Aging test method and device of electronic equipment, computer equipment and storage medium

Abstract

This application belongs to the field of aging test technology, and relates to an aging test method, apparatus, computer equipment, and storage medium for electronic devices. The method includes: receiving an aging configuration instruction from a tester for the electronic device; parsing the aging configuration instruction to obtain a target test item; determining the aging test duration and test restart parameters based on the target test item; calling the test interface corresponding to the target test item according to the aging configuration instruction; and performing the test on the target test item in the test interface according to the aging test duration and the test restart parameters to obtain test results. This application enables the entire aging test process to be carried out in an orderly manner according to predetermined items and parameters, forming a unified operating standard for each stage of the aging test, and ensuring that the generation of test results is based on a standardized test process, thus guaranteeing the accuracy of the aging test results from the execution level.

Description

Technical Field

[0001] This application relates to the field of aging test technology, and in particular to an aging test method, apparatus, computer equipment and storage medium for electronic devices. Background Technology

[0002] With the rapid development of the electronic equipment and smart terminal industry, and the continuous improvement of product functional integration, the market's demand for evaluating the long-term stability and reliability of products is becoming increasingly stringent. As a key step in verifying the performance and durability of products, aging testing has been widely used in consumer electronics, industrial equipment, and other fields, becoming an important quality control method before products leave the factory. Various aging testing technical solutions adapted to different scenarios have emerged.

[0003] Currently, most existing aging test technologies in the industry focus on basic function verification. They typically involve manually selecting test modules and setting test durations. Some solutions only have simple automatic start-up functions and lack unified operation process specifications. Test execution relies on the operator's experience and judgment, and parameter configuration and process connection lack standardized guidance.

[0004] However, current aging tests are prone to problems such as omissions, misconfigurations, and difficulty in detecting fault deviations, which directly leads to inconsistent test results and low data reliability, making it impossible to provide reliable support for product quality assessment.

[0005] In view of the above, this application is hereby submitted. Summary of the Invention

[0006] The purpose of this application is to provide an aging test method, apparatus, computer equipment, and storage medium for electronic devices, in order to solve the technical problem that current aging tests lack standardized procedures to ensure the accuracy of results.

[0007] To address the aforementioned technical problems, this application provides an aging test method for electronic devices, employing the following technical solution: Receive aging configuration instructions from testers for the electronic device, parse the aging configuration instructions, and obtain the target test items; Based on the target test items, determine the aging test duration and test restart parameters; According to the aging configuration instruction, the test interface corresponding to the target test item is invoked; On the test interface, the target test item is tested according to the aging test duration and the test restart parameters to obtain the test results.

[0008] Furthermore, the test results include monitoring results and restart results. In the test interface, the target test item is tested according to the aging test duration and the test restart parameters to obtain test results, including: In the test interface, start the test of the target test item, and monitor the test of the target test item according to the aging test duration to obtain the monitoring results; Based on the monitoring results and the test restart parameters, a restart test is performed on the target test item to obtain the restart result of the target test item.

[0009] Furthermore, the monitoring results include abnormal operation data and duration test completion events. The monitoring of the target test item based on the aging test duration to obtain the monitoring results includes: Monitor the running status data and current test duration of the target test item during the testing process; When the current test duration is greater than or equal to the aging test duration, the test on the target test item is terminated, and the duration test end event is generated. The abnormal operation data is determined based on the preset abnormal range and the operation status data.

[0010] Furthermore, determining the operational anomaly data based on the preset anomaly range and the operational status data includes: The running status data and the abnormal interval are compared to obtain the comparison result; In the comparison results, the operating status data that falls within the abnormal range is marked as the abnormal operating data.

[0011] Furthermore, the monitoring results include a duration test end event, and the step of restarting the target test item based on the monitoring results and the test restart parameters to obtain the restart result of the target test item includes: Based on the end event of the duration test, a restart command for the electronic device is generated; According to the restart command, the electronic device is restarted. After the electronic device restarts, the restart status of the target test item is detected, the current number of restarts is accumulated, and an interval timer is started. The restart result of the target test item is determined based on the restart status, the current number of restarts, the interval timer, and the test restart parameters.

[0012] Furthermore, the test restart parameters include a single restart interval and a target number of restarts. Determining the restart result of the target test item based on the restart status, the current number of restarts, the interval timer, and the test restart parameters includes: When the interval duration timer reaches the single restart interval, it is determined whether the current restart count is less than the target restart count; If the current number of restarts is less than the target number of restarts, then return to the step of restarting the electronic device according to the restart instruction. After the electronic device restarts, check the restart status of the target test item, accumulate the current number of restarts, and start the interval timer. If the current number of restarts is greater than or equal to the target number of restarts, the restart test of the electronic device is terminated, all restart states are recorded, and the restart result is obtained.

[0013] Furthermore, determining the aging test duration and test restart parameters based on the target test item includes: Match the initial aging test duration and initial test restart parameters corresponding to the target test item in the preset parameter library; Push the initial aging test duration and the initial test restart parameters to the configuration interface; The tester can obtain modification instructions for the initial aging test duration and the initial test restart parameters through the configuration interface. Based on the modification instructions, the aging test duration and the test restart parameters are determined.

[0014] To address the aforementioned technical problems, this application also provides an aging test apparatus for electronic devices, employing the following technical solution: An aging test apparatus for electronic devices, comprising: The parsing module is used to receive the aging configuration instructions from the tester for the electronic device, parse the aging configuration instructions, and obtain the target test items; The determination module is used to determine the aging test duration and test restart parameters based on the target test item; The calling module is used to call the test interface corresponding to the target test item according to the aging configuration instruction; The testing module is used to perform tests on the target test item on the testing interface according to the aging test duration and the test restart parameters, and obtain test results.

[0015] To address the aforementioned technical problems, this application also provides a computer device that employs the following technical solution: A computer device includes a memory and a processor, the memory storing computer-readable instructions, the processor executing the computer-readable instructions to implement the steps of the aging test method for an electronic device as described above.

[0016] To address the aforementioned technical problems, this application also provides a computer-readable storage medium, employing the technical solution described below: A computer-readable storage medium storing computer-readable instructions, which, when executed by a processor, implement the steps of the aging test method for an electronic device as described above.

[0017] Compared with the prior art, this application has the following main advantages: The aging test method for electronic devices disclosed in this application receives aging configuration instructions from testers, parses these instructions to obtain target test items, and clearly defines the test objects for aging testing, avoiding omissions or misselections of test items during the testing process. Secondly, based on the target test items, the aging test duration and test restart parameters are determined, ensuring that the aging test time standards and restart-related execution requirements are adapted to the specific test items, and that the test parameters are tailored to actual testing needs. Then, according to the aging configuration instructions, the corresponding test interface for the target test items is invoked, allowing different test items to be matched with dedicated operation and monitoring interfaces, avoiding the mixing of interfaces for different test items. Finally, on the test interface, the target test items are tested according to the aging test duration and test restart parameters to obtain test results. This ensures that the entire aging test process is carried out in an orderly manner according to predetermined items and parameters, forming a unified operating standard for each stage of the aging test, and that the generation of test results is based on a standardized testing process, guaranteeing the accuracy of the aging test results from the execution level. Attached Figure Description

[0018] To more clearly illustrate the solutions in this application, the accompanying drawings used in the description of the embodiments of this application will be briefly introduced below. Obviously, the accompanying drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 This is an exemplary system architecture diagram to which this application can be applied; Figure 2 This is a flowchart of one embodiment of the aging test method for electronic devices according to this application; Figure 3This is a schematic diagram of one embodiment of the aging test apparatus for electronic devices according to this application; Figure 4 This is a schematic diagram of the structure of one embodiment of the computer device according to this application. Detailed Implementation

[0020] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein in the specification of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application; the terms "comprising" and "having," and any variations thereof, in the specification, claims, and foregoing drawings of this application are intended to cover non-exclusive inclusion. The terms "first," "second," etc., in the specification, claims, or foregoing drawings of this application are used to distinguish different objects, not to describe a particular order.

[0021] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a mutually exclusive, independent, or alternative embodiment. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0022] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings.

[0023] like Figure 1 As shown, the system architecture 100 may include a first terminal device 101, a second terminal device 102, a third terminal device 103, a network 104, and a server 105. The network 104 serves as a medium for providing communication links between the first terminal device 101, the second terminal device 102, the third terminal device 103, and the server 105. The network 104 may include various connection types, such as wired or wireless communication links, or fiber optic cables, etc.

[0024] Users can use the first terminal device 101, the second terminal device 102, and the third terminal device 103 to interact with the server 105 via the network 104 to receive or send messages, etc. Various communication client applications can be installed on the first terminal device 101, the second terminal device 102, and the third terminal device 103, such as web browser applications, shopping applications, search applications, instant messaging tools, email clients, social platform software, etc.

[0025] The first terminal device 101, the second terminal device 102, and the third terminal device 103 can be various electronic devices with displays and support web browsing, including but not limited to smartphones, tablets, e-book readers, MP3 (Moving Picture Experts Group Audio Layer Ⅲ) players, MP4 (Moving Picture Experts Group Audio Layer IV) players, laptops, and desktop computers, etc.

[0026] Server 105 can be a server that provides various services, such as a backend server that supports the pages displayed on the first terminal device 101, the second terminal device 102, and the third terminal device 103.

[0027] It should be noted that the aging test method for electronic devices provided in this application is generally executed by the terminal device, and correspondingly, the aging test device for electronic devices is generally installed in the terminal device.

[0028] It should be understood that Figure 1 The number of terminal devices, networks, and servers shown is merely illustrative. Depending on implementation needs, any number of terminal devices, networks, and servers can be included.

[0029] Continue to refer to Figure 2 A flowchart illustrating an embodiment of an aging test method for an electronic device according to this application is shown. The aging test method for the electronic device includes the following steps: Step S201: Receive the aging configuration instruction from the tester for the electronic device, parse the aging configuration instruction, and obtain the target test item.

[0030] In this embodiment, the aging test method for electronic devices is applied to the electronic devices on which they are operated (e.g., Figure 1 The terminal device shown can send or receive data via wired or wireless connection. It should be noted that the aforementioned wireless connection methods may include, but are not limited to, 3G / 4G / 5G connections, Wi-Fi connections, Bluetooth connections, WiMAX connections, Zigbee connections, UWB (ultra-wide band) connections, and other currently known or future wireless connection methods.

[0031] In this embodiment, the aging test of electronic devices includes a duration aging test and a restart test. The duration aging test initiates a functional test of the target test item within the test interface. During the test, corresponding operations are performed according to the characteristics of the test item, such as camera image capture, speaker audio output, and audio / video loop playback. The restart test performs a complete restart test on the electronic device. The electronic device under test has built-in independently selectable aging test items such as a camera, speaker, sound, and lights. The main interface is configured with checkbox-style selection controls corresponding to each test item, and also includes a configuration confirmation button as a dedicated entry point for testers to input aging configuration commands. A preset configuration command parsing module can parse the tester's commands in real time. Specifically, on the main interface of the electronic device's aging test software, the tester checks or dechecks the checkboxes corresponding to each test item according to the actual aging test requirements. After determining the items to be tested, one or more items can be selected. The tester clicks the configuration confirmation button on the main interface, and this series of operations forms the aging configuration instruction for the electronic device. Then, the background configuration instruction parsing module is launched to parse the received aging configuration instruction, extract the selection status information of each test item checkbox contained in the instruction, and uniformly determine all the checked test items as the target test items for this aging test.

[0032] Step S202: Determine the aging test duration and test restart parameters based on the target test item.

[0033] In this embodiment, the aging test duration refers to the continuous testing time set for the target test item. It serves as the time benchmark for conducting uninterrupted aging tests on the target test item. This aging test duration parameter can be matched with a corresponding initial value according to different target test items. The default aging test duration can be preset to 2 hours. Testers can modify the initial value in the configuration interface according to actual test requirements. The final determined duration will be used as the standard. The test restart parameter refers to the parameters required to conduct a whole-machine restart test after the duration aging test is completed. It includes two sub-parameters: single restart interval and target number of restarts.

[0034] Specifically, after parsing the aging configuration instructions to obtain the target test item for this aging test, the corresponding aging test duration and test restart parameters in the system are matched based on the determined target test item. These aging test duration and test restart parameters can be pre-set default parameters or modified by the tester according to specific scenarios.

[0035] For example, if the target test items for this aging test are determined to be the camera and the speaker, the aging test system for electronic devices will match the aging test duration and test restart parameters corresponding to the combined camera and speaker test; if the target test item for this aging test is determined to be a single light item, the aging test duration and test restart parameters corresponding to the individual light test will be matched.

[0036] Step S203: According to the aging configuration instruction, call the test interface corresponding to the target test item.

[0037] In this embodiment, a pre-set interface mapping library is provided in the background. This library stores dedicated test interface information for individual and arbitrary combinations of test items such as cameras, speakers, and audio. Each test interface integrates dedicated controls for the operation monitoring, function execution, and status display of the corresponding test item. The software also has a built-in interface call module, which can retrieve the corresponding test interface based on aging configuration commands. Each test interface is matched one-to-one with the target test item. Next, the target test item information parsed from the aging configuration command is read, and the test interface uniquely corresponding to the target test item is matched according to the pre-set interface mapping library. Then, based on the matching result, an interface call operation is performed, switching the current operating interface of the electronic device from the main configuration interface of the aging test software to the test interface corresponding to the matched target test item.

[0038] Step S204: On the test interface, the target test item is tested according to the aging test duration and the test restart parameters to obtain the test results.

[0039] In this embodiment, the test results include monitoring results and restart results. Monitoring results refer to the data or events monitored during the aging test, while restart results refer to the results obtained after performing a full-device restart test on the electronic device according to preset test restart parameters. Specifically, a predetermined aging test duration is used as the time execution standard for the aging test, and the configured test restart parameters are used as the operation execution standard for the restart test. The aging test operation for the target test item is initiated according to the dedicated controls on the test interface. During the test, corresponding test stages are carried out sequentially according to the above two parameters, and various status data and result information are collected synchronously during the test. After all test stages are completed, the test data and information from the entire process are integrated to form the complete test result of this aging test, thus completing the aging test of the target test item.

[0040] This application receives aging configuration instructions from testers for the electronic device, parses these instructions to obtain target test items, and clearly defines the test objects for aging testing, avoiding omissions or misselections of test items during the testing process. Secondly, based on the target test items, it determines the aging test duration and test restart parameters, ensuring that the aging test time standards and restart-related execution requirements are adapted to the specific test items, and that the test parameters are tailored to actual testing needs. Then, based on the aging configuration instructions, it calls the test interface corresponding to the target test item, allowing different test items to be matched with dedicated operation and monitoring interfaces, avoiding the mixing of interfaces for different test items. Finally, on the test interface, the target test item is tested according to the aging test duration and test restart parameters to obtain test results. This ensures that the entire aging test process is carried out in an orderly manner according to predetermined items and parameters, forming a unified operating standard for each stage of the aging test, and that the generation of test results is based on a standardized test process, guaranteeing the accuracy of the aging test results from the execution level.

[0041] In some optional implementations of this embodiment, the test results include monitoring results and restart results. The steps described above, in the test interface, to test the target test item and obtain the test results based on the aging test duration and the test restart parameters, include: In the test interface, start the test of the target test item, and monitor the test of the target test item according to the aging test duration to obtain the monitoring results; Based on the monitoring results and the test restart parameters, a restart test is performed on the target test item to obtain the restart result of the target test item.

[0042] In this embodiment, the complete test results obtained from the aging test are divided into two parts: monitoring results and restart results. The two test phases are executed sequentially within the same test interface without switching to other operation interfaces. The test restart parameters include at least two items: single restart interval and target restart count. First, the duration of the aging test for the target test item is initiated through the function start control on the test interface. Simultaneously, based on a pre-determined aging test duration, the entire test process of the target test item is monitored. Once the relevant judgment conditions for the aging test duration are met, this stage of the test is completed, and the corresponding monitoring results are generated. Then, after obtaining the monitoring results, they are used as the trigger for the restart test. Simultaneously, the pre-configured test restart parameters are used as the execution basis for the restart test. The restart test continues on the target test item within the same test interface. After completing the restart test-related operations, the corresponding restart results are generated. Finally, the generated monitoring results and restart results are integrated to obtain the complete test results for this aging test of the target test item.

[0043] This application divides the aging test results into monitoring results and restart results, and conducts the test in two phases in sequence. The entire process is carried out on the same test interface without switching operations, which allows the test process to proceed in an orderly manner. It can also record relevant information of different test phases separately, making the division of aging test results clearer and the overall test execution process more organized.

[0044] In some optional implementations of this embodiment, the monitoring results include abnormal operation data and duration test completion events. The steps described above for monitoring the target test item based on the aging test duration to obtain the monitoring results include: Monitor the running status data and current test duration of the target test item during the testing process; When the current test duration is greater than or equal to the aging test duration, the test on the target test item is terminated, and the duration test end event is generated. The abnormal operation data is determined based on the preset abnormal range and the operation status data.

[0045] In this embodiment, the operational status data refers to various specific data related to the working status and performance of each target test item of the electronic device during the aging test. Different test items correspond to different monitoring dimensions, such as the frame rate and image integrity of the camera; the volume output value and sound output status of the speaker; the audio signal transmission status and audio-video playback synchronization of the sound module, etc. The current test duration is recorded from the moment the aging test of the target test item is started on the test interface. A dedicated timing module / thread is automatically triggered to continuously time the test in minutes and seconds, and to calculate the cumulative test time from the start of the test to the current moment in real time.

[0046] Specifically, through dedicated controls on the testing interface, the system synchronously monitors the running status data of the target test item during the testing process, as well as the current actual test duration. Relevant data and duration information are dynamically displayed on the interface and stored synchronously. The system continuously compares the current test duration with the preset aging test duration. When the current test duration is greater than or equal to the aging test duration, the test on the target test item is immediately terminated, and a duration test end event is generated synchronously. Finally, the system retrieves the corresponding preset abnormal interval and, combined with the running status data stored during the monitoring process, determines and confirms the abnormal running data. Integrating the generated duration test end event with the confirmed abnormal running data yields the monitoring results of this test.

[0047] This application synchronously monitors the operational status data and current test duration of the test project. After the preset duration is reached, the test is automatically terminated and a corresponding event is generated. It can also identify abnormal data from the monitoring data by combining preset abnormal intervals, making the composition of the monitoring results clearer, and completely recording the duration nodes and abnormal situations of equipment operation during the test, making the monitoring process more standardized.

[0048] In some optional implementations of this embodiment, the step of determining the abnormal operation data based on the preset abnormal range and the operation status data includes: The running status data and the abnormal interval are compared to obtain the comparison result; In the comparison results, the operating status data that falls within the abnormal range is marked as the abnormal operating data.

[0049] In this embodiment, the preset abnormal range is set in conjunction with the industry's conventional judgment standards for electronic device aging tests and is pre-stored in the aging test system. It can be fine-tuned according to actual test requirements. For example, the abnormal range for a camera can be a frame rate lower than 24fps or higher than 36fps, with abnormal acquisition states such as screen tearing, stuttering, or no image being captured. The abnormal range for a speaker can be a volume output value deviating from the benchmark value of the project by ±5dB or more, with abnormal sound output states such as distortion, noise, or no sound output during sound production. The abnormal range for sound can be an audio signal interruption, noise interference, or other transmission abnormalities, with the audio and video synchronization deviation exceeding 0.5 seconds when playing audio and video synchronously.

[0050] Specifically, the system retrieves the pre-set abnormal intervals that match the target test item; then, each piece of operational status data is compared with the abnormal interval one by one to form a comparison result for each piece of data; finally, based on all the comparison results, the operational status data within the abnormal interval are uniformly marked, and all the marked operational status data are the operational abnormal data determined in this aging test.

[0051] For example, if the target test item is a camera, its preset abnormal frame rate range is below 24fps or above 36fps. After comparing the monitored full-process frame rate data of the camera with this range one by one, all frame rate data below 24fps and above 36fps are marked. This marked data is the abnormal operation data of the camera. If the target test item is a speaker, its preset abnormal volume range is a deviation from the standard value of ±5dB. After comparing the monitored speaker volume data with this range, the system marks all volume data within this range, thus completing the determination of abnormal speaker operation data.

[0052] This application compares the monitored operational status data with preset abnormal intervals one by one, and then marks the data within the intervals. This avoids arbitrariness in operation, clearly distinguishes between normal and abnormal operational data, makes the judgment process more standardized, and can accurately extract abnormal data generated during testing.

[0053] In some optional implementations of this embodiment, the monitoring result includes a duration test end event, and the step of restarting the target test item based on the monitoring result and the test restart parameters to obtain the restart result of the target test item includes: Based on the end event of the duration test, a restart command for the electronic device is generated; According to the restart command, the electronic device is restarted. After the electronic device restarts, the restart status of the target test item is detected, the current number of restarts is accumulated, and an interval timer is started. The restart result of the target test item is determined based on the restart status, the current number of restarts, the interval timer, and the test restart parameters.

[0054] In this embodiment, the end of the duration test is used as a trigger signal to automatically generate a system restart command for the electronic device through the test interface. Then, the system restart operation is performed on the electronic device according to the restart command. After the restart of the electronic device is detected, the restart status of the target test item is immediately detected in the test interface. At the same time, the current restart count is accumulated, and the interval timer is started. Finally, the subsequent restart test operation is completed according to the pre-configured test restart parameters by combining the detected restart status, the accumulated current restart count, and the timing data of the interval timer, and the restart result of the target test item is finally determined.

[0055] For example, if the target test item is a speaker and light combination item, after the duration test end event of the item is obtained in the test interface, a whole machine restart command is immediately generated. After the restart is completed, the speaker sound status and light status are detected, the first restart count is accumulated and the interval timer is started. Then, combined with the preset test restart parameters, subsequent operations are carried out to finally determine the restart result of the combination item.

[0056] This application generates a restart command triggered by the end of the duration test. After the device restarts, it synchronously detects the restart status of the project, the cumulative number of restarts, and starts timing. Then, it combines multi-dimensional information to determine the restart result, so that each step of the restart test proceeds according to the predetermined steps, making the test process more orderly and also fully recording various test information related to the restart.

[0057] In some optional implementations of this embodiment, the test restart parameters include a single restart interval and a target number of restarts. The step of determining the restart result of the target test item based on the restart status, the current number of restarts, the interval timer, and the test restart parameters includes: When the interval duration timer reaches the single restart interval, it is determined whether the current restart count is less than the target restart count; If the current number of restarts is less than the target number of restarts, then return to the step of restarting the electronic device according to the restart instruction. After the electronic device restarts, check the restart status of the target test item, accumulate the current number of restarts, and start the interval timer. If the current number of restarts is greater than or equal to the target number of restarts, the restart test of the electronic device is terminated, all restart states are recorded, and the restart result is obtained.

[0058] In this embodiment, the restart parameters specifically include the single restart interval and the target number of restarts. The dedicated test interface for aging tests of electronic devices integrates adaptive controls for timing monitoring, count comparison, test loop and termination management.

[0059] Specifically, after the interval timer starts, the timing monitoring control on the test interface monitors the timing data in real time. When the interval timer reaches the preset single restart interval, it immediately retrieves the current accumulated restart count and compares it with the preset target restart count in the system to determine their relative values. If the comparison determines that the current restart count is less than the target restart count, the process returns to sending the restart command, restarting the entire electronic device, detecting the status of the target test item after restart, accumulating the current restart count, and restarting the interval timer, while resetting the interval timer to zero. If the comparison determines that the current restart count is greater than or equal to the target restart count, a restart test termination command is triggered through the test interface, immediately terminating the entire restart test of the electronic device, and resetting both the interval timer and the current restart count to zero. Simultaneously, the restart status information of the target test item after each restart stored during the test is retrieved, and all restart statuses are recorded uniformly and completely. This record represents the restart result of the target test item in this aging test.

[0060] This application controls the restart test process by setting a single restart interval and a target number of restarts. After the timer reaches the interval, the number of restarts is compared. If the number of restarts does not reach the target, the restart detection operation is executed repeatedly. If the target is reached, the test is terminated and all restart statuses are recorded. This provides clear criteria for the looping and termination of the restart test, ensures that each operation step is carried out in sequence, and also completely retains all status information during the restart process, making the test execution more standardized.

[0061] In some optional implementations of this embodiment, the steps of determining the aging test duration and test restart parameters based on the target test item include: Match the initial aging test duration and initial test restart parameters corresponding to the target test item in the preset parameter library; Push the initial aging test duration and the initial test restart parameters to the configuration interface; The tester can obtain modification instructions for the initial aging test duration and the initial test restart parameters through the configuration interface. Based on the modification instructions, the aging test duration and the test restart parameters are determined.

[0062] In this embodiment, the aging test system for electronic devices has a preset parameter library in the background. This library stores the initial aging test duration and initial test restart parameters corresponding to individual tests and arbitrary combinations of tests for nine test items, such as cameras, speakers, and sound. The system is also configured with a visual parameter configuration interface. After parsing the target test item, the aging test system first matches the initial aging test duration and initial test restart parameters corresponding to the target test item in the preset parameter library, and then automatically pushes the two types of initial parameters to the parameter configuration interface for visual display. Testers can adjust the initial parameters and issue modification commands on this interface according to actual test requirements. Based on the modification instruction, the required aging test duration and test restart parameters for this aging test are determined. For example, if the target test item is a combination of a camera and a speaker, the system matches its initial aging test duration of 2 hours, initial test restart parameters of 300 restarts and 5-second intervals from the parameter library. The tester can modify the duration to 4 hours and the number of restarts to 200 in the configuration interface. After the system obtains the modification instruction, it will use 4 hours as the aging test duration and 200 restarts and 5-second intervals as the target number of restarts and single restart interval in the test restart parameters.

[0063] This application first matches the initial aging test duration and restart parameters corresponding to the target test item from the preset parameter library, pushes them to the configuration interface, and allows testers to adjust them as needed. Then, the final parameters are determined according to the modification instructions, so that the parameter configuration can fit the characteristics of different test items and can also be flexibly adjusted according to actual test needs, making the parameter determination process more in line with the actual test application scenario.

[0064] The embodiments of this application can acquire and process relevant data based on artificial intelligence technology. Artificial intelligence (AI) refers to the theories, methods, technologies, and application systems that use digital computers or machines controlled by digital computers to simulate, extend, and expand human intelligence, perceive the environment, acquire knowledge, and use that knowledge to obtain optimal results.

[0065] Foundational technologies for artificial intelligence generally include sensors, dedicated AI chips, cloud computing, distributed storage, big data processing, operating / interactive systems, and mechatronics. AI software technologies mainly encompass computer vision, robotics, biometrics, speech processing, natural language processing, and machine learning / deep learning.

[0066] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by instructing related hardware through computer-readable instructions. These computer-readable instructions can be stored in a computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above methods. The aforementioned storage medium can be a non-volatile storage medium such as a magnetic disk, optical disk, or read-only memory (ROM), or random access memory (RAM).

[0067] It should be understood that although the steps in the flowcharts of the accompanying figures are shown sequentially as indicated by the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the accompanying figures may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily completed at the same time, but can be executed at different times, and their execution order is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the sub-steps or stages of other steps.

[0068] Further reference Figure 3 As a response to the above Figure 2 The implementation of the method shown in this application provides an embodiment of an aging test apparatus for electronic devices, which is similar to... Figure 2 Corresponding to the method embodiments shown, this device can be specifically applied to various electronic devices.

[0069] like Figure 3 As shown, the aging test device 300 for electronic devices described in this embodiment includes: a parsing module 301, a determining module 302, a calling module 303, and a testing module 304. Wherein: The parsing module 301 is used to receive the aging configuration instruction from the tester for the electronic device, parse the aging configuration instruction, and obtain the target test item; The determining module 302 is used to determine the aging test duration and test restart parameters based on the target test item; The calling module 303 is used to call the test interface corresponding to the target test item according to the aging configuration instruction; The test module 304 is used to perform tests on the target test item on the test interface according to the aging test duration and the test restart parameters, and obtain test results.

[0070] The aging test device for electronic devices provided in this application receives aging configuration instructions from testers for the electronic devices, parses the aging configuration instructions to obtain target test items, and clearly defines the test objects for aging tests, avoiding omissions or misselections of test items during the testing process. Secondly, based on the target test items, it determines the aging test duration and test restart parameters, ensuring that the aging test time standards and restart-related execution requirements are adapted to the specific test items, and that the test parameters are tailored to actual testing needs. Then, based on the aging configuration instructions, it calls the test interface corresponding to the target test items, allowing different test items to be matched with dedicated operation and monitoring interfaces, avoiding the mixing of interfaces for different test items. Finally, on the test interface, according to the aging test duration and test restart parameters, the target test items are tested to obtain test results. This ensures that the entire aging test process is carried out in an orderly manner according to predetermined items and parameters, forming a unified operating standard for each stage of the aging test, and that the generation of test results is based on a standardized test process, guaranteeing the accuracy of the aging test results from the execution level.

[0071] In some optional implementations of this embodiment, the test module 304 is further configured to: In the test interface, start the test of the target test item, and monitor the test of the target test item according to the aging test duration to obtain the monitoring results; Based on the monitoring results and the test restart parameters, a restart test is performed on the target test item to obtain the restart result of the target test item.

[0072] The aging test device for electronic devices provided in this application divides the aging test results into monitoring results and restart results, and conducts the test in two stages in sequence. The entire process is performed on the same test interface without switching operations, which allows the test process to proceed in an orderly manner. It can also record relevant information of different test stages, making the division of aging test results clearer and the overall test execution process more organized.

[0073] In some optional implementations of this embodiment, the test module 304 is further configured to: Monitor the running status data and current test duration of the target test item during the testing process; When the current test duration is greater than or equal to the aging test duration, the test on the target test item is terminated, and the duration test end event is generated. The abnormal operation data is determined based on the preset abnormal range and the operation status data.

[0074] The aging test device for electronic equipment provided in this application can automatically terminate the test and generate a corresponding event after the preset time is reached by synchronously monitoring the operating status data and current test duration of the test items. It can also identify abnormal data from the monitoring data by combining preset abnormal intervals, making the composition of the monitoring results clearer, and completely recording the time nodes and abnormal conditions of equipment operation during the test, making the monitoring process more standardized.

[0075] In some optional implementations of this embodiment, the test module 304 is further configured to: The running status data and the abnormal interval are compared to obtain the comparison result; In the comparison results, the operating status data that falls within the abnormal range is marked as the abnormal operating data.

[0076] The aging test device for electronic equipment provided in this application compares the monitored operating status data with preset abnormal ranges one by one, and then marks the data within the ranges. This avoids arbitrariness in operation, can clearly distinguish between normal and abnormal operating data, makes the judgment process more standardized, and can accurately extract abnormal data generated during testing.

[0077] In some optional implementations of this embodiment, the test module 304 is further configured to: Based on the end event of the duration test, a restart command for the electronic device is generated; According to the restart command, the electronic device is restarted. After the electronic device restarts, the restart status of the target test item is detected, the current number of restarts is accumulated, and an interval timer is started. The restart result of the target test item is determined based on the restart status, the current number of restarts, the interval timer, and the test restart parameters.

[0078] The aging test device for electronic equipment provided in this application generates a restart command triggered by the end of a timed test. After the device restarts, it synchronously detects the restart status of the project, the cumulative number of restarts, and starts timing. Then, it combines multi-dimensional information to determine the restart result, so that each step of the restart test proceeds according to the predetermined steps, making the test process more orderly and also fully recording various test information related to the restart.

[0079] In some optional implementations of this embodiment, the test module 304 is further configured to: When the interval duration timer reaches the single restart interval, it is determined whether the current restart count is less than the target restart count; If the current number of restarts is less than the target number of restarts, then return to the step of restarting the electronic device according to the restart instruction. After the electronic device restarts, check the restart status of the target test item, accumulate the current number of restarts, and start the interval timer. If the current number of restarts is greater than or equal to the target number of restarts, the restart test of the electronic device is terminated, all restart states are recorded, and the restart result is obtained.

[0080] The aging test device for electronic equipment provided in this application controls the restart test process by setting a single restart interval and a target number of restarts. After the timer reaches the interval, the number of restarts is compared. If the number of restarts does not reach the target, the restart test operation is executed repeatedly. If the target is reached, the test is terminated and all restart states are recorded. This provides a clear judgment standard for the cycle and termination of the restart test, and each operation step is carried out in sequence. It can also completely retain all state information during the restart process, making the test execution more standardized.

[0081] In some optional implementations of this embodiment, the determining module 302 is further configured to: Match the initial aging test duration and initial test restart parameters corresponding to the target test item in the preset parameter library; Push the initial aging test duration and the initial test restart parameters to the configuration interface; The tester can obtain modification instructions for the initial aging test duration and the initial test restart parameters through the configuration interface. Based on the modification instructions, the aging test duration and the test restart parameters are determined.

[0082] The aging test device for electronic devices provided in this application first matches the initial aging test duration and restart parameters corresponding to the target test item from the preset parameter library, pushes them to the configuration interface, and allows testers to adjust them as needed. Then, the final parameters are determined according to the modification instructions, so that the parameter configuration can fit the characteristics of different test items and can also be flexibly adjusted according to actual test needs, making the parameter determination process more in line with the actual test application scenario.

[0083] To address the aforementioned technical problems, embodiments of this application also provide a computer device. Please refer to [link / reference needed] for details. Figure 4 , Figure 4 This is a basic structural block diagram of the computer device in this embodiment.

[0084] The computer device 4 includes a memory 41, a processor 42, and a network interface 43 that are interconnected via a system bus. It should be noted that only the computer device 4 with components 41, 42, and 43 is shown in the figure; however, it should be understood that it is not required to implement all the shown components, and more or fewer components can be implemented alternatively. Those skilled in the art will understand that the computer device described here is a device capable of automatically performing numerical calculations and / or information processing according to pre-set or stored instructions, and its hardware includes, but is not limited to, microprocessors, application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), digital signal processors (DSPs), embedded devices, etc.

[0085] The computer device can be a desktop computer, laptop, handheld computer, or cloud server, etc. The computer device can interact with the user via a keyboard, mouse, remote control, touchpad, or voice control.

[0086] The memory 41 includes at least one type of readable storage medium, including flash memory, hard disk, multimedia card, card-type memory (e.g., SD or DX memory), random access memory (RAM), static random access memory (SRAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), programmable read-only memory (PROM), magnetic memory, magnetic disk, optical disk, etc. In some embodiments, the memory 41 may be an internal storage unit of the computer device 4, such as the hard disk or memory of the computer device 4. In other embodiments, the memory 41 may also be an external storage device of the computer device 4, such as a plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, etc., equipped on the computer device 4. Of course, the memory 41 may include both the internal storage unit and its external storage device of the computer device 4. In this embodiment, the memory 41 is typically used to store the operating system and various application software installed on the computer device 4, such as computer-readable instructions for aging test methods of electronic devices. In addition, the memory 41 can also be used to temporarily store various types of data that have been output or will be output.

[0087] In some embodiments, the processor 42 may be a central processing unit (CPU), a controller, a microcontroller, a microprocessor, or other data processing chip. The processor 42 is typically used to control the overall operation of the computer device 4. In this embodiment, the processor 42 is used to execute computer-readable instructions stored in the memory 41 or to process data, such as computer-readable instructions for executing an aging test method for the electronic device.

[0088] The network interface 43 may include a wireless network interface or a wired network interface, which is typically used to establish communication connections between the computer device 4 and other electronic devices.

[0089] The computer equipment provided in this application, by receiving aging configuration instructions from testers for the electronic equipment and parsing these instructions to obtain target test items, clearly defines the test objects for aging tests, avoiding omissions or misselections of test items during the testing process. Secondly, based on the target test items, it determines the aging test duration and test restart parameters, ensuring that the aging test time standards and restart-related execution requirements are adapted to the specific test items, and that the test parameters are tailored to actual testing needs. Then, based on the aging configuration instructions, it calls the test interface corresponding to the target test item, allowing different test items to be matched with dedicated operation and monitoring interfaces, avoiding the mixing of interfaces for different test items. Finally, on the test interface, based on the aging test duration and test restart parameters, the target test item is tested to obtain test results. This ensures that the entire aging test process is carried out in an orderly manner according to predetermined items and parameters, forming a unified operating standard for each stage of the aging test, and that the generation of test results is based on a standardized test process, guaranteeing the accuracy of the aging test results from the execution level.

[0090] This application also provides another embodiment, namely, providing a computer-readable storage medium storing computer-readable instructions that can be executed by at least one processor to cause the at least one processor to perform the steps of the aging test method for electronic devices as described above.

[0091] The computer-readable storage medium provided in this application receives aging configuration instructions from testers for the electronic device, parses the aging configuration instructions to obtain target test items, and clearly defines the test objects for aging testing, avoiding omissions or misselections of test items during the testing process. Secondly, based on the target test items, it determines the aging test duration and test restart parameters, ensuring that the aging test time standards and restart-related execution requirements are adapted to the specific test items, and that the test parameters are tailored to actual testing needs. Then, based on the aging configuration instructions, it calls the test interface corresponding to the target test item, allowing different test items to be matched with dedicated operation and monitoring interfaces, avoiding the mixing of interfaces for different test items. Finally, on the test interface, based on the aging test duration and test restart parameters, it tests the target test item and obtains test results. This ensures that the entire aging test process is carried out in an orderly manner according to predetermined items and parameters, forming a unified operating standard for each stage of the aging test, and that the generation of test results is based on a standardized test process, guaranteeing the accuracy of the aging test results from the execution level.

[0092] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal device (which may be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in the various embodiments of this application.

[0093] Obviously, the embodiments described above are only some embodiments of this application, not all embodiments. The accompanying drawings show preferred embodiments of this application, but do not limit the patent scope of this application. This application can be implemented in many different forms; rather, these embodiments are provided to provide a more thorough and comprehensive understanding of the disclosure of this application. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing specific embodiments, or make equivalent substitutions for some of the technical features. Any equivalent structures made using the content of this application's specification and drawings, directly or indirectly applied to other related technical fields, are similarly within the scope of patent protection of this application.

Claims

1. An aging test method for electronic devices, characterized in that, The electronic device includes multiple test items, including: Receive aging configuration instructions from testers for the electronic device, parse the aging configuration instructions, and obtain the target test items; Based on the target test items, determine the aging test duration and test restart parameters; According to the aging configuration instruction, the test interface corresponding to the target test item is invoked; On the test interface, the target test item is tested according to the aging test duration and the test restart parameters to obtain the test results.

2. The aging test method for electronic devices according to claim 1, characterized in that, The test results include monitoring results and restart results. In the test interface, the target test item is tested according to the aging test duration and the test restart parameters to obtain test results, including: In the test interface, start the test of the target test item, and monitor the test of the target test item according to the aging test duration to obtain the monitoring results; Based on the monitoring results and the test restart parameters, a restart test is performed on the target test item to obtain the restart result of the target test item.

3. The aging test method for electronic devices according to claim 2, characterized in that, The monitoring results include abnormal operation data and duration test completion events. The monitoring of the target test item based on the aging test duration yields the following monitoring results: Monitor the running status data and current test duration of the target test item during the testing process; When the current test duration is greater than or equal to the aging test duration, the test on the target test item is terminated, and the duration test end event is generated. The abnormal operation data is determined based on the preset abnormal range and the operation status data.

4. The aging test method for electronic devices according to claim 3, characterized in that, The step of determining the operational anomaly data based on the preset anomaly range and the operational status data includes: The operational status data and the abnormal interval are compared to obtain the comparison result; In the comparison results, the operating status data that falls within the abnormal range is marked as the abnormal operating data.

5. The aging test method for electronic devices according to claim 2, characterized in that, The monitoring results include a duration test end event. Based on the monitoring results and the test restart parameters, the target test item is restarted to obtain the restart result of the target test item, including: Based on the end event of the duration test, a restart command for the electronic device is generated; According to the restart command, the electronic device is restarted. After the electronic device restarts, the restart status of the target test item is detected, the current number of restarts is accumulated, and an interval timer is started. The restart result of the target test item is determined based on the restart status, the current restart count, the interval timer, and the test restart parameters.

6. The aging test method for electronic devices according to claim 5, characterized in that, The test restart parameters include a single restart interval and a target number of restarts. Determining the restart result of the target test item based on the restart status, the current number of restarts, the interval timer, and the test restart parameters includes: When the interval duration timer reaches the single restart interval, it is determined whether the current restart count is less than the target restart count; If the current number of restarts is less than the target number of restarts, then return to the step of restarting the electronic device according to the restart instruction. After the electronic device restarts, check the restart status of the target test item, accumulate the current number of restarts, and start the interval timer. If the current number of restarts is greater than or equal to the target number of restarts, the restart test of the electronic device is terminated, all restart states are recorded, and the restart result is obtained.

7. The aging test method for electronic devices according to any one of claims 1 to 6, characterized in that, The step of determining the aging test duration and test restart parameters based on the target test item includes: Match the initial aging test duration and initial test restart parameters corresponding to the target test item in the preset parameter library; Push the initial aging test duration and the initial test restart parameters to the configuration interface; The tester can obtain modification instructions for the initial aging test duration and the initial test restart parameters through the configuration interface. Based on the modification instructions, the aging test duration and the test restart parameters are determined.

8. An aging test apparatus for electronic equipment, characterized in that, include: The parsing module is used to receive the aging configuration instructions from the tester for the electronic device, parse the aging configuration instructions, and obtain the target test items; The determination module is used to determine the aging test duration and test restart parameters based on the target test item; The calling module is used to call the test interface corresponding to the target test item according to the aging configuration instruction; The testing module is used to perform tests on the target test item on the testing interface according to the aging test duration and the test restart parameters, and obtain test results.

9. A computer device, characterized in that, The device includes a memory and a processor, wherein the memory stores computer-readable instructions, and the processor executes the computer-readable instructions to implement the steps of the aging test method for the electronic device as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer-readable instructions, which, when executed by a processor, implement the steps of the aging test method for an electronic device as described in any one of claims 1 to 7.

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