Thermal test temperature control method, system, and device for satellite internal equipment

Abstract

This invention provides a method, system, and device for controlling the thermal test temperature of satellite internal equipment. During satellite thermal testing, the temperature values ​​of each internal device are acquired by thermistors. Based on a relay feedback self-tuning algorithm and current and power models of each heater, control parameters of the thermal test temperature control system with a PID controller are obtained. Based on these control parameters, the temperature value of each device is compared with its corresponding preset target temperature value to obtain the temperature deviation value of each device. Based on the PID controller, the current control increment corresponding to each temperature deviation value is obtained. The control current value of each device in the previous control cycle is acquired. The control current value of each device in the previous cycle is added to its corresponding current control increment to obtain the heating current corresponding to each device. The heaters corresponding to each device are controlled to heat the equipment according to the corresponding heating current, reducing the satellite development cycle and cost, and achieving precise temperature control.

Description

Technical Field

[0001] This invention relates to the field of satellite thermal vacuum testing technology, and in particular to a method, system, and device for controlling the thermal testing temperature of satellite internal equipment. Background Technology

[0002] As a satellite orbits, its position and orientation relative to the Sun and Earth are constantly changing. Therefore, the solar radiation, terrestrial radiation, and terrestrial albedo received by different parts of the satellite's outer surface also vary; that is, the external heat flow reaching the satellite's surface changes continuously as the satellite orbits. For these reasons, it is necessary to use satellite external heat flow simulation methods to conduct satellite thermal vacuum experiments to simulate the highest and lowest temperatures of the satellite's internal equipment (which can also be considered instruments), as well as instantaneous temperature changes.

[0003] During the thermal vacuum test, a large number of thermocouples are attached to the internal equipment during the final assembly stage to adjust the temperature of the equipment. After the thermal test, the satellite is sent back to the final assembly for thermal modification to remove the thermocouples from the internal equipment. This process increases the satellite's development cycle and cost. Summary of the Invention

[0004] This invention provides a method, system, and device for controlling the thermal testing temperature of satellite internal equipment, in order to solve the technical problems of high development cycle and high development cost of satellites in the prior art.

[0005] On one hand, the present invention provides a method for controlling the thermal test temperature of satellite internal equipment, wherein each of the equipment is equipped with a corresponding heater and each of the equipment is equipped with a corresponding thermistor, and the method includes:

[0006] During the satellite thermal test, the temperature values ​​of each device inside the satellite collected by each of the aforementioned thermistors were obtained.

[0007] Based on the relay feedback self-tuning algorithm and the current and power models of each heater, the control parameters of the thermal test temperature control system to which the PID controller belongs are obtained.

[0008] Based on the control parameters, the temperature value of each device is compared with its corresponding preset target temperature value to obtain the temperature deviation value of each device;

[0009] Based on the PID controller, the current control increment corresponding to each temperature deviation value is obtained;

[0010] Obtain the control current value of each device in the previous control cycle;

[0011] Add the control current value of each device in the previous cycle to its corresponding current control increment to obtain the heating current of each device;

[0012] Control the heaters corresponding to each device to heat the device according to the corresponding heating current.

[0013] According to the present invention, a method for controlling the temperature of a satellite's internal equipment during a thermal test includes, in the step of acquiring the temperature values ​​of each device inside the satellite collected by each thermistor during the satellite thermal test, the method comprises:

[0014] Receive telemetry data published to the Kafka bus by the satellite integrated test system; wherein the telemetry data includes temperature values ​​collected by the thermistors corresponding to each device, and the format of the telemetry data is unsigned binary format;

[0015] Generate a JSON formatted data message from the telemetry data;

[0016] The data message is decoded to obtain the temperature values ​​of various devices inside the satellite.

[0017] According to the present invention, a method for controlling the thermal test temperature of satellite internal equipment, based on a relay feedback self-tuning algorithm and current and power models of each heater, obtains the control parameters of the thermal test temperature control system to which the PID controller belongs, including:

[0018] Set the upper and lower power limits for the heater;

[0019] Turn on the programmable power supply, apply an upper and lower power limit to the heater, and measure the oscillation frequency and gain of the thermal test temperature control system to which the PID controller belongs;

[0020] Determine whether the thermal test temperature control system generates critical oscillation;

[0021] If so, the control parameters of the thermal test temperature control system can be obtained based on the critical oscillation formula.

[0022] According to the thermal test temperature control method for satellite internal equipment provided by the present invention, if no critical oscillation occurs, the method returns to the step of applying an upper and lower power limit to the heater and measuring the oscillation frequency and gain of the thermal test temperature control system to which the PID controller belongs.

[0023] According to a method for controlling the thermal test temperature of satellite internal equipment provided by the present invention, the thermal test temperature control system is divided into multiple control zones;

[0024] Each of the control areas includes a programmable power supply, a heater circuit, and several thermistors for monitoring temperature;

[0025] Each of the aforementioned control areas can control its corresponding device.

[0026] According to the present invention, a method for controlling the thermal test temperature of satellite internal equipment, wherein obtaining the current control increment corresponding to each temperature deviation value based on a PID controller includes:

[0027] Based on the PID controller, PID calculations are performed on each temperature deviation value to obtain the corresponding current control increment.

[0028] A method for controlling the thermal testing temperature of satellite internal equipment according to the present invention further includes:

[0029] Based on the temperature deviation value of each device, the temperature change rate of each device is adjusted.

[0030] According to the present invention, a method for controlling the temperature of thermal tests on satellite internal equipment is provided, wherein the heater is an infrared cage or an infrared lamp array.

[0031] On the other hand, the present invention also provides a thermal testing temperature control system for satellite internal equipment, wherein each of the aforementioned devices is equipped with a corresponding heater, and each of the aforementioned devices is equipped with a corresponding thermistor, the system comprising:

[0032] The on-board telemetry data decoding module is used to acquire the temperature values ​​of various devices inside the satellite collected by the thermistors during the satellite thermal test.

[0033] The parameter self-tuning module is used to obtain the PID control parameters of the PID controller based on the relay feedback self-tuning algorithm and the current and power models of each heater.

[0034] A closed-loop temperature control module is used to compare the temperature value of each device with its corresponding preset target temperature value based on PID control parameters, and obtain the temperature deviation value of each device.

[0035] Based on the PID controller, the current control increment corresponding to each temperature deviation value is obtained;

[0036] Obtain the control current value of each device in the previous control cycle;

[0037] Add the control current value of each device in the previous cycle to its corresponding current control increment to obtain the heating current of each device;

[0038] Control the heaters corresponding to each device to heat the device according to the corresponding heating current.

[0039] On the other hand, the present invention also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the thermal test temperature control method for any of the satellite internal devices described above.

[0040] The present invention provides a method, system, and device for controlling the temperature of satellite internal equipment during thermal testing. This method acquires the temperature values ​​of each device inside the satellite collected by thermistors during thermal testing. Based on a relay feedback self-tuning algorithm and the current and power models of each heater, it obtains the control parameters of the thermal testing temperature control system to which the PID controller belongs. Based on the control parameters, it compares the temperature value of each device with its corresponding preset target temperature value to obtain the temperature deviation value of each device. Based on the PID controller, it obtains the current control increment corresponding to each temperature deviation value. It acquires the control current value of each device in the previous control cycle. It adds the control current value of each device in the previous cycle to its corresponding current control increment to obtain the heating current corresponding to each device. It controls the heaters corresponding to each device to heat the device according to the corresponding heating current. This achieves automatic temperature control of the satellite internal equipment during thermal testing using only telemetry data collected by the onboard thermistors, without the need for attaching or removing thermocouple temperature sensors or manually adjusting external heat flow. This reduces the satellite's development cycle and cost. Furthermore, by using a relay feedback self-tuning algorithm and a PID controller, it achieves precise temperature control of the satellite's internal equipment, ensuring that the equipment temperature can quickly and accurately reach the preset target, reducing overshoot and oscillation. Attached Figure Description

[0041] To more clearly illustrate the technical solutions in this invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0042] Figure 1 This is a flowchart illustrating the thermal testing temperature control method for satellite internal equipment provided in an embodiment of the present invention.

[0043] Figure 2 This is a schematic diagram of the process for obtaining the temperature values ​​of various devices inside a satellite, provided in an embodiment of the present invention.

[0044] Figure 3 This is a schematic diagram of the thermal testing temperature control system for satellite internal equipment provided in an embodiment of the present invention;

[0045] Figure 4 This is a schematic diagram of the structure of the electronic device provided in an embodiment of the present invention. Detailed Implementation

[0046] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0047] Figure 1 This is a flowchart illustrating a method for controlling the thermal test temperature of satellite internal equipment according to an embodiment of the present invention. Each device can be equipped with a corresponding heater, and each device can be equipped with a corresponding thermistor. The heater and thermistor can have a one-to-one correspondence with the device. The execution entity of this method can be a computer, an automated control system, or a microcontroller unit, etc. The automated control system can be a PLC (Programmable Logic Controller) or a DCS (Distributed Control System), etc.

[0048] See Figure 1 The thermal testing temperature control method for satellite internal equipment may include the following steps.

[0049] 101. During the satellite thermal test, the temperature values ​​of each device inside the satellite collected by each thermistor are obtained.

[0050] In this step, the temperature values ​​of various internal satellite devices collected by each thermistor during the satellite thermal test are obtained, including:

[0051] Receive telemetry data published to the Kafka bus by the satellite integrated test system; the telemetry data includes temperature values ​​collected by the thermistors of each device, and the telemetry data is in unsigned binary format;

[0052] Generate JSON formatted data messages from telemetry data;

[0053] The data message is decoded to obtain the temperature values ​​of various devices inside the satellite.

[0054] This step utilizes a Kafka message "producer-consumer" interaction model to obtain the device temperature values. Specifically, the message content is transmitted as a structure with a message header and body, and published to the Kafka bus. Message production: After receiving telemetry data from the satellite, a JSON-formatted message is generated according to the message protocol. This message is then published to the satellite thermal testing system via the Kafka telemetry parameter topic assigned to the telemetry frontend, awaiting consumption by the thermal testing system's preprocessing service. Message consumption: The satellite thermal testing system processes the message according to the message topic. The original code of this telemetry message is unsigned binary data. Temperature values ​​of various devices within the satellite are obtained through decoding. Generally, based on the satellite name, master control code, and parameter code, and following a certain decoding cycle, the onboard thermistor temperature values ​​can be obtained and stored in the database according to a specified format.

[0055] By receiving telemetry data, generating JSON-formatted data messages, and decoding them, the system achieves efficient processing and transmission of telemetry data, ensuring accurate acquisition and real-time updates of temperature data, and supporting rapid-response temperature control.

[0056] This step can also be referred to. Figure 2 The satellite integrated test system publishes messages (telemetry data) to the Kafka bus, receives messages on the Kafka bus through the corresponding interface protocol, obtains the original code of the telemetry message, and then decodes it through the decoder to obtain the temperature value of the on-board thermistor.

[0057] 102. Based on the relay feedback self-tuning algorithm and the current and power models of each heater, the control parameters of the thermal test temperature control system to which the PID controller belongs are obtained.

[0058] In this step, based on the relay feedback self-tuning algorithm and the current and power models of each heater, the control parameters of the thermal test temperature control system to which the PID controller belongs are obtained, including:

[0059] Set the upper and lower power limits for the heater;

[0060] Turn on the programmable power supply, apply the upper and lower power limits to the heater, and measure the oscillation frequency and gain of the thermal test temperature control system to which the PID controller belongs;

[0061] Determine whether the temperature control system of the thermal test generates critical oscillation;

[0062] If so, the control parameters of the thermal test temperature control system can be obtained based on the critical oscillation formula.

[0063] This step utilizes the critical oscillation method. In this method, the proportional gain (Kp) of the PID controller is adjusted to bring the system to a critical oscillation state. Once the system reaches this state, the control parameters of the PID controller can be calculated. These parameters typically include the proportional gain (Kp), integral gain (Ki), and derivative gain (Kd). By setting the upper and lower power limits of the heater, the oscillation frequency and gain of the system are measured, and the control parameters are obtained based on the critical oscillation formula. This achieves self-tuning of the control system, optimizes the PID controller's control parameters, and improves the performance and stability of the control system. Generally, the system's control parameters can be obtained by oscillating the onboard equipment temperature within two cycles above and below the preset target temperature.

[0064] 103. Based on the control parameters, compare the temperature value of each device with its corresponding preset target temperature value to obtain the temperature deviation value of each device.

[0065] In this step, the difference between the temperature value of each device and its corresponding preset target temperature value can be calculated as the temperature deviation value of each device.

[0066] 104. Based on the PID controller, obtain the current control increment corresponding to each temperature deviation value.

[0067] In this step, based on the PID controller, the current control increment corresponding to each temperature deviation value is obtained, including:

[0068] Based on the PID controller, PID calculations are performed on each temperature deviation value to obtain the corresponding current control increment.

[0069] 105. Obtain the control current value of each device in the previous control cycle.

[0070] In this step, at the end of each control cycle, the current control current value can be recorded and stored, typically in an external database system or a built-in storage module. At the start of the next control cycle, the control system reads the control current value from the previous cycle.

[0071] 106. Add the control current value of each device in the previous cycle to its corresponding current control increment to obtain the heating current of each device.

[0072] 107. Control the heaters corresponding to each piece of equipment to heat the equipment according to the corresponding heating current.

[0073] In this embodiment, during the satellite thermal test, the temperature values ​​of each device inside the satellite are acquired by each thermistor; based on the relay feedback self-tuning algorithm and the current and power models of each heater, the control parameters of the thermal test temperature control system to which the PID controller belongs are obtained; based on the control parameters, the temperature value of each device is compared with its corresponding preset target temperature value to obtain the temperature deviation value of each device; based on the PID controller, the current control increment corresponding to each temperature deviation value is obtained; the control current value of each device in the previous control cycle is acquired; the control current value of each device in the previous cycle is added to its corresponding current control increment to obtain the heating value corresponding to each device. The system controls the heaters of each device to heat the equipment according to the corresponding heating current. This enables automatic temperature control of the equipment inside the satellite during thermal tests, without the need to attach or remove thermocouple temperature sensors or manually adjust the external heat flow. The system can achieve automatic temperature control of the equipment only by telemetry data collected by the onboard thermistors, reducing the satellite's development cycle and cost. Furthermore, by using a relay feedback self-tuning algorithm and a PID controller, the system achieves precise temperature control of the equipment inside the satellite (the temperature after equipment adjustment differs from the corresponding preset target temperature value by less than 0.5℃), ensuring that the equipment temperature can quickly and accurately reach the preset target, reducing overshoot and oscillation.

[0074] In one embodiment of this specification, if no critical oscillation occurs, the process returns to the steps of applying an upper and lower power limit to the heater and measuring the oscillation frequency and gain of the thermal test temperature control system to which the PID controller belongs.

[0075] In this embodiment, if no critical oscillation occurs, the process returns to the step of applying an upper and lower power limit to the heater to ensure dynamic adjustment and stability of the system. This method ensures that the control system can maintain stability and response speed under different conditions. Alternatively, if no critical oscillation occurs, the process can also return to the step of setting the upper and lower power limits of the heater; that is, critical oscillation can be generated by adjusting the upper and lower power limits. In addition, preset control parameters can be used.

[0076] In one embodiment of this specification, the thermal test temperature control system is divided into multiple control zones;

[0077] Each control zone includes a programmable power supply, a heater circuit, and several thermistors for monitoring temperature;

[0078] Each control zone can control its corresponding equipment.

[0079] In this embodiment, by dividing the control system into multiple control zones, each containing a programmable power supply, a heater circuit, and a thermistor, independent control of multiple zones is achieved, improving the flexibility and efficiency of the control system and allowing precise control of different zones, that is, allowing independent and precise control of different devices.

[0080] In one embodiment of this specification, the thermal testing temperature control method for satellite internal equipment further includes:

[0081] Based on the temperature deviation of each device, adjust the rate of temperature change of each device.

[0082] In this embodiment, the temperature change rate of the device is adjusted based on the temperature deviation value of the device to achieve more precise temperature control. This method allows the system to dynamically adjust the temperature change rate according to real-time data, thereby improving control accuracy.

[0083] The control system calculates the rate of temperature change for each device based on the temperature deviation. For example, if the temperature deviation is large, the control system may decide to accelerate the rate of temperature change to quickly approach the target temperature. Based on the calculated rate of temperature change, the control system adjusts the heating current of each device, which can be achieved by changing the output of the PID controller, specifically by adjusting the power output of the heater. If the temperature deviation of a device is large, the control system may increase the heating current of that device to accelerate the rate of temperature rise. Conversely, if the temperature deviation is small or the device is close to the target temperature, the control system may reduce the heating current to avoid overshoot and oscillation.

[0084] In one embodiment of this specification, the heater is an infrared cage or an infrared lamp array.

[0085] In this embodiment, an infrared cage or infrared lamp array is used as the heater, providing a highly efficient heating solution. This design ensures that the heater can respond quickly to control signals, achieving precise temperature control.

[0086] Based on the same general inventive concept, this invention also protects a thermal testing temperature control system for satellite internal equipment, such as... Figure 3 As shown, Figure 3 This is a schematic diagram of the thermal testing temperature control system for satellite internal equipment provided in an embodiment of the present invention. The thermal testing temperature control system for satellite internal equipment provided by the present invention is described below, and the thermal testing temperature control system described below can be referred to in correspondence with the thermal testing temperature control method for satellite internal equipment described above.

[0087] The thermal test temperature control system for the satellite's internal equipment includes an onboard telemetry data decoding module 301, a parameter self-tuning module 302, and a closed-loop temperature control module 303.

[0088] The on-board telemetry data decoding module 301 is used to acquire the temperature values ​​of each device inside the satellite collected by each of the thermistors during the satellite thermal test.

[0089] The parameter self-tuning module 302 is used to obtain the PID control parameters of the PID controller based on the relay feedback self-tuning algorithm and the current and power models of each heater.

[0090] The closed-loop temperature control module 303 is used to compare the temperature value of each device with its corresponding preset target temperature value based on PID control parameters, and obtain the temperature deviation value of each device.

[0091] Based on the PID controller, the current control increment corresponding to each temperature deviation value is obtained;

[0092] Obtain the control current value of each device in the previous control cycle;

[0093] Add the control current value of each device in the previous cycle to its corresponding current control increment to obtain the heating current of each device;

[0094] Control the heaters corresponding to each device to heat the device according to the corresponding heating current.

[0095] Figure 4 This is a schematic diagram of the structure of the electronic device provided in an embodiment of the present invention.

[0096] like Figure 4 As shown, the electronic device may include a processor 410, a communications interface 420, a memory 430, and a communication bus 440. The processor 410, communications interface 420, and memory 430 communicate with each other via the communication bus 440. The processor 410 can call logical instructions from the memory 430 to execute thermal testing temperature control methods for the satellite's internal equipment.

[0097] Furthermore, the logical instructions in the aforementioned memory 430 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, essentially, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0098] On the other hand, the present invention also provides a computer program product, which includes a computer program that can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer is able to execute the thermal test temperature control method for satellite internal equipment provided by the above methods.

[0099] In another aspect, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the thermal test temperature control method for satellite internal equipment provided by the methods described above.

[0100] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without any creative effort.

[0101] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in the various embodiments or some parts of the embodiments.

[0102] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for controlling the thermal testing temperature of satellite internal equipment, characterized in that, Each of the aforementioned devices is equipped with a corresponding heater, and each of the aforementioned devices is equipped with a corresponding thermistor. The method includes: During the satellite thermal test, the temperature values ​​of each device inside the satellite collected by each of the aforementioned thermistors were obtained. Based on the relay feedback self-tuning algorithm and the current and power models of each heater, the control parameters of the thermal test temperature control system to which the PID controller belongs are obtained. Based on the control parameters, the temperature value of each device is compared with its corresponding preset target temperature value to obtain the temperature deviation value of each device; Based on the PID controller, the current control increment corresponding to each temperature deviation value is obtained; Obtain the control current value of each device in the previous control cycle; Add the control current value of each device in the previous cycle to its corresponding current control increment to obtain the heating current of each device; Control the heaters corresponding to each device to heat the device according to the corresponding heating current.

2. The method for controlling the thermal test temperature of satellite internal equipment according to claim 1, characterized in that, During the satellite thermal test, the temperature values ​​of each device inside the satellite collected by each thermistor include: Receive telemetry data published to the Kafka bus by the satellite integrated test system; wherein the telemetry data includes temperature values ​​collected by the thermistors corresponding to each device, and the format of the telemetry data is unsigned binary format; Generate a JSON formatted data message from the telemetry data; The data message is decoded to obtain the temperature values ​​of various devices inside the satellite.

3. The method for controlling the thermal test temperature of satellite internal equipment according to claim 1, characterized in that, Based on the relay feedback self-tuning algorithm and the current and power models of each heater, the control parameters of the thermal test temperature control system to which the PID controller belongs are obtained, including: Set the upper and lower power limits for the heater; Turn on the programmable power supply, apply an upper and lower power limit to the heater, and measure the oscillation frequency and gain of the thermal test temperature control system to which the PID controller belongs; Determine whether the thermal test temperature control system generates critical oscillation; If so, the control parameters of the thermal test temperature control system can be obtained based on the critical oscillation formula.

4. The method for controlling the thermal test temperature of satellite internal equipment according to claim 3, characterized in that, If no critical oscillation occurs, return to the steps of applying an upper and lower power limit to the heater and measuring the oscillation frequency and gain of the thermal test temperature control system to which the PID controller belongs.

5. The method for controlling the thermal test temperature of satellite internal equipment according to claim 1, characterized in that, The thermal test temperature control system is divided into multiple control zones; Each of the control areas includes a programmable power supply, a heater circuit, and several thermistors for monitoring temperature; Each of the aforementioned control areas can control its corresponding device.

6. The method for controlling the thermal test temperature of satellite internal equipment according to claim 1, characterized in that, The process of obtaining the current control increment corresponding to each temperature deviation value based on the PID controller includes: Based on the PID controller, PID calculations are performed on each temperature deviation value to obtain the corresponding current control increment.

7. The method for controlling the thermal test temperature of satellite internal equipment according to claim 1, characterized in that, Also includes: Based on the temperature deviation value of each device, the temperature change rate of each device is adjusted.

8. The method for controlling the thermal test temperature of satellite internal equipment according to claim 1, characterized in that, The heater is an infrared cage or an infrared lamp array.

9. A thermal testing temperature control system for satellite internal equipment, characterized in that, Each of the aforementioned devices is equipped with a corresponding heater, and each of the aforementioned devices is equipped with a corresponding thermistor. The system includes: The on-board telemetry data decoding module is used to acquire the temperature values ​​of various devices inside the satellite collected by the thermistors during the satellite thermal test. The parameter self-tuning module is used to obtain the PID control parameters of the PID controller based on the relay feedback self-tuning algorithm and the current and power models of each heater. A closed-loop temperature control module is used to compare the temperature value of each device with its corresponding preset target temperature value based on PID control parameters, and obtain the temperature deviation value of each device. Based on the PID controller, the current control increment corresponding to each temperature deviation value is obtained; Obtain the control current value of each device in the previous control cycle; Add the control current value of each device in the previous cycle to its corresponding current control increment to obtain the heating current of each device; Control the heaters corresponding to each device to heat the device according to the corresponding heating current.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the thermal test temperature control method for satellite internal equipment as described in any one of claims 1 to 8.

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