D printing process.
[0004] Therefore, existing methods for detecting the index values of thin-walled parts suffer from low efficiency and accuracy. Summary of the Invention
[0005] This application provides a method, apparatus, equipment, and medium for detecting the index values of thin-walled parts, in order to solve the problem that existing methods for detecting the index values of thin-walled parts have low efficiency and accuracy.
[0006] Firstly, this application provides a method for detecting the index values of thin-walled components, the method comprising: Based on multiple amplitude values of a standard workpiece and a preset reference value, the gain of the measuring device is adjusted to obtain the target measuring device. Based on the target measuring device, multiple target defective workpieces are measured to obtain their respective initial amplitude values. Based on the division of the initial amplitude and the reference value, the target amplitude corresponding to each target defect workpiece is determined, and the preset mechanical properties of the target defect workpiece are measured to obtain the corresponding index values. Based on the target amplitude and index value corresponding to all target defect workpieces, determine the corresponding mapping rules; Based on the target measuring equipment, the amplitude corresponding to the workpiece to be inspected is measured, and the amplitude is substituted into the mapping rule to obtain the corresponding target index value.
[0007] In some embodiments of this application, the gain of a measuring device is adjusted based on multiple amplitude values of a standard workpiece and a preset reference value to obtain a target measuring device, including: Based on the end face of the standard workpiece, multiple measurement points are determined, and based on the probe, transmission waves are transmitted and received at each measurement point to obtain multiple amplitudes. The amplitude with the smallest value is determined as the amplitude to be adjusted. Adjust the gain of the measuring device until the amplitude to be adjusted matches the preset reference value.
[0008] In some embodiments of this application, based on a target measurement device, multiple target defective workpieces are measured to obtain their respective initial amplitudes, including: Determine the standard manufacturing parameters corresponding to the standard workpiece, as well as multiple preset defect width values; Multiple target defect workpieces are prepared according to standard preparation parameters and preset defect width values.
[0009] In some embodiments of this application, a corresponding mapping rule is determined based on the target amplitude and index value corresponding to all target defective workpieces, including: Based on each target amplitude and index value, determine multiple corresponding coordinate points, and based on the amplitude and index value corresponding to the standard workpiece, determine the coordinate intercept; The mapping rules are determined based on the coordinate points and coordinate intercepts.
[0010] In some embodiments of this application, the mapping rule is determined based on the coordinate point and the coordinate intercept, including: Based on the coordinate points and coordinate intercepts, linear regression is performed to obtain the corresponding fitted line, and the mapping rule is determined based on the fitted line.
[0011] In some embodiments of this application, measuring the amplitude corresponding to the workpiece to be inspected according to the target measuring device includes: Determine the measurement parameters corresponding to the standard workpiece; Based on the measurement parameters and the target measurement equipment, the workpiece to be inspected is measured to obtain the corresponding amplitude.
[0012] In some embodiments of this application, after substituting the amplitude into the mapping rule to obtain the corresponding target index value, the method further includes: Compare the target indicator value with the preset threshold to obtain the corresponding comparison result; If the comparison result shows that the target index value is not greater than the preset threshold, then the workpiece to be tested is determined to be the target workpiece; If the comparison result shows that the target index value is greater than the preset threshold, the workpiece to be inspected is determined to be a workpiece to be scrapped, and the corresponding prompt information is output.
[0013] Secondly, this application provides a device for detecting the index values of thin-walled parts, the device comprising: The adjustment module is used to adjust the gain of the measuring device according to multiple amplitudes of the standard workpiece and the preset reference value to obtain the target measuring device, and to measure multiple target defect workpieces based on the target measuring device to obtain their respective initial amplitudes. The measurement module is used to determine the target amplitude corresponding to each target defect workpiece based on the division of the initial amplitude and the reference value, and to measure the preset mechanical properties of the target defect workpiece to obtain the corresponding index value. The determination module is used to determine the corresponding mapping rules based on the target amplitude and index values corresponding to all target defect workpieces; The substitution module is used to measure the amplitude corresponding to the workpiece to be inspected according to the target measuring equipment, and substitute the amplitude into the mapping rule to obtain the corresponding target index value.
[0014] Thirdly, this application provides a computer device, including: a processor, and a memory communicatively connected to the processor; The memory stores the instructions that the computer executes; The processor executes computer execution instructions stored in memory to implement the method of this application.
[0015] Fourthly, this application provides a computer-readable storage medium storing program code, which, when executed by a processor, is used to implement the method of this application.
[0016] Compared with existing technologies, the method of this application calibrates the accuracy of the measuring device by adjusting the gain of the measuring device, ensuring that the target measuring device, based on multiple amplitudes of a standard workpiece and a preset reference value, has stable and consistent detection capabilities, avoiding the impact of equipment errors on the accuracy of subsequent data. Initial amplitudes are obtained by measuring multiple target defect workpieces, and the target amplitude is determined by combining the division of the reference value, thereby quantifying the impact of defects on the detection signal. Simultaneously, the corresponding preset mechanical indicators are measured to obtain indicator values, enabling further establishment of the defect-signal-performance correlation. Mapping rules are determined based on all target amplitudes and indicator values, realizing the quantitative binding of defect signals and mechanical performance indicators, enabling the prediction of workpiece mechanical performance indicators from the dimension of quantified data. By acquiring the amplitude of the workpiece to be detected through the target measuring device and substituting it into the mapping rules to obtain the target indicator value, the accuracy and efficiency of workpiece mechanical performance prediction are improved, effectively reducing workpiece scrap due to performance misjudgment and lowering production cycle and cost. Attached Figure Description
[0017] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.
[0018] Figure 1A flowchart illustrating a method for detecting the index values of a thin-walled component, provided in an embodiment of this application; Figure 2 A schematic diagram illustrating the prediction of an index value detection method for a thin-walled component provided in an embodiment of this application; Figure 3 A schematic diagram of the structure of a device for detecting the index value of a thin-walled component provided in an embodiment of this application; Figure 4 This is a structural block diagram of an apparatus for performing a method for detecting the index value of a thin-walled component according to an embodiment of this application. Detailed Implementation
[0019] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims.
[0020] The technical solution of this application and how the technical solution of this application solves the above-mentioned technical problems are described in detail below with specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments. The embodiments of this application will now be described with reference to the accompanying drawings.
[0021] Figure 1 This is a schematic flowchart illustrating a method for detecting the index values of a thin-walled component, as provided in an embodiment of this application. Figure 1 As shown, the method for detecting the index values of this type of thin-walled component may include the following steps: S110. Based on multiple amplitude values of the standard workpiece and a preset reference value, adjust the gain of the measuring device to obtain the target measuring device, and measure multiple target defective workpieces based on the target measuring device to obtain their respective initial amplitude values.
[0022] Among them, the standard workpiece refers to the workpiece manufactured under ideal and defect-free process conditions, that is, a solid filled thin-walled part without pre-made defects. It represents the best quality state that can be achieved under the current process, without any artificially introduced defects, and thus serves as the benchmark for all subsequent ultrasonic measurement data.
[0023] Amplitude refers to the wave height signal value displayed on the detector screen after the ultrasonic wave penetrates the workpiece, thus reflecting the energy change of the ultrasonic wave after penetrating the workpiece. Defects inside the workpiece material will scatter or reflect the sound waves, resulting in a decrease in the energy after penetration, i.e., the amplitude. The larger and more serious the defect, the lower the amplitude.
[0024] The preset reference value refers to a standardized signal reference value of the ultrasonic testing instrument that has been predetermined. In practical applications, it can be 80% of the full scale of the measuring device's display screen, thus setting a unified and repeatable sensitivity standard for all tests. This ensures that measurement results performed at different times and on different devices can be compared with each other.
[0025] Measuring equipment refers to specialized equipment used for scanning tests. It mainly includes two ultrasonic probes (one transmitter and one receiver) and an ultrasonic testing instrument. The ultrasonic testing instrument contains functional components such as a gain adjustment knob to enable the acquisition and display of ultrasonic signals penetrating the workpiece, thereby obtaining amplitude data, completing defect detection, and evaluating mechanical properties.
[0026] Gain refers to the signal amplification adjustment function of an ultrasonic testing instrument. By changing the amplification factor of the instrument through the knob operation, the wave height display intensity of the ultrasonic signal on the display screen can be adjusted. Increasing the gain will amplify the overall amplitude of the received signal, while decreasing the gain will reduce it. This is to adjust the minimum transmission wave amplitude of the standard workpiece to the preset reference value, thereby calibrating the sensitivity of the equipment and achieving a standardized, high signal-to-noise ratio display effect for the signal in the defect-free state, which is convenient for the accurate identification of subsequent defect signals.
[0027] The target measurement device refers to a calibrated measurement device that has been adjusted for gain to meet the preset reference value requirements, namely, the minimum amplitude display of the standard workpiece is 80% of the full scale. This is to provide a stable and standardized testing environment, ensure that the measurement process for all target defective workpieces is consistent and the data is accurate, and avoid the impact of equipment errors on the defect quantification results.
[0028] A target defect workpiece refers to a workpiece with known size and type defects. Apart from the defects, all other conditions, including materials, processes and geometry, are exactly the same as standard workpieces, thereby accurately simulating the pore defects caused by faults such as poor filament delivery in actual printing.
[0029] The initial amplitude refers to the transmitted wave height signal value at the defect location recorded after ultrasonic scanning testing of each target defect workpiece using the target measuring device. In other words, it is the raw amplitude data directly read by the instrument without any processing when the target measuring device directly measures the target defect workpiece. It directly reflects the original impact of each specific defect on the attenuation of ultrasonic energy. Since the initial amplitude is measured by the target measuring device, it has already established a connection with the standard workpiece and can therefore be used to calculate the target amplitude later.
[0030] Based on this, the gain of the measuring device is adjusted by measuring multiple penetration amplitudes and preset reference values corresponding to the standard workpiece, so as to obtain the adjusted target measuring device. Furthermore, based on the target measuring device, multiple target defect workpieces are measured to obtain their respective initial amplitudes.
[0031] S120. Based on the division of the initial amplitude and the reference value, determine the target amplitude corresponding to each target defect workpiece, and measure the preset mechanical properties of the target defect workpiece to obtain the corresponding index value.
[0032] Among them, the preset mechanical index refers to the key mechanical index that is predetermined and used to evaluate the mechanical properties of the workpiece. The mechanical index is a quantitative characterization of the mechanical behavior of a material or part under force, including the tensile strength, bending strength, compressive strength, elastic modulus and other performance indicators of the workpiece. In practical application scenarios, the tensile strength of the workpiece can be used as the preset mechanical index, so as to further evaluate the correspondence between the amplitude and tensile strength of the workpiece by measuring the tensile strength of the workpiece.
[0033] The index value refers to the specific quantitative value of the preset mechanical index obtained after mechanical performance testing of standard workpieces and target defective workpieces. For example, the preset mechanical index can be tensile strength, and the measured index value is tensile strength of 10MPa.
[0034] Based on this, the target amplitude is calculated by comparing the ratio of the initial amplitude to the reference value, thereby achieving standardized processing of the workpiece measurement amplitude and measuring the preset mechanical properties of the target defective workpiece, such as measuring the tensile strength of the workpiece, to obtain the corresponding index value.
[0035] S130. Determine the corresponding mapping rules based on the target amplitude and index values corresponding to all target defect workpieces.
[0036] The mapping rule refers to the rule used to describe the quantitative relationship between the target amplitude and the index value. It is usually expressed as a specific mathematical formula, such as y=31.489x+61.546, where x represents the target amplitude and y represents the index value. The mapping rule can be understood as a bridge connecting ultrasonic non-destructive testing and mechanical performance evaluation. In practical applications, through the mapping rule, the workpiece to be tested does not need to undergo destructive mechanical testing. The amplitude of the workpiece can be obtained by ultrasonic scanning, and the corresponding mechanical performance prediction value can be quickly calculated by substituting it into the mapping rule. This solves the problems of parts scrapping, low efficiency, and high cost caused by directly measuring mechanical performance.
[0037] Based on this, by determining the target amplitude and index value corresponding to each target defect workpiece, the correspondence between the amplitude and index value is quantified and represented to obtain the mapping rule. In order to determine the index value corresponding to the amplitude of the workpiece to be detected in the real-time scene according to the mapping rule, the mechanical performance of the workpiece can be measured.
[0038] 140. Based on the target measuring equipment, measure the amplitude corresponding to the workpiece to be inspected, and substitute the amplitude into the mapping rule to obtain the corresponding target index value.
[0039] Among them, the workpiece to be tested refers to the composite material irregular thin-walled parts whose mechanical properties need to be evaluated in the current real-time scenario. These parts may have unknown defects caused by the actual printing process, such as poor wire extrusion. It is necessary to evaluate the mechanical properties of these real and more valuable products to determine whether they can be put into normal use.
[0040] The target index value refers to the predicted value of the preset mechanical properties of the workpiece to be tested, calculated by substituting the measured amplitude of the workpiece into the established mapping rules. It is a prediction result, not the actual value obtained through destructive testing. Therefore, without destroying the specific workpiece to be tested, a high-precision estimate of its key mechanical properties can be obtained. If the target index value meets the design requirements, the workpiece is qualified; if it does not meet the requirements, the critical value of the wave height amplitude can be used to determine whether it should be scrapped. This ensures product quality, avoids cost waste caused by false scrapping, and adapts to the efficiency requirements of mass production.
[0041] Based on this, a mapping rule is determined between the workpiece amplitude and the mechanical index value. In the actual application of the testing scenario, it is only necessary to measure the amplitude corresponding to the workpiece to be tested and substitute it into the mapping rule to obtain the index value of the workpiece, thereby evaluating its mechanical performance.
[0042] Based on the feasible implementation of S110 described above, this application further provides a method for adjusting the gain of a measuring device according to multiple amplitude values of a standard workpiece and a preset reference value to obtain a target measuring device, including: Based on the end face of the standard workpiece, multiple measurement points are determined, and based on the probe, transmission waves are transmitted and received at each measurement point to obtain multiple amplitudes. The amplitude with the smallest value is determined as the amplitude to be adjusted. Adjust the gain of the measuring device until the amplitude to be adjusted matches the preset reference value.
[0043] Among them, the end face refers to the two opposite and flat end faces of the thin-walled composite material part. It is the incident and exit surface of the ultrasonic wave penetrating the workpiece. The surface is smooth to reduce the interference of ultrasonic signal reflection, thereby providing a stable contact coupling interface for the ultrasonic probe, ensuring that the ultrasonic wave can penetrate the workpiece vertically, avoiding signal attenuation or distortion due to irregular contact surface, and ensuring the accuracy of amplitude measurement.
[0044] Measurement points refer to specific locations on the end face of a standard workpiece that are pre-selected for ultrasonic scanning. Generally, five points can be selected and they need to be evenly distributed to cover the main area of the workpiece end face to avoid local deviations affecting the measurement results. In this way, the transmission wave amplitude values at different locations can be obtained through multi-point measurement, avoiding the random errors of a single measurement point.
[0045] A probe is a core component used to transmit and receive ultrasonic waves. It consists of two probes, one for transmitting and one for receiving, corresponding to the transmitting and receiving ends of the ultrasonic waves, respectively. It needs to be parallel and aligned with the end face of the workpiece. In practical applications, one probe transmits pulse waves or continuous waves to the workpiece, while the other probe receives the ultrasonic signals after penetrating the workpiece. It converts the acoustic signals into electrical signals and transmits them to the ultrasonic testing instrument. It is a key component for realizing ultrasonic signal acquisition.
[0046] Transmission and reception of transmitted waves refers to the transmitting probe emitting ultrasonic waves towards one end face of a standard workpiece. After the ultrasonic waves penetrate the interior of the workpiece, they are emitted from the other end face. The receiving probe captures the transmitted waves and converts them into measurable electrical signals, which are ultimately displayed as wave height amplitude on the testing instrument.
[0047] Based on this, by selecting multiple measurement points on the end face of a standard workpiece, and then transmitting and receiving transmission waves at each measurement point according to the probe, multiple amplitudes are obtained, and the amplitude with the smallest value is determined as the amplitude to be adjusted. In order to adjust the gain of the measuring device according to the amplitude to be adjusted and the preset reference value, until the amplitude to be adjusted is consistent with the preset reference value.
[0048] Based on the feasible implementation of S110 described above, this application further provides a method for measuring multiple target defective workpieces using a target measuring device to obtain their respective initial amplitude values, including: Determine the standard manufacturing parameters corresponding to the standard workpiece, as well as multiple preset defect width values; Multiple target defect workpieces are prepared according to standard preparation parameters and preset defect width values.
[0049] The standard preparation parameters refer to the complete set of core process parameters set when preparing 3D printed composite material irregular thin-walled parts, including printing temperature, printing speed, printing linewidth, printing wall thickness, printing layer thickness, and line overlap rate. These parameters must be kept completely consistent in the preparation of standard parts, target defect workpieces, and workpieces to be tested, so as to achieve complete uniformity of forming conditions for all workpieces, eliminate the interference of process parameter differences on mechanical properties, and make the correlation between subsequent ultrasonic signals and mechanical properties determined only by the defect width, thereby improving the accuracy of the mapping rules.
[0050] The preset defect width value refers to the specific width value that is predetermined and used to simulate the actual printing of poor filament output defects. It ranges from single-pass printing line width (C) to multi-pass line width (NC). In practical applications, it can be preset in the workpiece through digital-analog Boolean operations.
[0051] Based on this, by determining the standard preparation parameters corresponding to the standard workpiece and multiple preset defect width values, multiple target defect workpieces are prepared according to the standard preparation parameters and preset defect width values, so as to ensure that the forming conditions of all workpieces are completely uniform and to eliminate the interference of process parameter differences on mechanical properties.
[0052] Based on the feasible implementation of S130 described above, this application further provides a mapping rule for determining the corresponding mapping rule based on the target amplitude and index value corresponding to all target defect workpieces, including: Based on each target amplitude and index value, determine multiple corresponding coordinate points, and based on the amplitude and index value corresponding to the standard workpiece, determine the coordinate intercept; The mapping rules are determined based on the coordinate points and coordinate intercepts.
[0053] Here, coordinate points refer to two-dimensional data points that correspond one-to-one with the target amplitude as the horizontal axis and the corresponding index value as the vertical axis. Each target defective workpiece and standard part corresponds to an independent coordinate point, thus intuitively presenting the correspondence between the degree of ultrasonic signal attenuation and the mechanical performance level, thereby constructing a mapping rule. Multiple coordinate points cover performance data of different defect degrees, so as to conduct subsequent linear regression analysis, thereby ensuring that the mapping rule can accurately reflect the quantitative correlation between the two.
[0054] The coordinate intercept refers to the value corresponding to the intersection of the trend line and the vertical axis after all coordinate points are fitted by linear regression analysis to form a trend line. Essentially, it is the theoretical value of the vertical axis when the horizontal axis coordinate is 0.
[0055] Based on this, the target defect workpiece is determined as a coordinate point in a two-dimensional coordinate system by using the target amplitude and index value corresponding to each target defect workpiece. The coordinate intercept is determined by using the amplitude and index value corresponding to the standard workpiece. Then, linear fitting is performed based on each coordinate point and the determined coordinate intercept to obtain the corresponding fitting line. The mapping rule is then determined based on the fitting line.
[0056] Based on the feasible implementation of S130 described above, this application further provides a method for determining mapping rules based on coordinate points and coordinate intercepts, including: Based on the coordinate points and coordinate intercepts, linear regression is performed to obtain the corresponding fitted line, and the mapping rule is determined based on the fitted line.
[0057] Linear regression fitting is a statistical data analysis method that uses mathematical operations to fit all coordinate points of the target amplitude and index value, thereby finding an optimal straight line that best approximates all data points, minimizing the sum of squared errors of each data point to the line, and finally outputting the mathematical expression of the line, i.e., the mapping rule.
[0058] A fitted line is a straight line obtained through linear regression that best represents the linear relationship between the target amplitude and the index value. It can be presented in the form of a clear mathematical equation, containing two key parameters: slope and intercept. It is a centralized and regularized representation of coordinate point data.
[0059] Based on this, the mapping rule is determined by performing linear regression fitting on the coordinate points and coordinate intercepts.
[0060] Based on the feasible implementation of S140 described above, this application further provides a method for measuring the amplitude corresponding to the workpiece to be inspected according to the target measuring device, including: Determine the measurement parameters corresponding to the standard workpiece; Based on the measurement parameters and the target measurement equipment, the workpiece to be inspected is measured to obtain the corresponding amplitude.
[0061] Among them, the measurement parameters refer to the complete set of operating parameters that are pre-set and uniformly executed during the ultrasonic immersion scanning test to ensure the consistency and accuracy of the test. These parameters cover the core adjustment items and test operation specifications of the ultrasonic testing equipment, including the gate start point, gate width, gate threshold, measurement mode, and decibel bandwidth. These parameters remain completely consistent in standard part calibration, target defect workpiece testing, and workpiece measurement, thereby ensuring the consistency of measurement conditions.
[0062] Based on this, by ensuring that the measurement conditions of the standard workpiece and the workpiece to be tested are consistent, the accuracy of the mapping rules can be improved.
[0063] Based on the feasible implementation of S140 described above, this application further provides a method that, after obtaining the corresponding target index value by substituting the amplitude into the mapping rule, also includes: Compare the target indicator value with the preset threshold to obtain the corresponding comparison result; If the comparison result shows that the target index value is not greater than the preset threshold, then the workpiece to be tested is determined to be the target workpiece; If the comparison result shows that the target index value is greater than the preset threshold, the workpiece to be inspected is determined to be a workpiece to be scrapped, and the corresponding prompt information is output.
[0064] The preset threshold refers to a pre-set critical value for a mechanical performance index, which is on the same dimension as the target index value. For example, if the index value is tensile strength, then the preset threshold is the tensile strength threshold. This determines whether the mechanical properties of the workpiece under test meet the standards. The value is usually determined based on product service requirements, industry standards, or design drawings. It is necessary to ensure that the workpiece can withstand the expected load and meet functional requirements in actual applications. In actual applications, if the target index value corresponding to the workpiece under test is greater than the preset threshold, it indicates that there is a problem with the mechanical properties of the workpiece and it cannot be put into normal use.
[0065] The target workpiece refers to the workpiece to be tested whose target index value does not exceed the preset threshold after comparison. In other words, it is a qualified workpiece that meets the mechanical performance standards and production and use requirements. This ensures that the workpieces entering the market or application scenarios have reliable mechanical performance, guarantee the overall quality and safety of the product, and avoid the cost waste caused by the misjudgment of qualified workpieces.
[0066] Workpieces to be scrapped refer to workpieces that, after comparison, have target index values greater than preset thresholds. These are unqualified workpieces with substandard mechanical properties that cannot meet actual usage requirements. This process quickly identifies unqualified workpieces, preventing them from flowing into subsequent stages and causing assembly failures, product malfunctions, or even safety accidents, thus helping to improve the overall production pass rate.
[0067] The notification message refers to the standardized notification content output by the system or equipment when a workpiece to be inspected is determined to be scrapped. It usually includes key information such as workpiece number, inspection time, target index value, preset threshold, and reason for scrapping. The form can be text prompt, audible and visual alarm, etc., so as to promptly notify the operator to handle the unqualified workpiece and avoid confusion between workpieces to be scrapped and qualified workpieces.
[0068] Based on this, by comparing the target index value with the preset threshold, the workpiece to be inspected can be determined as either the target workpiece or the workpiece to be scrapped based on the comparison result. If the workpiece to be inspected is the workpiece to be scrapped, the corresponding prompt information can be output to notify the operator to handle the unqualified workpiece in a timely manner.
[0069] Please refer to Figure 2 , Figure 2 A schematic diagram illustrating the framework of a method for detecting the index values of thin-walled components provided in this application embodiment; as shown. Figure 2 As shown, a coordinate system is established with wave height amplitude on the horizontal axis and mechanical performance data on the vertical axis. A straight line with a certain slope is obtained through linear regression analysis. The mechanical performance strength corresponding to each wave height amplitude can be obtained from the trend line of this coordinate system.
[0070] Based on the above steps, it can be seen that this application calibrates the equipment accuracy by adjusting the gain of the measuring device, ensuring that the target measuring device, obtained based on multiple amplitudes of a standard workpiece and a preset reference value, has a stable and consistent detection capability, avoiding the impact of equipment errors on the accuracy of subsequent data. Initial amplitudes are obtained by measuring multiple target defect workpieces, and the target amplitude is determined by combining the division of the reference value, thereby quantifying the impact of defects on the detection signal. Simultaneously, the corresponding preset mechanical indicators are measured to obtain indicator values, so as to further establish the defect-signal-performance correlation. Mapping rules are determined based on all target amplitudes and indicator values, realizing the quantitative binding of defect signals and mechanical performance indicators, enabling the prediction of workpiece mechanical performance indicators from the dimension of quantified data. By acquiring the amplitude of the workpiece to be detected through the target measuring device and substituting it into the mapping rules to obtain the target indicator value, the accuracy and efficiency of workpiece mechanical performance prediction are improved, effectively reducing workpiece scrap due to performance misjudgment and lowering production cycle and cost. Figure 3 This is a schematic diagram of a device for detecting the index values of thin-walled parts, provided in an embodiment of this application. Figure 3 As shown, the device for detecting the index values of this type of thin-walled component includes: an adjustment module, a measurement module, a determination module, and an input module; wherein: The adjustment module is used to adjust the gain of the measuring device according to multiple amplitudes of the standard workpiece and the preset reference value to obtain the target measuring device, and to measure multiple target defect workpieces based on the target measuring device to obtain their respective initial amplitudes. The measurement module is used to determine the target amplitude corresponding to each target defect workpiece based on the division of the initial amplitude and the reference value, and to measure the preset mechanical properties of the target defect workpiece to obtain the corresponding index value. The determination module is used to determine the corresponding mapping rules based on the target amplitude and index values corresponding to all target defect workpieces; The substitution module is used to measure the amplitude corresponding to the workpiece to be inspected according to the target measuring equipment, and substitute the amplitude into the mapping rule to obtain the corresponding target index value.
[0071] In this embodiment of the application, the adjustment module can also be specifically used for: Based on the end face of the standard workpiece, multiple measurement points are determined, and based on the probe, transmission waves are transmitted and received at each measurement point to obtain multiple amplitudes. The amplitude with the smallest value is determined as the amplitude to be adjusted. Adjust the gain of the measuring device until the amplitude to be adjusted matches the preset reference value.
[0072] In this embodiment of the application, the adjustment module can also be specifically used for: Determine the standard manufacturing parameters corresponding to the standard workpiece, as well as multiple preset defect width values; Multiple target defect workpieces are prepared according to standard preparation parameters and preset defect width values.
[0073] In this embodiment of the application, the determining module can also be specifically used for: Based on each target amplitude and index value, determine multiple corresponding coordinate points, and based on the amplitude and index value corresponding to the standard workpiece, determine the coordinate intercept; The mapping rules are determined based on the coordinate points and coordinate intercepts.
[0074] In this embodiment of the application, the determining module can also be specifically used for: Based on the coordinate points and coordinate intercepts, linear regression is performed to obtain the corresponding fitted line, and the mapping rule is determined based on the fitted line.
[0075] In this embodiment of the application, the substitution module can also be specifically used for: Determine the measurement parameters corresponding to the standard workpiece; Based on the measurement parameters and the target measurement equipment, the workpiece to be inspected is measured to obtain the corresponding amplitude.
[0076] In this embodiment of the application, other modules of the thin-walled component index value detection device may also be specifically used for: Compare the target indicator value with the preset threshold to obtain the corresponding comparison result; If the comparison result shows that the target index value is not greater than the preset threshold, then the workpiece to be tested is determined to be the target workpiece; If the comparison result shows that the target index value is greater than the preset threshold, the workpiece to be inspected is determined to be a workpiece to be scrapped, and the corresponding prompt information is output.
[0077] Figure 4 This is a schematic diagram of the structure of an apparatus for performing a method for detecting index values of a thin-walled component according to an embodiment of this application. Figure 4 As shown, the device includes: The device may include one or more processors with processing cores, one or more computer-readable storage media such as memory, communication components, etc. The processor, memory, and communication components are connected via a bus.
[0078] In the specific implementation process, at least one processor executes computer execution instructions stored in memory, causing at least one processor to execute the above-described method for detecting the index value of a thin-walled component.
[0079] The specific implementation process of the processor can be found in the above method embodiments, and its implementation principle and technical effect are similar, so it will not be repeated here.
[0080] Furthermore, the processor can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), etc. The general-purpose processor can be a microprocessor or any conventional processor. The steps of the method disclosed in this application can be directly implemented by a hardware processor, or implemented by a combination of hardware and software modules within the processor.
[0081] The memory may include Random Access Memory (RAM) and may also include Non-volatile Memory (NVM), such as at least one disk storage device.
[0082] The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. Buses can be categorized as address buses, data buses, control buses, etc. For ease of illustration, the buses shown in the accompanying drawings are not limited to a single bus or a single type of bus.
[0083] In some embodiments, a computer program product is also provided, including a computer program or instructions that, when executed by a processor, implement the steps in any of the above-described methods for detecting the index values of thin-walled components.
[0084] For details on the implementation of each of the above operations, please refer to the previous examples, which will not be repeated here.
[0085] Those skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be performed by instructions, or by instructions controlling related hardware. These instructions can be stored in a computer-readable storage medium and loaded and executed by a processor.
[0086] Therefore, embodiments of this application provide a computer-readable storage medium storing a plurality of program codes, which can be loaded by a processor to execute the steps in any of the thin-walled component index value detection methods provided in embodiments of this application.
[0087] The storage medium may include: read-only memory (ROM), random access memory (RAM), disk or optical disk, etc.
[0088] According to one aspect of this application, a computer program product or computer program is provided, the computer program product or computer program including computer instructions stored in a computer-readable storage medium.
[0089] Since the instructions stored in the storage medium can execute the steps in any of the thin-walled component index value detection methods provided in the embodiments of this application, the beneficial effects that any of the thin-walled component index value detection methods provided in the embodiments of this application can achieve can be realized. For details, please refer to the previous embodiments, which will not be repeated here.
[0090] Other embodiments of this application will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of this application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this application are indicated by the appended claims.
[0091] It should be understood that this application is not limited to the precise structure described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope.
Claims
1. A method for detecting the index values of thin-walled components, characterized in that, The method includes: Based on multiple amplitude values of a standard workpiece and a preset reference value, the gain of the measuring device is adjusted to obtain the target measuring device. Based on the target measuring device, multiple target defective workpieces are measured to obtain their respective initial amplitude values. Based on the division between the initial amplitude and the reference value, the target amplitude corresponding to each target defect workpiece is determined, and the preset mechanical properties of the target defect workpiece are measured to obtain the corresponding property values. Based on the target amplitude and index value corresponding to all the target defect workpieces, determine the corresponding mapping rule; According to the target measuring device, the amplitude corresponding to the workpiece to be inspected is measured, and the amplitude is substituted into the mapping rule to obtain the corresponding target index value.
2. The method according to claim 1, characterized in that, The step of adjusting the gain of the measuring device based on multiple amplitude values of a standard workpiece and a preset reference value to obtain the target measuring device includes: Based on the end face of the standard workpiece, multiple measurement points are determined, and based on the probe, transmission waves are transmitted and received at each measurement point to obtain multiple amplitude values. The amplitude value with the smallest value is determined as the amplitude value to be adjusted. Adjust the gain of the measuring device until the amplitude to be adjusted matches the preset reference value.
3. The method according to claim 1, characterized in that, The step of measuring multiple target defective workpieces based on the target measuring device to obtain their respective initial amplitudes includes: Determine the standard manufacturing parameters corresponding to the standard workpiece, as well as multiple preset defect width values; Multiple target defect workpieces are prepared according to the standard preparation parameters and the preset defect width value.
4. The method according to claim 1, characterized in that, The step of determining the corresponding mapping rule based on the target amplitude and index value corresponding to all the target defect workpieces includes: Based on each of the target amplitudes and index values, multiple corresponding coordinate points are determined, and the coordinate intercept is determined based on the amplitude and index value corresponding to the standard workpiece. The mapping rule is determined based on the coordinate point and the coordinate intercept.
5. The method according to claim 4, characterized in that, The step of determining the mapping rule based on the coordinate point and the coordinate intercept includes: Based on the coordinate points and the coordinate intercepts, a linear regression fit is performed to obtain the corresponding fitted line, and the mapping rule is determined based on the fitted line.
6. The method according to claim 1, characterized in that, Measuring the amplitude corresponding to the workpiece to be inspected using the target measuring device includes: Determine the measurement parameters corresponding to the standard workpiece; The workpiece to be inspected is measured according to the measurement parameters and the target measuring device to obtain the corresponding amplitude.
7. The method according to claim 1, characterized in that, After substituting the amplitude into the mapping rule to obtain the corresponding target index value, the method further includes: The target index value is compared with a preset threshold to obtain the corresponding comparison result; If the comparison result indicates that the target index value is not greater than the preset threshold, then the workpiece to be detected is determined to be the target workpiece. If the comparison result shows that the target index value is greater than the preset threshold, then the workpiece to be inspected is determined to be a workpiece to be scrapped, and the corresponding prompt information is output.
8. A device for detecting the index values of thin-walled parts, characterized in that, The device includes: The adjustment module is used to adjust the gain of the measuring device according to multiple amplitudes of the standard workpiece and a preset reference value to obtain the target measuring device, and to measure multiple target defective workpieces based on the target measuring device to obtain their respective initial amplitudes. The measurement module is used to determine the target amplitude corresponding to each of the target defect workpieces based on the division between the initial amplitude and the reference value, and to measure the preset mechanical properties of the target defect workpieces to obtain the corresponding property values. The determining module is used to determine the corresponding mapping rule based on the target amplitude and index value corresponding to all the target defect workpieces; The substitution module is used to measure the amplitude corresponding to the workpiece to be inspected according to the target measuring device, and substitute the amplitude into the mapping rule to obtain the corresponding target index value.
9. A computer device, characterized in that, include: One or more processors; Memory; One or more programs, wherein the one or more programs are stored in memory and configured to be executed by one or more processors, the one or more programs being configured to perform the method as described in any one of claims 1 to 7.
10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores program code that can be called by a processor to perform the method as described in any one of claims 1 to 7.