Dynamic detection device and dynamic focusing algorithm

By using dynamic detection devices based on terahertz, Asia-Pacific hertz, millimeter waves, and optics, combined with radar and structured light sensors, rapid and accurate non-contact detection has been achieved. This solves the problem of difficulty in detecting cracks and fatigue damage in existing technologies, and improves detection efficiency and safety.

CN122283697APending Publication Date: 2026-06-26TAIWANTAIPEI UNIVERSITY OF TECHNOLOGY
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Patent Information

Application Number
CN202610202985.9
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Priority Date
2025-02-14
Filing Date
2026-02-10
Publication Date
2026-06-26

AI Technical Summary

Technical Problem

Existing detection technologies are insufficient to quickly and accurately detect potential cracks and fatigue damage in railway infrastructure, aircraft structures, and bridge tunnels, leading to safety threats and structural instability in transportation vehicles.

Method used

Employing a dynamic detection device combining terahertz, Asia-Pacific Hz, millimeter wave, and optics, along with radar and structured light sensors, and utilizing a dynamic focusing algorithm, it achieves efficient, non-contact detection, completing the detection within 90 seconds and achieving micron- and millimeter-level analytical accuracy to identify various material defects.

Benefits of technology

It improves detection efficiency by 5 times, shortens the detection cycle, has high analytical accuracy and safety, can identify material properties with a thickness of micrometers, is suitable for the detection of a variety of material structures, and does not require contact with coupling agent, thus avoiding radiation hazards.

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Abstract

The present invention relates to a dynamic detection device and a dynamic focusing algorithm. The dynamic detection device includes: a computing unit; a screen; a structured light; a radar; an autofocus lens; an external power supply unit; and an internal power supply unit; wherein the screen, the structured light, the radar, the external power supply unit, and the internal power supply unit are all electrically connected to the computing unit; and the radar is electrically connected to the autofocus lens.
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Description

Technical Field

[0001] This invention relates to a detection device and its operating method, and more particularly to a dynamic detection device and its operating method based on terahertz, Asia-Pacific hertz, millimeter waves and optics. Background Technology

[0002] Currently, many countries face challenges such as aging railway infrastructure, fatigue damage to aircraft structural materials, and common issues like cracks, fatigue, and damage in bridges and tunnels. These problems not only affect transportation efficiency but also pose a significant threat to public safety. In particular, fatigue cracks in aircraft materials directly impact the integrity of the aircraft structure. If these cracks are not detected early, they can potentially lead to aircraft disintegration, resulting in a mortality rate as high as 90%. However, current technological bottlenecks and limitations in detection methods prevent the timely detection of many potential cracks or deformations, posing a serious threat to the stability of transportation vehicle structures.

[0003] Therefore, how to solve the above problems is an important issue that the industry must face and resolve. Summary of the Invention

[0004] In view of this, the inventors of this invention propose a detection technology that is fast, highly accurate, easy to operate, and fully functional. Specifically, it relates to a dynamic detection device and its operating method based on terahertz, Asia-Pacific Hz, millimeter waves, and optics. This invention's detection technology can complete a task within 90 seconds, improving efficiency by more than five times compared to traditional ultrasound and X-ray detection, significantly shortening the detection cycle and making it suitable for high-efficiency industrial applications. Regarding analytical accuracy, this invention's detection technology possesses excellent imaging and thickness measurement capabilities, achieving micrometer (μm) and millimeter (mm) level analytical accuracy; for example, it can detect materials with a thickness of 5 μm. Furthermore, this invention's detection technology can accurately distinguish the characteristics of different materials, applicable to the detection needs of various material structures. Regarding operability and functionality, this invention's detection method has the ability to detect various defects, including but not limited to debonding, delamination, dents, cracks, holes, water seepage, melting, and lightning strike defects. Simultaneously, the detection process does not require the use of contact coupling agents, further improving operational convenience. In addition, this invention's detection technology avoids radiation hazards, ensuring operational safety and providing a high level of health protection for operators. The detection technology of this invention effectively and significantly improves detection efficiency and accuracy while taking into account ease of operation and safety, making it an ideal solution to meet the detection needs of modern industry.

[0005] Based on the above, this disclosure provides a dynamic detection device, comprising: arithmetic unit; screen; Structured light is a structured light sensor used to emit structured light and receive reflected light signals; A radar is a radar sensor used to transmit and receive radar signals; Automatic zoom lens; External power supply unit; and Internal power supply unit; The screen, structured light, radar, external power supply unit, and internal power supply unit are all electrically connected to the computing unit; the radar is also electrically connected to the auto-zoom lens. The computing unit determines the focus of the auto-zoom lens based on the received radar and reflected light signals.

[0006] According to one or more embodiments of this disclosure, the computing unit includes a system-on-a-chip, a graphics processor, a random access memory, and a hard disk.

[0007] According to one or more embodiments of this disclosure, the external power supply unit includes an external power module.

[0008] According to one or more embodiments of this disclosure, the internal power supply unit includes a charging module, a battery, and a voltage regulator module.

[0009] According to one or more embodiments of this disclosure, when the dynamic detection device 1 is in operation, the computing unit may be powered by either the external power supply unit or the internal power supply unit.

[0010] According to one or more embodiments of this disclosure, the charging module is electrically connected to the battery, and the battery is electrically connected to the voltage regulator module.

[0011] Another aspect of this disclosure provides a dynamic focusing algorithm, executed by the dynamic detection device described in claim 1, comprising the following steps: Perform the initialization settings steps; Perform the steps to obtain A-Scan data; Perform the steps to extract target distance and peak values; Perform the step of calculating the average intensity of all wave crests; Perform the steps to confirm whether the optimal focal length has been reached; Perform the steps to output the optimal focal length and intensity; Perform the steps to adjust the focus; and Perform the step of repeating the scan after updating the focal length. Attached Figure Description

[0012] Figure 1 This is a schematic diagram of a dynamic detection device according to an embodiment of the present invention.

[0013] Figure 2 This is a flowchart of the dynamic focusing algorithm executed by the dynamic detection device in one embodiment of the present invention.

[0014] Figure 3 This is a flowchart illustrating the process of determining whether the optimal focal length has been reached when the dynamic detection device is activated in one embodiment of the present invention.

[0015] Figure label: 1. Dynamic detection device; 10. Computational unit; 20. Screen; 30; Structured light; 40. Radar; 50. Automatic zoom lens; 60. External power supply unit; 70. Internal power supply unit; 10a. System-on-a-chip (SoC); 10b. Graphics processor; 10c, Random Access Memory; 10d, hard drive; 70a, Charging module; 70b, Battery; 70c, voltage regulator module; 60a. External power supply module; S1~S8, Steps; S31~S41, Steps. Detailed Implementation

[0016] The following disclosure provides different embodiments or examples to establish different features of the provided subject matter. The specific examples of the components and arrangements described below are for the purpose of simplifying this disclosure and are not intended to constitute limitation; the size and shape of the elements are not limited by the scope or values ​​disclosed, but may depend on the manufacturing conditions of the elements or the desired characteristics. For example, the technical features of the invention are described using cross-sectional views, which are schematic diagrams of idealized embodiments. Therefore, differences in the shapes illustrated due to manufacturing processes and / or tolerances are foreseeable and should not be limiting.

[0017] Furthermore, spatial relative terms, such as "below," "under," "lower than," "above," and "higher than," are used to easily describe the relationship between elements or features depicted in the diagram. In addition, spatial relative terms include not only the directions depicted in the diagram but also the different directions in which the elements are used or operated.

[0018] First and foremost, it should be noted that the dynamic detection device described in the embodiments of this invention is a portable imaging system. It uses terahertz, Asia-Pacific hertz, or millimeter-wave radar as its core sensor, supplemented by a camera, infrared, and structured light sensors to achieve planar damage analysis, penetrating internal damage detection, and advanced material structure analysis. This system can be widely applied in fields such as aircraft maintenance, rail inspection, and building structure inspection.

[0019] Terahertz imaging technology is an advanced detection technique that utilizes electromagnetic waves with frequencies between 0.1 THz and 10 THz for imaging. Because terahertz waves possess both electrical and optical properties, they have unique advantages in materials testing and imaging, earning them the reputation of being a "combination of ultrasound and X-rays." Terahertz waves can penetrate non-metallic materials (such as plastics, fibers, ceramics, and composite materials) and are absorbed and reflected by different materials. Through reflection imaging and semi-transparent imaging methods, terahertz technology can detect the internal structure of materials, identify defects such as cracks and damage, and further analyze material properties and structure. Terahertz imaging technology is a non-contact detection technique, requiring no coupling agent, making it suitable for inspecting curved surfaces and difficult-to-contact areas. Terahertz imaging technology has high penetration, capable of penetrating various non-conductive materials, such as composite materials, plastics, and ceramics, to detect internal defects. Terahertz imaging technology features high-precision imaging with medium to high resolution, enabling clear imaging and analysis of cracks, damage, and material structures. In addition, terahertz imaging technology is safe and radiation-free, belonging to non-ionizing radiation, which is safe and harmless to the human body and is easy to operate.

[0020] Structured light technology is an active depth sensing technology. Its basic components include an IR emitter, an IR camera module, and an RGB camera module. The principle of structured light technology is to first project a specific pattern of light onto an object, then receive the encoded light pattern on the object's surface using a camera. This encoded pattern is then compared to the original projected light pattern, and the object's three-dimensional coordinates are calculated using triangulation principles. The advantages of structured light technology are high depth accuracy, but its disadvantages include susceptibility to natural lighting and suitability for short-distance measurements. It is currently used in fields such as facial recognition, motion-sensing game consoles, and industrial machine vision inspection (AOI).

[0021] In its implementation, this system utilizes a two-tiered approach during dynamic focusing. First, the radar sensor transmits and receives radar signals as the primary measurement basis, while the structured light sensor transmits and receives structured light signals as auxiliary signals. Both signals are synchronously transmitted to the processing unit for analysis and judgment, thereby controlling the auto-zoom lens to adjust its focal length. After adjustment, the radar sensor and structured light sensor again sense the signal at the new focal length, and the aforementioned judgment and adjustment steps are repeated until the optimal focal length is achieved. Next, please refer to... Figure 1 , Figure 1 This is a schematic diagram of a dynamic detection device according to an embodiment of the present invention. Figure 1 As shown, in an embodiment of the present invention, the dynamic detection device 1 includes a computing unit 10, a screen 20, a structured light 30, a radar 40, an autofocus lens 50, an external power supply unit 60, and an internal power supply unit 70.

[0022] In an embodiment of the present invention, the screen 20, the structured light 30, and the radar 40 are all electrically connected to the computing unit 10. Additionally, the external power supply unit 60 and the internal power supply unit 70 are both electrically connected to the computing unit 10.

[0023] In an embodiment of the present invention, the computing unit 10 includes a system-on-a-chip, a graphics processor, a random access memory, and a hard disk.

[0024] In an embodiment of the present invention, the external power supply unit 60 includes an external power module 60a. In an embodiment of the present invention, the internal power supply unit 70 includes a charging module 70a, a battery 70b, and a voltage regulator module 70c. In an embodiment of the present invention, when the dynamic detection device 1 is operating, either the external power supply unit 60 or the internal power supply unit 70 can be selected to supply power to the computing unit 10. For example, the internal power supply unit 70 can supply power to the computing unit 10 first, and then the external power supply unit 60 can supply power to the computing unit 10 when the power of the internal power supply unit 70 is about to be exhausted; or, when the power of the internal power supply unit 70 is about to be exhausted, the external power supply unit 60 can charge the internal power supply unit 70, and then the internal power supply unit 70 can supply power to the computing unit 10. In an embodiment of the present invention, the charging module 70a is electrically connected to the battery 70b, and the battery 70b is electrically connected to the voltage regulator module 70c.

[0025] In addition, in an embodiment of the present invention, the radar 40 is connected to the autofocus lens 50 via telecommunications.

[0026] In an embodiment of the present invention, the dynamic detection device 1 integrates the computing unit 10 with the external power supply unit 60 or the internal power supply unit 70. In particular, the computing unit 10, as described above, includes a system on a chip (SoC) 10a, a graphics processing unit (GPU) 10b, random-access memory (RAM) 10c, and a hard disk 10d. These components together form the core computing part and are connected to external devices through an interface.

[0027] In an embodiment of the present invention, after the radar 40 detects the data, it transmits the data to the computing unit 10 through the interface for SAR imaging calculation, and then displays the results on the screen 20.

[0028] It should be noted again that, in the embodiments of the present invention, the dynamic detection device 1 provides two power supply methods. One is direct power supply from the external power supply unit 60; the other is direct power supply from the internal power supply unit 70. As mentioned above, the internal power supply unit 70 includes a charging module 70a, a battery 70b, and a voltage regulator module 70c. The design of the internal power supply unit 70 ensures the stable operation of the dynamic detection device 1 under portability requirements.

[0029] Next, please refer to Figure 2 , Figure 2 This is a flowchart illustrating the dynamic focusing algorithm executed by the dynamic detection device in one embodiment of the present invention. Figure 2 As shown, in an embodiment of the present invention, the dynamic detection device 1 executes the dynamic focusing algorithm including steps S1 to S8, as described below. However, steps S1 to S8 do not represent an absolute order of steps.

[0030] In step S1, the initialization settings are executed. The entire process begins with initialization settings, including setting the basic parameters of the radar 40, such as the frequency range, and the focusing range and step value of the lens of the autofocus lens 50. Then, the process proceeds to step S2.

[0031] In step S2, the A-Scan data acquisition process is performed. In step S2, radar 40 begins operation, acquiring A-Scan data through scanning. This data is the core of the entire process and is used for subsequent analysis. Afterwards, the process proceeds to step S3. The radar transmits in terahertz, Asia-Pacific hertz, and millimeter wave bands, and the A-Scan data is data transmitted by the radar in these bands.

[0032] In step S3, the target distance and peak information are extracted. After acquiring the data, the dynamic detection device 1 extracts the target distance and peak information, analyzes the feature points in the A-Scan waveform, and records the intensity value of each peak. Then, the process proceeds to step S4.

[0033] In step S4, the average intensity of all wave peaks is calculated. The average value of these peak intensities is calculated and serves as an important basis for judging the degree of focal length optimization. Then, proceed to step S5.

[0034] In step S5, a step is performed to confirm whether the optimal focal length has been reached. That is, the dynamic detection device 1 evaluates whether the optimal focal length has been reached based on the current data. If yes, that is, the optimal focal length has been reached, then proceed to step S6. Otherwise, if no, that is, the optimal focal length has not been reached, then proceed to step S7.

[0035] In step S6, the step of outputting the optimal focal length and intensity is performed. Specifically, since the stopping condition is met, the optimal focal length position and the corresponding maximum average intensity are output, completing the process.

[0036] In step S7, the focus is adjusted. Then, proceed to step S8.

[0037] In step S8, the scanning process is repeated after updating the focal length. Specifically, in steps S7 and S8, since the optimal focal length was not reached, the lens focal length position is further adjusted and updated according to the set step value, and the data acquisition and analysis process is repeated. This iterative cycle continues until the focal length adjustment reaches the optimal result. The entire process optimizes the target peak signal intensity by dynamically adjusting the focal length and analyzing data in real time.

[0038] Next, please refer to Figure 3 , Figure 3 This is a flowchart illustrating the process of determining whether the optimal focal length has been reached during the operation of the dynamic detection device in one embodiment of the present invention. Figure 3 As shown, in an embodiment of the present invention, the process of determining whether the optimal focal length has been reached when the dynamic detection device 1 is activated includes steps S31 to S41, as described below. However, steps S31 to S41 do not represent an absolute order of steps.

[0039] In step S31, the step of acquiring A-Scan data is performed. Then, step S32 is performed. Radar 40 transmits signals and receives echoes reflected from the material surface and internal structure. By analyzing the echo peaks and wavelength characteristics in the A-Scan data, the accuracy of the radar 40's focal length can be confirmed, and ranging errors can be corrected.

[0040] In step S32, the step of finding the position of the echo peak is performed. Then, proceed to step S33.

[0041] In step S33, the step of calculating the wavelength λ_m within the material is performed. Then, proceed to step S34.

[0042] In step S34, the theoretical echo position B_true is calculated. Then, proceed to step S5.

[0043] In step S35, the echo peak offset ΔB is calculated. Then, proceed to step S36.

[0044] In step S36, a step is performed to determine whether the offset ΔB (i.e., the offset between the measured position and the theoretical peak position) exceeds a threshold. If yes, proceed to step S37. Otherwise, proceed to step S40.

[0045] In step S37, the focus is adjusted to obtain the best echo. Then, proceed to step S38.

[0046] In step S38, the process of reacquiring and verifying the A-Scan data is performed. Then, proceed to step S39.

[0047] In step S39, a step is performed to ensure that the peaks correspond correctly. Then, proceed to step S41.

[0048] In step S40, the focus is maintained and the result is recorded. Then, proceed to step S41.

[0049] In step S41, the distance and focus calibration steps are performed to complete the entire process.

[0050] It should be specifically noted that, in the embodiments of this invention, when the focal length of the radar 40 is correct, the primary reflection peak of the A-Scan data corresponds to the known location of the material; the relationship between the echo wavelength and the material thickness conforms to theoretical predictions, and the waveform is clear and non-divergent; when the focal length is optimal, the echo signal strength is maximum, the waveform is sharpest, and there is no additional scattering or distortion within the range of the primary echo peak. Conversely, when the focal length is incorrect, the echo peak position shifts, leading to ranging errors; the waveform diverges, affecting resolution, and the edges of the echo become blurred or delayed; the signal strength decreases, making it impossible to accurately analyze the internal structure of the material.

[0051] The embodiments of the present invention determine whether the optimal focal length has been reached through the above method, including but not limited to steps such as wave crest position correspondence, wavelength analysis, and focal length correction, to ensure accurate ranging and optimize the focal length.

[0052] Furthermore, in the above-mentioned steps of acquiring A-Scan data, the radar 40 transmits signals, receives echoes, records the correspondence between A-Scan intensity (Amplitude) and range bins, and parses the range bin information to obtain the intensity distribution of the material echo.

[0053] In addition, during the steps of determining the echo peak location, besides using Local Peak Detection to find the main peak of the echo, the range bin location of the echo peak is also recorded. ,and This indicates the range bin of the echo peak measured by A-Scan.

[0054] Furthermore, in the above-mentioned step of calculating the theoretical echo location, the material thickness is used as a basis. and radar wavelength Range Bin Resolution refers to the actual physical distance corresponding to each range cell (Range Bin) in the radar's digital processing unit. It is used to calculate the expected location of the echo peaks. As shown in equations (1) and (2) below: Equation (1) Equation (2) in, λ is the radar wavelength within the material; n is the refractive index of the material; f is the radar frequency; and c is the speed of light.

[0055] In addition, when confirming the peak offset, the peak position offset is calculated using the following formula (3): Equation (3) in, This indicates the range bin position of the echo peak measured by A-Scan. This indicates the position of the peak that should appear according to the calculation theory. If If the value exceeds the allowable range, it indicates a ranging error.

[0056] Furthermore, in the step of analyzing the relationship between wavelength and material thickness, the ratio of material thickness to wavelength is calculated using the following formula (4): Equation (4) in, The thickness of the standard material is known; k is the ratio of the material thickness to the wavelength. The radar wavelength within the material. If the integer value is used, it may cause a standing wave effect, affecting the resolution of the echo signal.

[0057] Furthermore, in the step of adjusting the radar focal length to obtain the optimal echo, when the focal length is optimal, the embodiments of the present invention satisfy the following conditions: (1) the main echo peak corresponds to the material thickness without any additional offset. (2) the signal strength is at its maximum, with no obvious scattering or blurry echoes. (3) the edges of the reflected echo are clear, and the signal width is at its narrowest. In the embodiments of the present invention, the method of adjusting the focal length is to change the distance between the radar antenna and the material, and to adjust the automatic zoom lens to make the echo the strongest.

[0058] In an embodiment of the present invention, it is assumed that we use millimeter-wave radar to measure a piece of material with a known thickness of 5 mm. The material has a diameter of 0.005 m, and the radar frequency is 10 GHz. =1010 Hz), the refractive index of the material is 2.5 ( =2.5). The dynamic detection device 1 transmits A-Scan data and detects that the echo peak appears at the 200th range bin. =200). The Range Bin Resolution of Radar 40 is 0.1 mm / bin (0.00010.00010.0001 m / bin). The following steps are intended to check whether the echo peak position matches the actual material thickness and ensure the error range is within ±1%.

[0059] First, calculate the theoretical echo peak position. Theoretically, the echo peak... It should appear at 41.67. That is, calculated according to the above formula (1), we get .

[0060] Next, calculate the ranging error. Check the measured peak. =200, calculate the offset, that is, according to the above formula (3), we get Permissible error = 0.01 × =0.4167.

[0061] Then, the focal length is corrected using a zoom lens. Since the focal length of the radar echo affects the position of the wave crest in the A-Scan, we can adjust the position of the wave crest by changing the focal length of the zoom lens. Focal Length Change With peak shift The relationship between them is shown in the following equation (5): Equation (5) The focal length adjustment factor depends on the radar resolution and the characteristics of the zoom lens. Assuming that each unit focal length adjustment of 10 mm affects the range bin, then:

[0062] This means that the focal length should be shortened by 15.833 mm so that the echo peaks correspond to the correct positions.

[0063] Next, remeasure the A-Scan. After adjusting the focus, acquire the A-Scan data again and confirm whether the main echo peak has shifted to... Nearby. Assuming that after focal length correction, the new peak position is: , new = 41.5

[0064]

[0065] This means that the error has been reduced to an acceptable range and the focus calibration is complete.

[0066] The above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention.

Claims

1. A dynamic detection device, characterized in that, Include: arithmetic unit; screen; Structured light; radar; Automatic zoom lens; External power supply unit; and Internal power supply unit; The screen, structured light, radar, external power supply unit, and internal power supply unit are all electrically connected to the computing unit; the radar is electrically connected to the auto-zoom lens. The computing unit makes a judgment based on a radar signal received from the radar and a reflected light signal from the structured light, and controls the autofocus lens to adjust the focal length.

2. The dynamic detection device as described in claim 1, characterized in that, The computing unit includes a system-on-a-chip, a graphics processor, a random access memory, and a hard disk.

3. The dynamic detection device as described in claim 1, characterized in that, The external power supply unit includes an external power module.

4. The dynamic detection device as described in claim 1, characterized in that, The internal power supply unit includes a charging module, a battery, and a voltage regulator module.

5. The dynamic detection device as described in claim 1, characterized in that, When the dynamic detection device is in operation, the computing unit can be powered by either the external power supply unit or the internal power supply unit.

6. The dynamic detection device as described in claim 1, characterized in that, The charging module forms an electrical connection with the battery, and the battery forms an electrical connection with the voltage regulator module.

7. The dynamic detection device as described in claim 1, characterized in that, The radar can transmit in terahertz, Asia-Pacific hertz, or millimeter wave bands.

8. A dynamic focusing algorithm, characterized in that, Performed by the dynamic detection device according to claim 1, the process includes the following steps: Perform the initialization settings steps; Perform the steps to obtain A-Scan data; Perform the steps to extract target distance and peak values; Perform the step of calculating the average intensity of all wave crests; Perform the steps to confirm whether the optimal focal length has been reached; Perform the steps to output the optimal focal length and intensity; Perform the steps to adjust the focus; as well as Perform the step of repeating the scan after updating the focal length.

9. The dynamic focusing algorithm as described in claim 8, characterized in that, The step of obtaining A-Scan data involves obtaining radar transmission data in bands such as terahertz, Asia-Pacific hertz, and millimeter waves.