Computing device, computing method, program, and machine learning model generation method
By using machine learning models, especially neural network models, and utilizing the list of d-values in the distribution diagram of X-ray powder diffraction, the problems of long calculation time and low accuracy of lattice volume and lattice constant in the prior art have been solved, and high-precision lattice volume inference and rapid lattice constant determination have been achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- RIGAKU CORP
- Filing Date
- 2025-12-01
- Publication Date
- 2026-06-05
AI Technical Summary
Existing techniques for inferring lattice volume and lattice constant from X-ray powder diffraction patterns suffer from long processing times and the inability to accurately calculate monoclinic or triclinic lattice constants.
By employing machine learning models, especially neural network models, and utilizing the list of d-values in the distribution diagram of X-ray powder diffraction, combined with crystal system information, the lattice volume is inferred, and the lattice volume is used to help determine the lattice constant, thereby shortening the computation time.
It enables high-precision deduction of lattice volume from X-ray powder diffraction patterns and accurate calculation of lattice constants in a short time. It is applicable to various crystal systems, especially monoclinic and triclinic lattices.
Smart Images

Figure CN122156925A_ABST