A compact electronic hardware inspection device

Abstract

This invention discloses and provides a compact electronic hardware testing device, enabling universal testing of different project boards and devices, significantly reducing the design workload and error probability of dedicated test boards, and shortening debugging time. The invention includes at least one functional box and a power control box, wherein the power control box provides power to the functional box. The functional box is used for electronic hardware testing. The functional box includes a housing and an integrated module disposed within the housing. The integrated module includes an FPGA control module, a power integrated circuit, an audio output measurement circuit, a channel switching circuit, a ripple measurement circuit, a GPIO control circuit, and an AC / DC voltage measurement circuit. This invention applies to the technical field of electronic hardware testing.

Description

Technical Field

[0001] This invention relates to an electronic inspection device, and more particularly to a compact electronic hardware inspection device. Background Technology

[0002] Outgoing Quality Control (OQC) is a crucial step in modern manufacturing before shipment, directly determining product quality and the effectiveness of design risk management. Currently, for various electronic hardware components such as integrated circuits, industrial control boards, power modules, and consumer electronics components, the testing of DC parameters, AC voltage, and negative voltage load capacity requires the independent design of dedicated test boards for each item in OQC inspection. With the surge in the number of items, problems such as redundant test boards, tight design cycles, high R&D costs, high debugging error rates, and low inspection efficiency have gradually emerged. Specific problems are as follows: 1. The contradiction between universal testing and portability: Although existing universal OQC testing platforms and similar universal equipment on the market have solved the problem of universality for multi-item testing, they are too large and heavy, making them too difficult to move. As the number of items increases, the time cost also increases significantly.

[0003] 2. Redundant structural design: The functional modules of the existing general test platform are independently packaged and laid out horizontally, with redundant gaps between modules, which further occupy space and prevents the volume from being effectively reduced, which does not conform to the trend of compact design. 3. Power supply compatibility limitations: The existing OQC test platform uses an ATX power supply for AC mains power, which has a large interface size and complex wiring, further increasing the overall size of the equipment, and cannot meet the needs of the power supply equipment on site. 4. Functional redundancy: The existing OQC test platform is a four-channel design, but in practice, only one channel is usually used, resulting in redundancy of other channels and wasted space. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to overcome the shortcomings of the prior art and provide a compact electronic hardware testing device that realizes universal testing of different project boards and equipment, greatly reduces the design workload and error probability of dedicated test boards, and shortens the debugging time.

[0005] The technical solution adopted in this invention is as follows: This invention includes at least one functional box 1 and a power control box 2. The power control box 2 provides power to the functional box 1. The functional box 1 is used for electronic hardware testing. The functional box 1 includes a housing and an integrated module disposed within the housing. The integrated module includes an FPGA control module, a power integrated circuit, an audio output measurement circuit, a channel switching circuit, a ripple measurement circuit, a GPIO control circuit, and an AC / DC voltage measurement circuit. The power integrated circuit, audio output measurement circuit, channel switching circuit, ripple measurement circuit, GPIO control circuit, and AC / DC voltage measurement circuit are all connected to the FPGA control module. FPGA control module: As the core control unit of the system, it undertakes the digital signal processing and coordinated scheduling tasks of the entire system, including: controlling the operation of each module through IIc and SPI; frequency output and measurement with different duty cycles; II2 and SPI master-slave simulation function; communication with the host PC through the network port; communication with the board under test and the system UART; TDM master-slave simulation function; PDM master-slave simulation function; Power supply integrated circuit: Provides two adjustable power supplies to power the board under test, provides one electronic load interface to measure the power load capacity of the board under test, provides one ADC to measure the voltage of the board under test and the system, and provides one adjustable DAC to provide different voltage excitation sources for the board under test; Audio integrated circuit: Its main function is to provide various test signal sources and excitation sources to the board under test, and to measure the audio signal of the board under test, and to analyze the peak-to-peak value, effective voltage value and frequency of the audio signal; Channel switching circuit: Switches multiple input channels to a single output for the processor to analyze, thereby saving processor resources; Ripple measurement circuit: used to measure the ripple parameters of voltage rails on the board under test and the system; GPIO control circuit: The basic interface circuit used to connect external devices. It realizes interaction with external hardware through digital signal input / output. Specifically, it provides multiple I / O ports through GPIO expansion chips and controls MUX and relays to perform logic switching. AC / DC voltage test circuit: The AC circuit adds a full-bridge rectifier circuit and a voltage divider conditioning circuit. The AC input signal is first rectified into a DC signal by the full-bridge rectifier, and then acquired and measured by the ADC chip. The DC input signal is fed into the ADC chip for acquisition and measurement through a path switching circuit.

[0006] Furthermore, the number of functional boxes 1 is four, and the four functional boxes 1 are designed in a stacked manner.

[0007] Furthermore, the functional box 1 uses an aluminum alloy shell.

[0008] Furthermore, an internal adapter board 3 connected to the integrated module is also provided inside the outer casing, and the board under test 4 is connected to the internal adapter board 3 through an external adapter board 5. Attached Figure Description

[0009] Figure 1 This is a schematic diagram of the structure of the present invention; Figure 2 This is a block diagram of the OQC test hardware resources of this invention; Figure 3 This is a block diagram of the overall OQC testing system of this invention; Figure 3-1 This is another block diagram of the OQC overall testing system of the present invention; Figure 4 This is the original circuit block diagram of the functional box; Figure 5 This is the circuit diagram of the FPGA control module; Figure 6 It is a power supply integrated circuit; Figure 7 It is an audio output measurement circuit; Figure 8 It is a channel switching circuit; Figure 9 It is a ripple measurement circuit; Figure 10 It is a GPIO control circuit; Figure 11 It is an AC / DC voltage measurement circuit. Detailed Implementation

[0010] like Figures 1 to 11 As shown, in this embodiment, the present invention achieves comprehensive optimization through "single motherboard integration + single adapter 24V power supply + expandable multi-channel + functional optimization and upgrade".

[0011] The overall structure of the device of the present invention includes a core function box and a power control box: 1. Core Function Box: The casing is made of aluminum alloy and measures 265mm×173mm×47mm. The top and bottom of the casing are equipped with standardized buckles and positioning holes, which support vertical stacking (up to 4 function boxes can be stacked to achieve 4-channel detection). The sides are equipped with a power input interface, a USB input port, and a network cable input interface, and the back is equipped with a heat dissipation grille. The traditional modular design has been eliminated, and all functions are integrated into a single core motherboard. The motherboard measures 250mm × 150mm and is installed inside the casing. Compared to the previous generation core board, which measures 443mm × 195mm, space utilization has been improved by 56%. In addition, an adapter board has been added, and the external connectors have been changed to commonly used and compact interfaces.

[0012] 2. Power control box: The power input adopts DC 24V (6P adapter interface) and can output 4 independent power rails, namely 24V, 5V, 3V3 and 1V8; USB hub circuit: integrates a 1 to 4 USB 2.0 hub chip to meet the 4-channel USB testing requirements. The core functional box of this invention adopts an integrated design. The functional box 1 includes a housing and an integrated module disposed within the housing. The integrated module includes an FPGA control module, a power integrated circuit, an audio output measurement circuit, a channel switching circuit, a ripple measurement circuit, a GPIO control circuit, an AC / DC voltage measurement circuit, and various communication protocol paths, etc., wherein: FPGA Control Module: As the core control unit of the system, it undertakes the tasks of digital signal processing and coordinated scheduling of the entire system. Its core functions include: 1) controlling the operation of each module through IIc and SPI; 2) frequency output and measurement with different duty cycles; 3) IIc and SPI master-slave simulation function; 4) communication with the host PC through the network port; 5) communication with the board under test and the system UART; 6) TDM master-slave simulation function; 7) PDM master-slave simulation function, etc.

[0013] Power supply integrated circuit: 1) Provides two adjustable power supplies to power the board under test; 2) Provides one electronic load interface to measure the power load capacity of the board under test; 3) Provides one ADC to measure the voltage of the board under test and the system; 4) Provides one adjustable DAC to provide different voltage excitation sources for the board under test.

[0014] Audio integrated circuits: Their main function is to provide various test signal sources and excitation sources to the board under test, and to measure the audio signals of the board under test, and to analyze parameters such as peak-to-peak value, effective voltage value and frequency of the audio signals.

[0015] Ripple measurement circuit: Used to measure the ripple parameters of the voltage rails on the board under test and the system.

[0016] GPIO control circuit: It is a basic interface circuit used in embedded systems and electronic devices to connect external devices or sensors. Its core function is to realize the interaction with external hardware through the input / output of digital signals. Specifically, it provides multiple I / O ports through GPIO expansion chips and controls MUX and relays to perform logic switching.

[0017] AC / DC voltage test circuit: The AC circuit adds a full-bridge rectifier circuit and a voltage divider conditioning circuit. The AC input signal is first rectified into a DC signal by the full-bridge rectifier, and then acquired and measured by the ADC chip. The DC input signal is fed into the ADC chip for acquisition and measurement through a path switching circuit.

[0018] This invention abandons the traditional multi-module design and ATX power supply, adopting a "single motherboard integrating full functionality + 24V adapter power supply + power control box" solution. It integrates multi-voltage rail outputs and USB hub circuitry, simplifying power supply and interfaces. This invention innovatively uses a stacked structure design, eliminating horizontally distributed layouts and concentrating all functions on a single motherboard using vertical stacking, significantly reducing the horizontal footprint. This invention employs a "single box, single channel + stacked expansion for multiple channels" design. The basic box integrates all core functions, and multiple functional boxes can be vertically stacked when multiple channels are needed, flexibly adapting to different testing requirements. This invention adds AC voltage testing and Nload negative voltage tensile testing functions, expanding the testing coverage and improving the equipment's practicality.

[0019] The effective effects of this invention are as follows: 1. Wide range of applicable scenarios: It can be used for testing DC parameters, AC voltage, and negative voltage load capacity of various electronic hardware such as integrated circuits, industrial control boards, power modules, and consumer electronic components, covering multiple fields such as industrial electronics, consumer electronics, and automotive electronics. It is especially suitable for mobile scenarios such as batch sampling inspection on production lines and on-site maintenance. 2. Reduced overall costs: The single-motherboard integrated design reduces the number of components, lowering hardware costs by 30%; the elimination of bulky server power supplies reduces transportation and storage costs by 50%; the multi-channel scalable design avoids duplicate equipment purchases, reducing equipment investment costs by 60%. 3. Improve testing efficiency and quality: Test preparation time is reduced by 90%, single-channel test cycle is ≤30 seconds, and 4-channel synchronous testing can realize batch equipment parallel testing, improving efficiency by 3 times; 4. Lowered operating threshold: The integrated design and one-click testing process eliminate the need for professional debugging, allowing production line workers or after-sales personnel to quickly get started and reduce labor training costs.

[0020] Although the embodiments of the present invention are described with reference to actual solutions, they do not constitute a limitation on the meaning of the present invention. Modifications to the embodiments and combinations with other solutions based on this specification will be obvious to those skilled in the art.

Claims

1. A compact electronic hardware inspection device comprising at least one functional box (1) and a power control box (2) providing power to the functional box (1) for electronic hardware inspection, characterized in that: The functional box (1) includes a housing and an integrated module disposed within the housing. The integrated module includes an FPGA control module, a power supply integrated circuit, an audio output measurement circuit, a channel switching circuit, a ripple measurement circuit, a GPIO control circuit, and an AC / DC voltage measurement circuit. The power supply integrated circuit, the audio output measurement circuit, the channel switching circuit, the ripple measurement circuit, the GPIO control circuit, and the AC / DC voltage measurement circuit are all connected to the FPGA control module, wherein: FPGA control module: As the core control unit of the system, it undertakes the digital signal processing and coordinated scheduling tasks of the entire system, including: controlling the operation of each module through IIc and SPI; frequency output and measurement with different duty cycles; II2 and SPI master-slave simulation function; communication with the host PC through the network port; communication with the board under test and the system UART; TDM master-slave simulation function; PDM master-slave simulation function; Power supply integrated circuit: Provides two adjustable power supplies to power the board under test, provides one electronic load interface to measure the power load capacity of the board under test, provides one ADC to measure the voltage of the board under test and the system, and provides one adjustable DAC to provide different voltage excitation sources for the board under test; Audio integrated circuit: Its main function is to provide various test signal sources and excitation sources to the board under test, and to measure the audio signal of the board under test, and to analyze the peak-to-peak value, effective voltage value and frequency of the audio signal; Channel switching circuit: Switches multiple input channels to a single output for the processor to analyze, thereby saving processor resources; Ripple measurement circuit: used to measure the ripple parameters of voltage rails on the board under test and the system; GPIO control circuit: The basic interface circuit used to connect external devices. It realizes interaction with external hardware through digital signal input / output. Specifically, it provides multiple I / O ports through GPIO expansion chips and controls MUX and relays to perform logic switching. AC / DC voltage test circuit: The AC circuit adds a full-bridge rectifier circuit and a voltage divider conditioning circuit. The AC input signal is first rectified into a DC signal by the full-bridge rectifier, and then acquired and measured by the ADC chip. The DC input signal is fed into the ADC chip for acquisition and measurement through a path switching circuit.

2. The compact electronic hardware testing device according to claim 1, characterized in that: The number of the functional boxes (1) is four, and the four functional boxes (1) are designed in a stacked manner.

3. The compact electronic hardware testing device according to claim 1, characterized in that: The functional box (1) has an aluminum alloy shell.

4. The compact electronic hardware testing device according to claim 1, characterized in that: The outer casing is also provided with an internal adapter board (3) that is connected to the integrated module. The test board (4) is connected to the internal adapter board (3) through an external adapter board (5).

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