Unit test case automatic generation method and device based on preferred iteration feedback
By employing deep dependency analysis and coverage threshold optimization iteration mechanisms, the redundancy and instability issues in unit test case generation within the CIM system were resolved. This enabled the efficient generation of high-quality, high-coverage unit test cases, thereby improving the software quality and R&D efficiency of the CIM system.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 上海朋熙半导体股份有限公司
- Filing Date
- 2026-04-30
- Publication Date
- 2026-05-29
AI Technical Summary
Existing AI-driven unit test case generation methods in CIM systems suffer from redundant context inputs, low generation accuracy, and unstable iterative optimization, resulting in slow code coverage improvement and difficulty in generating high-quality, high-coverage test cases.
By extracting necessary reference code through deep dependency analysis, combining iterative optimization of coverage thresholds, accurately filtering external reference information, constructing an internal dependency view, generating unit test cases using AI models, and ensuring the legality and coverage of the generated test cases through a closed-loop feedback path of syntax validity verification and coverage iteration optimization.
It significantly improved the first-time compilation pass rate and runnability of unit test cases, steadily increased coverage, shortened the development cycle, reduced project launch risks, and improved the software quality and development efficiency of the CIM system.
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