Analyzing apparatus, analyzing program, method, semiconductor device, and semiconductor wafer

By establishing an electromagnetic noise performance model of the sample and analyzing it using product characteristic values, the problem of time-consuming electromagnetic noise performance analysis in existing technologies is solved, achieving the effect of quickly determining the malfunction mechanism and reducing development time.

CN122139129APending Publication Date: 2026-06-02DENSO CORP
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
DENSO CORP
Filing Date
2024-07-08
Publication Date
2026-06-02

AI Technical Summary

Technical Problem

Existing technologies make it difficult to quickly analyze the electromagnetic noise performance of electrical or electronic products, resulting in a significant time commitment to determining the mechanism of malfunctions and an inability to effectively reduce development time.

Method used

By generating a model, the electromagnetic noise performance value of the sample is used as the target variable, and multiple product characteristic values ​​of the sample are used as explanatory variables. An analytical device and program are established to realize the analysis and prediction of electromagnetic noise performance.

Benefits of technology

It can quickly determine the cause of malfunctions in electromagnetic noise performance, reduce the time required for product analysis, and improve analysis efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention relates to an analysis apparatus (100) configured to perform analysis processing of the electromagnetic noise performance of a sample. The analysis apparatus (100) includes: a model generation unit (102) that generates a model that takes the noise performance value of the electromagnetic noise performance of a first sample (S1) as the target variable and multiple product characteristic values ​​of the first sample (S1) as explanatory variables; and a performance prediction unit (103) and a data output unit (104) that input multiple product characteristic values ​​of a second sample (S2) that are different from the multiple product characteristic values ​​of the first sample (S1) to the explanatory variables of the model, and output data related to the analysis of the electromagnetic noise performance of the second sample (S2) using the model.
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