Method, system and storage medium for determining the pollution class of a metal component-containing insulator
By calculating the surface density of metal pollution and introducing a correction factor, the problem of the hazard of metal pollution not being reflected in traditional assessment methods has been solved, enabling a scientific assessment of the pollution level of insulators and improving the safety and reliability of the power grid.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- YUNNAN POWER GRID CO LTD ELECTRIC POWER RES INST
- Filing Date
- 2026-01-06
- Publication Date
- 2026-06-02
AI Technical Summary
Traditional methods cannot accurately reflect the conductivity and physical hazards of insulators containing a high proportion of metal components when assessing pollution, leading to distorted flashover risk assessments and potential safety hazards.
By calculating the surface density of metal contamination, introducing the metal conductivity contribution conversion factor and the metal physical contribution correction factor, the traditional equivalent salt density and ash density are corrected, and the equivalent equivalent salt density and ash density are calculated to scientifically quantify the electrical and physical effects of metal contamination.
It enables a true and comprehensive assessment of insulators containing metallic pollution, provides accurate insulation configuration and anti-flashover management decisions, and improves the operational safety and reliability of the power grid in special environments.
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Figure CN122131083A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of transmission line insulator testing technology, and in particular to a method, system, and storage medium for determining the pollution level of insulators containing metallic components. Background Technology
[0002] The reliability of the external insulation of transmission lines is the first line of defense for the safe and stable operation of the power grid. Pollution flashover is one of the most significant external insulation faults threatening power grid safety, and the key to its prevention lies in the accurate assessment of the degree of contamination on the insulator surface. Currently, the power industry generally uses two indicators, equivalent salt density (ESDD) and equivalent ash density (NSDD), to characterize the degree of contamination on the insulator surface, and uses these as the basis for classifying contaminated areas and configuring external insulation levels.
[0003] The standard procedure for traditional assessment methods is as follows: A pollution sample is taken from the surface of the operating insulator, dissolved in deionized water, filtered, and the conductivity of the filtrate is measured and converted to an equivalent mass of NaCl. This mass is then divided by the sampling area to obtain the ESDD (Excessive Static Discharge). The remaining insoluble matter on the filter paper is dried, weighed, and divided by the sampling area to obtain the NSDD (Negative Static Discharge). In pollution flashover risk assessment, ESDD and NSDD are usually treated as independent variables, substituted into empirical formulas or compared with pollution-flashover characteristic curves to determine the risk level. However, the above-mentioned traditional assessment method has fundamental flaws when dealing with pollution from special industrial environments such as metallurgy, mining, and cement plants, which contain a high proportion of metal components (such as iron, aluminum, copper, and their oxide particles). This leads to serious distortion in risk assessment, mainly in the following two aspects: 1. Traditional ESDD only reflects the ionic conductivity contribution of soluble salts. Although metal particles themselves are insoluble in water, their inherent high conductivity allows them to directly participate in the formation of conductive channels when the insulator surface is damp. This crucial conductive contribution is completely ignored in traditional ESDD measurements, resulting in measured ESDD values that are significantly lower than the actual surface equivalent conductivity level, severely underestimating the conductive hazards of contamination.
[0004] 2. Traditional non-volatile organic compounds (NSDDs) treat all insoluble matter as equal, measuring it solely by mass. Metal contaminants differ significantly from standard inert materials (such as diatomaceous earth) in particle size, shape, specific surface area, and chemical activity. Their hygroscopic and water-retaining properties, as well as their impact on local electric field distortion, cannot be characterized by mass alone. Simply including highly conductive metal particles in NSDDs ignores their fundamental difference from ordinary ash and severely underestimates their physical risk of exacerbating flashover.
[0005] Therefore, the pollution zone classification, insulation configuration and cleaning decisions based on distorted ESDD and NSDD pose significant safety hazards in areas with high metal pollution, which may lead to insufficient external insulation configuration and trigger pollution flashover accidents that are difficult to predict. Summary of the Invention
[0006] Therefore, it is necessary to propose a method for determining the pollution level of insulators containing metallic components to address the above problems.
[0007] A method for determining the pollution level of an insulator containing metallic components, the method comprising the following steps: Obtain the sampling area A of the insulator pollution sample, the total mass of insoluble matter in the insulator pollution sample, and the mass fraction of each of the various metal elements in the insoluble matter; The surface density of the metal contamination is calculated based on the sampling area A of the contaminated insulator sample, the insoluble matter in the contaminated insulator sample, and the mass fraction of each of the various metal elements in the insoluble matter. Based on the aforementioned metal contamination surface density and metal composition, the metal conductivity contribution reduction factor and the metal physical contribution correction factor are determined respectively. Obtain the conventional equivalent salt density and conventional equivalent ash density of the insulator contamination sample; The traditional equivalent salt density is corrected by using the metal conductivity contribution conversion factor, and the traditional equivalent gray density is corrected by using the metal physical contribution correction factor, and the equivalent equivalent salt density and equivalent equivalent gray density are calculated respectively. The pollution level of insulators is assessed based on the equivalent salt density and equivalent ash density.
[0008] In the above scheme, obtaining the mass fraction of each of the various metal elements in the insoluble matter specifically includes: The types and mass fractions of metal elements in the insoluble matter of the insulator contamination sample were determined by elemental composition analysis; the metal elements included at least Fe, Al, Cu, Zn, Mg, Ca, Na, and K.
[0009] In the above scheme, the calculation of the metallic pollution surface density based on the sampling area A of the insulator pollution sample, the insoluble matter in the insulator pollution sample, and the mass fraction of each of the various metallic elements in the insoluble matter specifically includes: The surface density of metallic contaminants can be determined using the following formula:
[0010] Where, m 不溶物 ω is the total mass of insoluble matter in the contaminated insulator sample. i Let A be the mass fraction of the i-th metallic element in the insoluble matter, and A be the sampling area. is the surface density of the metal contaminant.
[0011] In the above scheme, determining the metal conductivity contribution reduction factor and the metal physical contribution correction factor based on the metal contamination surface density and metal composition specifically includes: The conversion factor for the electrical conductivity contribution of metals is determined using the following formula:
[0012]
[0013]
[0014] Where K_C is the conversion factor for the metallic conductivity contribution, and α i Let be the intrinsic conductivity factor of the i-th metallic element, ESDD NaCl For equivalent NaCl salt density, Let β be the surface density of the i-th metallic element. i γ is the speciation factor of the i-th metallic element, representing the ratio of the relative conductivity of a specific speciation of the metallic element to that of a conductive pure metal. i Let be the particle size influence factor of the i-th metallic element. Let represent the percentage of the mass of the i-th metallic element relative to the total mass of all metallic elements; The correction factor for the physical contribution of the metal is determined using the following formula:
[0015] in, The correction factor contributes to metal physics, where λ is the metal-gray density coupling coefficient determined experimentally, and NSDD_0 is the traditional equivalent gray density. is the surface density of the metal contaminant.
[0016] In the above scheme, the step of correcting the traditional equivalent salt density using the metal conductivity contribution conversion factor and correcting the traditional equivalent gray density using the metal physical contribution correction factor, and calculating the equivalent equivalent salt density and equivalent equivalent gray density respectively, specifically includes: The equivalent salt density is determined using the following formula: ESDD_eq=ESDD_0+K_C×
[0017] Where ESDD_eq is the equivalent salt density, ESDD_0 is the traditional equivalent salt density, and K_C is the metal conductivity contribution reduction factor. The surface density of the metal contaminant; The equivalent gray density is determined according to the following formula: NSDD_eq= ×NSDD_0 Wherein, NSDD_eq represents the equivalent gray density. The correction factor is contributed to the metal physics, and NSDD_0 is the traditional equivalent gray density.
[0018] In the above scheme, the assessment of the insulator pollution level based on the equivalent salt density and equivalent ash density specifically includes: When the equivalent salt density is less than or equal to the first threshold, the contamination level is grade a; When the first threshold < the equivalent salt density ≤ the second threshold, the contamination level is b. When the second threshold < the equivalent salt density ≤ the third threshold, the filth level is level c; When the equivalent salt density is greater than the third threshold, the contamination level is d. Specifically, when the equivalent gray density is greater than the fourth threshold, the pollution level is raised by one level based on the above classification results.
[0019] The above scheme, after calculating the surface density of metallic contaminants, also includes: correcting for the uneven distribution of metallic contaminants on the insulator surface. The distribution characteristics of metallic fouling were determined by water flushing experiments, and the distribution correction factor δ was determined accordingly. Calculate the corrected metallic fouling surface density ρ'_M using the following formula, and replace the metallic fouling surface density ρ_M with the corrected metallic fouling surface density ρ'_M: ρ'_M=ρ_M×δ Where ρ'_M is the corrected surface density of metal contamination, ρ_M is the surface density of metal contamination, and δ is the distribution correction factor, which is 1 when the metal contamination is uniformly distributed.
[0020] This application also proposes a pollution level determination system for insulators containing metallic components, the system comprising: a data acquisition unit, a surface density calculation unit, a correction coefficient determination unit, an equivalent calculation unit, and a pollution level evaluation unit; The sample collection unit is used to obtain the sampling area of the insulator pollution sample, the total mass of insoluble matter in the insulator pollution sample, the mass fraction of each of the various metal elements in the insoluble matter, and the traditional equivalent salt density and traditional equivalent ash density of the pollution sample. The areal density calculation unit is used to calculate the metal pollution areal density based on the sampling area A of the insulator pollution sample, the insoluble matter in the insulator pollution sample, and the mass fraction of each of the various metal elements in the insoluble matter. The correction coefficient determination unit is used to determine the metal conductivity contribution conversion coefficient and the metal physical contribution correction coefficient based on the metal contamination surface density and metal composition, respectively. The equivalent calculation unit is used to determine the traditional equivalent salt density and traditional equivalent ash density of the contaminated sample; the traditional equivalent salt density is corrected by the metal conductivity contribution conversion factor, and the traditional equivalent ash density is corrected by the metal physical contribution correction factor, and the equivalent equivalent salt density and equivalent ash density are calculated respectively. The pollution level assessment unit is used to assess the pollution level of the insulator based on the equivalent salt density and equivalent ash density.
[0021] This application also proposes a readable storage medium storing a computer program, which, when executed by a processor, causes the processor to perform the following steps: Obtain the sampling area A of the insulator pollution sample, the total mass of insoluble matter in the insulator pollution sample, and the mass fraction of each of the various metal elements in the insoluble matter; The surface density of the metal contamination is calculated based on the sampling area A of the contaminated insulator sample, the insoluble matter in the contaminated insulator sample, and the mass fraction of each of the various metal elements in the insoluble matter. Based on the aforementioned metal contamination surface density and metal composition, the metal conductivity contribution reduction factor and the metal physical contribution correction factor are determined respectively. Obtain the conventional equivalent salt density and conventional equivalent ash density of the insulator contamination sample; The traditional equivalent salt density is corrected by using the metal conductivity contribution conversion factor, and the traditional equivalent gray density is corrected by using the metal physical contribution correction factor, and the equivalent equivalent salt density and equivalent equivalent gray density are calculated respectively. The pollution level of insulators is assessed based on the equivalent salt density and equivalent ash density.
[0022] This application also proposes a computer device, including a memory and a processor, wherein the memory stores a computer program, and the computer program is executed by the processor in the following steps: Obtain the sampling area A of the insulator pollution sample, the total mass of insoluble matter in the insulator pollution sample, and the mass fraction of each of the various metal elements in the insoluble matter; The surface density of the metal contamination is calculated based on the sampling area A of the contaminated insulator sample, the insoluble matter in the contaminated insulator sample, and the mass fraction of each of the various metal elements in the insoluble matter. Based on the aforementioned metal contamination surface density and metal composition, the metal conductivity contribution reduction factor and the metal physical contribution correction factor are determined respectively. Obtain the conventional equivalent salt density and conventional equivalent ash density of the insulator contamination sample; The traditional equivalent salt density is corrected by using the metal conductivity contribution conversion factor, and the traditional equivalent gray density is corrected by using the metal physical contribution correction factor, and the equivalent equivalent salt density and equivalent equivalent gray density are calculated respectively. The pollution level of insulators is assessed based on the equivalent salt density and equivalent ash density.
[0023] The embodiments of this invention offer the following advantages: The method for determining the pollution level of insulators containing metallic components, provided by this invention, introduces metallic pollution surface density as a core intermediate parameter and employs a dual-path correction method using both a metallic conductivity contribution conversion factor and a metallic physical contribution correction factor. This allows for the scientific quantification and integration of the electrical hazards and physical effects of insoluble metal particles into the traditional assessment system. The final output equivalent salt density (and equivalent gray density) accurately and comprehensively reflects the overall pollution level of insulators containing metallic pollution, fundamentally solving the problem of inaccurate assessment of metallic pollution using traditional ESDD / NSDD methods. This provides a scientific and reliable basis for precise insulation configuration, pollution zone delineation, and flashover prevention in high-metallic-pollution areas, significantly improving the operational safety and reliability of the power grid in special industrial environments. Attached Figure Description
[0024] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0025] in: Figure 1 This is a schematic diagram of a method for determining the pollution level of an insulator containing metallic components in one embodiment. Detailed Implementation
[0026] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.
[0027] In the following description, numerous specific details are set forth in order to provide a more thorough understanding of the invention; however, it will be apparent to those skilled in the art that the invention may be practiced without one or more of these details; in other instances, certain technical features well-known in the art have not been described in order to avoid confusion with the invention. It should be understood that the invention can be practiced in different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided to make the disclosure thorough and complete and to fully convey the scope of the invention to those skilled in the art.
[0028] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the invention. When used herein, the singular forms “a,” “an,” and “the” are also intended to include the plural forms, unless the context clearly indicates otherwise. The terms “comprising” and / or “including,” when used in this specification, identify the presence of said features, integers, steps, operations, elements, and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups. When used herein, the term “and / or” includes any and all combinations of the associated listed items.
[0029] To fully understand the present invention, a detailed structure will be presented in the following description in order to illustrate the technical solution proposed by the present invention; optional embodiments of the present invention are described in detail below, however, in addition to these detailed descriptions, the present invention may have other embodiments.
[0030] like Figure 1 As shown, in one embodiment, a method for determining the pollution level of an insulator containing metallic components is provided. This method includes steps S101 to S106, detailed below: S101. Obtain the sampling area A of the insulator pollution sample, the total mass of insoluble matter in the insulator pollution sample, and the mass fraction of each of the various metal elements in the insoluble matter. Specifically, a contamination sample was collected from the surface of the insulator, and the sampling area was measured. The contamination sample was then dissolved and filtered to separate soluble and insoluble substances. By obtaining the specific sampling area and the mass of insoluble substances, the standardized values of the contamination sample were achieved. By determining the mass fraction of metal elements, the specific composition of the metal components in the insoluble substances was clarified, thus refining the traditional general ash density into specific metal composition data, laying a data foundation for subsequent differentiation of metal hazards.
[0031] In some embodiments, obtaining the mass fraction of each of the various metal elements in the insoluble matter specifically includes: The types and mass fractions of metal elements in the insoluble matter of insulator contaminated samples were determined by elemental composition analysis. The metal elements included at least Fe, Al, Cu, Zn, Mg, Ca, Na, and K.
[0032] S102. Calculate the surface density of metal pollution based on the sampling area A of the insulator pollution sample, the insoluble matter in the insulator pollution sample, and the mass fraction of each metal element in the insoluble matter. This step converts the content of metal elements into the metal surface density per unit area, enabling an accurate characterization of the degree of metal contamination on the insulator surface and providing a calculable intermediate variable for subsequent assessment of the specific impact of metal contamination on insulation performance.
[0033] In some embodiments, the metallic pollution surface density is calculated based on the sampling area A of the insulator pollution sample, the insoluble matter in the insulator pollution sample, and the mass fraction of each of the various metallic elements in the insoluble matter. Specifically, this includes: The surface density of metallic contaminants can be determined using the following formula:
[0034] Where, m 不溶物 ω is the total mass of insoluble matter in the contaminated insulator sample. i Let A be the mass fraction of the i-th metallic element in the insoluble matter, and A be the sampling area. is the surface density of the metal contaminant.
[0035] In some embodiments, after calculating the metallic contamination areal density, the method further includes: correcting for non-uniformity in the distribution of metallic contamination on the insulator surface. The distribution characteristics of metallic fouling were determined by water flushing experiments, and the distribution correction factor δ was determined accordingly. Calculate the corrected metallic fouling surface density ρ'_M using the following formula, and replace the metallic fouling surface density ρ_M with the corrected metallic fouling surface density ρ'_M: ρ'_M=ρ_M×δ Where ρ'_M is the corrected surface density of metal contamination, ρ_M is the surface density of metal contamination, and δ is the distribution correction factor, which is 1 when the metal contamination is uniformly distributed.
[0036] S103. Based on the surface density of metal contamination and the metal composition, determine the conversion factor for the metal's electrical conductivity contribution and the correction factor for the metal's physical contribution, respectively. These two coefficients quantify the two core hazard pathways of metal contamination: the direct conductivity of metal particles under humid conditions (i.e., the metal's conductive contribution) and the differences in physical properties of metal particles relative to ordinary insoluble substances in terms of hygroscopicity, particle size, and shape (i.e., the metal's physical contribution). This allows the assessment model to reflect the specific risks of different types and forms of metals.
[0037] In some embodiments, the metal conductivity contribution reduction factor and the metal physical contribution correction factor are determined based on the metal contamination areal density and metal composition, respectively, specifically including: The conversion factor for the electrical conductivity contribution of metals is determined using the following formula:
[0038]
[0039]
[0040] Where K_C is the conversion factor for the metallic conductivity contribution, and α i Let be the intrinsic conductivity factor of the i-th metallic element, ESDD NaCl For equivalent NaCl salt density, Let β be the surface density of the i-th metallic element. i γ is the speciation factor of the i-th metallic element, representing the ratio of the relative conductivity of a specific speciation of the metallic element to that of a conductive pure metal. i Let be the particle size influence factor of the i-th metallic element. Let represent the percentage of the mass of the i-th metallic element relative to the total mass of all metallic elements; The correction factor for the physical contribution of the metal is determined using the following formula:
[0041] in, The correction factor contributes to metal physics, where λ is the metal-gray density coupling coefficient determined experimentally, and NSDD_0 is the traditional equivalent gray density. is the surface density of the metal contaminant.
[0042] Preferably, the method for determining the intrinsic conductivity factor αi includes: preparing artificial dirt containing different mass fractions of the i-th metal element and coating it onto a standard glass plate; measuring the surface conductivity σi under standard humid conditions; preparing NaCl solutions of different concentrations as dirt and measuring the surface conductivity σNaCl under the same conditions; determining the value of αi by fitting the σi-ρi curve and the σNaCl-ESDD curve, such that αi×ρi is equivalent to ESDD.
[0043] S104. Obtain the traditional equivalent salt density and traditional equivalent ash density of insulator contamination samples; Obtaining the traditional equivalent salt density and traditional equivalent ash density of insulator pollution samples from existing standards as a benchmark for correction ensures the effective connection between the method of this invention and the existing technical evaluation system, facilitating application and comparison in practical engineering.
[0044] S105. The traditional equivalent salt density is corrected by using the metal conductivity contribution conversion factor and the traditional equivalent ash density is corrected by using the metal physical contribution correction factor. The equivalent equivalent salt density and equivalent equivalent ash density are calculated respectively. By correcting the traditional ESDD (Effective Electrostatic Discharge) method, the conductivity contribution of insoluble metal particles, which is often overlooked in traditional measurements, is taken into account, thus addressing the issue of low ESDD values. Similarly, by correcting the traditional NSDD (Non-Standardized Non-Standardized Discharge) method, the hygroscopic and water-retention properties and electric field distortion characteristics of metallic pollution, which distinguish it from ordinary inert ash, are taken into account, thus addressing the problem that traditional NSDD cannot reflect the specific physical hazards of metals. The resulting equivalent parameters can accurately and comprehensively reflect the overall hazard level of metallic pollution.
[0045] In some embodiments, the traditional equivalent salt density is corrected using a metal conductivity contribution reduction factor, and the traditional equivalent gray density is corrected using a metal physical contribution correction factor, to calculate the equivalent equivalent salt density and equivalent equivalent gray density, respectively. Specifically, this includes: The equivalent salt density is determined using the following formula: ESDD_eq=ESDD_0+K_C×
[0046] Where ESDD_eq is the equivalent salt density, ESDD_0 is the traditional equivalent salt density, and K_C is the metal conductivity contribution reduction factor. The surface density of the metal contaminant; The equivalent gray density is determined according to the following formula: NSDD_eq= ×NSDD_0 Wherein, NSDD_eq represents the equivalent gray density. The correction factor is contributed to the metal physics, and NSDD_0 is the traditional equivalent gray density.
[0047] S106. Evaluate the pollution level of insulators based on equivalent salt density and equivalent ash density.
[0048] Since the input equivalent parameters truly reflect the hazards of metal pollution, the pollution zone classification and level determination based on this can effectively avoid insufficient insulation configuration due to underestimation of risks, and provide a reliable decision-making basis for the safe and stable operation of the power grid in a high metal pollution environment.
[0049] In some embodiments, the pollution level of insulators is evaluated based on the equivalent equivalent salt density and the equivalent equivalent ash density, which specifically includes: When the equivalent equivalent salt density ≤ the first threshold, the pollution level is level a; When the first threshold < the equivalent equivalent salt density ≤ the second threshold, the pollution level is level b; When the second threshold < the equivalent equivalent salt density ≤ the third threshold, the pollution level is level c; When the equivalent equivalent salt density > the third threshold, the pollution level is level d; Wherein, when the equivalent equivalent ash density > the fourth threshold, on the basis of the above classification results, the pollution level is upgraded by one level.
[0050] Preferably, taking the equivalent equivalent salt density ESDD_eq and the equivalent equivalent ash density NSDD_eq as criteria, a new pollution level classification standard is established, specifically: When ESDD_eq ≤ 0.03 mg / cm², it is level a; When 0.03 mg / cm² < ESDD_eq ≤ 0.06 mg / cm², it is level b; When 0.06 mg / cm² < ESDD_eq ≤ 0.10 mg / cm², it is level c; When ESDD_eq > 0.10 mg / cm², it is level d; Wherein, when NSDD_eq > 1.0 mg / cm², the pollution level is automatically upgraded by one level, and the pollution severity of levels a, b, c, and d increases in turn.
[0051] This application also proposes a system for determining the pollution level of insulators containing metal components. The system includes: a data acquisition unit, a surface density calculation unit, a correction factor determination unit, an equivalent calculation unit, and a pollution level evaluation unit; A sample collection unit, configured to obtain the sampling area of the insulator pollution sample, the total mass of the insoluble substances in the insulator pollution sample, the mass fraction of each of the multiple metal elements in the insoluble substances, and the traditional equivalent salt density and the traditional equivalent ash density of the pollution sample; A surface density calculation unit, configured to calculate the metal pollution surface density according to the sampling area A of the insulator pollution sample, the insoluble substances in the insulator pollution sample, and the mass fraction of each of the multiple metal elements in the insoluble substances; A correction factor determination unit, configured to respectively determine the metal conductivity contribution conversion factor and the metal physical contribution correction factor based on the metal pollution surface density and the metal components; The equivalent calculation unit is used to determine the traditional equivalent salt density and traditional equivalent ash density of the polluted sample; the traditional equivalent salt density is corrected by the metal conductivity contribution conversion factor and the traditional equivalent ash density is corrected by the metal physical contribution correction factor, and the equivalent equivalent salt density and equivalent equivalent ash density are calculated respectively. The pollution level assessment unit is used to assess the pollution level of insulators based on equivalent salt density and equivalent ash density.
[0052] This application also proposes a readable storage medium storing a computer program, which, when executed by a processor, causes the processor to perform the following steps: Obtain the sampling area A of the insulator pollution sample, the total mass of insoluble matter in the insulator pollution sample, and the mass fraction of each of the various metal elements in the insoluble matter; The surface density of the metal pollution is calculated based on the sampling area A of the insulator pollution sample, the insoluble matter in the insulator pollution sample, and the mass fraction of each metal element in the insoluble matter. Based on the surface density of metal contamination and the metal composition, the conversion factor for the metal's electrical conductivity contribution and the correction factor for the metal's physical contribution are determined respectively. Traditional equivalent salt density and traditional equivalent ash density were obtained from insulator contamination samples; The traditional equivalent salt density is corrected by using the metal conductivity contribution conversion factor, and the traditional equivalent ash density is corrected by using the metal physical contribution correction factor. The equivalent equivalent salt density and equivalent equivalent ash density are calculated respectively. The pollution level of insulators is assessed based on equivalent salt density and equivalent ash density.
[0053] This application also proposes a computer device, including a memory and a processor, wherein the memory stores a computer program, and the computer program is executed by the processor in the following steps: Obtain the sampling area A of the insulator pollution sample, the total mass of insoluble matter in the insulator pollution sample, and the mass fraction of each of the various metal elements in the insoluble matter; The surface density of the metal pollution is calculated based on the sampling area A of the insulator pollution sample, the insoluble matter in the insulator pollution sample, and the mass fraction of each metal element in the insoluble matter. Based on the surface density of metal contamination and the metal composition, the conversion factor for the metal's electrical conductivity contribution and the correction factor for the metal's physical contribution are determined respectively. Traditional equivalent salt density and traditional equivalent ash density were obtained from insulator contamination samples; The traditional equivalent salt density is corrected by using the metal conductivity contribution conversion factor, and the traditional equivalent ash density is corrected by using the metal physical contribution correction factor. The equivalent equivalent salt density and equivalent equivalent ash density are calculated respectively. The pollution level of insulators is assessed based on equivalent salt density and equivalent ash density.
[0054] Those skilled in the art will understand that implementing all or part of the processes in the above embodiments can be accomplished by instructing related hardware through a computer program. The program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), Rambus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.
[0055] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0056] The embodiments described above are merely illustrative of several implementation methods of this application, and their descriptions are relatively specific and detailed. However, they should not be construed as limiting the scope of this application's patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. The embodiments disclosed above are merely preferred embodiments of the present invention and should not be construed as limiting the scope of the present invention. Therefore, equivalent variations made according to the claims of this invention are still within the scope of this invention.
Claims
1. A method for determining the pollution level of an insulator containing metallic components, characterized in that, The method includes: Obtain the sampling area A of the insulator pollution sample, the total mass of insoluble matter in the insulator pollution sample, and the mass fraction of each of the various metal elements in the insoluble matter; The surface density of the metal contamination is calculated based on the sampling area A of the contaminated insulator sample, the insoluble matter in the contaminated insulator sample, and the mass fraction of each of the various metal elements in the insoluble matter. Based on the aforementioned metal contamination surface density and metal composition, the metal conductivity contribution reduction factor and the metal physical contribution correction factor are determined respectively. Obtain the conventional equivalent salt density and conventional equivalent ash density of the insulator contamination sample; The traditional equivalent salt density is corrected by using the metal conductivity contribution conversion factor, and the traditional equivalent gray density is corrected by using the metal physical contribution correction factor, and the equivalent equivalent salt density and equivalent equivalent gray density are calculated respectively. The pollution level of insulators is assessed based on the equivalent salt density and equivalent ash density.
2. The method for determining the pollution level of an insulator containing metallic components according to claim 1, characterized in that, Obtaining the mass fraction of each of the various metal elements in the insoluble matter specifically includes: The types and mass fractions of metal elements in the insoluble matter of the insulator contamination sample were determined by elemental composition analysis; the metal elements included at least Fe, Al, Cu, Zn, Mg, Ca, Na, and K.
3. The method for determining the pollution level of an insulator containing metallic components according to claim 2, characterized in that, The calculation of the metallic pollution surface density based on the sampling area A of the insulator pollution sample, the insoluble matter in the insulator pollution sample, and the mass fraction of each of the various metallic elements in the insoluble matter specifically includes: The surface density of metallic contaminants can be determined using the following formula: Where, m 不溶物 ω is the total mass of insoluble matter in the contaminated insulator sample. i Let A be the mass fraction of the i-th metallic element in the insoluble matter, and A be the sampling area. is the surface density of the metal contaminant.
4. The method for determining the pollution level of an insulator containing metallic components according to claim 3, characterized in that, The determination of the metal conductivity contribution reduction factor and the metal physical contribution correction factor based on the metal contamination surface density and metal composition specifically includes: The conversion factor for the electrical conductivity contribution of metals is determined using the following formula: Where K_C is the conversion factor for the metallic conductivity contribution, and α i Let be the intrinsic conductivity factor of the i-th metallic element, ESDD NaCl For equivalent NaCl salt density, Let β be the surface density of the i-th metallic element. i γ is the speciation factor of the i-th metallic element, representing the ratio of the relative conductivity of a specific speciation of the metallic element to that of a conductive pure metal. i Let be the particle size influence factor of the i-th metallic element. Let represent the percentage of the mass of the i-th metallic element relative to the total mass of all metallic elements; The correction factor for the physical contribution of the metal is determined using the following formula: in, The correction factor contributes to metal physics, where λ is the metal-gray density coupling coefficient determined experimentally, and NSDD_0 is the traditional equivalent gray density. is the surface density of the metal contaminant.
5. The method for determining the pollution level of an insulator containing metallic components according to claim 4, characterized in that, The process of correcting the traditional equivalent salt density using the metal conductivity contribution reduction factor and correcting the traditional equivalent gray density using the metal physical contribution correction factor, and calculating the equivalent equivalent salt density and equivalent equivalent gray density respectively, specifically includes: The equivalent salt density is determined using the following formula: ESDD_eq=ESDD_0+K_C× Where ESDD_eq is the equivalent salt density, ESDD_0 is the traditional equivalent salt density, and K_C is the metal conductivity contribution reduction factor. The surface density of the metal contaminant; The equivalent gray density is determined according to the following formula: NSDD_eq= ×NSDD_0 Wherein, NSDD_eq represents the equivalent gray density. The correction factor is contributed to the metal physics, and NSDD_0 is the traditional equivalent gray density.
6. The method for determining the pollution level of an insulator containing metallic components according to claim 5, characterized in that, The assessment of insulator pollution levels based on the equivalent salt density and equivalent ash density specifically includes: When the equivalent salt density is less than or equal to the first threshold, the contamination level is grade a; When the first threshold < the equivalent salt density ≤ the second threshold, the contamination level is b. When the second threshold < the equivalent salt density ≤ the third threshold, the filth level is level c; When the equivalent salt density is greater than the third threshold, the contamination level is d. Specifically, when the equivalent gray density is greater than the fourth threshold, the pollution level is raised by one level based on the above classification results.
7. The method for determining the pollution level of an insulator containing metallic components according to claim 3, characterized in that, After calculating the surface density of metallic contaminants, the following steps are also included: correcting for the uneven distribution of metallic contaminants on the insulator surface. The distribution characteristics of metallic fouling were determined by water flushing experiments, and the distribution correction factor δ was determined accordingly. Calculate the corrected metallic fouling surface density ρ'_M using the following formula, and replace the metallic fouling surface density ρ_M with the corrected metallic fouling surface density ρ'_M: ρ'_M=ρ_M×δ Where ρ'_M is the corrected surface density of metal contamination, ρ_M is the surface density of metal contamination, and δ is the distribution correction factor, which is 1 when the metal contamination is uniformly distributed.
8. A pollution level determination system for insulators containing metallic components, characterized in that, The system includes: a data acquisition unit, a surface density calculation unit, a correction coefficient determination unit, an equivalent calculation unit, and a pollution level assessment unit; The sample collection unit is used to obtain the sampling area of the insulator pollution sample, the total mass of insoluble matter in the insulator pollution sample, the mass fraction of each of the various metal elements in the insoluble matter, and the traditional equivalent salt density and traditional equivalent ash density of the pollution sample. The areal density calculation unit is used to calculate the metal pollution areal density based on the sampling area A of the insulator pollution sample, the insoluble matter in the insulator pollution sample, and the mass fraction of each of the various metal elements in the insoluble matter. The correction coefficient determination unit is used to determine the metal conductivity contribution conversion coefficient and the metal physical contribution correction coefficient based on the metal contamination surface density and metal composition, respectively. The equivalent calculation unit is used to determine the traditional equivalent salt density and traditional equivalent ash density of the contaminated sample; the traditional equivalent salt density is corrected by the metal conductivity contribution conversion factor, and the traditional equivalent ash density is corrected by the metal physical contribution correction factor, and the equivalent equivalent salt density and equivalent ash density are calculated respectively. The pollution level assessment unit is used to assess the pollution level of the insulator based on the equivalent salt density and equivalent ash density.
9. A readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, the processor performs the steps of the method as described in any one of claims 1 to 7.
10. A computer device, comprising a memory and a processor, characterized in that, The memory stores a computer program that, when executed by the processor, causes the processor to perform the steps of the method as described in any one of claims 1 to 7.