A space simulation environment variable-temperature light and heat performance testing device based on steady-state calorimetry

Abstract

This invention discloses a space-simulated environment variable-temperature photothermal performance testing device based on steady-state calorimetry: the outer layer of the experimental chamber is a vacuum chamber, and the inner layer is a cryogenic chamber, with gas communication between the vacuum chamber and the cryogenic chamber; before testing, the cryogenic chamber is cooled by a cooling device, and the interior of the experimental chamber is evacuated to a vacuum state by a suction device, so that the interior of the experimental chamber meets the testing environment. A sample installation and adjustment unit is used to install and fix the sample to be tested in the cryogenic chamber. A temperature control unit is used to change the temperature of the sample to be tested. A solar radiation simulation unit is used to simulate sunlight irradiation. When the sample to be tested reaches the preset temperature, the data processing unit records the corresponding vacuum level and the output power of the temperature control unit, and calculates the emissivity of the sample to be tested by combining parameters such as the temperature inside the cryogenic chamber and the radiative area of ​​the sample. This invention achieves continuous and simultaneous measurement of full-spectrum hemispherical infrared emissivity and solar absorptivity from 150K to 450K, with a large temperature range and high measurement accuracy.

Description

Technical Field

[0001] This invention belongs to the field of photothermal performance measurement technology, and in particular relates to a space simulation environment variable temperature photothermal performance testing device based on steady-state calorimetry. Background Technology

[0002] Spacecraft orbiting the Earth experience alternating temperature environments ranging from -100℃ to +100℃ during their operation. To ensure the normal operation of various structural components and instruments, it is necessary to adjust the thermal radiation properties of the object's surface to maintain a balance between energy absorption and radiation, thereby controlling the equilibrium temperature of the object's surface. The two most important parameters are emissivity and solar absorptivity. Emissivity is defined as the ratio of the total energy emitted into hemispherical space per unit time and per unit area of ​​the material surface at the same temperature to the total energy of blackbody radiation. Solar absorptivity is defined as the ratio of the solar radiation energy absorbed per unit time and per unit area of ​​the material surface at a given temperature to the total solar radiation energy projected onto the material surface.

[0003] Planck's law states that the blackbody radiation curve exhibits a redshift at low temperatures, and the radiation peak tends to flatten, indicating that blackbody radiation energy is uniformly distributed over a wider wavelength range. Under these conditions, spectroscopic emissivity measurement devices often struggle to accurately obtain the actual emissivity of materials at low temperatures, suffering from limitations such as insufficient test wavelength range and the need for band-specific detector selection. In contrast, emissivity measurement devices based on steady-state calorimetry can measure the emissivity of a full-spectrum hemispherical structure with a sufficiently wide temperature range, thus demonstrating unique advantages in the field of measuring the emissivity of materials under varying temperatures. Furthermore, in the field of solar absorptivity measurement, while indirect measurements based on integrating spheres are mainstream, their functionality is limited, often making it difficult to perform tests under varying temperature conditions.

[0004] Existing technology discloses a steady-state calorimeter-based hemispherical emissivity tester, which can test the hemispherical emissivity of materials under different temperature conditions, especially at low temperatures. However, this device has limited functionality, only capable of testing the temperature-dependent emissivity of materials and unable to measure the solar absorptivity of materials. Existing technology also discloses a system and method for testing the low-temperature hemispherical emissivity of materials. Based on steady-state calorimetry, this invention provides a system for continuously measuring the average hemispherical emissivity of materials from 10K to 300K. However, this testing device also suffers from limitations such as limited functionality and a limited testing range, failing to meet the testing requirements of the space environment for Earth-orbiting spacecraft. Summary of the Invention

[0005] The technical objective of this invention is to provide a space-simulated environment variable-temperature photothermal performance testing device based on steady-state calorimetry, so as to realize the infrared emissivity and solar absorptivity of the sample from 150K to 450K, with a large temperature measurement range and high measurement accuracy.

[0006] To solve the above problems, the technical solution of the present invention is as follows: A space-simulated environment variable temperature photothermal performance testing device based on steady-state calorimetry includes: a vacuum cryogenic unit, a sample mounting and adjustment unit, a temperature control unit, a sunlight simulation unit, and a data processing unit; The vacuum cryogenic unit includes an experimental chamber and a cooling device and a suction device connected to the experimental chamber. The experimental chamber adopts a double-layer cavity structure, with the outer layer being a vacuum cavity and the inner layer being a cryogenic cavity. The vacuum cavity and the cryogenic cavity are connected by gas. Before the test, the cryogenic cavity is cooled by the cooling device, and the interior of the experimental chamber is evacuated to a vacuum state by the suction device, so that the interior of the experimental chamber meets the test environment. The sample mounting and adjustment unit is configured to mount and fix the sample to be tested inside the low-temperature chamber; The temperature control unit is configured to change the temperature of the sample being tested and bring it to a preset temperature; The sunlight simulation unit is configured to simulate sunlight exposure, with the direction of the exposure facing the sample to be tested; The data processing unit is configured to record the corresponding vacuum level and the output power of the temperature control unit after the sample under test reaches the preset temperature, and calculate the emissivity of the sample under test by combining the temperature in the low temperature chamber and the radiation area of ​​the sample under test; then change the preset temperature and repeat the test until the emissivity test of the sample under test at all target temperature points is completed.

[0007] Specifically, the vacuum cavity includes a vacuum interface, an optical instrument interface, a sensor interface, and a cryogenic interface; The vacuum interface is connected to the suction device via a pipeline; The optical instrument interface is connected to the simulated sunlight unit via a flange and lens; The sensor interface is connected to the temperature control unit; The low-temperature interface is connected to the refrigeration unit.

[0008] The cryogenic cavity has a sandwich structure, with a cooling medium channel between the outer surface of the cryogenic cavity and the inner wall of the vacuum cavity. The inner surface of the cryogenic cavity is coated with an optical ultra-black material. The cooling medium channel is connected to the cryogenic interface, including a cooling medium inlet pipe for receiving cold air and a cooling medium outlet pipe for releasing gas.

[0009] Specifically, the suction device includes a mechanical pump, a molecular pump, and a vacuum gauge; the mechanical pump reduces the gas pressure level in the experimental chamber to below 10 Pa, and the molecular pump further reduces the gas pressure level in the experimental chamber to 10 Pa.-3 Below Pa, the vacuum gauge monitors the pressure level inside the experimental chamber in real time during the test.

[0010] Specifically, the refrigeration device includes a self-pressurized liquid nitrogen container and corrugated pipes. The self-pressurized liquid nitrogen container operates at a pressure of 0.05 MPa to 0.10 MPa.

[0011] The sample mounting and adjustment unit includes a hollow manual rotating platform and a sample suspension device.

[0012] Specifically, the temperature control unit includes a precision power supply, a thin-film heating element, a temperature controller, and a temperature sensor; A precision power supply is electrically connected to a thin-film heating element and is configured to heat the sample under test. The thin-film heating element is connected to the sample under test via vacuum grease; The temperature controller is electrically connected to the temperature sensor. The temperature sensor collects the temperature of the sample being tested and sends the collected signal to the temperature controller for monitoring. The precision power supply and temperature controller are also electrically connected to the data processing unit. The data processing unit adjusts the output of the precision power supply in real time according to the input of the temperature controller, thereby realizing real-time control of the sample temperature.

[0013] The temperature sensor includes at least 12 T-type thermocouples, of which at least 10 are distributed on the low-temperature cavity, 2 are located on the upper cover of the low-temperature cavity, 2 are located on the lower cover of the low-temperature cavity, 6 are located on the side wall of the low-temperature cavity, and the remaining 2 are located on the surface and bottom of the sample being tested, respectively.

[0014] Specifically, the simulated sunlight unit includes a xenon lamp light source; A xenon lamp light source includes a xenon lamp, a condenser, a reflector, a filter, and a lens; The xenon lamp serves as the light source in the optical path, the condenser lens acts as the focusing system, the reflector reflects the light back, the filter is used to match the AM0 solar spectrum, and the lens acts as the collimating objective.

[0015] More preferably, the simulated sunlight unit also includes an adjustable aperture, which is used to adjust the size and brightness of the light spot of the xenon lamp.

[0016] Because the present invention adopts the above technical solution, it has the following advantages and positive effects compared with the prior art: This invention provides a space-simulated environment variable-temperature photothermal performance testing device based on steady-state calorimetry. Through a suction device and a cooling device, a low-pressure and low-temperature testing environment is maintained within the experimental chamber. The temperature of the thin-film heating element is controlled by a sample temperature control unit. A data processing unit acquires the output power of a precision power supply, the output power of the simulated sunlight unit, and the measured temperature of the temperature sensor. This allows for the calculation of the infrared emissivity and solar absorptivity of the tested sample from 150K to 450K. This invention offers a wide temperature measurement range and high measurement accuracy. Attached Figure Description

[0017] Various other advantages and benefits will become apparent to those skilled in the art upon reading the following detailed description of preferred embodiments. The accompanying drawings are for illustrative purposes only and are not intended to limit the invention.

[0018] Figure 1 This is an overall structural diagram of a space simulation environment variable temperature photothermal performance testing device based on steady-state calorimetry according to the present invention. Figure 2 This is a schematic diagram of the internal structure of the vacuum cryogenic unit of the present invention; Figure 3 This is a schematic diagram of the internal structure of the solar simulation unit of the present invention.

[0019] Explanation of reference numerals in the attached figures 1: Vacuum cryogenic unit; 11: Vacuum chamber; 12: Cryogenic chamber; 13: Suction device; 14: Cooling device; 111: Vacuum interface; 112: Optical instrument interface; 113: Sensor interface; 114: Cryogenic interface; 2: Sample mounting and adjustment unit; 21: Hollow manual rotating platform; 22: Sample suspension device; 3: Temperature control unit; 31: Precision power supply; 32: Thin film heating element; 33: Temperature controller; 4: Sunlight simulation unit; 41: Xenon lamp light source; 411: Xenon lamp; 412: Condenser lens; 413: Reflector; 414: Filter; 415: Lens; 42: Adjustable aperture; 5: Data processing unit; 6: Flange. Detailed Implementation

[0020] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the specific implementation methods of the present invention will be described below with reference to the accompanying drawings. Obviously, the drawings described below are merely some embodiments of the present invention. For those skilled in the art, other drawings and other implementation methods can be obtained based on these drawings without any creative effort.

[0021] To keep the drawings concise, only the parts relevant to the invention are shown schematically in each figure, and they do not represent the actual structure of the product. Furthermore, for ease of understanding, in some figures, only one of components with the same structure or function is shown schematically, or only one is labeled. In this document, "one" can mean not only "only one" but also "more than one".

[0022] The following detailed description, in conjunction with the accompanying drawings and specific embodiments, provides a spatial simulation environment variable temperature photothermal performance testing device based on steady-state calorimetry. The advantages and features of the invention will become clearer from the following description and claims.

[0023] Example See Figures 1 to 3 This embodiment provides a space simulation environment variable temperature photothermal performance testing device based on steady-state calorimetry, which mainly consists of a vacuum low temperature unit 1, a sample installation and adjustment unit 2, a temperature control unit 3, a sunlight simulation unit 4, and a data processing unit 5.

[0024] Among them, see Figure 1 and Figure 2 In this embodiment, the vacuum cryogenic unit 1 provides a vacuum cryogenic environment for experimental testing. Specifically, it includes an experimental chamber and a cooling device 14 and a suction device 13 connected to the experimental chamber. The experimental chamber adopts a double-layer cavity structure, with an outer vacuum chamber 11 and an inner cryogenic chamber 12, and gas communication between the vacuum chamber 11 and the cryogenic chamber 12. Before testing, the cryogenic chamber 12 is cooled by the cooling device 14, and the interior of the experimental chamber is evacuated to a vacuum state by the suction device 13, ensuring that the interior of the experimental chamber meets the testing environment requirements.

[0025] Specifically, the vacuum chamber 11 includes a vacuum interface 111, an optical instrument interface 112, a sensor interface 113, and a cryogenic interface 114. In this embodiment, the vacuum interface 111 is located at the bottom of the vacuum chamber 11 and is connected to the suction device 13 via a pipeline. The optical instrument interface 112 is located on one side of the vacuum chamber 11 and is connected to the sunlight simulation unit 4 via a flange 6 and a lens. The sensor interface 113 is located at the top of the vacuum chamber 11 and is connected to the temperature control unit 3. The cryogenic interface 114 is also located on one side of the vacuum chamber 11 and is connected to the cooling device 14.

[0026] Furthermore, the cryogenic cavity 12 has a sandwich structure, with a cooling medium channel formed between the outer surface of the cryogenic cavity 12 and the inner wall of the vacuum cavity 11. The inner surface of the cryogenic cavity 12 is coated with an optical ultra-black material. The cooling medium channel is connected to the cryogenic interface 114, including a cooling medium inlet pipe for receiving cold gas and a cooling medium outlet pipe for releasing gas. An optical channel is provided on the side of this sandwich structure to ensure that the simulated sunlight generated by the sunlight simulation unit 4 can be projected onto the surface of the sample under test.

[0027] Specifically, the suction device 13 includes a mechanical pump, a molecular pump, and a vacuum gauge. The mechanical pump reduces the gas pressure level in the experimental chamber to below 10 Pa, and the molecular pump further reduces the gas pressure level in the experimental chamber to below 10 Pa. -3 Below Pa, the vacuum gauge monitors the pressure level inside the experimental chamber in real time during the test.

[0028] Specifically, the refrigeration device 14 includes a self-pressurized liquid nitrogen container and a corrugated pipe. The self-pressurized liquid nitrogen container operates at a pressure of 0.05 MPa to 0.10 MPa. The refrigeration device 14 is connected to the vacuum cryogenic unit 1 via the aforementioned corrugated pipe.

[0029] The sample mounting and adjustment unit 2 is used to mount and fix the sample to be tested, thereby fixing the sample to be tested within the low-temperature chamber 12. Specifically, the sample mounting and adjustment unit 2 includes a hollow manual rotating platform 21 and a sample suspension device 22. The hollow manual rotating platform 21 is positioned above the vacuum low-temperature unit 1, allowing the vacuum low-temperature unit 1 to rotate. The sample suspension device 22 extends through the top of the vacuum low-temperature unit 1 and into the low-temperature chamber 12. The temperature control unit 3 is used to change the temperature of the sample to be tested and bring it to a preset temperature. Specifically, the temperature control unit 3 includes a precision power supply 31, a thin-film heating element 32, a temperature controller 33, and a temperature sensor. The precision power supply 31 is electrically connected to the thin-film heating element 32 for heating the sample to be tested. The thin-film heating element 32 is connected to the sample to be tested via vacuum grease. The temperature controller 33 is electrically connected to the temperature sensor, which collects the sample temperature of the sample to be tested and transmits the collected signal to the temperature controller 33 for monitoring. The precision power supply 31 and the temperature controller 33 are both electrically connected to the data processing unit 5. The data processing unit 5 adjusts the output of the precision power supply 31 in real time according to the input of the temperature controller 33, thereby realizing real-time control of the sample temperature.

[0030] Furthermore, the temperature sensor includes at least 12 T-type thermocouples, of which at least 10 are distributed on the low-temperature cavity 12, 2 are located on the upper cover of the low-temperature cavity 12, 2 are located on the lower cover of the low-temperature cavity 12, 6 are located on the side wall of the low-temperature cavity 12, and the remaining 2 are located on the surface and bottom surface of the sample being measured, respectively.

[0031] See Figure 2 and Figure 3 In this embodiment, the sunlight simulation unit 4 is used to simulate sunlight irradiation, with the irradiation direction facing the sample to be tested. The light is directed along the optical channel to the sample. Specifically, the sunlight simulation unit includes a xenon lamp source 41 and an adjustable aperture 42. The xenon lamp source 41 includes a xenon lamp 411, a condenser lens 412, a reflector 413, a filter 414, and a lens 415. The xenon lamp 411 serves as the light source for the optical path. The condenser lens 412 focuses the light emitted by the xenon lamp 411. Then, the light is reflected back through the reflector 413. The filter 414 is used to match the AMO solar spectrum to filter the passing light. Finally, the lens 415 converts the divergent light into a parallel beam. The adjustable aperture 42 is located at the output end of the sunlight simulation unit 4 and is used to adjust the size and brightness of the light spot of the xenon lamp 411. When testing the solar absorptivity of the sample, simulated sunlight is projected onto the surface of the sample. The temperature of the sample is kept constant before and after being exposed to simulated sunlight. The data processing unit 5 processes and calculates the collected temperature of the sample, the temperature of the low-temperature cavity 12, the power of the precision power supply 31, the output power of the xenon lamp light source 41, and the incident angle, and finally obtains the solar absorptivity of the sample.

[0032] During testing, once the sample reaches the preset temperature, the data processing unit 5 records the corresponding vacuum level and the output power of the temperature control unit 3. Combined with parameters such as the temperature inside the cryogenic chamber 12 and the radiation area of ​​the sample, the emissivity of the sample is calculated. The preset temperature is then changed, and the test is repeated until the emissivity test of the sample at all target temperature points is completed.

[0033] The measurement principle of this embodiment is explained below: When the sample is placed inside the experimental chamber, the sample and the surrounding environment together form a heat exchange system, and only radiative heat exchange occurs between the sample surface and the inner wall of the vacuum chamber. Based on heat transfer theory, the relevant system heat transfer equations are established. Compensation for sample thermal radiation is achieved by applying external electric power or simulating sunlight. Given the sample temperature and other parameters, the emissivity and solar absorptivity of the material can be obtained by solving the heat balance equations according to the law of conservation of energy, satisfying the following formula: in, It is the Stefan-Boltzmann constant. ; Indicates the radiation area of ​​the sample being tested; Indicates the temperature of the sample being measured; This indicates the temperature of the vacuum cryogenic chamber 12. , , Indicates the applied electrical power, where The external electrical power applied to the sample under simulated sunlight. The external electrical power is the power applied to the sample when it is not exposed to simulated sunlight, and the temperature of the sample remains unchanged before and after being exposed to simulated sunlight. This represents the input power of the simulated sunlight; This represents the angle between the simulated sunlight and the normal direction of the sample surface.

[0034] To further illustrate this embodiment, the specific operation steps of this embodiment will now be described: First, the sample to be tested is connected to the thin film heating plate 32 using vacuum grease, and then thermocouples are installed on the surface of the sample to be tested and the ground respectively; the sample suspension device 22 is used to connect it to the manual rotating platform 21, and the whole thing is placed into the experimental chamber.

[0035] Then check and debug whether the vacuum cryogenic unit 1, sample installation and adjustment unit 2, temperature control unit 3, sunlight simulation unit 4 and data processing unit 5 of this embodiment are in normal working condition.

[0036] The experimental chamber was evacuated using suction device 13 to obtain the vacuum environment required for the test. First, a mechanical pump was used to reduce the gas pressure level in the experimental chamber to below 10 Pa, and then a molecular pump was used to further reduce the gas pressure level to 10 Pa. -3 Below Pa, the vacuum gauge can monitor the pressure level inside the test chamber of the device in real time during experimental testing.

[0037] Once the vacuum level in the experimental chamber reaches the required level, the refrigeration device 14 is turned on. The self-pressurized liquid nitrogen container is used to introduce the cooling medium liquid nitrogen through the corrugated pipe, the low temperature interface 114 and the cooling medium channel into the low temperature chamber 12 of the vacuum low temperature unit 1 for cooling in order to obtain the low temperature environment required for the test.

[0038] Once the test chamber reaches the low-temperature environment, the sample temperature control unit 3 and data processing unit 5 are activated. When the sample reaches the target set temperature, the corresponding vacuum level and the output power of the precision power supply 31 are recorded. Then, the emissivity of the sample is calculated by combining the temperature of the low-temperature chamber 12, the radiation area of ​​the sample, and other parameters. The set temperature is then changed, and the above recording and calculation operations are repeated until the emissivity test of the sample at all target temperature points is completed.

[0039] After the test is completed, turn off the sample temperature control unit 3, the sunlight simulation unit 4 and the data processing unit 5, stop the input of the cooling medium liquid nitrogen, and stop the vacuuming; after the test chamber is heated to room temperature, open the sample to be tested in this embodiment and take it out.

[0040] Furthermore, to improve calculation accuracy, heat leakage during the testing process also needs to be considered, including heat leakage from residual gas, heat leakage from heating wires, heat leakage from measurement leads, and radiative heat dissipation. This further eliminates errors in the testing system and improves testing accuracy. Based on this, the emissivity and solar absorptivity are further expressed as follows: In the formula, , , The heat loss generated during the testing process in this embodiment, = + + ; This is represented as heat leakage due to conduction from residual gas. , To adjust the coefficient, The pressure of the residual gas inside the testing device; This indicates heat conduction leakage in the heating wires and measuring leads. , For heating wires or measuring the thermal conductivity of leads, For heating wires or measuring the cross-sectional area of ​​leads, For heating wires or measuring lead length; This refers to the radiative heat dissipation from the heating wires and measuring leads. , To heat the wire or measure the emissivity of the lead, For heating wires or measuring the side surface area of ​​leads.

[0041] The embodiments of the present invention have been described in detail above with reference to the accompanying drawings, but the present invention is not limited to the above embodiments. Even if various changes are made to the present invention, if these changes fall within the scope of the claims of the present invention and their equivalents, they shall still fall within the protection scope of the present invention.

Claims

1. A space-simulated environment variable-temperature photothermal performance testing device based on steady-state calorimetry, characterized in that, include: Vacuum cryogenic unit, sample mounting and adjustment unit, temperature control unit, sunlight simulation unit and data processing unit; The vacuum cryogenic unit includes an experimental chamber and a cooling device and a suction device connected to the experimental chamber. The experimental chamber adopts a double-layer cavity structure, with an outer vacuum cavity and an inner cryogenic cavity, and the vacuum cavity and the cryogenic cavity are connected by gas. Before the test, the cryogenic cavity is cooled by the cooling device, and the interior of the experimental chamber is evacuated to a vacuum state by the suction device, so that the interior of the experimental chamber meets the test environment. The sample mounting and adjustment unit is configured to mount and fix the sample to be tested inside the low-temperature cavity; The temperature control unit is configured to change the temperature of the sample being tested and bring it to a preset temperature; The sunlight simulation unit is configured to simulate sunlight irradiation, with the irradiation direction facing the sample to be tested; The data processing unit is configured to record the corresponding vacuum level and the output power of the temperature control unit after the sample under test reaches the preset temperature, and calculate the emissivity of the sample under test by combining the temperature in the low temperature chamber and the radiation area of ​​the sample under test; then change the preset temperature and repeat the test until the emissivity test of the sample under test at all target temperature points is completed.

2. The space simulation environment variable temperature photothermal performance testing device based on steady-state calorimetry according to claim 1, characterized in that, The vacuum chamber includes a vacuum interface, an optical instrument interface, a sensor interface, and a cryogenic interface; The vacuum interface is connected to the suction device via a pipeline; The optical instrument interface is connected to the simulated sunlight unit via a flange and a lens; The sensor interface is connected to the temperature control unit; The low-temperature interface is connected to the refrigeration device.

3. The space simulation environment variable temperature photothermal performance testing device based on steady-state calorimetry according to claim 2, characterized in that, The low-temperature cavity has a sandwich structure, with a cooling medium channel between the outer surface of the low-temperature cavity and the inner wall of the vacuum cavity, and the inner surface of the low-temperature cavity is coated with an optical super black material. The cooling medium channel is connected to the low-temperature interface and includes a cooling medium inlet pipe for receiving cold air and a cooling medium outlet pipe for releasing gas.

4. The space simulation environment variable temperature photothermal performance testing device based on steady-state calorimetry according to claim 1, characterized in that, The suction device includes a mechanical pump, a molecular pump, and a vacuum gauge; the mechanical pump reduces the gas pressure level in the experimental chamber to below 10 Pa, and the molecular pump further reduces the gas pressure level in the experimental chamber to 10 Pa. -3 Below Pa, the vacuum gauge monitors the pressure level inside the experimental chamber in real time during the test.

5. The space simulation environment variable temperature photothermal performance testing device based on steady-state calorimetry according to claim 1, characterized in that, The refrigeration device includes a self-pressurized liquid nitrogen container and a corrugated pipe. The self-pressurized liquid nitrogen container operates at a pressure of 0.05 MPa to 0.10 MPa.

6. The space simulation environment variable temperature photothermal performance testing device based on steady-state calorimetry according to claim 1, characterized in that, The sample mounting and adjustment unit includes a hollow manual rotating platform and a sample suspension device.

7. The space simulation environment variable temperature photothermal performance testing device based on steady-state calorimetry according to claim 1, characterized in that, The temperature control unit includes a precision power supply, a thin-film heating element, a temperature controller, and a temperature sensor; The precision power supply is electrically connected to the thin-film heating element and is configured to heat the sample under test. The thin-film heating element is connected to the sample under test via vacuum grease; The temperature controller is electrically connected to the temperature sensor. The temperature sensor collects the temperature of the sample being tested and transmits the collected signal to the temperature controller for monitoring. Both the precision power supply and the temperature controller are electrically connected to the data processing unit. The data processing unit adjusts the output of the precision power supply in real time according to the input of the temperature controller, thereby realizing real-time control of the sample temperature.

8. The space simulation environment variable temperature photothermal performance testing device based on steady-state calorimetry according to claim 1, characterized in that, The temperature sensor includes at least 12 T-type thermocouples, of which at least 10 are distributed on the low-temperature cavity, 2 are located on the upper cover of the low-temperature cavity, 2 are located on the lower cover of the low-temperature cavity, 6 are located on the side wall of the low-temperature cavity, and the remaining 2 are located on the surface and bottom of the sample being tested, respectively.

9. The space simulation environment variable temperature photothermal performance testing device based on steady-state calorimetry according to claim 1, characterized in that, The simulated sunlight unit includes a xenon lamp light source; The xenon lamp light source includes a xenon lamp, a condenser, a reflector, a filter, and a lens; The xenon lamp serves as the light source for the optical path, the condenser lens serves as the focusing system, the reflector reflects the light path back, the filter is used to match the AMO solar spectrum, and the lens serves as the collimating objective.

10. The space simulation environment variable temperature photothermal performance testing device based on steady-state calorimetry according to claim 7, characterized in that, The simulated sunlight unit also includes an adjustable aperture, which is used to adjust the size and brightness of the light spot of the xenon lamp.

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