A spectral frequency calibration device and method applied to a quantum microwave field strength meter

By calibrating the peak spacing of the EIT spectrum, combined with high-precision frequency modulation and synchronization between the signal source and the atomic clock, the problems of large frequency scanning range and accurate frequency calibration in quantum microwave field strength meters were solved, achieving high-precision spectral frequency calibration and traceability of measurement results, thus improving measurement accuracy and stability.

CN122194036APending Publication Date: 2026-06-12NATIONAL INSTITUTE OF METROLOGY CHINA +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
NATIONAL INSTITUTE OF METROLOGY CHINA
Filing Date
2026-04-27
Publication Date
2026-06-12

AI Technical Summary

⚠Technical Problem

Existing spectral frequency calibration methods cannot simultaneously accommodate a large frequency scanning range and precise frequency calibration, thus limiting the measurement range and performance of quantum microwave field strength meters.

⚗Method used

By calibrating the peak spacing of electromagnetic induction transparency (EIT) spectra, a quantitative relationship between unit time and frequency on the horizontal axis of the spectral data is established. Using a probe laser, a coupling laser, an optical modulation component, an atomic gas cell, a signal acquisition component, and a probe optical path, combined with high-precision frequency modulation and synchronization between the signal source and the atomic clock, spectral frequency calibration is achieved.

🎯Benefits of technology

It achieves high-precision spectral frequency calibration with a large frequency scanning range (>1GHz), and the measurement results can be traced back to the radio frequency drive signal output by the signal source, which improves the measurement accuracy and stability of the quantum microwave field strength meter. Moreover, the device has a simple structure and is easy to integrate.

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Abstract

The application discloses a spectrum frequency calibration device and method applied to a quantum microwave field strength instrument, wherein a probe light laser emits probe light, atoms in an atomic cell are excited from a ground state to a first excited state; a coupling light laser emits coupling light, atoms in the atomic cell are excited from the first excited state to a Rydberg state; the coupling light is modulated through an electro-optical modulator, a signal source provides a radio frequency driving signal for the electro-optical modulator; an atomic clock provides a frequency reference for the signal source, and a time frequency standard transmission terminal is used for calibrating the atomic clock; the atomic cell stores alkali metal atoms, the probe light and the coupling light form an optical axis passing through a center position of the atomic cell; a photoelectric detector is used for receiving the probe light and converting the probe light into a voltage signal; a data acquisition card records the voltage signal output by the photoelectric detector and forms time sequence voltage data; and a host computer processes the time sequence voltage data to form spectrum data. The application has high measurement precision, adjustable calibration range and simple structure and is easy to implement.
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