A calibration method, calibration apparatus, electronic device, medium, and program product.

Abstract

This application relates to the field of data processing technology, and discloses a calibration method, calibration device, electronic device, medium, and program product. The method includes: acquiring an image of the object to be tested under a microscope and the microscope's configuration information; identifying the target object in the image; measuring the target features of the target object to obtain measured values; comparing the measured values ​​of the target object with standard values ​​of the target object to obtain comparison results; determining the scale calibration error based on the comparison results; and generating and outputting a first prompt message if the scale calibration error exceeds an error threshold, wherein the first prompt message includes at least one correct configuration information. The configuration information can then be adjusted to improve measurement accuracy. Furthermore, it can be automatically triggered before each experiment or during image analysis, providing real-time prompts to the user to prevent analysis based on erroneous data, thereby improving the stability and reliability of the measurement results.

Description

Technical Field

[0001] This application relates to the field of data processing technology, and in particular to a calibration method, calibration device, electronic device, medium, and program product. Background Technology

[0002] Currently, microscopic measurements are used in numerous scientific and industrial fields. For example, measuring the size of cells and tissue structures on tissue sections is used for disease diagnosis or tissue structure research. Or, for instance, in semiconductor manufacturing, the dimensions of circuit patterns on wafers are measured to ensure manufacturing precision. Therefore, in digital microscopy measurements, precise scaling and measurement techniques are required to ensure the accuracy and reliability of the data.

[0003] During the imaging process of microscopes and their cameras, errors in parameter configuration or operational oversights may lead to deviations or errors in the scaling between image pixel size and physical size, which in turn affects the accuracy of sample measurement or even results in completely incorrect measurements. Summary of the Invention

[0004] The purpose of this application is to provide a calibration method, calibration device, electronic device, medium, and program product.

[0005] The first aspect of this application provides a calibration method applied to an electronic device. The method includes: acquiring an image of an object to be tested using a microscope and configuration information of the microscope; identifying a target object in the image; measuring the target features of the target object to obtain measurement values; comparing the measurement values ​​of the target object with standard values ​​of the target object to obtain comparison results; determining a scale calibration error based on the comparison results; and generating and outputting a first prompt message corresponding to a scale calibration error greater than an error threshold, wherein the first prompt message includes at least one correct configuration information.

[0006] In this embodiment, by identifying the target object in the image and comparing the measured value of the target object with its standard value, if the comparison result indicates that the scale calibration error corresponding to the microscope's configuration information exceeds a preset range (greater than an error threshold), a prompt message is generated to alert the user to at least one correct configuration setting. Thus, the microscope's configuration information can be adjusted based on the correct configuration information until the scale calibration error is within the preset range (scale calibration error less than or equal to the error threshold), thereby improving measurement accuracy.

[0007] Furthermore, it can be automatically triggered before each experiment or during image analysis, and provide real-time alerts to users (e.g., experimenters) regarding scale calibration errors, preventing users from conducting subsequent analyses based on erroneous data and thus improving the user experience.

[0008] In one possible implementation of the first aspect described above, the first prompt information further includes at least one suggestion for adjusting configuration information.

[0009] In this embodiment, it is possible to identify which specific configuration information (such as objective lens magnification or camera adapter magnification) is erroneous and provide adjustment suggestions, thereby improving the pertinence of troubleshooting.

[0010] In one possible implementation of the first aspect described above, the method further includes: generating and outputting a second prompt message corresponding to a scale calibration error being less than or equal to an error threshold, wherein the second prompt message is used to indicate to the user that the microscope configuration information is correct.

[0011] In one possible implementation of the first aspect described above, the configuration information includes at least one of the following: the objective lens magnification of the microscope, the camera adapter magnification, the scaling configuration parameters, and the digital zoom factor.

[0012] In one possible implementation of the first aspect described above, the target object includes at least one of the following: a standard ruler, a cell counting chamber, a standard calibration sheet, or a sample of known size range; wherein the sample of known size range includes at least one of the following: cell and tissue samples, microbial samples, plant samples, aquatic microorganism samples, micro / nano-scale particle samples, or material samples containing gap structures of known size.

[0013] In this application embodiment, in addition to supporting calibration using professional standard calibration sheets, it also supports calibration using known size references commonly found in samples (such as cells, pollen, yeast, etc.), thus lowering the calibration threshold.

[0014] In one possible implementation of the first aspect described above, the standard calibration sheet is a glass slide or cover plate with an etched pattern, the standard calibration sheet is switchable, and the size of the etched pattern is a known standard value; wherein the standard calibration sheet is used to adjust the configuration information of the microscope.

[0015] In one possible implementation of the first aspect above, identifying a target object in an image includes: identifying the target object through a first model, wherein the first model is an artificial intelligence model trained on multiple types of sample images, the types of which include at least one of the following: a standard ruler, a cell counting plate, a standard calibration sheet, or a sample of a known size range.

[0016] In one possible implementation of the first aspect above, measuring the target features of the target object to obtain measurement values ​​includes: measuring the target features of the target object through a second model to obtain measurement values; wherein the second model is an artificial intelligence model or a computer vision-based image processing algorithm for extracting and measuring features from sample images.

[0017] In this embodiment, the target object is automatically identified and measured by the model, eliminating the need for manual measurement and calculation, thus improving calibration efficiency and accuracy.

[0018] In one possible implementation of the first aspect described above, the microscope is a stereomicroscope or a compound microscope; the microscope is operated manually or electrically.

[0019] A second aspect of this application provides a calibration apparatus, comprising: an image acquisition module for acquiring an image of an object to be inspected by a microscope; a configuration information reading and writing module for acquiring configuration information of the microscope; an identification and measurement module for identifying a target object in the image; measuring the target features of the target object to obtain measurement values; comparing the measurement values ​​of the target object with the standard values ​​of the target object to obtain comparison results; determining a scale calibration error based on the comparison results; and generating and outputting a first prompt message corresponding to a scale calibration error greater than an error threshold, wherein the first prompt message includes at least one correct configuration information.

[0020] A third aspect of this application provides an electronic device, comprising: a memory for storing instructions executable by one or more processors of the electronic device, and a processor for performing any of the methods described in the first aspect above.

[0021] A fourth aspect of this application provides a computer-readable medium storing instructions that, when executed, implement any of the methods described in the first aspect above.

[0022] The fifth aspect of this application provides a program product including instructions that, when executed, implement any one of the methods described in the first aspect above. Attached Figure Description

[0023] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0024] Figure 1 An embodiment of this application illustrates a schematic diagram of a user observing a scene through a microscope;

[0025] Figure 2 A schematic diagram illustrating the implementation process of a calibration method is shown in the embodiments of this application;

[0026] Figures 3A to 3C A schematic diagram of a set of samples with a known size range is shown according to an embodiment of this application;

[0027] Figure 4 A schematic diagram of a microscope and a standard calibration slide is shown according to this application;

[0028] Figure 5A A schematic diagram illustrating the measurement of a target object is shown according to an embodiment of this application;

[0029] Figure 5B A schematic diagram illustrating the measurement of another target object is shown according to an embodiment of this application;

[0030] Figure 5C A schematic diagram illustrating the display of a first prompt message in text form is shown according to an embodiment of this application;

[0031] Figure 6 A schematic diagram of the structure of a calibration device 600 is shown according to an embodiment of this application;

[0032] Figure 7 A schematic diagram of the hardware structure of an electronic device 100 is shown according to an embodiment of this application;

[0033] Figure 8 A schematic diagram of the structure of a microscope 200 is shown according to an embodiment of this application. Detailed Implementation

[0034] The illustrative embodiments of this application include, but are not limited to, a calibration method, calibration apparatus, electronic device, medium, and program product.

[0035] As mentioned earlier, precise scaling and measurement techniques are required in microscope measurements to ensure the accuracy and reliability of the data. However, during microscope imaging, errors in parameter configuration or operational oversights can lead to deviations in scaling between image pixel dimensions and physical dimensions, thus affecting the accuracy of sample measurements or even resulting in completely erroneous results.

[0036] For example, suppose a user is observing ants through a microscope, refer to Figure 1 The diagram shown has a scale calibration error, which makes the ant appear to be 22.777 millimeters (mm) wide. As a result, the user may judge that the ant is a giant ant, leading to incorrect judgment and possibly generating incorrect reports and analysis results.

[0037] To address the aforementioned issues, this application proposes a calibration method comprising: acquiring an image of the object to be inspected using a microscope and configuration information of the microscope; identifying the target object in the image; measuring the target features of the target object to obtain measurement values; comparing the measurement values ​​of the target object with standard values ​​of the target object to obtain comparison results; determining the scale calibration error based on the comparison results; and generating and outputting a first prompt message corresponding to a scale calibration error greater than an error threshold, wherein the first prompt message includes at least one correct configuration information.

[0038] It is understood that the calibration method provided in this application identifies the target object in the image and compares the measured value of the target object with the standard value of the target object. If, based on the comparison result, it is determined that the scale calibration error corresponding to the microscope's configuration information exceeds a preset range (greater than an error threshold), a prompt message is generated to remind the user of at least one correct configuration information. In this way, the user can adjust the configuration information until the scale calibration error is within the preset range (scale calibration error is less than or equal to the error threshold), thereby improving the accuracy of the measurement.

[0039] To better understand the technical methods of this application, the calibration method provided in the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0040] For example, Figure 2 A schematic diagram illustrating the implementation process of a calibration method is shown in the embodiments of this application. It can be understood that... Figure 2 The execution subject of the flowchart shown is electronic device 100. For ease of description, the following will refer to... Figure 2 When describing the flowchart shown, the execution subject of the flowchart will not be repeated.

[0041] like Figure 2 As shown, this process includes, but is not limited to:

[0042] S201: Obtain the image of the object to be inspected by the microscope and the configuration information of the microscope.

[0043] In some embodiments, the electronic device 100 acquires images of the object to be inspected by the microscope and configuration information of the microscope through a data interface provided by the microscope and the microscope camera for acquiring images of the object to be inspected.

[0044] In other embodiments, the electronic device 100 acquires images of the object to be examined by the microscope and configuration information of the microscope through a communication link established with the microscope.

[0045] In other embodiments, the electronic device 100 may also directly read the image of the object to be detected by the microscope and the configuration information of the microscope from the storage unit corresponding to the microscope. This application does not limit the specific method by which the electronic device 100 acquires the image of the object to be detected by the microscope and the configuration information of the microscope.

[0046] In some embodiments, the configuration information includes at least one of the following: the objective lens magnification of the microscope, the camera adapter magnification, the scaling configuration parameters, and the digital zoom factor.

[0047] In some embodiments, the microscope is a stereomicroscope (or a zoom microscope) or a combination microscope.

[0048] It is understood that the microscope can be operated manually or electrically. That is to say, the microscope can be a manual microscope or an electric microscope, and this application does not limit it in this regard.

[0049] The objective lens magnification can be, for example, 0.5x, 1x, 4x, 10x, 20x, 40x, 100x, etc. The camera adapter magnification refers to the magnification of the adapter (e.g., a C-mount adapter) between the microscope and the microscope camera; the camera adapter magnification can be 0.35x, 0.5x, 0.63x, 1x, etc. The digital zoom factor can be, for example, 1x, 2x, 3x, 5x, 100x, etc.

[0050] In some embodiments, for a stereomicroscope, the scaling configuration parameters include the magnification value corresponding to the current position of the zoom knob, such as 0.8x, 1x, 2x, 3x, etc.

[0051] It is understood that the above configuration information is only an illustrative example. In other embodiments, the configuration information may include more or fewer parameters, and this application does not limit this.

[0052] S202: Identify the target object in the image.

[0053] In some embodiments, the target object includes at least one of the following: a standard ruler, a cell counting chamber, a standard calibration sheet, or a sample of known size range. The sample of known size range includes at least one of the following: cell and tissue samples (e.g., human cells, tissue sections, etc.), microbial samples (e.g., yeast, bacteria, etc.), plant samples (e.g., pollen, algae, etc.), aquatic microorganism samples, micro / nano-scale particle samples of known size, or material samples containing gap structures of known size.

[0054] For example, Figures 3A to 3C A schematic diagram of a set of samples with a known size range is shown according to an embodiment of this application.

[0055] like Figure 3A As shown, the average diameter of human blood cells (such as red blood cells) in human blood samples is 6.5-8.5 micrometers, for example, the diameter of the cell shown in the figure is 7.245 micrometers.

[0056] like Figure 3B As shown, the average diameter of pollen in the pollen sample is 20-50 micrometers, for example, the pollen in the illustration has a diameter of 33.082 micrometers.

[0057] like Figure 3C As shown, the average diameter of yeast cells in the yeast sample is 2-6 micrometers.

[0058] In some embodiments, the length of the standard ruler can be 1 mm, 2 mm, 3 mm, 5 mm, etc., and the smallest division of the standard ruler can be 0.01 mm, 0.001 mm, etc. The grid size of the cell counting plate can be set according to international standards, for example, each small square has a side length of 0.25 mm.

[0059] In some embodiments, the standard calibration sheet is a glass slide or cover plate with an etched pattern. The standard calibration sheet is switchable, and the size of the etched pattern is a known standard value. The standard calibration sheet is used to adjust the microscope's configuration information.

[0060] In some embodiments, the standard calibration sheet may be made of, for example, glass or other suitable materials known in the art. The etched pattern of the standard calibration sheet is checkerboard-shaped, for example comprising a plurality of periodically arranged (e.g., arranged in a chessboard pattern) grid cells, wherein at least a portion of the boundary of each grid cell can be identified by a microscope.

[0061] It can be understood that the regions located on both sides of and adjacent to the boundary portion of each lattice cell have optical property differences (such as reflectance or color differences) that are identifiable by a microscope, or that the boundary portion of each lattice cell itself has optical property differences relative to the surrounding region that are identifiable by a microscope.

[0062] For example, Figure 4 An example is shown in the schematic diagram of a microscope with a standard calibration slide.

[0063] like Figure 4 As shown, the standard calibration sheet 41 is placed on the stage of the microscope 42. The etched pattern of the standard calibration sheet 41 is a black and white checkerboard pattern, i.e., a chessboard pattern.

[0064] It is understood that "periodic arrangement" in this application means that multiple lattice units appear repeatedly at equal intervals or adjacent to each other in a one-dimensional or two-dimensional direction. Figure 4The arrangement shown is merely an illustrative example and does not constitute the sole limitation on the etching pattern of the standard calibration sheet.

[0065] It is understood that a microscope can identify at least a portion of the boundaries of each grid cell of a standard calibration sheet and determine the image position or relative image position relationship of at least a portion of the identified boundaries of each grid cell in the image. Therefore, the magnification of the microscope can be calculated based on the image position or relative image position relationship of at least a portion of the identified boundaries of each grid cell and a preset position or preset relative position relationship.

[0066] In some embodiments, the electronic device 100 identifies the target object through a first model, wherein the first model is an artificial intelligence model trained based on multiple types of sample images, the types of which include at least one of the following: a standard ruler, a cell counting plate, a standard calibration sheet, or a sample of a known size range.

[0067] It is understood that the first model can be, for example, a deep convolutional neural network-based object detection model, such as YOLO or Faster R-CNN. This application does not limit the specific type of the first model.

[0068] S203: Measure the target features of the target object and obtain the measured values.

[0069] In some embodiments, after the electronic device 100 identifies a target object (e.g., pollen), it can use image processing algorithms (e.g., edge detection, Hough transform, feature point matching, etc.) to locate the position of the target features of the target object and measure the target features of the target object to obtain measurement values.

[0070] It can be understood that the measurement value is the size of the target feature of the target object. For example, assuming that electronic device 100 identifies the target object as pollen, the measurement value could be the diameter of a pollen grain.

[0071] S204: Compare the measured value of the target object with the standard value of the target object to obtain the comparison result.

[0072] In some embodiments, the standard values ​​of the target object can be obtained from a database. For example, the standard value of human red blood cells is 7.4-7.6 (7.5 μm ± 1.0) micrometers.

[0073] In some embodiments, the comparison result may be the absolute value of the difference between the measured value of the target object and the maximum (or minimum) value of the standard value of the target object, and this application does not limit this.

[0074] S205: Based on the comparison results, determine the scale calibration error. If the scale calibration error is greater than the error threshold, generate and output the first prompt message.

[0075] In some embodiments, the scale calibration error can be expressed as a percentage of the comparison result to the standard value, or it can be the comparison result itself, or it can be other values ​​after converting the comparison result. This application does not limit this.

[0076] When the electronic device 100 determines that the scale calibration error is greater than the error threshold, it generates and outputs the first prompt message.

[0077] The error threshold can be, for example, 5%, 10%, etc. It is understood that the setting of the error threshold is related to the form of the scale calibration error, and this application does not limit the specific value or form of the error threshold. For example, Figure 5A A schematic diagram illustrating the measurement of a target object is shown according to an embodiment of this application.

[0078] like Figure 5A As shown, if the target object is a ruler, the electronic device 100 will recognize and display "ruler detected" and the measured value of the detected target object "1.5 mm" and the standard value of the target object "database: 1 mm".

[0079] Based on this, the comparison result can be 0.5, with a scale calibration error of 50%. If the error threshold is 5%, then the scale calibration error is greater than the error threshold, indicating a significant deviation, which may be due to errors in the configuration information. Since the target object has been identified, the observation parameters (microscope configuration parameters) corresponding to the target object are usually known (e.g., empirical values ​​or configuration parameters corresponding to the target feature size of the target object), and the electronic device 100 can generate corresponding prompt information.

[0080] For example, Figure 5B A schematic diagram of the measurement of another target object is shown according to an embodiment of this application.

[0081] like Figure 5B As shown, if the target object is a counting board, the electronic device 100 will identify and display "Counting board detected" and the measured value of the detected target object "2.5 mm" and the standard value of the target object "Database: 0.25 mm".

[0082] Based on this, the comparison result could be 2.25, with a scale calibration error of 900%. If the error threshold is 5%, then the scale calibration error is greater than the error threshold, indicating a significant deviation, which may be due to errors in the configuration information. Since the target object has been identified, the observation parameters (microscope configuration parameters) corresponding to the target object are usually known (e.g., empirical values ​​or configuration parameters corresponding to the target object's feature size), and the electronic device 100 can generate corresponding prompt information.

[0083] In some embodiments, the first prompt message includes at least one correct configuration information.

[0084] For example, for the target object (ruler) shown in 5A, the correct configuration parameters for the ruler could be: 1x objective lens and 1x zoom, or 0.5x objective lens and 2x zoom, etc. Then the first prompt message could be "The ruler has been detected, however, the measurement results show that there is a height scaling error. The correct configuration information may be: 1x objective lens and 1x zoom; or 0.5x objective lens and 2x zoom".

[0085] It is understood that the correct configuration information included in the first prompt message is determined based on the comparison results between the measured value of the target object and the standard value of the target object. The correct configuration information included in the first prompt message includes, but is not limited to: the objective lens magnification of the microscope, the camera adapter magnification, the zoom configuration parameters, and the digital zoom coefficient.

[0086] In other embodiments, the first prompt message also includes suggestions for adjusting at least one configuration information.

[0087] For example, for the target object shown in 5A, the first prompt message could also be "A ruler has been detected; however, the measurement results show a height scaling error. The correct configuration information might be: 1x objective and 1x zoom; or 0.5x objective and 2x zoom. It is recommended to adjust the configuration information to the following combination:...".

[0088] It is understood that the form of the first prompt message can be displayed text or played audio, and this application does not impose any restrictions on this.

[0089] For example, Figure 5C An embodiment of this application illustrates a schematic diagram of displaying a first prompt message in text form.

[0090] like Figure 5C As shown, the display interface shows the text information "Standard calibration piece detected", the measured value of the detected target object (standard calibration piece) "0.5 mm" and the standard value of the target object "Database: 0.25 mm", as well as the prompt information "Based on the measurement results, the correct magnification may be 4x".

[0091] In some embodiments, the electronic device 100 measures the target features of the target object using a second model to obtain measurement values.

[0092] The second model is an artificial intelligence model or a computer vision-based image processing algorithm used to extract and measure features from sample images.

[0093] For example, the second model can be an artificial intelligence model trained on different types of sample data, or an algorithm that extracts feature points based on image processing and automatically measures them. The second model can be a trained model such as YOLO, or it can be a computer vision image processing algorithm based on OpenCV, or it can be a model combining artificial intelligence and vision algorithms. This application does not limit the specific form of the second model, as long as it can achieve the function of extracting and measuring features from sample images, it is within the scope of protection of this application.

[0094] Thus, in practical applications, the second model receives the input image and current configuration information. It no longer relies on visually identifying scale lines and then manually measuring distances in the software; instead, it directly regresses the scale calibration error. For example, by analyzing the spacing characteristics of the scale lines on a standard ruler, the second model directly outputs a prompt such as, "The current image detects a scale calibration error greater than the error threshold; the possibly correct objective lens magnification and camera adapter magnification are xx, xx." This method is faster, and for samples of known sizes that are not perfectly regular (such as pollen samples), the second model can make fuzzy judgments based on statistical shape rather than absolute size, making it more robust.

[0095] In other embodiments, the electronic device 100 can also measure the target features of the target object using a target algorithm to obtain measurement values. The target algorithm can perform feature extraction and measurement on sample images.

[0096] For example, the target algorithm can be a scale-invariant feature transform (SIFT) algorithm, or other algorithms or variants thereof. This application does not limit the specific form of the target algorithm, as long as it can achieve the function of feature extraction and measurement of sample images, it is within the scope of protection of this application.

[0097] Understandable. Figure 2 The method flow shown is merely an exemplary illustration; in other embodiments, Figure 2 The process shown can also include more steps.

[0098] For example, in other embodiments, when the scale calibration error is less than or equal to an error threshold, the electronic device 100 generates and outputs a second prompt message, wherein the second prompt message is used to indicate to the user that the microscope configuration information is correct.

[0099] For example, the second prompt could be "It is now safe to conduct the experiment and measure the results."

[0100] It is understood that the second prompt message can be displayed text or played audio, and this application does not impose any restrictions on this.

[0101] For example, in other embodiments, the electronic device 100 may adjust the configuration information of the microscope based on at least one correct configuration information so that the scale calibration error is less than or equal to the error threshold.

[0102] It is understandable that users can also manually adjust the microscope configuration information based on the first prompt information until the scale calibration error is less than or equal to the error threshold. This application does not limit this.

[0103] In summary, the calibration method provided in this application automatically identifies and measures the target object through a model, eliminating the need for manual measurement and calculation, thus improving calibration efficiency and accuracy. Furthermore, it can identify which specific configuration information (such as objective lens magnification or camera adapter magnification) is erroneous and provide adjustment suggestions, improving the targeted nature of troubleshooting.

[0104] Furthermore, the calibration method provided in this application embodiment can be automatically triggered before each experiment or during image analysis, and can provide real-time prompts to users (e.g., experimenters) regarding scale calibration errors, preventing users from performing subsequent analyses based on erroneous data, thereby improving the user experience.

[0105] Furthermore, in addition to supporting calibration using professional standard calibration sheets, it also supports calibration using common known size reference objects in samples (such as cells, pollen, yeast, etc.), which lowers the calibration threshold and achieves the goal of automatic real-time calibration synchronization during routine microscope imaging observations.

[0106] It is understood that the above describes the function of identifying the target object using the first model and the function of extracting and measuring features from the sample image using the second model. In other embodiments, the functions of the first and second models can be achieved using more or fewer models, and this application does not limit this. The architecture of the first and second models can be implemented in software, hardware, or a combination of software and hardware, and this application does not limit this.

[0107] It is understood that the electronic device 100 in the embodiments of this application may be a module disposed in the microscope, or a device or apparatus connected to the microscope, and this application does not limit it in this regard.

[0108] In some embodiments, this application also provides a calibration device for implementing the functions of the electronic device 100 in the above embodiments. The calibration device may be a device disposed in a microscope or a device connected to the microscope. The calibration device may also be a device disposed in the electronic device 100. This application does not limit this.

[0109] For example, Figure 6 A schematic diagram of a calibration device 600 is shown according to an embodiment of this application.

[0110] like Figure 6 As shown, the calibration device 600 includes an image acquisition module 610, a configuration information reading and writing module 620, and an identification and measurement module 630. Wherein:

[0111] The image acquisition module 610 is used to acquire images of the object to be inspected under the microscope.

[0112] The configuration information read / write module 620 is used to acquire the configuration information of the microscope.

[0113] In other embodiments, the configuration information module is also used to adjust (or set) the configuration information of the microscope.

[0114] The recognition and measurement module 630 is used to recognize target objects in an image; measure the target features of the target objects to obtain measurement values; compare the measurement values ​​of the target objects with the standard values ​​of the target objects; determine the scale calibration error based on the comparison results; and generate and output first prompt information when the scale calibration error is greater than the error threshold, wherein the first prompt information includes at least one correct configuration information.

[0115] In other embodiments, corresponding to a scale calibration error less than or equal to an error threshold, the identification and measurement module 630 is further configured to generate and output a second prompt message, wherein the second prompt message is used to indicate to the user that the microscope configuration information is correct.

[0116] For details, please refer to the above. Figure 2 The relevant descriptions in the implementation process shown are not repeated here.

[0117] It should be understood that Figure 6The structure of the calibration device 600 shown is merely an example. In other embodiments, the calibration device 600 may include more or fewer modules, which is not limited herein. The modules in the calibration device 600 may be hardware modules or software modules, and this application does not impose any limitations on this.

[0118] For example, Figure 7 A schematic diagram of the hardware structure of an electronic device 100 is shown according to an embodiment of this application.

[0119] like Figure 7 As shown, the electronic device 100 includes one or more (only one is shown in the figure) processors 110, memory 120, communication interface 130, and bus 140. The processors 110, memory 120, and communication interface 130 are interconnected via the bus 140.

[0120] The processor 110 may include one or more processing units, such as a central processing unit (CPU), a microprocessor, a graphics processing unit (GPU), an application-specific integrated circuit, etc., for executing related programs to implement the functions required by the modules in the compilation apparatus of this application embodiment, or to execute the calibration method of this application method embodiment.

[0121] The memory 120 may include one or more memories for storing data or one or more applications. The memory may be read-only memory (ROM), static storage device, dynamic storage device, random access memory (RAM), high-speed random access memory, double data rate synchronous dynamic RAM (DDR), high bandwidth memory (HBM), or non-volatile memory, such as at least one disk storage device, flash memory device, universal flash storage (UFS), etc.

[0122] The processor 110 can also be an integrated circuit chip with signal processing capabilities. In implementation, each step of the data processing method of this application can be completed by software instructions in the processor 110. The aforementioned processor 110 can also be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit, a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. It can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of this application. The general-purpose processor can be a microprocessor or any conventional processor. The steps of the methods disclosed in the embodiments of this application can be directly embodied in the execution of a hardware decoding processor, or executed by a combination of hardware and software modules in the decoding processor. The software modules can reside in random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, registers, or other mature storage media in the art. The storage medium is located in the memory 120. The processor 110 reads the information in the memory 120 and, in conjunction with its hardware, performs the functions required by the units included in the compilation apparatus of this application embodiment, or performs the calibration method of this application method embodiment.

[0123] Communication interface 130 is used to enable communication between electronic device 100 and other devices or communication networks. Communication interface 130 may include wired or wireless communication interfaces, allowing electronic device 100 to access the Internet via wired or wireless means and acquire or send data to other devices based on the Internet. In some embodiments, electronic device 100 acquires images of the object to be examined by the microscope and configuration information of the microscope through communication interface 130.

[0124] Bus 140 is used to connect processor 110, memory 120, communication interface 130 and other possible modules or circuits.

[0125] In some embodiments, the electronic device 100 can be used to perform the calibration method corresponding to the method embodiments described above. To avoid repetition, it will not be described again here.

[0126] It should be understood that Figure 7 The structure of the electronic device 100 shown is only an example. In other embodiments, the electronic device 100 may include more or fewer modules, which is not limited here.

[0127] In some embodiments, the functions of the electronic device 100 can also be implemented by a microscope. The structure of the microscope in the embodiments of this application is described below with reference to the accompanying drawings.

[0128] For example, Figure 8 According to embodiments of this application, a microscope 200 (e.g.) is shown. Figure 4 The diagram shows the structure of microscope 42.

[0129] like Figure 8 As shown, the microscope 200 may include a processor 210, a memory 220, an optical system 230, a power supply system 240, a sample stage system 250, an imaging system 260, a control system 270, and auxiliary systems 280, etc.

[0130] It is understood that the structures illustrated in the embodiments of this application do not constitute a specific limitation on the microscope 200. In other embodiments of this application, the microscope 200 may include more or fewer components than illustrated, or combine some components, or split some components, or have different component arrangements. The illustrated components may be implemented in hardware, software, or a combination of software and hardware.

[0131] Processor 210 may include one or more processing units, such as application processors (APs), modem processors, graphics processing units (GPUs), image signal processors (ISPs), controllers, video codecs, digital signal processors (DSPs), baseband processors, and / or neural network processing units (NPUs). These different processing units may be independent devices or integrated into one or more processors. Processor 210 can be used to execute the calibration methods provided in the embodiments of this application.

[0132] The processor 210 may also include a memory for storing instructions and data.

[0133] The memory 220 can be used to store computer-executable program code, including instructions. The memory 220 may include a program storage area and a data storage area. The program storage area may store the operating system, at least one application program required for a given function, etc. The data storage area may store data created during the use of the microscope 200 (such as operating parameters, sample images, etc.). Furthermore, the memory 220 may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk storage device, flash memory device, universal flash storage (UFS), etc. The processor 210 implements the calibration method provided in this application embodiment by executing instructions stored in the memory 220 and / or instructions stored in the memory disposed in the processor 210.

[0134] Optical system 230 is used to achieve high-resolution imaging of the sample.

[0135] The power supply system 240 provides a stable power supply to all components of the electron microscope 200, ensuring the normal operation of the microscope 200.

[0136] The sample stage system 250 is used to support and move a sample, enabling imaging of the sample. The sample stage system 250 may include a sample stage, a sample moving device, a sample tilting device, and a sample rotating device. The sample stage is used to fix the sample. The sample moving device is used to move the sample in the X, Y, and Z directions. The sample tilting device is used to adjust the tilt angle of the sample. The sample rotating device is used to rotate the sample to achieve multi-angle observation.

[0137] Imaging system 260 is used to acquire observable images of a sample. Imaging system 260 may include: a display screen, an image acquisition system (e.g., a microscope camera), an image processing system, and a computer system. The display screen is used for direct image observation.

[0138] The control system 270 is used to operate and adjust the various components of the microscope 200 to achieve optimal imaging results. The control system 270 may include an operation panel, an automatic control system, and a software system. The operation panel is used to acquire parameters of the microscope 200 that are manually adjusted by the user. The automatic control system is used to automatically adjust the parameters of the microscope 200, such as autofocus and automatic correction. The software system is used to control the operation of the microscope 200, including parameter setting, image acquisition, and processing.

[0139] The auxiliary system 280 includes devices for specific experiments or functions, such as heating stages, freezing stages, stretching stages, and gas injection systems.

[0140] In some embodiments, this application also provides a computer-readable storage medium storing instructions that, when executed, implement the calibration methods provided in the above-described method embodiments.

[0141] In some embodiments, this application also provides a computer program product, which includes instructions that, when executed, implement the calibration methods provided in the above-described method embodiments.

[0142] Various embodiments of the mechanisms disclosed in this application can be implemented in hardware, software, firmware, or combinations of these implementation methods. Embodiments of this application can be implemented as computer programs or program code executable on a programmable system, the programmable system including at least one processor, a storage system (including volatile and non-volatile memory and / or storage elements), at least one input device, and at least one output device.

[0143] Program code can be applied to input instructions to execute the functions described in this application and generate output information. The output information can be applied to one or more output devices in a known manner. For the purposes of this application, the processing system includes any system having a processor such as, for example, a digital signal processor (DSP), a microcontroller, an application-specific integrated circuit (ASIC), or a microprocessor.

[0144] The program code can be implemented using a high-level procedural language or an object-oriented programming language to communicate with the processing system. Assembly language or machine language can also be used when needed. In fact, the mechanisms described in this application are not limited to any particular programming language. In either case, the language can be a compiled language or an interpreted language.

[0145] In some cases, the disclosed embodiments may be implemented in hardware, firmware, software, or any combination thereof. The disclosed embodiments may also be implemented as instructions carried on or stored thereon on one or more temporary or non-temporary machine-readable (e.g., computer-readable) storage media, which may be read and executed by one or more processors. For example, the instructions may be distributed via a network or through other computer-readable media. Therefore, computer-readable media may include various media capable of storing program code, such as USB flash drives, external hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0146] In the accompanying drawings, some structural or methodological features may be shown in a specific arrangement and / or order. However, it should be understood that such a specific arrangement and / or order may not be necessary. Rather, in some embodiments, these features may be arranged in a manner and / or order different from that shown in the illustrative drawings. Furthermore, the inclusion of structural or methodological features in a particular figure does not imply that such features are required in all embodiments, and in some embodiments, these features may be omitted or may be combined with other features.

[0147] It should be noted that all units / modules mentioned in the device embodiments of this application are logical units / modules. Physically, a logical unit / module can be a physical unit / module, a part of a physical unit / module, or a combination of multiple physical units / modules. The physical implementation of these logical units / modules themselves is not the most important factor; the combination of functions implemented by these logical units / modules is the key to solving the technical problems proposed in this application. Furthermore, to highlight the innovative aspects of this application, the above-described device embodiments of this application have not introduced units / modules that are not closely related to solving the technical problems proposed in this application. This does not mean that the above-described device embodiments do not contain other units / modules.

[0148] It should be noted that in the examples and description of this patent, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one" does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes the element.

[0149] Although this application has been illustrated and described with reference to certain preferred embodiments thereof, those skilled in the art should understand that various changes in form and detail may be made thereto without departing from the spirit and scope of this application.

Claims

1. A calibration method, characterized in that, Applied to electronic devices, the method includes: Acquire images of the object to be examined using a microscope and the configuration information of the microscope; Identify the target object in the image; The target features of the target object are measured to obtain measurement values; The measured value of the target object is compared with the standard value of the target object to obtain the comparison result; Based on the comparison results, the scale calibration error is determined. If the scale calibration error is greater than the error threshold, a first prompt message is generated and output, wherein the first prompt message includes at least one correct configuration information.

2. The method according to claim 1, characterized in that, The first prompt message also includes suggestions for adjusting at least one configuration information.

3. The method according to claim 1 or 2, characterized in that, The method further includes: If the scale calibration error is less than or equal to the error threshold, a second prompt message is generated and output, wherein the second prompt message is used to indicate to the user that the configuration information of the microscope is correct.

4. The method according to any one of claims 1 to 3, characterized in that, The configuration information includes at least one of the following: the objective lens magnification of the microscope, the camera adapter magnification, the zoom configuration parameters, and the digital zoom factor.

5. The method according to any one of claims 1 to 4, characterized in that, The target object includes at least one of the following: a standard ruler, a cell counting chamber, a standard calibration slide, or a sample of known size range; wherein, The known size range of samples includes at least one of the following: cell and tissue samples, microbial samples, plant samples, aquatic microorganism samples, micro / nano-scale particle samples, or material samples containing gap structures of known size.

6. The method according to claim 5, characterized in that, The standard calibration sheet is a glass slide or glass cover plate with an etched pattern. The standard calibration sheet is switchable, and the size of the etched pattern is a known standard value. The standard calibration plate is used to adjust the configuration information of the microscope.

7. The method according to any one of claims 1 to 6, characterized in that, The identification of the target object in the image includes: The target object is identified by a first model, wherein the first model is an artificial intelligence model trained on multiple types of sample images, and the types of sample images include at least one of the following: standard ruler, cell counting plate, standard calibration slide, or samples of known size range.

8. The method according to any one of claims 1 to 6, characterized in that, Measuring the target features of the target object to obtain measurement values ​​includes: The target features of the target object are measured using a second model to obtain measurement values; wherein... The second model is an artificial intelligence model or a computer vision-based image processing algorithm used to extract and measure features from sample images.

9. The method according to any one of claims 1 to 8, characterized in that, The microscope is a stereomicroscope or a compound microscope; The microscope can be operated manually or electrically.

10. A calibration device, characterized in that, include: The image acquisition module is used to acquire images of the object to be inspected under the microscope; A configuration information read / write module is used to acquire the configuration information of the microscope; The identification and measurement module is used to identify target objects in the image; The target features of the target object are measured to obtain measurement values; The measured value of the target object is compared with the standard value of the target object to obtain the comparison result; based on the comparison result, the scale calibration error is determined; if the scale calibration error is greater than the error threshold, a first prompt message is generated and output, wherein the first prompt message includes at least one correct configuration information.

11. An electronic device, characterized in that, include: Memory, used to store instructions executed by one or more processors of an electronic device, and A processor for performing the method according to any one of claims 1 to 9.

12. A computer-readable medium, characterized in that, The computer-readable medium stores instructions that, when executed, implement the method of any one of claims 1 to 9.

13. A program product, characterized in that, The program product includes instructions that, when executed, implement the method of any one of claims 1 to 9.

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