A large multi-probe array parallel sampling antenna test system and a test method thereof

Abstract

The application discloses a large multi-probe array parallel sampling antenna test system and a test method thereof, and belongs to the technical field of antenna measurement. The system comprises a vector network analyzer, a transceiving switching unit, a plurality of probe arrays, a first switch assembly, a coupler, a plurality of signal links and a third switch assembly. By setting the probe array with a plurality of groups of different frequency band probe groups, and cooperating with the reconfigurable signal link, the system can effectively test the wideband multi-band antenna. The bidirectional amplifier in each link can be selectively turned on or bypassed through the switch group, so that the system can be flexibly switched between high-precision serial test and high-speed parallel mass production test modes. The scheme solves the technical problems of poor test flexibility, low efficiency and difficulty in meeting the research and development and mass production requirements in the prior art, and significantly improves the adaptability and comprehensive performance of the antenna test.

Description

Technical Field

[0001] This invention relates to the field of antenna testing technology, specifically to a large-scale multi-probe array parallel sampling antenna testing system and its testing method. Background Technology

[0002] With the rapid development of 5G, 6G, massive MIMO, active antenna array technology, and satellite internet, the technical specifications of antennas under test are undergoing unprecedented changes. Modern antenna systems often need to simultaneously cover the Sub-6GHz low-frequency band and the millimeter-wave high-frequency band, exhibiting a huge frequency band span. At the same time, the widespread application of phased array antennas and multi-band antennas has led to an exponential increase in the number of test states (frequency / channel / band). This presents a significant challenge to traditional antenna near-field testing systems.

[0003] Existing antenna testing systems primarily employ a serial architecture of "single receiver + mechanical / electronic switch polling." During testing, RF electronic switches sequentially and in a time-division manner switch a single receiver to each probe channel to acquire the amplitude and phase distribution of the spatial electric field. However, with the dramatic increase in the number of test states for the product under test, the acquisition time of this serial switching method has become a major bottleneck restricting the system's testing efficiency. For large antenna testing systems, the number of probes often reaches hundreds or even thousands. Acquiring data from a single plane requires hundreds of test points, while acquiring complete spherical test data requires thousands of test points. If the antenna under test is a multi-channel, multi-band antenna, the number of sampling points will increase exponentially, resulting in extremely long testing times for traditional serial methods, making it difficult to meet the high-throughput testing requirements of modern production lines.

[0004] To address the aforementioned efficiency issues, several parallel reception schemes based on multi-probe systems have been proposed in the prior art. For example, Chinese patent application No. 202410325966.6 (Publication No. CN 118130920 A) discloses an "Antenna Testing Method Based on Parallel Reception of a Multi-Probe System." This scheme achieves multi-channel parallel reception by grouping probes and reference signal interfaces according to preset principles, determining the number of branches of a single-pole multi-throw switch, and associating them with a transceiver subgroup set, thereby aiming to improve testing efficiency.

[0005] However, the existing parallel testing schemes mentioned above still have significant limitations in practical applications:

[0006] First, it cannot meet the testing requirements of wide-band, multi-frequency applications. Existing parallel systems typically use single-band probe antennas, or their probe grouping logic is fixed. When the antenna under test needs to simultaneously cover a wide range of frequency bands, such as Sub-6GHz and millimeter waves, existing systems lack the ability to dynamically reconfigure probe groups based on frequency band characteristics. Antennas exceeding the frequency range of a single probe band often need to be disassembled and moved to other dedicated sites for segmented testing, which is not only cumbersome but also prevents integrated, rapid testing across the entire frequency band.

[0007] Second, the lack of flexibility makes it difficult to balance R&D and mass production. Once existing parallel systems are built, their hardware connections and grouping logic are often fixed in parallel mode, lacking the ability to flexibly switch between "high-precision serial testing" and "high-speed parallel mass production testing." During the R&D verification phase, engineers typically need high dynamic range serial testing to accurately analyze antenna performance; while during the production line testing phase, the focus is more on testing speed. Existing technology cannot support real-time "hot switching" between these two operating modes, making it difficult for the same system to simultaneously meet the dual requirements of R&D verification (requiring high dynamic range) and production line testing (requiring high speed).

[0008] In summary, there is an urgent need for a new antenna testing method and system that can dynamically reconstruct probe groups based on frequency band characteristics, support multi-band wideband testing, and flexibly switch between high-precision serial mode and high-speed parallel mode to solve the problems mentioned above. Summary of the Invention

[0009] To address the shortcomings of existing technologies, the present invention aims to provide a large-scale multi-probe array parallel sampling antenna testing system and its testing method, thereby solving the problems of low testing efficiency, narrow frequency band coverage, and poor flexibility in existing technologies.

[0010] To solve the above-mentioned technical problems, the present invention is implemented through the following solution:

[0011] This invention discloses a multi-probe near-field antenna testing system, comprising: a vector network analyzer for generating high-frequency test signals and receiving response signals; a transceiver switching unit connected to the vector network analyzer for switching the transmission path and reception path of the signal; multiple probe arrays, each probe array having multiple groups of probes with different frequency bands, each group having multiple probes, the probes being used to radiate test signals to the antenna under test or receive response signals from the antenna under test; a probe ring for mounting the multiple probe arrays; a first switching assembly having multiple first single-pole multi-throw switches connected between the probe arrays and the transceiver switching unit, and selectively activating one of the multiple probe arrays according to a preset command; multiple links corresponding one-to-one with the number of probe groups, used for filtering and / or amplifying the signal; and a third switching assembly for serially cascading the multiple links to form a serially cascaded link.

[0012] Each link includes a power divider, a bidirectional amplifier, a second switch group, and a filter. The bidirectional amplifier is connected to the probe group through the power divider. The second switch group includes two first single-pole double-throw switches respectively disposed at both ends of the bidirectional amplifier, used to selectively turn on or bypass the bidirectional amplifier. The filter is connected to the power divider and is used to perform frequency band filtering on the signal.

[0013] The third switching assembly includes a second single-pole double-throw switch disposed at the end of each of the links and a second single-pole multi-throw switch disposed at the end of the serial cascaded link. The number of throws of the second single-pole multi-throw switch corresponds to the number of probe groups and is used to selectively connect one of the probe groups or perform signal routing switching.

[0014] The system also includes a coupler, the input of which is connected to the transmitter of the transceiver switching unit, and the coupling end of which is connected to each of the links through a first single-pole multi-throw switch and multiple second single-pole multi-throw switches. After extracting the reference sample of the transmitted signal, it is sent to the reference receiver of the vector network analyzer through the links.

[0015] Preferably, the link is configured as an active mixer module, and the internal connection relationship of the active mixer module is as follows: the signal enters the bidirectional amplifier for signal gain through a first single-pole double-throw switch in the second switch group, or is directly transmitted through the bypass terminal of the second switch group; the processed signal is output to the power divider through another first single-pole double-throw switch in the second switch group; the output terminal of the power divider is connected to the filter, and the output terminal of the filter is connected to the corresponding probe group.

[0016] Preferably, the probe group includes a Sub-6GHz probe group, a 6-18GHz probe group, and an 18-40GHz probe group; the probe array contains 66 to 121 physical probes, each probe supporting dual polarization, forming 132 to 242 probe channels; the probes are spaced at an angle of 1.25° or 2.5° on the probe ring; the multiple links include Sub-6GHz links, 6-18GHz links, and 18-40GHz links; the filters in each link are configured as bandpass filters that match the probe group of the corresponding frequency band.

[0017] Preferably, the cascading logic of the third switch component is as follows: if the probe group corresponding to the current link is selected for operation, the second single-pole double-throw switch at the end of the link is turned on to the probe group direction, so that the signal is transmitted to the probe group through the filter; if the probe group corresponding to the current link is not selected for operation, the second single-pole double-throw switch at the end of the link is turned on to the cascading direction, so that the signal skips the current link and is transmitted to the next level link.

[0018] Preferably, the multiple throw positions of the second single-pole multi-throw switch are respectively connected to the output terminals of each of the links, for selecting a specific frequency band of link signal for output in multi-level cascading mode.

[0019] Preferably, the system further includes a turntable multi-channel switching module, which integrates multiple links and the third switching component; the turntable multi-channel switching module is configured to be installed on the test turntable and rotates with the test turntable to change the test angle; the single rotation time of the turntable is 0.15s to 1.25s, and the single rotation time of the probe ring is 2s to 3s; the switching time of the switching component in the system is less than 0.01ms; the turntable multi-channel switching module realizes the serial transmission and parallel output switching of multi-frequency signals through the third switching component.

[0020] Preferably, the power divider is connected between the plurality of probe groups and the bidirectional amplifier for signal distribution and signal allocation.

[0021] The present invention also provides a test method based on the above-described multi-probe near-field antenna test system, comprising the following steps:

[0022] Step S1: Test initialization and frequency band selection. The vector network analyzer generates a high-frequency test signal, and the transceiver switching unit sets the signal transmission direction according to the test requirements. The first single-pole multi-throw switch in the first switching assembly is activated to select the target probe array to be tested from the multiple probe arrays.

[0023] Step S2: Link routing configuration, according to the frequency band to which the probe group to be activated in the target probe array belongs, control the state of the third switch component; the control signal of the third switch component is transmitted in multiple serially cascaded links until the signal reaches the target link corresponding to the probe group to be activated;

[0024] Step S3: Link state switching. For the target link, control the second single-pole double-throw switch at the end of the link to be turned on in the direction of the probe group, and at the same time control the second switch group in the link to turn on the bidirectional amplifier or bypass, so that the signal is transmitted to the corresponding probe group through the filter and power divider; for the non-target link, control the second single-pole double-throw switch at the end of the link to be turned on in the cascading direction, so that the signal skips the link and is transmitted to the next level link.

[0025] Step S4: Signal transmission and acquisition. The probes in the probe group radiate test signals to the antenna under test or receive response signals from the antenna under test. The response signals return to the vector network analyzer via the original path and are compared with the reference signals obtained through the coupler for analysis.

[0026] Preferably, in step S3, when the test signal frequency belongs to the Sub-6GHz band: the first single-pole double-throw switch selects the target probe array connected to the Sub-6GHz link; the signal enters the Sub-6GHz link, and the bandpass filter in the link performs Sub-6GHz band filtering on the signal; the second single-pole double-throw switch at the end of the link guides the signal to the Sub-6GHz probe group, and the second single-pole double-throw switches of the remaining high-frequency links are all in the cascaded conduction state.

[0027] Preferably, in step S3, when the test signal frequency belongs to the 18-40GHz band: the signal passes through the Sub-6GHz link and the 6-18GHz link in sequence, and the second single-pole double-throw switches at the ends of these two links are in a cascaded conducting state, allowing the signal to bypass; when the signal reaches the 18-40GHz link, the second switch group in this link turns on the bidirectional amplifier to perform gain compensation for the high-frequency signal; the second single-pole double-throw switch at the end of this link guides the signal to the 18-40GHz probe group for radiation.

[0028] Preferably, step S3 further includes amplifier bypass control logic: when the input signal power is greater than a preset threshold, the two first single-pole double-throw switches in the second switch group are controlled to operate, cutting off the path of the bidirectional amplifier and directly connecting the input terminal and the output terminal to the bypass to prevent signal saturation or damage to the device; when the input signal power is less than the preset threshold, the second switch group is controlled to turn on the bidirectional amplifier to amplify the signal.

[0029] Preferably, the method further includes a multi-probe parallel testing step: when multiple groups of probes in different frequency bands in the same probe array need to be simultaneously subjected to time-domain or frequency-domain synthesis testing, the second single-pole multi-throw switch at the end of the serial cascaded link in the third switch assembly is controlled; the second single-pole multi-throw switch quickly switches to the output end of different links according to a preset time-division multiplexing sequence, sequentially selecting the Sub-6GHz probe group, the 6-18GHz probe group, and the 18-40GHz probe group, so as to realize the sequential scanning test of probes in multiple frequency bands on a single port of the vector network analyzer.

[0030] Preferably, the method further includes a turntable synchronization test step: a turntable multi-channel switching module integrating multiple links and a third switch component is installed on the test turntable; during the rotation of the test turntable, the switching action of the first switch component and the third switch component is synchronously triggered according to the real-time angle position signal of the turntable; at different test angles, the system automatically switches to the probe group with the best gain or the best frequency band coverage for signal transmission and reception.

[0031] Preferably, the signal acquisition process in step S4 adopts a multi-port parallel sampling mode: the vector network analyzer is configured as a four-port network analyzer, where one port is used as a transmitter and the other three ports are used as receivers; in the probe cyclic sampling step, the third switch assembly or the first switch assembly is controlled so that the three receivers are simultaneously connected to three probes at different elevation angles or positions; the vector network analyzer synchronously acquires the response signals of the three probes in the same sampling period, reducing the total number of probe cyclic samplings to 1 / 3 of the total number of probes.

[0032] Preferably, in step S4, when performing multi-band antenna testing, the system executes a five-layer nested loop control logic, which, from the inside out, includes: a first-layer loop for probe loop sampling, which includes probe switching and vector network analyzer acquisition; a second-layer loop for multi-band loop sampling, which nests the probe loop sampling step and performs a band switching action before entering the probe loop sampling step; a third-layer loop for multi-port loop sampling, which nests the multi-band loop sampling step and performs a multi-port switching action before entering the multi-band loop sampling step; a fourth-layer loop for turntable azimuth loop sampling, which nests the multi-port loop sampling step and performs a turntable azimuth rotation action before entering the multi-port loop sampling step; and a fifth-layer loop for probe ring angle loop sampling, which nests the turntable azimuth loop sampling step and performs a probe ring rotation action before entering the turntable azimuth loop sampling step.

[0033] Preferably, during the test initialization phase, the system determines the size of the antenna under test. Wavelength corresponding to the highest test frequency The minimum sampling angle step is calculated using the sampling law formula. The system calculates... The turntable orientation rotation angle and probe ring rotation angle are automatically planned, and the rotation angle step value is configured to be a value that can be divided by 360°.

[0034] Compared with the prior art, the beneficial effects of the present invention are:

[0035] The system integrates multiple probes optimized for different frequency bands (such as Sub-6GHz and millimeter wave) on a single probe array. This enables a single physical system to cover a wide bandwidth and multiple frequency bands without switching between different dedicated test sites. When testing a specific frequency band, the system selects the corresponding probe array by controlling the first switching component and routes the signal to the dedicated link corresponding to the probe group for that frequency band via the third switching component. Each link contains a filter configured to filter a specific frequency band. This means that when a signal enters a link, only signals of the target frequency band are effectively processed, ensuring the purity and accuracy of the test. This architecture allows the system to dynamically select and activate the corresponding "probe group-dedicated link" channel based on the frequency band characteristics of the antenna under test, achieving dynamic reconfiguration of the probe group and meeting the needs of wideband integrated testing. Each signal link integrates a bidirectional amplifier to enhance signal strength. Simultaneously, a second switching group consisting of two first single-pole double-throw switches controls whether the signal passes through the amplifier. High-precision serial test mode (R&D verification): In this mode, the system controls the second switch group to activate the bidirectional amplifier via the signal path. The amplifier amplifies the weak response signal, significantly improving the system's dynamic range and test sensitivity, meeting the needs of precise analysis and verification of antenna performance during the R&D phase. High-speed parallel mass production test mode (production line testing): In this mode, the system controls the second switch group to bypass the bidirectional amplifier. The signal is transmitted directly through the path formed by the switch group, avoiding nonlinear distortion or noise that might be introduced by the amplifier. It also simplifies the signal path, facilitating high-speed, high-volume parallel testing to meet the high throughput requirements of the production line. This design allows users to quickly and flexibly switch between the two test modes on the same hardware system using software commands, perfectly balancing the high-precision requirements of the R&D phase and the high-efficiency requirements of the mass production phase. Attached Figure Description

[0036] Figure 1 This is a schematic diagram of the circuit principle of a multi-probe near-field antenna testing system according to the present invention.

[0037] Figure 2 This is a circuit diagram of the parallel link in a multi-probe near-field antenna testing system according to the present invention.

[0038] Figure 3 This is a circuit diagram of the first serial link in a multi-probe near-field antenna testing system of the present invention.

[0039] Figure 4 This is a circuit diagram of the second type of serial link in a multi-probe near-field antenna testing system of the present invention.

[0040] Figure 5 This is a circuit diagram of the third type of serial link in a multi-probe near-field antenna testing system of the present invention.

[0041] Figure 6 This is a flowchart of a test method based on a multi-probe near-field antenna test system according to the present invention.

[0042] Figure 7 This is a schematic diagram of the structure of a multi-probe near-field antenna testing system according to the present invention.

[0043] Figure 8 This is a front structural diagram of a multi-probe near-field antenna testing system according to the present invention.

[0044] Figure 9 This is a flowchart of a conventional antenna testing scheme in a testing method based on a multi-probe near-field antenna testing system according to the present invention.

[0045] Figure 10 This is a flowchart of a multi-channel antenna testing scheme in a testing method based on a multi-probe near-field antenna testing system according to the present invention.

[0046] Figure 11 This is a flowchart of a multi-band antenna testing scheme in a testing method based on a multi-probe near-field antenna testing system according to the present invention.

[0047] The following labels are used in the attached diagram: 200, probe; 300, probe ring; 1, turntable; 21, probe group; 211, Sub-6GHz probe group; 212, 6-18GHz probe group; 213, 18-40GHz probe group. Detailed Implementation

[0048] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the scope of protection of the present invention. Obviously, the embodiments described in this invention are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0049] Furthermore, the technical features involved in the different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0050] Example 1: The specific structure of the present invention is as follows:

[0051] like Figure 1 , Figure 7 and Figure 8 As shown, a multi-probe near-field antenna testing system includes: a vector network analyzer (VNA) for generating high-frequency test signals and receiving response signals; a transceiver switching unit (TSU) connected to the VNA for switching the transmission and reception paths of the signals; multiple probe arrays, each probe array having multiple groups 21 of probes with different frequency bands, each group 21 having multiple probes 200, the probes 200 being used to radiate test signals to the antenna under test or receive response signals from the antenna under test; a probe ring 300 for mounting the multiple probe arrays; a first switching assembly having multiple first single-pole multi-throw switches (K11) connected between the probe arrays and the TSU, selectively activating one of the multiple probe arrays according to a preset command; multiple links, corresponding one-to-one with the number of probe groups 21, for filtering and / or amplifying the signals; and a third switching assembly for cascading the multiple links in series to form a cascaded link.

[0052] Each link includes a power divider (PD), a bidirectional amplifier (OP), a second switch group, and a filter (PF). The bidirectional amplifier (OP) is connected to the probe group 21 via the power divider (PD). The second switch group includes two first single-pole double-throw switches (K21) respectively disposed at both ends of the bidirectional amplifier (OP), used to selectively turn on the bidirectional amplifier (OP) or bypass the bidirectional amplifier (OP). The filter (PF) is connected to the power divider (PD) and is used to perform frequency band filtering on the signal.

[0053] The third switching assembly includes a second single-pole double-throw switch K31 disposed at the end of each of the links and a second single-pole multi-throw switch K32 disposed at the end of the serial cascaded link. The number of throws of the second single-pole multi-throw switch K32 corresponds to the number of probe groups 21, and is used to selectively connect one of the probe groups 21 or perform signal routing switching.

[0054] In this embodiment, the system integrates multiple probes 200 optimized for different frequency bands (such as Sub-6GHz and millimeter wave) on the same probe array. This enables a single physical system to have the hardware capability to cover a wide bandwidth and multiple frequency bands without switching between different dedicated test sites. When a specific frequency band needs to be tested, the system selects the corresponding probe array by controlling the first switching component and routes the signal to the dedicated link corresponding to the probe group 21 for that frequency band by the third switching component. Each link contains a filter PF, which is configured to filter a specific frequency band. This means that when a signal enters a link, only the signal of the target frequency band can be effectively processed, thereby ensuring the purity and accuracy of the test. This architecture enables the system to dynamically select and activate the corresponding "probe group 21-dedicated link" channel according to the frequency band characteristics of the antenna under test, realizing the dynamic reconfiguration of the probe group 21 and meeting the needs of wideband integrated testing.

[0055] Each signal link integrates a bidirectional amplifier (OP) to boost signal strength. Simultaneously, a second switch group consisting of two first single-pole double-throw switches (K21) controls whether the signal passes through the amplifier.

[0056] High-precision serial test mode (R&D verification): In this mode, the system controls the second switch group to activate the bidirectional amplifier (OP) via the signal path. The amplifier amplifies the weak response signal, significantly improving the system's dynamic range and test sensitivity, meeting the needs of precise analysis and verification of antenna performance during the R&D phase.

[0057] High-speed parallel mass production testing mode (production line testing): In this mode, the system controls the second switch group to bypass the bidirectional amplifier OP. The signal is transmitted directly through the path formed by the switch group, avoiding nonlinear distortion or noise that may be introduced by the amplifier, while simplifying the signal path. This facilitates high-speed, large-volume parallel testing and meets the high throughput requirements of the production line.

[0058] This design allows users to quickly and flexibly switch between two testing modes on the same hardware system using software commands, perfectly balancing the high precision requirements of the R&D phase and the high efficiency requirements of the mass production phase.

[0059] Furthermore, the link is configured as an active mixer module, and the internal connection relationship of the active mixer module is as follows: the signal enters the bidirectional amplifier OP for signal gain through one of the first single-pole double-throw switches K21 in the second switch group, or is directly transmitted through the bypass terminal of the second switch group; the processed signal is output to the power divider PD through another first single-pole double-throw switch K21 in the second switch group; the output terminal of the power divider PD is connected to the filter PF, and the output terminal of the filter PF is connected to the corresponding probe group 21.

[0060] In this embodiment, the signal first passes through the second switch group (composed of two first single-pole double-throw switches K21). This is the first decision point after the signal enters the link. Path A (Amplification Mode): The signal enters the bidirectional amplifier OP. In this path, the signal is amplified by power gain or low noise to increase signal strength. Path B (Bypass Mode): The signal does not pass through the amplifier but is directly transmitted through the bypass terminal of the switch group. This is equivalent to a "straight-through" channel, and the signal maintains its original strength (affected only by transmission line loss). Regardless of whether the signal is amplified or bypassed, it will eventually converge to the output terminal of the second switch group and be transmitted to the power divider PD. After passing through the power divider PD, the signal enters the filter PF. The filter PF filters the signal according to the preset frequency band characteristics (such as Sub-6GHz or millimeter wave), filtering out out-of-band noise or interference. Finally, the clean signal is transmitted to the corresponding probe group 21 and radiated towards the antenna under test (or receives the signal from the antenna). The filter PF set at the end of the link ensures that only signals of specific frequency bands can reach the corresponding probe group 21. For example, when testing millimeter waves, the signal passes through a dedicated millimeter-wave filter (PF), effectively isolating low-frequency interference. In high-frequency (millimeter-wave) testing, cable and switch losses are very high. The intervention of a bidirectional amplifier (OP) effectively compensates for link losses, ensuring that the signal reaching probe 200 has sufficient strength, thus solving the problem of weak and difficult-to-measure high-frequency signals in broadband testing.

[0061] Furthermore, the probe group 21 includes a Sub-6GHz probe group 211, a 6-18GHz probe group 212, and an 18-40GHz probe group 213; the multiple links include a Sub-6GHz link, a 6-18GHz link, and an 18-40GHz link; the filter PF in each link is configured as a bandpass filter PF that matches the probe group 21 of the corresponding frequency band. The probe array contains 66 to 121 probes 200, each probe supporting dual polarization, forming 132 to 242 probe channels; the spacing angle of the probes 200 on the probe ring 300 is 1.25° or 2.5°.

[0062] In this embodiment, the system divides the test frequency band into three specific intervals: Sub-6GHz (low frequency), 6-18GHz (mid-high frequency), and 18-40GHz (millimeter wave / high frequency). The system is configured with three corresponding probes 200 and three corresponding links. When the system needs to test a specific frequency band (e.g., 18-40GHz), the switching component routes the signal to the 18-40GHz link. After entering this link, the signal first passes through a bandpass filter PF. This filter PF is specifically designed to allow only 18-40GHz signals to pass through, thereby filtering out out-of-band low-frequency noise, spurious signals, or intermodulation products. The filtered (and optionally amplified) signal is then transmitted to the 18-40GHz probe group 213 for radiation or reception. Through this one-to-one correspondence configuration, the system effectively integrates three independent test subsystems. By switching, the system can quickly switch between different frequency bands, or simultaneously process signals from different frequency bands in parallel test mode (if combined with multiple receivers), thereby achieving full coverage from low frequency to millimeter wave.

[0063] Furthermore, the cascading logic of the third switch component is as follows: if the probe group 21 corresponding to the current link is selected for operation, the second single-pole double-throw switch K31 at the end of the link is turned on in the direction of the probe group 21, so that the signal is transmitted to the probe group 21 through the filter PF; if the probe group 21 corresponding to the current link is not selected for operation, the second single-pole double-throw switch K31 at the end of the link is turned on in the cascading direction, so that the signal skips the current link and is transmitted to the next level link.

[0064] In this embodiment, in parallel links, such as Figure 2 As shown, when the system decides to use a specific link (e.g., a "6-18GHz link") for measurement, the second single-pole double-throw switch K31 at the end of that link will activate, directing the signal path to the probe group 21. At this time, the signal flows through the filter PF, amplifier, and other devices inside the link, completing signal conditioning before reaching the corresponding probe group 21 for radiation or reception. In a serial link, such as... Figure 3 , Figure 4 and Figure 5 As shown, when the probe group 21 corresponding to this link does not need to operate (for example, when testing is currently in Sub-6GHz mode, and this link is an 18-40GHz link), the second single-pole double-throw switch K31 at its end will activate, opening the signal path in the cascading direction. At this time, the signal skips the internal components of this link, such as the filter PF and amplifier, and is directly transmitted to the input of the next-level link through the switch. In this way, multiple links are electrically cascaded in series to form a long signal transmission pipeline.

[0065] Furthermore, the multiple throws of the second single-pole multi-throw switch K32 are respectively connected to the output terminals of each of the links, and are used to select a specific frequency band of link signal for output in multi-level cascading mode.

[0066] In this embodiment, each link in the system (Sub-6GHz, 6-18GHz, 18-40GHz, etc.), after its own processing (filtering / amplification / bypassing), has its output connected not only to the next-level link but also to a throw position of the second single-pole multi-throw switch K32. This means that regardless of whether the link is in active or bypass mode, the signal at the end of the link (either the processed signal or the direct source signal) is presented on the port of this multi-throw switch. Selection in multi-level cascade mode: When the system is in cascade mode, the signal may have already flowed through the previous links. In this case, the second single-pole multi-throw switch K32 can act as a "backtracker." If the system needs to read the processed signal from a specific link (e.g., the second-level 6-18GHz link), the switch can be directly switched to the throw position connected to the output of that link. Once a throw position is selected, the signal output by that link is routed to a common terminal (usually connected back to the receiver or subsequent processing unit), thus completing signal acquisition. By combining the third switching component at the front end (responsible for series / bypass between links) and the second single-pole multi-throw switch K32 at the back end (responsible for final output selection), the system can construct complex signal flows. For example, the signal can be serially passed through all filters PF for combined testing, and then the multi-throw switch selects the final output point; alternatively, any link can be selected independently for individual testing.

[0067] Furthermore, the system also includes a turntable multi-channel switching module (CSU), which integrates multiple links and the third switching component. The CSU is configured to be mounted on the test turntable 1 and rotates with the turntable 1 to change the test angle. The CSU uses the third switching component to switch between serial transmission and parallel output of multi-frequency signals. The single rotation time of the turntable 1 is 0.15s to 1.25s, and the single rotation time of the probe ring 300 is 2s to 3s. The switching time of the third switching component is less than 0.01ms.

[0068] In this embodiment, the turntable multi-channel switching module (CSU) is installed as a single unit on the test turntable 1. When the turntable 1 rotates, the module, along with its integrated multiple links (Sub-6GHz, 6-18GHz, etc.) and the third switching assembly, rotates together. This allows the probe group 21 to perform mechanical rotation scanning in space, thereby acquiring near-field data from different angles and achieving spherical or cylindrical scanning. During the rotation of the turntable 1, the system needs to switch frequency bands or test modes in real time. At this time, the third switching assembly directly performs the switching action within the module.

[0069] Serial transmission: Signals are transmitted serially cascaded between multiple links within the module (as mentioned earlier, through bypass or conduction).

[0070] Parallel output switching: The module can output signals from a specific link according to instructions. Since the module is integrated on the turntable 1, after the signal is filtered and amplified inside the module, it can be directly transmitted to the probe 200 that rotates with the turntable 1 through a very short path, or transmitted back to the receiving end at the fixed end through the slip ring / rotation joint.

[0071] Furthermore, the power divider PD is connected between the plurality of probe groups 21 and the bidirectional amplifier OP for signal distribution and signal allocation.

[0072] In this embodiment, when the system probe group 21 is used to transmit a signal, the signal is output from the bidirectional amplifier OP and enters the common terminal (input terminal) of the power divider PD. The power divider PD distributes this signal energy to multiple output ports according to a specific ratio (usually evenly). These output ports are respectively connected to multiple probe groups 21 (or multiple probe units in the same frequency band). When the system is in receive mode, multiple probe groups 21 simultaneously receive response signals from the antenna under test. These weak response signals enter the various branch ports of the power divider PD. The power divider PD (used as a power combiner at this time) combines the multiple signal energies into a single signal, which is then transmitted to the bidirectional amplifier OP for amplification.

[0073] Furthermore, the system also includes a coupler D, whose input is connected to the transmitter of the transceiver switching unit (TSU), and whose coupling end is connected to each of the links through a first single-pole multi-throw switch (K11) and multiple second single-pole multi-throw switches (K32). After extracting the reference sample of the transmitted signal, it is sent to the reference receiver of the vector network analyzer (VNA) through the links.

[0074] In this embodiment, the test signal generated by the Vector Network Analyzer (VNA) first enters the transmitter of the Transceiver Switching Unit (TSU). The signal then enters the input (main transmission line) of the coupler D. At this point, the vast majority of the signal energy (e.g., 99%) continues to be transmitted directly through the output of the coupler D to the probe 200 radiating the antenna under test. Simultaneously, the coupler D extracts a small portion of the signal energy (e.g., 1%) through the coupling end. This portion of the signal is called the reference signal or reference sample. The extracted reference sample is directly sent to the reference receiver of the VNA (usually labeled as the R channel or Ref channel). The VNA internally compares this reference signal with the test signal (A channel or B channel) returned from the probe 200 and reflected or transmitted through the antenna under test. By calculating the complex ratio (amplitude ratio and phase difference) between the test signal and the reference signal, the VNA accurately determines the scattering parameters (such as reflection coefficient and transmission coefficient) of the antenna under test.

[0075] This invention also provides a test method based on the above-described multi-probe near-field antenna test system, such as... Figure 6 As shown, it includes the following steps:

[0076] Step S1: Test initialization and frequency band selection. The vector network analyzer (VNA) generates a high-frequency test signal, and the transceiver switching unit (TSU) sets the signal transmission direction according to the test requirements. The first single-pole multi-throw switch (K11) in the first switching assembly is activated to select the target probe array to be tested from the multiple probe arrays.

[0077] Step S2: Link routing configuration, according to the frequency band to which the probe group 21 to be activated in the target probe array belongs, control the state of the third switch component; the control signal of the third switch component is transmitted in multiple serially cascaded links until the signal reaches the target link corresponding to the probe group 21 to be activated;

[0078] Step S3: Link state switching. For the target link, control the second single-pole double-throw switch K31 at the end of the link to be turned on in the direction of the probe group 21. At the same time, control the second switch group in the link to turn on the bidirectional amplifier OP or bypass, so that the signal is transmitted to the corresponding probe group 21 through the filter PF and the power divider PD. For non-target links, control the second single-pole double-throw switch K31 at the end of the link to be turned on in the cascading direction, so that the signal skips the link and is transmitted to the next level link.

[0079] Step S4: Signal transmission and acquisition. The probe 200 in the probe group 21 radiates a test signal to the antenna under test or receives a response signal from the antenna under test. The response signal returns to the vector network analyzer (VNA) via the original path and is compared and analyzed with the reference signal obtained through the coupler D.

[0080] Further, in step S3, when the test signal frequency belongs to the Sub-6GHz band: the first single-pole double-throw switch K11 selects the target probe array connected to the Sub-6GHz link; the signal enters the Sub-6GHz link, and the bandpass filter PF in the link performs Sub-6GHz band filtering on the signal; the second single-pole double-throw switch K31 at the end of the link guides the signal to the Sub-6GHz probe group 211, and the second single-pole double-throw switches K31 of the remaining high-frequency links are all in a cascaded conduction state.

[0081] Furthermore, in step S3, when the test signal frequency belongs to the 18-40GHz band: the signal passes through the Sub-6GHz link and the 6-18GHz link in sequence. The second single-pole double-throw switch K31 at the end of these two links is in a cascaded conduction state, allowing the signal to bypass; when the signal reaches the 18-40GHz link, the second switch group in this link turns on the bidirectional amplifier OP to perform gain compensation for the high-frequency signal; the second single-pole double-throw switch K31 at the end of this link guides the signal to the 18-40GHz probe group 213 for radiation.

[0082] Furthermore, step S3 also includes amplifier bypass control logic: when the input signal power is greater than a preset threshold, the two first single-pole double-throw switches K21 in the second switch group are controlled to operate, cutting off the path of the bidirectional amplifier OP and directly connecting the input terminal and the output terminal to the bypass to prevent signal saturation or damage to the device; when the input signal power is less than the preset threshold, the second switch group is controlled to turn on the bidirectional amplifier OP to amplify the signal.

[0083] Furthermore, the method also includes a multi-probe parallel testing step: when multiple probe groups 21 of different frequency bands in the same probe array need to be simultaneously subjected to time-domain or frequency-domain synthesis testing, the second single-pole multi-throw switch K32 at the end of the serial cascaded link in the third switching component is controlled; the second single-pole multi-throw switch K32 quickly switches to the output end of different links according to a preset time-division multiplexing sequence, sequentially selecting the Sub-6GHz probe group 211, the 6-18GHz probe group 212 and the 18-40GHz probe group 213, so as to realize the sequential scanning test of the probes 200 of multiple frequency bands on a single port of the vector network analyzer VNA.

[0084] Furthermore, the method also includes a turntable 1 synchronous testing step: a turntable multi-channel switching module CSU integrating multiple links and a third switch component is installed on the test turntable 1; during the rotation of the test turntable 1, the switching action of the first switch component and the third switch component is synchronously triggered according to the real-time angle position signal of the turntable 1; under different test angles, the system automatically switches to the probe group 21 with the best gain or the best frequency band coverage for signal transmission and reception.

[0085] Furthermore, the signal acquisition process in step S4 adopts a multi-port parallel sampling mode: the vector network analyzer (VNA) is configured as a four-port network analyzer, with one port serving as the transmitter and the other three ports serving as receivers; in the probe 200 cyclic sampling step, the third switch assembly or the first switch assembly is controlled so that the three receivers are simultaneously connected to three probes 200 at different elevation angles or positions; the vector network analyzer (VNA) synchronously acquires the response signals of the three probes 200 within the same sampling period, reducing the total number of cyclic samplings of the probes 200 to 1 / 3 of the total number of probes 200.

[0086] Further, in step S4, when performing multi-band antenna testing, the system executes a five-layer nested loop control logic. This five-layer nested loop control logic, from the inside out, includes: the first loop F1 is a probe 200 loop sampling step, which includes probe 200 switching and VNA (Vector Network Analyzer) acquisition actions; the second loop F2 is a multi-band loop sampling step, which nests the probe 200 loop sampling step and performs a band switching action before entering the probe 200 loop sampling step; the third loop F3 is a multi-port loop. The sampling steps are as follows: the multi-port cyclic sampling step is nested within the multi-band cyclic sampling step, and a multi-port switching action is performed before entering the multi-band cyclic sampling step; the fourth-level loop F4 is the turntable azimuth cyclic sampling step, which is nested within the multi-port cyclic sampling step, and a turntable 1 azimuth rotation action is performed before entering the multi-port cyclic sampling step; the fifth-level loop F5 is the probe ring angle cyclic sampling step, which is nested within the turntable azimuth cyclic sampling step, and a probe ring rotation action is performed before entering the turntable azimuth cyclic sampling step.

[0087] Furthermore, during the test initialization phase, the system determines the size of the antenna under test. Wavelength corresponding to the highest test frequency The minimum sampling angle step is calculated using the sampling law formula. The system calculates... The rotation angle of the turntable 1 and the rotation angle of the probe ring are automatically planned, and the rotation angle step value is configured to be a value that can be divided by 360°.

[0088] 1) Analysis report on conventional antenna test plan and test time

[0089] like Figure 9 As shown in the figure, E represents the probe ring angle, MOVE represents rotation or movement, A represents the turntable azimuth, P represents the filter, T represents the probe, and Read represents acquisition. During conventional antenna pattern measurements, a Vector Network Analyzer (VNA) needs to be connected as both the transmitter and receiver of the system. During antenna reception testing, the host computer software switches the system link to the receive link (probe transmission).

[0090] The software controls the turntable and probe ring to return to the test position, and the test of a conventional antenna is achieved through the process of probe ring rotation angle -- turntable azimuth rotation angle -- probe -- polarization channel switching -- vector network analyzer acquisition of amplitude and phase.

[0091] The process for antenna transmission pattern testing is basically the same as that for transmission direction. Figure 1 However, by measuring data from three channels simultaneously through four ports, the sampling time can be reduced to one-third, thereby improving testing efficiency.

[0092] The following statements, "The receive pattern uses two ports of a vector network analyzer," refer to using two different probes simultaneously connected to the two receive ports of a vector network analyzer (such as a 4-port vector network analyzer) to acquire signals when testing the antenna's receive performance. "The transmit pattern uses a 4-port vector network analyzer" refers to fully utilizing all four channels of a 4-port vector network analyzer when testing the antenna's transmit performance (or performing near-field scanning), typically meaning one port transmits and three ports receive simultaneously.

[0093] 1.1) Test Time Analysis

[0094] To facilitate the statistical analysis of test time, the test process is broken down. As can be seen from the above test process, the overall test process mainly includes three loops, which are ordered in sequence as follows: probe loop sampling, turntable orientation loop sampling, and probe ring angle loop sampling.

[0095] Among them, the probe cyclic sampling is mainly divided into two steps: probe switching sampling and vector network analyzer acquisition.

[0096] Turntable azimuth cyclic sampling mainly consists of two steps: probe cyclic sampling and azimuth rotation.

[0097] The probe ring angle cyclic sampling is mainly divided into two steps: turntable orientation cyclic sampling and probe ring rotation.

[0098] The entire routine test consists of cyclic sampling of n probe ring angles. By calculating the time and number of cycles for each layer, the time for a single routine test can be calculated.

[0099] As shown in Tables 1 and 2, the following is a routine test conducted using a test object with a maximum frequency of 12 GHz and a size of 4 m as an example, under the conditions of an intermediate frequency bandwidth of 10 kHz and 10 test frequency points.

[0100] Before performing calculations, the minimum sampling angle step must be calculated using the sampling theorem, based on the test frequency band and the size of the object under test. The wavelength corresponding to 12GHz is... =0.025m, the size of the object being measured is D=4m.

[0101] Substitute into the formula: in, calculate ≤0.35°.

[0102] Considering that 0.35° is not divisible by 360°, and the probe spacing is 2.5°, then in In terms of direction, take .exist In terms of direction, take ;

[0103] The action time for each loop will be broken down below:

[0104] The spacing between probes 200 in this system is 2.5°, which means that the probe ring needs to be rotated. =8 times, rotating 0.3125° each time. The probe ring 300 rotates 0.3125° each time, requiring... 3 seconds. For turntable 1, a rotation angle of 0.35° is required. =1029 times, the time for each rotation is... 0.15s.

[0105] This system has 66 probes, each with two polarizations, meaning it consists of a total of [number missing] probes. =132 probe channels, probe switching time is =0.01ms, the sampling time of the vector network analyzer for 10 frequency bands at an intermediate frequency bandwidth of 10kHz is 1ms.

[0106] 1.2) Calculation of receiver pattern test time

[0107] The receiver pattern was tested using two ports of a vector network analyzer, one as a transmitter and the other as a receiver.

[0108] Based on the above analysis, its testing time ;

[0109] Among them, the sampling time of a single probe channel 1.01ms;

[0110] One probe cycle sampling time 132*1.01ms 133.32ms;

[0111] The first azimuth sampling time is ms + 133.32ms = 0.283s;

[0112] Primary azimuth cycle sampling time =1029 * 0.283 s = 291.536 s;

[0113] One probe loop sampling time 2s + 291.536s = 293.536s;

[0114] Standard test time =8*293.536s=2348.29s=39.14 min;

[0115] Test configuration

[0116]

[0117] Table 1

[0118] Test time statistics

[0119]

[0120] Table 2

[0121] 1.3) Calculation of launch pattern test time

[0122] The transmit pattern was analyzed using a 4-port vector network analyzer. During antenna receive pattern testing, the network's 4 ports can function as one transmitter and three receivers, allowing simultaneous reception from three probes at different elevation angles. This effectively improves testing efficiency and reduces testing time. The following is the time calculation for the receive pattern:

[0123] As shown in Table 3, the receiver pattern test procedure is basically the same as the transmitter pattern test procedure. The main difference is that during probe loop testing, the Vector Network Analyzer (VNA) can simultaneously read data from three probe channels. The number of probe loops can be reduced from... =132 dropped to =44 times.

[0124] Test time statistics

[0125]

[0126] Table 3

[0127] In summary, for routine testing, within the 8-12GHz frequency band, arbitrarily selecting 10 frequency points with an intermediate frequency bandwidth of 10kHz, and completing a 4-meter diameter sampling sphere, the transmission pattern test takes approximately 39.14 minutes, and the reception pattern test takes 33.68 minutes, both of which are less than the ≤40 minutes required in the tender.

[0128] Sampling completion time should be ≤40min, and near-field and far-field data processing and analysis time should be ≤5min.

[0129] 2) Multi-channel antenna test plan and test time analysis report

[0130] like Figure 10 As shown in the figure, CH represents the port, E represents the probe ring angle, MOVE represents rotation or movement, A represents the turntable azimuth, P represents the filter, T represents the probe, and Read represents acquisition. When performing multi-port antenna pattern measurement, the test procedure is to nest a layer of multi-port sampling within the azimuth cyclic sampling on the basis of the conventional test.

[0131] As shown in Table 4, the specific test procedure is as follows:

[0132] The host computer software switches the system link to the receiving link (probe transmission).

[0133] The software controls the turntable 1 and probe ring 300 to return to the test position, and performs conventional antenna testing through the process of probe ring rotation angle -> turntable azimuth rotation angle -> multi-port switching -> probe -> polarization channel switching -> vector network analyzer acquisition of amplitude and phase.

[0134] Similar to routine testing, the antenna transmission pattern measurement, based on the above analysis, has a testing time... ;

[0135] One probe cycle sampling time 44 * 1.01 ms = 44.44 ms;

[0136] The first azimuth sampling time is 150ms + 44.44ms = 0.194s;

[0137] Primary azimuth cycle sampling time =1029 * 0.194 s = 200.08 s;

[0138] One probe loop sampling time +200.08s = 202.08s;

[0139] One probe loop sampling time =10 * 202.08 s = 2020.8 s = 33.68 min;

[0140] Test configuration

[0141]

[0142] Table 4

[0143] Its process is basically the same as the launch direction. Figure 1 However, by using three ports of a four-port vector network analyzer (VNA) as receivers, data from three channels can be measured simultaneously, reducing the sampling time to one-third and thus improving testing efficiency.

[0144] 2.1) Analysis of the test time for the 1.7m antenna

[0145] To facilitate the statistical analysis of test time, the test process is broken down. As can be seen from the above test process, the overall test process mainly includes 4 loops, which are ordered in sequence as follows: probe loop sampling, multi-port loop sampling, turntable orientation loop sampling, and probe ring angle loop sampling.

[0146] in:

[0147] Probe cyclic sampling mainly consists of two steps: probe switching sampling and vector network analyzer acquisition.

[0148] Multi-port cyclic sampling mainly consists of two steps: multi-port switching and probe cyclic sampling.

[0149] Turntable azimuth cyclic sampling mainly consists of two steps: azimuth rotation and multi-port cyclic sampling.

[0150] The probe ring angle cyclic sampling mainly consists of two steps: probe ring rotation and turntable orientation cyclic sampling.

[0151] The following example uses a test object with a maximum frequency of 18GHz and a size of 1.7m as an example, and takes a routine test under the conditions of an intermediate frequency bandwidth of 10kHz, 13 test frequency points, and 16 test ports.

[0152] Before performing calculations, the minimum sampling angle step must be calculated using the sampling theorem, based on the test frequency band and the size of the object under test. The wavelength corresponding to 18 GHz is... Substituting 0.0167m and the object size D = 1.7m into the formula: in, calculate ≤0.56°. Considering that 0.56° is not divisible by 360°, and the probe spacing is 2.5°, then in In terms of direction, take =0.5°. In In terms of direction, take ;

[0153] The action time for each loop will be broken down below:

[0154] The probes in this system are spaced 2.5° apart, which means the probe rings need to be rotated. =5 times, rotating 0.5° each time. The probe ring rotates 0.5° each time, requiring... 2 seconds. For the turntable, a rotation angle of 0.5° is required. =720 times, the time for each rotation is... 0.5s.

[0155] Number of test channels =16 channels, the switching time of each multi-port electrical box is 0.01ms.

[0156] This system has 66 probes, each with 200 polarizations in two configurations, meaning it consists of a total of [missing information - likely a number of probes]. =132 probe channels, probe switching time is =0.01ms, the sampling time of the Vector Network Analyzer (VNA) for 10 frequency bands at an intermediate frequency bandwidth of 10kHz is 1.3ms.

[0157] 2.2) Calculation of the test time for the receiving pattern of a 1.7m antenna

[0158] The receiver pattern was tested using two ports of a Vector Network Analyzer (VNA), one as a transmitter and the other as a receiver.

[0159] As shown in Tables 5 and 6, based on the above analysis, the test time... ;

[0160] Among them, the sampling time of a single probe channel 1.31ms;

[0161] One probe cycle sampling time 132*1.31ms 172.92ms;

[0162] The sampling time for one channel is ms + 172.92ms = 172.93ms;

[0163] One channel cycle sampling time =16 * 172.93 ms = 2.766 s;

[0164] The first azimuth sampling time is ;

[0165] Primary azimuth cycle sampling time =720* s = 2352.15s;

[0166] One probe loop sampling time 3s + 2352.15s = 2355.15s;

[0167] One probe loop sampling time =5 * 2355.15 s = 11770.77 s = 3.27 h;

[0168] Test configuration

[0169]

[0170] Table 5

[0171] Test time statistics

[0172]

[0173] Table 6

[0174] 2.3) Calculation of transmission pattern test time for 1.7m antenna

[0175] Launch direction Figure 4 The Port Vector Network Analyzer (VNA) allows a network's four ports to function as one transmitter and three receivers during antenna receive pattern testing. This enables simultaneous reception from three probes at different elevation angles, effectively improving testing efficiency and reducing testing time. The following is the time calculation for the receive pattern:

[0176] The receiver pattern test procedure is basically the same as the transmitter pattern test procedure. The main difference is that during probe loop testing, the vector network analyzer can simultaneously read data from three probe channels. The number of probe loops can be reduced from... =132 dropped to =44 times.

[0177] As shown in Tables 7 and 8, based on the above analysis, the test time... ;

[0178] That is, the sampling time of one probe cycle. 44*1.3ms 57.64ms;

[0179] The sampling time for one channel is ms + 57.64ms = 57.65ms;

[0180] One channel cycle sampling time =16 * 57.65 ms = 0.922 s;

[0181] The first azimuth sampling time is s + 0.922s = 1.422 s;

[0182] Primary azimuth cycle sampling time =720 * 1.422 s = 981.46 s;

[0183] One probe loop sampling time 2s + 981.46s = 983.46s;

[0184] One probe loop sampling time =5 * 983.46 s = 4932.28 s = 1.37 h;

[0185] Test configuration

[0186]

[0187] Table 7

[0188] Test time statistics

[0189]

[0190] Table 8

[0191] In summary, for multi-port testing, within the frequency band of 6-18GHz, 13 frequency points were randomly selected, with an intermediate frequency bandwidth of 10kHz and 16 channels. A sampling sphere with a diameter of 1.7 meters was completed. The transmission pattern test took approximately 3.27 hours, and the reception pattern test took 1.37 hours, both of which are less than the ≤5.5 hours required in the tender.

[0192] 2.4) Analysis of the test time for the 1.0m antenna

[0193] To facilitate the statistical analysis of test time, the test process is broken down. As can be seen from the above test process, the overall test process mainly includes 4 loops, which are ordered in sequence as follows: probe loop sampling, multi-port loop sampling, turntable orientation loop sampling, and probe ring angle loop sampling.

[0194] Among them, probe cyclic sampling is mainly divided into two steps: probe switching sampling and vector network analyzer acquisition;

[0195] Multi-port cyclic sampling mainly consists of two steps: multi-port switching and probe cyclic sampling.

[0196] Turntable azimuth cyclic sampling mainly consists of two steps: azimuth rotation and multi-port cyclic sampling.

[0197] The probe ring angle cyclic sampling mainly consists of two steps: probe ring rotation and turntable orientation cyclic sampling.

[0198] The following example uses a test object with a maximum frequency of 40 GHz and a size of 1.0 m as an example, and takes a routine test under the conditions of an intermediate frequency bandwidth of 10 kHz, 13 test frequency points, and 16 test ports.

[0199] Before performing calculations, the minimum sampling angle step must be calculated using the sampling theorem, based on the test frequency band and the size of the object under test. The wavelength corresponding to 40GHz is... Substituting 0.0075m and the object size D = 1.0m into the formula: in, calculate ≤0.429°. Then in In terms of direction, take =0.416°. In In terms of direction, take ;

[0200] The action time for each loop will be broken down below:

[0201] The probes in this system are spaced 2.5° apart, which means the probe rings need to be rotated. =6 times, each rotation is 0.416°. The probe ring rotates 0.5° each time, requiring... 2 seconds. For the turntable, a rotation angle of 0.42° is required. =858 times, the time for each rotation is... 0.5s.

[0202] Number of test channels =16 channels, the switching time of each multi-port electrical box is 0.01ms.

[0203] This system has 67 probes, each with two polarizations, meaning it consists of a total of [number missing] probes. =134 probe channels, probe switching time is =0.01ms, the sampling time of the Vector Network Analyzer (VNA) for 10 frequency bands at an intermediate frequency bandwidth of 10kHz is 1.3ms.

[0204] 2.5) Calculation of the test time for the receiving pattern of a 1.0m antenna

[0205] The receiver pattern was tested using two ports of a Vector Network Analyzer (VNA), one as a transmitter and the other as a receiver.

[0206] As shown in Tables 9 and 10, based on the above analysis, the test time... ;

[0207] Among them, the sampling time of a single probe channel 1.31ms;

[0208] One probe cycle sampling time 132*1.31ms 175.54ms;

[0209] The sampling time for one channel is ms + 175.54ms = 175.55ms;

[0210] One channel cycle sampling time =16 * 175.55 ms = 2.809 s;

[0211] The first azimuth sampling time is ;

[0212] Primary azimuth cycle sampling time =858* s = 2838.95s;

[0213] One probe loop sampling time 2s + 2838.95s = 2840.95s;

[0214] One probe loop sampling time =6 * 2840.95 s = 17045.70 s = 4.73 h;

[0215] Test configuration

[0216]

[0217] Table 9

[0218] Test time statistics

[0219]

[0220] Table 10

[0221] 2.6) Calculation of transmission pattern test time for 1.0m antenna

[0222] Launch direction Figure 4 The Port Vector Network Analyzer (VNA) allows a network's four ports to function as one transmitter and three receivers during antenna receive pattern testing. It can simultaneously receive signals from three probes at different elevation angles (200°), effectively improving testing efficiency and reducing testing time. The following is the time calculation for the receive pattern:

[0223] The receiver pattern test procedure is basically the same as the transmitter pattern test procedure. The main difference is that during probe loop testing, the Vector Network Analyzer (VNA) can simultaneously read data from three probe channels. The number of probe loops can be reduced from... =132 dropped to =44 times.

[0224] As shown in Tables 11 and 12, based on the above analysis, the test time... ;

[0225] That is, the sampling time of one probe cycle. 45*1.3ms 58.95ms;

[0226] The sampling time for one channel is ms + 58.95ms = 58.96ms;

[0227] One channel cycle sampling time =16 * 58.96 ms = 0.943 s;

[0228] The first azimuth sampling time is s + 0.943s = 1.443 s;

[0229] Primary azimuth cycle sampling time =858 * 1.443 s = 1238.40 s;

[0230] One probe loop sampling time 2s + 1238.40s = 1240.40s;

[0231] One probe loop sampling time =6 * 1240.40 s = 7442.42 s = 2.07 h;

[0232] Test configuration

[0233]

[0234] Table 11

[0235] Test time statistics

[0236]

[0237] Table 12

[0238] In summary, for multi-port testing, within the frequency band of 18~40GHz, 13 frequency points were randomly selected, with an intermediate frequency bandwidth of 10kHz and 16 channels. A sampling sphere with a diameter of 1.0 meter was completed. The transmission pattern test took approximately 4.73 hours, and the reception pattern test took 2.07 hours, both of which are less than the ≤5 hours required in the tender.

[0239] 3) Multi-band antenna test plan and test time analysis report

[0240] like Figure 11 As shown in the figure, B represents the band, CH represents the port, E represents the probe ring angle, MOVE represents rotation or movement, A represents the turntable azimuth, P represents the filter, T represents the probe, and Read represents acquisition. When performing multi-band antenna pattern measurement, the test procedure is based on multi-port testing, and then nests another layer of band cyclic sampling within multi-channel cyclic sampling.

[0241] The specific testing process is as follows:

[0242] The host computer software switches the system link to the receiving link (probe transmission).

[0243] The software controls the turntable and probe ring to return to the test position, and performs multi-band antenna pattern testing through the process of probe ring rotation angle -> turntable azimuth rotation angle -> multi-port switching -> band switching -> probe-polarization channel switching -> vector network analyzer acquisition of amplitude and phase.

[0244] Similar to routine testing, the antenna transmission pattern test follows a procedure largely the same as the transmission direction test. Figure 1 However, by using three ports of a four-port vector network analyzer (VNA) as receivers, data from three channels can be measured simultaneously, reducing the sampling time to one-third and thus improving testing efficiency.

[0245] 3.1) Test Time Analysis

[0246] To facilitate the statistical analysis of test time, the test process is broken down. As can be seen from the above test process, the overall test process mainly includes 5 loops, which are ordered in sequence as follows: probe loop sampling, multi-band loop sampling, multi-port loop sampling, turntable azimuth loop sampling, and probe ring angle loop sampling.

[0247] Among them, probe cyclic sampling is mainly divided into two steps: probe switching sampling and vector network analyzer acquisition;

[0248] Multi-band cyclic sampling mainly consists of two steps: band switching sampling and probe cyclic sampling.

[0249] Multi-port cyclic sampling mainly consists of two steps: multi-port switching and multi-band cyclic sampling.

[0250] Turntable azimuth cyclic sampling mainly consists of two steps: azimuth rotation and multi-port cyclic sampling.

[0251] The probe ring angle cyclic sampling mainly consists of two steps: probe ring rotation and turntable orientation cyclic sampling.

[0252] The following example uses a test object with a maximum frequency of 13 GHz and a size of 1 m as an example. Under the conditions of an intermediate frequency bandwidth of 1 kHz, a test frequency point of 1, a number of bands of 80, and a test port of 3, a multi-port test is performed.

[0253] Before performing calculations, the minimum sampling angle step must be calculated using the sampling theorem, based on the test frequency band and the size of the object under test. The wavelength corresponding to 13GHz is... Substituting 0.023m and the object size D = 1.0m into the formula: in, calculate ≤1.32°. Considering that 1.32° is not divisible by 360°, and the probe spacing is 1.25°, then in The direction just meets its sampling density. In the direction, take the same ;

[0254] The action time for each loop will be broken down below:

[0255] The spacing between probes 200 in this system is 1.25°. For turntable 1, a total rotation angle of 1.25° is required. =288 times, the time for each rotation is... 1.25s.

[0256] Number of test channels =3 channels, multi-port electrical box switching time per cycle =0.01ms.

[0257] Number of test bands =80 bands, the switching time for each band is =0.25ms.

[0258] This system has 121 probes, each with two polarizations, meaning it consists of a total of [number missing] probes. =242 probe channels, probe switching time is =0.01ms, the sampling time of the N5080 vector network analyzer in one frequency band at an intermediate frequency bandwidth of 1kHz is 1ms.

[0259] 3.2) Calculation of Receiver Pattern Test Time

[0260] Based on the above analysis, its testing time ;

[0261] As shown in Tables 13 and 14, the sampling time of a single probe channel is... 1.01ms;

[0262] One probe cycle sampling time 134*1.01ms 135.34ms;

[0263] The sampling time for one band is ms + 135.34ms = 135.59ms;

[0264] One channel cycle sampling time =80 * 135.59 ms = 10.847 s;

[0265] The sampling time for one channel is ms + 10.847s = 10.857s;

[0266] One channel cycle sampling time =3 * 10.857 s = 32.542 ms;

[0267] The first azimuth sampling time is 1s + 32.542ms = 33.542s;

[0268] Primary azimuth cycle sampling time =288 * 33.542 s = 9659.99 s;

[0269] One probe loop sampling time 3s + 9659.99s = 9662.99s;

[0270] One probe loop sampling time =2 * 9662.99s = 19325.98s = 5.37 h;

[0271] Test configuration

[0272]

[0273] Table 13

[0274] Test time statistics

[0275]

[0276] Table 14

[0277] 3.3) Calculation of launch pattern test time

[0278] Launch direction Figure 4 The Port Vector Network Analyzer (VNA) allows a network's four ports to function as one transmitter and three receivers during antenna receive pattern testing. This enables simultaneous reception from three probes at different elevation angles, effectively improving testing efficiency and reducing testing time. The following is the time calculation for the receive pattern:

[0279] The receiver pattern test procedure is basically the same as the transmitter pattern test procedure. The main difference is that during probe loop testing, the Vector Network Analyzer (VNA) can simultaneously read data from three probe channels. The number of probe loops can be reduced from... =134 dropped to =45 times.

[0280] As shown in Tables 15 and 16, based on the above analysis, the test time... ;

[0281] One probe cycle sampling time 45*1.01ms 45.45ms;

[0282] The sampling time for one band is ms + 45.45ms = 45.7ms;

[0283] One channel cycle sampling time =80 * 45.7 ms = 3.656 s;

[0284] The sampling time for one channel is ms + 3.656s = 3.666s;

[0285] One channel cycle sampling time =3 * 3.666s = 10.968s;

[0286] The first azimuth sampling time is 1s + 10.968ms = 11.968s;

[0287] Primary azimuth cycle sampling time =288 * 11.968 s = 3446.79 s;

[0288] One probe loop sampling time 3s + 3446.79s = 3449.79s;

[0289] One probe loop sampling time =2 * 3449.79s = 6899.59s = 1.92 h;

[0290] Test configuration

[0291]

[0292] Table 15

[0293] Test time statistics

[0294]

[0295] Table 16

[0296] In summary, for multi-band testing, at a frequency of 13 GHz, an intermediate frequency bandwidth of 1 kHz, 3 channels, 80 bands, and a sampling sphere with a diameter of 1 meter, the antenna band switching time is approximately 250 μs. The transmission pattern test takes approximately 5.37 hours, and the reception pattern test takes 1.92 hours, both of which are less than the ≤5.5 hours required in the tender.

[0297] The above description is only a preferred embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent structural or procedural transformations made based on the content of the present invention specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of the present invention.

Claims

1. A multi-probe near-field antenna testing system, characterized in that, include: A vector network analyzer is used to generate high-frequency test signals and receive response signals. The transceiver switching unit, connected to the vector network analyzer, is used to switch the transmission path and the reception path of the signal; Multiple probe arrays, wherein multiple groups of probes with different frequency bands are provided on the probe arrays, and each group of probes has multiple probes, the probes being used to radiate test signals to the antenna under test or to receive response signals from the antenna under test; A probe ring for mounting multiple probe arrays; A first switching assembly, comprising a plurality of first single-pole multi-throw switches, is connected between the probe array and the transceiver switching unit, and selectively turns on one of the plurality of probe arrays according to a preset instruction; Multiple links, each corresponding to a group of probes, are used for signal filtering and / or amplification. The third switching component is used to serially cascade multiple of the links to form a serially cascaded link; Each of the links includes a power divider, a bidirectional amplifier, a second switch group, and a filter. The bidirectional amplifier is connected to the probe group through the power divider. The second switch group includes two first single-pole double-throw switches respectively disposed at both ends of the bidirectional amplifier, for selectively turning on the bidirectional amplifier or bypassing the bidirectional amplifier. The filter is connected to the power divider and is used for band filtering of the signal; The third switching assembly includes a second single-pole double-throw switch disposed at the end of each of the links and a second single-pole multi-throw switch disposed at the end of the serial cascaded link. The number of throws of the second single-pole multi-throw switch corresponds to the number of probe groups and is used to selectively connect one of the probe groups or perform signal routing switching. The system also includes a coupler, the input of which is connected to the transmitter of the transceiver switching unit, and the coupling end of which is connected to each of the links through a first single-pole multi-throw switch and multiple second single-pole multi-throw switches. After extracting the reference sample of the transmitted signal, it is sent to the reference receiver of the vector network analyzer through the links.

2. The multi-probe near-field antenna testing system according to claim 1, characterized in that, The link is configured as an active mixer module, and the internal connection relationship of the active mixer module is as follows: The signal enters the bidirectional amplifier for signal amplification via a first single-pole double-throw switch in the second switch group, or is transmitted directly via the bypass terminal of the second switch group; The processed signal is output to the power divider through another first single-pole double-throw switch in the second switch group; The output of the power divider is connected to the filter, and the output of the filter is connected to the corresponding probe group.

3. The multi-probe near-field antenna testing system according to claim 1, characterized in that, The probe group includes a Sub-6GHz probe group, a 6-18GHz probe group, and an 18-40GHz probe group; The probe array contains 66 to 121 physical probes, each supporting dual polarization, forming 132 to 242 probe channels; the probes are spaced at an angle of 1.25° or 2.5° on the probe ring. The aforementioned links include Sub-6GHz links, 6-18GHz links, and 18-40GHz links; The filters in each of the links are configured as bandpass filters that match the probe group of the corresponding frequency band.

4. The multi-probe near-field antenna testing system according to claim 1, characterized in that, The cascading logic of the third switch component is as follows: If the probe group corresponding to the current link is selected to work, the second single-pole double-throw switch at the end of the link is turned on to the direction of the probe group, so that the signal is transmitted to the probe group through the filter; If the probe group corresponding to the current link is not selected for operation, the second single-pole double-throw switch at the end of the link is turned on in the cascading direction, so that the signal skips the current link and is transmitted to the next level link.

5. The multi-probe near-field antenna testing system according to claim 1, characterized in that, The multiple throws of the second single-pole multi-throw switch are respectively connected to the output terminals of each of the links, and are used to select a specific frequency band of link signal for output in multi-level cascading mode.

6. The multi-probe near-field antenna testing system according to claim 1, characterized in that, The system also includes a turntable multi-channel switching module, which integrates multiple links and the third switch component. The turntable multi-channel switching module is configured to be installed on the test turntable and rotate with the test turntable to change the test angle. The rotation time of the turntable is 0.15s to 1.25s, and the rotation time of the probe ring is 2s to 3s. The switching time of the switching components within the system is less than 0.01ms; The turntable multi-channel switching module achieves serial transmission and parallel output switching of multi-frequency signals through the third switching component.

7. The multi-probe near-field antenna testing system according to claim 1, characterized in that, The power divider is connected between the plurality of probe groups and the bidirectional amplifier for signal distribution and signal allocation.

8. A test method based on the multi-probe near-field antenna test system according to any one of claims 1 to 7, characterized in that, Includes the following steps: Step S1: Test initialization and frequency band selection. The vector network analyzer generates a high-frequency test signal, and the transceiver switching unit sets the signal transmission direction according to the test requirements. The first single-pole multi-throw switch in the first switching assembly is activated to select the target probe array to be tested from the multiple probe arrays. Step S2: Link routing configuration, according to the frequency band to which the probe group to be activated in the target probe array belongs, control the state of the third switch component; the control signal of the third switch component is transmitted in multiple serially cascaded links until the signal reaches the target link corresponding to the probe group to be activated; Step S3: Link state switching. For the target link, control the second single-pole double-throw switch at the end of the link to be turned on to the probe group direction, and at the same time control the second switch group in the link to turn on the bidirectional amplifier or bypass, so that the signal is transmitted to the corresponding probe group through the filter and power divider. For non-target links, control the second single-pole double-throw switch at the end of the link to be turned on in the cascading direction, so that the signal skips the link and is transmitted to the next level link; Step S4: Signal transmission and acquisition. The probes in the probe group radiate test signals to the antenna under test or receive response signals from the antenna under test. The response signals are returned to the vector network analyzer via the original path for analysis and compared with the reference signals obtained through the coupler.

9. The test method of the multi-probe near-field antenna test system according to claim 8, characterized in that, In step S3, when the test signal frequency belongs to the Sub-6GHz band: The first single-pole multi-throw switch selects and connects to the target probe array via a Sub-6GHz link; The signal enters the Sub-6GHz link, where a bandpass filter performs Sub-6GHz frequency band filtering on the signal. The second single-pole double-throw switch at the end of the link directs the signal to the Sub-6GHz probe group, while the second single-pole double-throw switches of the remaining high-frequency links are all in a cascaded conducting state.

10. The test method of the multi-probe near-field antenna test system according to claim 8, characterized in that, In step S3, when the test signal frequency belongs to the 18-40GHz band: The signal passes through the Sub-6GHz link and the 6-18GHz link in sequence. The second single-pole double-throw switch at the end of both links is in a cascaded conduction state, allowing the signal to bypass. When the signal reaches the 18-40GHz link, the second switch group in the link turns on the bidirectional amplifier to perform gain compensation for the high-frequency signal. The second single-pole double-throw switch at the end of the link directs the signal to the 18-40GHz probe group for radiation.

11. The test method of the multi-probe near-field antenna test system according to claim 8, characterized in that, Step S3 also includes amplifier bypass control logic: When the input signal power is greater than a preset threshold, the two first single-pole double-throw switches in the second switch group are controlled to operate, cutting off the path of the bidirectional amplifier and directly connecting the input and output terminals to the bypass to prevent signal saturation or damage to the device. When the input signal power is less than a preset threshold, the second switch group is controlled to turn on the bidirectional amplifier to amplify the signal.

12. The test method of the multi-probe near-field antenna test system according to claim 8, characterized in that, The method also includes a multi-probe parallel testing step: When it is necessary to perform time-domain or frequency-domain synthesis tests on multiple groups of probes in different frequency bands in the same probe array at the same time, control the second single-pole multi-throw switch at the end of the serial cascaded link in the third switch assembly. The second single-pole multi-throw switch quickly switches to the output of different links according to a preset time-division multiplexing sequence, sequentially selecting the Sub-6GHz probe group, the 6-18GHz probe group, and the 18-40GHz probe group, so as to realize the sequential scanning test of probes of multiple frequency bands on a single port of the vector network analyzer.

13. The test method of the multi-probe near-field antenna test system according to claim 8, characterized in that, The method also includes a turntable synchronization test step: A turntable multi-channel switching module integrating multiple of the aforementioned links and a third switch component is installed on the test turntable; During the rotation of the test turntable, the switching action of the first switch component and the third switch component is triggered synchronously according to the real-time angle position signal of the turntable; Under different testing angles, the system automatically switches to the probe group with the best gain or the best frequency band coverage for signal transmission and reception.

14. The test method of the multi-probe near-field antenna test system according to claim 8, characterized in that, The signal acquisition process in step S4 adopts a multi-port parallel sampling mode: The vector network analyzer is configured as a four-port network analyzer, with one port serving as a transmitter and the other three ports serving as receivers; During the probe cyclic sampling step, the third switch assembly or the first switch assembly is controlled so that the three receivers are simultaneously connected to three probes at different elevation angles or positions. The vector network analyzer synchronously acquires the response signals of the three probes within the same sampling period, reducing the total number of probe cyclic samplings to 1 / 3 of the total number of probes.

15. The test method of the multi-probe near-field antenna test system according to claim 8, characterized in that, In step S4, when performing multi-band antenna testing, the system executes a five-layer nested loop control logic, which, from the inside out, includes: The first loop is the probe cyclic sampling step, which includes performing probe switching and vector network analyzer acquisition actions. The second layer of loop is a multi-band cyclic sampling step, which is nested within the probe cyclic sampling step, and a band switching action is performed before entering the probe cyclic sampling step; The third loop is a multi-port cyclic sampling step, which is nested within the multi-band cyclic sampling step, and a multi-port switching action is performed before entering the multi-band cyclic sampling step. The fourth loop is the turntable orientation loop sampling step, which nests the multi-port loop sampling step, and performs the turntable orientation rotation action before entering the multi-port loop sampling step. The fifth loop is the probe ring angle cyclic sampling step, which is nested within the turntable orientation cyclic sampling step, and the probe ring rotation action is performed before entering the turntable orientation cyclic sampling step.

16. The test method of the multi-probe near-field antenna test system according to claim 8, characterized in that, During the test initialization phase, the system determines the size of the antenna under test. Wavelength corresponding to the highest test frequency The minimum sampling angle step is calculated using the sampling law formula. The system calculates... The turntable orientation rotation angle and probe ring rotation angle are automatically planned, and the rotation angle step value is configured to be a value that can be divided by 360°.

Images