Multi-layer matching scanning method and image measuring device

By determining the workpiece matching model and local matching model in the image measurement equipment, and combining it with the moving image capture of the scanning device, the problem of needing to manually locate the position of the workpiece to be measured in the prior art is solved, and efficient and accurate measurement results are achieved.

CN122199508APending Publication Date: 2026-06-12CHOTEST TECH INC
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
CHOTEST TECH INC
Filing Date
2025-12-22
Publication Date
2026-06-12

AI Technical Summary

⚠Technical Problem

Existing image measurement equipment requires manual instruction on the specific placement of the workpiece on the stage during automatic measurement. Furthermore, the workpiece in the measurement template program is usually not exactly the same as the workpiece to be measured in terms of placement and the features to be measured, resulting in low efficiency and accuracy of the measurement results.

⚗Method used

By determining the workpiece matching model and local matching model based on the workpiece image of the template workpiece, and combining the moving image of the scanning device, the feature measurement area of ​​the workpiece to be measured is automatically identified and matched, realizing efficient and accurate measurement without the need for manual positioning.

🎯Benefits of technology

This improves the efficiency and accuracy of measurement results, ensuring accurate scanning of the feature measurement area without prior knowledge of the workpiece's position.

✦ Generated by Eureka AI based on patent content.

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Abstract

The application relates to a multi-layer matching scanning method and an image measuring device. The method comprises the following steps: determining a workpiece matching model, at least one local matching model, at least one first feature measuring model and a first relative position relationship between each local matching model and each first feature measuring model based on a workpiece image of a template workpiece; determining at least one workpiece matching area in a first to-be-measured image based on a first to-be-measured image obtained by shooting a first selected area of a worktable by a scanning device and the workpiece matching model; determining a local matching area corresponding to each workpiece matching area based on each workpiece matching area and the local matching model; and determining a measurement result of at least one to-be-measured workpiece in the first to-be-measured image based on a first feature measuring area of each to-be-measured workpiece corresponding to each workpiece matching area and the local matching area corresponding to each workpiece matching area. The method can improve the efficiency and accuracy of the measurement result.
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