A high-speed chip timing test method and system suitable for climate environment isolation structure
By establishing an environmental parameter-signal attenuation compensation model and a multivariate regression model, the problem of testing accuracy for high-speed chip timing detection under harsh environments was solved, achieving higher testing accuracy and equipment stability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- BEIJING GUANGQI INTELLIGENT TESTING TECHNOLOGY CO LTD
- Filing Date
- 2026-02-25
- Publication Date
- 2026-05-29
AI Technical Summary
Existing technologies cannot effectively counteract the nonlinear interference of environmental factors on test results when performing high-speed chip timing tests in harsh environments, resulting in low test accuracy, easy wear and tear on test equipment, and poor signal integrity.
By establishing an environmental parameter-signal attenuation compensation model, the changes in time series parameters caused by changes in environmental parameters are measured, and data compensation is performed. The impact of environmental parameters on time series parameters is quantified by combining a multivariate regression model, and a test report is generated.
It improves testing accuracy, reduces test equipment wear and tear, ensures signal integrity, and adapts to high-speed chip timing testing in various harsh environments.
Smart Images
Figure CN122109780A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of chip testing technology, and in particular to a high-speed chip timing test method and system suitable for climatically isolated structures. Background Technology
[0002] In the field of integrated circuit testing technology, the timing performance of high-speed chips is a core indicator for evaluating their operational reliability and adaptability. In practical application scenarios such as aerospace, industrial control, and automotive electronics, high-speed chips often need to withstand the test of harsh climatic environments such as high temperature and humidity and salt spray. Therefore, accurate timing testing under harsh environments has become a key requirement that the industry urgently needs to address.
[0003] However, corrosive media and extreme temperature and humidity in harsh environments can not only directly corrode core testing equipment such as control boards and high-speed probes, but also interfere with the stable transmission of high-speed signals, posing a dual challenge to the accuracy of test data and the long-term stability of the equipment.
[0004] To address the aforementioned challenges, three related technical solutions closest to this invention have emerged in the industry: First, the control board, test board, and high-speed probe are directly integrated into an environmental test chamber, allowing the test equipment and the chip under test to be placed in the same harsh environment, thus enabling direct acquisition of timing signals; Second, the test board is stored inside the test chamber, with the test board's detection interface led out through cables penetrating the chamber wall, and then connected to a high-speed probe in a normal temperature environment to complete signal transmission and detection; Third, a heat flow hood is used to cover the test board, enabling targeted testing under single high-temperature or low-temperature environments through a localized temperature control structure. However, all of the aforementioned technologies suffer from unavoidable core flaws: The first type of solution completely fails to consider the corrosive effects of harsh environments on control boards and high-speed probes, leading to an over 80% increase in the wear and tear of core testing equipment. Furthermore, extreme temperatures and humidity directly cause a decline in signal integrity, resulting in severe data distortion. While the second type of solution achieves room-temperature deployment of high-speed probes, the cable penetration design not only introduces significant signal loss and electromagnetic crosstalk but also compromises the test chamber's sealing integrity, further exacerbating environmental fluctuations and signal transmission interference. The third type of solution is only suitable for single-temperature environments and cannot meet the testing requirements of complex environments such as humidity and salt spray, or harsh environments with multiple mixed factors, severely limiting its applicability. More importantly, none of the aforementioned technologies incorporate targeted error compensation mechanisms, failing to offset the nonlinear interference of environmental factors on timing parameters and making it difficult to guarantee testing accuracy. Ultimately, existing technologies cannot simultaneously address the core requirements of environmental adaptability, signal integrity, and testing practicality, hindering the development of high-speed chip timing detection technology in harsh environments.
[0005] Therefore, how to achieve accurate testing of chips under different environmental parameters is an urgent problem to be solved. Summary of the Invention
[0006] The purpose of this invention is to provide at least one high-speed chip timing test method and system suitable for climatic isolation structures, which can at least solve the technical problem that the test socket and leads affect the test results due to changes in environmental parameters, resulting in inaccurate test results, and can at least achieve the technical effect of improving test accuracy.
[0007] To address the aforementioned technical problems, at least one embodiment of this application provides a high-speed chip timing test method suitable for climate-isolated structures, comprising: changing the environmental parameters inside the environmental test chamber where the test socket is located and the environmental parameters of the signal acquisition point outside the environmental test chamber; applying a standard signal to the test socket; acquiring environmental parameters and signal timing parameters; and establishing an environmental parameter-signal attenuation compensation model. During testing, changing the environmental parameters inside the environmental test chamber where the test socket is located and the environmental parameters of the signal acquisition point outside the environmental test chamber; applying a test signal to the high-speed chip under test on the test socket; acquiring the raw test data, environmental parameters, and signal timing parameters of the high-speed chip under test; calculating the real-time compensation amount of the raw test data according to the environmental parameter-signal attenuation compensation model; compensating the raw test data; and obtaining accurate test data.
[0008] At least one embodiment of this application also provides a high-speed chip timing test system suitable for climate-isolated structures, including: a control module, a central unit, a control board unit, a test board unit, an electrical connection unit, a timing detection unit, and an environmental conditioning unit. The control module includes a control central unit and a control board unit. The control board unit is connected to the control central unit, the control board unit, the electrical connection unit, the timing detection unit, and the environmental conditioning unit, respectively. One end of the electrical connection unit is connected to the control board unit, and the other end is connected to the test board unit for signal transmission between the control board unit and the test board unit. The timing detection unit is also connected to the control central unit. The control board unit is used to generate standard signals or test signals according to the instructions of the control center and transmit them to the test board unit; collect environmental parameters of the electrical connection unit and the test board unit and transmit them to the control center unit; and bind the test raw data of the test board unit with the timestamp and transmit it to the control center unit. The environmental conditioning unit is used to adjust the environmental parameters inside the environmental test chamber where the test panel unit is located. The test board unit is used to set up the high-speed chip under test, acquire the raw test data of the high-speed chip under test, and feed it back to the control board unit. Electrical connection unit, used for connecting the control board unit and the test board unit; The timing detection unit is used to detect the timing of the transmitted signals at the connection point between the control board unit and the electrical connection unit, and transmits the detected timing parameters to the control center unit. The control center unit is used to establish an environmental parameter-signal attenuation compensation model based on the environmental parameters transmitted by the control board unit and the timing parameters of the timing detection unit when the high-speed chip under test is not installed. When testing the high-speed chip under test, it receives the raw test data, timestamps, and environmental parameters transmitted by the control board unit, calculates the compensation amount of the raw test data using the environmental parameter-signal attenuation compensation model to obtain accurate test data, receives the timing parameters from the timing acquisition unit, and associates the timing parameters, accurate test data, and environmental parameters according to the timestamps to form an integrated dataset. It processes the data within the time window in the integrated dataset to obtain statistical data, establishes a multivariate regression model based on the statistical data to quantify the impact of environmental parameters on timing parameters, and generates an environmental parameter-timing parameter trend chart and a test report.
[0009] At least one embodiment of this application also provides an electronic device, including: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to enable the at least one processor to perform the above-described high-speed chip timing test method suitable for climatic isolation structures.
[0010] At least one embodiment of this application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the above-described high-speed chip timing test method suitable for climatic isolation structures.
[0011] The embodiments of this application provide a high-speed chip timing test method and system suitable for climate-isolated structures. When the high-speed chip under test is not installed, changes in environmental parameters lead to changes in test leads, which in turn cause changes in the timing of test signals. These changes can lead to inaccurate test data. The technical solution of this application first measures the changes in timing parameters caused by changes in environmental parameters and establishes an environmental parameter-signal attenuation compensation model to compensate for the original test data, thereby improving the accuracy of the test.
[0012] In some optional embodiments, establishing the environmental parameter-signal attenuation compensation model includes: The environmental parameters inside the environmental test chamber are set as standard environmental parameters. A standard signal is applied to the test socket inside the environmental test chamber from outside the chamber through an electrical connection unit. The timing parameters of the standard signal are collected outside the environmental test chamber, and the standard environmental parameters and the standard signal timing parameters are used as standard data. The environmental parameters inside the environmental test chamber are changed. Under different environmental parameters, the standard signal is applied to the test socket, and the current timing parameters and the environmental parameters at the electrical connection unit outside the environmental test chamber are collected. The error between the current timing parameters and the standard timing parameters is calculated to obtain error data. The error data is correlated with the corresponding environmental parameters to form an error dataset. Based on the error dataset, the parameters of the nonlinear compensation model are fitted using the Gauss-Newton iterative method to obtain the environmental parameter-signal attenuation compensation model.
[0013] Using standard environmental parameters and standard timing signals as a benchmark, the environmental parameters are changed, and the changes in timing parameters caused by the changes in environmental parameters are calculated. This is used to compensate for the original test data and improve test accuracy.
[0014] In some optional embodiments, the environmental parameter-signal attenuation compensation model is expressed as follows: ; In the formula, α and β represent the power-law effect of temperature on conductor resistance and expansion; γ and δ represent the exponential terms of the change in dielectric constant caused by humidity; ε represents the temperature-humidity synergistic effect coefficient; c represents a constant; the parameter corresponding to subscript 1 represents the parameter of the environmental test chamber; the parameter corresponding to subscript 2 represents the parameter at the electrical connection unit; T represents temperature; and H represents humidity.
[0015] The model considers not only the influence of environmental parameters of the test fixture on the test, but also the influence of environmental parameters of the signal timing acquisition points on the test, which improves the accuracy of error calculation.
[0016] In some optional embodiments, the establishment of the environmental parameter-signal attenuation compensation model further includes: verifying the prediction accuracy of the environmental parameter-signal attenuation compensation model, including: using the environmental parameter-signal attenuation compensation model for prediction, calculating the preset error of the time series parameters for different environmental parameters, calculating the mean square error between the prediction error and the actual error, saving the environmental parameter-signal attenuation compensation model when the mean square error reaches the accuracy requirement, and supplementing the error data volume and refitting the parameters of the nonlinear compensation model when the accuracy does not reach the accuracy requirement, until the prediction accuracy of the environmental parameter-signal attenuation compensation model reaches the accuracy requirement.
[0017] The accuracy of the environmental parameter-signal attenuation compensation model was verified, ensuring the model's accuracy and stability.
[0018] In some optional embodiments, the high-speed chip timing test method applicable to climate-isolated structures further includes: associating precise test data, timing parameters, and environmental parameters by timestamp to obtain an integrated dataset; performing segmented statistics on data within different time windows in the integrated dataset based on the integrated dataset to obtain a statistical data set; constructing a multivariate regression model based on environmental parameters and timing parameters based on the statistical data set to quantify the impact of environmental parameters on timing parameters and generate a test report.
[0019] By processing the data in segments according to time windows, the impact of data fluctuations on the results is avoided, thus improving accuracy.
[0020] In some optional embodiments, the step of segmenting and statistically analyzing data within different time windows in the integrated dataset to obtain a statistical data set includes: using a sliding time window method to segment the integrated data according to time windows, processing the data within each time window, calculating the mean of environmental parameters within the time window, calculating the statistical characteristic values of time-series parameters within the time window, and obtaining a statistical data set.
[0021] By extracting the mean or feature value for each time period, the impact of data fluctuations on the results is avoided, thus improving accuracy.
[0022] In some optional embodiments, the construction of a multivariate regression model based on environmental parameters and time-series parameters includes: the expression of the multivariate regression model is shown in the following formula: ; In the formula, T represents temperature, H represents humidity; the parameter corresponding to subscript 1 represents the parameter of the environmental test chamber, and the parameter corresponding to subscript 2 represents the parameter at the electrical connection unit. They represent the fitting coefficients, This represents a constant term.
[0023] The least squares method is used to solve for the model parameters of the multivariate regression model.
[0024] By simultaneously considering the environmental parameters of the test stand and the signal acquisition point, the least squares method is used to solve the parameters, which improves the accuracy of the parameters. Attached Figure Description
[0025] One or more embodiments are illustrated by way of example with reference numerals in the accompanying drawings. These illustrations do not constitute a limitation on the embodiments. Elements with the same reference numerals in the drawings are denoted as similar elements. Unless otherwise stated, the figures in the drawings are not to be limited by scale.
[0026] Figure 1 This is a schematic diagram of a test method flow provided according to an embodiment of the present invention; Figure 2 This is a schematic diagram of a test system structure provided according to an embodiment of the present invention. Detailed Implementation
[0027] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the various embodiments of the present invention will be described in detail below with reference to the accompanying drawings. However, those skilled in the art will understand that many technical details have been presented in the various embodiments of the present invention to enable the reader to better understand the present invention. However, the technical solutions claimed in the present invention can be implemented even without these technical details and various changes and modifications based on the following embodiments.
[0028] To address the aforementioned technical problem of inaccurate high-speed chip testing under different environmental parameters, this invention proposes a high-speed chip timing test method suitable for climate-isolated structures. The implementation details of this embodiment of a high-speed chip timing test method suitable for climate-isolated structures are described below. The following implementation details are provided for ease of understanding and are not essential for implementing this solution. Example 1:
[0029] This embodiment presents a high-speed chip timing test method suitable for climate-isolated structures, which can be applied to electronic devices with communication, computing, and data storage capabilities.
[0030] First, with the test stand located in the environmental test chamber and the signal acquisition point outside the environmental test chamber at standard environmental parameters, a standard signal is applied to the test stand, and the timing parameters of the standard signal are acquired outside the environmental test chamber. Based on the timing parameters and environmental parameters, an environmental parameter-signal attenuation compensation model is established. Secondly, during testing, the environmental parameters of the signal acquisition points inside and outside the environmental test chamber are changed, and test signals are applied to the high-speed chip under test on the test stand to obtain the raw test data of the high-speed chip under test. The raw test data is then compensated according to the environmental parameter-signal attenuation compensation model to obtain accurate test data.
[0031] Environmental parameters include the environmental parameters of the area where the test stand is located and the environmental parameters of the signal timing acquisition points outside the environmental test chamber.
[0032] Third, based on the accurate test data, data processing is performed to associate the accurate test data, time series parameters, and environmental parameters by timestamp to obtain an integrated dataset; based on the integrated dataset, a multivariate regression model based on environmental parameters and time series parameters is constructed to quantify the impact of environmental parameters on time series parameters.
[0033] Its specific process can be as follows: Figure 1 As shown, it includes: S1. Change the environmental parameters in the environmental test chamber where the test stand is located and the environmental parameters of the signal acquisition point. Apply a standard signal to the test stand, collect the test environmental parameters and signal timing parameters, and establish an environmental parameter-signal attenuation compensation model. S2. During testing, change the environmental parameters in the environmental test chamber where the test stand is located and the environmental parameters of the signal acquisition point. Apply a test signal to the high-speed chip under test on the test stand, collect the raw test data, environmental parameters and signal timing parameters, calculate the real-time compensation amount of the raw test data according to the environmental parameter-signal attenuation compensation model, compensate the raw test data, and obtain accurate test data. S3. Link the precise test data, time series parameters, and environmental parameters by timestamp to obtain an integrated dataset; perform segmented statistics on the data within different time windows in the integrated dataset to obtain a statistical data set; based on the statistical data set, construct a multivariate regression model based on environmental parameters and time series parameters to quantify the impact of environmental parameters on time series parameters and generate a test report.
[0034] Specifically, the test socket is mounted on the test board, which is installed inside the environmental test chamber. An electrical connection module is installed on the chamber body of the environmental test chamber, while the control module and timing detection unit are installed outside the environmental test chamber. One end of the electrical connection unit is connected to each lead-out terminal on the test board inside the environmental test chamber, and the other end is connected to each lead-out terminal of the control module outside the environmental test chamber. Each lead-out terminal on one end of the electrical connection unit is connected to each lead-out terminal on the other end in a one-to-one correspondence. The control module communicates with the test board through the electrical connection unit. The timing detection unit detects the signal timing parameters at the connection point between the electrical connection unit and the control module. The connection point between the electrical connection unit and the control module is the signal acquisition point.
[0035] Furthermore, the electrical connection unit adopts a blind-plug flexible electrical connection module.
[0036] In step S1, the environmental parameters of the signal acquisition points inside and outside the environmental test chamber are set as standard environmental parameters. A standard signal is applied to the test stand without installing the high-speed chip under test on the test stand. The timing parameters of the standard signal at the connection between the electrical connection unit and the control board unit outside the environmental test chamber are collected. The standard environmental parameters and standard timing parameters are used as standard data. The timing parameters include signal rising edge, falling edge, period, overshoot, settling time, etc., and the environmental parameters include temperature, humidity, etc.
[0037] The test socket does not install the high-speed chip under test. The environmental parameters of the signal acquisition points inside and outside the environmental test chamber are changed. Under different environmental parameters, a standard signal is applied to the test socket, the current timing parameters are collected, the error between the current timing parameters and the standard timing parameters is calculated, and the error data is obtained. The error data is correlated with the corresponding environmental parameters to form an error dataset. Based on the error dataset, the parameters of the nonlinear compensation model are fitted using the Gauss-Newton iterative method to obtain the environmental parameter-signal attenuation compensation model.
[0038] The expression for the environmental parameter-signal attenuation compensation model is shown below: ; In the formula, α and β represent the power-law effect of temperature on conductor resistance and expansion; γ and δ represent the exponential terms of the change in dielectric constant caused by humidity; ε represents the temperature-humidity synergistic effect coefficient; c represents a constant; the parameter corresponding to subscript 1 represents the parameter inside the environmental test chamber, and the parameter corresponding to subscript 2 represents the parameter of the signal acquisition point outside the environmental test chamber; T represents temperature, and H represents humidity.
[0039] The prediction accuracy of the environmental parameter-signal attenuation compensation model is verified. When the prediction accuracy meets the accuracy requirements, the environmental parameter-signal attenuation compensation model is saved. When the accuracy does not meet the accuracy requirements, different environmental parameters are added for testing. After obtaining more error data, the parameters of the nonlinear compensation model are refitted until the prediction accuracy of the environmental parameter-signal attenuation compensation model meets the accuracy requirements.
[0040] Specifically, an environmental parameter-signal attenuation compensation model is used for prediction. The prediction error of the time series parameters under different environmental parameters is calculated, the mean square error between the prediction error and the actual error is calculated, and it is determined whether the mean square error meets the accuracy requirements.
[0041] The environmental parameter-signal attenuation compensation model is used to represent the impact of changes in environmental parameters on signal timing parameters.
[0042] In step S2, after confirming that the electrical connection unit is reliably connected to the control module and the test board, and that each pin of the high-speed chip to be tested is reliably connected to each lead-out terminal of the test socket, the high-speed chip to be tested is tested.
[0043] Specifically, an interface detection signal is sent to the test board interface, and feedback response signals from each pin of the high-speed chip under test are received. The reliability of the connection between the high-speed chip pins and the test socket and probe points is judged. If the reliability meets the standard, it means that the connection is ready. If the reliability does not meet the standard, a fault prompt is given.
[0044] The environmental parameters inside the environmental test chamber and the environmental parameters of the signal acquisition point outside the environmental test chamber are changed once. When the environmental parameters reach the target environmental value, the set time is waited for the environment to stabilize. Then, a test signal is applied to the high-speed chip under test on the test socket to obtain the raw test data of the high-speed chip under test and to collect the signal timing parameters. The raw test data, current environmental parameters, and timing parameters are associated according to the timestamp.
[0045] An environmental parameter-signal attenuation compensation model is used to calculate the compensation amount based on the current environmental parameters and the original test data. This compensation is then applied to the original test data to obtain accurate test data.
[0046] Precise test data, environmental parameters, and timing parameters are linked and bound according to timestamps to form an integrated data set of environmental parameters, test data, and timing parameters.
[0047] By repeatedly changing the environmental parameters inside the environmental test chamber, integrated data under different environmental parameters is obtained, forming an integrated dataset.
[0048] Based on the integrated dataset, the data is segmented and statistically analyzed according to time windows. The mean value of environmental parameters and the statistical characteristic value of time series parameters within each time window are calculated to obtain a statistical data set.
[0049] Specifically, the integrated data is read according to the time window, and abnormal data is automatically filtered out, such as invalid values caused by sensor failure. The sliding time window method is used to segment the data according to the time window, process the data in each time window, calculate the average value and mean value of environmental parameters in the time window, and calculate the mean, peak value, fluctuation amplitude and other statistical characteristic values of time series parameters in the time window.
[0050] Based on the statistical data set, a multivariate regression model for environmental parameters and time-series parameters is constructed.
[0051] The expression for the multivariate regression model is shown below: ; In the formula, T represents temperature and H represents humidity. The parameter corresponding to subscript 1 represents the parameter of the environmental test chamber, and the parameter corresponding to subscript 2 represents the parameter at the electrical connection unit. They represent the fitting coefficients, This represents a constant term.
[0052] The least squares method was used to solve the model parameters of equation (2) and to quantify the influence weights of temperature, humidity and the combined effect of temperature and humidity on the time series parameters.
[0053] Generate a test report, which includes: basic test information, accurate test results of timing parameters, quantification results of environmental impact weights, correlation trend chart of temperature and humidity with timing parameters, and evaluation conclusions of the chip's timing performance under the target environment.
[0054] Basic test information includes chip model, test environment parameters, and test duration; precise timing parameter test results include: raw test data, compensated data, and a comparison of data before and after compensation; environmental impact weight quantification results include: Numerical and physical meaning.
[0055] The temperature and humidity-time series parameter correlation trend chart can intuitively present the dynamic correlation between changes in environmental parameters and fluctuations in time series parameters. It includes single parameter influence curves and co-influence surface plots. The single parameter influence curve shows the influence of one parameter on the time series parameter when a certain parameter is fixed, such as the influence of temperature on establishment time under fixed humidity. The co-influence surface plot shows the influence of multiple parameters on the time series parameter. Example 2:
[0056] This embodiment provides a high-speed chip timing test system suitable for climate-isolated structures, such as... Figure 2 As shown, it includes a control module, a test board unit, an electrical connection unit, a timing detection unit, and an environmental conditioning unit. The control module includes a control center unit and a control board unit. The control board unit is connected to the control center unit, the control board unit, the electrical connection unit, the timing detection unit, and the environmental conditioning unit, respectively. One end of the electrical connection unit is connected to the control board unit, and the other end is connected to the test board unit, which is used for signal transmission between the control board unit and the test board unit. The timing detection unit is also connected to the control center unit.
[0057] The control board unit is used to generate standard signals or test signals according to the instructions of the control center and transmit them to the test board unit; collect environmental parameters of the electrical connection unit and the test board unit and transmit them to the control center unit; and bind the test raw data of the test board unit with the timestamp and transmit it to the control center unit. The environmental conditioning unit is used to adjust the environmental parameters inside the environmental test chamber where the test panel unit is located. The test board unit is used to set up the high-speed chip under test, acquire the raw test data of the high-speed chip under test, and feed it back to the control board unit. Electrical connection unit, used for connecting the control board unit and the test board unit; The timing detection unit is used to detect the timing of the transmitted signals at the connection point between the control board unit and the electrical connection unit, and transmits the detected timing parameters to the control center unit. The control center unit is used to establish an environmental parameter-signal attenuation compensation model based on the environmental parameters transmitted by the control board unit and the timing parameters of the timing detection unit when the high-speed chip under test is not installed. When the high-speed chip under test is being tested, it receives the raw test data, timestamps, and environmental parameters transmitted by the control board unit, uses the environmental parameter-signal attenuation compensation model to calculate the compensation amount of the raw test data to obtain accurate test data, receives the timing parameters from the timing acquisition unit, and associates the timing parameters, accurate test data, and environmental parameters according to the timestamps to form an integrated dataset. It processes the data within the time window in the integrated dataset to obtain statistical data, establishes a multivariate regression model based on the statistical data to quantify the impact of environmental parameters on timing parameters, and generates an environmental parameter-timing parameter trend chart and a test report. Example 3:
[0058] This embodiment provides a high-speed chip timing test system suitable for climate-isolated structures. It employs a high-speed chip timing test method suitable for climate-isolated structures as described in Embodiment 1, and can be applied to electronic devices with communication, computing, and data storage capabilities.
[0059] include: Without installing the chip under test on the test board, adjust the environmental parameters inside the environmental test chamber and the environmental parameters of the signal acquisition point outside the environmental test chamber, test the timing parameters of the standard signal when the environmental parameters are different, and establish an environmental parameter-signal attenuation compensation model. When placing the chip under test on the test board and conducting the test, the environmental parameters in the environmental test chamber are adjusted, and test signals of different frequencies and amplitudes are applied to the chip under test. Raw test data is collected, and the raw test data is compensated according to the environmental parameter-signal attenuation compensation model to obtain accurate test data. The accurate test data, timing parameters, and environmental parameters are correlated to obtain an integrated dataset. A time window is set, and the data in the integrated dataset is segmented and statistically analyzed. The data feature values of each time window are calculated to form a statistical data set. Based on the statistical data set, a multivariate regression model is established to quantify the impact of environmental parameters on timing parameters, and an environmental parameter-time parameter trend chart and test report are generated.
[0060] Establishing an environmental parameter-signal attenuation compensation model and controlling the operation of the control center unit includes the following steps: S1. Send the first instruction to the control board unit; S2, Receive environmental parameters inside the environmental test chamber and environmental parameters at the signal acquisition point; S3. When the environmental parameters reach the standard parameters, send the model establishment command to the control board unit and the acquisition timing command to the timing detection unit. S4. Receive standard timing parameters transmitted by the timing detection unit and environmental parameters transmitted by the control board unit. S5. Based on the timestamp, bind the environment parameters and timing parameters to obtain standard data; S6. Send adjustment command to the environmental control unit and wait for the set duration; S7. Send the second instruction to the control board unit and send the acquisition timing instruction to the timing detection unit; S8. Receive the current timing parameters transmitted by the timing detection unit, receive the current environmental parameters transmitted by the control board unit, calculate the difference between the current timing parameters and the standard timing parameters, use it as the timing error corresponding to the current environmental parameters, and associate the timing error with the current environmental parameters to form sample data. S9. Repeat steps S6 to S8 to obtain multiple sets of sample data and construct a sample dataset. S10. Using the Gauss-Newton iterative method, based on the sample dataset, the parameters in the nonlinear compensation model are fitted to obtain the environmental parameter-signal attenuation compensation model. The environmental parameter-signal attenuation compensation model is shown in the following equation: ;
[0061] In the formula, α and β represent the power-law effect of temperature on conductor resistance and expansion; γ and δ represent the exponential terms of the change in dielectric constant caused by humidity; ε represents the temperature-humidity synergistic effect coefficient; c represents a constant; the parameter corresponding to subscript 1 represents the environmental parameters inside the environmental test chamber, and the parameter corresponding to subscript 2 represents the environmental parameters at the signal acquisition point outside the environmental test chamber; T represents temperature, and H represents humidity. S11. The prediction error is calculated using the environmental parameter-signal attenuation compensation model. S12. Calculate the mean square error between the prediction error and the actual error; S13. Determine whether the mean square error meets the accuracy threshold. If yes, proceed to the next step; otherwise, go to S5. S14. Save environmental parameters - signal attenuation compensation model.
[0062] Establishing an environmental parameter-signal attenuation compensation model and controlling the operation of the control board unit includes the following steps: A1. Collect environmental parameters inside the environmental test chamber and environmental parameters from signal acquisition points outside the environmental test chamber, and send them to the control center unit; A2. After receiving the model establishment command from the control center unit, the output standard signal is sent to the test board unit through the electrical connection unit; A3. Real-time acquisition of environmental parameters inside the environmental test chamber and environmental parameters at signal acquisition points, linked with timestamps, and sent to the control center unit; A4. After receiving the test command from the control center unit, output the test signal with the first frequency and the first amplitude to the electrical connection unit; A5. Real-time acquisition of environmental parameters in the environmental test chamber and environmental parameters at signal acquisition points; receiving raw test data from the test board unit; binding environmental parameters and raw test data with timestamps; and sending them to the control center unit. A6. Repeat steps A4 and A5 to output test signals of different frequencies and amplitudes to the electrical connection unit; and send the environmental parameters and raw test data at the same time to the control center unit.
[0063] An environmental parameter-signal attenuation compensation model is established. The operation of the timing detection unit includes detecting the timing parameters of the signals at the output terminals of the control board unit and the electrical connection unit, i.e., the timing parameters of the signal acquisition points. The timing parameters include rising edge, falling edge, period, overshoot, and setup time.
[0064] When placing the high-speed chip under test on the test board and conducting tests, the operation of the control center unit for each preset environmental scenario includes the following steps: B1. Beginning; B2. After receiving the connection ready signal from the control board unit, send an environmental parameter adjustment command to the environmental control unit. The environmental parameter adjustment command includes the target environmental parameter. B3. Receive the current environmental parameters sent by the control board unit, and continue for a set duration when the current environmental parameters reach the target environmental parameters; the current environmental parameters include the environmental parameters inside the environmental test chamber and the environmental parameters of the signal acquisition points outside the environmental test chamber; B4. Send test commands to the control board unit and send timing detection commands to the timing detection unit; B5. Receive high-speed chip test raw data, environmental parameters, and timing parameters of the timing detection unit back from the control board unit in real time; B6. Using the environmental parameter-signal attenuation compensation model, calculate the signal attenuation compensation amount under the current environmental parameters, and perform real-time compensation on the original test data to obtain accurate test data; B7. Link precise test data, environmental parameters, and time series parameters with timestamps to form an integrated dataset that includes temperature and humidity, test data, and time series parameters; B8. Perform segmented statistics from the integrated dataset according to time windows, calculate the mean of environmental parameters and the characteristic values of time series parameters within each time window, and form a statistical data set; B9. Based on the statistical data set, construct a multivariate regression model to quantify the impact of environmental parameters on time series parameters; B10. Generate environmental parameter-time series parameter trend charts and test reports; B11. Upon detection that the test is complete, send a test termination command to the control board unit, environmental conditioning unit, and timing detection unit.
[0065] Test completion refers to the end of the test duration or the completion of the test scenario.
[0066] In step B3, when the current environmental parameters reach the target environmental parameters, a set duration is continuously set, including the following steps: B31. Send environmental control instructions to the environmental control unit. The environmental control instructions include the target environmental parameter values. Receive real-time environmental parameters sent by the control board, including the temperature and humidity at the signal acquisition point and the temperature and humidity inside the environmental test chamber. B32. Calculate the error between real-time environmental parameters and target environmental parameters; B33. Determine whether the error value meets the error requirements. If yes, proceed to the next step; otherwise, go to B31. B34. Start timing; B35. Determine if the timing duration is equal to the set duration. If yes, proceed to the next step. If no, go to B32. B36. The environmental test chamber has achieved the target environmental parameters.
[0067] Step B8 includes the following steps: B81. Employs a temperature and humidity time-series correlation analysis algorithm to read integrated datasets from the database in batches according to time windows and automatically filters out abnormal data. B82. Perform segmented statistics on the data within the preset time window, calculate the average and variance of each parameter in the environmental parameters and the statistical characteristic values of each parameter in the time series parameters within each time window, and form a statistical data set.
[0068] In step B9, a multivariate regression model of environmental parameters and time-series parameters is constructed based on the statistical data set.
[0069] The expression for the multivariate regression model is shown below:
[0070] In the formula, T represents temperature and H represents humidity. The parameter corresponding to subscript 1 represents the parameter of the environmental test chamber, and the parameter corresponding to subscript 2 represents the parameter at the electrical connection unit. They represent the fitting coefficients, This represents a constant term.
[0071] The least squares method was used to solve the model parameters of equation (2) and to quantify the influence weights of temperature, humidity and the combined effect of temperature and humidity on the time series parameters.
[0072] With the test chip installed on the test board, tests are performed on each preset environmental scenario. The operation of the control board unit includes: initiating the pin connection detection process, outputting preset detection signals to the test board unit interface, receiving feedback response signals from the high-speed chip pins, determining the reliability of the connection between the high-speed chip pins under test and the test socket and electrical connection unit, sending a "connection ready" signal to the control center after the connection meets the standard, transmitting environmental parameters such as the real-time temperature and humidity of the blind-fit flexible electrical connection module and the real-time temperature and humidity inside the environmental test chamber to the control center, binding the environmental parameters with the original feedback data from the high-speed chip on the test board with a timestamp, and forwarding it to the control center.
[0073] Includes the following steps: F1, Start; F2. After the chip to be tested is installed, start the pin connection detection process and output the preset detection signal to the test board unit. F3. Receive feedback response signals from the pins of the high-speed chip under test and determine the reliability of the connection between the pins of the high-speed chip under test and the test socket and electrical connection unit. F4: Check if the connection meets the requirements. If yes, proceed to the next step. If no, press F11. F5. Send a "Connection Ready" signal to the control center; F6. Detect environmental parameters within the electrical connection unit and on the test board, and transmit them to the control center; F7. Receive test commands from the control center unit and transmit the test commands to the high-speed chip under test on the test board unit. F8: Receive the raw test data after the high-speed chip under test has been running; F9. Environmental parameters within the electrical connection unit and environmental parameters on the test board, after being bound to the original test data according to the timestamp, are transmitted to the control center; F10: Receive the test termination signal from the control center to stop signal transmission and data acquisition; F11, End.
[0074] With the test chip installed on the test board unit, the timing detection unit performs the following tasks: responding to the acquisition command from the control center unit, acquiring the timing parameters of the signals at the connection between the control board unit and the electrical connection unit in real time, synchronously recording the timing parameters and timestamps, and sending them to the control center unit; and stopping signal transmission and data acquisition after receiving the test termination signal from the control center unit.
[0075] In one specific embodiment of this application, Environmental parameters - Signal attenuation compensation algorithm: Standard environmental calibration (23℃±2℃, 40%~60% RH): The control board unit outputs a standard signal, and the oscilloscope acquires and stores the standard timing parameters; Error dataset construction: Simulate different temperature and humidity environments, record the time series parameter error Δt, and form the {(T_i, H_i)→Δt_i} error dataset; The parameters are fitted using the Gauss-Newton iterative method, with the goal of minimizing the mean square error, and the calculation is performed iteratively. Real-time compensation: During the test, based on the collected temperature and humidity data, the environmental parameter-signal attenuation compensation model is called to automatically compensate for signal attenuation and eliminate environmental interference.
[0076] Temperature and humidity time series correlation analysis algorithm: Synchronous acquisition: Temperature and humidity data and oscilloscope timing parameters, such as rising edge, falling edge, period, overshoot, and setup time, are read in parallel through a multi-threaded program. Correlation modeling: Based on the sliding time window method and statistical data, with a time window duration of 1 minute, a multivariate regression model is established to quantify the weight of the impact of the environment on the time series. Generate a temperature and humidity-time series parameter trend overlay plot and a structured test report.
[0077] It is worth mentioning that all units involved in this embodiment are logical units. In practical applications, a logical unit can be a physical unit, a part of a physical unit, or a combination of multiple physical units. Furthermore, to highlight the innovative aspects of this application, this embodiment does not introduce units that are not closely related to solving the technical problems proposed in this application; however, this does not mean that other units are absent in this embodiment. Example 4:
[0078] Another embodiment of this application relates to an electronic device, including: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to enable the at least one processor to perform a high-speed chip timing test method suitable for a climate-isolated structure according to the above embodiments.
[0079] The memory and processor are connected via a bus, which can include any number of interconnecting buses and bridges, connecting various circuits of one or more processors and memories. The bus can also connect various other circuits, such as peripheral devices, voltage regulators, and power management circuits, which are well known in the art and will not be described further herein. The bus interface provides an interface between the bus and the transceiver. The transceiver can be a single element or multiple elements, such as multiple receivers and transmitters, providing a unit for communicating with various other devices over a transmission medium. Data processed by the processor is transmitted over the wireless medium via an antenna, which further receives data and transmits it to the processor.
[0080] The processor manages the bus and general processing, and also provides various functions, including timing, peripheral interfaces, voltage regulation, power management, and other control functions. Memory is used to store data used by the processor during operation. Example 5:
[0081] Another embodiment of this application relates to a computer-readable storage medium storing a computer program. When executed by a processor, the computer program implements the method embodiments described above.
[0082] That is, those skilled in the art will understand that all or part of the steps in the methods of the above embodiments can be implemented by a program instructing related hardware. This program is stored in a storage medium and includes several instructions to cause a device (which may be a microcontroller, chip, etc.) or processor to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.
[0083] Those skilled in the art will understand that the above embodiments are specific examples of implementing the present invention. In practical applications, the technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification, and various changes can be made to them in form and detail without departing from the spirit and scope of the present invention.
Claims
1. A high-speed chip timing test method suitable for climate-isolated structures, characterized in that, include: Change the environmental parameters inside the environmental test chamber where the test stand is located and the environmental parameters of the signal acquisition point outside the environmental test chamber, apply a standard signal to the test stand, collect environmental parameters and signal timing parameters, and establish an environmental parameter-signal attenuation compensation model; During testing, the environmental parameters inside the environmental test chamber where the test stand is located and the environmental parameters of the signal acquisition point outside the environmental test chamber are changed. Test signals are applied to the high-speed chip under test on the test stand, and the raw test data, environmental parameters and signal timing parameters of the high-speed chip under test are collected. According to the environmental parameter-signal attenuation compensation model, the compensation amount of the raw test data is calculated, and the raw test data is compensated to obtain accurate test data.
2. The high-speed chip timing test method suitable for climate-isolated structures according to claim 1, characterized in that, The establishment of the environmental parameter-signal attenuation compensation model includes: Set the environmental parameters inside the environmental test chamber and the environmental parameters of the signal acquisition point outside the environmental test chamber as standard environmental parameters. Apply a standard signal to the test socket inside the environmental test chamber from outside the environmental test chamber through the electrical connection unit. Acquire the timing parameters of the standard signal outside the environmental test chamber. Use the standard environmental parameters and the standard signal timing parameters as standard data. The environmental parameters inside the environmental test chamber and the environmental parameters of the signal acquisition points outside the environmental test chamber are changed. Under different environmental parameters, a standard signal is applied to the test base, the current timing parameters and the environmental parameters of the signal acquisition points are collected, the error between the current timing parameters and the standard timing parameters is calculated, the error data is obtained, and the error data is associated with the corresponding environmental parameters to form an error dataset. Based on the error dataset, the Gauss-Newton iterative method is used to fit the parameters of the nonlinear compensation model, thus obtaining the environmental parameter-signal attenuation compensation model.
3. The high-speed chip timing test method suitable for climate-isolated structures according to claim 2, characterized in that, The environmental parameter-signal attenuation compensation model is expressed as follows: ； In the formula, α and β represent the power-law effect of temperature on conductor resistance and expansion; γ and δ represent the exponential terms of the change in dielectric constant caused by humidity; and ε represents the temperature-humidity synergistic effect coefficient. The subscript 1 represents a constant; the parameter corresponding to subscript 1 represents the parameter of the environmental test chamber, the parameter corresponding to subscript 2 represents the parameter of the signal acquisition point, T represents temperature, and H represents humidity.
4. The high-speed chip timing test method suitable for climate-isolated structures according to claim 2, characterized in that, The establishment of the environmental parameter-signal attenuation compensation model also includes: verifying the prediction accuracy of the environmental parameter-signal attenuation compensation model, including: using the environmental parameter-signal attenuation compensation model for prediction, calculating the preset error of the time series parameters for different environmental parameters, calculating the mean square error between the prediction error and the actual error, saving the environmental parameter-signal attenuation compensation model when the mean square error reaches the accuracy requirement, and supplementing the error data and refitting the parameters of the nonlinear compensation model when the accuracy does not reach the accuracy requirement, until the prediction accuracy of the environmental parameter-signal attenuation compensation model reaches the accuracy requirement.
5. The high-speed chip timing test method suitable for climate-isolated structures according to claim 1, characterized in that, The method further includes: associating precise test data, time series parameters, and environmental parameters by timestamp to obtain an integrated dataset; based on the integrated dataset, performing segmented statistics on data within different time windows in the integrated dataset to obtain a statistical data set; based on the statistical data set, constructing a multivariate regression model based on environmental parameters and time series parameters to quantify the impact of environmental parameters on time series parameters and generate a test report.
6. The high-speed chip timing test method suitable for climate-isolated structures according to claim 5, characterized in that, The step of segmenting and statistically analyzing data within different time windows in the integrated dataset to obtain a statistical data set includes: using a sliding time window method to segment the integrated data according to time windows, processing the data within each time window, calculating the mean of environmental parameters within the time window, calculating the statistical characteristic values of time series parameters within the time window, and obtaining a statistical data set.
7. The high-speed chip timing test method suitable for climate-isolated structures according to claim 1, characterized in that, The construction of a multivariate regression model based on environmental and time-series parameters includes: the expression of the multivariate regression model is shown in the following formula: ； In the formula, T represents temperature, H represents humidity; the parameter corresponding to subscript 1 represents the parameter of the environmental test chamber, and the parameter corresponding to subscript 2 represents the parameter of the signal acquisition point. They represent the fitting coefficients, Represents a constant term; The least squares method is used to solve for the model parameters of the multivariate regression model.
8. A high-speed chip timing test system suitable for climate-isolated structures, characterized in that, include: The system includes a control module, a central unit, a control board unit, a test board unit, an electrical connection unit, a timing detection unit, and an environmental control unit. The control module comprises a control central unit and a control board unit. The control board unit is connected to the control central unit, the control board unit, the electrical connection unit, the timing detection unit, and the environmental control unit, respectively. One end of the electrical connection unit is connected to the control board unit, and the other end is connected to the test board unit, for signal transmission between the control board unit and the test board unit. The timing detection unit is also connected to the control central unit. The control board unit is used to generate standard signals or test signals according to the instructions of the control center and transmit them to the test board unit; collect environmental parameters of the electrical connection unit and the test board unit and transmit them to the control center unit; and bind the test raw data of the test board unit with the timestamp and transmit it to the control center unit. The environmental conditioning unit is used to adjust the environmental parameters inside the environmental test chamber where the test panel unit is located. The test board unit is used to set up the high-speed chip under test, acquire the raw test data of the high-speed chip under test, and feed it back to the control board unit. Electrical connection unit, used for connecting the control board unit and the test board unit; The timing detection unit is used to detect the timing of the transmitted signals at the connection point between the control board unit and the electrical connection unit, and transmits the detected timing parameters to the control center unit. The control center unit is used to establish an environmental parameter-signal attenuation compensation model based on the environmental parameters transmitted by the control board unit and the timing parameters of the timing detection unit when the high-speed chip under test is not installed. When testing the high-speed chip under test, it receives the raw test data, timestamps and environmental parameters transmitted by the control board unit, and uses the environmental parameter-signal attenuation compensation model to calculate the compensation amount of the raw test data to obtain accurate test data. The system receives time-series parameters from the time-series acquisition unit, associates the time-series parameters, precise test data, and environmental parameters according to timestamps to form an integrated dataset, processes the data within the time window in the integrated dataset to obtain statistical data, establishes a multivariate regression model based on the statistical data, quantifies the impact of environmental parameters on time-series parameters, and generates an environmental parameter-time-series parameter trend chart and a test report.
9. An electronic device, characterized in that, include: At least one processor; as well as, A memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by the at least one processor to enable the at least one processor to perform a high-speed chip timing test method for a climate-isolated structure as described in any one of claims 1 to 7.
10. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by the processor, it implements a high-speed chip timing test method suitable for climatic isolation structures, as described in any one of claims 1 to 7.